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28_IEEE_Proc_97
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21/03/2003 ULIS 2003 - Udine (Italy) - C. Gallon 1 Analysis of Mechanical Stress Effects in Short Channel MOSFETs C. Gallon 1, G. Reimbold 1, G. Ghibaudo
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INDUSTRIAL POLICIES, THE CREATION OF A LEARNING SOCIETY, AND ECONOMIC DEVELOPMENT A Discussion by Josh Lerner Harvard University and NBER
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Peninsula News 133
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