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Reliability Society N E W S L E T T E R Vol. 46, No. 4, July 2000 (ISSN 1059-8642) http://www.ieee.org/society/rs President’s Message Recognition The IEEE Reliability Society has a variety of awards that it gives to deserving members. At our January meeting, we gave our annual Engineers of the Year to Jeff Voas and Joanne Bechta Dugan. At our July meeting, we will give out both chapter awards and IEEE Millennium Medals. The chapter awards go to chapters that have exhibited a high degree of activity during the previous year. The Millennium Medals are being given to Reliability Society individuals who have a distinguished record of professional accom- plishment and service to the IEEE. I congratu- late all of the award recipients and thank them for their contributions to the engineering pro- fession and the Reliability Society. Those chapters and individuals who didn’t receive awards should look to the recipients as role models - and look at them especially as those who enjoyed making their contributions. I know most of the recipients personally and can tell you that, despite the work involved, all of the recipients thoroughly en- joyed what they did to eventually receive the awards. I’d also like to take this opportunity to recognize the efforts of Dave Franklin, Newsletter Editor, and Bob Loomis, Newsletter As- sociate Editor (and VP Publications), in bringing the Reliabil- ity Society Newsletter to a new level of excellence. They’ve created an outstanding balance of technical and non-technical information that makes the Newsletter hard to stop reading. Since this is a summer issue, I want to wish all of you an enjoy- able summer season. Ken Kenneth P. LaSala, Ph.D. President, IEEE Reliability Society [email protected] C O N T E N T S President’s Message 1 Editor’s Column 2 Chapter Activities 3 Reliability Society AdCom Meeting 4 Reliability Society AdCom Meeting Agenda 6 Tech-Ops Committee Reorganized–Part 2 6 New Books on Reliability 8 Designing Systems for Reliable Human Performance Video Tutorial at a Special Discount 8 Concurrent Engineering Perspectives: Concepts to Success 8 2000 Integrated Workshop 9 IEEE Seeks U. S. University Program Evaluators 10 IEEE Standards Project by Society Now on Web 11 Meeting Notice: Final Call for Papers IEEE 2000 International Integrated Reliability Workshop 12 ISACC 2000 13 Maastricht, the Netherlands, EU. 16 Preliminary Notice: ITSC 16 Preliminary Notice: IFIP World Computer Congress 2000 18 Preliminary Notice: SBCCI2000 18 Preliminary Notice: FPL 2000 19 Preliminary Notice: ICCCD 2000 20 Reconfigurable Technolgy 20 ISSRE 2000 21 Call for Papers: ICSC/NAISO 22 Technical Magazine Section: INET Infrastructure Technology Options and Life Cycle Reliability 26 Editor: Dave Franklin Business Manager: Bob Gauger

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Page 1: Reliability Society · Franklin, Newsletter Editor, and Bob Loomis, Newsletter As-sociate Editor (and VP Publications), in bringing the Reliabil-ity Society Newsletter to a new level

Reliability SocietyN E W S L E T T E R

Vol. 46, No. 4, July 2000 (ISSN 1059-8642)

http://www.ieee.org/society/rs

President’s Message

RecognitionThe IEEE Reliability Society has a variety of awards that it

gives to deserving members. At our January meeting, we gaveour annual Engineers of the Year to Jeff Voas and JoanneBechta Dugan. At our July meeting, we will give out bothchapter awards and IEEE Millennium Medals. The chapterawards go to chapters that have exhibited ahigh degree of activity during the previousyear. The Millennium Medals are being givento Reliability Society individuals who have adistinguished record of professional accom-plishment and service to the IEEE. I congratu-late all of the award recipients and thank themfor their contributions to the engineering pro-fession and the Reliability Society. Thosechapters and individuals who didn’t receiveawards should look to the recipients as rolemodels - and look at them especially as thosewho enjoyed making their contributions. Iknow most of the recipients personally and can tell you that,despite the work involved, all of the recipients thoroughly en-joyed what they did to eventually receive the awards. I’d alsolike to take this opportunity to recognize the efforts of DaveFranklin, Newsletter Editor, and Bob Loomis, Newsletter As-sociate Editor (and VP Publications), in bringing the Reliabil-ity Society Newsletter to a new level of excellence. They’vecreated an outstanding balance of technical and non-technicalinformation that makes the Newsletter hard to stop reading.Since this is a summer issue, I want to wish all of you an enjoy-able summer season.

Ken

Kenneth P. LaSala, Ph.D.President, IEEE Reliability Society

[email protected]

C O N T E N T SPresident’s Message

1

Editor’s Column2

Chapter Activities3

Reliability Society AdCom Meeting4

Reliability Society AdCom Meeting Agenda6

Tech-Ops Committee Reorganized–Part 26

New Books on Reliability8

Designing Systems for Reliable Human Performance VideoTutorial at a Special Discount

8

Concurrent Engineering Perspectives: Concepts to Success8

2000 Integrated Workshop9

IEEE Seeks U. S. University Program Evaluators10

IEEE Standards Project by Society Now on Web11

Meeting Notice: Final Call for Papers IEEE 2000International Integrated Reliability Workshop

12

ISACC 200013

Maastricht, the Netherlands, EU.16

Preliminary Notice: ITSC16

Preliminary Notice: IFIP World Computer Congress 200018

Preliminary Notice: SBCCI200018

Preliminary Notice: FPL 200019

Preliminary Notice: ICCCD 200020

Reconfigurable Technolgy20

ISSRE 200021

Call for Papers: ICSC/NAISO22

Technical Magazine Section: INET InfrastructureTechnology Options and Life Cycle Reliability

26

Editor:Dave Franklin

Business Manager:Bob Gauger

Page 2: Reliability Society · Franklin, Newsletter Editor, and Bob Loomis, Newsletter As-sociate Editor (and VP Publications), in bringing the Reliabil-ity Society Newsletter to a new level

2 Reliability Society Newsletter ■ July 2000

Editor’s Column ■ ■ ■ ■ ■ ■ ■ ■ ■ ■ ■ ■ ■ ■ ■ ■ ■ ■ ■ ■ ■ ■

Reliability Society Newsletter InputsAll RS newsletter inputs should be sent to:

Editor Business ManagerDave Franklin Bob Gauger,300 North Oak Hills Drive [email protected] Park, CA 91377Tel: +1 818 586 9683E-mail: [email protected]

The schedule for submittals is: Newsletter Due Date

January October 8April January 8July April 8October July 8

Reliability Society Newsletter is published quarterly by the Reliability So-ciety of the Institute of Electrical and Electronic Engineers, Inc. Headquar-ters: 3 Park Avenue, 17th Floor, New York, NY 10016-5997. Sent at a cost of$1.00 per year to each member of the Reliability Society. Printed in U.S.A.Periodicals postage paid at New York, NY and at additional mailing offices.Postmaster: Send changes to Reliability Society Newsletter, IEEE, 445 HoesLane, Piscataway NJ 08854.

©2000 IEEE. Information contained in this newsletter may be copied with-out permission provided that copies are not used or distributed for directcommerical advantage, and the title of the publication and its date appearon each photocopy.

■ ■ ■ ■ ■ ■ ■ ■ ■ ■ ■ ■ ■ ■ ■ ■ ■ ■ ■ ■ ■ ■ ■ ■ ■ ■

ADVERTISING RATESAll copy that contains graphics or special fonts must be camera-ready or

delivered on computer disk and be received by the due dates indicated.Ad Size One Time 2-3 4+

Full Page $400 375 350Half Page $300 280 260Third Page (vertical) $240 225 210Quarter Page $205 190 180Eighth Page $120 110 100

Discounted per issue rates are shown for ads run in more than one issue.

Request for AdComNominations

It is time to consider nominations forthe Reliability Society AdministrativeCommittee Members who will serve theSociety from 2001 through 2003. Thereare two ways for a candidate to be placedon the ballot:

1. A nominating petition signed by tenor more Reliability Society Membersin good standing (excluding studentmembers),

2. Selection by the Reliability Society’sNominating Committee.

Candidates placed on the ballot are notdesignated between type 1 and type 2candidates.

The sponsor of a nominee should se-cure the candidate’s willingness to serve(The AdCom meets four times per year.Partial expenses for attending the meet-ings are borne by the Reliability Society).A Nominating Petition signed by at least

RELIABILITYSOCIETY OFFICERSPresidentK. P. LaSala ([email protected])

Vice President – MembershipPat Hetherington([email protected])

Vice President – PublicationsDr. Robert J. Loomis, Jr([email protected])

Vice President – MeetingsJeff Voas ([email protected])

Vice President - Technical OperationsK. Inoue ([email protected])

SecretaryDennis Hoffman([email protected])

TreasurerR. A. Kowalski ([email protected])

STANDING COMMITTEES

Standards and DefinitionsT. Brogan([email protected])

Y. Lord([email protected])

Meetings OrganizationR. Gauger ([email protected])

General MembershipPat Hetherington([email protected])

ChaptersPat Hetherington([email protected])

Academic Education CommitteeM. Abramo ([email protected])

Professional DevelopmentM. Abramo ([email protected])

Constitution and BylawsT. Fagan ([email protected])

Nominations and AwardsL. Arellano ([email protected])

FellowsT. L. Regulinski([email protected])

FinanceR. A. Kowalski ([email protected])

HistorianA. Plait ([email protected])

continnued on page 28

Page 3: Reliability Society · Franklin, Newsletter Editor, and Bob Loomis, Newsletter As-sociate Editor (and VP Publications), in bringing the Reliabil-ity Society Newsletter to a new level

July 2000 ■ Reliability Society Newsletter 3

Chapter Activities

Boston ChapterJim Fahy

Chair, Boston ChapterPhone: (978) 288-4778

Fax: (978) [email protected]

Correspondance to:Jim Fahy

20 Waldor DriveMansfield, MA 02048

Cleveland ChapterThe Cleveland Chapter had two meet-

ings in this period.Our November meeting was on the

History of the Cleveland IX Center. In1939 the Government was looking for anew heavy bomber. The Douglas B-19was the largest experimental bomber inthe world at the time. What General Ar-nold and the Air Force needed turned outto be the B-29. The war Departmentchooses several mid-west sites, includingCleveland, Wichita, and Marietta to buildthis new bomber. Construction of what is

now the IX Center started on May 7, 1942and was completed that year. The MainBuilding covers almost 29 acres with afloor space of 2.5 million square feet. Theplant was turned over to Fisher Body onApril 1, 1943 and production of the B-29was started. The B-29 was not developedwithout problems with the WrightR-3350 Cyclone Engine. The engines onthe first B-29 overheated and caught fireon a test flight causing the aircraft tocrash. Three separate solutions werefound at the NASA Glenn Research Cen-ter Lewis Field then know as NACALewis Field. One cause of engine over-heating was due to carburetor mixtureswere excessively rich. The addition ofspray bars injecting water droplets intothe fuel mixture. The sodium-filledvalves were collapsing extending theheight of the cylinder heads solved thisproblem. The final solution, under the Di-rector Abe Silverstein, was to create vari-able adjustment of the engine cowl flapsand to create baffles to redirect airflowaround the cylinders. The altitude tunnel

which went on line in early May 1944was so effective in 10 days of testing, itwas considered to have paid for it self insolving the problems of this desperatelyneeded bomber. This meeting was veryinteresting and well attended.

Our December meeting was our usualmid year social. No speaker was used.We had a buffet, cash bar and lightsnacks. Ping-Pong, pool, dancing and alot of talking were the order for the eve-ning. The Guerin House is an early Amer-ican home with a fireplace, perfect forthis activity. This has become a regularactivity each year. All enjoy the opportu-nity to wish you and yours a happy andsafe holiday season.

The ’00 RAMS was a big success. Weplan to support ’01 RAMS on the Man-agement Committee, with papers, and tu-torial suggestions.

All in all here in Cleveland we are hav-ing fun staying active and trying to servethe needs of our members.

Vincent Lalli, [email protected]

TECHNICAL OPERATIONSVice PresidentK. Inoue ([email protected])

TECHNOLOGY COMMITTEESCAD/CAED. R. Hoffman ([email protected])

Human Interface TechnologyK. P. LaSala ([email protected])

International ReliabilityJ. P. Rooney ([email protected])

Mechanical ReliabilityR. L. Doyle ([email protected])

P. Hetherington([email protected])

Microelectronic TechnologiesA. N. Campbell([email protected])T. A. Rost ([email protected])

Reliability DesignM. Roush ([email protected])

Reliability MethodologyC. K. Hansen ([email protected])

System SafetyY. Sato ([email protected])

Software ReliabilityS. J. Keene ([email protected])

Standards & DefinitionsY. Lord([email protected])T. L. Brogan([email protected]

Testing & ScreeningH. A. Chan ([email protected])

WarrantyW. A. Zeller([email protected])

SYSTEMS COMMITTEES(8 COMMITTEES)

Aerospace & Defense SystemsVacant

Consumer ElectronicsVacant

Energy SystemsM. Lively ([email protected])J. Zamanali ([email protected])

Industrial SystemsVacant

Information Technology &CommunicationsH. Wolf ([email protected])

Medical SystemsVacant

SensorsVacant

Transportation SystemsVacant

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Page 4: Reliability Society · Franklin, Newsletter Editor, and Bob Loomis, Newsletter As-sociate Editor (and VP Publications), in bringing the Reliabil-ity Society Newsletter to a new level

4 Reliability Society Newsletter ■ July 2000

Cincinnati Chapter

Dallas ChapterLon Chase

[email protected]

DenverTom Basso, Treasurer

Phone [email protected]

Japan ChapterShuichi Fukuda, ChairChair, Japan Chapter

[email protected]

Los Angeles ChapterDavid L Franklin

[email protected]

Twin CitiesMinnesota Chapter

The Twin Cities IEEE Reliability So-ciety held a meeting on November 161999. The November 16, 1999 meetingcovered the “Impact of Safety Regula-tions to product reliability in the Interna-tional Market”. The speaker, MikeSherman of FSI, gave examples of howthe regulations tie to reliability during the

design process. Fifteen people attendedthis meeting.

The January 18 meeting was to be apresentat ion by James Steel ofMedtronic, Microrel division of Phoenix.The topic was “Microcircuit Control andDevelopment Protocol” This talk was tocover biomedical applications and otherimportant markets for microcircuits.

The February 15 meeting is scheduledto be “ Reliability Predictions, Fact or Fic-tion” by James McLinn, CRE of Hanover,Minnesota. The meeting will cover the his-tory of the prediction, as well as, the valueof prediction for design improvement.

The March 21 meeting is scheduled tobe on Markov Models for Reliability As-sessment". The speaker, Paul Pukite ofUnited Defense will cover the applicationof these diagrams to the easy analysis ofFault Trees, Maintainability and Cut Sets.

The April 18 meeting will be a talk on“Design of Experiments” by Mark An-derson of Stat-Ease Corp.

The May 16 meeting will be a plantvisit to Twin City Test to review testmethods and equipment for AcceleratedLife Testing.

Submitted by James McLinn,Past Chapter chair,

for Norb Santoski Chapter [email protected]

Philadelphia ChapterFulvio E Oliveto

Philadelphia Section609-722-3147

San Diego ChapterRichard L. Doyle, PE

Secretary of Rel. [email protected]

Singapore Chapter(ED/Reliability/CPMT Joint Chapter)

Report on 1999 Activities - IEEE Sin-gapore, REL/CPMT/ED Chapter

Chapter Chair:Dr. Ong Soon Huat,email:[email protected]

Report by: YC Ng,Secretary of Singapore

REL/CPMT/ED Chapter.

SwitzerlandMauro Ciappa

Switzerland Chapter Chairemail:

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Reliability Society AdCom Meeting

8 April 2000San Jose, CA

Those in attendance: Alan Street,Loretta Arellano, Bud Trapp, YvonneLord, Bill Tonti, Koichi Inoue, DickKowalski, Robert Loomis, Ken LaSala,Bob Gauger, Jeff Voas, Patrick Hether-ington, Tom Brogan, Dick Doyle, WayKuo, Jon Klema, Dennis Hoffman, JohnHealy, Marsha Abramo, Sam Keene,Dave Franklin.

The meeting was called to order at8:30. A quorum was present. There wasan introduction of members, includingthe newly elected members. The agendawas approved.

Jeff Voas distributed the minutes andthey were approved.

■ Action: Dennis Hoffman is to put acomplete listing of actions in min-utes.

■ Action: Jeff Voas is to send out anupdated roster to AdCom.

■ Action: Jeff Voas is to send DennisHoffman past final minutes, actionitem lists, and updated roster.

■ Prior Action #5: Affiliate Member-ship is $35 – all professional techni-cal Societies qualify. Abramo.Status — Closed.

■ Prior Action #6: Marsha Abramo isto review old membership actionitems to see if any should be carried.

Ken LaSala gave an overview of TABactivities that were covered in the Senti-nel — $100K loan from IEEE to SensorsCouncil, IEEE spending $20K in Indus-trial Relations for an outreach program,and IEEE is forming an InformationTechnology Committee.

Treasurer’s report: Dick Kowalski re-ported a surplus for 1999. Dick reportedthat we will be given an assessment byIEEE for Headquarters (infrastructurecosts) – $74.5K in 2000 and $123.4K in2001 – which could affect RS financialreserves.

■ Action: David Franklin to get with1998 IRW and push to get the booksclosed on that Workshop.

Page 5: Reliability Society · Franklin, Newsletter Editor, and Bob Loomis, Newsletter As-sociate Editor (and VP Publications), in bringing the Reliabil-ity Society Newsletter to a new level

July 2000 ■ Reliability Society Newsletter 5

■ Motion passed to keep non-memberSubscription price at $200.

■ Motion passed to remain at 1999Membership dues rate of $25.

■ Action: David Franklin has the ac-tion to develop an unbundled plan.This will be an agenda for the nextAdCom meeting.

■ Action: VPs to provide DickKowalski with changes to their bud-get for 2000 and 2001. DickKowalski will contact VPs. CopyKen LaSala on inputs.

■ Motion passed to move $50K at nextopportunity to long term IEEE fund.

■ Action: Ken LaSala to send toAdCom the Society Audit Reviewmaterial in pdf format and in twoviews – one for internal use and onefor general use.

Meetings: Jeff Voas gave the Meet-ings report. Jeff covered the Meetingsregistration web site which provides theRS AdCom an easy way to indicate up-coming meeting attendance as well asmeal selections.

Jeff Voas reported on some upcomingconferences, some having potential spon-sorship opportunities. Next meeting isplanned to be held in Burlington, VT onJuly 14 – 15, 2000. Tutorials will be givenon Friday, July 14, with the AdCommeeting being held on Saturday, July 15.Banquet Saturday evening.

Jeff Voas lead the discussion of vari-ous locations to hold our fall internationalAdCom meeting.

■ Motion passed for the OctoberWorkshop and AdCom meeting beheld in Madrid, Spain, Oct 21-24,2000..

■ Action: Jeff Voas has action tocheck with his contacts on feasibil-ity of a Madrid meeting.

■ Action: Jeff Voas to develop a pro-cedure pertaining to criteria for se-lecting locations (chapters, po-tential chapters, increase member-ship, local assistance, etc) for out ofthe US AdCom meetings.

Membership: The Main focus needs tobe reversing a five year trend of slowlylosing US members.

Publications: Bob Loomis gave hisPubs report and distributed to members.

Bob recommends that we do not try to dofinancial transactions on the RS web site,use the IEEE supported process – recom-mendation accepted. Bob and Way Kuo in-dicated that the Transactions would have128 pages per issue for a total of 512 pagesin 2001. Nice increase in page count.

■ Action: Bob Loomis to e-mail toJohn Baillieul, Transactions Com-mittee Chair, a statement concern-ing the non-availability of proofs toour managing editor on mid-levelIEEE editing service.

■ Action: Dick Doyle to documentfacts about APP concerning pricingto Bob Loomis, so Bob can take ac-tion with IEEE HQ.

■ Action: Jeff Voas to contact IEEESpectrum to get them to cover VTAdCom meeting with a small articleon Society-Industry relations.

■ A motion passed approving $25K tovideo tape the Accelerated StressTesting tutorial.

■ Alan Street accepted the position ofWebMaster for the Society.

■ Action: Bob Loomis / Alan Street toupdate content on the RS web so itwill be current.

Special Presentation: P.1413.1, Reli-ability Prediction Guide Jon Elerath,P.1413.1 Working Group Representativegave an overview of the guide, its intent,their schedule, guide draft outline, andthe membership of the WG.

■ A motion was made and passed, forthe RS to remain a member of thespecial standards council formed forthe development of this guide.

■ Action: By May 15, Yvonne Lord isto generate slide by slide commentsas well as general comments forfeedback on the Rel Predictionguide. Yvonne is to identify newparticipants with contact info. NextWG meeting is scheduled for May22 at the U of MD.

■ Action: Yvonne Lord has the actionto get the AdCom on draft Rel Pre-diction guide distribution.

■ Action: Yvonne Lord is to brief theAdCom on the guide status at theJuly AdCom meeting.

Tech Ops Report: Koichi Inoue pro-vided the AdCom with a written status re-port that he distributed to the members.

Koichi outlined his Principles of TechOps Management.

■ A motion passed for travel reim-bursement of up to $500 per annumfor Tech Ops Chairs or their repre-sentative to attend Tech Ops VPcalled Tech Ops meetings, effectiveimmediately.

■ Action: Dick Kowalski to send outreimbursement guidelines to newpeople – Associate Editors, TechOps Chairs, and AdCom.

■ Action: Dennis Hoffman to sendKoichi Inoue Keith Janasak’s con-tact info. Keith is the new Chair ofthe CE/CAE Tech Ops Committee.Contact info provided. Status –Closed.

General:■ Action: Alan Street is to take RS’s

desire for the IRPS Proceedings tobe in CD format (for distribution toRS members as part of membership)vs paper to the next IRPS GeneralChair and Publication Chair for theirconsideration / action.

■ Action: Ken LaSala to send PatHetherington an IEEE ad for sampleformat.

■ Side Line Action: Loretta Arellanoto send Dennis Hoffman the IEEEOrg Structure.

Jr. Past President’s Report: LorettaArellano gave her report with copies dis-tributed to the members.

■ Loretta Arellano asked for and re-ceived approval to have IEEE do theelection mechanics.

■ Loretta Arellano requested that theIEEE Millennium medallion recipi-ents, not covered by other means, beallowed reasonable expenses up to$1500 to attend the July AdCombanquet to receive their award –mainly to help two overseas recipi-ents be in attendance. The motionpassed.

Senior Past President’s Report: DickDoyle presented his report.

Meeting adjourned at 5:00PM.

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6 Reliability Society Newsletter ■ July 2000

IEEE Reliability Society AdCom Meeting Agenda15 July 20008:30 AM Call to Order, K. LaSala8:30-8:45 Agenda Approval, K. LaSala8:45-9:00 Minutes Approval,

D. Hoffman9:00-9:30 President’s Report, K. LaSala

- TAB series report, K. LaSala,, L.Arellano

- Review of action items from lastmeeting, D. Hoffman

- RS nominations for TAB posi-tions

9:30-10:00 Treasurers Report,R. Kowalski

- Budget report- FY001 budget development

10:00-10:15 Break10:15-10:30 Meetings, J. Voas

- Conference close-outs esp IRW -J. Voas, W. Tonti

- IRPS and IRW reports - W. Tonti- ISRE report - S. Keene- SOLE display at RAMS, RS dis-

play at SOLE- RS sponsorship of Annual Micro-

electronics Reliability and Quali-fication Workshop Oct. 31-Nov.1, 2000

- Sponsorship of ASQ Six-SigmaConference

10:30-11:00 Membership, P. Hethering-ton/M. Abramo

- Membership Report - focus on re-versing 5-year trend - P. Hether-ington/M. Abramo

- PACE - L. Arellano/M. Abramo- Chapters - L. Arellano- Millennium medals - L. Arellano

11:00-11:30 Publications - R. Loomis- Transactions report including da-

tabase conversion - W. Kuo- Newsletter report - D. Franklin- Web site update - R. Loomis,

Alan Street- Video Program status - S. Keene- T-DMR status - R. Loomis- Wireless periodicals - new IEEE

publication?- CAS Society newsletter conver-

sion to IEEE Circuits and Sys-tems Magazine - a long rangetarget for the RS Newsletter?

11:30-12:00 Junior Past President’sReport - L. Arellano

- Nominations Committee Report- Awards and Medals report- Updated field of interest progress

- By-laws and constitution revisionprogress

12:00-1:00 Lunch1:00-1:45 Technical Operations -

K. Inoue- Technical operations chair ap-

pointments- Committee activities- Standards - T. Brogan/Y. Lord-Council and liaison news - Sen-

sors, Superconductivity,Nanotechnology, Intelligent

-Transportation Systems - RS rep-resentatives

1:45-2:30 Senior Past President’sReport

- RS Long-Range Planning - R.Doyle

- IEEE strategic planning confer-ence, -Dallas, TX, Sep 00 - K.LaSala

- IEEE industry relations studyproject - K. LaSala

2:30-2:45 Break2:45-3:15 Old business

- www based IEEE RS skill bank3:15-4:00 New Business4:00 Adjourn

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TechOps Technical Committees Reorganized –Part 2

It is my great pleasure to introduceyou the two new TechOps TechnicalCommittee chairpersons: Keith Janasak,Raytheon Electronic Systems, who re-placed the former chairperson DennisHoffman, and who takes care of Techni-cal Committee on CAD/CAE, and Clem-ent Aladekugbe, Carrier Corporation,who has accepted the responsibility ofcreating a new Technical Committee onAutomotive Systems. Many congratula-tions to Keith and Clement, and I hopethey will contribute to our Society and itsmembers through their volunteer activi-ties. Please see below for their scopes,objectives and planned activities.

In the April issue of this Newsletter(Vol. 46, No. 3, April 2000), I introduced

your reorganized and new TechnicalCommittees under the title “TechOpsTechnical Committees Reorganized”, inwhich you can see the brief introductions,scopes, planned activities and so on of the9 Technical Committees. These are

■ Human Interface Technology(Chair: Kenneth LaSala)

■ Mechanical Reliability (Co-Chairs:R. L. Doyle and P. Hetherington)

■ Microelectronic Technologies(Co-Chairs: A. N. Campbell and T.A. Rost)

■ Reliability Methodology (Chair:C. K. Hansen)

■ System Safety (Chair: Y. Sato)■ Software Reliability (Chair: S. J.

Keene, Jr.)

■ Standards & Definitions (Co-Chairs: Y. Lord and T. Brogan)

■ Warranty (Chair: W. A. Zeller)■ Information Technology & Com-

munications (Chair: H. Wolf).After that I received information on

the additional 4 Technical Committeesfrom respective chairpersons. These are:

■ CAD/CAE (Chair: K. Janasak)■ International Reliability (Chair: J.

P. Rooney)■ Testing & Screening (Chair: H. A.

Chan)■ Automotive Systems (Chair: C.

Aladekugbe, Co-Chair: B. Dodson).The brief descriptions together with

the scopes and activity plans for the year2000 of the above 4 Technical Commit-

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July 2000 ■ Reliability Society Newsletter 7

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tees are to follow. You will notice thatevery chairperson would invite you totake part in his or her activities. If you areinterested in the activities of a specificTechnical Committee, I would suggestthat you not to hesitate to contact theChairperson.

Koichi InoueVP TechOps

[email protected]

❖ Technical Committee on CAD/CAE

Chair: Keith Janasak (RaytheonElectronic Systems, [email protected])Members: Dennis Hoffman(Lockheed Martin), Ken LaSala(NOAA, DOC), Mike Tortorella(Lucent Technologies) and DavidFollowell (Boeing Company).The scope, Objectives andActivity Plans:

The CAD/CAE Technical Com-mittee’s objective is to stay current ontoday’s R&M CAE tools and tomor-row’s emerging R&M CAE direc-tion. Members plan to attend relatedconferences, work with R&M CAEvendors, and academia to stay on theforefront of this technology domain.Information will be communicated topracticing R&M engineers primarilythrough the RAMS CAE Track,which includes an Innovative R&MCAE Solutions Session along withvendor tool demos.

Our primary activity for this yearwill be to focus our attention onplanning and supporting the R&MCAE Track at RAMS 2001, which isscheduled for January 22 - 25, 2001at the Philadelphia Marriott.

❖ Technical Committee on Interna-tional ReliabilityChair: John P. Rooney (TheFoxboro Company, [email protected])Members: Presently none, butwould like to recruit “reporters” inany nation, such as Singapore, Ma-laysia, Switzerland, and so on. Thereporter would write a brief piece onthe status of reliability or reliabilityimprovements or reliability activity.

The scope, Objectives andActivity Plans:

Developments in internationalreliability.The Expected Results fromActivities:

Quarterly reports of internationalactivity.Volunteers would be definitelywelcomed (see the item “mem-bers” above).

■ Technical Committee on Testing& ScreeningChair: H. Anthony Chan (AT&TLabs, [email protected])Members: See the item “Activitiesand Planned activities”.Background and purpose:

Rapid changes in technology ac-companied by a desire to fulfill cus-tomer satisfaction within an in-creasingly competitive global mar-ketplace are two important drivingforces behind a product reliabilityimprovement initiative. Acceleratedstress testing (AST), in conjunctionwith a good failure tracking and cor-rective action system, can reduce theincidence of field failures, and hencecost, and be used to improve designand manufacturing processes. ASTcan be performed at different levelsof the product hierarchy, namely thecomponent level, sub-assemblylevel, unit or shelf level, and the sys-tem level. As one moves from com-ponent level AST to system levelAST the fault coverage improves butthe cost increases and the feedbackloop to design and manufacturingbecomes looser. Thus an integratedapproach where the strengths of alllevels of AST and failure analysis areutilized, is desired.

This Committee links profession-als involved in assuring that theirsystem hardware is robust andmeets world-class standards for de-sign quality. Interest is from the chippackage level up to fully assembledlarge systems, with a special empha-sis on the use of accelerated stresstesting as a means of qualifying andsystematically improving product

reliability. Members share tech-niques for product qualification,simulation, environmental testing,and other aspects of assuring that aproduct is mature enough for themarket.

This Committee collaborateswith IEEE/CPMT TC7 in variousactivities.Activities and Planned activities:� IEEE Workshop on Accelerated

Stress Testing. For more informa-tion, contact H. Anthony Chan(AT&T Labs, [email protected]).

� Accelerated Stress Testing Dis-cussion group is being set up.

� Articles/Newsletter/Web Info: arti-cles are welcome. Members of thisnew group are Jim Reilly (RomeLabs), Edmund Kyser (TandemComputers), Steve Bryant (TTC),Judith Untiedt (Teradyne, Inc.),Abhijit Dasgupta (Univ. of Mary-land), Mike Silverman (QualMark),Gary Hazard (Tellabs), EdwardPohl (AFIT, USAF), Chris Hanse(Hanse Gechnology). The cham-pion of this group is vacant.

� Standards: volunteers are wel-come Members of this new groupare Eric Cheng( Astec, HongKong), Jim Reilly (Rome Labs),Gary Hazard (Tellabs), SteveBryant (TTC), Judith Untiedt(Teradyne, Inc.), Abhijit Dasgupta(Univ. of Maryland). The cham-pion of this group is vacant.

■ Technical Committee on Auto-motive SystemsChair: Clement Aladekugbe(Carrier Corporation, [email protected])Co-chair: Bryan Dodson(Continental Taves,[email protected])Members: There would be aboutsix committee members to be se-lected before the end of June mainlyfrom the automotive companies. Thechairperson has selected one to date.The name of the one selected is RafiuAjayi (Ford Motor Company).

continued on page 8

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8 Reliability Society Newsletter ■ July 2000

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The Scope, Objectives andActivity Plans:� Conduct monthly meet ings via

teleconference, video conference, andinternet

� Conduct projects on automotive technol-ogy and produce an annual assessment ofreliability in the automotive industries

� Conduct projects on product quality inautomotive industries

� Publish committee projects on the Reli-ability Society web site, Reliability Soci-ety newsletter and present committeeprojects at the International PhysicsSymposium or at R&M Symposium

� Answers members questions and auto-motive industries questions

Tech-Opscontinued from page 7

New Books on Reliability:

■ The Fault Tree Method(in the Fields of Reliability and Safety Technology) 1999, 206 pp.

■ Petri Nets for ReliabilityModeling (in the Fields of Engineering Safety and Dependability)1999, 200 pp.

Each (soft cover) copy costs in total $21.The author is Dr. W. Schneeweiss, SM IEEE, Prof. em. of Comp. Engg.

at the German Univ. for Distance Studies.Fast delivery is guaranteed in US/Canada & Europe. For more details

consult:www.lilole -verlag.dee-mail: Information L&LiLoLe -Verlag. deFAX: **49 2331 590981LiLoLe-Verlag Gmbh (Publ. Co. Ltd.)Im Erlenbusch 613, D-58093 Hagen, Germanyserves Life-Long Learning.

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Designing Systems for Reliable Human PerformanceVideo Tutorial at a Special Discount

PISCATAWAY, NJ, 27 March 2000— Reliability Society President Dr. KenLaSala and Dr. Samuel Keene, IEEE Fel-low, agree that the many system failuresand errors due to humans are far toomany. Data show that 70% of failures inuse are due to humans, with conse-quences that range from loss of service toproduct liability claims.

However, there is no need for productdesigners to accept this situation. The wayto avoid this situation is to be more attentiveto the human aspects of the product. IEEEmakes it easier for you to develop hu-man-friendly products by offering its “De-signing Systems for Reliable HumanPerformance” videotape tutorial at the dis-counted price of $299 IEEE Member/$399Non-Member. In less than three hours, anIEEE panel of experts will provide youwith an understanding of the following as-pects of designing products so humans canuse them reliably:

■ Consideration of the human in sys-tems analysis and reliability

■ Factors affecting reliable humanperformance

■ Models of human performance■ Sources of human performance reli-

ability data

■ Methods for designing systems thatinclude humans

■ Predicting the reliability of humanperformance

■ Testing methods for systems that in-clude humans

Not only does the tutorial include lec-tures on the above topics, but it also in-cludes panel discussions about criticaltopics in designing products for humans.

This videotape, released in 1997, con-sists of 2 videotapes and presentationsnotes. The IEEE NTSC product order

number is HV6979-QVE and for the PALproduct order number is HV6980-QVE.Order from the IEEE Customer ServiceDepartment, 445 Hoes Lane, PO Box1331, Piscataway, NJ 08855-1331, USA.For single sales, call 1-800-678-IEEE(1-732-981-0060 outside the USA andCanada); for company or institutionalsales, call 1-800-701-IEEE; or fax732-981-9667. Or order from our conve-nient Online Store, access from the IEEEhomepage: www.ieee.org. Shipping andhandling charges apply.

Concurrent EngineeringPerspectives: Concepts to SuccessVideo Tutorial at a Special Discount

PISCATAWAY, NJ, 27 March 2000— Dr. Samuel Keene, IEEE Fellow, oftenemphasizes that concurrent engineeringsimplifies product development and man-ufacture. This video course shows how tomanage product development to be suc-cessful in a competitive market place.

The concepts first presented in this1996 video package are always relevantto the workplace, because “lessonslearned” is the basis from which all pro-grams can benefit. Concepts and methodsintroduced in these videos never becomedated because they are not fads. They

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ADVERTISEMENT

Page 9: Reliability Society · Franklin, Newsletter Editor, and Bob Loomis, Newsletter As-sociate Editor (and VP Publications), in bringing the Reliabil-ity Society Newsletter to a new level

July 2000 ■ Reliability Society Newsletter 9

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help you realize shorter product develop-ment cycle times, make speedier programdecisions, maintain program focus, andkeep diversions at bay. The IEEE is offer-ing the video tutorial, “Concurrent Engi-neering Perspectives: Concepts toSuccess,” at the special reintroductoryprice of $299.00 IEEE Member/$399.00Non-Member.

Concurrent engineering is a synergis-tic approach to product development in aprocess-oriented engineering environ-ment. Top experts in concurrent engi-neering have designed this course todeliver practical information in a waythat will enable you to apply these tech-niques immediately. Avoid pitfalls andspeed your robust products to the market-place. Learn:

■ Development tools that save bothtime and project resources

■ How to assure timely considerationof Life Cycle Cost (LCC) factors

■ Design for Manufacturability(DFM) and affordability practices

■ How to promote state-of-the-artbreakthroughs in your products

■ Product development “lessonslearned” that you can apply immedi-ately

This videotape, released in 1996, con-sists of 2 videotapes and presentationsnotes. The IEEE NTSC product ordernumber is HV6965-QVE and for the PALproduct order number is HV6966-QVE.Order from the IEEE Customer ServiceDepartment, 445 Hoes Lane, PO Box1331, Piscataway, NJ 08855-1331, USA.

For single sales, call 1-800-678-IEEE(1-732-981-0060 outside the USA andCanada); for company or institutionalsales, call 1-800-701-IEEE; or fax 732-981-9667. Or order from our convenientOnline Store, access from the IEEEhomepage: www.ieee.org. Shipping andhandling charges apply.

The Educational Activities Board(EAB) of the IEEE recommends educa-tional policy to the IEEE Board of Direc-tors, and coordinates the Institute’seducational activities, programs, andproducts.

CONTACT:Lynn Murison

E-mail: [email protected]: 1.732.562.6526

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2000 Integrated Reliability Workshop

The 2000 Integrated ReliabilityWorkshop (IRW), sponsored by theIEEE Reliability Society and the IEEEElectron Devices Society, will be held atthe Stanford Sierra Camp on the shore ofFallen Leaf Lake near South LakeTahoe, CA from October 23rd to 26th,2000. This workshop provides a uniqueforum for open and frank discussions ofall areas of reliability research and tech-nology for present and future semicon-ductor applications.

The technical portion of the 2000workshop is being organized by AndreasMartin of Infineon Technologies AG andwill focus on six main areas:

■ Wafer Level Reliability Tests andTest Approaches

■ Identification of Reliability Effects■ New or Existing Reliability Char-

acterization and Prediction Models■ Reliability Test Structures■ Customer Product Reliability Re-

quirements / Manufacturer Reliabil-ity Tasks

■ Designing-in-Reliability (Circuits,Processes, Products)

This year’s hot topics include Cu in-terconnects, reliability of deep sub-mi-cron, high speed, high frequency devices,

new dielectric systems, and reliabilitymodeling and simulation. This year’sworkshop promises to provide compre-hensive coverage of the topics crucial tothe reliability engineer.

The IRW is quite a bit different from atypical technical conference. From themoment you arrive, after winding slowlyback to the south shore of Fallen LeafLake, you realize that you are taking partin something special. Attendees stay incabins without TVs or phones, dress iscasual (suits, ties and high heels areshunned), affiliations are downplayed,and meals are taken at the lodge diningroom, family-style. Attendees of theworkshop are expected to actively partic-ipate. You feel yourself drawn into tech-nical discussions from the start. Everyaspect of this conference, from the iso-

lated location to the format of the techni-cal program, is designed to get attendeesto interact.

Located just a short drive (less thantwo hours) from Reno, the Stanford Si-erra Camp is situated at 6000 ft in theHigh Sierra on Fallen Leaf Lake. Atten-dees stay in cabins nestled amid the pinesand cedars along the shoreline. All cabinshave decks and breathtaking views of thelake and surrounding peaks (don’t worry,the cabins also have warm beds and hotshowers; phone booths are available inthe lodge). This peaceful setting, freefrom the distractions and annoyances ofmodern life, presents a terrific opportu-nity to really get to know your colleagues,including internationally renown experts,an opportunity not usually available atbigger, more hectic reliability confer-ences. Instead of watching TV, partici-pants spend their evenings at postersessions, discussion groups, and specialinterest groups (SIGs), all with refresh-ments provided to stimulate discussions.

One unique aspect of this workshop isthe opportunity for every attendee to

continued on page 10

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10 Reliability Society Newsletter ■ July 2000

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present a poster of their own research, nomatter what state it is in. Just arrange forspace when you register or bringlast-minute results in your briefcase orbackpack – your ideas will be accommo-dated. This a great way to share that newproject you are working on and getworld-class feedback. The poster pre-sentations are even eligible for a twopage write up in the conference proceed-ings. The open poster sessions are butone example of the opportunities for in-teraction that sets the IRW apart fromother conferences.

Another distinction of the IRW is themoderated Discussion Groups that areheld every evening of the workshop, al-ways on topics chosen to stimulate livelyconversation and debate among partici-pants. Last year’s discussion groupswere: 1) Fast WLR Monitoring, 2) BurnIn, 3) Thin Oxide Limits, 4) Electro-migration, and 5) Hot Carriers. The lead-ers of the discussion groups prepare writ-ten summaries, hi-lighting their sessions,which are also included in the workshopproceedings.

For those with the stamina, followingthe Discussion Groups are the Special In-terest Group meetings or SIGs (as atten-dees refer to them). The SIGs are

composed of small groups of researchersand engineers who continue their conver-sations and collaborations even after theyleave the workshop. Every attendee hasthe opportunity to become part of an ex-isting SIG or suggest a new topic and starttheir own. One particularly successfulexample is the Thin Oxide Integrity SIGwhich has met for several years and col-laborated to produce award winning pre-sentations at other reliability meetings.Be warned, remnants of the SIG discus-sions sometimes rage on into the weehours of the morning.

Yet another advantage are the tutorialshort courses, presented by world class ex-perts and included at no additional cost.These tutorials review basic topics as wellas the latest developments and thus are de-signed to be beneficial both to newcomersand experienced members of the reliabil-ity community. Last year’s tutorials werebroken into two sessions: Basic Reliabilityand Hot Carriers. The Basic ReliabilityTutorial included three main topics, 1)“Electromigration,” by Tim Sullivan ofIBM, 2) “(Ultra)thin Oxide Break-down(s), An Overview,” by EmmanuelVincent of STMicroelectronics, and“Burn-In,” by Rolf Vollertsen of InfineonTechnologies. The Hot Carriers Tutorialwas composed of “Hot Carrier Degrada-tion Evolution in Deep SubmicrometerCMOS Technologies,” by Alain Bravaix

of ISEM, and “Simulation, Modeling andLifetime Prediction for HCI,” by BruceMcGaughy of BTA Technology.

Last, but certainly not least, attendeeshave Wednesday afternoon off to enjoyactivities such as hiking (with the annualtrek to the top of Mt. Tallac as a favoritegoal), volleyball, canoeing, biking, walk-ing, or just conversing by the lake, all inthe fresh clean mountain air. This free af-ternoon is a favorite as is a great way notonly to network, but to build long-lastingfriendships.

Additional information about theworkshop is available on the IRWwebsite at www.irps.org/irw, or by con-tacting SAR Associates at 301 N. Madi-son Street; Rome, NY 13440, Phone:315-339-3968; fax: 315-336-9134. Note:If you want to take part in this event,please register early as space at the Stan-ford Sierra Camp is limited to roughly120 attendees and the workshop has soldout in the past.

On behalf of the 2000 Integrated Reli-ability Workshop Committee, we lookforward to meeting you in Lake Tahoe!

Dr. John F. Conley, Jr.Communications Chair, IRW 2000California Institute of Technology

NASA JPLPasadena, CA

[email protected]

IRWcontinued from page 9

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IEEE Seeks U. S. University Program EvaluatorsPISCATAWAY, NJ, 15 June 2000.

The IEEE Educational Activities Boardseeks engineering professionals from in-dustry, government, and academe toserve as program evaluators for accredit-ing engineering and engineering technol-ogy programs at U.S. universities.Nominations will be accepted through 31October 2000.

The Accreditation Board for Engi-neering and Technology, Inc (ABET)provides a peer review of university pro-grams that is so important to the continu-ing vitality and quality of the engineeringand engineering technology professions.Aside from the professional and publicgood that evaluators perform, there are

specific benefits to the evaluators andtheir employers. The evaluators aretrained in the Quality Process and are ableto hone their decision-making skills. Byvirtue of being on campus, evaluators canidentify potential will be the future inno-vators and industry leaders.

The IEEE members selected will attenda one-day training seminar on theIEEE/ABET accreditation process, one ofwhich will take place at the June 2001American Society for Engineering Educa-tion convention in Albuquerque, NewMexico. After training, these programevaluators will visit engineering and engi-neering technology departments across thecountry on behalf of the IEEE and ABET.

Evaluation sessions take place each falland generally run for two to three days.

Information packages, including theapplication and nomination forms, areavailable on the WWW at: http://www.ieee.org/organizations/eab/apc/ceaa/engapplication.htm (engineeringprograms) and http://www.ieee.org/or-ganizations/eab/apc/ctaa/techapplica-tion.htm (engineering technologyprograms). For more program informa-tion, contact [email protected].

Lynn MurisonOutreach Administrator,

IEEE Educational Activitiesph: 1.732.562.6526

www.ieee.org/organizations/eab/

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July 2000 ■ Reliability Society Newsletter 11

IEEE Standards Projects by Society Now on Web

To: IEEE-SA Members

To assist you in keeping abreast ofIEEE Standards Activities, we havecompiled a list of new, revised, andwithdrawn standards and standardsprojects, listed by sponsoring IEEE So-ciety, that have been recently approvedby the IEEE-SA Standards Board.

For our returning subscribers, youmay notice that the list is not in this let-ter. Instead, I have placed it up on ourweb site. Please copy and paste the url,

http://standards.ieee.org/sa-mem/bdapp.html, into your browser to viewthe information.

A more detailed account of the rec-ommendations from the IEEE-SAStandards Board New Standards Com-mittee (NesCom) and Review Commit-tee (RevCom) will be posted shortly tothe web site and you may check theseurls respectively, http://standards.ieee.org/board/nes/index.html orhttp://standards.ieee.org/board/rev/index.html.

As always, please contact me withyour questions and comments. Thankyou.

Sincerely,Ronni Rubenstein

IEEE-SA MembershipAdministrator445 Hoes Lane

Piscataway, NJ 08855 USATel: +1 732 562 6381Fax: +1 732 562 1571

[email protected]

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Global Course Access and Discounts Too

PISCATAWAY, NJ. April 28, 2000.On June 1 professional development getseasier and more convenient for IEEEmembers. That date marks the start of fullaccess to the co-sponsored Stevens Insti-tute of Technology Online WebCampuscourses and the all-IEEE generatedVideo-on-Demand tutorials. Either oneclick off the Educational Activities Board(EAB) homepage for easy access to eitheror use the discrete sites quoted below.

IEEE members receive a 10% dis-count on all Stevens WebCampus onlinecourses. The Stevens online courses, cur-rently numbering eleven, are in three hotfields: Wireless Communications, Tele-communications Management, andTechnology Applications in Science Ed-ucation. Our members and their employ-ers appreciate that the same highlyrespected Stevens faculty teaches boththe traditional oncampus courses and theonline courses.

EAB Professional Development com-mittee member, Sameer Kalra, while stilla graduate student at Stevens, partici-pated in the design of the online Wirelesscourse. To Mr. Kalra “the single most im-portant feature of the online course is that

you can access it anywhere, anytime atyour convenience.” The busy profes-sional can determine scheduling, courselengths, order of classes, and graduatecredit or Continuing Education Unit op-tions, from anywhere in the world. Mod-est systems requirements make thesecourses global friendly.

Check registration requirements andsample a class at the Stevens website:http://attila.stevens-tech.edu/gradschool/distance_learning/courses/sample.html

For Video-On-Demand IEEE part-nered with Softcom, Inc. to stream video-tapes of lectures and tutorials over theweb directly to the user’s desktop. By us-ing a free Real Networks G2 player,members are able to watch the tutorialsfrom any computer connected to theInternet in any part of the world without adownload period.

Fifteen moderately priced tutorials,taught by experts in their fields, are cur-rently being offered in five subject areasincluding communications, computer en-gineering and networking, power and en-ergy, and signal and image processing.

All courses feature a five to sevenminute preview, so users can browse be-

fore buying. Courses are available as one-month subscriptions from the order dateand may be purchased online. Includedwith the integrated, synchronous audio,video, and slide presentation, is a Fre-quently Asked Question page, helpscreens and an interactive table of con-tents that allows users to go directly to in-formation or presentations of interest.

Systems requirements and previewsare explained on the Video-On-Demandwebpage http://ieee.mediaplatform.com/vod/ieee/index.po.

Stevens and VOD are just a start to aseries of innovative partnerships of IEEEEducational Activities with industry anduniversity educational programs and de-livery systems. The series will maximizelife long learning and professional devel-opment opportunities for IEEE membersglobally.

Lynn MurisonOutreach Administrator,

IEEE Educational Activitiesph: 1.732.562.6526

www.ieee.org/organizations/eab/

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12 Reliability Society Newsletter ■ July 2000

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Meeting NoticeFinal Call For Papers

IEEE 2000 InternationalIntegrated Reliability Workshop

October 23-26, 2000http://www.irps.org/irw/Stanford Sierra Camp,Lake Tahoe, CA

SUBMISSION DEADLINE:JULY 7th, 2000

From the moment you arrive at the southshore of Fallen Leaf Lake, you realize thatyou are taking part in something special.The IEEE Integrated Reliability Workshop(IRW) is quite a bit different from a typicaltechnical conference. Attendees stay incabins without TVs or phones, dress is ca-sual (suits, ties, and high heels areshunned), affiliations are downplayed, andmeals are served at the lodge dining room,family-style. Attendees of the workshopare expected to actively participate and youfeel yourself drawn into technical discus-sions from the start. This peaceful setting,free from the distractions and annoyancesof modern life, presents a terrific opportu-nity to really get to know your colleagues,including internationally renown experts,an opportunity not usually available at big-ger, more hectic conferences. Every aspectof this conference, from the isolated loca-tion, to the format of the technical program,to the Wednesday afternoon off, is de-signed to get attendees to interact.

The committee of the 2000 IRW in-vites you to submit an abstract describingyour latest reliability work….

CALL FOR PAPERSThe Integrated Reliability Workshop

continues to focus on ensuring semicon-ductor reliability through component fab-rication, design, characterization, andanalysis tools. It provides a unique envi-ronment for envisioning, developing, andsharing reliability technology for presentand future semiconductor applications.Hot reliability topics of the workshop are:Cu interconnects, reliability of deepsub-micron, high speed, high frequencydevices, new dielectric systems, and reli-ability modeling & simulation.

We invite you to submit a presentationproposal that addresses one or more of thefollowing topics:

� WAFER LEVEL RELIABILITYTESTS AND TEST APPROACHES

� IDENTIFICATION OF RELI-ABILITY EFFECTS

� NEW OR EXISTING RELIABIL-ITY CHARACTERIZATION ANDPREDICTION MODELS TOSHOW

� RELIABILITY TEST STRUC-TURES

� CUSTOMER PRODUCT RELI-ABILITY REQUIREMENTS /MANUFACTURER RELIABIL-ITY TASKS

� DESIGNING-IN RELIABILITY(CIRCUITS, PROCESSES, PROD-UCTS)

SUBMISSION DEADLINE: Re-ceived no later than JULY 7th, 2000.(Please note that the deadline has beenEXTENDED.)

Your submission should state clearlyand concisely the results of your work andwhy they are significant. Representativedata and/or figures that support your pro-posal are REQUIRED. You can submityour work as a paper or a poster.

Preferably, please e-mail your maxi-mum two-page abstract (incl. figures) orairmail (express mail preferred) it with 15copies to either the Technical ProgramChair or the Vice Technical ProgramChair. If you send the proposal by e-mail,please send it as a MS Word document or.pdf file. Your proposal must include thename, affiliation, complete return ad-dress, telephone and telefax numbers, ande-mail address for each author.

Telefax submissions will NOT be ac-cepted. All submissions will be acknowl-edged within three weeks. If you do notreceive acknowledgment of your submis-sion, please contact the Technical Pro-gram Chair.

Visual aids for the ACCEPTED pro-posals are required by September 8, 2000

for inclusion in the Presentation Handoutavailable at the workshop.

A written version of your presentationis due at the workshop for inclusion in theFinal Report.MAIL TO: Andreas Martin,Technical Program Chair, IRW 2000Infineon Technologies AGOtto-Hahn-Ring 681739 MuenchenGERMANYTel: ++ 49 89 234 45257Fax: ++ 49 89 234 45822e-mail: [email protected].... or...Linda M. Head, PhD,Tech. Prog. Vice ChairAssociate ProfessorElectrical and Computer EngineeringRowan University201 Mullica Hill Rd.Glassboro, NJ 08028856-256-5335 856-256-5241(FAX)[email protected]

2000 IRW ADVANCEREGISTRATION

� October 2326, 2000� Stanford Sierra LodgeAdvance Registration should be made

well before September 2000 to insureyour space at the Workshop. THEWORKSHOP HAS LIMITED SPACE(for approx. 140 attendees) and YOUARE ENCOURAGED TO REGISTEREARLY (the conference has sold out inthe past).

The Registration fee is US$925 forIEEE Members and US$975 fornon-members, which includes: meals,lodging, and refreshments at the StanfordSierra Camp; Presentation View Graphs(provided at the Meet-ing); and the 2000IRW Final Report (published after theMeeting).

LODGING & FACILITIESNestled throughout the pines and ce-

dars along the shoreline of Fallen Leaf

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July 2000 ■ Reliability Society Newsletter 13

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Second International Software AssuranceCertification Conference (ISACC 2000)

September 24-26, 2000

Hyatt Regency Hotel,Reston Town Center,Reston, Virginiahttp://www.isacc.com

Theme: Issuing SoftwareCertificates of QualityGeneral Chair:Dr. Gary McGraw([email protected])Program Chair: Dr. Jeffrey Voas([email protected])Conference Manager:Jen Norman([email protected])

ISACC 2000 is the second internationalconference in an annual series to be de-voted exclusively to the topic of softwarecertification. Its predecessor conference,ISACC’99, was held in March of 1999 andwas a major success, attracting researchers,academics, practitioners, government offi-cials, and industry executives.

Today, enormous pressure is drivingthe search for technologies, tools, meth-odologies, and models that can certifysoftware. Why? Because it is imperativethat users know a priori whether de-

ployed software will “behave as adver-tised.” Similar to last year’s conference,ISACC 2000 will be the key internationalforum where software users and publish-ers can exchange points of view on howbest to certify software.

The theme of ISACC 2000 is “IssuingSoftware Certificates of Quality”. ISACC2000 will focus its attention on the differentapproaches toward “stamping” softwarewith declarations of quality. As an exampleof such a declaration, the British TradeMarks and Service Marks Rules defines a“certified trademark” as “a mark adapted inrelation to any goods to distinguish in thecourse of trade goods certified by any per-son in respect to origin, material, mode ofmanufacture, quality, accuracy or othercharacteristic, from goods not so certified.”By employing such a definition, a stamp ofquality could be devised to differentiategood software from inferior software.

While ISACC 2000’s theme is techni-cal, it is equally important to recognize thatthe near-term prospects for software certifi-cation are largely driven by non-technicalissues. Software is increasingly used in sys-tems where failure threatens safety, eco-nomic loss, loss of privacy orconfidentiality, and other injuries. ISACC

2000 is also greatly interested in addressingthe legal/liability, social, and political im-pacts of certification.

ISACC 2000 will again explore thequestion of whether the governmentshould mandate what the certification re-quirements are for given species of soft-ware systems, or whether “private-sector” developers should self-regulatevia a core set of certification technolo-gies. If self-policing is preferred, will itbe by an honor system or will softwarecertification laboratories be the means bywhich software vendors show that theirsoftware is of high quality?

In summary, the ISACC conferenceseries seeks practitioners, attorneys, re-search scientists, industry executives,CIOs, and those that are interested in pub-lic policy to discuss ways in which soft-ware certification can be transformedfrom being viewed as a tax on the indus-try to being viewed as a trophy.

Topics of particular interest to theISACC 2000 program can be divided intotwo categories and include:

� Certification Issues:� Certification Authorities and Labo-

ratories

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Lake, a few miles from South LakeTahoe, are clusters of 2 and 3 bedroomcabins furnished in the rustic style of analpine resort.

Each cabin cluster is equipped withshared bathroom facilities. All roomshave decks with magnificent views ofFallen Leaf Lake and surrounding Sierrapeaks.

The physical isolation of the locationand the absence of distractions, such asin-room phones and television sets, en-courages extensive interaction among theWorkshop attendees. Lodging is avail-able for meeting attendees only.

JEDEC JC-14.2 MEETINGThe JEDEC JC-14.2 Committee on

Wafer Level Reliability meet-ing willbe held immediately after the Work-shop at the Stanford Sierra Camp onThursday afternoon and Friday morn-ing. Members, alter-nates, and guestsare welcome. The cost for the accom-modations is US $160.00, which in-cludes Thursday night dinner andlodging and Friday breakfast and lunch.All attendees must leave the camp afterlunch on Friday. If you have any ques-tions, please call Michael Dion at (407)724-7067. If you want to become a

member of JC-14.2, please call theJEDEC office at (703) 907-7558.

ADDITIONAL INFORMATION:Including a complete downloadable

version (.pdf) of the Call for Papers / Reg-istration Information is available on theIRW WebSite at www.irps.org/irw.

We look forward to meeting you inTahoe!

John ConleyCommunications Chair,

IRW 2000

continued on page 16

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14 Reliability Society Newsletter ■ July 2000

RELEX Center Spread

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July 2000 ■ Reliability Society Newsletter 15

RELEX Center Spread

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Preliminary Notice

Intelligent Transportation System Council (ITSC)October 2-3, 2000

and

IEEE Intelligent Vehicles Symposium IV2000October 4-5, 2000, Dearborn, MI

The following special sessions will beheld during the symposium:

� Military Applications and CurrentResearch

� organized by Bruce Brendle, U.S.Army Tank-automotive & Arma-ments Command organized by

Christoph Stiller, Robert BoschGmbH, Germany

� Autonomous Driving on ExtremeCourses

� User Interfaces for On-Board Sys-tems organized by Mauro Mosconi,University of Pavia, Italy

� Vehicle Motion Control Systemsorganized by Aurelio Piazzi andCorrado Guarino Lo Bianco, Uni-versity of Parma, Italy

� Autonomous Vehicles Cooperationand Coordination organized byGiovanni Adorni, University of

16 Reliability Society Newsletter ■ July 2000

Maastricht, the Netherlands,EU.

September 5th-7th

The symposium on Digital Systems Design addresses both architecturesand implementations of embedded) digital systems as well as efficient de-sign methods and tools. It is a discussion forum of the state-of-the-art re-search, development and applications for the research community workingon computer system architecture, microprocessor architecture and design,logic design, application specific integrated processors, systems on a chip,hardware/software codesign, and design automation.

Topics include:� CPU and memory architectures: arithmetic and logic units, co-proces-

sors, pipelining, superscalarity, cache, MMU.� Special architectures: DSP, ASIPs, graphic and image processors, custom

computing machines, processing arrays and FPGAs, reconfigurablestructures.

� Specification and modeling: (hardware/software) system specifica-tion and modeling, system and hardware description languages,component modeling.

� Validation: simulation, emulation, prototyping and testing at the sys-tem, RT and logic level, multilevel- and co-simulation, formal verifica-tion.

� Synthesis: system on chip design; system, hardware-software, high-level,RT-level and logic synthesis, intellectual property and design reuse; syn-thesis for low-power, speed and testability; system, hardware/softwareand logic partitioning.

GENERAL INFORMATION ON EUROMICRO CONFERENCEShttp://www.euromicro.org

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� Certification Ethics� Existing Software Standards (ISO, CMM, IEC,

USNRC, FDA, NCSA, etc.)� Government’s Role in Software Quality and

Consumer Protection Legislation� Product vs. Process Certification vs. Person-

nel Licensing� Software Liability� Software Engineering Malpractice� Software Insurance� Software Warranties (Express and Implied)� The Roles for Professional Organizations

(ACM, IEEE, ASQ, etc.)� Uniform Commercial Information Transac-

tions Act� US Congressional Policy and Upcoming

Hearings

Technology Advances:� Commercial-off-the-shelf (COTS) software

quality� Firewall certification� Independent Verification and Validation� Software Metrics and Measurement� Software Validation� Software Reliability Measurement� Software Safety Assessment� Software Security Assessment� Testing/Verification and Validation

ITSCcontinued from page 13

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July 2000 ■ Reliability Society Newsletter 17

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Parma, Italy and Hiroaki Kitano,Sony Computer Science Labs, Japan

IEEE IntelligentVehicles SymposiumThe Ritz-Carlton Hotel,Dearborn, MI, USAOctober 4-5, 2000

The IEEE Intelligent TransportationSystem Council (ITSC) is sponsoring a pro-fessional-level conference on basic researchand present and future applications for Intel-ligent Vehicles and Intelligent Infrastruc-tures. Papers dealing with vehicle-centeredintelligent systems will be presented. Thissymposium is characterized by a single ses-sion format so that all the attendees remainin a single room for multilateral communi-cations in an informal atmosphere. As an-other tradition, the meetings haveenthusiastic participation from industry, aswell as research centers and universities.The IEEE Conference on Intelligent Trans-portation Systems (ITS) will be held at thesame location on Oct. 2-3, 2000, and a single-reduced rate-registration option will beavailable forbothConferences, aswell as in-dividual registrations.

Topics� Driver Assistance Systems System

Architectures Sensors� Navigation/Guidance Systems Im-

aging and Vision Enhancement Ve-hicle Control

� Information Systems Human-ma-chine Interfaces Active Safety

� Traffic Monitoring and ControlCommunications and NetworksCAN

SPECIAL SESSIONSMilitary Applications andCurrent Research

This session will provide an opportunityto explore research and development activi-ties for autonomous and semi-autonomousground vehicle systems. It examines thetechnology requirements and operationalcapabilities of robotic vehicle programs formilitary, and commercial applications. Thesession brings together technologists to dis-cussneeds,opportunitiesandapproaches foradapting commercial automotive intelligentsystems to meet military off-road autono-

mous applications. The conference providesa unique opportunity to identify commercialresearch projects and leverage the results tomeet crucial military requirements.

Topics:� Government and Commercial pro-

grams: technical and performancechallenges, system performance,test results, lessons learned;

� Machine perception for navigationand mission execution; Vehicle mo-bility and motion control;

� Operator interface and human-robotinteractions.

Autonomous Driving on ExtremeCoursesTheme:

Autonomous vehicle guidance in ex-treme driving environment. Coping withsuch conditions is a prerequisite for the in-troduction of advanced driver assistancefunctions. Hence, a discussion of the re-quirements and approaches to meet withthese challenging conditions is expected toenhance insight into future developments,reveal missing links between current re-search and realization and provide impetusfor new activities. The session will gatherexperts from various disciplines to shedlight on the topic from different views.

Topics:� System architecture, Multisensor

systems, Advanced vehicle control,� Driving strategy formation, Self-as-

sessment, Reliability and Safety,� Driving robot.

User Interfaces for On-BoardSystemsTheme:

This session will focus on user inter-faces issues in vehicle-centered intelligentsystems and will feature experiences fromthe usability engineering perspective. Is-sues include, for instance, feedback, inte-gration, synchronization, context, andhow to make the most value from deviceswithin vehicles: many of these are also is-sues for stand-alone systems, but mobilityadds extra problems and opportunities.Those attending the session will be able tolearn from and establish contacts with re-searchers who are innovators in develop-ing human-computer interfaces.

Topics:� Feedback, Feedthrough, Integra-

tion, Synchronization, Context,� Multimodality, Design, Proto-

typing, Evaluation, Empiricalstudies.

Vehicle Motion Control SystemsTheme:

� This session will focus on controlsystems for autonomous vehiclemotion.

� Longitudinal and lateral control strat-egies of car-like vehicles will be pre-sented and the tight interplay withsensing systems (vision and nonvi-sion based) will be highlighted.

Topics:� Automatic steering control, Sensing

systems, Visual guidance, Imagedynamics estimation,

� Trajectory generation, Supervisorycontrol, Advanced control systemsdesign.

Autonomous Vehicles Cooperationand CoordinationTheme:

Cooperation and coordination of activ-ities and actions are fundamental taskswhen more than one agent is involved inaccomplishing a complex common goal.During the last few years several projectshave been started on such a topic. Amongothers, the European Handshaking (part ofPrometheus Project) subproject where au-tomobiles exchange information to betterorganize traffic flow; the Japanese rescueproject for intervention of autonomous ve-hicles (robots) during catastrophic events;the international RoboCup initiativewhere a team of autonomous indoor vehi-cles (robots) have to coordinate their ac-tions to implement a common strategy tocompete against another team accordingto the soccer rules. The goal of the work-shop is to focus on indoor and outdoor au-tonomous vehicles cooperation andcoordination issues and related topics.

Topics:� Fleets of indoor/outdoor autono-

mous vehicles,� Autonomous vehicles cooperation,

continued on page 18

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� Team strategies for autonomous ve-hicles,

� Team coordination in challengingenvironments,

� Team competitions, Coopera-tive/competitive behaviors,

� Cooperative distributed perception.

IV-2000 Home Page:http://www.ce.unipr.it/iv2000

TSC-2000 Home Page:

http://www.ewh.ieee.org/tc/its/cfp-itsc-2000.html

IEEE ITS Council Home Page:http://www.ieee.org/its

18 Reliability Society Newsletter ■ July 2000

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Preliminary Notice

IFIP World Computer Congress ‘2000Beijing, China

The Association for Computing Ma-chinery (ACM) and the IEEE ComputerSociety (IEEE-CS) became full membersof IFIP, the International Federation for In-formation Processing (www.ifip.or.at) inJanuary, 1999.

WCC ‘2000 will be held August21-25, 2000 in Beijing, China. It will behosted by the Chinese Institute of Elec-tronics, the China Computer Federation,and the Chinese Institute of Communica-tion. The theme of the Congress is “Infor-

mation Processing Beyond Year 2000.”Together with various keynotes, panels,and workshops, the main technical com-ponents of the Congress will consist ofeight federated conferences:

� ICCT: International Conference onCommunication Technologies

� ICSP: International Conference onSignal Processing

� ICDA: International Conference onChip Design Automation

� IIP: International Conference on In-telligent Information Processing

� ICEUT: International Conferenceon Educational Use of Technologies

� ITBM: International Conference onInformation Technology for Busi-ness Management

� ICS: International Conference onSoftware — Theory and Practice

� SEC: International Conference onInformation Security

More specific information about eachconference can be found at www.wcc2000.org.

ITSCcontinued from page 17

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Preliminary Notice

SBCCI2000 - XIII Symposium on Integrated Circuitsand Systems DesignCHIP IN THE JUNGLE

Tropical Hotel,Manaus, Amazonas,BrazilSeptember 18-22, 2000http://www.sbc.org.br/

sbcciThe SBCCI is a forum dedicated to in-

tegrated circuits and systems design, heldannually in Brazil. The location of its2000 edition will be Manaus: gateway tothe Amazon Rain Forest, flowers and ani-mals paradise, and a wonderful cuisine

make it a favorite tourists destination andprovide a great environment for holdingconferences and meetings.

SBCCI2000 will occur in the samevenue as SBMICRO2000 - Congress ofBrazilian Microelectronics Society. Thegoal of the symposium is to bring to-gether researchers in the areas of CAD,synthesis, design and test of integratedcircuits and systems. The IEEE Com-puter Society Press publishes the pro-ceedings in time for distribution at theconference. Besides the traditional tutori-

als, regular technical sessions, round ta-bles, working groups and exhibition, sev-eral activities are planned this year toencourage high quality contributions andenrich even more the meeting. The authorof the best papers presented at the sympo-sium will be invited to resubmit an ex-tended version that will be considered forpublication at the IEEE Design and Testof Computers Magazine.

A nice social program is being prepared,including a jungle excursion, with option tostay in a jungle resort (Ariau Hotel).

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July 2000 ■ Reliability Society Newsletter 19

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Topics of interest include, but are notlimited to:

� Rapid Prototyping� Design for Test� Micro-architectures� Logic and High Level Synthesis� Digital, Analog and Mixed-Signal

Designs� Formal Methods� Micro-Electromechanical Systems� Hardware-Software Codesign� Low-Power, Low-Voltage� Embedded Systems� Physical Design� Design Environments� Test and Testability� Industrial Applications

General Chair:Ricardo Reis, UFRGS - [email protected]

Prof. Ricardo ReisInstituto de InformaticaUniversidade Federal doRio Grande do SulAv. Bento Goncalves, 9500 -Campus do Vale - Bloco IVC.P.15064, CEP 91501-970Porto Alegre BRASILTel: +55-51- 3166830Fax: +55-51- 3191576Email: [email protected]://www.inf.ufrgs.br/~reis

Take a look at:http://www.inf.ufrgs.br/gme

Preliminary Notice

FPL 2000The 10th International Conferenceon Field Programmable Logic and

Applications

28 - 30 August 2000Villach, Austria

Future SoC - System on a Chip: im-possible without Reconfigurable Subsys-tems

The conference proceedings will bepublished by Springer Verlag http://link.springer.de/series/lncs/

Topics to be covered include:

� Reconfigurable Hardware and Sys-tems: Fine grain - Coarse grain - Re-configurable Computing, Adaptive- Customizable - Embedded - fault-tolerant, Architectures - Technol-ogies - Low Power - DynamicallyRec.

� Applications: Routing - Net-working - Wireless - EvolvableReal-world - Scientific - Rapid-prototyping - Others

� CAD, Compilation, Testing andVerification: Design Flow - Tools -Higher Level Synthesis, Intercon-nect - Parameter Estimation -

Benchmarks, Testing and Veri-fication of Dynamically Recon-figurable Apps

■ Surveys, Tutorials, Future, His-tory, and Education: Roadmapsto Technology, Application andDesign, Teaching Reconfigur-ables & Evolvables - CurricularImpact, Student Projects - In-dustry/University Programs -Publicity

� Evolvable Hardware and Evolu-tionary Compilation Methods:Evolvable Hardware (EH) - Co-Evolution, Tools and methodol-ogies - Genetic Programming

� Emerging and Other RL/RC-re-lated Methodologies: State ma-chines - Cellular Automata,Biologically inspired - Brain in-spired, fludic reconfigurablelogic and applications, Molecu-lar Biology Applications

For details on topic areas and con-ference location see:

http://xputers.informatik.uni-kl.de/FPL/FPL2000/detailed_fpl.html

Download Registration Form:pdf:

http://xputers.informatik.uni-kl.de/FPL/fpl2000/CfP_FPL2000.pdf

ps:http://xputers.informatik.uni-kl.de/

FPL/fpl2000/CfP_FPL2000.ps

Reiner HartensteinProgram Chair FPL-2000

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20 Reliability Society Newsletter ■ July 2000

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Preliminary Notice

International Conference on Communications,Computers and Devices ICCCD-2000

IIT-KHARAGPUR INDIADec. 14-16, 2000Tutorials: Dec.14, 2000

This Conference is being organizedby the Department of Electronics & Elec-trical Communication Engineering, IIT,Kharagpur on the eve of the Golden Jubi-lee of the Institute.

The topics of interest include:

� Telecommunications� Switching and Networking

� Signal Processing� Computers� Pattern Recognition & Computer

Vision� Electromagnetics� Photonics� Electron Devices & VLSI Circuits� Emerging & Next Generation Tech-

nologies in Communications,� Computers & Devices

Correspondence:Professor C K Maiti, Publicity Chair or

Professor S L Maskara, Technical Pro-gram & Publication ChairElectronics & ElectricalCommunication EngineeringDepartmentI.I.T., Kharagpur 721302, IndiaTelephone +91 3222 55221to 55224 & 77390 to 77393E-mail: [email protected]:http://www.iitkgp.ernet.in/ccd2000

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Reconfigurable Technology:FPGAs & Reconfigurable Processors for

Computing and ApplicationsTo be held as part of:

SPIE’s Photonics East Symposium on Voice Video,and Data Communications

5-8 November 2000, Boston Massachusetts

The past decade has seen a dramatic in-crease in the use of reconfigurable logic de-vices in commercial applications. Amongthe most significant milestones in this fieldare the arrival of million plus gate logic de-vices and the introduction of a series of newreconfigurable processors. These devicesare ideal for data-intensive, Internet, DSP,and other high performance embeddedtelecom and datacom applications.

Many systems engineers are using re-configurable technologies to overcomecomputation and product developmentbottlenecks. The advent of million plusgate counts and advanced manufacturingtechniques have made these reconfigur-able devices more economical and practi-cal for computing systems.

This conference, in it’s fifth year, fo-cuses on three areas of reconfigurabletechnology:

� New devices and systems� Tools and techniques� High-performance applications

The conference will present pa-pers that illustrate applications andtechniques for using reconfigurabletechnology in both design and pro-duction cycles. The following areasare considered:

� Field programmable devices� Reconfigurable processors� Programming tools and methodolo-

gies for reconfigurable devices &systems

� Applications and platforms utiliz-ing reconfigurable technology for:� network & data intensive appli-

cations� hardware/software codesign� rapid product development� high-performance computing� image, signal, and communica-

tion processing� robotics� evolvable algorithms

Internet http://www.spie.org/info/vv

If you have any questions regardingthe conference contact the ConferenceChairman, John Schewel [email protected](+1 818-342-8294).

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July 2000 ■ Reliability Society Newsletter 21

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ISSRE’2000The Eleventh International Symposium on

Software Reliability Engineering

Doubletree Hotel, San Jose, California, USA8th October - 11th October 2000http://www.rstcorp.com/conferences/issre2000

In Collaboration with

The International Conference onSoftware Maintenance ICSM’2000

http://www.rstcorp.com/conferences/icsm2000

Sponsored by the IEEE Computer SocietyOrganized by the Committee on Software Reliability Engineering of the

IEEE Computer Society and the Technical Council on Software Engineering

ABOUT ISSRE’2000The role of software is expanding rap-

idly in many aspects of modern life,ranging from critical infrastructures,such as transportation, defense, and tele-communication systems, to work-placeautomation, productivity enhancement,education, health-care, publishing,on-line services, and entertainment.Given the potentially costly impact ofsoftware failures for many of these appli-cations, it is important to have soundmethods of engineering reliable softwareas well as accurate methods of quantita-tively certifying software reliability.ISSRE’2000 seeks to bring togetherpractitioners and researchers fromaround the world to share the latest infor-mation and know-how related to all areasof software reliability engineering for abroad range of applications. The themeof the 2000 symposium will be “Ap-plying Software Reliability”. Like previ-ous symposia, ISSRE’2000 seeks newresults concerning today’s software reli-ability problems. But ISSRE’2000 willgive preference to papers focusing on theapplication of theory to the practice of re-

liability assessment. ISSRE’2000 hasadopted this theme so that: (1) research-ers can better hone their efforts towardthe real problems expected in the nextcentury, and (2) industry practitionerscan describe real-world problems and theneeded reliability technologies. Contri-butions are expected to advance the stateof the art or to shed light on current bestpractices and to stimulate interaction be-tween (and among) researchers and prac-titioners. Topics of will include:

� Practical applications of reliabilitymodeling

� Measurement for software reliabil-ity assessment

� Software reliability models� Software testing and verification� Software safety� Fault-tolerant and robust software� Reliability of distributed systems� SRE tools, education, and technol-

ogy transfer� Software reliability standards and

legal issues� Building high-integrity mobile

code systems

ISSRE’2000 and ICSM’2000 willfeature an entire day — Industry Day —on 11 October 2000 dedicated to keycompanies describing how they performsoftware reliability engineering, mainte-nance, and testing. The initial list of par-ticipants follows:

� IBM Global Solutions� NASA� Nortel� Sun Microsystems� European Industry� Italian Industry� RST Corporation

Industry Day will be followed by avisit to the exciting Technical Museumof Innovation in San Jose for an eveningof exhibits and dinner in the Communi-cations Gallery: Global Communica-tions and the Exploration Gallery: NewFrontiers!

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22 Reliability Society Newsletter ■ July 2000

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Call for PapersICSC/NAISO Call For Papers and

Conference Calendar (2000 and 2001)For further reference refer to the ICSC/NAISO home page at

http://www.icsc.ab.ca

Upcoming events:1. ICSC Congress on INTELLIGENTSYSTEMS AND APPLICATIONS(ISA’2000)University of Wollongong, Australia -December 12-15, 2000

http://www.icsc.ab.ca/isa2000.htm(submission deadline passed, except forspecial events, such as workshops and in-vited/special sessions)

ISA’2000 consists of:1.1 Symposium on COMPUTATIONALINTELLIGENCE (CI’2000)

http://www.icsc.ab.ca/151-info.htm

1.2 Symposium on INTERACTIVEAND COLLABORATIVE COM-PUTING (ICC’2000)http://www.icsc.ab.ca/152-info.htm

1.3 Symposium on INDUSTRIAL SYS-TEMS (IS’2000)

http://www.icsc.ab.ca/153-info.htm

1.4 Symposium on BIOLOGICALLYINSPIRED SYSTEMS (BIS’2000)

http://www.icsc.ab.ca/154-info.htm

1.5 Symposium on MULTI-AGENTSAND MOBILE AGENTS IN VIRTUALORGANIZATIONS AND E-COM-MERCE (MAMA’2000)

http://mama-2000.tripod.com/http://www.icsc.ab.ca/150-rel.htm

(MAMA’2000 has extended deadlines)

1.6 Workshop on MASS CUSTOMIZ-ATION MANAGEMENT (MCM’2000)

http://www-wi.cs.uni-magdeburg.de/mc/mcm2000/

1.7 Session/Tutorial on INTELLIGENTDECISION SUPPORT FOR LEGALPRACTICE

http://www.icsc.ab.ca./150-inv.htm

2. NAISO Congress on INFORMATIONSCIENCE INNOVATIONS (ISI’2001)American University in Dubai, U.A.E. -March 17-21, 2001

http://www.icsc.ab.ca/isi2001.htm

ISI’2001 consists of:2.1 Symposium on CLINICAL TRIALS(CT’2001)

http://www.icsc.ab.ca/161-info.htm

2.2 Symposium on E-BUSINESS ANDBEYOND (EBB’2001)

http://www.icsc.ab.ca/162-info.htm

2.3 Symposium on INTELLIGENT AU-TOMATED MANUFACTURING(IAM’2001)

http://www.icsc.ab.ca/163-info.htm

2.4 Symposium on ENGINEERING OFNATURAL AND INTELLIGENT SYS-TEMS (ENAIS’2001)

http://www.icsc.ab.ca/164-info.htm

2.5 Symposium on INTELLIGENTQUALITY MANAGEMENT AND ME-TROLOGY (IQQM’2001)

http://www.icsc.ab.ca/165-info.htm

2.6 Workshop on INFORMATION SYS-TEMS FOR MASS CUSTOMIZATION(ISMC’2001)

http://www-wi.cs.uni-magdeburg.de/mc/ismc2001/

2.7 Workshop on AUTONOMOUS ARTI-FICIAL SYSTEMS EXPLORING HOS-TILEENVIRONMENTS(AASEHE’2001)http://www.gmd.gr.jp/JRL/events.html

2.8 Workshop on DOCUMENT IMAGEANALYSIS AND UNDERSTANDING(DIAU’2001)

http://www.icsc.ab.ca/160-work.htm

2.9 ROBOT SOCCER CHAMPION-SHIP (FIRA-ISI’2001)

http://www.icsc.ab.ca/160-fira.htm

3. ICSC Congress on COMPUTA-TIONAL INTELLIGENCE-METHODSAND APPLICATIONS (CIMA’2001)University of Bangor, Wales, U.K. - June19-22, 2001

http://www.icsc.ab.ca/cima2001.htm

CIMA’2001 consists of:3.1 Symposium on FUZZY LOGICAND APPLICATIONS (FLA’2001)

http://www.icsc.ab.ca/171-info.htm

3.2 Symposium on ADVANCES IN IN-TELLIGENT DATA ANALYSIS(AIDA’2001)

http://www.icsc.ab.ca/172-info.htm

3.3 Symposium on ADVANCED COM-PUTING IN BIO MEDICINE (ACBM’2001)

http://www.icsc.ab.ca/173-info.htm

3.4 Symposium on ADVANCED COM-PUTING IN THE FINANCIALMARKET (ACFM’2001)

http://www.icsc.ab.ca/175-info.htm

3.5 Workshop on GRANULAR COM-PUTING (GrC’2001)

http://www.icsc.ab.ca/175-info.htm

4. ICSC Congress on SOFT COM-PUTING (SOCO’2001) and INTELLI-GENT SYSTEMS FOR INDUSTRY(ISFI’2001)University of Paisley, Scotland, U.K. -June 26-29, 2001

http://www.icsc.ab.ca/soco2001.htm

5. Third WORLD MANUFACTURINGCONGRESS (WMC’2001)Rochester Institute of Technology, N.Y.,USA - September 24-27, 2001

WMC’2001 consists of:5.1 Symposium on MANUFAC-TURING SYSTEMS (ISMS’2001)

http://www.icsc.ab.ca/191-info.htm

5.2 Symposium on MANUFAC-TURING TECHNOLOGY (ISMT’2001)

http://www.icsc.ab.ca/192-info.htm

5.3 Symposium on MANUFAC-TURING MANAGEMENT (ISMM’2001)

http://www.icsc.ab.ca/193-info.htm

For information on further events, publi-cations, further details and updatedevents please follow the above links orvisit our homepage at:

http://www.icsc.ab.ca

ICSC International Computer ScienceConventionsNAISO Natural & Artificial IntelligenceSystems Organization5101C - 50 Street - Wetaskiwin,AB T9A 1K1 - [email protected] (operating)[email protected] (planning)Website: http://www.icsc.ab.caPhone: +1-780-352-1912Fax: +1-780-352-1913

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2000 IEEE Microelectronics Reliability and Qualification WorkshopHilton, Glendale, California

October 31 – November 1, 2000http://parts.jpl.nasa.gov/workshop/home.htm

Sponsored By:Aerospace Corporation

Air Force Research LaboratoryDefense Threat Reduction Agency

Goddard Space Flight CenterIEEE Components, Packaging and Manufacturing Society

Jet Propulsion LaboratorySandia National Laboratory

CALL FOR PAPERS

The 3rd annual Microelectronics Reliability and Qualification Workshop will be held October 31st -November 1st, 2000 at the Hilton in Glendale, California. The purpose of the workshop is to provide aforum for open discussion in all areas of microelectronics reliability and qualification for highreliability and commercial applications. Papers detailing latest results or work in progress in all areasof microelectronics device reliability and qualification methodologies are solicited. General topics ofinterest include:

•••• RELIABILITY (accelerated testing, electromigration, hot carrier, TDDB, etc.)•••• QUALIFICATION METHODOLOGIES (COTS, screening, ESD, etc.)•••• RELIABILITY MODELING AND SIMULATION (devices, materials, atomic scale, etc.)•••• MATERIALS (advanced materials, dielectrics, thin oxides, SiGe, III-V, defects, etc.)•••• SPECIAL ENVIRONMENTS (radiation, extreme temperature, temperature cycling, etc.)•••• ADVANCED TECHNOLOGIES (MEMS, NVM, MOS, advanced devices, etc.)•••• PROCESS, PRODUCTION, and YIELD (impact on reliability)

PAPER SUBMISSION:Prospective authors are requested to submit an abstract of not more than 300 words. The abstract mustinclude the author’s name, affiliation, complete address, telephone, and FAX number, email, andpreference for oral (approx. 20 minutes) or poster presentation. The abstract must state: (1) the purposeof the work, (2) the results or conclusion of the work, and (3) how the work advances the knowledge ofmicroelectronics reliability or qualification. Authors are responsible for obtaining all requiredcompany and government clearances prior to submission.

Please submit your abstract electronically (MS Word attachment preferred) by August 25, 2000 to:

John F. Conley, Jr., Technical Program ChairTel: (818)354-3188, Fax: (818)393-4559

[email protected],

Authors will be notified by September 20, 2000 of acceptance. A two to four page written summary ofall accepted presentations will be due by October 13, 2000 for inclusion in the workshop proceedings.

REGISTRATION:Registration fee is $120, which includes break service, lunch, exhibit reception, and workshopproceedings. Further information regarding registration and lodging will be available by June 2, 2000at http://parts.jpl.nasa.gov/workshop/home.htm.

For additional information, please contact:

Joanne Wellman, Local Arrangements ChairTel: (818)354-0318, Fax: (818)393-4559

[email protected]

General Chair:Sammy KayaliJet Propulsion Lab.(818)354-6830

Technical Program Chair:John F. Conley, Jr.Jet Propulsion Lab.(818)354-3188

Technical Committee:Joseph BenedettoUTMC(719)594-8415

Steve BrockettTriQuint Semiconductor(503)615-9303

Tomasz BrozekMotorola(480)814-4403

Joseph ClementSandia National Lab.(505)284-6640

Lewis CohnDTRA(703)325-1156

Ken LaBelGSFC(301)286-9936

Ronald LaCoeAerospace Corporation(310)336-0118

Manish PageyDynamics Research Corp.(619)523-3660

John SuehleNIST(301)975-2247

Scott TysonAFRL-SEPT(505) 846-1106

Jim VinsonIntersil Corp.(321)729-5074

Local Arrangements ChairJoanne WellmanJet Propulsion Lab.(818)354-5787

Publicity/Exhibits ChairChoon LeeJet Propulsion Lab.(626)354-0108

Important Dates:Submission Deadline:August 25, 1999Workshop:October 31- November 1

Page 24: Reliability Society · Franklin, Newsletter Editor, and Bob Loomis, Newsletter As-sociate Editor (and VP Publications), in bringing the Reliabil-ity Society Newsletter to a new level

SOLE – THE INTERNATIONAL SOCIETY OF LOGISTICS

Presents

SSSSOOOOLLLLE E E E 2000 2000 2000 2000 – – – – TTTThhhhe e e e 35353535tttthhhh AAAAnnunnunnunnuaaaal l l l IIIInnnntttteeeerrrrnnnnaaaattttiiiioooonnnnaaaal l l l CCCCoooonnnnfefefeferrrreeeennnncccce e e e aaaannnnd d d d EEEExxxxhihihihibbbbiiiittttiiiioooonnnn

LLLLOOOOGGGGIIIISSSSTTTTIIIICCCCSSSS: : : : CCCCOOOORRRRNNNNEEEERSRSRSRSTTTTOOOONNNNE E E E OOOOF TF TF TF THE FUTURHE FUTURHE FUTURHE FUTUREEEE

Meetings & Workshops August 5-7, Conference August 8-10

SSSSOOOOLLLLE E E E – – – – TTTThhhhe e e e IIIInnnntttteeeerrrrnnnnaaaattttiiiioooonnnnaaaal l l l SSSSoooocccciiiieeeetttty y y y oooof f f f LLLLooooggggiiiissssttttiiiiccccssss is proud to present three full days of exciting, educational and topicalproceedings, designed to enhance the value of the individual logistician in the workplace. Opening Sessions eachmorning feature highly regarded and well known logisticians, including, of course, the Hubble Servicing Astronauts.These Sessions are followed by nearly one hundred individual presentations by your fellow logisticians: learn how theyare doing what you may be asked to do.

Invited Speakers:Tuesday Morning:Daniel L. Dornan P.E., PriceWaterhouseCoopers LLP

Thomas J, Edwards, US Army Combined Arms Support CommandSusan C. Kinney, Arthur Anderson LLPRobert Taylor, Office of Naval ResearchRussell A. Vacante, Ph.D., Chairman, TRANSLOG International

Wednesday Morning:Panel Discussion: “Partnership in Reliability Maintainability and SupportabilityStandards”, Dr, Vacante, Moderator

Herb Kaufman, Director, SAE Technical Standards and ResearchBelinda L. Collins, Ph.D., Director, NIST Office of StandardsGregory E. Saunders, Director, Defense Standardization ProgramThursday MorningLLLLtttt. . . . GGGGeeeennnn. . . . JJJJoooohn hn hn hn MMMM. . . . ““““MMMMiiiikkkkeeee” ” ” ” MMMMccccDDDDuuuuffffffffiiiieeee, , , , UUUUSSSSAAAA, Director for Logistics, The Joint Staff, Pentagon,

Washington D.C., followed by:TTTThhhhe e e e HHHHuuuubbbbbbbblllle e e e AAAAssssttttrrrroooonnnnaaaauuuuttttssss

Five Simultaneous Papers Sessions, Tuesday through Thursday, August 8, 9, &10:Management and Strategy, Space Logistics, Defense and Supportability, Electronic Commerce, Supply Chain

Management PPPPlllluuuussss Posters Presentations of General Interest in the Exhibit Hall

Exhibition Hall: Major providers of Logistics Products and Services, Exhibitors Reception on Tuesday, Luncheon onTuesday and Wednesday.

Workshops, Sunday: Supportability; Six Sigma; Statistics for Logisticians; Developing Standards. Monday: Marks of Conformity; System Engineering; SOLE and You

Visit the SOLE Web Site at www.sole.org to Register for the Conference, Join SOLE, or for more details about the SOLE2000 presentations and Workshops. You may also contact SOLE Headquarters at 301-459-8446; e-mail:[email protected].

Make room reservations directly with the hotel:Sheraton New Orleans Hotel500 Canal Street, New Orleans, Louisiana800-253-6156, Mention SOLE 2000(504-525-2500; fax is 504-561-0178)

Page 25: Reliability Society · Franklin, Newsletter Editor, and Bob Loomis, Newsletter As-sociate Editor (and VP Publications), in bringing the Reliabil-ity Society Newsletter to a new level

Copyright ©, ISQED, 1998-2000, all rights reserved

C A L L F O R P A P E R S

����������� 2001 International Symposium on

Quality Electronic DesignMarch 26-28, 2001 , San Jose, California, USA

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Page 26: Reliability Society · Franklin, Newsletter Editor, and Bob Loomis, Newsletter As-sociate Editor (and VP Publications), in bringing the Reliabil-ity Society Newsletter to a new level

26 Reliability Society Newsletter ■ July 2000

Technical Magazine Section

INET Infrastructure Technology Options andLife Cycle Reliability

The battle for providing internet accessand content services the last distance tohomes, offices and other facilities involvessome unexpected competitors. Telephone,cable, terrestrial wireless, electrical utility,and communication satellite companies,content-providers and some municipalitiesare the primary stakeholders. End users, incomparison, are considered a payment re-source, rather than, as is most likely, a con-sumer and producer of Internet content.Reliability is depicted as only a detail de-sign characteristic with an economic im-pact. This article will suggest wherereliability expertise may be helpful in thecompetition.

Amitava Dutta-Roy provided back-ground articles in the IEEE Spectrum is-sues for March, May, September, andDecember 1999, (references a, b, c, d, e).Dr. Alan McAdams of Cornell’s JohnsonSchool of Management, led a multi-phase workshop of IEEEUSA Commit-tee on Communication and InformationPolicy (CCIP) volunteers, through dis-cussion and white paper generation onthe leading technology options and logi-cal scenarios describing how the internetmight grow technologically over the nextfive to ten years (reference f).

As Internet utilization increases, de-sirable features become mandatory userrequirements for attributes such as readyaccess, infinite bandwidth, advanced ser-vices such as interactive video, tele-com-muting, high definition/digital TV, tele-medicine, full multimedia, and 99.99%availability and low cost . Hence, systemsuccess is defined as satisfying end userrequirements at the lowest possible cost.Since there may not be any one technol-ogy option that best serves all of these re-quirements over the systems life cycle,alternative, evolutionary options, selec-table by the end-user, is also a mandatorysystem requirement.

The five primary technology optionsunder consideration for local access in-frastructure currently are: a) Optical Fi-ber, b) Hybrid-Fiber-Coax, c) Wireless(terrestrial) d) Wireless (satellite) and e)

Digital Subscriber Line (DSL). Sincespace does not permit a meaningful dis-cussion of each technology’s benefitsand limitations, the reader is directed toreference f) and the white papers byeach of the technology task groups andimplementation scenarios of the sce-nario task groups.

What remains is to challenge thereader by describing where the authorbelieves reliability expertise can makean impact. The Table below depictssome failure modes that exist for twothe technologies. It is far from exhaus-tive, but represents the breadth of need.

Generic sources of operational reli-ability problems are generally known.Active, rather than passive components,such as lasers and optical switches, arepotential failure sources. Built in redun-dancy may be impractical consideringcompetitive cost of product. High reli-ability parts for satellite onboard pro-cessing, modulation, or amplificationapplications may be too costly, but re-dundancy may cause a weight problem.The number of active components im-pact system design, performance, reli-ability and costs. The operating environ-ment introduces interesting opportuni-ties, e.g. water seepage impacts on opti-cal cables. Shared facilities as in dataflow to and from the Head End of an op-tical system using the same fiber at dif-ferent frequencies or carried by thenormal data stream can introduce reli-ability challenges.

Integration during technology tran-sition phases is also a challenge, eventhough there is some consensus that afull fiber system built in stages usinghybrid-fiber-coax and mobile wirelesswill be the logical downstream designchoices. Consider a system incorporat-ing optical fiber to a central office, coaxto a local switch, point to point micro-wave to a building and fiber to the desk-top. Demonstrate via simulation ormodeling an availability of 0.9999.

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System/ItemFailure Mode(s)Concerns/Impacts/solution(s)

All Optical Fiber NetworksLaser failureLoss of data transmission

-Local architecture: star or ringLoss of functionality/redundancyRing backbone; user at star tip; SONETring desirable

-Uni- or bi-directional systemElectronics failure or insufficientbandwidthCost of more electronics vs more fiber;symmetric bi-directional preferred

-Passive Optical networkPassive optical splitter failsRare event

-Dense wave division multiplexingMultiplexer failureEliminate unit; use different services ondifferent wavelengths over same fiber

-Lifeline powerLoss of service with power outageNeed new power backup, e.g. for dialtone (backup batteries)

Wireless

- Terrestrial Fixed Wireless AccessSolder joint failuresLoss of function; loss of data

- Fixed Satellite ServiceOnboard processing & switchingsystem failureLoss of data

Excessive bit error or link error ratesTCP/IP protocol performance

Encapsulation failureChip performance degradation; overheating

-Terrestrial Mobile ServiceModule failureNo redundancy due to cost impact;remove & replace

Real-time downloadable software virus(for digital radio)Loss of interoperability among hard-ware & software modules

- Mobile Satellite ServiceFrequent disconnectionsHTTP (web) performance impacts

Amplifier overheatingLoss of signal level

INET Futures: Sample Failure Mode Effects,Concerns & Solutions

continued on page 28

Page 27: Reliability Society · Franklin, Newsletter Editor, and Bob Loomis, Newsletter As-sociate Editor (and VP Publications), in bringing the Reliabil-ity Society Newsletter to a new level

July 2000 ■ Reliability Society Newsletter 27

Page 28: Reliability Society · Franklin, Newsletter Editor, and Bob Loomis, Newsletter As-sociate Editor (and VP Publications), in bringing the Reliabil-ity Society Newsletter to a new level

28 Reliability Society Newsletter ■ July 2000

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ten members of the Reliability Society(excluding student members) and a bio-graphical sketch should be included inthe submittal.

For uniformity, the biographicalsketch should be typed and include foursections:

1. Education: Degrees, Universities,Subjects

2. Work Experience3. IEEE Experience4. Other

The biographical sketch should be lim-ited to one side of one 8.5" x 11" sheet ofpaper. The nominating material: 1) Agree-ment to serve if elected (signed), 2) Bio-graphical sketch, and 3) Nominating

petition, should be sent before July 31,2000 to:

Loretta ArellanoNominating Committee ChairRaytheon Systems Co.RE/R7/P514P.O. Box 902El Segundo, CA 90245-0902

Questions can also be e-mailed [email protected]

Editor's Messagecontinued from page 1

Therefore, if one is interested in the re-liability of internet infrastructure sys-tems, this author’s recommendation is thestudy of optical fiber and hybrid-fi-ber-coax networks. The application mar-ketplace is huge. Wireless (satellite)system reliability, on the other hand,while a smaller application market, mayhave larger technical design challenges.

Hank Wolf is president of IRM Associ-ates, Inc, a consulting firm that provides

management support for inter- disciplinary,academic research. He serves as the Reli-ability Society’s representative on theIEEEUSA Committee on Communicationsand Information Policy and was a facilitatorfor Technology Task Group 2, Hybrid-Fi-ber-Coax, at the INet Futures Workshop inIthaca, New York, Fall 1999.

Referencesa. “Bring Home the Internet” AmitavaDutta-Roy IEEE Spectrum March 1999

b. “Cable, It’s Not Just for TV” AmitavaDutta-Roy IEEE Spectrum May 1999

c. “A Second Wind for Wiring” AmitavaDutta-Roy IEEE Spectrum September1999

d. “Fixed Wireless Routes for NetworkAccess” Amitava Dutta-Roy IEEE Spec-trum September 1999

e. “Networks for Homes” AmitavaDutta-Roy IEEE Spectrum December1999

f. http://www.ieeeusa.org/commit-tees/CCIP/workshop/index.html

INETcontinued from page 13

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