Multipurpose diffraction for everyone

X’PERT POWDER

Your solution for powder analyses & more

•State-of-the-artperformance for an attractive price

•Easyandeconomicalupgradepathfornowandthefuture

TheAnalyticalX-rayCompany

Highthroughput,highquality

ThePreFIXtechnology

X’PERT POWDER

Equippedwithafull-powergenerator,afull-sizegoniometerusingtheDirectOpticalPositioning(DOPS)systemandtheaward-winningX’Celeratordetector,X’PertPowdergivesyouunsurpassed price/data qualityratiointhemedium-endXRDrange.

X’PertPowderadvantages

Full-power 3 kW generator gives you more intensity and fast results

X’Celerator – the first solid-state line detector

• Upto100timesfasterthanstandardXe-detectors

• Nocompromiseinresolution• Maintenance-free,nogasrefillandreturn

to factory needed• Largestinstalledbaseworldwide

Goniometer using Direct Optical Positioning (DOPS)

• Sensorsongoniometerarms,notongears• Exceptionalangularresolution

• Pre-alignedfastinterchangeableX-raymodules• Single,conicalboltre-attachableopticsto

correct alignment position with few microns accuracy

• Hardenedtoolsteelcomponentsforlifetimeprecision

• Easyconfigurationchanges,withoutelaboratere-alignment

• Nocompromiseinresolution or intensity when switching betweenapplications• Enjoythelatest developments on components in the optical path

5 min

5 min

Your solution for powder analyses and more

Versatile,yeteasyto use

State-of-the-artperformance for an attractive price

X’PERT POWDER

ThelatestadditiontotheX’PertPROfamilyofX-raydiffractometers,X’PertPowderoffershigh-throughputandhigh-qualityphaseidentificationandquantificationofpolycrystallinematerialsforanattractiveprice.Aspioneerinmodularsystembuilding,PANalytical’sX’PertPowdercanbeeasilyupgradednoworinthefutureasnewapplicationsarise.

Forpowderanalyses,phaseanalysis,quantification

With limited additional investment you can:• Performanalysesonthinfilms• Performparticlesizingonnano-

materials• Investigatetheinfluenceof

temperature on material properties

• Performautomatedanalysesonmultiple samples

• Benefitfromthelatestdevelopmentsonoptics,samplestages,detectors,X-raytubesandanalysis software

• High-speed,high-qualitydataacquisition• Uptofivetimesfasterthanabenchtopsystem• Comprehensiveandeasy-to-usesoftware• Over10yearsofprovenquality• Communityofover2500usersites

Almost80%oftheworld’stop50universities*arecustomersand development partners of PANalytical.

*www.usnews.com/articles/education/worlds-best-universities/2009/10/20/worlds-best-universities-top-200.html

Forphaseanalysisandquantification

Fortransmission

X’PERT POWDER

DeterminethecrystalstructureofyoursampleusingHighScore(Plus).WhetheryouwanttohavefullcontrolusingthelatestanalysistechniquesoryouwanttoletHighScoreautomaticallyprocessyour analysis using an automatic samplechanger,youcanconfigureHighScoretoyourneeds.

Youcanidentifyyoursamplebycomparingitwithreferencepatterns.WithHighScoreyouhavefreechoiceofreferencedatabases.YoucanusetheICDD,PAN-ICSDorfreedatabasesavailableontheinternet(e.g.CrystallographyOpenDatabase).Withthisfreechoiceofreferencedatabasesyouhaveaccessto100,000to500,000referencepatternsofdifferentquality.Forpush-buttonquantificationofyoursamples you can use X’Pert Quantify or X’PertIndustry.Incaseyouhavecomplexsampleswithmanyphasesweofferextensiveapplicationsupport.

Semi-quantitative analysis by RIR Reference intensity ratio method utilizes RIR data from ICDD cards to provide an estimate of mixture composition.

Comparison of diffractograms of milk chocolate in reflection and transmission mode. The latter shows much better low-angle performance.

An X’Pert Powder is easily converted to transmissiongeometry,resultinginmoreaccuratepeakpositionsandintensitiesatlowangles.ThesamegeometrycanalsobeusedforSAXSandforpowdersinglasscapillaries.

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Forthinfilmanalyses

Forsmall-angleX-rayscattering

X’PERT POWDER

You can easily reconfigure X’Pert Powderforyourthinfilmanalyses.WithX-rayreflectometryyoucanmeasure the thickness and quality of thelayersofyourthinfilmstructure,resulting from density differences betweenthelayers.Alternatively you can identify the phases of individual layers in your thin filmstructureusinggrazingincidenceoptics.Withtheresultinggeometryyoureduce the penetration depth of the X-rays,yieldinginformationofonlythetop layer(s) depending on the angle of incidence.

ThereismorethanjustBraggpeaksinadiffractogram...At small angles X-rays scatter with nano-sizedstructures-small-angleX-ray scattering (SAXS) is an ideal way tocharacterizethesestructures.Unlikeelectronmicroscopy,SAXSisaveryfastmethodtomeasurenano-sizedstructures that yields representative structural information over a macroscopicvolumeofyoursample.YourX’PertPowdercanbeconvertedintoaSAXSinstrument.UsingtheEasySAXSsoftwareyoucananalyzenano-sizedparticles,nano-sizedcompositesandnano-sizedpores.

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Example of reflectometry measurement on 40 nm polystyrene film on an oxidized Si substrate

Example of particle size distribution of a mixture of nanopowder of

anatase and rutile, derived from small

angle measurements

PANalyticalsoftware-youradded value

PANalytical’ssoftwarerangegivesX-ray diffraction instruments a common platform for data collection andanalysis.Userscanchoosefroma wide range of modules that collect andanalyzedataforR&Dandprocesscontrol.MeasurementresultsareinterchangeablewithothersystemsusingtheopenXRDMLformatfordatatransferandfilesharing,basedontheindustryandinternetstandardXML.

From data acquisition all the way to dataanalysisofyourexperiment,PANalytical’ssoftwarehelpsyoutodrawtherightconclusions.

PANalytical’s Data Collector is a universal data acquisition software package for allXRDapplications.Whetheryouwanttoperformphaseanalysisonpowders,analyzenanoparticlesoranalyzeyourthinfilmstructure,DataCollectorprovides you with an ease way to set up yourexperiment.DataarestoredintheopenXRDMLplatform and contain all information to repeatyourmeasurement.XRDMLfilescaneasilybepreviewedandorganizedusingPANalytical’sExploreradd-ons.For the different applications data in theXRDMLfilecanbeanalyzedwithHighScore,ReflectivityorEasySAXS.You can automatically start your analysis with Data Collector using the Automatic ProcessingProgram.

1. DataCollectorforinstrument control and data acquisition for all XRDapplications

2. DatastoredinopenformatXRDML

3. UseHighScore(Plus),ReflectivityorEasySAXStoanalyzeyourdata

Gettingthemaximumoutof your data

PANalyticalexpertise

PANalyticalfacilitiesaroundtheworlddelivertrainingcourses,instrumentfamiliarizationsessions,applicationsworkshopsandremotelearning channels to provide important information for new and existingcustomers,alongsidewithmoregeneralscientificmeetingsonavarietyofX-raydiffractionandscatteringtopics.

• Extensiveuserdocumentationtohelp you to get the most out of your investment- User’sguide- Quick Start guides- Software help- Tutorials

• Coursestailoredtoyourneedsaroundtheglobe

- BasicXRDcourse - Crystallography - Non-ambientanalysis - HighScore - Small-angle X-ray scattering - Reflectometry

TheresultTheresultofanXRDmeasurement is a diffractogram,showingcrystalline phases present (peakpositions),phaseconcentrations (peak areas),amorphouscontent(backgroundhump)andcrystallitesize/strain(peakwidths).

WhatisX-raydiffraction?

ThesampleThediagramdepictsatypicalsample,comprisingtwocrystallinephases(violet,blue),eachwithdifferentaveragecrystallitesizes,plus a proportion of amorphous material(beige).Thefeaturesofthediffractogramshownbelowarecolor-coded to indicate the relevant components.

ThemethodX-raydiffractionisaversatile,non-destructive analytical technique for identification and quantitative determination of the various crystalline forms,knownas‘phases‘,ofcompoundspresentinpowderedandsolidsamples.Identificationisachievedbycomparingthe X-ray diffraction pattern - or ‘diffractogram‘-obtainedfroman

unknown sample with an internationallyrecognizeddatabasecontaining reference patterns for morethan200,000phases.Moderncomputer-controlleddiffractometer systems use automatic routinestomeasure,recordandinterpret the unique diffractograms producedbyindividualconstituentsinevenhighlycomplexmixtures.

Intensity

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PANalyticalB.V.Lelyweg1,7602EAAlmeloP.O.Box13,7600AAAlmeloTheNetherlandsT+31(0)546534444F+31(0)546534598info@panalytical.comwww.panalytical.com

RegionalsalesofficesAmericasT+15086471100F+15086471115

Europe,MiddleEast,AfricaT+31(0)546834444F+31(0)546834499

Asia PacificT+6567412868F+6567412166

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