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the art of metrology TM FRT Multi Sensor Metrology for Wafer Industries FRT, Fries Research & Technology …since 1995

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the art of metrologyTM

FRT Multi Sensor Metrology for Wafer Industries

FRT, Fries Research & Technology

…since 1995

the art of metrologyTM

FRT provides a worldwide network for sales and service

FRT stands for reliable technology and premium customer support

Distributors: Around 20 in 18 countries

FRT International Sales and Service Network

the art of metrologyTM

tabletop

fully integrated production tool

Company Introduction FRT‘s Range of Metrology Tools

the art of metrologyTM

FRT MicroScope WLI Lab Metrology Tool

the art of metrologyTM

FRT MicroSpy® Affordable Metrology Tool

the art of metrologyTM

established standard metrology tool

several hundred tools in industrial use

easy to use, high reliability

on site upgradable to TTV setup

on site upgradable to fully automated MHU

measurement according to Semi standards

IR and Film Thickness upgrades optional

adjustable to specific metrology tasks

high performance software and hardware

FRT MicroProf® Semi Automated Metrology Tool

the art of metrologyTM

FRT MicroProf® Wafer Metrology Tool

MicroProf® 200 MHU

Multi Sensor metrology tool

with 200 mm stage and

material handling unit

MicroProf® 300 TTV MHU

Multi Sensor metrology tool with 300 mm

stage, sensor setup for wafer thickness

measurement (TTV), fully automated

SEMI Compliant TTV Measurement

FRT MFE - Metrology for Frontend

Fully automated Multi Sensor metrology

tool with 300 mm stage, bridge tool, class

1 EFEM, SECS/GEM interface, thin wafer

handling optional

the art of metrologyTM

FRT MicroProf® TTV with MHU Fully Automated Material Handling Unit

high throughput, >150 w/h

fully automated

high reliability

sorting capability

the art of metrologyTM

FRT MicroProf® MicroProf® with Thin Wafer Handling

the art of metrologyTM

MEMS Metrology FRT‘s Major Target Industries

One Metrology Tool for All Wafer Tasks !!!

the art of metrologyTM

FRT Multi Sensor Technology Multi Sensor Technology for Flexible Metrology Systems

FRT offers various sensors giving 4 basic combination options:

Multisensor Configuration

the art of metrologyTM

optical measurement,

fast and non contact

down to 6 nm vertical resolution

2 µm lateral resolution

4 kHz measuring frequency 400 nm 540 nm 680 nm blue green red

intensity and wavelength

λ

step height

400 nm 540 nm 680 nm blue green red

I

λ

FRT MicroProf® FRT CWL Sensor Technology

the art of metrologyTM

Data:

Michelson interferometer

85 mm x 85 mm range

170 µm lateral resolution

z-resolution 1.4 nm

image frequency 10 to 30 s/f

FRT MicroProf® FRT Field of View Sensor Technology

the art of metrologyTM

FRT MicroProf® FRT Film Thickness Sensor FTR

Downhill Simplex fit, up to 10 layers

iterative fit with FFT, with one or two variable film thickness values

FFT for thickness bigger 2 µm, 2 layers

database with 40 materials

upgradable

the art of metrologyTM

Applications and Automation Roughness, Topography, Profiles

the art of metrologyTM

Polished side Rough side

FRT MicroProf® TTV Measurements on Wafers

the art of metrologyTM

FRT MicroProf® Acquire Automation XT Software

die layout wizard

define die structure and alignment marks

define sensor and measurement setting

import and export measurement positions

the art of metrologyTM

FRT MicroProf® IR Wafer Thickness Measurement

single side IR measurement

the art of metrologyTM

FRT MicroProf® Nanotopography Measurement

measurement of nanotopography

measurement of dimples

the art of metrologyTM

FRT MicroProf® Measurement of Doped Wafers

up to 150 µm thickness of heavily doped wafers

the art of metrologyTM

TSV measurement

high aspect ratio ( > 1:40)

FRT MicroProf® TSV Measurements

the art of metrologyTM

FRT MicroProf® MEMS Measurements

the art of metrologyTM

FRT Metrology MST / MEMS Measurements

Samples: Danfoss Silicon Power GmbH

the art of metrologyTM

FRT Metrology MST / MEMS Measurements

the art of metrologyTM

FRT MicroProf® Thickness Measurement

measurement of film thickness

interferometry, reflectometry, IR

SU8 measurement

SiO2 on Si

the art of metrologyTM

Company Introduction More than 500 Tools in the Market

the art of metrologyTM

Thank you for your attention!

Headquarters FRT, Fries Research & Technology GmbH Friedrich-Ebert-Strasse 51429 Bergisch Gladbach, Germany Tel.: +49 (0) 2204 - 84 2430 Fax: +49 (0) 2204 - 84 2431 Internet www.frt-gmbh.com E-Mail [email protected]

FRT of America, LLC

1101 South Winchester Blvd.,

Suite L-240

San Jose, CA 95128, USA

Tel. +1 408-261-2632

Fax +1 408-261-1173 Internet www.frtofamerica.com E-Mail [email protected]

FRT Shanghai Co., Ltd.

Room A18, 3rd Floor,

No.475 Fute No. 1 Rd. (W.)

Waigaoqiao Free Trade Zone,

Shanghai, China 200131

Tel +86-21-3876-0907

Fax +86-21-3876-0917 Internet www.frt-china.cn E-Mail [email protected]

FRT Taiwan

2F.-1, No.47, Ln. 223, Sec. 4,

Zhongxiao E. Rd.,

Da-an Dist., Taipei City 106,

Taiwan, Republic Of China

Tel. +886 (0)2 8772 5546

Fax +886 (0)2 8772 5546 Internet www.frt-china.cn E-Mail [email protected]