efficient analysis of substrate integrated waveguide

12
1 Efficient analysis of substrate integrated waveguide devices using hybrid mode matching between cylindrical and guided modes Elena D´ ıaz Caballero, Graduate Student Member, IEEE, ector Esteban, Member, IEEE, ´ Angel Belenguer, Member, IEEE, and Vicente E. Boria, Senior Member, IEEE Abstract—A new method is presented in this paper to efficiently analyze substrate integrated waveguide (SIW) based devices with multiple accessing ports. The problem is considered as a 2-D electromagnetic problem assuming no field variation normal to the dielectric substrate. The incident and scattered fields from each circular cylinder are expanded with cylindrical modes, and the fields in the waveguide ports are expanded using progressive and regres- sive modal summations. The addition theorems of Bessel and Hankel functions are used to analyze the full-wave behavior of the SIW device. In order to extract the circuital parameters, the hybrid mode-matching between guided and cylindrical modes is done by projecting continuity equations in a circular boundary containing the whole SIW structure over the inner modes of each region. Applying this new technique, it is possible to analyze multiple port devices by solving a set of integrals that can be easily approached analytically or by using the inverse fast Fourier transform, avoiding the use of non efficient numerical methods. It is shown that the new method runs faster than commercial software packages and other techniques recently published. Index Terms—EM analysis, mode matching, modal anal- ysis, substrate integrated waveguides, microwave filters. I. INTRODUCTION T HE interest on the substrate integrated waveguide (SIW) is constantly increasing. In such a circuit, the vertical walls of a traditional waveguide are emulated by two rows of metallic posts embedded in a dielectric substrate, which is covered with conducting sheets on the top and bottom sides. This low cost realization of the traditional waveguide circuit inherits the merits from both the microstrip for easy integration and the waveguide for low radiation loss. Furthermore, it is possible to use this new technology for making many devices, such as antennas, filters and multiplexers [1]–[3], and to integrate many substrate integrated waveguide circuits into a single- board subsystem. E. Diaz, H. Esteban and V. E. Boria are with the Departamento de Comunicaciones, Universidad Polit´ ecnica de Valencia, 46022 Va- lencia, Spain (e-mail: [email protected]; [email protected]; [email protected]). A. Belenguer is with the Departamento de Ingenier´ ıa El´ ectrica, Electr´ onica, Autom´ atica y Comunicaciones, Escuela Universitaria Polit´ ecnica de Cuenca, Universidad de Castilla-La Mancha, Campus Universitario, 16071 Cuenca, Spain (e-mail: [email protected]). The design equations for the radius and separation of the post walls so that the field leakage is minimum can be found in [4]–[6]. However, to study a general substrate integrated waveguide circuit, a fullwave analysis is required. For these reasons, the efficient analysis of SIW devices becomes a new challenge that is the object of intense research in the last few years. Some of the recent contribution for the analysis of SIW circuits is based on the Boundary Integral - Resonant Mode Expansion (BI-RME) method [7]–[10], and vari- ous numerical techniques such as finite element method (FEM), finite difference time domain (FDTD), finite- difference frequency-domain (FDFD), transmission line method (TLM), and 2D multiport method have been developed to analyze the structure under consideration [11]–[14]. Other recent contributions to this field are hybrid techniques based on mode-matching and the method of moments [15] that can be used to analyze any device that is fed through canonical waveguides. In general, those hybrid techniques are formulated by applying the equivalence theorem [16], so that the ports are replaced by a pair of unknown electric and magnetic current densities. A hybrid proposal that uses this pair of currents to achieve the equivalence [17], [18] has been successfully applied to the analysis of several SIW [6], [19], [20] devices. In [17] and also in the novel hybrid formulation re- cently proposed in [21], the metalized holes compris- ing the substrate integrated waveguide are character- ized by means of cylindrical emergent spectra, implying an important computational advantage. But in [21] the port characterization is based just on a single electric current density, unlike the common strategy based on two equivalent sources, a pair of magnetic and electric current densities. This helps to reduce the computational cost, since the evaluation of the scattering parameters is much simpler, and makes possible the development of a fast sweep scheme in [22] by means of an asymptotic waveform evaluation (AWE) and the technique known as complex frequency hopping (CFH). The aim of this work is to present a new analysis This is the author's version of an article that has been published in this journal. Changes were made to this version by the publisher prior to publication. The final version of record is available at http://dx.doi.org/10.1109/TMTT.2011.2178424 Copyright (c) 2016 IEEE. Personal use is permitted. For any other purposes, permission must be obtained from the IEEE by emailing [email protected].

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Page 1: Efficient analysis of substrate integrated waveguide

1

Efficient analysis of substrate integratedwaveguide devices using hybrid mode matching

between cylindrical and guided modesElena Dıaz Caballero, Graduate Student Member, IEEE, Hector Esteban, Member, IEEE, Angel

Belenguer, Member, IEEE, and Vicente E. Boria, Senior Member, IEEE

Abstract—A new method is presented in this paper toefficiently analyze substrate integrated waveguide (SIW)based devices with multiple accessing ports. The problemis considered as a 2-D electromagnetic problem assumingno field variation normal to the dielectric substrate. Theincident and scattered fields from each circular cylinderare expanded with cylindrical modes, and the fields in thewaveguide ports are expanded using progressive and regres-sive modal summations. The addition theorems of Besseland Hankel functions are used to analyze the full-wavebehavior of the SIW device. In order to extract the circuitalparameters, the hybrid mode-matching between guided andcylindrical modes is done by projecting continuity equationsin a circular boundary containing the whole SIW structureover the inner modes of each region. Applying this newtechnique, it is possible to analyze multiple port devicesby solving a set of integrals that can be easily approachedanalytically or by using the inverse fast Fourier transform,avoiding the use of non efficient numerical methods. It isshown that the new method runs faster than commercialsoftware packages and other techniques recently published.

Index Terms—EM analysis, mode matching, modal anal-ysis, substrate integrated waveguides, microwave filters.

I. INTRODUCTION

THE interest on the substrate integrated waveguide(SIW) is constantly increasing. In such a circuit,

the vertical walls of a traditional waveguide are emulatedby two rows of metallic posts embedded in a dielectricsubstrate, which is covered with conducting sheets onthe top and bottom sides. This low cost realization ofthe traditional waveguide circuit inherits the merits fromboth the microstrip for easy integration and the waveguidefor low radiation loss. Furthermore, it is possible to usethis new technology for making many devices, such asantennas, filters and multiplexers [1]–[3], and to integratemany substrate integrated waveguide circuits into a single-board subsystem.

E. Diaz, H. Esteban and V. E. Boria are with the Departamentode Comunicaciones, Universidad Politecnica de Valencia, 46022 Va-lencia, Spain (e-mail: [email protected]; [email protected];[email protected]).

A. Belenguer is with the Departamento de Ingenierıa Electrica,Electronica, Automatica y Comunicaciones, Escuela UniversitariaPolitecnica de Cuenca, Universidad de Castilla-La Mancha, CampusUniversitario, 16071 Cuenca, Spain (e-mail: [email protected]).

The design equations for the radius and separationof the post walls so that the field leakage is minimumcan be found in [4]–[6]. However, to study a generalsubstrate integrated waveguide circuit, a fullwave analysisis required. For these reasons, the efficient analysis ofSIW devices becomes a new challenge that is the objectof intense research in the last few years.

Some of the recent contribution for the analysis of SIWcircuits is based on the Boundary Integral - ResonantMode Expansion (BI-RME) method [7]–[10], and vari-ous numerical techniques such as finite element method(FEM), finite difference time domain (FDTD), finite-difference frequency-domain (FDFD), transmission linemethod (TLM), and 2D multiport method have beendeveloped to analyze the structure under consideration[11]–[14].

Other recent contributions to this field are hybridtechniques based on mode-matching and the method ofmoments [15] that can be used to analyze any devicethat is fed through canonical waveguides. In general,those hybrid techniques are formulated by applying theequivalence theorem [16], so that the ports are replaced bya pair of unknown electric and magnetic current densities.A hybrid proposal that uses this pair of currents to achievethe equivalence [17], [18] has been successfully appliedto the analysis of several SIW [6], [19], [20] devices.

In [17] and also in the novel hybrid formulation re-cently proposed in [21], the metalized holes compris-ing the substrate integrated waveguide are character-ized by means of cylindrical emergent spectra, implyingan important computational advantage. But in [21] theport characterization is based just on a single electriccurrent density, unlike the common strategy based ontwo equivalent sources, a pair of magnetic and electriccurrent densities. This helps to reduce the computationalcost, since the evaluation of the scattering parameters ismuch simpler, and makes possible the development of afast sweep scheme in [22] by means of an asymptoticwaveform evaluation (AWE) and the technique known ascomplex frequency hopping (CFH).

The aim of this work is to present a new analysis

This is the author's version of an article that has been published in this journal. Changes were made to this version by the publisher prior to publication.The final version of record is available at http://dx.doi.org/10.1109/TMTT.2011.2178424

Copyright (c) 2016 IEEE. Personal use is permitted. For any other purposes, permission must be obtained from the IEEE by emailing [email protected].

Page 2: Efficient analysis of substrate integrated waveguide

2

technique in order to efficiently analyze different kindsof SIW devices with multiple accessing ports.

To achieve this objective, the multiple 2-D scatteringanalysis method described in [23], a method oriented to-ward waveguide devices that solves the matching betweencylindrical and guided waves, is going to be adaptedto efficiently analyze the substrate integrated waveguidedevices. This method makes use of the concept of transferfunction or characterization matrix of a scattering object.This matrix totally characterizes its electromagnetic be-havior in the view of any incidence.

Similarly to [23], we will solve the electromagneticcoupling among all the scatterers by means of scatteredcylindrical modes and spectrum translations, instead ofusing MoM as in [21], [22]. This procedure differenceallows for an analytical resolution of the coupling, thusresulting in a method more efficient than [22], as theresults section shows.

In [24] a new mode matching procedure was presentedto characterize single or multiple posts inside a rectan-gular waveguide. This method overcomes the limitationsfound in [23] when the accessing ports are close to thescattering objects, but still it considers just two accesses.The circular posts were analytically characterized usingcylindrical waves, and the mode matching was efficientlysolved using the fast Fourier transform.

In this work, an extension of that method will allowto analyze a SIW device with multiple ports. Firstly,the whole SIW device is enclosed in a circumference assmall as possible, which is not completely surroundedwith accessing ports, contrary to what happened in [24].That circular region is completely characterized through aglobal transfer function. Afterwards the continuity equa-tions of electric and magnetic fields particularized in thecircular boundary are projected over the cylindrical andguided modes, similarly to what is described in [24].However, in order to solve this mode matching and toobtain the generalized scattering matrix, some of theintegrals involved have had to be reformulated due to themultiple port configuration. All the integrals can still besolved analytically or by using the fast Fourier transform,thus making the new formulation highly efficient.

Finally, the results obtained in the analysis of severalfilters and structures are compared with different methodsand commercial software, and also with experimentalmeasurements.

II. PROBLEM FORMULATIONA. Layout of the problem

The layout of the problem, including the guided ex-citation accesses, the SIW device and the outer region,is presented in Fig. 1, where the three main regions aredefined.

Region A includes all the guided ports accessing to theSIW device. In this region the fields will be expanded

Region A

Region C

Region B

Fig. 1: Layout of a general SIW problem

as summations of the progressive and regressive guidedmodes. Region B is a circular region containing thewhole SIW device. In this inner region, the fields willbe expressed as summations of incident and scatteredcylindrical open space modes. Finally, region C is theouter region, in which the fields should be zero since theleakage form the post walls is very weak. The analysis ofeach region and the mode matching is presented below.

B. Scattering objects

Region B, containing the SIW device, can be seen asa multiple scattering problem with N scattering objects.Every single object receives incident fields from theexternal excitation but also scattered fields coming fromthe other N-1 objects. It will be necessary to solve theelectromagnetic coupling among scatterers. This multiplescattering problem can be schematized as shown in Fig. 2.

k N

21E(1)in

E(2)in

E(N)in

T (k,0) · EI

T (k,1)D(1) E(1)in

T (k,N)D(N) E(N)in

T (k,2)D(2) E(2)in

Fig. 2: Multiple scattering scheme with incident fields toobject k

Since the geometry of the scattering objects is invariantin z, and so are the exciting fields, the scattered fields are

This is the author's version of an article that has been published in this journal. Changes were made to this version by the publisher prior to publication.The final version of record is available at http://dx.doi.org/10.1109/TMTT.2011.2178424

Copyright (c) 2016 IEEE. Personal use is permitted. For any other purposes, permission must be obtained from the IEEE by emailing [email protected].

Page 3: Efficient analysis of substrate integrated waveguide

3

also invariant in z and the structure can be reduced to a 2-D problem, where a cylindrical coordinate system will beused. For each scattering object, the field is expanded assummations of incident and scattered cylindrical modesas follows

~E(k)i =

N(k)i∑

p=−N(k)i

i(k)p Jp(kρ(k)) ejpφ

(k)

z (1)

~E(k)d =

N(k)d∑

q=−N(k)d

c(k)q H(2)q (kρ(k)) ejqφ

(k)

z (2)

where i(k)p and c

(k)q are the incident and scattered field

spectra in open space to object k, Jp(kρ(k)) ejpφ

(k)

and H(2)q (kρ(k)) ejqφ

(k)

are the p-th incident and q-thscattered cylindrical modes, and N

(k)i and N

(k)d are the

truncation indexes for the summations of incident andscattered cylindrical modes. Both numbers must be highenough to ensure a good accuracy of the results [16],[25], [26]. In this work, considering the general caseof K = ω

√µε, where ε = ε′(1 − j tan δ) and tan δ

represents the loss tangent in the dielectric substrate, thefollowing expression has been used

N(k)i = max

{3, ceil

(PNi(k) · <(K)r(k)

)}(3)

N(k)d = max

{3, ceil

(PNd(k) · <(K)r(k)

)}(4)

where <(K) is the real part of the wavenumber, K, r(k)

is the radius of object k and PNi(k) and PNd(k) arevalues high enough to guarantee good accuracy insidethe validity region of the modal expansion, though it isadvisable not to over estimate those truncation indexes asit leads to an unnecessary increase in the computationalcost of the analysis method. With these equations, weensure that N (k)

i and N (k)d are at least 3, in order to avoid

a excessively low number of modes if object k has a verysmall radius. In (1) and (2), ρ(k) and φ(k) are the polarcoordinates in the coordinate system local to object k(see Fig. 3). It is convenient to place the local coordinatesystem of the object k so that the larger distance fromit to any point of the object, r(k), is minimum. As thetypical scatterer will be a cylindrical object, r(k) = a(k)

where a(k) is the radius of the cylinder. A convergencestudy will be presented in Section II-F.

In region B, the field spectrum scattered by each objectcan be related to its incident field spectrum by means ofthe scattering matrix D(k), which provides the full wavecharacterization of that scattering object k [25] as follows

c(k)q =

N(k)i∑

p=−N(k)i

i(k)p d(k)qp (5)

O(0,0)

C(k)

C(r,f)

(k)r

f

r(k)f

Fig. 3: Coordinate system local to object k and globalcoordinate system

In matrix form

ED(k) = D(k) · EI(i) (6)

where ED(k) and EI(i) are, respectively, scattered andincident field spectra for object k.

In this work, we have considered different types ofscattering objects, whose scattering matrices [16] [27]have been adapted from the vacuum assumption to thethe case in which the objects are immersed in a dielectricsubstrate. Their scattering matrices are presented below.

When the scattering object k is a circular post, eachincident cylindrical mode excites only the scattered cylin-drical mode of the same order, so truncation indexesN

(k)i and N

(k)d in (3) and (4) must be the same. Thus

the scattering matrix that relates incident and scatteredcylindrical spectra is a diagonal matrix [16], and

d(k)qp = 0, ∀q 6= n (7)

c(k)q =

N(k)i∑

p=−N(k)i

d(k)qp i(k)p = d

(k)qq i

(k)q (8)

The most common scattering object presented in a SIWdevice is the metallic cylinder, whose scattering matrixelements can be easily obtained analytically [16],

d(k)qq = − Jq(Ka(k))

H(2)q (Ka(k))

(9)

where a(k) is the radius of cylinder k and K = ωc0

√µrεr

is the substrate wavenumber, being εr = ε′

r − jε′′

r =ε′

r(1 − j tan δ) and µr the relative permittivity and per-meability of the dielectric substrate. The dielectric andthe multilayer cylinder have been also considered.

The scattering matrix of a dielectric post,

d(k)qq =

∣∣∣∣∣∣Jq(Ka

(k)) Jq(Kca(k))

J ′q(Ka(k)) J ′q(Kca

(k))

√ε(k)rc /εr

µ(k)rc /µr

∣∣∣∣∣∣∣∣∣∣∣ −H(2)q (Ka(k)) Jq(Kca

(k))

−H′(2)q (Ka(k)) J ′q(Kca

(k))√

εrc/εrµrc/µr

∣∣∣∣∣(10)

This is the author's version of an article that has been published in this journal. Changes were made to this version by the publisher prior to publication.The final version of record is available at http://dx.doi.org/10.1109/TMTT.2011.2178424

Copyright (c) 2016 IEEE. Personal use is permitted. For any other purposes, permission must be obtained from the IEEE by emailing [email protected].

Page 4: Efficient analysis of substrate integrated waveguide

4

will be useful not only to characterize a real dielectricpost, but also for a metallic post with losses, where therelative permittivity of the post with finite conductivity is

εrc = −jσ

ε0ω

σ is the finite conductivity of the metal and Kc =ωc0

√εrc√µrc is the wavenumber inside the cylinder.

In the case of a multilayer cylinder, the iterative methodto solve its scattering matrix is introduced in [27], thoughthe last layer, generally assumed to be vacuum, will havehere εr > 1 because of the dielectric substrate.

C. Electromagnetic coupling among scatterers

In order to solve the electromagnetic coupling, thegeneral method introduced in [25] is adapted to efficientlysolve the particular situation faced in a SIW structure.This method will allow us to forget about the geometry ofeach scattering object once its scattering matrix is known.

As shown in Fig. 2, matrix T (k,i) is a spectrum transla-tion matrix from cylindrical spectrum emergent from C(i)

to cylindrical spectrum incident to C(k), whose elementsare

T (k,i)pq = H

(2)p−q(Kd

(k,i)) e−j(p−q)φ(i,k)

(11)

where

d(k,i)

=√

(xC(i) − xC(k) )2 + (y

C(i) − yC(k) )2 (12)

tanφ(k,i)

=yC(i) − yC(k)

xC(i) − xC(k)

(13)

and T (k,0) is the translation matrix from external spec-trum incident to O, where O is the global coordinateorigin (see Fig. 5), to cylindrical spectrum incident toC(k), whose elements are

T (k,0)rp = Jr−p(Kd

(k,0)) e−j(r−p)φ(k,0)

(14)

The final equation system for the field incident to objectk can be written as follows (see Fig. 2)

E(k)in = T (k,0) · EI +

N∑i=1,i 6=k

T (k,i) ·D(i) · E(i)in

N∑k=1

A(k,i) · E(i)in = T (k,0) · EI k = 1, . . . , N (15)

A(k,i) =

{I si k = i

−T (k,i) ·D(i) si k 6= i(16)

where I is an (2N(k)i +1)×(2N (k)

i +1) identity matrix andEI is the incident external field spectrum characterizedwith 2Ni + 1 cylindrical modes, where

Ni = ceil(PNi · <K ·R) (17)

and R is the radius of the circular boundary (see Fig. 5).

Finally, the matrix system to be solved for the electro-magnetic coupling among N scattering objects is

E = A(−1) ·B · EI (18)

where

E = [E(1)in , ... E

(N)in ]T B = [T (1,0), ... T (N,0)]T (19)

It will be useful to define the coupled scattering matrixof the object k, D

′(k), as the one that completely charac-terizes object k taking into account the coupling with allthe other objects. In order to do so, the external excitationmatrix EI in (18) is supposed to be an identity matrix,having

E′= A(−1) ·B

where E′

contains N submatrices E′(k). Each submatrix

stores the total incident field to object k for each externalincident mode. The product of E

′(k) and D(k) results inthe wanted D

′(k)

D′(k) = D(k) · E

′(k)

In Fig. 4 the amplitude of the total electric fieldobtained in this way is represented for a four cavitySIW filter with an incident plane wave, whose cylindricalspectrum is [16]

in = (jejβ0)−n

where φ = β0 is the propagation direction, here taken asβ0 = 0rad.

Fig. 4: Electric field amplitude with an 11GHz incidentplane wave propagating parallel to the x axis

D. Global Scattering Matrix

Before obtaining a circuital matrix that characterizesthe SIW device, a global scattering matrix is needed. Inorder to do so, the whole SIW structure must be containedin a circumference as small as possible. This is to obtainthe Dglobal scattering matrix of the whole SIW part ofthe problem, relating the scattered field spectrum to theincident one.

The global scattering matrix comes from adding all thecontributions of the scattered fields of every single post,but centered in the center of the circumference containingall of them (see Fig. 5), which will be also the center

This is the author's version of an article that has been published in this journal. Changes were made to this version by the publisher prior to publication.The final version of record is available at http://dx.doi.org/10.1109/TMTT.2011.2178424

Copyright (c) 2016 IEEE. Personal use is permitted. For any other purposes, permission must be obtained from the IEEE by emailing [email protected].

Page 5: Efficient analysis of substrate integrated waveguide

5

of the global coordinate system. It can be calculated asfollows,

Dglobal =

N∑k=1

T (0,k)D′(k) N ≡ number of posts

(20)

where D′(k) is the coupled scattering matrix of the k-

object and T (0,k) is the translation matrix from C(k) toO

T (0,k)rp = Jr−p(Kd

(0,k)) e−j(r−p)φ(0,k)

(21)

a x1

z1y1

x2

z2 y2

Region A

Region C

Region B

y

x

ρ

φ

R

Fig. 5: General layout of the SIW problem with coordi-nate systems of regions A and B

This matrix will not be a diagonal one, but it isconvenient to make it square by filling it with zeros.Although Dglobal has all the information concerningthe electromagnetic behavior of the SIW structure, it isnecessary to express that information in terms of circuitparameters in order to link it to other blocks using simplecircuit theory.

E. Generalized Scattering Matrix. Mode Matching

Now, in order to obtain the circuital parameters of theSIW device, a mode matching between guided modes ofRegion A and cylindrical modes of Region B must bedone. This can be achieved by enforcing continuity oftangential components of electric and magnetic fields inthe circumference of radius R containing Region B. Thisleads to the Generalized Scattering Matrix (GSM).

In region B, the field can be expanded as summationsof incident and scattered cylindrical modes,

~E = ~Ein

(ρ, φ) + ~Ed(ρ, φ) (22)

~Ein

(ρ, φ) ≈Ni∑

p=−Ni

ip Jp(kρ) ejpφ

z (23)

~Ed(ρ, φ) ≈

Ni∑p=−Ni

Nd∑n=−Nd

dnp ip H(2)n (kρ) e

jnφz (24)

where Ni (17) and Nd are the truncation indexes for thesummations,

Nd = ceil(PNd ·K ·R) (25)

(where, according to [16], PNd ≥ 1) and dnp are theelements of the Dglobal matrix.

In region A, the tangential fields are expanded as sum-mations of the progressive and regressive guided modesof the canonical equivalent waveguide, whose width, aeq ,can be calculated as [28]

aeqw

= ξ1 +ξ2

s

d+ξ1 + ξ2 − ξ3ξ3 − ξ1

(26)

ξ1 = 1.0198 +0.3465

w

s− 1.0684

ξ2 = −0.1183− 1.2729w

s− 1.2010

ξ3 = 1.0082− 0.9163w

s+ 0.2152

where w is the distance between the two rows of metallicvias comprising the SIW walls, s is repetition period orseparation between the center of consecutive vias, and dis their diameter.

The expressions for the fields are [21], [25]

~E(i)t (ρ, φ) =

Mi∑m=1

(a(i)m e

−γ(i)m zi + b(i)m e

γ(i)m zi )~e

(i)′′m (xi) (27)

~H(i)t (ρ, φ) =

Mi∑m=1

(a(i)m e

−γ(i)m zi − b(i)m eγ(i)m zi )Y

(i)0m~h

(i)′′m (xi)(28)

γ(i)m =

√√√√(mπa(i)eq

)2

− k2 (29)

Y(i)m0 =

1

Z(i)m0

=γ(i)m

jωµ=γ(i)m

jkη(30)

where a(i)m y b(i)m are the amplitudes of the progressiveand regressive TEm0 guided modes at access i, Mi is thenumber of modes in that access, and i = 1, ..., L, beingL the total number of accessing ports,

~e(i)′′m (xi) =

−z

√√√√ 2Z(i)0m

a(i)eq h

sin

(mπ

a(i)eq

xi

)φ ∈ [φ(i)

m , φ(i)M ]

0 other

(31)

~h(i)′′m (xi) =

xi

√√√√ 2Z(i)0m

a(i)eq h

sin

(mπ

a(i)eq

xi

)φ ∈ [φ(i)

m , φ(i)M ]

0 other

(32)

with h being the substrate height, and φ(i)m and φ

(i)M are

the φ coordinates in the global coordinate system of theport i edges (see Fig. 6).

This is the author's version of an article that has been published in this journal. Changes were made to this version by the publisher prior to publication.The final version of record is available at http://dx.doi.org/10.1109/TMTT.2011.2178424

Copyright (c) 2016 IEEE. Personal use is permitted. For any other purposes, permission must be obtained from the IEEE by emailing [email protected].

Page 6: Efficient analysis of substrate integrated waveguide

6

Fig. 6: Local to port i and global coordinate systems

In a more compact way, and considering ρ = R, (27)and (28) can be written in terms of global cylindricalcoordinate system as

~Et(φ) =

M∑m=1

(am e

+m(φ) + bm e

−m(φ)

)gm (φ) (−z) (33)

~Ht(φ) =

M∑m=1

(am e

+m(φ)− bm e−m(φ)

)Y0m gm (φ) xi (34)

defining vectors a, b and Y0, each of them with M =∑Li=1Mi elements,

a =

a(1)

a(2)

...a(L)

b =

b(1)

b(2)

...b(L)

Y0 =

Y

(1)0

Y(2)0

...Y

(L)0

(35)

where

a(i) =[a(i)1 , ..., a

(i)Mi

]T, i ∈ [1, ..., L] (36)

b(i) =[b(i)1 , ..., b

(i)Mi

]T, i ∈ [1, ..., L] (37)

Y(i)0 =

[Y

(i)01 , ..., Y

(i)0Mi

]T, i ∈ [1, ..., L] (38)

and defining also the vectors in (39) and (40), whereφ(i)0 is the coordinate φ just in the angular center of accessi (see Fig. 6)

φ(i)0 =

φ(i)m + φ

(i)M

2

and φ(i)d is the angular width of that access (φ(i)d = φ(i)M −

φ(i)m ).Since the post walls are designed to emulate the vertical

walls of the traditional waveguide circuit using the designrules in [4] and [6], the field leakage from the post wallsis very weak, and thus the field in region C can beneglected. Note that if a little leakage occurred, it would

be still in region B and would be vanished by the time itarrives to the border with region C.

Next, continuity of tangential components is goingto be enforced. Eqs. (33) and (34) of region A arealready particularized in the circumference of radius R.In region B, the transversal electric field particularized inthe circular boundary is

~Ei(ρ = R) + ~Ed(ρ = R) =Ni∑

n=−Ni

(Jn(KR)ejnφ +

Nd∑q=−Nd

dqnH(2)q (KR)ejqφ)inz

(41)

Enforcing tangential field continuity in the circumfer-ence of radius R, electric fields in (33) and (41) must beequal in ρ = R.

~Ei(ρ = R,φ) + ~Ed(ρ = R,φ) = ~Et(ρ = R,φ) (42)

Using Maxwell’s curl equation, ~H = − 1

jωµ∇× ~E, we

can also obtain the total magnetic field in the inner region

~H(ρ = R) =

Ni∑n=−Ni

[−1

η

n

KR(Jn(KR)e

jnφ+

+

Nd∑q=−Nd

q dqnH(2)q (KR)ejqφ)ρ− 1

η(J′n(KR)e

jnφ+

+

Nd∑q=−Nd

dqnH(2)′q (KR)ejqφ)φ]in

(43)

where η is the intrinsic impedance of the substrate (η =120π/

√εr). The continuity equation of magnetic field

along t = xi results as follows

[ ~Hin(ρ = R,φ) + ~Hsc(ρ = R,φ)] · t =N∑i=1

[~H

(i)t (ρ = R,φ) · t+ ~H(i)

zi (ρ = R,φ) · t]=

N∑i=1

~H(i)t (ρ = R,φ) · xi

(44)

where

[ ~Hint (R,φ)+ ~Hsc

t (R,φ)]·t =Ni∑

n=−Ni

[−1

η

n

KR(Jn(KR)e

jnφ+

+

Nd∑q=−Nd

q dqnH(2)q (KR)ejqφ)(ρ · t)− 1

η(J′n(KR)e

jnφ+

+

Nd∑q=−Nd

dqnH(2)′q (KR)ejqφ)(φ · t)]in (45)

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7

e±m(φ) =

e∓γ(1)m z1(R,φ) ·

∏(φ−φ(1)0

φ(1)d

)si m ∈ [1, ...,M1]

e∓γ(2)

m−M1z2(R,φ) ·

∏(φ−φ(2)0

φ(2)d

)si m ∈ [M1 + 1, ...,M1 +M2]

...

e∓γ(N)

m−∑L−1j=1

Mj

zN (R,φ)

·∏(φ−φ(N)

0

φ(N)d

)si m ∈

[N−1∑j=1

Mj + 1, ...,M

]0 other

(39)

gm(φ) =

h(1)′′m (x1(R,φ)) ·

∏(φ−φ(1)0

φ(1)d

)si m ∈ [1, ...,M1]

h(2)′′

m−M1(x2(R,φ)) ·

∏(φ−φ(2)0

φ(2)d

)si m ∈ [M1 + 1, ...,M1 +M2]

...

h(N)′′

m−∑N−1j=1 Mj

(xN (R,φ)) ·∏(φ−φ(N)

0

φ(N)d

)si m ∈

[L−1∑j=1

Mj + 1, ...,M

]0 other

(40)

and

t = xi = sinφ(i)x− cosφ(i)y (46)ρ = cosφ x+ sinφ y (47)φ = − sinφx+ cosφy (48)

ρ · xi = A(i) cosφ+B(i) sinφ (49)φ · xi = B(i) cosφ−A(i) sinφ (50)

A =

sinφ(1)

sinφ(2)

...sinφ(L)

(51)

B =

− cosφ(1)

− cosφ(2)

...− cosφ(L)

(52)

A(i) and B(i) are, respectively, the components in x andy of vector xi in each of the L accesses. However, Amnand Bmn will be used instead

Amn =

sinφ(1) m ∈ [1, ...,M1] n ∈ [−Ni, Ni]sinφ(2) m ∈ [M1 + 1, ...,M1 +M2] n ∈ [−Ni, Ni]

...sinφ(L) m ∈ [

∑L−1i=1 Mi + 1, ...,M ] n ∈ [−Ni, Ni]

(53)

Bmn =

− cosφ(1) m ∈ [1, ...,M1] n ∈ [−Ni, Ni]− cosφ(2) m ∈ [M1 + 1, ...,M1 +M2] n ∈ [−Ni, Ni]

...− cosφ(L) m ∈ [

∑L−1i=1 Mi + 1, ...,M ] n ∈ [−Ni, Ni]

(54)

where φ(i) is the angle that the excitation line accessing toport-i forms with axis X in the global coordinate system,that is (x, zi) (see Fig. 6).

Instead of using discrete mode matching, and due tothe circular boundary, in this work the mode matchingis solved by projecting the equations resulting fromenforcing field continuity to the modes of A and B. Thisprovides with a set of equations, and after selecting theproper ones, a matrix system is obtained whose solutionis the GSM of the structure. If the right set of equationsis chosen [24], the matrix system will be really wellconditioned and achieve a good accuracy in the results.Moreover, the integrals that must be solved to obtain theelements of the matrices involved can be solved by usingthe fast Fourier transform instead of using other numericalmethods.

In order to obtain an equation system, (42) and (44)must be projected over the modes of the regions A or B.Projecting (42) over the inner modes of region B, ejmφ,gives

Ni∑n=−Ni

Imnin =

M∑n=1

(Jmnan + Kmnbn) (55)

where m ∈ [−Ni, Ni] and

Imn =

∫ 2π

0

EBt (ρ = R) · e−jmφdφ (56)

Jmn =

∫ 2π

0

e+n (φ)gn(φ)e−jmφdφ (57)

Kmn =

∫ 2π

0

e−n (φ)gn(φ)e−jmφdφ (58)

(59)

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8

Projecting (44) over the modes of the region A, gm(φ)gives

Ni∑n=−Ni

Rmnin =

M∑n=1

(Umnan − Tmnbn) (60)

where m ∈ [0,M ],

Rmn =

∫ 2π

0

HBt (ρ = R) · g∗m(φ)dφ (61)

Umn =

∫ 2π

0

e+n (φ)Y0ngn(φ)g∗m(φ)dφ (62)

Tmn =

∫ 2π

0

e−n (φ)Y0ngn(φ)g∗m(φ)dφ (63)

Expressing equations (55) and (60) in matrix form

Ii = Ja+Kb (64)Ri = Ua− Tb (65)

In order to obtain the GSM, (64) and (65) containinformation of both electric and magnetic fields. i willbe extracted from (64)

i = I−1(Ja+Kb) (66)

Now substituting in (66) in (65)

RI−1(Ja+Kb) = Ua− Tb (67)

(U −RI−1J)a = (T +RI−1K)b (68)

And finally, the GSM is (b = Sa)

S = (T +RI−1K)−1(U −RI−1J) (69)

With this procedure, we have used the equation (64)of the electric field continuity projected over the modesof region B, and the equation (65) of the magnetic fieldcontinuity projected over the modes of region A. Soboth electric and magnetic fields have been used andprojections over both sets of modes, those of region Aand those of region B, are involved.

The great advantage of this analysis method is that allthe integrals needed for the elements of matrices I , J ,K, R, T and U can be solved either analytically or byusing the fast Fourier transform. It is in the evaluation ofR where a new reformulation has been required in orderto adapt the mode matching presented in [24] to the caseor multiple accesses (see [24] for expressions of the otherfive types of integrals).

Rmn (eq. 61) comes from the projection of transversalmagnetic fields of the inner region over the guided modes

Rmn =

∫ 2π

0

−1

η

n

KRJn(KR)e

jnφ

[Amn

(ejφ + e−jφ

2

)+

+ Bmn

(ejφ − e−jφ

2j

)g∗m(φ)dφ+

+

∫ 2π

0

−1

η

q

KR

∑q

dqnH(2)q (KR)e

jqφ

[Amn

(ejφ + e−jφ

2

)+

+ Bmn

(ejφ − e−jφ

2j

)g∗m(φ)dφ+

+

∫ 2π

0

−j

ηJ′n(KR)e

jnφ

[Bmn

(ejφ + e−jφ

2

)−

− Amn

(ejφ − e−jφ

2j

)g∗m(φ)dφ+

+

∫ 2π

0

−j

η

∑q

dqnH(2)′q (KR)e

jqφ

[Bmn

(ejφ + e−jφ

2

)−

− Amn

(ejφ − e−jφ

2j

)g∗m(φ)dφ

(70)

Using (81) and substituting in (70),

Rmn ∼= −π

η

n

KRJn(KR)

[(Amn − jBmn) y(m)[n+ 1]+

+ (Amn + jBmn) y(m)[n− 1] +

− π

η

q

KR

∑q

dqnH(2)q (KR)

[(Amn − jBmn) y(m)[q + 1]+

+ (Amn + jBmn) y(m)[q − 1] +

− jπ

ηJ′n(KR)

[(Bmn + jAmn) y

(m)[n+ 1]+

+ (Bmn − jAmn) y(m)[n− 1] +

− jπ

η

∑q

dqnH(2)′q (KR)

[(Bmn + jAmn) y

(m)[q + 1]+

+ (Bmn − jAmn) y(m)[q − 1](71)

In matrix form

R = πY +(RA +RBD) + πY −(RC +RDD) (72)

where

Y + =

y(1)[n+ 1]

y(2)[n+ 1]...

y(M)[n+ 1]

M×(2Ni+1)

(73)

Y − =

y(1)[n− 1]

y(2)[n− 1]...

y(M)[n− 1]

M×(2Ni+1)

(74)

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9

and RA, RB , RC and RD are diagonal matrices with

RAnn = −1

η

n

KRJn(KR) (Amn − jBmn)

−j 1ηJ′n(KR) (Bmn + jAmn) (75)

RBnn = −1

η

q

KRH(2)q (KR) (Amn − jBmn)

−j 1ηH(2)′q (KR) (Bmn + jAmn) (76)

RCnn = −1

η

n

KRJn(KR) (Amn + jBmn)

−j 1ηJ′n(KR) (Bmn − jAmn) (77)

RDnn = −1

η

q

KRH(2)q (KR) (Amn + jBmn)

−j 1ηH(2)′q (KR) (Bmn − jAmn) (78)

Finally,

R = πY +(Amn + jBmn)(Ra +RbD)+

+πY −(Amn − jBmn)(Rc +RdD)

where

y(m)[n] = DTFT−1{g∗m(φ)} (80)

but in order to accelerate the process, just some discretepoints of g∗m(φ) are considered along φ and Fast FourierTransform can be used,

y(m)[n] ≈ y(m)[n] = FFT−1{g∗m(φ)} (81)

being y(m)[n] a periodic signal with period equal to thenumber of discrete points considered for the FFT. Thisnumber of points must be

Nfft ≥ 2Ni + 1

so that aliasing error will not appear, and the followingexpression has been used

Nfft = 2 · ceil(Ni(1 + PNfft)) + 1 (82)

Properties of FFT that have been utilized are1

∫ 2π

0

g∗m(φ)e

jφejnφ

dφ = y(m)

[n+ 1] ∼= y(m)

[n+ 1] (83)

1

∫ 2π

0

g∗m(φ)e

−jφejnφ

dφ = y(m)

[n− 1] ∼= y(m)

[n− 1] (84)

F. Convergence study

Due to computational reasons, several infinite sum-mations must be truncated. Truncation indexes for thenumber of modes of the external incident field spectrum,Ni (17), the scattered field spectrum, Nd (25), and theincident field spectrum to object k, N (k)

i (3), and forthe number of points of the FFT, Nfft (82), have beendefined.

In order to test the convergence of the method andchoose the adequate values for these indexes, a similar

convergence study as in [24] has been done with each oneof these indexes. It shows that the adequate values in thisnew formulation of hybrid mode matching are PN (k)

i =7, PNi = 10, PNd = 1.5 and PNfft = 2. This is toensure that the chosen parameters are valid for a widerange of different complex structures.

III. RESULTSWe have tested the efficiency and accuracy of our

method by analyzing and measuring several devices. Theresults of these analysis will be compared with [17] and[22], and also with the commercial software HFSS [29].This is to test the accuracy of the method and to comparethe computation times for each analysis tool.

The first two designs (Figs. 7 - 10) first appeared in[17] and here we compare the results provided by withour method with those presented in [17].

Fig. 7: Three cavity filter (28GHz) [17]

26 28 30

−20

−10

0

Frequency (GHz)

SPa

ram

eter

s(d

B)

S11 NewS21 NewS11 [17]S21 [17]

Fig. 8: S Parameters of the circuit in Fig.7

Total TimeNew Method 6.8183 s[17] 2 minHFSS 11 min

Table I: Cost comparison for filter in Fig. 7 (60 frequencypoints)

Table I shows how this method reduces the computa-tional time by 98.96% comparing it with HFSS temporalcosts, but it is also in the order of 20 times faster thanthe hybrid analysis method for SIW structures presented

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Page 10: Efficient analysis of substrate integrated waveguide

10

in [17]. It must be said that the comparisons with HFSShave been done with respect to the discrete sweep, tofairly contrast the results because, although HFSS has alsoa fast sweep it does not analyze the problem in all thefrequencies and the results are less accurate and limitedto a certain bandwidth.

Fig. 9: Dual-band filter with annular dielectric posts [17]

24 25 26 27−30

−20

−10

0

Frequency (GHz)

SPa

ram

eter

s(d

B)

S11 NewS21 NewS11 [17]S21 [17]

Fig. 10: S Parameters of the circuit in Fig. 9

The fourth design (Figs. 11 - 13), which we alreadypresented in [22], is here analyzed with the new methodand compared with [22] and also with the results obtainedfrom the analysis with HFSS.

Fig. 11: Four cavity filter (11GHz)

Time/point Total TimeNew Method 1.4091 s 11.7659 min[22] 2.3243 s 19.4081 minHFSS 2.25 min 18.79 hrs

Table II: Cost comparison for filter in Fig. 11 (501frequency points)

Once again Table II shows that the new method reducesby 98.96% the computational time compared to HFSSdiscrete sweep, and still using the fast sweep in HFSS

10.8 10.9 11 11.1 11.2

−40

−20

0

Frequency (GHz)

SPa

ram

eter

s(dB

)

S11 NewS21 NewS11 [22]S21 [22]S11 HFSSS21 HFSS

Fig. 12: S Parameters for filter in Fig. 11

the temporal cost would be 20min, twice the cost ofthe new method’s cost. But here we can also see that itconsiderably reduces the time with respect to [22] usingdiscrete sweep.

10.8 10.9 11 11.1 11.2−30

−20

−10

0

Frequency (GHz)

SPa

ram

eter

s(d

B)

S11 NewS21 NewS11 [22]S21 [22]S11 HFSSS21 HFSS

Fig. 13: S Parameters of the filter in Fig. 11 with substrateof tan δ = 0.0023 and σ = 5.813 · 107 S/m for themetallic posts

Time/point Total TimeNew Method 1.4295 s 11.9365 min[22] 5.4615 s 45.6030 minHFSS 2.25 min 18.79 hrs

Table III: Cost comparison for filter in Fig. 11 with losses(501 frequency points)

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Page 11: Efficient analysis of substrate integrated waveguide

11

As it can be appreciated in Table III, this new methoddoes not increase the computational cost of the analysisbecause of the fact of introducing losses in the analysis.

The fifth and last design (Figs. 14- 15), first appearedin [17], was already analyzed, redesigned, fabricated, andmeasured in [22], and now we analyze it again with thenew method presented in this work.

1

2

3

4

Fig. 14: Hybrid ring

IV. CONCLUSIONSWe have obtained a very accurate method to efficiently

analyze different kinds of SIW devices with multipleaccessing ports with an important time saving whencompared to other existing methods or to reference com-mercial software.

It is an extension of the mode matching in [24], wherethe use of a circular boundary for the mode matchingallows the solution of the required integrals by usingthe fast Fourier transform where analytic solution is notpossible, although here the SIW device is not completelysurrounded with accessing ports, contrary to [24]. The ef-ficiency of this technique has been tested with the analysisof different topologies, and it is maximum for any kind ofcircular obstacles such as the studied ones. However, andalthough these are the most common objects presented ina SIW structure, the method is valid for general arbitrarilyshaped posts once we know their scattering matrix.

Furthermore, the new method easily models the lossesdue to the substrate and the finite conductivity of themetallic posts by taking substrate tan δ into account inthe calculation of permittivity and phase constant andcharacterizing the metallic post with the scattering matrixof a dielectric post with their respective permittivities.This way of dealing with losses does not increase thecomputational cost of the analysis as happens with othermethods.

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16.5 17 17.5 18 18.5 19

−30

−20

−10

0

Frequency (GHz)S

Para

met

ers

(dB

)

S11 NewS12 NewS13 NewS11 [22]S12 [22]S13 [22]S11 HFSSS12 HFSSS13 HFSS

Fig. 15: S Parameters of the circuit in Fig. 14

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Copyright (c) 2016 IEEE. Personal use is permitted. For any other purposes, permission must be obtained from the IEEE by emailing [email protected].

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Elena Dıaz Caballero (S’07-GSM’10) re-ceived the Telecommunication Engineering de-gree from the Universidad Politecnica de Va-lencia (UPV), Spain, in July 2010. She isnow working on her research toward the Ph.D.degree at UPV, where she was awarded Stu-dent of the Year in 2010. She won a Col-laboration Fellowship at the CommunicationsDepartment of UPV in 2009, has done aninternship at AURORASAT Company and hasrecently won an Excellence Fellowship from

the UPV. Her research interest is currently focused in the developmentof efficient methods for the analysis and design of substrate integratedwaveguide devices.

Hector Esteban (S’93−M’99) received adegree in telecommunications engineeringfrom the Universidad Politecnica de Valencia(UPV), Spain, in 1996, and a Ph.D. degreein 2002. He worked with the Joint ResearchCentre, European Commission, Ispra, Italy. In1997, he was with the European Topic Cen-tre on Soil (European Environment Agency).He rejoined the UPV in 1998. His researchinterests include methods for the full- waveanalysis of open-space and guided multiple

scattering problems, CAD design of microwave devices, electromagneticcharacterization of dielectric and magnetic bodies, and the accelerationof electromagnetic analysis methods using the wavelets and the FMM.

Angel Belenguer (M’04) received theTelecommunication Engineering and Ph.D.degrees from the Universidad Politecnicade Valencia, Spain, in 2000 and 2009,respectively. He joined the Universidad deCastilla-La Mancha in 2000, where he is nowProfesor Titular de Escuela Universitaria inthe Departamento de Ingenierıa Electrica,Electronica, Automatica y Comunicaciones.His research interests include methods in thefrequency domain for the full-wave analysis

of open-space and guided multiple scattering problems, specifically theimprovement or acceleration of these methods using several strategies:hybridization of two or more different methods, the use of specificbasis, and the application of accelerated solvers or solving strategies tonew problems or structures.

Vicente E. Boria (S’91−A’99−SM’02) re-ceived the Ingeniero de Telecomunicacin andthe Doctor Ingeniero de Telecomunicacin de-grees from the Universidad Politecnica de Va-lencia, Spain, in 1993 and 1997. In 1993 hejoined the Universidad Politecnica de Valenciawhere he is Full Professor since 2003. In1995 and 1996 he was held a Spanish Traineeposition with the European Space research andTechnology Centre (ESTEC)-European SpaceAgency (ESA). He has served on the Editorial

Boards of the IEEE Transactions on Microwave Theory and Techniques.His current research interests include numerical methods for the analysisof waveguide and scattering structures, automated design of waveguidecomponents, radiating systems, measurement techniques, and powereffects in passive waveguide systems.

This is the author's version of an article that has been published in this journal. Changes were made to this version by the publisher prior to publication.The final version of record is available at http://dx.doi.org/10.1109/TMTT.2011.2178424

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