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1 EECS 427 EECS 427 VLSI Design I TuTh 10:00-11:30am Disc: Tu 5:30-6:30pm EECS 427 F08 Lecture 1 1 Prof. David Blaauw http://www.eecs.umich.edu/courses/eecs427 Outline What you can expect to learn in this class What you can expect to learn in this class Logistics – teaching staff intro, go over syllabus CMOS processing sequence EECS 427 F08 Lecture 1 2

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EECS 427EECS 427VLSI Design I

TuTh 10:00-11:30am Disc: Tu 5:30-6:30pm

EECS 427 F08 Lecture 1 1

pProf. David Blaauw

http://www.eecs.umich.edu/courses/eecs427

Outline

• What you can expect to learn in this class• What you can expect to learn in this class• Logistics – teaching staff intro, go over

syllabus• CMOS processing sequence

EECS 427 F08 Lecture 1 2

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What you will learn in 427• 312 – Transistors design and behavior• 270 – Logic design – combining transistorsg g g• 370 – Architecture – high level organization

• 427 – VLSI: realization of circuits in silicon: – The entire process of very large-scale integration– Generation of custom layout– Sub-system design such as adders, register files..

EECS 427 F08 Lecture 1 3

y g g– Synthesis + automated place/route design flow– Advanced circuit design topics: pulsed latches,

memory decoder and sense amplifiers, power, etc.Project - Teamwork

Teaching Staff• Primary instructors:

– David Blaauwoffice hours: Tuesday 11:30 1:00pm Thursday 11:30• office hours: Tuesday 11:30 – 1:00pm, Thursday 11:30 –Noon. Both lecture material and project

• GSI:– Brian Cline

• Support of CAD (Computer-Aided Design) tools and project related issues as well as lecture material.

• Staff support:

EECS 427 F08 Lecture 1 4

• Staff support:– Joel Van Laven

• Major CAD tool issues (pertaining to the project); consult after Brian

3

Course setup

• Tues and Thur lectures in 1303 EECS• Tuesday discussion section led by Brian (1200 EECS)uesday d scuss o sec o ed by a ( 00 CS)

– Purpose of discussion: review lecture topics, review CAD assignments and answer project related questions

• Homeworks– Only 1 ‘typical’ HW, others handle planning issues of project

(groups, initial proposal, etc.)• CAD assignments

– Roughly weekly, several 2+week assignmentsE h i t t t f fi l

EECS 427 F08 Lecture 1 5

– Each assignment represents a component of your final microprocessor design

– First 2 are individual, rest are in groups• Quizzes: 2 - roughly every 6 weeks, non-cumulative.

Project• Main component of class, 70+% of your grade• Design a 16-bit RISC (reduced instruction set

computing) processorcomputing) processor– Groups of 4 (you choose)

• Good to have a mix of EE and CE • Baseline architecture (instruction set) given to you; you choose

and implement a circuit-level enhancement technique– Time requirements: 30-40 hrs/week avg. 427 → 247– Peer contribution forms; must pull your weight

• Learn full-custom design (datapath) and automation tools (logic synthesis + custom router + place/route)

EECS 427 F08 Lecture 1 6

tools (logic synthesis + custom router + place/route)• You can send this design off to be fabricated and

then test it later as a directed study or possibly in EECS 579 (encouraged!)

4

Logistics• Course Textbook:

Digital Integrated Circuits: A Design Perspective, 2nd

edition by Rabaey Chandrakasan and Nikolicedition by Rabaey, Chandrakasan, and Nikolic

• Lecture notes will be posted online shortly after class sessions and I will bring copies to class for note taking

• Book will be supplemented with several handouts from other sources throughout the semesterOth b k t M di U i (W t

EECS 427 F08 Lecture 1 7

• Other books on reserve at Media Union (Weste, Chandrakasan)– Weste/Harris in particular is recommended if you want to

pursue a career/graduate studies in digital circuits

Grade Breakdown

• Your project, in the form of CAD assignments and final report/presentation is the dominantand final report/presentation, is the dominant part of your grade

Homework 10%CAD assignments 35%Quizzes 24% (12% each)

EECS 427 F08 Lecture 1 8

( )Final project/report, indiv. contrib. 31%

CAD late policy: within 24 hours = 25% penalty, 24-48 hours = 50% penalty, see course info handout

5

Project Schedule• Tutorial 1 (CAD): Tuesday, September 2 - 5:30 – 7:30• CAD1 (Inverter/Nand/Mux): Monday, September 8• CAD2 (D flip-flop): Monday September 15• CAD2 (D flip-flop): Monday, September 15• CAD3 (Register file): Friday, September 26• CAD4 (ALU): Friday, October 10• CAD5 (Shifter): Friday, October 24• Tutorial 2 (verilog): Tuesday, October 28• CAD6 (Datapath): Friday, October 31• CAD7 (program counter): Friday, November 7

EECS 427 F08 Lecture 1 9

(p g ) y,• CAD8 (controller): Friday, November 14• CAD9 (completion):

– Presentation & demo: Thursday Dec 12, – Report due: Same day (Dec. 12) at 7am

Lecture ScheduleDate Topic Reading/Coverage Notes,

assignments dueSeptember 2 Course Introduction, 1.1-1.3 (review), 2.2, CAD tutorial, 9/2

Manufacturing WH 3.2 5:30-7:30pm & 7:30-9:30, 1695 CSE

9/4 Design Rules & Layout 2.3, Insert A, WH 1.5, WH 3.3

CAD1 due 9/8

9/9 Design Styles Overview 8.1-8.4

9/11 CMOS Review 5.4, 6.2 HW1 due in classCAD2 due 9/15

9/16 Interconnect Review 4.3.1, 4.3.2, 4.4.1-4.4.3, 9.3.3

HW2 due in class (teams)

9/18 Project Architecture and Intro to Logical Effort

handouts

9/23 Logical Effort handouts

9/25 Adders 11.1-11.3.1 CAD3 due 9/26

9/30 Adders 11.3.2-11.3.3

EECS 427 F08 Lecture 1 10

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Lecture ScheduleDate Topic Reading/Coverage Notes,

assignments dueOctober 2 Shifters 11.5, WH 10.8 HW3 due in class

(initial proposal)10/7 Multipliers 11.4

10/9 Power/Energy, Dynamic Logic

5.5, 6.3, CBF 7 CAD4 due 10/10

10/14 Low-Power ALUs 11.7

10/16 Quiz 1

10/20, 10/21 - Fall Study Break, No Classes

10/23 Counters pipelining WH 10 5 notes CAD5 due 10/2410/23 Counters, pipelining WH 10.5, notes CAD5 due 10/24

10/28 Synthesis/APR flow Notes, WH 8.4

10/30 Timing, skew/jitter 10.1-10.3 CAD6 due 10/31

November 4 Timing cont., D-Q, pulsed latches

10.3, 7.4 HW4 due in class (detailed proposal)

EECS 427 F08 Lecture 1 11

Lecture ScheduleDate Topic Reading/Coverage Notes,

assignments due11/6 Design-for-Test (DFT) Insert H.3, CBF 25 CAD7 due 11/7

11/11 Memory Core and Peripherals

12.1-12.3

11/13 Memory Reliability and Power 12.4, 12.5 CAD8 due 11/14

11/18 System-Level Power Reduction

6.4.2, CBF 4

11/20 Quiz 2

11/25 Clock Distribution & Robustness

10.3.3, 10.6,CBF Ch. 13

11/26, 11/27, 11/28 - Thanksgiving Break, No Classes

EECS 427 F08 Lecture 1 12

7

Lecture ScheduleDate Topic Reading/Coverage Notes,

assignments dueDecember 2 Advanced Interconnect 9.5

Techniques12/4 Power Grid and Other Issues WH 12.3, CBF 24

12/9 Process Variation Course Evaluations in class

12/12 Final Project DemosFinal Project Presentations(Time TBD)

CAD9: Final DueHW5: Final Report due @7amHW6: Presentations

EECS 427 F08 Lecture 1 13

5 Minute break!

EECS 427 F08 Lecture 1 14

8

CMOS Process

EECS 427 F08 Lecture 1 15

A Modern CMOS Process

gate-oxide

p-well n-well

p-epi

SiO2

AlCu

poly

n+

SiO2

p+

Tungsten

TiSi2

EECS 427 F08 Lecture 1 16

p+

DualDual--Well TrenchWell Trench--Isolated CMOS ProcessIsolated CMOS Process

9

Circuit Under Design

VDD VDD

Vin Vout

M1

M2

M3

M4

Vout2

EECS 427 F08 Lecture 1 17

Its Layout View

EECS 427 F08 Lecture 1 18

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oxidation

opticalmask

Photolithographic Process

photoresist coatingphotoresistremoval (ashing)

photoresist

stepper exposure

development

Typical operations in a single photolithographic cycle (from [Fullman]).

EECS 427 F08 Lecture 1 19

processstep

spin, rinse, dryacid etch

development

Patterning of SiO2

Si-substrate

(a) Silicon base materialSiO2Hardened resist

Chemical or plasmaetch

(a) Silicon base material

(b) After oxidation and depositionof negative photoresist

PhotoresistSiO2

UV-lightPatterned

Si-substrate

Si-substrate

Si-substrate

SiO2

(d) After development and etching of resist,chemical or plasma etch of SiO2

(e) After etching

Hardened resist

EECS 427 F08 Lecture 1 20

Si-substrate Si-substrate

(c) Stepper exposure

optical mask

Exposed resist SiO2

(e) te etc g

(f) Final result after removal of resist

11

CMOS Process at a GlanceDefine active areasEtch and fill trenches

Implant well regions

Deposit and patternpolysilicon layer

Implant source and drain

EECS 427 F08 Lecture 1 21

Implant source and drainregions and substrate contacts

Create contact and via windowsDeposit and pattern metal layers

CMOS Process Walkthrough

p-epi (a) Base material: p+ substrate with p-epi layerp+ with p-epi layer

p+

p-epi SiO2

3SiN

4(b) After deposition of gate-oxide and sacrificial nitride (acts as abuffer layer)

EECS 427 F08 Lecture 1 22

p+

(c) After plasma etch of insulatingtrenches using the inverse of the active area mask

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CMOS Process WalkthroughSiO2

(d) After trench filling,CMP planarization and

n

CMP planarization, and removal of sacrificial nitride

(e) After n-well and Vthpadjust implants

EECS 427 F08 Lecture 1 23

p(e) After p-well and Vthnadjust implants

CMOS Process Walkthroughpoly(silicon)

(g) After polysilicon deposition

p+n+

(g) After polysilicon depositionand etch

(h) After n+ source/drain andp+ source/drain implants. Thesesteps also dope poly.

EECS 427 F08 Lecture 1 24

SiO2

(i) After deposition ofSiO2 insulator and contacthole etch

13

CMOS Process Walkthrough

Al

AlSiO2

(j) After deposition andpatterning of first Al layer.

EECS 427 F08 Lecture 1 25

(e) After deposition of SiO2Insulator, etching of vias, deposition and patterning of2nd layer of Al

Looking Ahead• http://jas.eng.buffalo.edu/education/fab/invFab/index.html• Read Sections 1.1, 1.2, 1.3.2-1.3.4, and 2.2 , , ,

of Rabaey (mostly review)• Next lecture: we’ll cover design rules and

layout styles

EECS 427 F08 Lecture 1 26