Space Radiation Effectsin Electronic Components.

Len AdamsLen Adams

Professor Associate, Brunel Univ.Professor Associate, Brunel Univ.

Consultant to Spur Electron.Consultant to Spur Electron.

For: PA and Safety Office. For: PA and Safety Office.

May 2003 May 2003

Space Radiation Effects in Electronic Components

Structure of Presentation

1.1. Space radiation environment Space radiation environment

2.2. Radiation effects in electronic components.Radiation effects in electronic components.

3.3. Radiation testingRadiation testing

4.4. Use of commercial componentsUse of commercial components

5.5. Guide to comrad-uk resourceGuide to comrad-uk resource

6.6. Open discussionOpen discussion

Space Radiation EnvironmentOverview

Complex and DynamicComplex and Dynamic

Trapped Radiation – ‘Belts’ of energetic electrons Trapped Radiation – ‘Belts’ of energetic electrons and protonsand protons

Cosmic Rays (Energetic Ions)Cosmic Rays (Energetic Ions)

Solar Event protons Solar Event protons

Space Radiation EnvironmentTrapped Radiation

Electrons and Protons are trapped in the Electrons and Protons are trapped in the Earths magnetic field, forming the ‘Van Earths magnetic field, forming the ‘Van Allen’ belts.Allen’ belts.

Electrons up to 7 MeVElectrons up to 7 MeV

Protons up to a few hundred MeV.Protons up to a few hundred MeV.

Electron Belts

Proton Belts

Space Radiation EnvironmentTransiting Radiation

Very high energy Galactic Cosmic Rays Very high energy Galactic Cosmic Rays originating from outside the solar systemoriginating from outside the solar system

Solar Events. (X-rays, protons and heavy Solar Events. (X-rays, protons and heavy ions)ions)

Space Radiation EnvironmentGalactic Cosmic Rays

85% Protons, 14% Alpha particles, 1% 85% Protons, 14% Alpha particles, 1% Heavy Nuclei.Heavy Nuclei.

Energies up to GeVEnergies up to GeV Expressed in terms of Linear Energy Expressed in terms of Linear Energy

Transfer (LET) for radiation effects Transfer (LET) for radiation effects purposespurposes

Space Radiation EnvironmentSolar Flares

Occur mostly near first and last year of Occur mostly near first and last year of solar maximumsolar maximum

Solar Events, composed mainly of protons Solar Events, composed mainly of protons with minor constituent of alpha particles, with minor constituent of alpha particles, heavy ions and electronsheavy ions and electrons

Space Radiation EnvironmentSouth Atlantic Anomaly

Distortion of the earth’s magnetic field Distortion of the earth’s magnetic field allows the proton belts to extend to very allows the proton belts to extend to very low altitudes in the region of South low altitudes in the region of South AmericaAmerica

Low Earth Orbiting satellites will be Low Earth Orbiting satellites will be exposed to high energy protons in this exposed to high energy protons in this regionregion

Space Station. 1 year dose-depth curve.

Space Station . Non-Ionizing Energy Loss spectrum.

Space Station. Orbit averaged LET spectra

Space Station. Proton flux as a function of orbital time.

Radiation Effects in Components(1) IONIZATION

Mechanism : Charge generation, trapping and Mechanism : Charge generation, trapping and build-up in insulating layers.build-up in insulating layers.

Due to: Electrons, Protons.Due to: Electrons, Protons.

Main Effects: Parameter drift. Increased Main Effects: Parameter drift. Increased leakage currents. Loss of noise immunity. leakage currents. Loss of noise immunity. Eventual functional failureEventual functional failure

Radiation Effects in Components(2) DISPLACEMENT

DAMAGE

Mechanism: Disruption of crystal latticeMechanism: Disruption of crystal lattice

Due to: ProtonsDue to: Protons

Main Effects: Reduced gain, increased ‘ON’ Main Effects: Reduced gain, increased ‘ON’ resistance, reduced LED output, reduced resistance, reduced LED output, reduced charge transfer efficiency in CCDs. charge transfer efficiency in CCDs.

Radiation Effects in Components(3) SINGLE EVENT

Mechanism: Dense path of localised Mechanism: Dense path of localised ionization from a single particle ‘hit’ionization from a single particle ‘hit’

Due to: Cosmic rays, high energy protons.Due to: Cosmic rays, high energy protons.

Main Effects: Transient current pulses, variety Main Effects: Transient current pulses, variety of transient and permanent ‘Single Event of transient and permanent ‘Single Event Effects’Effects’

Single Event Current Pulse

SEU Mechanism in CMOS bistable

Radiation Effects in Components(4) Single Event Effects in detailLatch-up. Permanent, potentially destructiveLatch-up. Permanent, potentially destructive

Bit flips (‘Single Event Upset’) in bistablesBit flips (‘Single Event Upset’) in bistables

High Anomalous Current (HAC), ‘snap-back’High Anomalous Current (HAC), ‘snap-back’

Heavy Ion Induced Burn-out in power MOSHeavy Ion Induced Burn-out in power MOS

Single Event Gate Rupture (SEGR)Single Event Gate Rupture (SEGR)

Single Event Transient, noise pulses, false outputsSingle Event Transient, noise pulses, false outputs

‘‘Soft Latch’ (device or system ‘lock up’)Soft Latch’ (device or system ‘lock up’)

Typical Single Event Transient Requirements.

Output voltage swing of rail voltage to Output voltage swing of rail voltage to ground and ground to rail voltage.ground and ground to rail voltage.

Duration:Duration:

15 microseconds for Op-Amps.15 microseconds for Op-Amps.

10 microseconds for comparators, voltage 10 microseconds for comparators, voltage regulators and voltage references.regulators and voltage references.

100 nanoseconds for opto-couplers.100 nanoseconds for opto-couplers.

Radiation TestingSpecifications and Standards

Total Ionizing Dose: Total Ionizing Dose:

SCC-22900 (ESA-SCC) SCC-22900 (ESA-SCC)

Mil Std 883E Method 1019.6 (DESC) Mil Std 883E Method 1019.6 (DESC)

ASTM F1892 (includes ELDRS)ASTM F1892 (includes ELDRS) Single Event:Single Event:

SCC-29500 (ESA-SCC)SCC-29500 (ESA-SCC)

EIA/JEDEC Standard EIA/JESD57EIA/JEDEC Standard EIA/JESD57

ASTM F1192ASTM F1192

Radiation TestingImportant Considerations

Choice of radiation source.Choice of radiation source. Specifications and StandardsSpecifications and Standards Worst case or application biasWorst case or application bias Test softwareTest software Number of samplesNumber of samples TraceabilityTraceability DatabasingDatabasing

Radiation TestingChoice of Source

Total Ionizing Dose: Co-60 gamma or Total Ionizing Dose: Co-60 gamma or 1-3 MeV electrons (Linac or VdG)1-3 MeV electrons (Linac or VdG)

Displacement Damage: Protons (10-20 MeV), Displacement Damage: Protons (10-20 MeV), Neutrons (1 MeV), Electrons (3-5 MeV)Neutrons (1 MeV), Electrons (3-5 MeV)

Single Event: Heavy Ion Accelerator (ESA-Louvain Single Event: Heavy Ion Accelerator (ESA-Louvain HIF), Proton Accelerator (ESA-PSI PIF)HIF), Proton Accelerator (ESA-PSI PIF)Cf-252 ‘CASE’ laboratory system.Cf-252 ‘CASE’ laboratory system.

Typical Radiation Verification (RVT) requirements.

TECHNOLOGYTECHNOLOGY REQUIREMENTREQUIREMENT DOSE RATEDOSE RATE

Bipolar TransistorBipolar Transistor Data > 10 yrsData > 10 yrs High or LowHigh or Low

MOS TransistorMOS Transistor All diffusion lotsAll diffusion lots High or LowHigh or Low

Linear ICsLinear ICs All diffusion lotsAll diffusion lots LowLow

MOS Digital ICsMOS Digital ICs Data > 1 yrData > 1 yr High or LowHigh or Low

Bipolar Digital ICsBipolar Digital ICs Data > 10 yrsData > 10 yrs LowLow

ASICs, FPGA.ASICs, FPGA. Data > 2 yrsData > 2 yrs LowLow

MOS RAM, ROMMOS RAM, ROM Data > 2 yrsData > 2 yrs High or LowHigh or Low

Bipolar RAM, ROMBipolar RAM, ROM Data > 6 yrsData > 6 yrs LowLow

OptoelectronicsOptoelectronics All diffusion lotsAll diffusion lots High or LowHigh or Low

Technologies generally considered to be radiation tolerant (~ 300 krad)

Diodes (other than zener).Diodes (other than zener). TTL logic (e.g. 54xx series).TTL logic (e.g. 54xx series). ECL (Emitter Coupled Logic).ECL (Emitter Coupled Logic). GaAs (Gallium Arsenide) technologies.GaAs (Gallium Arsenide) technologies. Microwave devices.Microwave devices. Crystals. Crystals. Most passives.Most passives.

Radiation TestingSample Size/Traceability

Sample Size:Sample Size:Total Ionizing Dose. Minimum 5 samples. Total Ionizing Dose. Minimum 5 samples. 4 test, 1 reference.4 test, 1 reference.Single Event. 3 samples recommended.Single Event. 3 samples recommended.Traceability:Traceability:Use single Lot-Date-Code for test and flight Use single Lot-Date-Code for test and flight hardware.hardware.

Dose-rates for testing.

- High Dose Rate:- High Dose Rate:

SCC 22900 Window 1. 1-10 rads/sec.SCC 22900 Window 1. 1-10 rads/sec.

MIL883E 1019.6. 50-300 rads/sec.MIL883E 1019.6. 50-300 rads/sec.

- Low Dose Rate:Low Dose Rate:

SCC 22900 Window 2. 0.01-0.1 rads/sec.SCC 22900 Window 2. 0.01-0.1 rads/sec.

MIL883E 1019.6. 0.01 rads/sec.MIL883E 1019.6. 0.01 rads/sec.

Elevated Temp.Elevated Temp. 0.5-5 rads/sec. 0.5-5 rads/sec.

Radiation TestingTest Software (Single Event)

Test pattern dependence. All 1, All 0, Test pattern dependence. All 1, All 0, Alternate 1-0, Chequerboard, MOVI.Alternate 1-0, Chequerboard, MOVI.

Different sensitivities for different registers.Different sensitivities for different registers. Dead Time. (detect flip/record/rewrite) Dead Time. (detect flip/record/rewrite) How to test Processors (‘Golden Chip’ ?)How to test Processors (‘Golden Chip’ ?) Possibility to run application software ?Possibility to run application software ?

Beware of software/hardware interaction.Beware of software/hardware interaction.

Radiation TestingAnd finally……

TEST IT LIKE YOU FLY ITTEST IT LIKE YOU FLY IT

FLY IT LIKE YOU TEST ITFLY IT LIKE YOU TEST IT

(Ken LaBel. GSFC)(Ken LaBel. GSFC)

Use of Commercial Components

The use of commercial technology does The use of commercial technology does NOT necessarily result in cost-saving.NOT necessarily result in cost-saving.

Cost of Ownership is the important Cost of Ownership is the important consideration.consideration.

First choice should always be QML or First choice should always be QML or Space Quality components if available.Space Quality components if available.

Why Use Commercial Technology ?

Complexity of functionsComplexity of functions

PerformancePerformance

Availability (limited number of QML/Space Availability (limited number of QML/Space suppliers).suppliers).

What are the drawbacks of commercial technology?

Little or no traceabilityLittle or no traceability Rapid and unannounced design and process Rapid and unannounced design and process

changes.changes. Rapid obsolescenceRapid obsolescence Packaging Issues (Plastic).Packaging Issues (Plastic).

- Effect of burn-in on radiation response- Effect of burn-in on radiation response

- Deep dielectric charging in space (?)- Deep dielectric charging in space (?)

COTS Hardness Assurance

Define the hazardDefine the hazard Evaluate the hazardEvaluate the hazard Define requirementsDefine requirements Evaluate device usageEvaluate device usage Discuss with designersDiscuss with designers Iterate process as necessaryIterate process as necessary

Risk Assessment & Mitigation

Components list review by a radiation expertComponents list review by a radiation expert Good Radiation Design Margin (2-5)Good Radiation Design Margin (2-5) Fully characterise key componentsFully characterise key components Limit the use of new technologiesLimit the use of new technologies Eliminate or shield marginal technologiesEliminate or shield marginal technologies Maintain awareness of developments in radiation Maintain awareness of developments in radiation

effectseffects Do not cut back on testingDo not cut back on testing Look for system solutionsLook for system solutions

Countermeasures/MitigationTotal Ionizing Dose.

Additional shielding. Only effective in electron dominated Additional shielding. Only effective in electron dominated environments.environments.

Cold redundancy (‘sparing’). Not effective for all Cold redundancy (‘sparing’). Not effective for all technologies.technologies.

Generous derating.Generous derating.

Robust electronic design. High drive currents, low fan-out Robust electronic design. High drive currents, low fan-out or loading. Large gain margins, high noise immunity etc. or loading. Large gain margins, high noise immunity etc.

Countermeasures/Mitigation. Single Event Effects

Note that additional shielding is NOT effective.Note that additional shielding is NOT effective.

Ensure systems are not sensitive to transient effects.Ensure systems are not sensitive to transient effects.

Use fault tolerant design techniques.Use fault tolerant design techniques.

Use Error Detection and Correction for critical circuits.Use Error Detection and Correction for critical circuits.

Ensure systems can re-boot autonomously.Ensure systems can re-boot autonomously.

COMRAD-UKAn integrated Web resource of components radiation effects

data.

Why Integrated Web Resource ?

COMRAD provides more than a database.COMRAD provides more than a database.

it includes :it includes :

Components radiation effects database.Components radiation effects database.

A tutorial handbook.A tutorial handbook.

Links to radiation effects sites.Links to radiation effects sites.

Links to manufacturers sites.Links to manufacturers sites.

Links to publications in .pdf format.Links to publications in .pdf format.

‘‘Experts Forum’ for technical discussions.Experts Forum’ for technical discussions.

Available from COMRAD-UK Home Page

TermsTerms LinksLinks GlossaryGlossary

IndexIndex SearchSearch Total DoseTotal Dose

Heavy IonHeavy Ion NeutronNeutron ProtonProton

SponsorsSponsors ManufacturersManufacturers SeminarsSeminars

HandbookHandbook Publications Publications

& News& News

Experts ForumExperts Forum

Welcome to COMRAD

This web site is the primary source of information on the internet for

COMponent RADiation data. Please feel free to browse and review the information contained herein.

This site was designed and built by:

Spur Electron Ltd Hayward House

Hayward Business Centre New Lane

Havant, Hants United Kingdom

Tel: + 44 (0)23 92 455564 Fax: + 44 (0)23 92 455568

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Origins of COMRAD-UK Database

ESA RADFX (on discs)ESA RADFX (on discs) Database Round Table (RADECS 1993)Database Round Table (RADECS 1993) Discussions with Space Agencies, Scientific Discussions with Space Agencies, Scientific

Institutes and IndustryInstitutes and Industry Discussions with CERN LHC Project and Discussions with CERN LHC Project and

Detector groups.Detector groups.

Aims of COMRAD-UK Database To be ‘informative’ not ‘regulatory’.To be ‘informative’ not ‘regulatory’. To contain recent data and be continuously To contain recent data and be continuously

updated.updated. To provide data summary and detailed tabulated To provide data summary and detailed tabulated

data (if available).data (if available). To provide contact details for the test authority.To provide contact details for the test authority. To be expandable for High-Energy Physics and To be expandable for High-Energy Physics and

AvionicsAvionics

COMRAD-UK Database status.

700 Total Dose records700 Total Dose records 280 Single Event Records280 Single Event Records Being updated on a monthly basisBeing updated on a monthly basis Primary data resources:Primary data resources:IEEE NSREC Data Workshop and ProceedingsIEEE NSREC Data Workshop and ProceedingsRADECS Data Workshop and ProceedingsRADECS Data Workshop and ProceedingsESA Contract Reports.ESA Contract Reports.IEEE Publications.IEEE Publications.CERN reports and publicationsCERN reports and publications

Origins of COMRAD-UK Handbook

ESA Radiation Design Handbook. PSS-609ESA Radiation Design Handbook. PSS-609 Handbook of Radiation Effects. OUP 1993.Handbook of Radiation Effects. OUP 1993. The use of commercial components in aerospace The use of commercial components in aerospace

technology. BNSC Contract Report 1999.technology. BNSC Contract Report 1999. Participation in CERN RD-49 collaboration. Participation in CERN RD-49 collaboration.

‘Hardened microelectronics and commercial ‘Hardened microelectronics and commercial components’.components’.

Various international seminars and workshops Various international seminars and workshops over past 5 years.over past 5 years.

Aims of COMRAD-UK Handbook

A brief (100 page) tutorial guide to the space A brief (100 page) tutorial guide to the space application of components.application of components.

To assist in the assessment of components in the To assist in the assessment of components in the COMRAD database for any particular mission.COMRAD database for any particular mission.

Provides guidance on Hardness Assurance Provides guidance on Hardness Assurance practices.practices.

Discusses the application of commercial Discusses the application of commercial components.components.

Handbook Contents

The Space Radiation EnvironmentThe Space Radiation Environment Radiation Effects Prediction TechniquesRadiation Effects Prediction Techniques Radiation Effects in Electronic ComponentsRadiation Effects in Electronic Components Designing Tolerant SystemsDesigning Tolerant Systems Radiation Effects DatabasesRadiation Effects Databases Radiation TestingRadiation Testing Hardness Assurance ManagementHardness Assurance Management Recommended Procurement PracticesRecommended Procurement Practices

COMRAD-UKExperts Forum

The Experts Forum allows users to post The Experts Forum allows users to post queries on the Web-site. queries on the Web-site.

These will, as far as possible, be answered These will, as far as possible, be answered by Spur Electron but it is also possible for by Spur Electron but it is also possible for other users to provide an input and start a other users to provide an input and start a discussion.discussion.

Summary

COMRAD-UK is a Web based integrated source COMRAD-UK is a Web based integrated source of components radiation effects data.of components radiation effects data.

COMRAD-UK is co-sponsored by the British COMRAD-UK is co-sponsored by the British National Space Centre and maintained on their National Space Centre and maintained on their behalf by SPUR-Electron.behalf by SPUR-Electron.

The site is under continuous development The site is under continuous development - comments and suggestions are welcome.- comments and suggestions are welcome.

– comrad-uk.netcomrad-uk.net– radinfo@spurelectron.comradinfo@spurelectron.com

Hardness Assurance in the real world

WE HAVEN’T GOT THE MONEYWE HAVEN’T GOT THE MONEY

SO WE’VE GOT TO THINK.SO WE’VE GOT TO THINK.

(Lord Rutherford 1871-1937)(Lord Rutherford 1871-1937)