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© Siemens AG 2011. All rights reserved. How to create a PAT data management platform to support Continuous Production 8th Annual PAT and QbD Conference, London, February 16 th , 2011 Jan Verelst

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© Siemens AG 2011. All rights reserved.

How to create a PAT data management platform to support Continuous Production8th Annual PAT and QbD Conference,London, February 16th, 2011

Jan Verelst

© Siemens AG 2011. All rights reserved.

Industry Sector

Page 2 February 16, 2011 8th Annual PAT/QbD Conference - London

Back in time

© Siemens AG 2011. All rights reserved.

Industry Sector

Page 3 February 16, 2011 8th Annual PAT/QbD Conference - London

What caused this disaster ?

Information :

� Hidden

� Critical

� Knowledge

Knowledge

Data

Information

© Siemens AG 2011. All rights reserved.

Industry Sector

Page 5 February 16, 2011 8th Annual PAT/QbD Conference - London

Oral Solid Dosage today

Granulator

Dryer

Coating

Delay Delay Delay

1 to 2

months to

release

Blender

Raw Material

Tablet press

Delay

Blender

© Siemens AG 2011. All rights reserved.

Industry Sector

Page 6 February 16, 2011 8th Annual PAT/QbD Conference - London

PAT: Key Enabler for Continuous Manufacturing and Real Time Product Release

Raw Material

Dryer

Granulator Tablet press

Blender

Qualitycheck

SIPATSIPAT

Coating

Right First Time

Real time release

In/At line check

© Siemens AG 2011. All rights reserved.

Industry Sector

Page 7 February 16, 2011 8th Annual PAT/QbD Conference - London

Process feed

Ho

ld /

rele

ase

LabLabTemp., Speed,

Liquid addition,

Compression Force, …

Process output

LIMSLIMS

Sample

Classic controlClassic control

Process Analyzer

monitoringmonitoring

processprocess datadata

monitoringmonitoring

product product qualityquality

PATPAT

mathematicalmathematical

translationtranslation

RealReal--timetime

releasereleaseAdvanced Advanced

ControlControl

Quality build in by design

Right first time

PAT Basics – Holistic Approach

Closed loopClosed loop

controlcontrol

© Siemens AG 2011. All rights reserved.

Industry Sector

Page 8 February 16, 2011 8th Annual PAT/QbD Conference - London

SIPAT functions

© Siemens AG 2011. All rights reserved.

Industry Sector

Page 9 February 16, 2011 8th Annual PAT/QbD Conference - London

SIPAT Collectors

Collector = Interface to read data from external systems as input to SIPAT

Method

Standard available collectors within SIPAT

� Instrument collectors (dedicated interfaces to range of analytical instruments)

� Process collector (OPC DA Client)

� File collectors (XML, SPC, JCAMP)

� PAT Collector (results from other SIPAT Method)

� Databrowse collectors (ODBC, SQL, OLEDB)

© Siemens AG 2011. All rights reserved.

Industry Sector

Page 10 February 16, 2011 8th Annual PAT/QbD Conference - London

Process Analyzers

Standard analyzer connection available with actual productivity pack:

� Kaiser Raman (Raman RXN1, RXN3, RXN3L, RXN4R and PhAT); Kaizer’s Analyser Control V4.2

� Thermo Fischer Antaris and Antaris II family (via Result software)

� PAA Ltd with GranuMet XP (acoustic emission measurement), Version 4

� Bruker NIR via OPUS V6.1 software

� Bruker NIR via OPUS 6.5 embedded DLL

� Malvern Insitec – Laser Diffraction PSD (RT Sizer software)

� Malvern Morphology G3

� Mettler Toledo collector for ReactIR 4000 (FT-IR) � via IC4 software

� Mettler Toledo MonARC (FT-IR) � via IC4 software

� Mettler Toledo Lasentec FBRM (PSD) � via IC4 software

� Zeiss collector MCS 500 serie (photodiode array UV/visible spectrophotometer)

� Zeiss collector MCS 600 serie (NIR)

� Brimrose Luminar 5030 and 4030 AOTF-NIR

� Expo ePAT 601 (including an Axsun NIR)

� Dr. Schleuniger tablet tester (Tandem using Dr. Schleuniger – Pharmatron - Bruker)

� ABB FTPA2000

� Bruker LancIR via embedded DLL 6.5.92

New productivity packs will be released on a frequent basis

© Siemens AG 2011. All rights reserved.

Industry Sector

Page 12 February 16, 2011 8th Annual PAT/QbD Conference - London

SIPAT: data collection in real time

Alignment of Collectors

NIR

Process value(e.g. Temp)

Measurement

duration

Start batch

Startup off set Measurement rate

Negative Validity

Range

REFERENCE COLLECTOR

Positive Validity Range

Aggregation function :

Average

Last Value

Maximum

Middle

Minimum

First Value

Nearest to reference

© Siemens AG 2011. All rights reserved.

Industry Sector

Page 13 February 16, 2011 8th Annual PAT/QbD Conference - London

SIPAT: data collection in real timePrinciple

�Data alignment

�Contextualization

�Rules separating non-representativedata

SIPAT

Raw Material

Characteristics

LIMS

Process

+

Context data

SC

AD

A

Analytical

Data

NIR, PSD

Analyzer

© Siemens AG 2011. All rights reserved.

Industry Sector

Page 14 February 16, 2011 8th Annual PAT/QbD Conference - London

SIPAT functions

© Siemens AG 2011. All rights reserved.

Industry Sector

Page 15 February 16, 2011 8th Annual PAT/QbD Conference - London

SIPAT: data monitoring and control in real timeApplication

SIPAT brings all data (in-line, at-line, on-line and off-line) in relation for prediction

Quelle: Siemens IT Solutions and Services

Quantitative prediction

Qualitative prediction

Real Time

Prediction

Alig

nm

ent

Meta &

context data

Raw Material

Data / IPC data (Moisture, …)

Other Application data

Instrument data

(NIR, Raman, PSD, …)

Process data (pH, Temp, Pressure, …)

© Siemens AG 2011. All rights reserved.

Industry Sector

Page 17 February 16, 2011 8th Annual PAT/QbD Conference - London

SIPAT Data Model

SIPAT MethodSIPAT MethodCollector DataCollector Data CalculationsCalculations

VisualizationsVisualizations

Info DataInfo Data

Perform Calculations

Make Predictions

� using

� Models

� Basic Calculations

� Advanced Calculations

Input from

� Analytical Instruments

� Process/Automation Level

� Raw Materials

� Other Systems

� Previous process step

� using Collectors

Static data

Semi-static data

Meta-data

Manual/automatic entry

Configure operator screens

Using Charting types

© Siemens AG 2011. All rights reserved.

Industry Sector

Page 18 February 16, 2011 8th Annual PAT/QbD Conference - London

SIPAT: data monitoring and control in real timePrinciple

�Data alignment

�Contextualization

�Rules separating non-representativedata

�Statistical RT Models

�e.g. PLS, PCA

�Chemometrics(SIMCA, Matlab,

Unscrambler,

PharmaMV,…)

engine embedded

in SIPAT

�CQA

Aggregation of CQA over process context

- Average,

- Standard deviation

On line Monitoring

Out of control detection

Deviation tracking

AP

CR

TR

SIPAT

Raw Material

Characteristics

LIMS

Process

+

Context data

SC

AD

A

Analytical

Data

NIR, PSD

Analyzer

Critical

to

QualtyAttribute

© Siemens AG 2011. All rights reserved.

Industry Sector

Page 19 February 16, 2011 8th Annual PAT/QbD Conference - London

SIPAT functions

© Siemens AG 2011. All rights reserved.

Industry Sector

Page 20 February 16, 2011 8th Annual PAT/QbD Conference - London

SIPAT: data miningPrinciple

SIPAT

Analyser Data ( NIR, Raman, PSD, …)

Process Data Predicted data

Off- line lab data

(RM,process samples,…)

External application

Meta & context data Other data

- Batch number

- Trial number

- Process step

- Product

- Campaign

…. Processoptimization

© Siemens AG 2011. All rights reserved.

Industry Sector

Page 21 February 16, 2011 8th Annual PAT/QbD Conference - London

SIPAT: data miningModel creation & process optimization

Turning data into knowledge

� Improved process understanding

� Base of QbD

Model Builder

� Integrate all relevant PAT data

� Send to Chemometrics application

� Umetrics - Simca

� Camo - Unscrambler

� Matlab

� Perceptive Engineering - PharmaMVProcess

optimization

© Siemens AG 2011. All rights reserved.

Industry Sector

Page 22 February 16, 2011 8th Annual PAT/QbD Conference - London

SIPAT functions

© Siemens AG 2011. All rights reserved.

Industry Sector

Page 23 February 16, 2011 8th Annual PAT/QbD Conference - London

ReportingAutomated or ad hoc

© Siemens AG 2011. All rights reserved.

Industry Sector

Page 24 February 16, 2011 8th Annual PAT/QbD Conference - London

ReportingTable output

© Siemens AG 2011. All rights reserved.

Industry Sector

Page 25 February 16, 2011 8th Annual PAT/QbD Conference - London

ReportingGraphical output

© Siemens AG 2011. All rights reserved.

Industry Sector

Page 26 February 16, 2011 8th Annual PAT/QbD Conference - London

ReportingGraphical output - spectrum

© Siemens AG 2011. All rights reserved.

Industry Sector

Page 27 February 16, 2011 8th Annual PAT/QbD Conference - London

ReportingGraphical output – batch comparison

© Siemens AG 2011. All rights reserved.

Industry Sector

Page 28 February 16, 2011 8th Annual PAT/QbD Conference - London

Why SIPAT ?

SIPAT

Increase process understanding / manage variability

Bring all data (in-line, at-line, on-line and off-line) in relation

Provide on-line predictions on product/process quality

Shift from lab testing towards in process testing

1 common interface for all PAT tools

Close the gap between R&D and Manufacturing

© Siemens AG 2011. All rights reserved.

Industry Sector

Page 29 February 16, 2011 8th Annual PAT/QbD Conference - London

Project context

GEA Pharma Systems

� Process Know-How

� Supply specific equipment +

instrumentation to handle a specific

production operation

� Focus on equipment specific

optimization

� Equipment automation specification

(PLC, HMI, drive, instrumentation,

...)

� Equipment validation

� Equipment specific 21 CFR Part 11

functionality

� Worldwide Packaged Unit Support

Siemens� Industry know How

� Standard platform

� Scalable solutions

� Easy integration

� GMP supporting functions

� Cost effective solutions

� Long term Support (investment protection)

� Worldwide Product Support

End-User

� Product Know-How

� Specify required machinery to fulfill a specific production operation

� Equipment must comply with the own

specific norms and standards

� Focus on the optimized

functioning of the

complete production line

� Easy integration of

the control level into

Plant-IT

End-user

Supplier

OEM

© Siemens AG 2011. All rights reserved.

Industry Sector

Page 30 February 16, 2011 8th Annual PAT/QbD Conference - London

PAT Instruments

NDC - Moisture

NIR (J&M LHP)

Moisture+ C. uniformity

Malvern

Particle Size

At line analyzer

Weight, Hardness,Thickness, Assay

© Siemens AG 2011. All rights reserved.

Industry Sector

Page 31 February 16, 2011 8th Annual PAT/QbD Conference - London

MES LIMS

SCADA

PLC / Motion Control

PROCESS

ANALYZERS

SIPAT

Line

SITE

(2)

(5)

(1) (3)

(4)

(6)

High Level System Architecture

�Control Analyzers

�Multivariate Data handling

�On-line monitoring of the Critical to Quality Attributes (CQA)

�Deviation Tracking CQA

�Out of Control Detection & input to APC

� Supervisory & Control

� Alarm handling

� Line Recipe handling

� Trending Univariate Data

� Deviation Tracking Critical Process Parameters

�Real Time Releasereporting

© Siemens AG 2011. All rights reserved.

Industry Sector

Page 32 February 16, 2011 8th Annual PAT/QbD Conference - London

Traditional PAT in solid dosage

Drying

control

Process

parameters

Milling Blending

Lubrication

control

Process

parameters

Compression

control

Process

parameters

Coating

control

Process

parameters

Dispense

& Blend

control

Process

parameters

� API

� Excipients

Wet

Granulation

control

Process

parameters

Liquid addition

Lubricant excipient

Coating solution

Moisture

Bulk Physical

Defects

Test against

specifications

Bulk Physical

Defects

Content

Uniformity

Packaging

control

Process

parameters

Particle size

Sampling &

Off-line analysis

© Siemens AG 2011. All rights reserved.

Industry Sector

Page 33 February 16, 2011 8th Annual PAT/QbD Conference - London

End product quality predictions

Lubricant excipient

Drying

control

Process

parameters

Blending /

Lubrication

control

Process

parameters

Compression

control

Process

parameters

Coating

control

Process

parameters� Api

� Excipients

Dispense

& Blend

control

Process

parameters

Liquid addition

Wet

Granulation

control

Process

parameters

Coating solution

Moisture

(NIR)

Assay

Dissolution

Disintegration

Packaging

control

Process

parameters

Particle size

(Malvern)Weight

Hardness

Thickness

Input material

characteristics

Visual

Inspection

Coating

thickness

Content

Uniformity

© Siemens AG 2011. All rights reserved.

Industry Sector

Page 34 February 16, 2011 8th Annual PAT/QbD Conference - London

Lot 1 Lot 2

Lot 1 Lot 2

Lot 1 Lot 2

F1C1 F1C2 F1C3 F1C4 F1C5 F1C6 F2C1 F2C2 F2C3 F2C4 F2C5 F2C6 F3C1 F3C2 F3C3 F3C4 F3C5 F3C6 F4C1 F4C2 F4C3 F4C4 F4C5

F1C1 F1C2 F1C3 F1C4 F1C5 F1C6 F2C1 F2C2 F2C3 F2C4 F2C5 F2C6 F3C1 F3C2 F3C3 F3C4 F3C5 F3C6 F4C1 F4C2 F4C3 F4C4

F1C1 F1C2 F1C3 F1C4 F1C5 F1C6 F2C1 F2C2 F2C3 F2C4 F2C5 F2C6 F3C1 F3C2 F3C3 F3C4 F3C5 F3C6 F4C1 F4C2 F4C3

F1C1 F1C2 F1C3 F1C4 F1C5 F1C6 F2C1 F2C2 F2C3 F2C4 F2C5 F2C6 F3C1 F3C2 F3C3 F3C4 F3C5 F3C6 F4C1 F4C2

API

Excipient 1

Excipient 2

Granulation

Ingredients

Drum 1 Drum 2 Drum 3Output

Time

Drying

Millling/Blending

Compression

Coating

Material Residence Time distribution Product Plug tracking

© Siemens AG 2011. All rights reserved.

Industry Sector

Page 35 February 16, 2011 8th Annual PAT/QbD Conference - London

Lot 1 Lot 2

Lot 1 Lot 2

Lot 1 Lot 2

F1C1 F1C2 F1C3 F1C4 F1C5 F1C6 F2C1 F2C2 F2C3 F2C4 F2C5 F2C6 F3C1 F3C2 F3C3 F3C4 F3C5 F3C6 F4C1 F4C2 F4C3 F4C4 F4C5

F1C1 F1C2 F1C3 F1C4 F1C5 F1C6 F2C1 F2C2 F2C3 F2C4 F2C5 F2C6 F3C1 F3C2 F3C3 F3C4 F3C5 F3C6 F4C1 F4C2 F4C3 F4C4

F1C1 F1C2 F1C3 F1C4 F1C5 F1C6 F2C1 F2C2 F2C3 F2C4 F2C5 F2C6 F3C1 F3C2 F3C3 F3C4 F3C5 F3C6 F4C1 F4C2 F4C3

F1C1 F1C2 F1C3 F1C4 F1C5 F1C6 F2C1 F2C2 F2C3 F2C4 F2C5 F2C6 F3C1 F3C2 F3C3 F3C4 F3C5 F3C6 F4C1 F4C2

API

Excipient 1

Excipient 2

Granulation

Ingredients

Drum 1 Drum 2 Drum 3Output

Time

Drying

Millling/Blending

Compression

Coating

Material Residence Time distribution Real Time Release floating window

Release window

© Siemens AG 2011. All rights reserved.

Industry Sector

Page 36 February 16, 2011 8th Annual PAT/QbD Conference - London

SIPAT: data monitoring and control in real timePrinciple

�Data alignment

�Contextualization

�Rules separating non-representativedata

�Statistical Real Time Models

�e.g. PLS, PCA

�Chemometrics

(SIMCA, Matlab,

Unscrambler,

PharmaMV,…)

engine embedded in SIPAT

�CQA

Aggregation of CQA over process context

- Average,

- Standard deviation

On line Monitoring

Out of control detection

Deviation tracking

AP

CR

TR

SIPAT

Raw Material

Characteristics

LIMS

Process

+

Context data

SC

AD

A

Analytical

Data

NIR, PSD

Analyzer

Critical

to

QualtyAttribute

© Siemens AG 2011. All rights reserved.

Industry Sector

Page 37 February 16, 2011 8th Annual PAT/QbD Conference - London

37

Data Driven Manufacturing

• SiPAT allows to measure inline the CQA’s, real time

• Increased number of measurements

Test case of 50hrs run @25kg/hr=1250kg material

- Moisture measured 960 times

- Particles size distribution

measurements: 960 times

- Content uniformity: 100 times

- Tablet weight: each tablet (1,8 Mio)

�Enhanced product security

�Data correlation across units

© Siemens AG 2011. All rights reserved.

Industry Sector

Page 38 February 16, 2011 8th Annual PAT/QbD Conference - London

Results of the trials

Main findings of the feasibility study:

� Reduced process development time

� “Unlimited” number of reference batches as a basis for model creation

� Real Time Release enabling

� Quality information available on tablet level rather than on batch level

� Increased process understanding

� Through Real Time Quality Assurance

� Time-based process: scalability improvement

� Savings in construction, space, energy, maintenance

� Increase of yield and equipment efficiency

� Reduction of scrap, waste & rework

� Reduction of raw material

� Reduction of human interference (cost, safety)

� …

© Siemens AG 2011. All rights reserved.

Industry Sector

Page 39 February 16, 2011 8th Annual PAT/QbD Conference - London

Article available on request

© Siemens AG 2011. All rights reserved.

Industry Sector

Page 40 February 16, 2011 8th Annual PAT/QbD Conference - London

Better process understanding…leads to a more efficient result !

© Siemens AG 2011. All rights reserved.

Jan Verelst

Siemens

Industrial IT

+32 475 432 560

[email protected]

Thank you for your attention!