mass measurement at besiii

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June, 14th, 2006 Mo Xiaohu 1 Mass Measurement at BESIII X.H.MO Workshop on Future PRC-U.S. Cooperation in High Energy Physics Beijing, China, Jun 11-18

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 Mass Measurement at BESIII. X.H.MO. Workshop on Future PRC-U.S. Cooperation in High Energy Physics Beijing, China, Jun 11-18. Content Introduction Statistical optimization of  mass measurement Systematic uncertainty study Summary. Introduction. Pseudomass method ARGUS CLEO - PowerPoint PPT Presentation

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Page 1: Mass Measurement  at BESIII

June, 14th, 2006 Mo Xiaohu 1

Mass Measurement at BESIII

X.H.MO

Workshop on Future PRC-U.S. Cooperation in High Energy Physics

Beijing, China, Jun 11-18

Page 2: Mass Measurement  at BESIII

June, 14th, 2006 Mo Xiaohu 2

Content

1.Introduction2.Statistical optimization

of mass measurement 3.Systematic uncertainty

study4.Summary

Page 3: Mass Measurement  at BESIII

June, 14th, 2006 Mo Xiaohu 3

Introduction

Page 4: Mass Measurement  at BESIII

June, 14th, 2006 Mo Xiaohu 4

Pseudomass method• ARGUS• CLEO• OPAL• Belle• KEDRThreshold scan• BES

Points : 12 , Lum. : 5 pb1

Page 5: Mass Measurement  at BESIII

June, 14th, 2006 Mo Xiaohu 5

!,

1 i

Ni

i

n

ii N

ePPLFii

F(x): E.A.Kuraev,V.S.Fadin , Sov.J.Nucl.Phys. 41(1985)466;(s): F.A. Berends et al. , Nucl. Phys. B57 (1973)381.

Ecm (GeV)

B r.c.

obs

BES:PRD53(1995)20

Page 6: Mass Measurement  at BESIII

June, 14th, 2006 Mo Xiaohu 6

Ecm (GeV)

BES results:the stat. (0.18 0.21 )is compatible withthe syst. (0.25 0.17)M =1776.96 0.18

0.25 M / M = 1.7 10 – 4

0.21 0.17

Page 7: Mass Measurement  at BESIII

June, 14th, 2006 Mo Xiaohu 7

Statistical optimization of

Mass Measurement

Page 8: Mass Measurement  at BESIII

June, 14th, 2006 Mo Xiaohu 8

Neglecting all experiment uncertaintiesLuminosity L ; Efficiency =14% ; Branching fraction: Bf =0.1763 • 0.1784 ;[ Bf = B • B e , PDG04]Background BG =0 .

Using Voloshin’s formula for obs

[M.B.Voloshin, PLB556(2003)153.]

Statistical optimization

Page 9: Mass Measurement  at BESIII

June, 14th, 2006 Mo Xiaohu 9

Statistical optimization for high accurate M measurementAssume : M is known .

To find : 1.What’s the optimal

distribution of data taking point;

2.How many points are needed in scan experiment;

3.How much luminosity is required for certain precision.

Page 10: Mass Measurement  at BESIII

June, 14th, 2006 Mo Xiaohu 10

Evenly divided :1, for E: E0 + E, E=(Ef–E0)/n2, for lum. : L =Ltot /n= 3pb –1

To eliminate stat. fluctuation, Sampling many times (say, 500)

Page 11: Mass Measurement  at BESIII

June, 14th, 2006 Mo Xiaohu 11

Ecm (3.545,3.595) GeVLtot = 30 pb –1 Npt : 3 20

1. Sm >> m , using Sm as criterion;

2. Npt =5.

| m

|

Page 12: Mass Measurement  at BESIII

June, 14th, 2006 Mo Xiaohu 12

(Ecm)

d/dEcm

max. Sm=1.48MeVmin. Sm =0.147MeV

Random sampling 100 times:Ecm (3.545,3.595) GeVLtot =45 pb –1 Npt =5;

1. Points near threshold lead to small Sm ;

2. This corresponds to larger derivative of

The largest derivativepoint may be the optimaldata taking point

Page 13: Mass Measurement  at BESIII

June, 14th, 2006 Mo Xiaohu 13

(Ecm)

d/dEcm

Scheme I:2 points at region I + Npt(1—20) at region II Scheme II:Only Npt(1—20) at region II

II

I

Scheme I

Scheme II

Only the pointswithin region I are useful for optimal data taking point

L=5 pb –1 for each point

Page 14: Mass Measurement  at BESIII

June, 14th, 2006 Mo Xiaohu 14

With the region I, one point is enough!

I

Ecm (3.553,3.555) GeVLtot =45 pb –1 Npt = 1—6;

Where should this one point locate?

Page 15: Mass Measurement  at BESIII

June, 14th, 2006 Mo Xiaohu 15

Ecm = 3553.81 MeV Sm = 0.09559 MeV Ecm = 3554.84 MeV max d/dEcm

Ecm (3.551,3.595) GeVLtot =45 pb –1 Npt = 1; scan

3553.8 MeV

3554.8 MeV

Page 16: Mass Measurement  at BESIII

June, 14th, 2006 Mo Xiaohu 16

Ltot (pb–1) Sm (MeV)

9 0.285318 0.199027 0.155036 0.138045 0.119954 0.105163 0.097672 0.0913

100 0.07491000 0.0247

10000 0.0079

One pointWith lum.

Ltot

Page 17: Mass Measurement  at BESIII

June, 14th, 2006 Mo Xiaohu 17

Systematic Uncertainty Study

Page 18: Mass Measurement  at BESIII

June, 14th, 2006 Mo Xiaohu 18

Study of systematic uncertainty

1.Theoretical accuracy 2.Energy spread E 3.Energy scale 4.Luminosity 5.Efficiency 6.Background analysis

Page 19: Mass Measurement  at BESIII

June, 14th, 2006 Mo Xiaohu 19

BES:PRD53(1995)20

Accuracy Effect of Theoretical Formula

Energy spread, variation form

s=(Ecm)2

Energy scale, variation form

Page 20: Mass Measurement  at BESIII

June, 14th, 2006 Mo Xiaohu 20

Ecm = 3554 MeV

Ltot =45 pb –1

m = 1776.99 MeV

Uncertainty due to accuracy of cross section at level of 3 10 – 3 MeV

old [BES, PRD53(1995)20] fit results: m = 1777.028 MeV , m = 0.105 MeVnew [M.B.Voloshin, PLB556(2003)153] fit results: m = 1777.031 MeV , m = 0.094 MeVm = | m (new) – m (old) | < 3 10 – 3 MeV

Accuracy Effect of Theoretical Formula

Page 21: Mass Measurement  at BESIII

June, 14th, 2006 Mo Xiaohu 21

f(E) ;f(E)=a E+b E2+c E3

a=1; b=0; c=0;a=0; b=1; c=0;a=0; b=0; c=1;a=1; b=1; c=1;m < 1.5 10 – 3 MeV

Ecm (GeV)

Cross section (n

b)

'

J/

/

/

/

/

J

J

J

J

EfEfEfEf

(1.51MeV)

J/

(1.06MeV)

3 m < 6 10 – 3 MeV

2

20

32

GJ

GC

Eq

Page 22: Mass Measurement  at BESIII

June, 14th, 2006 Mo Xiaohu 22

f(E) ;f(E)=a E+b E2+c E3

a=1; b=0; c=0;a=0; b=1; c=0;a=0; b=0; c=1;a=1; b=1; c=1;

Ecm (GeV)

Cross section (n

b)

'

J/

E

EJ/

/

/

/

/

J

J

J

J

MMME

EEEW

W=E+ (E=M+ ); ~ 10– 4

m < 8 10 – 3 MeV

Page 23: Mass Measurement  at BESIII

June, 14th, 2006 Mo Xiaohu 23

BES:PRD53(1995)20

Luminosity L : 2% m < 1.4 10 – 2 MeVEfficiency : 2% m < 1.4 10 – 2 MeV Branching fraction: Bf : 0.5% m < 3.5 10 – 3 MeV[ Bf = B • B e , PDG04]Background BG : 10% m < 1.7 10 – 3 MeV [ BG = 0.024 pb –1: PLR68(1992)3021 ]

Total : m < 2.02 10 – 2 MeV

Page 24: Mass Measurement  at BESIII

June, 14th, 2006 Mo Xiaohu 24

Term m

(10 – 3 MeV) m / m

(10 – 6)Theoretical accuracy 3 1.7

Energy spread 6 3.4

Energy scale 8 4.5

Luminosity 14 7.9

Efficiency 14 7.9

Branching Fraction 3.5 2.0

Background 1.7 1.0

Total 22.7 12.7

Summary:systematic

Page 25: Mass Measurement  at BESIII

June, 14th, 2006 Mo Xiaohu 25

KEDR Collab. , depolarization method:Single energy scale at level of 0.8 keV, or 10 –4 MeVTotal systematic error at level of 9 keV, or 10 – 3 MeV

Absolute calibration of energy scale

Fix, stable, regular, eliminate and controllable

UNSTABLE and IRREGULAR, uncontrollable

BESI: E=0.2MeV

Bottleneck

Page 26: Mass Measurement  at BESIII

June, 14th, 2006 Mo Xiaohu 26

BKG.study

Eventselection

Optimalpoint

Data taking design

>100 pb –1 , 50 pb –1 , >100 pb –1

Page 27: Mass Measurement  at BESIII

June, 14th, 2006 Mo Xiaohu 27

Statistical and systematic uncertainties have been studied based on BESI performance experience. Monte Carlo simulation and sampling technique are adopted to obtain optimal data taking point for high accurate mass measurement. We found: optimal position is located at large derivative of cross section near threshold ; one point is enough, and 45 pb–1 is sufficient for accuracy up to 0.1 MeV .

Many factors have been taken into account to estimate possible systematic uncertainties, the total relative error is at the level of 1.3 10 – 5. However the absolute calibration of energy scale may be a key issue for further improvement of accuracy of mass.

Summary

Thanks!

Page 28: Mass Measurement  at BESIII

June, 14th, 2006 Mo Xiaohu 28

Backup

Page 29: Mass Measurement  at BESIII

June, 14th, 2006 Mo Xiaohu 29

Evenly divided :1,for E: E0 + E, E=(Ef–E0)/n2, for lum. : L =Ltot /n= 3pb –1

To eliminate stat. fluctuation, Sampling many times (say, 500)

The point below threshold Have no effect for fit results

M=1777.0367 MeV Sm =0.4273 MeV

Page 30: Mass Measurement  at BESIII

June, 14th, 2006 Mo Xiaohu 30

Optimization study shows that: optimal position is locate at large derivation of cross section near threshold ; one point is enough , and 45 pb–1 is sufficient for accuracy up to 0.1 MeV .

Summary:statistical

1. What’s the distribution of data taking point ;

2. How many points are needed in scan experiment ;

3. How much luminosity is required for certain precision.

Page 31: Mass Measurement  at BESIII

June, 14th, 2006 Mo Xiaohu 31

smB ,Improved the previous calculation, accuracy close to 0.1%M.B.Voloshin, PLB556(2003)153.

NRQCD, NNLO, accuracy better that 0.1%P.Ruiz-Femenia and A.Pich, PRD64(2001)053001.

v

h(v)

Fc(v)10–3

S(v)/ 10–3

h(v)

new

Page 32: Mass Measurement  at BESIII

June, 14th, 2006 Mo Xiaohu 32

Ecm = 3554 MeV

Ltot =45 pb –1

m = 1776.99 MeV

Uncertainty due to accuracy of cross section at level of 3 10 – 3 MeV

old fit results: m = 1777.028 MeV m = 0.105 MeVnew fit results: m = 1777.031 MeV m = 0.094 MeV

m = | m (new) – m (old) | < 3 10 – 3 MeV

± 10 – 4 m < 10 – 4 MeV ± 2 10 – 4

m < 10 – 4 MeV

Accuracy Effect of Theoretical Formula