keysight solutions catalogcatalog january 2015 with keysight technologies’ solutions you can...

Keysight Solutions Catalog

January 2015

With Keysight Technologies’ solutions you can extend the capabilities of our world-class instrumentation to address your specific testing challenges.

Keysight Technologies is the world’s leading supplier of test instruments, but when you’re solving a specific test problem you sometimes need more.

To create a complete test solution you need hardware, software and people with the correct engineering and measurement expertise. This is where Keysight’s solutions come in.

This catalog shows the range of solutions available from the Applications Engineering Organization (AEO) of Keysight and from Keysight’s Solutions Partners. Each solution is summarized with its key features and a link to retrieve additional information, if required.

Whether you are looking for a standard test system, the development of a custom test system or re-engineering an existing test system, Keysight’s solutions can help you achieve more with your test instruments.

The catalog shows a representative sample of the possibilities available. If your requirements differ then contact your local AEO to see how Keysight can work as part of your team to develop a solution to meet your exact needs.

Lon HintzeApplication Engineering District ManagerKeysight Technologies

Welcome

Table of Contents

Keysight AEO Solutions

Operations Consulting Service

Total Cost of Ownership Analysis

Test Process Analysis

Technology Refresh and Asset Management

RF Power Amplifier Test, Reference Solution

Military Radio Test, Reference Solution

Multi-Channel Antenna Calibration, Reference Solution

High-Speed Broadband Spectroscopy Measurements

Pulse Descriptor Word, Reference Solution

EW Test, Reference Solution

Keysight Partner Solutions

Functional Test of Medical Alert Pendants

Modular Function Test with 34980A

High-Performance Digitizers for Advanced Scientific Research

High Performance Digitizers for Aerospace/Defense

S-Parameter Measurements on Multiport Devices

RF Emissions Testing

In-Orbit Satellite Testing

RF Interference Analysis

Multiband Passive Intermodulation Testing

Impedance Matching with Vector-Receiver Load Pull

Keysight Solutions Catalog

Keysight AEOKeysight Technologies’ Application Engineering Organization (AEO) can provide solutions to address your specific testing challenges.

For more information on this solution or to discuss a similar application contact your local Keysight AEO.

Canada (877) 894 4414 - 2Brazil 55 11 3351 7010Mexico 001 800 254 2440United States (800) 829 4444 - #2

Table of Contents

Solution SummaryAs government sponsored aerospace defense contracts move to firm fixed price (FFP) and away from cost-based contracts in the low rate, initial production (LRIP) phase, you are faced with re-structuring your whole product life cycle (PLC) process.

Ensuring solid development and manufacturing strategies to meet the new emphasis toward FFP LRIP procurements is crucial for the financial success of your entire enterprise. Keysight Technologies can help you rework your infrastructure for a smooth transition to a competitive PLC process.

Keysight can assist you in – Manufacturing and Test Process Development – Business Planning – Operations Consulting Services – Flexible Leasing and Financing Options – Tailored Maintenance Delivery – Technical Resource and Staff Development

Key Features – Optimize your test strategy to reduce your capital expenses – Increase the flexibility of your manufacturing strategy – Explore flexible financing opportunities for test assets – Optimize your engineering productivity for lower cost

Additional InformationMore information on this solution is available in Keysight Technologies solutions brochure 5990-9036EN

Restructure your product life cycle to meet the needs of FFP, LRIP contracts

Operations Consulting Services

Information subject to change© Keysight Technologies, 2015

http://literature.cdn.keysight.com/litweb/pdf/5990-9036EN.pdf




Table of Contents

Solution SummaryIn electronics manufacturing, approximately one third of the costs under your direct control are related to test. By reducing and controlling these costs you can improve your profitability allowing you to sustain your competitive advantage.

Total Cost of Ownership is the total annual amount you spend to own and operate your test equipment. Classes of costs include acquisition, calibration, repair, down-time mitigation, technology refresh, resale/disposal, and other operating expenses such as energy and floor space.

By looking at your Total Cost of Ownership from a Product Life Cycle (PLC) cost perspective, a more accurate cost model can be developed. We encourage you to analyze and compare the Total Cost of Ownership of Keysight products against products from other suppliers. When you consider the total value that comes with your Keysight product, you will find that Keysight is the clear leader in providing the highest total value.

Key Features – Learn what drives your Total Cost of Ownership. – Identify the primary cost factors for the instruments you own, rent,

or are considering for purchase. – Compare Keysight’s products against other suppliers. – View results per annum or per test in graphical format

Additional InformationMore information on this solution is available in Keysight Technologies solutions brochures 5990-6254EN and 5990-6642EN

Control your test costs by understanding your Total Cost of Ownership

Total Cost of Ownership Analysis







Table of Contents

Solution SummaryThe Keysight Test Process Analysis (TPA) service provides an alternate perspective on your product life-cycle test processes to see if there are opportunities to improve profits, achieve higher productivity, or improve competitiveness and quality. With over 15 years of adding value by delivering TPAs, Keysight has the breadth and depth of expertise and knowledge to help you meet your goals.

Keysight’s Test Process Analysis incorporates a well-defined methodology: – Executive meeting to establish mutual benefit – Understand your business goals and critical success factors – Analyze your processes, review your data, and consider alternatives – Review financial considerations

The Keysight TPA Service has helped many customers achieve their business goals providing both technical and business expertise in the electronic industry

Key Features – Lower production costs – Faster cycle times – Improved product reliability – Faster new product introduction – Improved supply chain effectiveness – More effective resource utilization

Use Keysight knowledge to improve your business results.

Test Process Analysis





Table of Contents

Solution SummaryWhether you are migrating to a new technology, extending the life of an existing system, or developing a new program, Keysight has services and solutions to assist you in refreshing your existing test and measurement applications.

Although the reasons for change may vary, the critical success factors are the same: measurement capability, code compatibility, physical envelope and user interface. Of course the underlying factor is cost. The ability to remove the obstacles to ensure minimum disruption of the critical success factors is paramount for influence on the replacement asset. A key to this is the early identification of obstacles and their real effect on the success of the migration. To adequately do this takes planning and forethought so that all the needed information is vetted on facts and not emotion.

Keysight’s Technology Refresh program helps you recognize, strategize and plan for migration of your instrumentation. Keysight’s proactive approach in assisting you in understanding your options and the associated benefits and risks will allow a balanced return for your technical and business needs.

Key Features – Instrument and Migration Planning Services (IMPS) provides consultation

on a total migration strategy (for US only). – Test System Development services for refurbishment of existing test

systems or subsystems. – Code Compatibility solutions to support your individual instrument

migration requirements. – Software Requirements when Replacing Instruments help ensure

instrument extendibility, application portability, and custom application development

– Product Support options to extend your current instrument warranty and service.

Additional InformationMore information on this solution is available at: www.keysight.com/find/techrefresh

Extend, migrate, or modernize your test assets

Technology Refresh and Asset Management


http://www.keysight.com/find/techrefresh




Table of Contents

Solution SummaryWireless mobile device manufacturers continue to look for ways to drive down cost while improving performance of their devices. To support this trend, power amplifier duplex (PAD) devices are an increasingly popular alternative to the more traditional PA architecture.

RF PA/FEM characterization and test, Reference Solution enables rapid, full charac-terization of next-generation power amplifier modules such as PAD devices, including S-parameter, demodulation, power, adjacent channel power and harmonic distortion measurements. Digital pre-distortion and envelope tracking signal generation and analysis are enabled by Keysight’s N7614B Signal Studio for Power Amplifier Test software. The Reference Solution control software enables tight synchronization between the signal source and the arbitrary waveform generator (AWG), resulting in optimal alignment between input signal and envelope. This multi-vendor solution also includes a Signadyne single slot, high speed PXI AWG, which supports fast envelope tracking capability, while maintaining a small test footprint.

To facilitate evaluation and integration into your test environment, you can use supplied test code examples that have been designed to optimize test throughput without compromising performance.

Key Features – Integration with N7614B Signal Studio for fast design and characterization. – High performance vector signal analyzer for harmonic distortion testing. – Real-time signal processing for faster measurements. – RF signal/envelope skew adjustable over ± 250 ns range to ± 1 ps. – X-series modular measurement applications provide excellent

correlation to bench-top instruments. – Add multiple independent full 2-port VNAs to reduce COT by

simultaneously characterizing many devices.


Make fast and accurate measurements of mobile device RF power amplifiers

RF Power Amplifier Test,Reference Solution






Table of Contents

Solution SummaryManufacturers of military radios are faced with rapidly changing radio technology and/or standards variations. They not only need to address production testing needs for a wider variety of radios but also need to provide support testing (depot) systems to global customers.

Many unique and custom developed testing solutions result from the variety of test need. A modular PXI based radio test solution from Keysight offers unprecedented speed, measurement performance, scalability and upgradeability.

Key FeaturesA PXI radio test solution from Keysight offers:

– Trusted measurement expertise – Fully specified and predictable test performance – Combine the ease of use of the benchtop with the modularity of PXI – Upgrade what you need – Reliability & Support by our global footprint – Experts in LTE – 160 MHz Wide BW (hopping? WiFi?) – Speed, FPGA – Superior GUI

Flexible and reliable testing of legacy and next generation military radios

Military Radio Test, Reference Solution





Table of Contents

Solution SummaryExtra production test time increases manufacturing cost. For active antenna arrays, a significant amount of production test time is spent on calibration. As engineers face pressure to reduce manufacturing cost, they also want to expand their test system flexibility to cover testing broad use cases and ensure they have a test platform that can also test higher performance arrays with even faster frequency switching perfor-mance and higher bandwidths.

The multi-channel antenna test reference solution is a combination of hardware, software, and measurement expertise providing the essential components of a nar-row-band antenna calibration test system. This enables engineers to use, enhance, or modify the test system as required to meet specific test application needs including scalable channel count, options for downconversion of antenna receive channels, selectable analysis bandwidth, and choice of RF/micro wave sources and local oscil-lator. It can also be extended to wide-band measurements as needs change.

Key Features – Enables multiple parallel measurements to increase test throughput – Provides more bandwidth and larger synchronous input channel

counts than network analyzer solutions – Configurable for measurements from narrow to wide frequency

spans with optimized sensitivity and resolution.


Accelerate the calibration of large antenna arrays.

Multi-Channel Antenna Calibration, Reference Solution






Table of Contents

Solution SummarySpectroscopy measures the interaction between a sample and electromagnetic radiation (light). Molecular Rotational Resonance (MRR) spectroscopy enables the accurate identification of the molecular structure of gas phase molecules based on the change of angular momentum when interacting with the light field.

Recent improvements in electronic instrumentation have enabled the development of a chirped pulse Fourier transform millimeter-wave (CP-FTmmW) spectrometer capable of measuring the 260 – 295 GHz region of a rotational spectrum in a single data acquisition.

Keysight’s M8190A 2-channel, AXIe, 12 GSa/s arbitrary waveform generator (AWG) is capable of creating a chirped pulse that provides frequency sweeps in segments from 2 to 3.5 GHz each in 250 ns with 12-bit resolution. By generating a very fast linear sweep of frequencies; it is possible to generate an envelope of radiation spanning a wide frequency range with maximum spectral purity that can be used to excite rotational transitions in a gas sample.

Keysight’s data conversion technology has enabled the development of new molec-ular research techniques based on CP-FTmmW spectroscopy that allow researchers to make faster measurements at millimeter-wave frequencies than were previously possible with conventional spectroscopy techniques.

Key Features – High dynamic range, speed and time resolution enable the development of

new molecular research techniques – Advanced, on-board, signal analysis enable researchers to perform faster

measurements – from days to minutes – AWG sequencing allows rapid library development for the broad adoption of

rotational spectroscopy in new pharmaceutical applications


Make faster spectroscopy measurements with new data conversion techniques

High-Speed Broadband Spectroscopy Measurements






Table of Contents

Solution SummaryRADAR and EW aerospace/defense customers have an important challenge of col-lecting a large number of pulsed RF signals and provide a clear and concise method of verifying the pulses in a complex signal environment.

The Keysight PDW Collector, Reference Solution combines hardware, software, and measurement expertise to provide the essential components to verify RADAR and EW signals. While analyzing a single pulse provides some insight, the ability to collect thousands or hundreds of thousands of pulses provide insights into how pulsed RF signals are changing over time.

Key Features – PDW Collection of Timing, Frequency, Amplitude, and Phase parameters – Database features (including SQL) of plotting, exporting, filtering, and

searching collected results – Multiple channel collection (up to 4) with wide bandwidth (up to 13GHz) and

high dynamic range – Optional RF tuner available for coverage up to 50 GHz (@1GHz BW

Fast and thorough collection of RF pulses for RADAR and EW

Pulse Descriptor Word,Reference Solution





Table of Contents

Solution SummarySetting up an RF simulation of a radar emitter environment with other RF emitters can be very complex and expensive. Typically customers wishing to generate these types of signals have had to purchase very large expensive simulators (>$5M).

At various stages of development and production from system integration laboratory testing to open air testing a simpler simulator is needed, however, few easy-to-use low cost solutions exist in this area. New Arbitrary WaveForm technology with very high Spur Free Dynamics Range (SFDR) and wide bandwidth allows signals to be generated easily.

The analysis of radar signals or jammer signals is complex, FPGA-based digitizers can take signals and process them to avoid high data storage and offload.

By using state of the art modern clean arbitrary waveform generators customers are able to generate unique and clean signals. Customers can quickly generate calibrated signals to test their EW receivers at relatively low cost

Key Features – Programmable Radar Waveforms – Quick to Setup, Low Cost – Clean calibrated signals with very high SFDR – High Bandwidth – FPGA Analysis – PDW Output

Test and analyze EW receivers with FPGA based broadband digitizers.

EW Test,Reference Solution


Solutions PartnersKeysight and its Solutions Partners work together to help customers meet their unique challenges, in design, manufac-turing, installation or support. To learn more about the program, our partners and solutions go to www.keysight.com/find/solutionspartner

For more information on this solution contact Keysight on:Canada (877) 894 4414 - 2Brazil 55 11 3351 7010Mexico 001 800 254 2440United States (800) 829 4444 - #2

Keysight & Solutions PartnersExtending our solutions to meet your needs

Table of Contents

Solution SummaryMedical Alert Pendants ensure that the elderly have a continuous communication channel so that they can continue to live an independent lifestyle.

Circuit Check has worked with medical alert system suppliers to design and deploy manufacturing test systems that ensure the accuracy and reliability of the medical alert system before leaving the production factory.

Circuit Check integrated Keysight’s 34980A multi-function switch/measurement unit for its ease of use and flexible configurations. The 34980A offers a built-in 6.5 digit DMM for basic measurements, a large selection of re-configurable switch and mea-surement plug-in modules and provides a wide range of source and measurement options to address challenging manufacturing test needs.

The test system software, developed by Circuit Check, allows for more than one device to be tested at a time, so the same test station can be used for both the base station unit and the wearable communicator pendant device.

Key Features – Complete data correlation with functional test capabilities for design

verification, early production and final production test. – Flexible platform for easy device changes, additional measurement needs and

new products. – Fully integrated and supported solution for design and manufacturing facilities

worldwide. – 34980A provides compact size, economical price, and a one-box solution for

medium to high-density switch and measure applications.


Ensure accuracy and reliability of critical devices with modular functional test.

Functional Test of Medical Alert Pendants


http://www.keysight.com/find/solutionspartner





Table of Contents

Solution SummaryThe time to develop and deploy functional test solutions can be the critical path item when moving new products from design to manufacturing. Creating customized functional test solutions can be costly and time-consuming. Systems based .on a modular approach can accelerate the deployment of functional test solutions in your manufacturing environment.

The CCI 1089 Configurable Production Test Platform from Circuit Check has been designed to give the modularity required for rapid and predictable functional test system development. The CCI 1089 uses hardware and software modules that can be configured easily to meet your exact functional test needs. It includes a standard base platform design with drop-in/replaceable product interfaces and pre-designedpneumatic, power distribution, and safety sub-systems.

The test platform can be configured with a wide range of Keysight Technologies instrumentation, switching and power supplies such as the Keysight N4010A wireless connectivity test set, Keysight 34980A multifunction switch/measure unit, Keysight 34921A 40-channel armature multiplexer and the Keysight E3645A 80 W PSU.

Circuit Check supports all aspects of the system development including electrical and mechanical design, software development, fabrication, system integration, deploy-ment and support.

Key Features – Modular functional test solution for rapid system development – Based on configurable hardware and software modules – Hardware includes pneumatic, power, and safety subsystems – Available in single, double, and triple enclosure format – Configured with Keysight power supplies, instruments and switching, – Modular software for rapid program development – Accelerates production test strategy deployment


Accelerate the deployment of your production test strategy

Modular Functional Testwith 34980A







Table of Contents

Solution SummaryApplied physics research laboratories face challenging scientific environments that demand innovative measurement solutions. Large scale research projects require many measurement channels with high density and good scalability, high-speed instrumentation, deep memory, powerful processing and very high data throughput.

AXIe based measurement systems using modules from Keysight Technologies and Guzik Test and Measurement can address these needs. Guzik utilizes custom ana-log-to-digital converters (ADCs) from Keysight in its ADC 6000 Series of advanced, high performance AXIe digitizers.

AXIe supports very high-speed data transfer. High data rates are critical for capturing a short duration event in a long time window. In the case of the Guzik digitizers, this means real-time data streaming to PC via PCIe Gen2 at up to 1.6 GB/s and at up to 40 GB/s between adjacent modules. In addition, the digitizers’ FPGA-based fast averaging accumulator provides up to 4 billion, 640,000 point waveforms with 40-bit resolution. This can reduce low signal-to-noise measurements from hours to seconds in applications such as rotational spectroscopy.

The Guzik ADC 6000 digitizers can be configured into a complete measurement solution by combining them with Keysight’s M9502A 2 slot or M9505A 5 slot AXIe chassis, M8190A arbitrary waveform generator, M9703A digitizer(s) and the M9536A embedded controller.

Key Features – Based on the AXIe open, modular instrumentation standard – Flexible channel count with excellent scalability – Very fast data throughput of up to 40 GB/s – Onboard 128 GB memory, up to 640 GB in 5 slot AXIe chassis – Up to 10 GSa/s real-time signal FPGA based processing on each module – Reduce low signal-to-noise measurements from hours to seconds


High channel count, high throughput AXIe digitizers for advanced scientific research

High-Performance Digitizers for Advanced Scientific Research







Table of Contents

Solution SummaryAerospace/defense applications such as wireless communications, RADAR and Satcom require measurements that are accurate, repeatable and flexible. With high performance digitizers you can directly acquire, down convert and process RF wide-band signals for accurate analysis of their characteristics.

Wide bandwidth digitizers from Guzik Test & Measurement capture and process RF signals for subsequent analysis with the Keysight Technologies 89600 Vector Signal Analysis (VSA) software. Guzik’s ADC 6000 series of digitizers perform digital down conversion (DDC) using built-in digital signal processing (DSP) hardware implemented in FPGA’s. This eliminates the need for large amounts of data to be transferred to a personal computer for analysis, reducing significantly the overall measurement time.

The Guzik digitizers are implemented as AXIe modules and can be configured with a number of channel and speed combinations. Up to five 13 GHz (ADC6131), ten 8 GHz (ADC6082) or twenty 4 GHz (ADC6044) RF channels can be configured in the 5 slot AXIe Keysight M9505A 4U chassis. Eight instrument channels can be combined to perform quad baseband IQ (BBIQ) phase coherent measurements.

Guzik’s ADC 6000 series of high performance digitizers, when used with Keysight’s 89600 VSA software, allow you to achieve fast, accurate, repeatable and flexible measurements in aerospace/defense RF wideband applications.

Key Features – High performance digitizers for RF wideband measurements – Built-in FPGA-based digital down conversion up to 13 GHz – Digital equalization for improved SFDR – 64 GByte on-board memory for multi-segment, repetitive acquisitions – PCIe Gen2 x4 and AXIe real-time streaming interface for offloading data – AXIe modular form factor for flexible and scalable configuration


Fast, accurate and repeatable RF wideband measurements with AXIe digitizers

High Performance Digitizersfor Aerospace/Defense







Table of Contents

Solution SummaryWhen using a two- or four-port microwave vector network analyzer to measure the S-parameters of multiport devices such as filters or amplifiers you have to constantly reconfigure the connections to the device-under-test (DUT). The greater the number of ports, the more time it will take to make the required measurements and the great-er the possibility for error when reconfiguring the connections.

In-Phase Technologies has addressed these challenges with the MPTS 388 auto-mated test system The MPTS 388 utilizes a high pin count switching matrix that can automatically configure S-parameter measurements for devices with up to 216 ports.

The In-Phase test system can be used with all models of Keysight Technologies microwave vector network analyzers including the PNA and PNA-X instruments. It comes with proprietary software that controls the switching, coordinates the mea-surements from the vector network analyzer and acquires and formats the test data to provide meaningful results..

The In-Phase MPTS 388 test system when matched with a Keysight vector networkanalyzer allows you to reduce dramatically the time to measure the S-parameters ofyour high pin count multiport microwave devices

Key Features – S-parameter measurements on high pin count multiport devices – Switching matrix allows automatic reconfiguration of connections – Test system handles high pin count devices with up to 216 ports – Works with Keysight PNA or PNA-X microwave network analyzer – Proprietary software for automated control – Software allows user-defined naming conventions – Reduces time for S-parameter measurements on multiport devices


Reduce the time to measure S-parameters on high pin count multiport devices

S-Parameter Measurementson Multiport Devices







Table of Contents

Solution SummaryRF emissions from electronic equipment can jeopardize the security of classified information. All government agencies and defense contractors with access to classi-fied data must ensure that their equipment meets emissions security standards and does not produce compromising emanations.

The conventional approach to RF emission testing uses manual, analog comparison techniques, which are time consuming and error-prone. Emissions analyzer software from EMSEC Solutions Inc. (ESI) addresses these issues by using digital signal pro-cessing (DSP) techniques to automate the test procedures.

The system comprises instrumentation from Keysight Technologies and test automa-tion software from ESI. A typical hardware configuration consists of a Keysight PXA spectrum analyzer, MXG signal generator, arbitrary function generator, oscilloscope, and a controller running the ESI emissions analyzer software suite. Standard configurations are available for testing to 13.6 or 20 GHz and 160 MHz or 900 MHz bandwidth.

The ESI emission analyzer software is based on the proven technology and equipmentused in the Keysight E3238S signal intercept and collection system. As a Keysightsolutions partner, ESI has extended this system with new DSP software to furtherincrease its test throughput.

Key Features – Automated RF emissions testing – Integrates ESI DSP software with Keysight instrumentation – Automated functions for DSS, peak search, and signal correlation – I/Q data stored for post-test analysis and investigation – Software supports conventional test techniques – Automated report generation – Extends and enhances the Keysight E3238S system – Accelerates RF emission testing to achieve certification


Achieve rapid certification of your products with automated RF emissions testing

RF Emissions Testing







Table of Contents

Solution SummaryManufacturers and operators of geostationary, medium and low earth orbit commu-nications satellites must ensure that their payloads operate at the highest level of performance. .In-orbit test (IOT) systems from SED Systems measure the performance of satellite payloads with a minimum of operator intervention. Operating at UHF, L, C, Ku or Ka band, SED’s in-orbit test systems automatically measure and monitor a wide range of satellite parameters.

A Keysight Technologies PSG signal generator provides a clean test carrier for the measurements or for use as a calibration source. A second Keysight signal generator can be added for optional measurements that require multiple test carriers.

The main measurement instrument is a Keysight N9020A MXA signal analyzer, which performs frequency domain or time domain measurements. Using the graphical interface an operator enters sequences of measurements to be performed, parameter tables for the measurements to be executed, data on the satellites to be measured, and nominal calibration data in preparation for an in-orbit test campaign.

During the test campaign, the system operates in a fully automated mode, performing the measurement sequences that have been specified. As measurements are per-formed, results are displayed along with the current status of the system.

Key Features – Continuous, automated, IOT of GEO, MEO & LEO satellites – Operates at UHF, L, C, Ku or Ka band – Unique test algorithms give fast and accurate measurements – Uses Keysight PSG signal generator and MXA signal analyzer – Graphical user interface for ease of use and configuration – Automated or manual calibration routines – Ensures satellite payloads operate to the highest performance


Ensure optimum performance from your satcomms with in-orbit payload testing

In-Orbit Satellite Testing







Table of Contents

Solution SummaryThere are many potential sources of RF interference that can affect the operation of RF systems. By capturing the RF spectrum over an extended period of time you can identify and analyze potential sources of RF interference.

A PXIe data streaming and analysis solution from X-COM and Keysight Technologies is used to record and analyze the operational spectral environment of an RF system in order to identify events causing RF interference. The solution utilizes the Keysight M9392A PXIe vector signal analyzer and M9202A PXIe IF digitizer as the RF front end to capture the RF spectrum. This is streamed to a directly attached RAID storage array for analysis using X-COM’s Spectro-X multi-channel signal analysis toolkit.

The X-COM Spectro-X multi-channel signal analysis toolkit provides a comprehensive set of tools that allows you to search through up to four capture files simultaneously in order to tag and compare the location of all carriers present, in time, frequency, duration and power. Using this data, an engineer can quickly parse the recording into time segments containing unknown carriers that can then be further investigated, and their effects quantified, using the Keysight 89600B VSA software.

The complementary features of the Keysight PXIe data streaming solution and VSA software together with X-COM’s Spectro-X multichannel signal analysis toolkit accel-erates the identification and elimination of RF interference problems allowing you to determine rapidly the best path to a reliable, deployable system.

Key Features – Capture and analyze the operational RF spectrum – Signal analysis software identifies potential causes of RF interference – PXIe data streaming and storage captures operational RF spectrum – Large RAID0 storage array for data capture – Uses Keysight PXIe instrumentation with X-COM analysis software – Accelerates the identification and elimination of RF interference


Identify and eliminate RF interference with PXIe data streaming and analysis

RF Interference Analysis







Table of Contents

Solution SummaryPassive intermodulation (PIM) is a critical issue that can limit the quality of service and capacity of current and next generation mobile communication systems such as cellular, PCS/DCS, UMTS and 4G/LTE.

A new PIM test solution from Power Technology Systems (PTS) and Keysight address-es the need of component suppliers, integrators and service providers to measure passive intermodulation effects. The solution uses the Keysight E5072A ENA series network analyzer and the N5171B EXG signal generator to provide multiband PIM testing capabilities.

PIM testing guidelines are defined in the IEC-62037 standard on RF connector and cables intermodulation level measurements. This includes guidelines for both fixed and swept frequency measurements.

Higher test speeds are achieved through the built-in frequency offset functions in the Keysight network analyzer and signal generator. The frequency offset functions are set by internal firmware eliminating the need for additional external instruments. This reduces significantly the time required to reconfigure the test system for different frequency bands and allows easy configuration of the system to implement the IEC-62037 tests.

Key Features – Multiband passive intermodulation testing – Test antennas, cables, connectors, filters, and other components – Uses Keysight ENA network analyzer and EXG signal generator – Accuracy better than -173 dBc – Rapid measurements using built-in frequency offset functions – Flexible configuration for design, production, QA – Achieve accurate and rapid PIM characterization


Accurate and rapid PIM characterization of communications components

Multiband PassiveIntermodulation Testing







Table of Contents

Solution SummaryVector-receiver load pull allows you to make faster, more accurate assessments of the optimum matching impedances required to maximize power transfer, output power, gain and efficiency in your amplifier designs.

The signal path in a traditional load pull system consists of a signal source and ampli-fier, source and load impedance tuners, a power meter and, optionally, a spectrum analyzer. If the scalar measurement instruments are replaced by a vector network analyzer the signals can be analyzed on a per-frequency basis, with greater accuracy than a power meter or spectrum analyzer.

In a vector-receiver load pull system measurements are made in real time at the device-under-test (DUT) reference plane. Instead of measuring power parameters, the actual DUT a- and b-waves are measured, allowing a more complete set of parameters to be analyzed.

Maury Microwave provides passive, active, hybrid-active and vector-receiver funda-mental and harmonic load pull solutions. All of these solutions are designed around the Keysight Technologies PNA-X Series of microwave network analyzers.

Key Features – Load pull measurements using vector network analyzer – Provides faster and more accurate impedance matching – Allows measurements on per frequency basis – Measurements made at DUT reference plane – Separates fundamental and harmonic measurements – Eliminates load-pull source-pull iterations – Uses Keysight PNA-X analyzers


Improve the performance of your amplifiers with fast, accurate impedance matching

Impedance Matching withVector-Receiver Load Pull




www.keysight.com/find/mykeysightA personalized view into the information most relevant to you.

The information in this document is subject to change without notice© Keysight Technologies, 2015Published in USA, January 20, 20155992-0441ENA1www.keysight.com

For more information on KeysightTechnologies’ products, applications orservices, please contact your local Keysight office. The complete list is available at:www.keysight.com/find/contactus


Keysight Technologies’ Applications Engineering Organization provides a range of additional services that allow you to optimize the performance of your test resources.

Test Code DevelopmentKeysight’s Application Engineers apply expertise in VEE, Visual Basic, Labview, LabWindows, Visual C/C++, Visual Basic .NET, ASP.NET and Visual C#.NET, along with test automation experience, to automate your measurements, optimize system performance and minimize test time.

More information on is available in Keysight Technologies brochure 5988-5354EN

Test Data ManagementTest Data Management service offers structured and organized storage of test data and test results. A Keysight Application Engineer will meet with your team to de-termine your data storage requirements. Once your requirements are specified the engineer will design and create your database. This service can also include theIntegration of database storage routines into existing test software and converting and moving existing data into the database.

More information on is available in Keysight Technologies brochure 5988-5363EN

Technical TrainingKeysight provides a comprehensive portfolio of technical training courses that allow you to achieve the technical proficiency necessary to optimize the effectiveness of your Keysight test equipment.

More information is available in Keysight Technologies Technical Training Catalog 5992-0216ENA1

Additional Services

http://www.keysight.com/find/mykeysight

http://www.keysight.com

http://www.keysight.com/find/contactus



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