半導體量測技術 semiconductor materials and device characterization
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半導體量測技術 Semiconductor Materials and Device Characterization Topic 7: time-of-flight technique and carrier mobility Instructor: Dr. Yi-Mu Lee Department of Electronic Engineering National United University. Review and new topics:. Charge pumping method (p. 379) - PowerPoint PPT PresentationTRANSCRIPT
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半導體量測技術Semiconductor Materials and Device Characterization
Topic 7: time-of-flight technique and carrier mobility
Instructor: Dr. Yi-Mu Lee
Department of Electronic Engineering
National United University
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Review and new topics:
• Charge pumping method (p. 379)• Haynes-Shockley experiment (time of flight)• Photoelectric effect (time of flight)• Introduction to mobility• Presentation: 12/29 = 3 students
01/05 = 5 students
• Final exam: (3:00pm~5:30pm)
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Time-of-flight (drift mobility)
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QA
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Mobility
• MOSFET mobility
• Effective mobility
• Field-effect mobility
• Time-of-flight or drift mobility– Mobility and carrier velocity at high E-field
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D. K. Schroder, p. 540
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D. K. Schroder, p. 541
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D. K. Schroder, p. 541
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D. K. Schroder, p. 541
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D. K. Schroder, p. 542~543
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Continue to study p. 545
D. K. Schroder, p. 541
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D. K. Schroder, p. 547
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D. K. Schroder, p. 548
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D. K. Schroder, p. 549
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D. K. Schroder, p. 549
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Continue to study p. 551
D. K. Schroder, p. 550
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Review suggested
• 8.4 8.5• 8.6 8.8• (in D. K. Schroder)
*You are welcome to submit the above homework to get extra bonus for your semester grade!!
**These questions are still in the range of final exam!!