example-bb electronic

Sponsor Peter Zhou

Coach Peter Zhou

Champion XXXXX

Leader XXXX

TeamMember

XXXX, XXXXXXXX

ABCD Product AOI First Time Yield

Improvement

Oct 13, 2008 1

Continental/Tianjin - Chrysler

ALCOA

AM I CD

2

CTQ & CTP Chart

CTQ CCR Customer Issues

VOC

Pin Position return ppm

No Positioning defects during AOI test (Meet Spec: +/- 0.4mm)

Pin positioning problem will cause ALCOA assembly line problem

TIPM board not reliable enough

VOB Business Issues

CBR CTP

High scrap rate(14%FYI)

Low output rate with high cost

Improve FTY% by 10% at least from current 86%

Reduce Misalignment defect rate

Remark1. Voice of customer and voice of business to be prioritized to those which are related to project objective2. Use VOB or VOC or both depending on the project objectives

AM I CD

3

F/E Process AOI and Packing process

ICT

PC BoardLoading

Screen Print

ComponentPlacement

Solder Reflow

UMG MachineLoading

2nd UMG Machine

Coating Machine

Function test

AOI Tester for Complaint pins

AOI Tester for Tuning fork pins

Finished Good Packing

Shipping to customer

Process Flow AM I CD

4

Yield Current Performance – Pin Misalignment

Y = Scrap Rate

TIPM Product AOI First Time Yield Performance Trend

75.00%

80.00%

85.00%

90.00%

95.00%

100.00%

28-O

ct-0

7

29-O

ct-0

7

30-O

ct-0

7

31-O

ct-0

7

1-N

ov-0

7

2-N

ov-0

7

3-N

ov-0

7

4-N

ov-0

7

5-N

ov-0

7

6-N

ov-0

7

7-N

ov-0

7

8-N

ov-0

7

9-N

ov-0

7

10-N

ov-0

7

% Average 86%

y = Pins Position Defect Rate

AM I CD

5

96%

May’08Yiel

d Pe

rfor

man

ce

86%

Nov’07

Project Target

AM I CDTarget

6

Team Charter Project Selection

ID CCR

TeamCharter

Build Team

Map Process

FinancialEstimation

Goal StatementIndicator Baseline Target Target Date

Process Output 86% 96% Aug 1st 2008

Finance …… Saving 200k Aug 1st 2008

Subsequent

Team SelectionSponsor/Champion: Scott Stryker/Chrysler, Angie Liu/ContinentalTeam leader.: XXX 35% - Con%Team member: Michael Quality engineer 35% Wang Test engineer 10% Cao line leader 5% Han Quality engineer 5% Zhang Process engineer 5% White Production super. 5%

Project SchedulePhase Start End Remark

Define 11/30/2007 12/15/2007

Measure 12/15/2007 01/15/2008

Analyze 01/15/2008 04/28/2008

Improve 04/28/2008 05/30/2008

Control 05/30/2008 07/30/2008

Business CaseChrysler is the biggest customer for XXX factory. TIPM for Chrysler has been launched since end 2006. It is brand-new design product for Continental/Tianjin, which has two sides pin on the top and bottom PCB slide. As the pin straightness (perpendicular to the board) is very important to customer assembly process, therefore Tianjin factory install AOI test for inspection, but the first time yield FTY% can’t meet the target which is above 96%.

Opportunity StatementIf we can meet FTY target 96%, we can achieve saving at least 200k and meet customer requirement accordingly. On time delivery will also be assured.

Project ScopeProcess Front End Process

Start Point UMG Station

End Point Packing process

Scope Focus on Tianjin facility for TIPM product

7

TIPM Product AOI First Time Yield Daily Performance Trend

65.00%

70.00%

75.00%

80.00%

85.00%

90.00%

95.00%

28-O

ct-0

7

29-O

ct-0

7

30-O

ct-0

7

31-O

ct-0

7

1-N

ov-0

7

2-N

ov-0

7

3-N

ov-0

7

4-N

ov-0

7

5-N

ov-0

7

6-N

ov-0

7

7-N

ov-0

7

8-N

ov-0

7

9-N

ov-0

7

10-N

ov-0

7

11-N

ov-0

7

12-N

ov-0

7

13-N

ov-0

7

14-N

ov-0

7

15-N

ov-0

7

16-N

ov-0

7

17-N

ov-0

7

18-N

ov-0

7

19-N

ov-0

7

20-N

ov-0

7

21-N

ov-0

7

22-N

ov-0

7

23-N

ov-0

7

24-N

ov-0

7

% 86%

88%

Quick Win Opportunity

Yield Improved to 88% by Implement three

Opportunities from Quick Win

AM I CD

8

Pin Misalignment Position Complaint Bent pin TIPM Medium

The complaint pin use the mechanical connective design, The tail of complain pin directly contact PCB through hole without any soldering. So they are more easily bent during normal production process.

X Direction

Y Direction

Bent Pins

AM I CD

9

Pin Misalignment Position

J4-37J4-11

J2-17

Bent Pin Most Happened Position Is On Then Edge of PCB Board

AM I CD

10

Pin Misalignment Position

Position Pareto chart for Real bent pin

The Pareto chart show the major bent pin issue are from the compliant pin and occurred more frequently at position J4-37 & J2-17.

AM I CD

11

MachineManpower

Drop to The Ground

Transportation Shock

Material

Tilted Pin

Wrong Handling

Mounting Machine

Temperature Chamber

ICT MachineOperator Touch Up

Separation Machine

Coating Machine

Function Fixture

Method

Unsafe Package In Process

Process Flow

Pin Handing

Temp Test Time

Oven Temp,Time

PCB Hole Tilt

Pin Roller Defect

Fishbone Diagram

Pin Snap Slot Defect

(Top Layer pin may be touched accidentally)

Unsafe Package after AOI

AM I CD

Different Pin Position

12

Identify Critical Process

Characteristics and Input Indicators

AM I CD

13

MachineManpower

Drop to The Ground


Material

Tilted Pin

Wrong Handling

UMG Mounting Machine

Temperature Test

ICT MachineOperator Touch Up

Separation Machine

Routing Machine

Function Fixture

Method


Process Flow

Pin Handing

Temp Test Time

Oven Temp,Time

PCB Hole Tilt

Pin Roller Defect

Fishbone Diagram


(Top Layer pin may be touched accidentally)

Unsafe Package after AOI

AM I CD

Different Pin Position

14


Temperature Test

ICT Machine

Operator Touch Up

Routing Machine



AM I CDScreening

Function Fixture

15

Data Collection Plan ID IPO Indicators Collect Data MSA

Process Capability

Remarks:Other data refers to additional information from stratification perspective.

Performance measure (Y)

Operational definition

Data source and location

Sample

size

Who will collect the data

When will data be

collected

How will data be

collected

Other data that should be

collected at the same time

PIN Misalignment

Rate

Pin Straightness Requirement (+/- 0.4mm)

AOI Tester 100% QA Nov 07 AOI Tester

Process / Input (X)

Operational definition

Data source and location

Sample

size

Who will collect the data

When will data be

collected

How will data be

collected

Other data that should be

collected at the same time

Pin Position Measure Pin Position

Jasper System 100% Jasper System Every Shift Jasper System -

16

MSA ResultsMSA study on these test itemsTo ensure the data are reasonable, we will do MSA study for AOI 1 testerThese AOI Tester GR&R% are all less than 10% , acceptable!See the MSA_Demo.PPT for the GR&R% study demonstration.

Microsoft PowerPoint Presentation

AM I CD

17

Pin Misalignment distributionCheck the TOP defect data distribution, The P-value is more than 0.05. It is normal distribution. But the mean value deviation to spec center, which need further analysis.

300225150750-75

Median

Mean

11010510095908580

1st Quartile 23.500Median 99.5003rd Quartile 168.750Maximum 308.000

84.558 107.163

82.113 113.000

88.722 104.768

A-Squared 0.72P-Value 0.061Mean 95.861StDev 96.076Variance 9230.529Skewness -0.082150Kurtosis -0.688619N 280Minimum -130.000

Anderson-Darling Normality Test

95% Confidence Interval for Mean

95% Confidence Interval for Median

95% Confidence Interval for StDev95% Confidence I ntervals

Summary for Y_ j2-17

-60-120-180-240-300-360

Median

Mean

-160-165-170-175-180-185-190

1st Quartile -214.75Median -169.503rd Quartile -134.25Maximum -21.00

-186.81 -170.63

-187.00 -163.00

61.01 72.50

A-Squared 0.70P-Value 0.066Mean -178.72StDev 66.26Variance 4389.96Skewness -0.295591Kurtosis -0.063028N 260Minimum -352.00


95% Confidence I nterval for Mean

95% Confidence I nterval for Median

95% Confidence I nterval for StDev95% Confidence I ntervals

Summary for X_ j2-17

3002001000-100-200-300

Median

Mean

1051009590858075

1st Quartile 25.500Median 84.0003rd Quartile 154.500Maximum 369.000

76.747 100.411

75.485 104.545

93.773 110.569

A-Squared 0.72P-Value 0.058Mean 88.579StDev 101.477Variance 10297.505Skewness -0.240282Kurtosis 0.998535N 285Minimum -319.000


95% Confidence Interval for Mean

95% Confidence Interval for Median

95% Confidence Interval for StDev95% Confidence I ntervals

Summary for X_ j4-37

AM I CD

18

Indi

vidu

al V

alue

272421181512963

0

-200

-400

_X=-181.7

UCL=2.6

LCL=-366.0

Mov

ing

Rang

e

272421181512963

200

100

0

__MR=69.3

UCL=226.4

LCL=0

Observation

Valu

es

252015105

0

-150

-300

-50-100-150-200-250-300-350

0-200-400

Within

Overall

Specs

WithinStDev 61.43289Cp 2.17Cpk 1.18CCpk 2.17

OverallStDev 67.56258Pp 1.97Ppk 1.08Cpm *

Process Capability Sixpack of BeforeI Chart

Moving Range Chart

Last 25 Observations

Capability Histogram

Normal Prob PlotAD: 0.234, P: 0.775

Capability Plot

Bent pin AnalysisCp/Cpk study for “Bent pin ”:

CPK: 1.18

AM I CDCapability Analysis

19

Key Process Characteristics Identified During Measurement Phase Shows That Four Stations Need To Be Focus On…

AM I CDInitial Analysis


Temperature Test/Chamber

ICT Machine

Operator Touch Up

Routing Machine



Function Fixture

20

UMG Machine

ICT Machine

Routing

Chamber & 3-temp. Testing

Same Lot PCB Board Go Through Four Processes, Pin Position Data Were Taken To Analysis & Identify The Key

Process

AM I CDANOVA

21

Bent Pin Analysis – Independent and Normality Test

300250200150100500-50

99

9590

80706050403020

105

1

Measure UMG

Perc

ent

Mean 119.8StDev 66.91N 30AD 0.435P-Value 0.281

Probability Plot of Measure UMGNormal

p-values > 0.05, normal distribution!

30282624222018161412108642

250

200

150

100

50

0

Observation

Mea

sure

UM

G

Number of runs about median: 13Expected number of runs: 16.0Longest run about median: 8Approx P-Value for Clustering: 0.132Approx P-Value for Mixtures: 0.868

Number of runs up or down: 20Expected number of runs: 19.7Longest run up or down: 3Approx P-Value for Trends: 0.559Approx P-Value for Oscillation: 0.441

Run Chart of Measure UMG

30282624222018161412108642

300

200

100

0

-100

Observation

Mea

sure

ICT



Run Chart of Measure ICT

30282624222018161412108642

250

200

150

100

50

0

Observation

Mea

sure

Rou

ter



Run Chart of Measure Router

3002001000-100

99

9590

80706050403020

105

1

Measure ICT

Perc

ent

Mean 125StDev 66.76N 30AD 0.378P-Value 0.385

Probability Plot of Measure ICTNormal


250200150100500

99

9590

80706050403020

105

1

Measure Router

Perc

ent

Mean 116.5StDev 54.66N 30AD 0.405P-Value 0.332

Probability Plot of Measure RouterNormal


All 4 p-values > 0.05, data are independent!

AM I CDData Analysis

22

ANOVA For All Related Process

Data

Measure 3-tempMeasure ICTMeasure RouterMeasure UMG

300

200

100

0

-100

Boxplot of Measure UMG, Measure Router, Measure ICT, Measure 3-temp

Proc

ess

95% Bonferroni Confidence Intervals for StDevs

Measure Router

Measure ICT

Measure 3-temp

Measure UMG

10090807060504030

Bartlett's Test

0.394

Test Statistic 7.43P-Value 0.059

Levene's TestTest Statistic 1.00P-Value

Test for Equal Variances for Measure

Measure 3 –Temp caused the most difference (Mean Shift a lot as compared with the other 3 process). Equal Variance showed at the test.

AM I CD

23

Why the 3-temp test process contribute the most

Put unit into the trays

Put into cold chamber

Cold temperature function test

Put unit into the trays

Put into hot chamber

Room temperature function test

AOI test equipment

Input From Front Line

To packing station

?3 – Temp Test Steps Breakdown

AM I CDTemperature Inspection

24

MachineManpower


Material

Tilted Pin

Wrong Handling

High Temp Chamber +85 Degree C

Function Test FixtureLow Temp Chamber -40 Degree C

Operator Touch Up

Conveyor

Method


Process FlowTemperature PCB Hole Tilt

Pin Roller Defect

Fishbone Diagram


AM I CD

25

SOV

Chamber

Mea

sure

8540

-50

-100

-150

-200

-250

Fixture12

Multi-Vari Chart for Measure by Fixture - Chamber

Chamber 1-40 Degree C

1

Chamber

Fixture

Chamber 2+85 Degree C

2

1

2

Conduct Source Of Variation Studies (SOV)

AM I CD

26


Temperature Test/Chamber

ICT Machine

Operator Touch Up

Routing Machine



Screening

Chamber Temperature

Function Fixture

AM I CD

Function Fixture

Chamber

Mea

sure

8540

-50

-100

-150

-200

-250

Fixture12

Multi-Vari Chart for Measure by Fixture - Chamber

27

Fixture 1 Fixture 2 Comparison

Mfg Date Same Same

Maintenance Schedule

Same Same

Open Angle 85 degree 70 degree

Operation Force

16 Ib 20 Ib

Close Angle 6 degree 2 degree

Operator A B

Usage Rate Same Same

Couple of Factors

Are Different

Compared

Between Two

Fixtures!!!

AM I CDSetting Comparison

28

Objective of DOE

Condition I: -45 Degree C Condition II: 85 Degree C

Level 1 Level 2 Level 1 Level 2

Open Angle 85 degree 70 degree 85 degree 70 degree

Open Force 16 Ib 20 Ib 16 Ib 20 Ib

Close Angle 6 degree 2 degree 6 degree 2 degree

In order to minimize the pin bent possibility, plan to design an experiment to optimize all the factors…

AM I CD

29

DOE at -40 Degree C AM I CD

30

Step 1. View Data >> Data Is Normal ------ P Value > 0.05 >> No Outlier Point >> No Apparent Upward or Downward Trend

-60-80-100-120-140-160-180

Median

Mean

-100-110-120-130-140-150


Variance 1161.42Skewness 0.311887Kurtosis -0.532572N 18Minimum -179.91

A-Squared

1st Quartile -151.12Median -130.443rd Quartile -96.99Maximum -61.44

95% Confidence Interval for Mean-144.65

0.21

-110.7595% Confidence Interval for Median

-149.42 -104.8195% Confidence Interval for StDev

25.57 51.09

P-Value 0.825Mean -127.70StDev 34.08

95% Confidence Intervals

Summary for Measure -40

RunOrder

Mea

sure

-40

20151050

-50

-75

-100

-125

-150

-175

CenterPt01

Scatterplot of Measure -40 vs RunOrder

AM I CDDOE at -40 Degree C

31

Step 2 and 3. Create and Fit Model

Term

Standardized Effect

ABC

BC

AB

AC

B

C

A

121086420

2.23Factor NameA Open AngleB Close AngleC Operation Force

Pareto Chart of the Standardized Effects (-40 Degree)(response is Measure -40, Alpha = .05)

Factor Open Angle, Close Angle, Operation Force and interaction between Open Angle and Operation Force are signification a = 0.05


32

Standardized Effect

Perc

ent

151050-5-10

99

9590

80706050403020

105

1

Factor NameA Open AngleB Close AngleC Operation Force

Effect TypeNot SignificantSignificant

AC

C

B

A

Normal Probability Plot of the Standardized Effects(response is Measure -40, Alpha = .05)

Normal probability plot of effects also shows the same effects to be significant.


33

Open Angle

642 201816

-100

-150

-200

Close Angle

-100

-150

-200

Operation Force

Open

77.5 Center85.0 Corner

Angle Point Type70.0 Corner

Close

4 Center6 Corner

Angle Point Type2 Corner

Interaction Plot (data means) for Measure -40

Mea

n of

Mea

sure

-40

85.077.570.0

-100

-120

-140

-160642

201816

-100

-120

-140

-160

Open Angle Close Angle

Operation Force

Point TypeCornerCenter

Main Effects Plot (data means) for Measure -40

These plots are consistent with our previous conclusions about the effects.


34

ANOVA indicates that at least one main effect is significant at a = 0.05. It also indicates that curvature is NOT significant.


35

Estimated effects and coefficients indicate that Open Angle, Close Angle, Operation Force and interaction Open Angle*Operation Force are significant at a = 0.05. The results agreed with the earlier graphs R-Sq = 96.38% R-Sq(adj) = 93.85%


36

Step 4. Perform Residual Diagnostics

The residual vs fitted (predicted) value and residual vs run order plots do not show any patterns or trends, and do not indicate any violations of the assumptions. The normal probability plot indicates residuals are normally distributed

Residual

Perc

ent

20100-10-20

99

90

50

10

1

Fitted ValueRe

sidua

l-50-100-150-200

10

0

-10

Residual

Freq

uenc

y

151050-5-10-15

4.8

3.6

2.4

1.2

0.0

Observation Order

Resi

dual

18161412108642

10

0

-10

Normal Probability Plot of the Residuals Residuals Versus the Fitted Values

Histogram of the Residuals Residuals Versus the Order of the Data

Residual Plots for Measure -40


37

Open Angle

Resid

ual

868482807876747270

15

10

5

0

-5

-10

Residuals Versus Open Angle(response is Measure -40)

Close Angle

Resid

ual

65432

15

10

5

0

-5

-10

Residuals Versus Close Angle(response is Measure -40)

The residual vs each X do not show any pattern

Operation Force

Resid

ual

2019181716

15

10

5

0

-5

-10

Residuals Versus Operation Force(response is Measure -40)


38

Step 6. Remove non-significant terms / Refit reduced model

Remove the non-significant terms

ANOVA indicates at least one main effect and at least one two-factor interactions are significant at a = 0.05 Also, curvature is not significant.

Step 5. Check for possible transformations.


39

Term

Standardized Effect

AC

B

C

A

121086420

2.16Factor NameA Open AngleB Close AngleC Operation Force

Pareto Chart of the Standardized Effects(response is Measure -40, Alpha = .05)

P-values show that all effects in the model are significant. The value of R-Sq and R-Sq(adj) has decreased

Standardized Effect

Perc

ent

1050-5-10

99

9590

80706050403020

105

1

Factor NameA Open AngleB Close AngleC Operation Force

Effect TypeNot SignificantSignificant

AC

C

B

A

Normal Probability Plot of the Standardized Effects(response is Measure -40, Alpha = .05)

Reduced Model

Full Model

R Square 94.53% 96.38%

R Square-Adj 92.84% 93.85%


40

Residual Diagnostics

Residual

Perc

ent

20100-10-20

99

90

50

10

1

Fitted ValueRe

sidua

l

-50-100-150-200

20

10

0

-10

-20

Residual

Freq

uenc

y

20151050-5-10-15

4

3

2

1

0

Observation Order

Resid

ual

18161412108642

20

10

0

-10

-20

Normal Probability Plot of the Residuals Residuals Versus the Fitted Values

Histogram of the Residuals Residuals Versus the Order of the Data

Residual Plots for Measure -40

The residual vs fitted (predicted) value and residual vs run order plots do not show any patterns or trends, and do not indicate any violations of the assumptions. The normal probability plot indicates residuals are normally distributed


41

Open Angle

Resid

ual

868482807876747270

20

10

0

-10

-20

Residuals Versus Open Angle(response is Measure -40)

Close Angle

Resid

ual

65432

20

10

0

-10

-20

Residuals Versus Close Angle(response is Measure -40)

Operation Force

Resid

ual

2019181716

20

10

0

-10

-20

Residuals Versus Operation Force(response is Measure -40)

The residual vs each X do not show any pattern


42

Model is adequate, therefore we can use it for predicting future responses at specified settings of control factors.

Chosen Model for the Fixture in uncoded units is:

Y (Pin Position) = 597.769 – 6.96360(Open Angle) + 7.18076(Close Angle) - 60.4389(Operation Force) + 0.628457(Open Angle)*(Operation Force)

Step 7. Choose Improved Model


Pin Position Specification: 0 +/-0.4mm

43

Predict Pin Position at the following level of X’s Open Angle = 85 degree Close Angle = 6 degree Operation Force = 16 lb


44

Mea

n of

Mea

sure

-40

85.077.570.0

-100

-120

-140

-160642

201816

-100

-120

-140

-160

Open Angle Close Angle

Operation Force

Point TypeCornerCenter

Main Effects Plot (data means) for Measure -40

Open Angle

642 201816

-100

-150

-200

Close Angle

-100

-150

-200

Operation Force

Open

77.5 Center85.0 Corner

Angle Point Type70.0 Corner

Close

4 Center6 Corner

Angle Point Type2 Corner

Interaction Plot (data means) for Measure -40

Step 8. Interpret Chosen Model


45

6

ure -40

-120

4

-90

-60

Close Angle70 75 280 85Open Angle

Hold ValuesOperation Force 16

Surface Plot of Measure -40 vs Close Angle, Open Angle

Open Angle

Clos

e An

gle

-70-80

-90

-100

-110

-120

-130

8482807876747270

6

5

4

3

2

Hold ValuesOperation Force 16

Contour Plot of Measure -40 vs Close Angle, Open Angle

Contour plot shows at what different settings of X’s can

achieve the target Y. It also shows that the direction of meeting Y

requirement. (0+/-0.4mm)


Look For Maximum46

Step 9. Implement New Process/Make Confirmation Runs

Plan to run 10pcs confirmation runs Predict response y=-63.7694 at the optimum settings above Compute the appropriate confidence interval of prediction based on the number of confirmation test run. Conduct 10 confirmation runs. Calculated average of the confirmation runs falls within the calculated confidence interval. (Average 10 confirmation run = - 59.95)


47

Optimized Setting

Key parameters Current Range

Optimized Range

Open Force 16 Ib~20 Ib 16 Ib

Close Angle 2~6 6

Open Angle 70~85 85

AM I CD

48

Pilot Run Result

Sample

Sam

ple

Mea

n

121110987654321

0

-50

-100

-150

-200

-250

-300

__X=-64.9

UCL=7.3

LCL=-137.0

Before AfterXbar Chart of Data by Status

Tests performed with unequal sample sizes

3602401200-120-240-360

LSL USL

LSL -400Target *USL 400Sample Mean -178.719Sample N 260StDev(Within) 65.2126StDev(Overall) 66.2567

Process Data

Cp 2.04CPL 1.13CPU 2.96Cpk 1.13

Pp 2.01PPL 1.11PPU 2.91Ppk 1.11Cpm *

Overall Capability

Potential (Within) Capability

PPM < LSL 0.00PPM > USL 0.00PPM Total 0.00

Observed PerformancePPM < LSL 345.38PPM > USL 0.00PPM Total 345.38

Exp. Within PerformancePPM < LSL 419.27PPM > USL 0.00PPM Total 419.27

Exp. Overall Performance

WithinOverall

Process Capability of X_ j2-17

3752501250-125-250-375

LSL USLProcess Data

Sample?N 29StDev(Within) 47.18711StDev(Overall) 49.35170

LSL -400.00000Target *USL 400.00000Sample Mean -64.88374

Potential (Within) Capability

CCpk 2.83Overall Capability

Pp 2.70PPL 2.26PPU 3.14Ppk

Cp

2.26Cpm *

2.83CPL 2.37CPU 3.28Cpk 2.37

Observed PerformancePPM?<?LSL 0.00PPM?>?USL 0.00PPM?Total 0.00

Exp. Within PerformancePPM?<?LSL 0.00PPM?>?USL 0.00PPM?Total 0.00

Exp. Overall PerformancePPM?<?LSL 0.00PPM?>?USL 0.00PPM?Total 0.00

WithinOverall

Process Capability of After

CPK: 1.18 CPK 2.37

One month pilot run result shows before and after resolution implemented Pin bent position really improved !

AM I CD

49

Pilot run for FTY% trackingAfter improvement on the first time yield%, we got this trend chart:

Pilot Run Result


75.00%

80.00%

85.00%

90.00%

95.00%

100.00%

18-J

un-0

8

19-J

un-0

8

20-J

un-0

8

21-J

un-0

8

22-J

un-0

8

23-J

un-0

8

24-J

un-0

8

25-J

un-0

8

26-J

un-0

8

27-J

un-0

8

28-J

un-0

8

%

FTY% is higher than 96%, and the average FTY value is 97%

达成目标


75.00%

80.00%

85.00%

90.00%

95.00%

100.00%

28-O

ct-0

7

29-O

ct-0

7

30-O

ct-0

7

31-O

ct-0

7

1-N

ov-0

7

2-N

ov-0

7

3-N

ov-0

7

4-N

ov-0

7

5-N

ov-0

7

6-N

ov-0

7

7-N

ov-0

7

8-N

ov-0

7

9-N

ov-0

7

10-N

ov-0

7

%

97%

May’08Yiel

d Pe

rfor

man

ce

86%

Nov’07

AM I CD

50

Add NP chart for test defect counts control in test bay eSPC function: Subgroup size =30 upper limit =3

Add NP chart in Control plan

AM I CDControl Plan Update

51

Standardization and Documentation

Replication OpportunityReplication Standardization

Solution Focus Pilot Site Company-wide Similar process

TIPM Product Line TIPM Product Line Continental/Tianjin SMT Line

Continental/Tianjin and other Continental Electrical SMT Line

SMT Line and other product line using

UMG Pin Mounting Process

AM I CD

52

Updated the product handle procedure based on the corrective action and train related operator and release the WI into system9000:

AM I CDLesson Learned and Training

53

example-bb electronic

Documents