sata qualification test report template

Important!

Printed copies of this document are considered current only on the date of print.

It is the responsibility of the user for the replacement and disposal of previous versions.

StorFly® CE M.2 Slim SATA MO-297 6Gb/s SSD

VSF205CI100G-A902 Qualification Test Report

1.0 Introduction

1.1 Purpose

The purpose of this design qualification and verification report is to evaluate the reliability, compatibility and performance of Virtium SSD SATA products. The products are subjected to various forms of environmental stress during the qualification testing to simulate industrial environmental extremes.

1.2 Scope

This document describes the required tests that were performed based upon the Virtium qualification requirements as dictated in Section 2.0, Qualification Tests. Table 1 lists the drives that were tested for this qualification report.

Table 1: SSDs Tested for Evaluation

Product Number Capacity Form Factor

VSF205CI100G-A902 100GB Slim SATA MO-297

1.3 Conclusion

Table 2: Conclusion Descriptions and Results

Description Result

Qualification Tests Pass

Environmental Functionality Qualification Pass

Compatibility Qualification Pass

Endurance Qualification Pass

Qualification Test Report

StorFly® Slim SATA 6.0Gb/s SSD Revision

VSF205CI100G-A902 1.7

Tel 949.888.2444 – 30052 Tomas, Rancho Santa Margarita, CA 92688 www.virtium.com

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Table of Contents 1.0 Introduction ............................................................................................................................................................ 1

1.1 Purpose ........................................................................................................................................................... 1 1.2 Scope ............................................................................................................................................................... 1 1.3 Conclusion ....................................................................................................................................................... 1

2.0 Qualification Tests ................................................................................................................................................ 6 2.1 Electrical Qualification ..................................................................................................................................... 6

2.1.1 SATA PHY SI Test ................................................................................................................................ 6 Objective ................................................................................................................................ 6 Sample Size ........................................................................................................................... 6 Equipment and Software ........................................................................................................ 6 Pass/Fail Criteria .................................................................................................................... 7 Results ................................................................................................................................... 7

2.1.2 In-Rush Current ................................................................................................................................... 10 Objective .............................................................................................................................. 10 Sample Size ......................................................................................................................... 10 Equipment and Software ...................................................................................................... 10 Power Analyzer Setup.......................................................................................................... 10 Graceful Bootup ................................................................................................................... 10 Hot Plug ............................................................................................................................... 10 Pass/Fail Criteria .................................................................................................................. 10 Results ................................................................................................................................. 11

2.1.3 Power Integrity Test ............................................................................................................................ 12 Objective .............................................................................................................................. 12 Sample Size ......................................................................................................................... 12 Equipment and Software ...................................................................................................... 12 Pass/Fail Criteria .................................................................................................................. 12 Results ................................................................................................................................. 12 Ripple Noise Graphs ............................................................................................................ 13

2.2 Protocol and Regression ............................................................................................................................... 16 2.2.1 Objective ............................................................................................................................................. 16 2.2.2 Sample Size ........................................................................................................................................ 16 2.2.3 Equipment and Software ..................................................................................................................... 16 2.2.4 Pass/Fail Criteria ................................................................................................................................. 16 2.2.5 Results ................................................................................................................................................ 16

2.3 Power Cycle with Data Compare ................................................................................................................... 18 2.3.1 Objective ............................................................................................................................................. 18 2.3.2 Sample Size ........................................................................................................................................ 18 2.3.3 Equipment and Software ..................................................................................................................... 18 2.3.4 Procedure ............................................................................................................................................ 19 2.3.5 Pass/Fail Criteria ................................................................................................................................. 19 2.3.6 Results ................................................................................................................................................ 19

2.4 Customer Specific Test ................................................................................................................................. 20 2.4.1 Juniper “trigger_fsync10” Script .......................................................................................................... 20

Objective .............................................................................................................................. 20 Sample Size ......................................................................................................................... 20 Equipment and Software ...................................................................................................... 20 Pre-Requisites ...................................................................................................................... 20 Pass/Fail Criteria .................................................................................................................. 21

http://www.virtium.com/



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Results ................................................................................................................................. 21 2.5 Performance Qualification ............................................................................................................................. 22

2.5.1 Sequential Read and Write ................................................................................................................. 22 Objective .............................................................................................................................. 22 Sample Size ......................................................................................................................... 22 Equipment and Software ...................................................................................................... 22 Results ................................................................................................................................. 22 Sequential Read/Write Performance Graphs ...................................................................... 23

2.5.2 Random Read and Write ..................................................................................................................... 24 Objective .............................................................................................................................. 24 Sample Size ......................................................................................................................... 24 Equipment and Software ...................................................................................................... 24 Results ................................................................................................................................. 24 Random Read/Write Performance Graphs .......................................................................... 25

2.6 Power Consumption ...................................................................................................................................... 26 2.6.1 Objective ............................................................................................................................................. 26 2.6.2 Sample Size ........................................................................................................................................ 26 2.6.3 Equipment and Software ..................................................................................................................... 26 2.6.4 Pass/Fail Criteria ................................................................................................................................. 26 2.6.5 Results ................................................................................................................................................ 27

3.0 Environmental Functionality Qualification ....................................................................................................... 28 3.1 Four Corner Testing ...................................................................................................................................... 28

3.1.1 Objective ............................................................................................................................................. 28 3.1.2 Sample Size ........................................................................................................................................ 28 3.1.3 Equipment and Software ..................................................................................................................... 28 3.1.4 Pass/Fail Criteria ................................................................................................................................. 28 3.1.5 Results ................................................................................................................................................ 28

3.2 Normal Power Off Reset ................................................................................................................................ 29 3.2.1 Objective ............................................................................................................................................. 29 3.2.2 Sample Size ........................................................................................................................................ 29 3.2.3 Equipment and Software ..................................................................................................................... 30 3.2.4 Pass/Fail Criteria ................................................................................................................................. 30 3.2.5 Results ................................................................................................................................................ 30

3.3 Sudden Power Off Reset ............................................................................................................................... 31 3.3.1 Objective ............................................................................................................................................. 31 3.3.2 Sample Size ........................................................................................................................................ 31 3.3.3 Equipment and Software ..................................................................................................................... 32 3.3.4 Pass/Fail Criteria ................................................................................................................................. 32 3.3.5 Results ................................................................................................................................................ 32

3.4 Brownout ........................................................................................................................................................ 33 3.4.1 Objective ............................................................................................................................................. 33 3.4.2 Sample Size ........................................................................................................................................ 33 3.4.3 Equipment and Software ..................................................................................................................... 33 3.4.4 Pass/Fail Criteria ................................................................................................................................. 33 3.4.5 Results ................................................................................................................................................ 33

4.0 Compatibility Qualification ................................................................................................................................. 35 4.1 System Boot .................................................................................................................................................. 35

4.1.1 Objective ............................................................................................................................................. 35




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4.1.2 Sample Size ........................................................................................................................................ 35 4.1.3 Equipment and Software ..................................................................................................................... 35 4.1.4 Pass/Fail Criteria ................................................................................................................................. 35 4.1.5 Results ................................................................................................................................................ 35

4.2 System Interoperability .................................................................................................................................. 36 4.2.1 Objective ............................................................................................................................................. 36 4.2.2 Sample Size ........................................................................................................................................ 36 4.2.3 Equipment and Software ..................................................................................................................... 36 4.2.4 Pass/Fail Criteria ................................................................................................................................. 36 4.2.5 Results ................................................................................................................................................ 36

4.3 Field Upgradable Firmware ........................................................................................................................... 37 4.3.1 Objective ............................................................................................................................................. 37 4.3.2 Sample Size ........................................................................................................................................ 37 4.3.3 Equipment and Software ..................................................................................................................... 37 4.3.4 Pass/Fail Criteria ................................................................................................................................. 37 4.3.5 Results ................................................................................................................................................ 37

4.4 Security Erase / Sanitize ............................................................................................................................... 38 4.4.1 Objective ............................................................................................................................................. 38 4.4.2 Sample Size ........................................................................................................................................ 38 4.4.3 Equipment and Software ..................................................................................................................... 38 4.4.4 Pass/Fail Criteria ................................................................................................................................. 38 4.4.5 Results ................................................................................................................................................ 38

5.0 Endurance Qualification ..................................................................................................................................... 39 5.1 Endurance Lifetime Test ................................................................................................................................ 39

5.1.1 Objective ............................................................................................................................................. 39 5.1.2 Sample Size ........................................................................................................................................ 39 5.1.3 Equipment and Software ..................................................................................................................... 39 5.1.4 Pass/Fail Criteria ................................................................................................................................. 39 5.1.5 Results ................................................................................................................................................ 40

6.0 Confidentiality Statement ................................................................................................................................... 41 7.0 Revision History .................................................................................................................................................. 42




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List of Tables Table 1: SSDs Tested for Evaluation .............................................................................................................................. 1 Table 2: Conclusion Descriptions and Results ............................................................................................................... 1

List of Figures Figure 1: PHY Overall Result .......................................................................................................................................... 7 Figure 2: PHY Summary of Results ................................................................................................................................ 8 Figure 3: 6Gb/s Eye Diagram .......................................................................................................................................... 9 Figure 4: Graceful In-Rush Current ............................................................................................................................... 11 Figure 5: Hot-Plug In-Rush Current .............................................................................................................................. 11 Figure 6: Normal Power Off Reset Sequence ............................................................................................................... 29 Figure 7: Sudden Power Off Reset Sequence .............................................................................................................. 31 Figure 8: Brownout Profile ............................................................................................................................................. 34




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2.0 Qualification Tests

The purpose of this section is to describe the tests that are performed on the drives to meet the electrical, firmware, functional and compatibility requirements as described in this document. This section also states the sample size for each subsection, pass / fail criteria, and the results.

2.1 Electrical Qualification

2.1.1 SATA PHY SI Test

Objective

The objective of this test is to validate that the drive complies with the electrical requirements as dictated in the Serial ATA Interoperability Program, Revision 1.5. The results were achieved by using Ulink DriveMaster to set the drive test patterns as dictated by the Keysight SATA compliance test. The compliance test also employs an oscilloscope to collect the required data.

Sample Size

Sample Description

Product VSF205CI100G-JUN

Controller SM2259

Firmware 0206-000

Quantity 1 unit

Equipment and Software

Equipment/Software Description

Oscilloscope Keysight MSOX-92004A

Probe Wilder Technology SATA-TPA-R: SATA Plug Test Receptacle

Test System ULink DriveMaster

Software N5411B SATA Compliance Software




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Pass/Fail Criteria

The pass / fail criteria are defined in the Serial ATA Interoperability Program, Revision 1.5; Keysight Technologies, Inc. Method of Implementation (MOI) Document for SATA PHY, TSG and OOB Measurements (Real-Time Oscilloscope (DSO/DSA Models) Measurements).

Results

Figure 1: PHY Overall Result




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Figure 2: PHY Summary of Results




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Figure 3: 6Gb/s Eye Diagram




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2.1.2 In-Rush Current

Objective

This test will verify the maximum value of the supply current to the SSD during graceful bootup and hot plug. The purpose of the test is to ensure that the drive does not exceed the maximum value, thereby forcing the system power supply to shut off. Typically performed on highest capacity configuration.

Sample Size

Sample Description


Controller SM2259

Firmware 0206-000

Quantity 1 unit



Power Analyzer Keysight N6705B DC Power Analyzer

Test Adaptor 2.5” Power Cable + ((Interface Here)) SATA Adapter

Power Analyzer Setup

The test is performed by attaching the test fixtures to the power analyzer and setting the analyzer to 5V, 20A, with a Slew Rate of 15,225 V/S.

Graceful Bootup

The graceful boot up test is performed by attaching the drive to the power analyzer and the allowing the voltage to go from 0V to 5V.

Hot Plug

The hot plug test is performed by turning on the power analyzer and plugging the drive into the power cable while the analyzer outputs 5V.

Pass/Fail Criteria

Test Voltage Current

Graceful 3.3V ≤2A

Hot Plug 3.3V ≤2A




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Results

Test Voltage Current

Graceful 3.3V 0.55A

Hot Plug 3.3V 0.58A

Figure 4: Graceful In-Rush Current

Figure 5: Hot-Plug In-Rush Current




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2.1.3 Power Integrity Test

Objective

This test will verify that the power ripple noise of the individual power lanes does not exceed the allowable range during drive operation. This test is performed to ensure that there is no ripple on the power lanes to the active components during heavy workloads. The workload used for testing is a sequential write workload with a 128KB block size with a queue depth of 32. A low noise power supply will be used the power the drive during the test. Typically performed on highest capacity configuration.

Sample Size

Sample Description


Controller SM2259

Firmware 0206-000

Quantity 1 unit



Oscilloscope Keysight MSOX-92004A

Probe Keysight N7024A

Power Analyzer Keysight N6705B Power Analyzer

Test System Supermicro X11SPM-TF

SSD Operation Read/Write Test Program: IOMeter, Version 1.1.0

Pass/Fail Criteria

1.1V 3.3V 3.3V 1.8V 1.5V

Core A3V3 VccF VccFQ DRAM

Ripple Noise (Maximum)

100 mVP-P 300 mVP-P 300 mVP-P 100 mVP-P 100 mVP-P

Results

1.1V 3.3V 3.3V 1.8V 1.5V

Core A3V3 VccF VccFQ DRAM

Ripple Noise 83.4 mVP-P 201.5 mVP-P 208.1.6 mVP-P 84.2 mVP-P 60.48 mVP-P




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Ripple Noise Graphs

2.1.3.6.1 1.1V Core

2.1.3.6.2 3.3V A3V3




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2.1.3.6.3 3.3V VccF

2.1.3.6.4 1.8V VccFQ




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2.1.3.6.5 1.5V DRAM




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2.2 Protocol and Regression

2.2.1 Objective

This test will verify that the drive passes the ATA/SATA protocols according to the T-13 Command Set and the Serial ATA Revision 3.2 requirements.

2.2.2 Sample Size

Sample Description

Product VSF205CI100G-A902

Controller SM2259

Firmware 0512-000

Quantity 2 units

2.2.3 Equipment and Software


Test System Asus P10S WS

Software Ulink DriveMaster version 8, script version 6.5

SSD Operation Ulink ATA/SATA Protocol Test Script

2.2.4 Pass/Fail Criteria

Test acceptance on zero (0) failures.

2.2.5 Results

Protocol Test 100GB

Identify Info SATA Pass

DCO SATA, DCO Identify Info Pass

Mandatory Commands, ATA Commands Pass

Write Cache Flush Time Pass

SMART Set Pass

Power States, Power Management, IPM Pass

NCQ Pass

SSP, SSP States Pass




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Protocol Test 100GB

PHY Event Count Pass

SCT Pass

Security Feature Set Pass

ATA Data Set Management Pass

Device Sleep Pass

Sanitize Pass




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2.3 Power Cycle with Data Compare

2.3.1 Objective

This test will write random data as “Good Data” on the SSD target and perform a Flush Cache and StandbyIM. This test is required for any drive that does not have a power holdup circuit; it will continue writing “Power Off Data” while asynchronously powering off the device. The test will verify the device Power-On Ready Time after the device is powered on and verify that the device is ready for commands. The test will finally compare the “Good Data”. “Power Off Data” verified if the SSD target has PLP. Average Power-On Ready time will be calculated over the entire test run.

2.3.2 Sample Size

Sample Description


Controller SM2259

Firmware 0512-000

Quantity 2 units



Test System Asus P105 WS

Software Ulink DriveMaster version 8, script version 6.5

SSD Operation Ulink ATA/SATA Regression Test Script




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2.3.4 Procedure

1. Configure PwrCycle_DataCmp_Cfg

1.1. DmaNcqMode = 2

1.2. GoodDataWrCmdCnt = 100

1.3. bFlsh = 1

1.4. wOnRdyTimeout = 8000

1.5. PwOffDelay = 5000

1.6. MaxDMALoopNum = 1000

1.7. MaxNCQLoopNum = 1000

2. Execute PwCycle_DataCmp.ens in Drivemaster

3. Specify StandbyIM enable


Test acceptance on zero (0) failures for “Good Data” and verified; the SSD target shall become ready with minimal soft resets.

2.3.6 Results

Regression Test 100GB

PwCycle_DataCmp Pass

Power-On Ready (avg) – Drive1 272ms

Power-On Ready (avg) – Drive2 85ms




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2.4 Customer Specific Test

2.4.1 Juniper “trigger_fsync10” Script

Objective

This test will measure the completion time of a 16MB file transfer followed by a Flush Cache command. The expected result is to verify that the file transfer and flush cache operations complete in less than one (1) second. Write performance (average) shall be greater than 300MB/s (dependent on capacity).

Sample Size

Sample Description


Controller SM2259

Firmware 0512-000

Quantity 2 units



Operating System CentOS 7 minimal Installation, Kernel 3.10.0-862.e17.x86_64


Drive Format EXT4 Root Partition, Device Mapper Disabled

Software trigger_fsync10

Pre-Requisites

1. Secure erase drive. Fresh out of box (FOB).

2. Low level format the drive. (if applicable)

3. Power cycle the drive.

4. Use the SSD as primary SSD and Install the OS (Use only CentOS / Redhat 7.2 or 7.3 or). While

installing OS on the SSD using the entire capacity of drive.

5. File system to be used EXT4 only and not XFS or any other file system.

6. LVM / Device Mapper (DM) or RAID modes disabled.

7. Do not create any additional partition except the one root “/” partition.

8. SSD should be directly connected through SATA port/connector, do not use any HBA to connect the

SSD.

9. Remove any USB devices during the entire test run. USB devices will only be used to transfer log files

from the root partition at beginning and end of the test run.

10. Capture logs at start of test and end of test:

a. SMART via smartctl utility. All attributes to display correct description redirected to file.

b. dmesg log redirected to file.

c. Latency test log (at end of test).

11. Test needs to run for 50 full drive writes. Calculate the iterations accordingly and provide the value while

launching the script.

12. CMD line arguments: ./trigger_fsync10 /junos/test 16777216 [# Iterations] 0 6000 500




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13. Number of iterations calculated based on Capacity to achieve 50 drive writes

a. 100GB = 160,000 iterations

b. 100GB = 320,000 iterations

c. 200GB = 640,000 iterations

d. 400GB = 1,280,000 iterations

Pass/Fail Criteria

1. FSYNC latency (worst delay) < 1 sec

2. Avg sequential write performance (16/avg latency x 1000)

a. 300 MB/s for devices > 200GB

b. 200MB/s for 100GB devices

c. 160MB/s for < 100GB

Results

Test Result Sample 1 Sample 2

FSYNC latency (worst delay) 135ms 99ms

Sequential Write Performance (average) 56ms / 286MB/s 55ms / 291MB/s




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2.5 Performance Qualification

2.5.1 Sequential Read and Write

Objective

This test will verify that the drive meets the sequential performance specification as required. Performance profile as follows:

1. Precondition drive with a 128K sequential write workload. At least two drive writes to enter steady state performance.

2. Performance graph IO size 0.5K, 1K, 2K, 4K, 8K, 16K, 32K, 64K, 128K, 256K, 512K, 1024K, 2048K. 3. Each IO size will be measured during a 30 second run. 4. Loop on Queue Depth 1, 2, 4, 8, 16, 32. 5. Repeat for Sequential Read and Write.

Sample Size

Sample Description


Controller SM2259

Firmware 0512-000

Quantity 100GB, 1 unit



Operating System Linux

Test System Oakgate D-Series Desktop; Driver v3.8.2, Discovery Agent v9.3.6

Drive Format Raw

Software Oakgate SVF v3.8.2

Results

Note: All values are expressed in MB/s.

Test Result 100GB

128KB Sequential Read 540

128KB Sequential Write 300




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Sequential Read/Write Performance Graphs

2.5.1.5.1 100GB Sequential Read MB/s

2.5.1.5.2 100GB Sequential Write MB/s




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2.5.2 Random Read and Write

Objective

This test will verify that the drive meets the random performance specification as required. Performance profile as follows:

1. Precondition drive with a 4K random write workload. At least two drive writes to enter steady state performance.

2. Performance graph IO size 0.5K, 1K, 2K, 4K, 8K, 16K, 32K, 64K, 128K, 256K, 512K, 1024K, 2048K 3. Each IO size will be measured during a 30 second run. 4. Loop on Queue Depth 1, 2, 4, 8, 16, 32. 5. Repeat for Random Read and Write.

Sample Size

Sample Description


Controller SM2259

Firmware 0512-000





Test System Oakgate

Drive Format Raw


Results

Test Result 100GB

4KB Random Read (IOPS) 73,000

4KB Random Write (IOPS) 8,000




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Random Read/Write Performance Graphs

2.5.2.5.1 100GB Random Read IO/s

2.5.2.5.2 100GB Random Write IO/s




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2.6 Power Consumption

2.6.1 Objective

This test will measure the amount of power the drive consumes at idle and various workloads. The test should not exceed the values dictated by product requirements. The test is performed using Oakgate, with various workloads and maximum queue depth. Power data is measured by the Oakgate power interposer or the Keysight DC power Analyzer.

Notes:

1. Maximum capacity SSD with full NAND placements to represent worst case power consumption.

2. All tests will measure the Average power consumption over the course of a 15-minute interval.

2.6.2 Sample Size

Sample Description


Controller SM2259

Firmware 0512-000





Test System Oakgate

Drive Format Raw



Note: All values are expressed in Watts.

Power Condition Power (W)

Maximum ≤5

Idle ≤2




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2.6.5 Results

Note: All values are expressed in Watts.

Parameter Power (W)

Sequential Read 2.20

Sequential Write 3.00

Random Read 2.40

Random Write 2.90

Idle 0.99

Note: The results reflect the average power consumption.




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3.0 Environmental Functionality Qualification

3.1 Four Corner Testing

3.1.1 Objective

This test will verify that the drive remains functional between -40oC to 85oC with the voltage set at 5V±10%. The test is performed by setting the voltage input to -10% and running a functional BurnIn Test with data verify at 85oC. The temperature in the chamber is ramped down after 12 hours to -40oC and run for an additional 12 hours. The test is then repeated with the drive input voltage set to +10%.

3.1.2 Sample Size

Sample Description

Product VSF205CI100G-JUN, VSF205CI050G-A901

Controller SM2259

Firmware 0206-000

Quantity 100GB 1 unit, 50GB 1 unit



Test Chamber Espec


Test Program BurnIn Test Pro v8.0



3.1.5 Results

Test Condition 100GB

4.5V@85oC Pass

4.5V@-40oC Pass

5.5V@85oC Pass

5.5V@-40oC Pass




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3.2 Normal Power Off Reset

3.2.1 Objective

This test is designed to detect high / low temp power cycling failures. It will verify that data has been written to the correct LBA during a normal power off event, with caching enabled at -40oC to 85oC. The test is performed by writing data to the drive, verifying the system completed writes to the drive (ATA StandbyIM), and finally shutting off power and soaking in an off state. Upon power up, the test will verify firmware / metadata integrity and user data. The test is run for 1,000 iterations at -40oC and 85oC.

3.2.2 Sample Size

Sample Description


Controller SM2259

Firmware 0512-000


Figure 6: Normal Power Off Reset Sequence




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Power Relay ULink Power Hub

Power Supply Keithley 2260B-80-27 Programmable Power Supply

Test Program Ulink DriveMaster custom script



3.2.5 Results

Temperature 100GB

85oC Pass

-40oC Pass




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3.3 Sudden Power Off Reset

3.3.1 Objective

This test is designed to detect high / low temp power cycling failures with the added metadata rebuild operation on startup due to ungraceful power cycling. It will verify the data has been written to the correct LBA during a sudden power off event, with caching enabled at -40oC to 85oC. The test is performed by writing data to the drive, cutting power during writes and soaking in the power off state. Upon power up, the test will verify firmware / metadata integrity and user data. User data already committed to NAND will be verified. Data in the write cache will be presumed lost. The test is run for 1,000 iterations at -40oC and 85oC.

3.3.2 Sample Size

Sample Description


Controller SM2259

Firmware 0512-000


Figure 7: Sudden Power Off Reset Sequence




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Power Relay ULink Power Hub

Test Program Ulink DriveMaster custom script



3.3.5 Results

Temperature 100GB

85oC Pass

-40oC Pass




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3.4 Brownout

3.4.1 Objective

This test will verify that low voltage dips on the SSD power supply input do not affect drive operational performance. The test is performed by setting the power supply to dip to -5% for a 30ms duration every 30 seconds during the burn-in test for two (2) hours. Typically performed on highest capacity configuration.

3.4.2 Sample Size

Sample Description


Controller SM2259

Firmware 0512-000





Power Supply Keysight N6705B DC Power Analyzer




3.4.5 Results

100GB

Pass

Note: This test occurs at room temperature or approximately 25oC.




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Figure 8: Brownout Profile




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4.0 Compatibility Qualification

4.1 System Boot

4.1.1 Objective

This test will verify that the SSD target is functional with various operating systems. The test ensures that the various operating systems can be loaded onto the SSD target. Warm and Cold boot cycles will be completed (10 cycles each). File system partitions will be created, and BurnIn Test will be run for 30 minutes.

4.1.2 Sample Size

Sample Description


Controller SM2259

Firmware 0512-000

Quantity 100GB, 2 units



Test System Asus P10S WS, PXE Server

Test Program BurnIn Test Pro v7.0 (Windows and Linux)



4.1.5 Results

Operating System 100GB

RedHat 8 Pass

Ubuntu 16.04 Pass

Windows 10 Pass




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4.2 System Interoperability

4.2.1 Objective

This test will verify that the drive functions on a variety of CPU and chipsets on the Windows OS platform. The test will ensure that the drive is compatible with the hardware and various BIOS configurations implementing aggressive link power management. This test will require that the drive be detected by the system and undergo the burn-in test.

4.2.2 Sample Size

Sample Description


Controller SM2259

Firmware 0512-000




Test System Multiple Platforms




4.2.5 Results

System, CPU 100GB

Asus P10S WS, Intel i7-6700 Pass

Supermicro X11SPM-TF. Xeon Silver 4016 Pass

Asus 297M-Plus, i54600K Pass

Asus 885M-E, i5-4690K Pass




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4.3 Field Upgradable Firmware

4.3.1 Objective

This test will verify that the drive firmware can be upgraded using Linux and/or Windows CLI utilities. The test will require that the drive to upgrade the firmware and verify that no SMART attributes were adversely changed due to the upgrade. A snapshot of SMART attributes will be taken before and after upgrade. Test results will include configuration specific DLMC binary for field use.

4.3.2 Sample Size

Sample Description


Controller SM2259

Firmware 0512-000





Test Program Linux hdparm


Minimum 10 cycles (5 cycles mode 3, 5 cycles mode 7) to verify FW download microcode update. Linux hdparm will be the default tool used unless otherwise specified in results.

4.3.5 Results

Test 100GB

Mode 3 Pass

Mode 7 Pass




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4.4 Security Erase / Sanitize

4.4.1 Objective

This test will verify that the drive is compliant with the standards for solid-state storage sanitization. Once sanitization is complete, the test will verify that every page in every block has been erased or overwritten with the predefined pattern specified by the user.

Note: Only supported erase methods will be tested

4.4.2 Sample Size

Sample Description


Controller SM2259

Firmware 0512-000





Test Program Drivemaster custom scripts


• Each erase method will complete without an error status (ATA status will report busy until complete).

• Power cycling during erase method (5 power cycles) will result in resuming erase.

• Military erase methods will perform multiple block erase and data overwrite patterns. Validate the last pattern written. Must match user input pattern, data compliment or randomly chosen pattern depending on erase method.

• Expect all user data blocks to contain final pattern in method. Verified by directly reading NAND blocks (through AES engine), bypassing LBA mapping using vendor specific commands.

Note: LBAs will not be mapped to physical NAND blocks after a Security Erase or Sanitize. All LBAs are unmapped until written again by user. LBAs will return zero data in an unmapped state. Performance to return to initial out of box levels.

4.4.5 Results

Secure Erase 100GB

Basic Erase Pass




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5.0 Endurance Qualification

5.1 Endurance Lifetime Test

5.1.1 Objective

This test will verify that the SSD target can withstand heavy workloads for sustained periods and determine maximum Terabytes Written (TBW) that is derived from the measured Write Amplification Factor (WAF). Tests are performed at room temperature (approximately 25oC) running JESD219 Enterprise Workload (Drive 1) and Sequential Write 100% Workload (Drive 2). The tests are completed after 120 hours.

5.1.2 Sample Size

Sample Description


Controller SM2259

Firmware 0512-000





Test Program VDBENCH


Juniper specific requirement: Minimum TBW for JESD219 Enterprise profile:

o Minimum 2 drives per workload and 120 hour runtime o 100GB: 100GB x 0.6 x 5 x 365 = 55 TB minimum o 100GB: 100GB x 0.6 x 5 x 365 = 110 TB minimum o 200GB: 200GB x 0.6 x 5 x 365 = 220 TB minimum o 400GB: 400GB x 0.7 x 5 x 365 = 511 TB minimum




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5.1.5 Results

Workload Sample 1 TBW Sample 2 TBW

JESD219 Enterprise Workload 589.45 589.22

Sequential Write 100% Workload 719.21 719.21




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6.0 Confidentiality Statement

THIS DOCUMENT AND ALL INFORMATION PROVIDED HEREIN REMAINS THE SOLE AND EXCLUSIVE PROPERTY OF VIRTIUM LLC. THE RECIPIENT MUST KEEP ALL INFORMATION IN STRICT CONFIDENCE AND TRUST, AND MUST NOT, DIRECTLY OR INDIRECTLY, IN ANY WAY, DISCLOSE, MAKE ACCESSIBLE, POST ON A WEBSITE, REVEAL, REPORT, PUBLISH, DISSEMINATE OR TRANSFER ANY INFORMATION TO ANY THIRD PARTY. THE RECIPIENT MUST NOT REPRODUCE OR COPY INFORMATION, WITHOUT SPECIFIC WRITTEN CONSENT FROM VIRTIUM LLC.




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7.0 Revision History

Date Revision Page(s) Description

06/19/2019 1.0 All Initial release.

06/21/2019 1.1 All Formatting updates.

08/01/2019 1.2 6-9 Section 2.1; updated units and thresholds.

08/29/2019 1.3 43-45 Section 4.9; Section 4.10; updated test coverage details.

10/04/2019 1.4 All Technical review and minor editorial corrections.

01/10/2020 1.5 20-30 Performance objective definition update.

07/14/2020 1.6 26-29 Section 3.3, 3.4; Updated Normal and Sudden power cycle figures

08/03/2020 1.7 All Formatting updates


Virtium manufactures storage and memory and solutions for the world’s foremost industrial embedded OEMs. For over two decades, we have designed, manufactured and supported our products in the USA – fortified by a network of global locations. Our world-class technology and unsurpassed support provide a superior customer experience that continuously results in better industrial embedded products for an increasingly interconnected world.

© Copyright 2019. All rights reserved. Virtium®, StorFly®, StorFly-IoT® TuffDrive®, vtView®, vtGuard® are registered trademarks and vtSecure™ is a trademark of Virtium LLC. All other non-Virtium product names are trademarks of their respective companies.

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