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MCPs and MCP based detectors Raquel Ortega [email protected]

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Page 1: MCPs and MCP based detectors · Double MCP (chevron) gain > 106 3 MCP (Z stack) configuration gain > 107 ... SPREAD (TTS) < 50 ps 3rd IPM Workshop, J-PARC. Spatial Resolution

MCPs and MCP based detectors

Raquel Ortega [email protected]

Page 2: MCPs and MCP based detectors · Double MCP (chevron) gain > 106 3 MCP (Z stack) configuration gain > 107 ... SPREAD (TTS) < 50 ps 3rd IPM Workshop, J-PARC. Spatial Resolution

OutlineIntroduction

MCP characteristics:▪ Gain

▪ Detection efficiency

▪ Time resolution

▪ Spatial resolution

▪ Detecting different particles (bias angle, coating)

▪ Linearity

▪ Lifetime

Working with MCPs:▪ Choices

▪ External conditions

MCP based detectors and Applications▪ Beam Profiler

▪ Neutron Imager

▪ Gateable MCP-PMT

▪ Photon counter

▪ Cricket…

Page 23rd IPM Workshop, J-PARC

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20% Science+ Photonics+ Analytical Instruments+ Physics+ Space+ Medical Imaging

Overview1200 Employees

75+ Years of experience in optical imaging and particle detection

6% Annual revenue re-invested in R&D and Innovation

100+ Patents for Proven Technology

Multi-award winning technology

3rd IPM Workshop, J-PARC | Page 3

80% DEFENCE+ Optical Night Vision+ Digital Night Vision

+ Electronic Counter Measures

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Worldwide presence

| Page 4

Head quarters

Production sites

3rd IPM Workshop, J-PARC

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History

| Page 5

1937Philips Brive

1963Hyperlec

1986RTC

Compelec

1990Philips

Components

1992Philips

Photonics

1996Photonis

1970Delft Electronische

Producten

1973Oude Delft

1990Delft Instruments

1995Delft Electronic

Products BV

1942US Navy

1946RCA

Corporation

1986GE

1987Burle

Industries

1999Purchase

Galileo MCP 1946

Photonis

DEP

Burle

2005 PhotonisGroup

2007 Opening Merignac Office

2006Acquisition of

100% of Antheryon(Optic Fiber)

2006Acquisition of

100% of Hi-light OptoElectronics

(Power Supply)

2008Acquisition of Assets

related to AVG manufacturing from

Brennel

2013Opening of Frisco

office

Creation of Digital Vision BU

3rd IPM Workshop, J-PARC

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Introduction

Page 63rd IPM Workshop, J-PARC

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Looking closer

Page 73rd IPM Workshop, J-PARC

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Where we start

Page 83rd IPM Workshop, J-PARC

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Microchannel Plate Manufacturing Process

Glass Monofiber

Draw

Billet Fabrication.

Billets are Sliced. Slices are ground and polished.

Polished slices are

subjected to chemical

processing.

Hydrogen Reduction

Electrode Evaporation

Final Test

and Inspection

Glass Multifiber Draw

93rd IPM Workshop, J-PARC

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Geometrical limitations

75mm active area - 10 µ minimum pore

40 mm active area – 5 µm pore, 60:1

25 mm active area - 5 µm pore, 60:1

18 mm active area – 2 µm pore, 60:1 MP

Page 103rd IPM Workshop, J-PARC

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Gain

Gain Parameters:

Channel Length/Diameter = Aspect Ratio = α

Number of MCP’s

Output End-spoiling

▪ 0.5 pore dia. Increases effective length

Page 113rd IPM Workshop, J-PARC

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Aspect Ratio

α=L/d Designed to be between 40-60 (optimized statistical uniformity)

Gain limitations:

▪ Ion feedback

▪ Space charge saturation:

Maximum gain of saturation (for fixed V and α is proportional to the pore diameter)

Page 12

G≈𝑒𝑥𝑝 (gα)

3rd IPM Workshop, J-PARC

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Multiple MCP configurations

Double MCP (chevron) gain > 106

3 MCP (Z stack) configuration gain > 107

Ion feedback decrease

A Z stack with the same total gain as a Chrevron stack (i.e. lower individual V) will have less ion feedback

Gain of multiple MCP configurations is limited by space charge effects (charge loss, saturation)

Pulse mode (gaussian distribution)

Page 13

Gain vs. interplatebias V

(FWHM/Gain) vs. interplate bias V

3rd IPM Workshop, J-PARC

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Electroding – “End spoiling”

Page 143rd IPM Workshop, J-PARC

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Single Microchannel Plate Gain as a Function Of Output Endspoiling

0

20

40

60

80

100

120

0 0.5 1 1.5 2 2.5 3

Gain %Normalized To .5cd

Value

Output Endsoiling Channel Diameters

700

1000153rd IPM Workshop, J-PARC

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Detection Efficiency Parameters

Open Area Ratio

Electroding

Specific (Particle dependent)

Bias Angle

Coatings

Page 163rd IPM Workshop, J-PARC

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Particle Detection Efficiency

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Bias angle

Strike Angle optimizations secondary electron creation

00 - collimation & filtration

50 – Photons

80 - Electrons

120- Ions

190 – Special arrangements

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Coatings

Magnesium Oxide - MgO

▪ Low energy electrons = below 300 eV

Cesium Iodide – CsI

▪ UV Photons = up to 200 nanometers

Magnesium Fluoride -MgF2

▪ UV Photons from 40 to 65 nanometers

Potassium Bromide – KBr

▪ X-rays from 0.2 eV to 9.0 keV

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Linearity and Dynamic Range

Low noise MCPs

MCP’s produce linear output for 10% of bias current -> saturation level improves with the increase of the Is, i.e. with the decrease of the MCP resistance

EDR MCP (low resistance) will have 5 to 10X linear output (high rate pulse events allowed)

It improves with decreasing the pore size (More pores available/Area for next event)

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MCP 40/12/10/8 Example

Standard MCP

Bias Current = 40 µA

Resistance = 80 Megohms

Linear Output = 4 µA

Max. Operating Temperature = 200 0C

EDR version

Bias Current = 200 µA

Resistance = 10 Megohms

Linear Output = 20 µA

Max. Operating Temperature = 80 0C

21

Extended Dynamic Range

3rd IPM Workshop, J-PARC

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Time response

Page 22

30,000

60005,000

2500 1800850 400

0

5,000

10,000

15,000

20,000

25,000

30,000

Pu

lse W

idth

(p

s)

Conventional

Discrete

Dynodes

HP Discrete

Dynodes

Single Channel

Multiplier

Magnum 25mm Bpolar

TOF

Conventional

MCP Detector

2 Micron TOF

3rd IPM Workshop, J-PARC

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Time resolution

Electron transit time down with the MCP size (electron transit distance)

Example: Planacon

Page 23

- Same principle for any device- Timing results depend on device

construction, MCP details…

- Planacon- 25 mm MCP ~45 ps- 10 mm MCP ~32 ps

TIME

SPREAD

(TTS)

< 50 ps

3rd IPM Workshop, J-PARC

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Spatial Resolution

Pore Ctr-to-Ctr Distance

End-spoiling

Page 24

0

50

100

150

200

0 10 20 30 40

Microchannel Plate Pitch (Microns)

Micrm

lp/mm

3rd IPM Workshop, J-PARC

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Spot Size, Deep Endspoiling

Focal Plane

253rd IPM Workshop, J-PARC

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Spatial Resolution – Endspoiling

0

5

10

15

20

25

30

35

40

45

50

0 0.5 1 1.5 2 2.5 3 3.5

Output Endspoiling (cd)

Limiting

Resolution

(lp/mm)

Single MCP

Chevron

Page 26

Conditions:

MCP to Al. Screen

Spacing = .6mm

Phosphor Grain

Size 3um

FOFP Pitch

6um

Screen Potential

5Kv

Limiting Spatial Resolution as a Function Of Output

Endspoiling (18mm 9.5µm C-C)

3rd IPM Workshop, J-PARC

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MCP Lifetime (gain stability)

The gain drops as a function of the accumulated extracted charge

ALD (atomic layer deposition) coating (Aluminum oxide)

Page 27

Results with multianode MCP-PMTs from PANDA collaboration

3rd IPM Workshop, J-PARC

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OutlineIntroduction

MCP characteristics:▪ Gain

▪ Detection efficiency

▪ Time resolution

▪ Spatial resolution

▪ Detecting different particles (bias angle, coating)

▪ Linearity

▪ Lifetime

Working with MCPs:▪ Choices

▪ External conditions

MCP based detectors and Applications▪ Beam Profiler

▪ Neutron Imager

▪ Gateable MCP-PMT

▪ Photon counter

▪ Cricket

Page 283rd IPM Workshop, J-PARC

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Choices

Page 293rd IPM Workshop, J-PARC

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What do we specify?

Page 313rd IPM Workshop, J-PARC

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External conditions (I)

Relative Immunity to Magnetic field:

MCPs can be operated in strong magnetic fields up to 2T

Maximum disturbance when perpendicular to the MCP pores (if possible choose smaller pores and B ‖ to pores)

Operating Temperature is important:

MCP Glass resistance goes down as temperature goes up (thermal Coefficient of Resistivity 0.8% -per-degree C)

T needs to be monitored: T increases -> Resistance decreases-> lower gain

Bias Current above 25 mA/cm2 leads to thermal runaway (MCP is overheated and damaged)

Page 323rd IPM Workshop, J-PARC

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External conditions (II)

Pressure:

Works at Pressures up to 10-2 Torr. At Pressures higher than the dark count rate starts to increase due to the increase of ion feedback.

With poor vacuum operating conditions, the noise increases and damage can occur (discharge…)

Page 333rd IPM Workshop, J-PARC

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OutlineIntroduction

MCP characteristics:▪ Gain

▪ Detection efficiency

▪ Time resolution

▪ Spatial resolution

▪ Detecting different particles (bias angle, coating)

▪ Linearity

▪ Lifetime

Working with MCPs:▪ Choices

▪ External conditions

MCP based detectors and Applications▪ Beam Profiler

▪ Neutron Imager

▪ Gateable MCP-PMT

▪ Photon counter

▪ Cricket

Page 343rd IPM Workshop, J-PARC

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MCPs detection characteristics

Highest Speed Detectors Available

Ideally Suited for TOF

Work at Pressures up to 10-2 Torr.

High Gain up to 100,000,000

Low Noise 1 ct/sec/cm2 after scrub

Position sensitive

Bipolar Detector

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Beam Profiler concept

Page 36

Electron generator Array (EGA)Resistive glass Plate

Beam

Imaging MCP setAnode

3rd IPM Workshop, J-PARC

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Beam Profiler

A poorly focused beam

Page 37

Camera zooming allows real-time magnification of regions of interest.

A beam de-focused by a time-varying magnetic field with many ions off target.

A tightly focused beam

3rd IPM Workshop, J-PARC

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First images taken at the Reactor Institute Delft (NL) with thermal neutrons, and at HFIR, Oak Ridge National Lab, with cold neutrons.

Neutron ImagerIf the MCP glass is doped with enriched 10B, it becomes neutron sensitive (n+B-> Li+α)

Detection efficiency ~50% for thermal neutrons, 70% for cold neutrons

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Neutronic (Large Area Neutron imager)

Page 39

Active Area:10cmx10cm

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Page 40

Photocathodes

3rd IPM Workshop, J-PARC

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Extremely low noise

Page 41

The Dark count rate of the new PHOTONIS High QE S20 photocathodes is extremely low, 20-30 cps/cm2 compared to conventional S20 photocathodes, 1000-2000 cps/cm2

typical 25cps/cm²

maximal 50 cps/cm²

D.A.Orlov et al. 2016 JINST11 C04015

3rd IPM Workshop, J-PARC

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MCP-PMT with integrated gating unit

Page 423rd IPM Workshop, J-PARC

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Imaging Photon Counter

MCP detector combined with specially designed electronics unit

with a unique combination of capabilities.

✓ Wide field of view (18 mm)

✓ Single photon counting

✓ High spatial and temporal resolution. The system has

picosecond timing and micro meter spatial resolution

✓ No read-out noise

✓ Up to 5MHz input rates

✓ Newly introduced high quantum efficiency photocathodes with

ultra low dark noise additionally boost the IPC performance

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The IPC detector head:

The MCP tube is enclosed in an air tight aluminum housing with

thermoelectric coolers and temperature sensors. C-type mount allows

attachment of lens, a microscope phototubes or any desired optics

Photocathode converts photon to electron

6 µm MCP(s) with L/D=80 amplify

electron by 104 to 107

Cross strip anode (32 X+32 Y)

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XS anodes (32 Y + 32 X strips) are 2.5

mm behind the second MCP allowing

charge collection over several strips

(optimal centroid calculation)

ANODE STRUCTURE

✓ The spatial resolution achieved in X and Y

direction is the same and equal to about 40 µm

FWHM.

✓ The timing resolution is below 100 ps

✓ The current electronics can process up to 5 MHz

input event rate.

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What is inside of an intensifier matters

Page 463rd IPM Workshop, J-PARC

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Cricket, an Advanced Intensifier Adaptor for Scientific Cameras

. Cricket is a self-contained unit, equipped with C-mount connections that enable the user to simply connect to any scientific camera and attach to any lens or microscope to begin

capturing intensified images. Cricket’s internal structure provides power to the embedded

image intensifier and maintains proper alignment and focus to provide a full 18mm

intensified image for analysis. Cricket supports detection ranges from 200 to 900 nm and can

be used with most EMCCD, CCD, CMOS or sCMOS cameras.

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What is inside cricket?

Page 48

Complete plug and play system, including:

▪ Image intensifier

▪ Power supply

▪ Focus adjustments

▪ Optional Gating Unit

▪ Gain control

C-mounts for easy connection to camera and lens

3rd IPM Workshop, J-PARC

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References

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