lec6 memory flash nand

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    NAND Flash Technology

    [email protected]

    Adapted from:Adapted from:11 Nonvolatile Memor Technolo ies with Em hasis on Flash edited b JoeNonvolatile Memor Technolo ies with Em hasis on Flash edited b Joe

    E. Brewer, WileyE. Brewer, Wiley 20082008

    [[22]] M.SanvidoM.Sanvido and et al., NAND Flash Memory and Its Role on Storageand et al., NAND Flash Memory and Its Role on StorageArcthitecturesArcthitectures,, Proceeding of IEEEProceeding of IEEE Vol.Vol.9696, No., No.1111, Nov, Nov 20082008

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    NAND Flash

    TopicTopic

    Examples

    -

    NAND Application with HDD and SSD

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    NAND Flash

    OverviewOverview

    of Tohoku University in 1987

    Uses uniform FN tunnelin for both erasin andprogramming

    Block-oriented memory

    Easily programmed in a long page (order of 16kb) so theprogramming time per byte can be short

    resistance of cells and select transistor

    Suitable for applications that requires reading andprogramming blocks of data

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    NAND Flash-Recap

    NAND Structured CellNAND Structured Cell

    connected between two

    select transistor

    Cell pitch defined by thepolysilicon wiring litho-

    graphy thus easier forscaling

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    NAND Flash

    ArchitectureArchitecture

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    NAND Flash

    Ex:Ex: 6464 MbitMbit

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    NAND Flash-Recap

    EraseErase

    allow inhibit

    Over-erasure is of no concern

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    NAND Flash

    ProgramProgram

    0-programchange to positive VT

    1-programkeep negative VT0V 0V

    Page operation

    are programmed simultaneously

    A l 20 V to a selected cell and 10 V to non-selected cells(which share the same BL and must operate as a pass gate)

    Apply 0 V to BL for 0-programing ( change to positive VT)

    ppy o or -programng eep nega ve

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    NAND Flash

    Ex: Program SchemeEx: Program Scheme

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    NAND Flash

    ReadRead

    o er ce s excep e se ec e ce serve as passdevices

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    NAND Flash

    Array Structure and OperationsArray Structure and Operations

    Use staggered-row decoder instead of sub row

    pitch

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    NAND Flash

    Conventional StructureConventional Structure

    Each row decoder occupies length of a NAND strings

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    NAND Flash

    Staggered Row DecoderStaggered Row Decoder

    Each row decoder occupies length of two NANDstrin s

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    NAND Flash

    SelfSelf--booted Erase Inhibit Schemebooted Erase Inhibit Scheme

    By floating CG andas ng -we , e

    capacitive coupling

    same amount as P-well.

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    NAND Flash

    Block EraseBlock Erase

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    NAND Flash

    SelfSelf--boosted Program Inhibit Schemeboosted Program Inhibit Scheme

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    NAND Flash

    Capacitive Model for SelfCapacitive Model for Self--boostedboosted

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    NAND Flash

    Program Page OperationProgram Page Operation

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    NAND Flash

    Read OperationRead Operation

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    NAND Flash

    Program DisturbProgram Disturb

    VM should be set between 6 and 11 V.

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    NAND Flash

    Read/Write and Verify CircuitsRead/Write and Verify Circuits

    (Write CG4 and operate at Supply = 3V)

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    NAND Flash

    Read/Write and Verify CircuitsRead/Write and Verify Circuits

    (Read CG4 and operate at Supply = 3V)

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    NAND Flash

    VerifyVerify--readread010

    001

    111

    101

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    NAND Flash

    Page Programming AlgorithmPage Programming Algorithm

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    Flash-MLC

    MultiMulti--Level CellLevel Cell

    Improve memory density without increasing the

    Lower cost per bit

    ConCon

    ompex program a gor ms an c rcu s

    Increase access time

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    Flash-MLC

    Key RequirementsKey Requirements

    Accurate control of the amount of charge stored, or placed,

    on the floating gatePrecise control and timing of the voltages applied to the

    cells

    Accurate measurement of the transistor characteristics todetermine which charge level, or data bit, is stored

    Advanced analog to digital conversion

    Retention: Accurate charge storage, such that the charge level, or data

    bit, remains intact over time

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    NOR Flash MLC

    Ex: IntelsEx: Intels StrataFlashStrataFlash (ETOX NOR)(ETOX NOR)

    Charge difference between states in 1 b/c is roughly

    30 000 electrons Distribution of 0.3 V corresponds to 3,000 electrons

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    NOR Flash MLC

    PlacementPlacement

    Program timing control voltage and placement

    O

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    NOR Flash MLC

    SensingSensing

    fast decoding

    Use flash cell togenerate referencefor better tracking

    of process variationand operating

    NAND Fl h MLC

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    NAND Flash MLC

    44--Level NANDLevel NAND

    arge res o vo age s r u on

    NAND Fl h MLC

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    NAND Flash MLC

    44--Level NAND : Page ReadLevel NAND : Page Read

    The WSR scheme identifiesone o our eren ce s a esby sequentially changing the

    NAND Fl h MLC

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    NAND Flash MLC

    44--Level NAND : Page ProgramLevel NAND : Page Program

    NAND Fl h MLC

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    NAND Flash MLC

    33--Level NANDLevel NAND

    NAND Flash MLC

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    NAND Flash MLC

    44--bit per Cellbit per Cell

    Spansion (AMD) announced MirrorBit Quad

    Using silicon nitride instead of conductive floating gate

    Claimed as first industry 4-bit per cell Flash. Actually it is nota FG Flash, it is a NROM

    20092009

    SanDisk initiated shipments of X4

    Made by Toshiba

    43 nm process technology

    Density 64Gb

    NAND Flash

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    NAND Flash

    Architecture and PerformanceArchitecture and Performance

    NAND Flash

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    NAND Flash

    Typical Raw ThroughputsTypical Raw Throughputs

    Type Page Block Page/blc Erase(mS/blc)

    Program

    (S/p)

    Write(MB/S)

    Read(S/p)

    - - -(64B)

    . . .

    2LC 4KB 512KB 128 3 600-900 3.8-5.4 50(218B)

    [2]

    Higher parallelism

    Setup standard interfaces :ONFI (Open Nand Flash, ,

    Applications with HDD

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    Applications with HDD

    Disk Caching ArchitectureDisk Caching Architecture

    Add NAND flash as a disk cache to HDD

    Looks as if there is firmware on HDD Data are not split into two separate physical units

    Driver is needed on host side to manage NAND

    Applications with HDD

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    Applications with HDD

    Disk Caching ArchitectureDisk Caching Architecture

    Use part of flash to permanently store some data such as

    portion of boot data, initial portion of the hibernation file,requency use ran om a a or app ca ons

    Use part of flash to temporary store incoming write datadurin the time that HDD does not s in to save owe

    Advantages provide a faster boot up and improve resume time from

    standby or hibernation

    reduce power consumption by rotating media, thus

    improve launch time for frequently used applications

    improve the hard disk drive reliability, since the media canbe spun down most of the time

    Applications with HDD

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    Applications with HDD

    Disk Caching ArchitectureDisk Caching Architecture

    Place NAND flash outside

    of HDD (on MTB or as acard)

    Split data into two physical

    oca ons

    Require software and driver

    to mana e NAND and HDD

    Advantages

    Fast boot, fast resume Lower overall power consumption

    Improve HDD reliability

    HDD System Diagram

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    HDD System Diagram

    Source: Debasis BaralSource: Debasis BaralSamsung USASamsung USA

    Solid-State Drive

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    Solid State Drive

    Inside SSDInside SSD

    Source: Debasis BaralSource: Debasis BaralSamsung USASamsung USA

    Solid-State Drive

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    Solid State Drive

    SSDSSD

    Currently use SLC NAND Flash

    -

    Sequential read slower than HDD which achieves100MB s

    Four to ten times slower than HDD on write access

    Still some issues on endurance, data retention

    design (average for 32/64 GB ~1-2 W)

    NAND Flash

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    NAND Flash

    NANDNAND vsvs HDDHDD

    Ref. J.Unsworth, Gartnet, Dataquest Insight: Solid-State Drive Emergein Select Consumer and Enterprise Markets, Jan 7, 2008

    Limitations of Flash

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    Limitations of Flash

    Programming VoltageProgramming Voltage

    Programming SpeedProgramming Speed

    EnduranceEndurance

    Little improvement, so far ~10

    ScalingScaling

    Limitation of Flash

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    Fundamental Scaling LimitFundamental Scaling Limit

    on retention time

    Attem t to reduce ro rammin volta e has not etsuccessful

    Good news: it can be scaled for more technology

    generations before anticipated fundamental scalingissues become critical.

    Limitation of Flash

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    Ideal MemoryIdeal Memory