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है”ह”ह

IS 12970-6-4 (1992): Semiconductor devices - Integratedcircuits, Part 6: Analogue integrated circuits - Measuringmethods, Section 4: Analogue switching circuits [LITD 5:Semiconductor and Other Electronic Components and Devices]

IS 12970 ( Part G/SW 4 ) : 1992

m&T FTFm

SEMICONDUCTOR DEVICES - INTEGRATED CIRCUITS

PART 6 ANALOGUE INTEGRATED CIRCUITS - MEASURING METHODS

Section 4 Analogue Signal Switching Circuits

UDC 621*3*049*77*037-33 : 621*391*3

@ BIS 1992

BUREAU OF INDIAN STANDARDS MANAK BHAVAN, 9 BAHADUR SHAH ZAFAR MARC3

NEW DELHI 110002 *

October 1992 ~ Price Group 3

Semiconductor Devices and Integrated Circuits Sectional Committee, LT 10

FOREWORD

This Indian Standard ( Part 6/Section 4 ) was adopted by the Bureau of Indian Standards, after the draft finalized by the Semiconductor Devices and Integrated Circuits Sectional Committee had been approved by the Electronics and Telecommunications Division Council.

This standard is one of a series of Indian Standards on measuring methods of Analogue inte- grated circuits. This section of the standard provides measuring methods for Analogue Integrated Circuits. Various sections of this part are:

Section 1 General Section 2 Linear amplifier Section 3 Voltage regulator Section 4 Analogue signal switching circuits

When more than one method of measurement of a particular characteristic are described, it is implied that any one method will be suitable. These methods may vary considerably in regard to accuracy desired, ease of measurements, etc.

While preparing this standard, assistance has been derived from IEC Pub 748-3 cSemiconductor devices, Integrated circuits - Part 3 : Analogue integrated circuits’, issued by the International Elecrtotechnical Commission ( IEC ).

In reporting the results of a test or analysis made in accordance with this standard, if the final value, observed or calculated, is to be rounded off, it shall be done in accordance with IS 2 : 1960 ‘Rules for rounding off numerical values ( revised ).’

Indian Standard

SEMICONDUCTOR DEVICES - CIRCUITS

IS 12970 ( Part 6/&x 4 ) : 1992

INTEGRATED

PART 6 ANALOGUE INTEGRATED CIRCUITS - MEASURING METHODS

Section 4 Analogue Signal Switching Circuits

1 SCOPE

1.1 This standard ( Part 6/Set 4 ) provides mea- suring methods for Analogue signal switching circuits.

2 REFERENCES

2.1 The Indian Standards listed below are necessary adjuncts to this standard:

IS No. Title

1885 Electrotechnical vocabulary: ( Part 7/Set 5 ) : Part 7 Semiconductor devices, 1971 Section 5 Integrated circuits

and microelectronics

3715 ( Part 1 ) : Letter symbols for semicondu- 1971 ctor devices : Part 1 General

aspects

12970 Semiconductor devices - In- ( Part 1 ) : 1990 tefra:: circuits : Part 1

3 TERMINOLOGY

3.1 For the purpose of this standard, the terms and definitions given in IS 1885 ( Part 7/Set 5 ) : 1971 shall be applicable in addrtion to 4 of IS 12970 ( Part 1 ) : 1990.

4 LETTER SYMBOLS

4.1 Por the purpose of this standard, the letter symbols given in IS 3715 (Part 1) : 1971 shall be applicable.

5 STATIC ON-STATE RESISTANCE [ 56 ]

5.1 Under consideration.

6 CONTROL FEEDTHROUGH VOLTAGE [ 57 I

6.1 Purpose

To measure the control feedthrough voltage between control input(s) and signal output of an analogue signal switching circuit.

6.2 Circuit Diagram

6.3 Circuit Description and Requirements

The measuring equipment shall be capable of measuring the voltage at the controli;Ft;k;) with adequate frequency response. more, the equipment shall provide the voltage and the loads at the terminals and shall keep the circuit being measured at the specified temperature.

6.4 Precautions to be Observed

Provision of 6.1 of IS 12970 applies unless otherwise stated.

( Part 1 ) : 1990

6.5 Measurement Procedure

The temperature of the circuit being measured is set to the specified value ( Tamb or Tease ). The input and output terminals as well as the other terminals are to be connected according to the specifications. The power supplies and additional networks are to be connected as specified. The pulse waveform Vi is applied to the control imput(s) n V,, and n V,,, are measured at the swtich output ( see Fig. 1 ).

The larger of the two measured voltage changes A Vol or A V,, is recorded as the control feed- through voltage.

6.6 Specified Conditions

6.6.1 Ambient or reference-point temperature.

6.6.2 Power supply voltage(s).

6.6.3 Input pulse conditions ( see Fig. 2 ):

a) Rise time tr;

b) Fall time tr;

c) Duration tw;

d) Amplitude Vi;

e) Repetition frequency.

1

I

f r

CONTROL INPUT

NETWORK

I I

I

I

__+

r ---

SWITCH Et- INPUT N ET WORK I

-- J

ClRCU1T BEING

MEASURED

---7

PtG. 1 MEASUREMENT OF CONTROL FEEDTHROUGH VOLTAGE BETWEEN CONTROL INPUT AND SIGNAL OUTPur OF ANALOGUE SIGNAL SWITCHING CIRCUIT

6.6.4 Analogue input and output networks of switching circuit, expressed as attenuation or channel n. resistance or conductance.

6.6.5 Control input network(s).

6.6.6 Output voltage V,, of channel n. 7.2 Circuit Diagram

6.6.7 Inputs and outputs to be measured. 7.3 Circuit Description and Requirements

6.6.8 Additional networks, where appro- priate.

The measuring equipment shall be capable of measuring the voltage at the input and output.

6.6.9 Conditions at other terminals, where Furthermore, the equipment shall provide the

appropriate. voltage and the loads at the terminals.

7 OFF-STATE SWITCH ISOLATION [ 58 ] 7.4 Precaution to be Observed, See 6.1 of IS 12970 ( Part 1 ) : 1990 on general precautions.

7.1 Purpose Care should be taken that unwanted signals do not affect the measurement of off-state

To measure the off-state switch isolation bet- switch isolation. Measurements should there- ween the input and output of an open fore be made, where appropriate, with a ( switched-off) channel of an analogue signal frequency-selective voltmeter.

2 .

IS 12970 ( Part 6/Set 4 ) : 1992

FIG. 2 MEASUREMENT OF CONTROL FEEDTHROUGH VOLTAGE BETWEEN CONTROL INPUT AND SIGNAL OUTPUT OF ANALOGUE SJGNAL SWITCHING CIRCUIT

7.5 Measurement Procedure

The integrated circuit is connected to the measurement circuit as shown in Fig. 3. The supply and input voltage and the input fre- quency are set to their specified values. The temperature is set to the specified value and checked immediately before and after the measurement. The channel being measured is to be opened ( switched-off condition ), using the control inputs. V,, is measured at the output.

The off-state switch isolation may be expressed:

-either as an attenuation, using the expression:

UOff = 20 IO&~ ‘I ( decibels ) 0

-or as a resistance, using the expression:

R of~=R~08~(-&-1)(ohms~

-or as a conductance, using the expression:

Goft = 1 Rorr = Gload v,_ v. -!!!L- ( Siemen )

NOTE --When expressed as a resistance or conduct- ance, the measurement should be made at a frequ- ency low enough to avoid the influence of the measurement error caused by the phase shift.

7.6 Specified Conditions

7.6.1 Ambient or reference-point tempera- ture.

7.6.2 Power supply voltage(s).

7.6.3 Amplitude of input voltage signal ( Vi )

7.6.4 Input signal frequency.

7.6.5 Input and output networks of channel to be measured ( load conditions: RIOBd or Goaa ).

7.6.6 - Switched condition of all channels.

3

.

IS E2WO ( Part Q/Set 4 ) : l!M2

CIRCUIT BEIN C

MEASURED

I

1 AOOlflONAL NET WORKS

? t t

1 OUTPUT NETWORK

FIG. 3 MEASUREMENT OF OFF-STATE SWITCH ISOLATION OF A CHANNEL OF AN ANALOCUE SIGNAL SWITCHING CLRCUIT

7.6.7 Inputs and outputs to be measured.

7.6.8 Additional networks, where apropriate.

9.2 Circuit Diagram

9.3 Circuit Description and Requirements 7.6.9 Conditions at other terminals,

7.6.10 Bandwidth of the bandpass filter, where appropriate.

8 HARMONIC DISTORTION [ 59 1

8.1 Under consideration.

9 CROSS-TALK ATTENUATION [ 60 1

9.1 Purpose

To measure the ( non-state ) cross-talk attenuation or the off-state cross-talk attenua- tion or the input cross-talk attenuation bet- ween any two channels of an analogue signal switching circuit.

4

The measurement equipment should be capabJe of providing the specified a.c. input voltage Vi* at the specified frequency and of measuring the a.c. input and output voltages. Purther- more, the equipment should provide the specified networks for connection to the device being measured.

9.4 Precautions to be Observed

See 6.1 of IS 12970 ( Part 1 ) : 1990 on general precautions. Care should be taken that unwanted signals do not affect the measurement of cross- talk attenuation. Measurements should therefore be made, where appropriate, with a frequency-selective voltmeter.

IS 12970 ( Part i/Set 4 j : 1992

I-

I I

I I - INPUT

’ NETWORK A I ’

_-_-l-,_! ; 1

A

INPUJ

NETWORK 8

r-- - I

I +

I ,I

OTHER INPUT

NET WORK

I ) i 1 I

I I NETWORK A

4

I I I -------1

CIRCUIT BEING

MEASURED

I 7

i

I

OUT PUT

I NETWORK B

I I I I I. - I I L-- -+-----_

, I

OTHER OUTPUT

I . NETWORK I .

PIG. 4 MEASUREMENT OF CROSS-TALK ATTENUATION BETWEEN CHANNELS OF AN ANALOGUE SIGNAL SWITCHING CIRCUIT

9.5 Measurement Procedure - Input cross-talk attenuation:

The integrated circuit is connected to the measurement circuit as shown in Fig. 4. The supply and input voltages and the input fre- quency are set to their specified values. The temperature is set to the specified value and checked immediately before and after the measurement.

V a, (in) = 20 log10 --%

ViA

9.6 Specified Conditions

9.6.1 Ambient or reference-point temperature.

9.6.2 Power supply voltage(s).

9.6.3 Amplitude of input voltage signal ( VIA).

9.6.4 Input signal frequeny.

9.6.5 Input and output networks of all channels.

9.6.6 Switch conditions of all channels.

9.6.7 Inputs and outputs to be measured.

9.6.8 Additional networks, where appropriate.

9.6.9 Conditions at other terminals, where appropriate.

9.6.10 Bandwidth of the bandpass filter, where appropriate.

The a.c. output voltages V,,* and VOB are measured.

The different cross-talk attenuations between channels .4 and B of an analogue signal switch- ing circuit are calculated using one of the expression:

- ( On-state ) cross-talk attenuation:

a, (on) = 20 log v,* ‘O VOI,

- ( Off-state ) cross-talk attenuation:

V a, (Off) = 20 log,,+

OB

5 .

I

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Revision of Indian Standards

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Comments on this Indian Standard may be

Dot : No. LTD 10 ( 1269 )

Amendments Issued Since Publication

Amend No. Date of Issue Text Affected

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