custom-made products / scientific research · pdf file304 custom-made products custom-made...

304

Custom-M

ade Products

Custom-Made Products / Scientific Research Instruments

１．Synchrotron Radiation Instruments

　１．１　Double Crystal Monochromator

Common Rotary Table System

A double crystal monochromator is an instrument that extracts light of a specific wavelength using crystal diffraction. Light of various wavelengths can be extracted by changing the incident angle to the crystal. We have designed a structure and assembly precision that assures maximum light intensity and a fixed exit beam position even when the wavelength is changed. To keep the crystal surface as clean as possible, all the monochromators have a structure that can maintain a pressure of approximately 10-4 (Pa) or less. Some examples of our double crystal monochromators with different structures are presented below.

The common rotary table type operates with a rotary table that carries adjustment mechanics of both crystals The movement of the rotary table is transmitted from the atmosphere side through a ferro-fluid seal into the vacuum chamber.

The positions of the two crystals in the instrument above are controlled to follow the orbit calculated by a computer. Multiple stages are used for

position adjustment so that fine adjustment of Bragg angle and horizontal position adjustment of the beam are possible. Also the crystals are cooled

with liquid nitrogen to withstand the thermal load of the beam. This instrument was installed at the Advanced Photon Source (APS) of the Argonne

National Laboratory in the USA.

Calculation and Combination Type

Although this instrument has the same structure as the calculation and coupling type double crystal monochromator described previously, this instrument has a structure in which silicon crystals and multilayers are arranged along the optical axis. For a diffraction experiment that requires high resolution, silicons is used, and for a small-angle scattering experiment that requires brightness, multilayers are used. This instrument was installed at the Advanced Light Source (ALS) in Berkeley, California.

305CONTACT TEL:+81-44-981-2131 FAX:+81-44-981-2181 [E-mail] [email protected] [URL] www.kohzu.com

Cust

om-M

ade

Prod

ucts

Independent Rotation Table SystemIn the independent Rotation table system, crystals are mounted on independent Rotation stages. This type of monochromator is used to obtain high resolution or to distribute a beam to multiple locations.

The instrument shown on the left is designed to obtain the optimum distance between two crystal planes by using a cam. To prevent deterioration of the precision caused by large variations of moment load applied to the main spindle when the Bragg angle is changed, this instrument is equipped with a cancellation mechanism (patent number 2782397) that cancels the force by means of an air cylinder. At the SPring-8 (Super Photon ring-8 GeV) synchrotron radiation facility in Japan, 27 of these instruments are now in standard service.

Single-Cam Type

The instrument shown on the left is designed to optimize the distance between double crystal planes and the distance between the double crystal centers at the same time by using double cams. The use of double cams enables the number of motors used in the vacuum to be reduced, the control to be facilitated, and the wavelength to be changed at high speed. This instrument was installed at Beijing Synchrotron Radiation Facility (BSRF) in China.

Double-Cam Type

The instrument shown on the left is manufactured to distribute a beam to

multiple locations. The white light that enters from the lower left is separated

by the first diamond crystal in the cylindrical chamber, reaches the right

chamber, is diffracted by the second crystal, and is extracted. Light that

passes through the first crystal is used also by another instrument. This

system is called a troika system, and a beam line can be used by multiple

groups without time sharing. This instrument was installed in the SPring-8

(Super Photon ring-8 GeV) BL24XU hatch of the synchrotron radiation facility

in Japan.

306

Custom-M

ade Products

　１．２　X-Ray Diffractometer

An X-ray diffractometer is an instrument that measures the physical properties of a sample by applying X-rays obtained from a monochromator or other source to the sample and detecting the scattered X-rays. Since X-rays obtained from synchrotron radiation have higher luminance than those from a typical laboratory source and allow various wavelengths to be selected, the X-rays are used for the analysis of powder and single crystal structures, surface and interface crystal structures, and protein crystal structures. The goniometer for rotating the sample includes multiple rotation stages combined at high precision to rotate in all directions and precisely detect the scattered X-rays. Some instruments also include an analyzer goniometer stage that diffracts scattered X-rays by Si crystals or other similar means.

This instrument is a diffractometer that has six degrees of freedom of rotation for the six axes: the χ, φ, and ω axes for positioning a sample and the 2θ, θa, and 2θa axes for positioning an analyzer crystal. This instrument has a base section that includes the X, Z, and α axes for positioning the overall diffractometer against the beam line. Also the incident optical bench is equipped with a four-quadrant slit for beam-shaping and an attenuator that adjusts the intensity of the beam. This instrument is now in service in the SPring-8 (Super Photon ring-8 GeV) BL13XU in Japan.

Multipurpose Six-Axis X-Ray Diffractometer

This diffractometer is characterized by the C shape of the χ circle for changing the orientation of the sample. With this shape, the blind angle can be reduced to a minimum in the incident angle and the scattering angle.This instrument is now in service in the SPring-8 (Super Photon ring-8 GeV) BL24XU in Japan.

χ Circle Type 4-Axis X-Ray Diffractometer With Gap

This diffractometer was manufactured for research of solid surfaces and thin film surfaces and interfaces. To observe the X-rays diffracted from the surface of a sample in any direction, this instrument has a four-axis structure comprising 2＋2 axes. With an ultra-high vacuum tank that allows on-the-spot observation, the axes are assembled so that the displacement of the rotating centers is less than 50μm.This instrument is now in service in the SPring-8 (Super Photon ring-8 GeV) BL13XU in Japan.

X-ray Diffractometer For Surface And Interface Analysis



Cust

om-M

ade

Prod

ucts

　１．３　X-Ray Detector System

The diffractometer shown on the left is an instrument for X-ray inelastic scattering experiments that was manufactured to observe an elementary excitation phenomenon on a sample caused by X-ray irradiation. The sample goniometer consists of a translation stage, a tilt stage, and a rotary stage for position adjustment that have withstand loads of 500 kg. This instrument also diffracts X-rays by means of a crystal mounted on the high-precision analyzer goniometer to detect inelastic scattering X-rays. This instrument is now in service at SPring-8 (Super Photon ring-8 GeV) BL11XU in Japan.

Inelastic Scattering X-Ray Diffractometer

The diffractometer shown on the left is a specialized instrument for structural analysis of powder samples. An analyzer crystal and a detector are mounted on each detector arm. Only 15-degrees of rotation is required for measurement in an angle range of 60 degrees. This instrument incorporates MAX-G400 and MAX-G600. The axial coincidence of the θ-2θ axes is kept at approximately 5 μm. This instrument is now in service at SPring-8 (Super Photon ring-8 GeV) BL08B2 in Japan.

Powder X-Ray Diffractometer

The instrument shown on the left is a base for measuring diffracted rays from a sample placed in a high-pressure state using energy dispersion and positioning adjuster. Diffracted rays can be measured using energy dispersion while the θ-2θ relationship is maintained. The detector is placed on the stage with a sample at the center and its rotation center displacement is 50 μm or less. This instrument is now in service at the SPring-8 (Super Photon ring-8 GeV) BL04B2 in Japan.

High-Pressure Press On-The-Spot Observer System

This is a specialized instrument for structural analysis of biopolymers such as proteins. Since the rotation stage for the sample is used to measure a crystal of approximately 10 μm, the rotation center displacement of the rotary stage for the sample is kept at 1 μm or less. Also since fluctuation of the sample caused by high-intensity X-rays is a problem, this instrument is equipped with a shutter that can be controlled to turn on and off in milliseconds. The X-ray CCD camera can approach the sample to a proximity of 40 mm to cover sufficiently the diffracted rays required for analysis. This instrument is now in service at the KEK PF (Photon Factory) BL05 in Japan.

Biopolymer Structural Analysis System

308

Custom-M

ade Products

The instrument shown on the left enables X-rays to be focused to submicron

size through a Fresnel zone-plate. A beam like the tip of a needle is used for

research on X-ray diffraction measurements and fluorescent X-ray analysis

in a very small area. The Fresnel zone-plate condenser and the sample

observing microscope can be toggled with the touch of a single button. Also

to observe very small samples, the rotation center displacement of the

rotation stage is kept at 1 μm or less. This instrument is now in service at

the SPring-8 (Super Photon ring-8 GeV) BL24XU in Japan.

Microbeam System

Photo courtesy : New Energy and Industrial Development Organization (NEDO)

The instrument shown on the left was manufactured for evaluation

experiments on micro-optics essential for developing next-generation

semiconductor manufacturing equipment using extreme ultraviolet light.

These instruments feature a clean vacuum with little contamination and a

vibration isolation structure that shuts out fluctuations of the optical system.

This instrument is now in service at the SPring-8 BL9 of New SUBARU in

Japan.

Exposure Evaluation Instruments

The instrument shown on the left is designed for large-area deep X-ray

lithography. Up to A4 mask size can be used.

This instrument is now in service at the SPring-8 BL2 of New SUBARU in

Japan.



Cust

om-M

ade

Prod

ucts

The instrument shown above is used to evaluate the polarization characteristics of a sample by polarizing X-rays from an X-ray source and

using the polarized light. Light from the X-ray source is separated and polarized using a channel-cut monochromator. The light is shaped at

a slit chamber in a later stage and guided to the sample chamber.

This instrument is now in service at CHUO University.

X-Ray Astronomy

The instrument shown above is a goniometer on which an optical device for an X-ray telescope is mounted. The orientation of the device

can be adjusted at high precision to evaluate the performance of the optical device.

This instrument is now in service at the X-ray astronomy group of NAGOYA University.

310

Custom-M

ade Products

The instrument shown on the left is a multipurpose 4-axis X-ray diffractometer system. This instrument was manufactured to observe on-the-spot proteins grown in a gravity-free state and a samples grown in an electric furnace. For X-rays generated by an X-ray generator, energy resolution can be increased by means of a double/quadruple crystal monochromator. Also the sample goniometer stage can be changed by removing the stage depending on the measurement mode: protein measurement or on-the-spot observation. Also the mode can be switched between one-time reflection and three-time reflection before the analyzer crystal.This instrument is now in service at the National Aeronautics and Space Administration (NASA).

Multipurpose X-Ray Diffractometer System For Laboratory Use

Inside of monochorometor

Multipurpose X-ray diffractometer

Detection analyzer unit

The instrument shown on the left is a κ goniometer type X-ray diffractometer. For the sample goniometer, a rotation stage like an χ circle is not used, and rotation stages tilted by 45° are combined and mounted. Since there is no object that cuts off the X-rays, such as an χφ circle, the degree of freedom for the angle of diffraction can be wide. For the θ-2θ axes, a direct-coupling rotary encoder is used. The rotation center displacement of the three axes can be reduced to 10μm. This instrument is now in service at the Production Engineering Laboratory of HITACHI CO., Ltd.

κ Goniometer Type X-Ray Diffractometer

This instrument is now in service at the 6G port of JRR-3M of the Japan Atomic Energy Agency and consists of a monochromator, goniometer for sample positioning, analyzer shield, and neutron detector inside a green shield. The overall instrument is controlled by an external computer. (Example of integration)

２．Neutron Diffraction Experiment InstrumentsNeutron scattering experiments are used for researching physical properties and structural analysis by using the characteristics of thermal neutrons extracted from an atomic reactor. We supply many diffractometers and positioning mechanisms to the Japan Atomic Energy Agency and High Energy Accelerator Research Organization.


custom-made products / scientific research · pdf file304 custom-made products custom-made...

Documents