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    Photolithography

    D. Boolchandani

    Department of ECE

    Malaviya National Institute of Technology

    Jaipur

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    Photolithography 2

    Photolithography

    In a microelectronic circuit, all the circuitelements (resistors, diodes, transistors, etc.) are

    formed in the top surface of a wafer (usually

    silicon). These circuit elements are interconnected in a

    complex, controlled,patternedmanner.

    Consider the simple case of a silicon p-njunction diode with electrical contacts to the p

    and n sides on the top surface of the wafer.

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    Photolithography 3

    Photolithography Silicon p-n junction diode with both electrical contacts on the

    top surface of the wafer:

    n

    p-type substrate

    Cross

    section:

    Al SiO2

    Topview:

    Can you draw the diode symbol on this diagram?

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    Photolithography 4

    Photolithography In order to produce a microelectronic circuit,

    portions of a silicon wafer must be doped withdonors and/or acceptors in a controlled,patterned

    manner.

    Holes or windows must be cut throughinsulating thin films in a controlled,patterned

    manner.

    Metal interconnections (thin film wires) mustbe formed in a controlled,patternedmanner.

    The process by which patterns are transferred to

    the surface of a wafer is calledphotolithography.

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    Photolithography 5

    Photolithography Consider the fabrication of a silicon p-n junction diode with both

    electrical contacts on the top surface of the wafer:

    n

    p-type substrate

    Cross

    section:

    Al SiO2

    Top

    view:

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    Photolithography 6

    Photolithography We start with a bare silicon wafer and oxidize it. (The bottom

    surface also gets oxidized, but well ignore that.):

    p-type substrate

    Cross

    section:

    SiO2

    Top

    view:

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    Photolithography We first need to open a window in the SiO2 through which we

    can diffuse a donor dopant (e.g., P) to form the n-type region:

    p-type substrate

    Cross

    section:

    SiO2

    Top

    view:

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    Photolithography

    The starting point for the photolithographyprocess is amask.

    A mask is a glass plate that is coated with an

    opaque thin film (often a metal thin film such as

    chromium).

    This metal film is patterned in the shape of the

    features we want to create on the wafer surface.

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    Photolithography For our example, our mask could look like this:

    glass plate

    Cross

    section:

    opaque metal,e.g.,Cr

    Top

    view:

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    Photolithography Recall that we start with a bare silicon wafer and oxidize it.

    (The bottom surface also gets oxidized, but well ignore that.):

    p-type substrate

    Cross

    section:

    SiO2

    Top

    view:

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    Photolithography The wafer is next coated with photoresist.

    Photoresist is a light-sensitive polymer. We will initially considerpositive photoresist (more

    about what this means soon).

    Photoresist is usually spun on.

    For this step, the wafer is held onto a support chuckby a vacuum.

    Photoresist is typically applied in liquid form

    (dissolved in a solvent). The wafer is spun at high speed (1000 to 6000 rpm)

    for 20 to 60 seconds to produce a thin, uniform film,typically 0.3 to 2.5 mm thick.

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    Photolithography After coating with photoresist, the wafer looks like this:

    p-type substrate

    Cross

    section:

    Photoresist

    Top

    view:

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    Photolithography The wafer is baked at 70 to 90C (soft bake or pre-bake) to

    remove solvent from the photoresist and improve adhesion.

    p-type substrate

    Cross

    section:

    Photoresist

    Top

    view:

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    Photolithography The mask is aligned (positioned) as desired on top of the

    wafer.Mask

    Cross

    section:

    Top

    view:

    p-type substrate

    glass plate

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    Photolithography The photoresist is exposed through the mask with UV light.

    UV light breaks chemical bonds in the photoresist.Mask

    Cross

    section:

    Top

    view:

    p-type substrate

    glass plate

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    Photolithography The photoresist is developed by immersing the wafer in a

    chemical solution that removes photoresist that has been exposed

    to UV light.

    Cross

    section:

    Top

    view:

    p-type substrate

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    Photolithography

    The wafer is baked again, but at a higher temperature (120 to

    180C). This hard bake or post-bake hardens the photoresist.

    Cross

    section:

    Top

    view:

    p-type substrate

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    Photolithography The unprotected SiO2 is removed by etching in a chemical

    solution containing HF (hydrofluoric acid), or by dry etching in

    a gaseous plasma, containing CF4 , for example.

    Cross

    section:

    Top

    view:

    p-type substrate

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    Photolithography The photoresist has done its job and is now removed (stripped)

    in a liquid solvent (e.g., acetone) or in a dry O2 plasma.

    Cross

    section:

    Top

    view:

    p-type substrate

    SiO2

    window

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    Photolithography 20

    Photolithography Phosphorous is next diffused through the window to form an

    n-type region. The SiO2 film blocks phosphorus diffusion

    outside the window.

    Cross

    section:

    Top

    view:

    p-type substrate

    SiO2

    window

    n-type

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    Photolithography 23

    Photolithography The wafer surface is next coated with aluminum by evaporation

    or sputtering. The window outlinesmay still be visible.

    n

    p-type substrate

    Cross

    section:

    AlSiO2

    Top

    view:

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    Photolithography 24

    Photolithography Photolithography is used to pattern photoresist so as to protect

    the aluminum over the windows:

    AlSiO2

    n

    p-type substrate

    Cross

    section:

    Top

    view:

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    Photolithography 25

    Photolithography What must the mask look like in order to pattern the aluminum

    film? Assume that were still using positive photoresist.

    n

    p-type substrate

    Cross

    section:

    AlSiO2

    Top

    view:

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    Photolithography 26

    Photolithography The aluminum is etched where it is not protected by photoresist.

    Wet or dry etchants can be used.

    n

    p-type substrate

    Cross

    section:

    AlSiO2

    Top

    view:

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    Photolithography 27

    Photolithography Then the photoresist is stripped.

    n

    p-type substrate

    Cross

    section:

    AlSiO2

    Top

    view:

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    Ph li h h

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    Photolithography 29

    Photolithography So far we have only consideredpositive

    photoresists. For positive resists, the resist pattern on the

    wafer looks just like the pattern on the mask

    There are alsonegative photoresists. Ultraviolet light crosslinks negative resists, making

    them less soluble in a developer solution.

    For negative resists, the resist pattern on the

    wafer is the negative of the pattern on the mask.

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    Photolithography 30

    Photolithography

    In order to align a new pattern to a pattern

    already on the wafer,alignment marks are used.

    Various exposure systems

    Contact printing,

    Proximity printing,

    Projection printing, and

    Direct step-on-wafer (step-and-repeat projection).

    Ph li h h

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    Photolithography 31

    Photolithography

    A complete photolithography process(photoresist + exposure tool + developing

    process) can be characterized by the smallest

    (finest resolution) lines or windows that can be

    produced on a wafer.

    This dimension is called theminimum feature

    size orminimum linewidth.

    The limitations of optical lithography are a

    consequence of basic physics (diffraction).

    Ph t lith h

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    Photolithography 32

    Photolithography For a single-wavelength projection photo-

    lithography system, theminimum feature size orminimum linewidth is given by theRayleighcriterion:

    l is the wavelength.

    NA is the numerical aperture, a measure of thelight-collecting power of the projection lens.

    k depends on the photoresist properties and the

    quality of the optical system.

    NAkFw

    l

    min

    Ph t lith h

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    Photolithography 33

    Photolithography

    So how do we reduce wmin ?

    Reduce k.

    Reduce l. Increase NA.

    NAkFw l

    min

    Ph t lith h

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    Photolithography 34

    Photolithography

    Even for the best projection photolithography

    systems, NA is less than 0.8.

    The theoretical limit for k (the lowest value) is

    about 0.25.

    NAkFw

    lmin

    Ph t lith h

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    Photolithography 35

    Photolithography

    Lenses with higher NA can produce smaller

    linewidths. This linewidth reduction comes at a price.

    Thedepth of focus decreases as NA increases.

    Depth of focus is the distance that the wafer can

    be moved relative to (closer to or farther from)

    the projection lens and still keep the image in

    focus on the wafer.

    NAkFw

    lmin

    Ph t lith h

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    Photolithography 36

    Photolithography

    Depth of focus is given by:

    2

    )(

    6.0

    NA

    DFl

    Depth of focus decreases (bad) as l decreases.

    Depth of focus decreases (bad) as NA increases.

    Ph t lith h

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    Photolithography 37

    Photolithography

    Numerous light sources are (and will be) used

    for optical lithography:

    Light Source l(nm)

    wmin(nm)

    DF(nm)

    g-line (Hg lamp) 436 311 850i-line (Hg lamp) 365 260 730

    KrF laser 248 175 500

    ArF laser 193 140 400

    F2 laser 157 112 320

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    Ph t lith h

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    Photolithography

    Other lithographic techniques will play a role in

    the future.

    Electron beam lithography

    Ion beam lithography.

    X-ray lithography.