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  • High Performance/Reliability Flash Solution for Embedded System and Automotive Application

    Speaker : Crystal Chang Author: Alex Tseng Nov. 2013

  • ATP Confidential 2013 ATP Electronics, Inc. 1

    Company Profile

    Product Selection by Applications

    Major Concerns of Flash Product Reliability

    ATP Solution of High Reliability Flash Product

    Agenda

  • ATP Confidential 2013 ATP Electronics, Inc. 2

    ATP

    Founded in Silicon Valley, USA in 1991 Offices in US, Taiwan, China, Japan,

    and Europe (Netherlands, Germany) Core Competencies OEM mission critical business engagement Strengths: Long term business stability, services focusing in supply chain,

    engineering, and process/quality management Global multi-party CM/EMS/3PL supply chain management Global support base for both OEM end customers and their supply chain partners

    DRAM & Flash products manufacturing Taiwan SMT facilities: Kaohsiung EVT/DVT/Burn In, Mass Production Scalable to market demands and customer requirements

  • ATP Confidential 2013 ATP Electronics, Inc. 3

    Extended & Long Term Product Longevity Long term partnership with first tier memory manufacturers Consistent DRAM and NAND Flash IC supply in varying market conditions

    Controller Partnerships with SiliconMotion and LSI Long term partnership for support on flash validation and application

    specific design

    Micron PLP Program - Long Life Cycle Based on Microns Product Longevity Program, ATP

    guarantees extended product life cycles of up to 10 years Longer life cycle to help reduce the frequency of re-design and

    re-qualification

    ATP Advantages

  • ATP Confidential 2013 ATP Electronics, Inc. 4

    100% Tested for Reliability and Consistency TDBI (Test During Burn In) & ATE (Automated Test Equipment) provide

    Increased flexibility, efficiency and scalability for DRAM testing Extended and industrial temperature testing Environmental testing & application testing

    Management of Total Cost of Ownership (TCO)ATP ensures the product life cycle and quality at the beginning of project to manage the TCO. Endurance and retention evaluations are initiated to provide the most

    cost-effective option to customers.

    Controlled Bill of Materials (BOM) Long product life cycle with buffer inventory support and advance PCN/EOL

    ATP AdvantagesATP has accumulated many years of experience in the design, manufacturing, and support of two main product lines: DRAM modules & NAND flash storage products.

  • ATP Confidential 2013 ATP Electronics, Inc. 5

    Host: Integrated USB 3.0 Host is mature for UHS-I reader ; Mobile AP will support SD 3.0 in 2014

    Device: UHS-I SD/microSD is ready Full HD video camera and display is popular Embedded Application of UHS-I SD/microSD

    Why UHS-I SD and microSD now?

    UHS-I ConventionalSD

    MB/s4X71

    17

  • ATP Confidential 2013 ATP Electronics, Inc. 6

    USB 3.0 Host is ready for UHS-I Card Reader Application Only USB 3.0 (5Gb/s) can fully utilize

    UHS-I speed (Up to 104 MB/s) instead of USB 2.0 (480Mb/s)

    Integrated USB 3.0 Host is mature for UHS-I reader

    2011/Sandy BridgeUSB 3.0 Host X2

    2012/Ivy BridgeIntegrated

    USB 3.0 Host X2

    2013/HaswellIntegrated

    USB 3.0 Host X6

    USB2.0 USB3.0

  • ATP Confidential 2013 ATP Electronics, Inc. 7

    Full HD Video Camera/Recording, and Playback become mainstream standard of high end Smartphone in 2013

    2M pixels (Full HD) front video camera and >5-inch display (Full HD) is a good carrier to drive user to choose UHS-I

    FullHD Video Camera and Display is popular

  • ATP Confidential 2013 ATP Electronics, Inc. 8

    Multi Channel Full HD Surveillance/Drive Recorder Car NAVI and RSE (Rear Seat Entertainment) Multi Channel Data Logger/Measurement Automation Control

    Embedded Application of UHS-I SD/microSD

  • ATP Confidential 2013 ATP Electronics, Inc. 9

    The life of Flash Storage is limited!!! EnduranceProgram/Erase cycles of MLC is 3,000Program/Erase cycles of SLC is 30,000~60,000

    Data RetentionMLC: 5/10 Years ( 10% of Max. P/E cycles),

    1 Year ( > 10% of Max. P/E cycles)SLC: 5/10 Years ( 10% of Max. P/E cycles),

    1 Year ( > 10% of Max. P/E cycles) Read DisturbanceContinuously Read one address without moving data is ~100K times

    Major Concerns of Flash Product Reliability

  • ATP Confidential 2013 ATP Electronics, Inc. 10

    Risk of Zone 1: Endurance Risk of Zone 2: Read Disturbance Risk of Zone 3: Read Disturbance and Data Retention

    Data Structure of Flash Storage Device

    Zone2(FrequentlyRead)OperatingSystem

    ApplicationProgram

    Zone3(DataRetentionisSustainable)

    Map/Database

    Zone1(FrequentlyWrite)Multimedia/DataLog

    FileAllocationTable/MBR

    SpareBlock

  • ATP Confidential 2013 ATP Electronics, Inc. 11

    ATP Innovative Flash Solution

    Conventional

    ATP

    Innovative

    Host CPUPHYPHY Wear-

    LevelingECC

    SRAM

    FlashInterface

    NANDFlash

    Flash Controller

    HostCPU

    PHYPHY Wear-Leveling

    ECCSRAM

    FlashInterface

    NANDFlash

    Flash Controller

    EnduranceRead

    Retention

  • ATP Confidential 2013 ATP Electronics, Inc. 12

    ATP Reliability Solution

    Endurance Engine

    Advanced Wear-leveling

    Block management

    ATP Total Reliability Protector

    Refresh Engine

    Auto ECC Check

    Auto Back-Up before failure

    Refresh Engine

    Reliable Mode

  • ATP Confidential 2013 ATP Electronics, Inc. 13

    High Drive-Write-Per-Day Requirement OLTP/Cloud Server/Data-Log Healthcare/Surveillance Total Cost of Ownership is only (5X cost/ 20X DWPD)=1/4

    Application of Endurance Protector

    Up to 5X cost

    Up to 20X DWPD (Endurance)

  • ATP Confidential 2013 ATP Electronics, Inc. 14

    Read-Frequently Device Boot-Up/ Operating System Automation/Robot/POS Application Program/Gaming

    Application of Read Protector

    Others ATP Model

    Before100,000

    >2,000,000*

    *100% Read-only

    After

  • ATP Confidential 2013 ATP Electronics, Inc. 15

    Long Product life requirement Automotive IVI/NAVI system Mission-critical Environment

    Application of Retention Protector

    Others ATP Model

    Data Retention

    1~5 Yrs

    >2X*

    *With system support

  • ATP Confidential 2013 ATP Electronics, Inc. 16

    ATP Total Reliability Protector saves your TCO: Endurance Protector: TCO Read Protector: >2M times read (ATP) VS.100K times read Retention Protector: 2X more data retention

    Conclusion

    Refresh EngineReliable Mode

    ATP Total Reliability Protector

    Endurance Engine Advanced

    Wear-levelingBlock management

    Refresh EngineAuto ECC CheckAuto Back-Up

    before failure

  • ATP Confidential 2013 ATP Electronics, Inc. 17

    CFast

    Industrial Grade UFD

    microSD

    CF

    mSATAeUSB

    Slim SATA

    SATA SSD

    Horizontal SATA

    Vertical SATASATA

    eUSB

    DRAM

    Industrial Grade UFD

    SD

    ATP Product Summary

  • ATP Confidential 2013 ATP Electronics, Inc. 18

    TCO Evaluation Sheet can help to save total cost when you care: Performance/Form-factor Write Frequently or Read Frequently

    Product Selection by Applications

    10MB/s 30MB/s 100MB/s 250MB/s 500MB/s

    PowerProtector Model

    SDminiSD

    MicroSD

    UFD 2.0/eUSB/CF/DOM/CFast

    SlimSATAmSATA

    SATA II SSD/SATA III SSD

    Form

    Fac

    tor S

    ize

    Performance

    Den

    sity

  • ATP Confidential 2013 ATP Electronics, Inc. 1919ATP Confidential 2013 ATP Electronics, Inc. 19

    F3206F3206VisitATPBoothat

  • ATP Confidential 2013 ATP Electronics, Inc. 20ATP Confidential 2013 ATP Electronics, Inc.