r-car gen3: computing platform for autonomous …€¦ · demonstrate renesas concept car for level...
TRANSCRIPT
© 2017 Renesas Electronics Corporation. All rights reserved. Page 1
R-CAR GEN3: COMPUTING PLATFORM FOR AUTONOMOUS DRIVING ERA
Mitsuhiko Igarashi, Toyokazu Hori, Yoshihiko Hotta, Kazuki
Fukuoka and Hirotaka Hara
AUTOMOTIVE SOLUTION BIZ. UNIT,
RENESAS ELECTRONICS CORPORATION
© 2017 Renesas Electronics Corporation. All rights reserved. Page 2 BIG IDEAS FOR EVERY SPACE
Outline
Renesas Autonomy : ADAS/Autonomous Driving Platform
Autonomous Driving Challenges and Feature of R-Car H3
Level 4 Autonomous driving Concept Car
Concept of Reliability Management for future auto. driving usage
© 2017 Renesas Electronics Corporation. All rights reserved. Page 3 BIG IDEAS FOR EVERY SPACE
NEW RENESAS CONCEPT FOR AUTONOMOUS DRIVING
Global No.1 share
in vehicle MCU
No.1
Promote end to end solution in collaboration with many global partners
END TO END SOLUTION FROM CLOUD SERVICE TO SENSING AND VEHICLE CONTROL
CONTRIBUTE TO NEXT AUTONOMOUS DRIVING SOCIETY
© 2017 Renesas Electronics Corporation. All rights reserved. Page 4 BIG IDEAS FOR EVERY SPACE
SENSING &COGNITIVE SOLUTION FOR AUTONOMOUS DRIVING
Scalable solution for sensing (Camera/Rader) and Cognitive from Level2/3 to Level 4/5
© 2017 Renesas Electronics Corporation. All rights reserved. Page 5 BIG IDEAS FOR EVERY SPACE
Outline
Renesas Autonomy : ADAS/Autonomous Driving Platform
Autonomous Driving Challenges and Feature of R-Car H3
Level 4 Autonomous driving Concept Car
Concept of Reliability Management for future auto. driving usage
© 2017 Renesas Electronics Corporation. All rights reserved. Page 6 BIG IDEAS FOR EVERY SPACE
Automotive
High Reliability
Autonomous Driving Challenges for LSI
HardwarePerformance @ Low power
Functional SafetyAvailability & Fail Operational
© 2017 Renesas Electronics Corporation. All rights reserved. Page 7 BIG IDEAS FOR EVERY SPACE
Solutions for Performance and Low Power by R-Car
OSOSOS
GFX
processing
Sensor into
processing
Virtua-
lization
PlanningOptimization
problem
Image
recognition
Video
processing
High speed bus network optimized for parallel processing
Image
recognition
engine (IMP)
GPU/
GPGPU
Cortex A57 x 4
Cortex A53 x 4
Cortex R7 x 1
Video
processing
engine
FPU
R-Car H3Power management
Performance at Low power
✓ Allocate each process to suitable automotive engines/processors
✓ Several power management techniques
Real time operation : Parallel processing preferred bus network / HW assist virtualization
© 2017 Renesas Electronics Corporation. All rights reserved. Page 8 BIG IDEAS FOR EVERY SPACE
Several Power Management Techniques for Low Power
Power gating : 21 power gated domains control, introduce each cluster shutdown for GPU
Dynamic Voltage Frequency Scaling / Adaptive Voltage Scaling to CPU and GPU
CortexA57
CPU0
L1$
Common L2$
CPU1
L1$
CPU2
L1$
CPU3
L1$
cl0
#0 #1
cl1
#2 #3
cl2
#4 #5
Common
GPU
PSW
controller
Voltage
controller
CLK
controller
cpuclk
gpuclk
Delay
Monitor
Thermal
Monitor
variable voltage (VDD_DVFS)
on/off
PD21
PMICOS
AVS
control
DVFS
control
Thermal
control
PSW
control
Delay
Monitor
Thermal
Monitor
PD1-5
PSW : Power Switch
PD6-9
Fixed voltage
© 2017 Renesas Electronics Corporation. All rights reserved. Page 9 BIG IDEAS FOR EVERY SPACE
Power Management for Functional Safety
Power management with several on chip monitor for several time scale events
Introduce voltage droop prediction and recovery technique with droop monitor [1]
Delay
Monitor
Droop
Monitor
CPU0
VDD_DVFSDelay
Monitor
noncpu
stop
cpu_clkPLL
clk ctrl
N/32
Div
stop_clear
PMIC
dly
ctrl
#count
11vup
vdown
Voltage
Monitor
vcpu_mon
delay_thFuse
clk
clk
Droop
Monitor
CPU1
clk
voltage
reg
Time
Ts=667ps
keyoff 15yr
Level:0
Level:1
Level:2
test
140mV
keyon0yr
Ts=1.6us
[1] C. Takahashi et al., ISSCC, 2016
Level Target Vmin Used monitor Control
2 DC operation Delay
monitor
voltage up
1 AC(>1MHz)
operation
Droop
monitor
Clock stop &
restart
0 Monitor Vmin Voltage
monitor
System
shutdown
VDD_DVFS
© 2017 Renesas Electronics Corporation. All rights reserved. Page 10 BIG IDEAS FOR EVERY SPACE
Power Management for Functional Safety and Run-time Test
Droop prediction technique can prevent the failure caused by voltage droop
Wear-out faults detection by run-time test
0
5
10
15
20
25
0.0 5.0 10.0 15.0 20.0 25.0 30.0
VC
OD
E
Time [sec]
Measured predictedw/ predictionw/o prediction
Large droop
Measurement condition
Droop monitor
Measurement Result
4 cycle prediction
: GPU running
: Run-time test
: Voltage monitoring
: Collect Min. Vcode and Display
667ps
© 2017 Renesas Electronics Corporation. All rights reserved. Page 11 BIG IDEAS FOR EVERY SPACE
Reliability Aware Droop Mitigation with MIM
Satisfy both voltage droop reduction with MIM and automotive reliability grade by
✓ Dedicated ESD protection for MIM (AEC-Q100 capable)
✓ MIM area optimization of CPU and GPU
MIM cap
Dedicated ESD protection
0.0
2.0
4.0
6.0
8.0
10.0
12.0
14.0
16.0
18.0
20.0
0.0 50.0 100.0 150.0 200.0 250.0 300.0
Voltag
e D
roop
Im
pro
vem
en
t [m
V]
MiM Cap [nF]
Failure rate limit
16mV
improvement
CPUGPU
© 2017 Renesas Electronics Corporation. All rights reserved. Page 12 BIG IDEAS FOR EVERY SPACE
Reliability Aware Droop Mitigation with MIM
MIM cap failure modelGlobal metal
VSS VDD
MIM
Short current
Introducing MIM IDDQ testing enable early failure rejection of MIM
Emphasize only MIM short current
CPU
VDD
MIM
VSS
Short
current
Large leakage
Conventional IDDQ test
Suppress
Current
MIM IDDQ test
MIM
Leakage
emphasizerCPU
VDD
VSS
Emphasize
Current
© 2017 Renesas Electronics Corporation. All rights reserved. Page 13 BIG IDEAS FOR EVERY SPACE
Outline
Renesas Autonomy : ADAS/Autonomous Driving Platform
Autonomous Driving Challenges and Feature of R-Car H3
Level 4 Autonomous driving Concept Car
Concept of Reliability Management for future auto. driving usage
© 2017 Renesas Electronics Corporation. All rights reserved. Page 14 BIG IDEAS FOR EVERY SPACE
Renesas Concept Car for Level 4 Autonomous Driving
Level 4 driving with redundancy at 25 Watts
Renesas NVIDIA NXP
HAD x 2(H3 x 4
+ MCU x 2)
Drive PX2(Parker x 2 +
Pascal GPU x 2)
BlueBox(QorIQ LS2088A)
25 W 250 W *1 40 W *2
*1 http://www.eetimes.com/author.asp?doc_id=1328609
*2 http://www.nxp.com/jp/products/microcontrollers-and-processors/
arm-processors/s32-arm-processors-microcontrollers/bluebox-autonomous-driving-platform-s32vls2-rdb:S32VLS2-RDB
© 2017 Renesas Electronics Corporation. All rights reserved. Page 15 BIG IDEAS FOR EVERY SPACE
Renesas Concept Car : Fail Operation
Fail operation tolerant by ASIL-D MCU (RH850) and triple redundant H3 system
Control the car to move to the safety zone when the failure is detected
https://www.youtube.com/watch?v=r59vYREilHY
Failure
© 2017 Renesas Electronics Corporation. All rights reserved. Page 16 BIG IDEAS FOR EVERY SPACE
Outline
Renesas Autonomy : ADAS/Autonomous Driving Platform
Autonomous Driving Challenges and Feature of R-Car H3
Level 4 Autonomous driving Concept Car
Concept of Reliability Management for future auto. driving usage
© 2017 Renesas Electronics Corporation. All rights reserved. Page 17 BIG IDEAS FOR EVERY SPACE
Big Waves in the Future Automotive
Owner Driven Car
Level2/3 (Level4)
Reduce Car Accident
Driving pleasure
Convenience for Driver
Economic efficiency
( EV Range, Function vs cost )
Level4/5 (Driverless)
Complete Safety
Service pleasure
Mobility convenience
Cloud Service model
Mobility Service CarOwner Driven
CarMobility Service
Car
© 2017 Renesas Electronics Corporation. All rights reserved. Page 18 BIG IDEAS FOR EVERY SPACE
Connected Car Solution with Cloud Service
Renesas can link all information to Cloud from control (RH850) to car information (R-Car).
One of important Service is “Vehicle quality Enhancement” for Service Car
Service
Data1)
© 2017 Renesas Electronics Corporation. All rights reserved. Page 19 BIG IDEAS FOR EVERY SPACE
Car Usage Challenges in Future Autonomous Driving Era
What will happen at fully automated driving era?
Increase an annual mileage dramatically
Reliability enhancement will be one of key challenge
*1 Automotive Electronics Council, "Failure Mechanism Based Stress
Test Qualification for Integrated Circuits,” AEC-Q100 Rev-H, 2014
Operation rate
~ 50%
Owner car Ride sharing
etc.
Mobility Service Car
with level 5 auto.
driving + EV
An
nu
al
mileag
e
Operation rate
< 10% *1
© 2017 Renesas Electronics Corporation. All rights reserved. Page 20 BIG IDEAS FOR EVERY SPACE
Trade-off between Reliability Enhancement and Performance
Handling of operation temperature, voltage and aging variation further optimize reliability
Low temp. limitation and low volt. operation may restrict the performance
Propose concept of reliability management for further LSI reliability enhancement
Volt. Temp.
Log(B
TI lif
etim
e)
~ 2x Lifetime
by - 20 mV
~30x
Log(B
TI lif
etim
e)
Log(B
TI lif
etim
e)
-3σ 3σ
~ 3x Lifetime
by - 15 deg C
TemperatureVoltage Aging variation
Opera
tion f
requen
cyFrequency down
Th
erm
al desig
n p
ow
erPerformance
restriction
BTI : Bias Temperature Instability
© 2017 Renesas Electronics Corporation. All rights reserved. Page 21 BIG IDEAS FOR EVERY SPACE
Reliability Management Concept ~ Static AVGS
Before Burn-in
Tester
CPU
Fuse
Fuse
Delay
Monitor
Lifetime
Odometer
After Burn-in
F_fresh
P-code
A-code
ΔF_agedGPU
Chip
P-code
(Process)
Burn-in
A-code
(Aging)
One of key reliability item is BTI/HCI degradation
Lifetime odometer (LTO) monitors BTI/HCI degradation per chip
Delay monitor and LTO detect Process variation and Aging variation at testing
Static Adaptive Voltage Guardband Scaling (AVGS)
BTI : Bias Temperature Instability
HCI : Hot Carrier Injection
© 2017 Renesas Electronics Corporation. All rights reserved. Page 22 BIG IDEAS FOR EVERY SPACE
Reliability Management Concept ~ Static AVGS
Static AVGS optimize Voltage Guardband (VGB) chip by chip with reflecting
✓ Operation Voltage difference (by P-code)
✓ Aging variation difference (by A-code)
20 mV lower operation extend lifetime at SS chip with negligible yield loss by LTO
FFSS
Adjusted
by A-code
Voltage
0Conv. AVS setting
Optimized
by P-codeStatic AVGS
setting
Vmin w/o agingAging
Guardband
TT
SS/TT/FF : Slow/Typical/Fast Chip
© 2017 Renesas Electronics Corporation. All rights reserved. Page 23 BIG IDEAS FOR EVERY SPACE
Reliability Management Concept ~ Dynamic AVGS
Dynamic-AVGS and Adaptive Thermal Control
Lifetime
odometer ΔVDD
for aging
Lifetime prediction
Adaptive
Thermal ControlPG, DVFS
System
controller
Tj
Volt.
Aging code
Process code
External flash
VGBLogThermal
Sensor
P-code
(Fuse)
A-code
(Fuse)
Dynamic voltage control based on P&A-code and lifetime prediction extend lifetime of
chip with initial low volt. (TT~FF chip)
Thermal
Sensor
ΔF
Deep
learning
VGB
threshold
+30mV
Lifetime extendedFF Chip
Lifetime extension with dynamic-AVGS
Dyn
am
ic A
VG
S Δ
VD
D
Effective stress time Teff @Tj=125C [hrs]
12K 120K1.2K
© 2017 Renesas Electronics Corporation. All rights reserved. Page 24 BIG IDEAS FOR EVERY SPACE
Reliability Management Concept ~ Dynamic AVGS
Dynamic-AVGS and Adaptive Thermal Control
Lifetime
odometer ΔVDD
for aging
Lifetime prediction
Adaptive
Thermal ControlPG, DVFS
System
controller
Tj
Volt.
Aging code
Process code
External flash
VGBLogThermal
Sensor
P-code
(Fuse)
A-code
(Fuse)
Adaptive thermal control based on P-code extend lifetime of chip with low leakage (SS~TT)
Thermal
Sensor
ΔF
Deep
learning
Tj relaxation of low leakage chip
© 2017 Renesas Electronics Corporation. All rights reserved. Page 25 BIG IDEAS FOR EVERY SPACE
Reliability Management Concept ~ Result
Burn-in stress
12K hrs (AEC-Q100)
Total lifetime extensionMeasured result of Lifetime Odometer
NBTI sensitive
osc
2.6x
67.2K hrs
Fre
qu
en
cy d
eg
rad
ati
on
[%
]
INV
based osc
Lifetime @Tj=125C [hrs]
2x
-20mV
5.6x
-20mV
&-15C
Power on time Field lifetime Duty ratio
12 K hrs 15 years 9.1%
67.2 K hrs 15 years 51.1%
5.6x lifetime in total without performance degradation realize ~ 50% operation rate
© 2017 Renesas Electronics Corporation. All rights reserved. Page 26 BIG IDEAS FOR EVERY SPACE
Summary
Renesas Autonomy : Total solution for auto. driving computing platform
R-Car H3 satisfy all of Performance, Low power, Functional safety and
Reliability
Demonstrate Renesas concept car for level 4 autonomous driving
✓ 25 W with triple redundant H3 and ASIL-D MCU system
Introduce concept of reliability management for future auto. driving usage
© 2017 Renesas Electronics Corporation. All rights reserved. Page 27 BIG IDEAS FOR EVERY SPACE
BACKUP
© 2017 Renesas Electronics Corporation. All rights reserved. Page 28 BIG IDEAS FOR EVERY SPACE
Definition of Levels of Driving Automation by SAE International
Source : SAE International J3016, Sep. 2016
© 2017 Renesas Electronics Corporation. All rights reserved. Page 29
BIG IDEAS FOR EVERY SPACE
Renesas.com