SDDthe golD StanDarD in

Silicon Drift DetectorS

SiPMSilicon PhotoMultiPlierS

next generation verSatility

detectorcreative

solutions

1980s1989 1995

1990s2002 2007 2008 2010

2000s

KeteK gMbh founDeD by Dr. Josef Kemmer

1St generation SDDS

new ManageMent Dr. Reinhard Fojt and Silvia Wallner

2012 2013 2015 2017 2018 2019

ProDuct launch axaSfirst electronics product with the KETEK

Analytical X-ray Acquisition System (AXAS)

QualifieD by tÜv ManageMent ServiceS according to ISO 9001:2000

viaMP MoDule ProDuct launch

VIAMP = VITUS SDD + pre-AMPlifier

worlD recorD energy reSolutionachieved by KETEK‘s SDD: 120.9 eV for Mn Kα line

worlD’S largeSt circular SDDwith 150 mm² collimated area

new vituS cube SDD SerieSan ultra-low-capacitance ASIC replaces the classical FET

vituS SDD lanDS on MarS on board Mars rover Curiosity

firSt SiPM DetectorS PreSenteD

new Digital PulSe ProceSSor (DPP2)

new ManageMent Dr. Jürgen Knobloch joins KETEK management

7-channel SDD array introDuceDtotal collimated area of 560 mm²

SiPM wb-SerieS launcheD sets new standards in performance, mass volume production and cost effectiveness

next generation vituS SDDwith improved cooling and KETEK‘s

patented graphene window

electronicS generation 2.0 vico-Dv 2.0 & axaS 2.0

with improved technology and small dimensions

SiPM tia MoDule launcheD SiPM with transimpedance amplifier (TIA)

and bias supply

tiMeline ketek

ProDuct launch axaS-D

AXAS with digital pulse processor (DPP)

2005

introDuction of vituS SDD

With our detectors the world is getting to the bottom of materials – for engineers, scientists and other curious people.

We are offering our customers, located everywhere in the world, tailored solutions for their analytical devices and applications, including our in-house-developed analog and digital signal processing electronics. As a 100 % independent family enterprise, KETEK has very close relationships with local uni-versities to maintain its innovative strength. With its high degree of production automation we are a powerful and reliable OEM supplier for our industrial customers.

ManageMentSilvia wallner Managing Director

„Not everything important is measurable, and not everything measurable is important.“

Albert Einstein (1879 – 1955)

Dr. reinharD fojt Managing Director

„The one thing that matters is the effort.“Antoine de Saint-Exupéry (1900 – 1944)

Dr. jÜrgen Knobloch Managing Director

„What you want to ignite in others must first burn inside yourself.“

Aurelius Augustinus (354 – 430)

At KETEK in Munich, Germany, an experienced team of highly motivated engineers, physicists and technicians is developing and manufacturing a unique product portfolio around the Silicon Drift Detector and the Silicon Photo-multiplier, starting from the bare silicon wafer to the detector chip and further to the highly complex detector module.

PHilosoPHY and values

UnPrECEDEnTED lOW-EnErGy PErFOrMAnCE DOWn TO li @ 53 eV

Coun

ts [a

.u.]

low-energy spectrum acquired with VITUS SDD showing the lithium and Oxygen Kα lines

Energy resolution FWHM down to 126 eV for Mn Kα at 1 μs peaking time even for H150

Energy resolution FWHM down to 123 eV for Mn Kα at 3 µs peaking time

Excellent performance at low energies: FWHM of 42 eV for Carbon Kα line

Energy [keV]

vitus

sdd Modules

KETEK’s VITUS Silicon Drift Detectors (SDD) are the state-of-the-art X-ray detectors for the energy range between 0.05 keV and 30 keV. They are used in applications such as EDS, XrF, µXrF, and TXrF in bench top spectrometers, as well as in handheld systems. Due to their wide operating temperature range, their excellent energy resolution, and high reliability they are particularly suited for industrial applications.

1E+06

1E+05

1E+04

1E+03

1E+02

1E+01

1E+000 1 2 3 4 5 6 7 8 9 10

250000

200000

150000

100000

50000

0

FWHM 126 eV @ 1 μs  Peaking time

Manganese Kα

Manganese Kβ

escape peaks escape peaks

Manganese Kα

Manganese Kβ

FWHM 123 eV @ 3 μs  Peaking time

1E+06

1E+05

1E+04

1E+03

1E+02

1E+01

1E+00

250000

200000

150000

100000

50000

0

0 1 2 3 4 5 6 7 8 9 10 Energy [eV]

FWHM 42 eV

Carbon

Oxygen

1E+05

1E+04

1E+03

1E+02

1E+01

0 100 200 300 400 500 600 700

60000

50000

40000

30000

20000

10000

0

Oxygen

Carbon nitrogen

0 100 200 300 400 500 600 700 800 900

18000

16000

14000

12000

10000

8000

6000

4000

2000

0

lithium

FWHM 39 eV

new SDD module

Standard SDD module

1

0.9

0.8

0.7

0.6

0.5

0.4

0.3

0.2

0.1

0

KETEK‘s r&D team constantly works on improving the VITUS SDD. The latest generation combines two recent developments: improved cooling performance and KETEK‘s patented graphene window. These modules have a significantly lower power consumption and an improved long-term stability, but also a better photon transmission compared to the previously used Beryllium window.

> 22 20 K lower chip temperatures over the whole temperature range

- 60 °C at + 65 °C heat sink temperature achievable

Drastically increased efficiency of the thermoelectric cooling

Improved heat management within module

Ultra stable vacuum integrity for many years of operation

CH window: 900 nm Carbon without support grid (replaces the 8µm Beryllium window)

Cl window: 150 nm Carbon with Si support grid (86 % open area) for low-energy applications

no fluorescence lines (pure Carbon window)

Both window types compatible with vacuum encapsulation process

Transmission better than conventional window types over the whole energy range

vitus

sdd innovation

CL

CH

0 0.1 0.2 0.3 0.4 0.5 0.6 0.7 0.8 0.9 1

1

0.9

0.8

0.7

0.6

0.5

0.4

0.3

0.2

0.1

0

Tran

smission

Energy [keV]

KETEK Graphene CH Be 8 μm

Tran

smission

Energy [keV]

Chip te

mpe

rature [°C]

Heat Sink Temperature [°C]

-30

-40

-50

-60

-70

-80

-9020 30 40 50 60 0 0.5 1 1.5 2 2.5 3

SDD te

mpe

rature [°C]

Peltier Power [W]

New SDD module

Standard SDD module

POWEr COnSUMPTIOn DrASTICAlly rEDUCED By UP TO

50 %20

0

-20

-40

-60

-80

Standard

VITUS SD

D

new VITUS

SDD

ΔT improved by 20 K

KETEK Graphene Cl AP3.3

0 0.5 1 1.5 2 2.5 3

h7

h20

h30

h50

h80

h150

CollimaTeD area [mm²] 7 20 30 50 80 150

aCTive area [mm²] 10 30 40 65 109 170

WindoW CH CH CH 12.5 μm Be 25 μm Be 25 μm Be

guarantEEd FWHM Mn Kα @ 5.9 keV [eV]

≤ 129 ≤ 129 ≤ 129 ≤ 129 ≤ 136 ≤ 136

Cooling PerformanCe [K] (max. Δ T @ 20 °C heat sink)

90 90 90 90 90 90

sensitive doWn to boron Kα at 185 ev

KeteK s unique graPHene WindoW

h7le

h20le

h30le

h50le

CollimaTeD area [mm²] 7 20 30 50

aCTive area [mm²] 10 30 40 65

WindoW Cl Cl Cl AP3.3

guarantEEd FWHM Mn Kα @ 5.9 keV [eV]

≤ 129 ≤ 129 ≤ 129 ≤ 136

Cooling PerformanCe [K]  (max. Δ T @ 20 °C heat sink)

90 90 90 75

coMPact Housing

verY large solid angle

large colliMated area

PortFoliostandard vitus vitus

PortFolioloW energY

Valid For all SddSAmplification stage: aSiC Guaranteed P/B: > 15000 Guaranteed P/T: > 2000 Max. ICr @ 50 % DT: 1 Mcps Absorption depth Si: 450 µm On-chip collimator: multilayer

Production sdd

ManuFactured in MunicH

VITUS SDD modules and the corresponding electronics are produced by KETEK in our modern production facili-ties in Munich, Germany. A reliable volume fabrication with a high degree of automation and maximum yield are essential to deliver quality products to our customers on-time. KETEK‘s value chain comprises all steps from the bare silicon wafer to the fully encapsulated detector module as well as complete signal processing electronics.

Elec

tron

ics

asse

mbl

y

Fully automated module production

VITU

S SD

D m

odul

e as

sem

bly

Semiconductor chip production

Vacu

um e

ncap

sula

tion

Clea

n ro

omPa

ralle

l pro

cess

ing

for h

igh

volu

mes

Spectroscopic characterization after encapsulation

sdd

Fully automated final testing

The final test for our electronics systems,like the VIAMP or the AXAS, is anotherspectroscopic characterization includingmeasurements with different parametersettings. For customized solutions wemeasure against agreed specificationsand share the acquried data.

The next production step is the vacuum encapsulation of the modules, followed by two further quality gates: ensuring the hermetically sealing and the final spectro-scopic test. The SDDs are now ready for shipment or they are passed on to ourelectronics production for further assembly.

The first quality gate – after semiconductor chip production – includes optical inspections and electrical measurements. Therefore after dicing only good dies will be passed on to module production.

After assembly, still before encapsulation,100 % of the modules are comprehensively tested and spectroscopically characterizedfor the first time. This is essential for a highyield, but also necessary because some of our modules are used windowless,e.g. in electron microscopes.

testing

Test of leak-tight encapsulation Spectroscopic test of complete systems

oPtical inSPectionS & wafer level MeaSureMentS

teSt of oPen SDD MoDuleS vacuuM encaPSulation SPectroScoPic teSting

All KETEK products have to pass several quality gates during production to ensure a high yield and excellent quality. Most of the automated test equipment is designed by KETEK's test system development team.

First quality gate on die level Spectroscopic test before encapsulation

ultra short Peaking times down to 0.1 μs

KETEK offers electronics engineered particularly for operating VITUS SDDs. The portfolio ranges from single components as the preamplifier to complete systems which further include all power supplies and the digital pulse processor. In combination with our tailored electronics solutions we ensure unprecedented performance with regards to FWHM and peak-to-background at ultra short peaking times down to 0.1 μs as well as input count rates up to 1 Mcps at 50 % dead time.

out

put C

ount

rat

e [k

cps]

FWH

M @

5.9

keV

[eV

]

Peaking Time [µs]

sdd electronics

FWH

M @

5.9

keV

[eV

]

The energy resolution of a system with KETEK’s DPP is independent from the input count rate, no matter which peaking time is chosen. This is essential for stable performance of a spectroscopic system.

600

500

400

300

200

100

0 0 100 200 300 400 500 600 700 800 900 1000

0.1 μs 0.2 μs 0.3 μs 0.5 μs 1 μs 2 μs 4 μs 6 μs

input Count rate [kcps]

160

155

150

145

140

135

130

125

12010 100 1000

-10 °C

-25 °C

-35 °C

-50 °C

0 1 2 3 4 5 6 7 8

140

135

130

125

120

input Count rate [kcps]

Throughput with KETEK signal processing electronicsat various peaking times and dead time < 50 %

Energy resolution versus input count rate acquired with KETEK DPP

Energy resolution at various chip temperatures acquired with VICO-DV 2.0 and VIAMP-KC H20

TAIlOrED STAnDArD COMPOnEnTS FOr OUTSTAnDInG PErFOrMAnCE

modular design

0.1 μs 0.2 μs 0.3 μs 0.5 μs 1 μs 2 μs 4 μs 6 μs

KC viamp

sdd electronics DV 2.0 viCo

sdd electronics

The VIAMP-KC module is the combination of a low noise preamplifier and a VITUS SDD, matching all types from 7 mm² (H7) up to 50 mm² (H50) collimated area. The Al housing is functioning as an appropriate heat sink. Dual FFC cable connection for readout and parameter settings.

Ultra-low-noise preamplifier ramped reset type output signal Configurable via FFC interface SDD temperature readout Customized solutions

available on request

VIAMP-KC and VICO-DV 2.0with FFC cable connection

The complement of the VIAMP module is the VICO-DV 2.0, comprising KETEK’s proven digital pulse processor (DPP), a temperature controller and all voltage supplies for the SDD. Various parameters can be set and read out via software interface (Dll included). Its small dimen- sions allow an easy system integration. Also an analog version without DPP is available.

Extremely small dimensions 60 × 32 × 17 mm³

Access to analog preamplifier signal and SDD temperature monitor

Very low typical power consumption < 2 W

Wide unipolar voltage input range: + 5 V to + 12 V

USB 2.0, SPI and rS232 interfaces SDD operating temperature setting,

spectrum readout and power save mode accessible via software

Original size

MATCHBOX SIzE SIGnAl PrOCESSInG ElECTrOnICS FOR SDDS

Smallest complete XrF system on the market: 80 × 60 × 36 mm³

low weight: < 300 g

Wide input voltage range: + 5 V to + 12 V / 1 A max.

Excellent cooling performance even at ambient temperatures up to 50 °C

Software interface for parameter setting, spectrum readout and power save mode

sdd coMPlete sYsteM

The AXAS 2.0 is KETEK’s new complete system for VITUS SDDs in a very compact housing. It includes all power supplies, the low-noise preamplifier, a high precision temperature controller and KETEK‘s fast DPP. Beside the digital signal also the analog preamp output is accessible. The AXAS 2.0 is available with all sizes of VITUS SDDs from H7 to H150 and different lengths of the vacuum tight finger.

2.0 axas

2.0 axas

oPerable at aMbient teMPeratures uP to + 50 °c

original size

FULLY VACUUM COMPATIBLE

New axas 2.0

560 mm² area

eMlcolexternal colliMatorThe clip-on mount for external multi-layer collimators is suitable for all VITUS SDDs up to the H50. Different collimator apertures are available. The EMlCOl prevents the X-ray fluorescence of the SDD‘s cap material.

sdd Multi-cHannel

Complete XrF multi-channel system includingseven fast VITUS H80 SDDs, ultra-low-noisepreamplifiers and seven high-performancedigital pulse processors. Also part of the system is an external control unit with all power supplies and a cooling circuit. The whole architecture is very service friendly and allows an easy exchange of single channels.

sdd accessories

no stray lines from SDD cap

Improved P/B and P/T

Additional protection for the VITUS entrance window

Open area 75 %

Thickness 0.5 mm

Withstands a static stress up to 50 n

no fluorescence lines from grid material

Customized shapes available on request

ecgridcarbon Protection gridThe pure carbon grid can be mounted within an instrument in front of the SDD in order to protect its fragile window from mechanical impact.

view on the SDD array head (cap removed)

Al

Ti

Cr

Ta

Va560 array

sdd

7 × 80 mm² = 560 mm² collimated area FWHM < 139 eV @ 1 μs peaking time

for Mn Kα-line (typ. < 132 eV) Operable at short peaking times down to 0.1 µs Up to 7 Mcps detection rate of the full system

@ 50 % dead time For X-ray energy range from 1.5 keV to 30 keV

IndIvIdual channel readout

7-CHAnnEl SIlICOn DrIFT DETECTOr ArrAy

Quality is the basis of all activities at KeteK and every employee contribu-tes significantly to quality.

qualitY in Focus ketek

KeteK lands on Marsin august 2012, on board of mars roverCuriosity, KeTeK’s Silicon Drift Detectorshave arrived on the red Planet.

This is already the third space mission a VituS Sdd has been chosen by the naSa as Xrf detector:

Spirit 2004 - 2011 opportunity 2004 - 2018 Curiosity landed 2012 

Mars 2020 Two KETEK H50-CUBE SDD

modules are installed in the nASA PIXl experiment on board of the Mars Rover

VITUS SDDs have been fully qualified for space mission by nASA / JPl

ketek

close cooPeration WitH KeY custoMers

Full coMMitMent  to qualitY bY all eMPloYees

ISo 9001:2015 Certified

En 55016En 61000

Silicon Photomultipliers (SiPMs) from KETEK are solid-state silicon detectors with single photon counting capability. SiPMs excel in many applications and feature high gain with very low temperature drift and extremely good timing performance at a low operating voltage. They are also insensitive to magnetic fields and stand out with their mechanical robustness. KETEK provides cost-effective solutions for high volume applications as well as customized detector modules.

sipm

silicon PHotoMultiPliers

single photon resolution

insensitive to magnetic fields

ultra high pde

RUGGED

Wb-series siPM tia Modules ultra loW noise siPM custoMized solutions Multi cHannel arraYs

HIGHEST PHOTOn DETECTIOn EFFICIEnCy AnD EXCEllEnT TIME rESOlUTIOn

KETEK SiPMs are produced cost-effective in CMOS foundries with high throughput rates. Due to their superior quantum efficiency and their very high gain, they represent a disruptive sensor technology with regards to the established PMTs and APDs in many applications.

Highest photo detection efficiency (PDE)

low operating voltage Minimum gain variation and

temperature dependency robust package with MSl1 approval

sipm

single PHoton sPectruMBoth PM3315-WB and PM3325-WB show an excellent single photon resolution. Measured with the SiPM Evaluation Kit at 4.0 V overvoltage.

Pde Absolute photo detection efficiency (PDE) of the WB-Series SiPMs versus photon wavelength. The peak PDE is at 430 nm. WB-Series SiPMs are sen-sitive over a wide range from 350 nm to 900 nm.

normalized

 entries

number of photons

overvoltage [v]2 2.5 3 3.5 4 4.5 5

140

120

100

80

60

40

20

0

1

0

1

0

wb Series

tecHnologY & PerForMance

Quenching resistor Antireflective layer Bias

Avalanche zone

n-doped body P-doped entrance window

PdE

[%]

Wavelength [nm]

45%

40%

35%

30%

25%

20%

15%

10%

5%

0%

Pm3325 43 % @ 430 nm

300 400 500 600 700 800 900

darK count rate~ 100 kHz/mm² in the recommended operating range. Measured at 21 °C.

Dark Co

unt r

ate [kHz/mm²]

WB-Series: 25 μm cell type

WB-Series: 15 μm cell type

WB-Series

0 1 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16

PM3315-WB

PM3325-WB

0 1 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16

ultra compact, tileable package

wb series

excellent Fill Factor

HigHest Pde &  linearitY

sipm

Product PortFolio sipm

Product PortFolio

www.ketek.net/store

SiPMs of the WB-Series offer ultra-highPDE, excellent uniformity, best-in-classrobustness and are suitable for highvolume industrial applications. The WB-Series photomultipliers are an ideal basis to create standard and customized arrays with high geometrical efficiency.

low cost

Active sensor area 1.0 × 1.0 mm² and 3.0 × 3.0 mm² with 15 μm or 25 μm microcell sizes

High photon detection efficiency (PDE) up to 43 % @ 430 nm

negligible delayed crosstalk robust wafer level package technology Excellent uniformity of breakdown voltage and gain High dynamic range and linearity Customized array solutions Only ± 125 mV variation of breakdown voltage

per reel

excellent uniformity

KeteK siPM Wb-series In ultra-compact, quadratic, tileable BGA package

TypeActive area

per channel [mm²]Microcell size [μm]

PDE @ 430 nm, 5.0 VOV [%]

Outer dimensions [mm³] Connection

PM11 1.0 × 1.0 25 43 1.315 × 1.315 × 0.595 BGA

PM33 3.0 × 3.015

25

31

433.315 × 3.315 × 0.595 BGA

high detection efficiency

KeteK siPM array Based on KETEK WB-Series Silicon Photomultipliers

TypeActive area

per channel [mm²]number of channels

Pixel Pitch [mm]

Outer dimensions [mm³]

PA11 1.0 × 1.0 8 × 8 1.36 10.84 × 10.84 × 2.5

PA33 3.0 × 3.08 × 84 × 42 × 2

3.3626.84 × 26.84 × 5.2113.40 × 13.40 × 5.21

6.77 × 6.77 × 2.20

sipm

electronics accessories sipm

electronics accessories

The KETEK SiPM Evaluation Kit allows an easy operation and evaluation of different KETEK SiPMs. It can be used for a wide range of applications, e.g. single photon counting or measurements with scintillators. For this purpose KETEK offers SiPMs mounted on a PCB with PIn connectors.

Evaluation and characterization of any KETEK SiPM

Plug and play solution Single photon measurements Measurements with scintillators Coincidence measurements

KeteK siPM eval-Kit Evaluation and characterization of any KETEK SiPM

Type Description

SiPM Eval-Kit

SiPM Evaluation Kit consisting of - SiPM on pin socket- Evaluation PCB in Thorlabs® cage system frame- Preamplifier- Cable set- Bias source (optional)

KeteK siPM evaluation Pcbs and sensorsround evaluation PCB for optical bench applications.

Type Description Signal Output Plug and Play SiPM types for PEPCB-EVAl

PEPCB-EVAlEvaluation PCB with a pin socket for evaluation of different SiPM types

AC coupled (MCX-P) or DC coupled (MCX-rES-P) signal output matched to 50 Ω

PM1125-WB PIn PM3315-WB PIn PM3325-WB PIn

KeteK siPM accessories For the use with any single KETEK SiPM or arrays

Type Output Supply Voltage

PEBIASSiPM Bias Source

20 V to 40 V2 mA or 20 mA

12 V DC, 0.85 A

PEPrEAMP-SIPMPreamplifier

13 x gain 12 V DC, 0.06 A

Bias Source

SiPM Evaluation PCB in Optical Bench Mount (post mount not included)

Preamplifier

easY oPeration

optical BENcH MoUNt

Evaluation PCB

Pm33xx Pin

PM1125 Pin

sipm

tia Module

With an integrated trans-impedance amplifier (TIA), bias control and a high dynamic range SiPM in a compact and multi-mount housing, KETEK’s SiPM TIA Module offers a plug & play solution for biophotonics and analytical instrumentation. replacing a photomultplier tube (PMT) has never been easier.

Plug & play solution, e.g. for cytometry

Controllable SiPM bias and gain

Bandwidth: 12.5 MHz

Output Polarity: Positive

Compatible with Thorlabs® SM05 optics and common PMT mounts

EXCEPTIONAL LINEARITY & PHOTON RESOLUTION

Coun

t

number of incoming Photons

plug & play

1E+00 1E+01 1E+02 1E+03 1E+04 1E+05

800

600

400

200

0

1E+07

1E+06

1E+05

1E+04

1E+03

1E+02

1E+01

1E+001E+00 1E+01 1E+02 1E+03 1E+04 1E+05 1E+06 1E+07

PM3315-WB linear PM3315-WB light pulse 70 ps PM3315-WB light pulse 1 μs

Integrated traNs-impedaNCe ampLifier and bias sourCe

relative light intensity

num

ber of Detected  Pho

tons

Type Description Dimensions Signal Output Supply Voltage

PETIASiPM module and trans-impedance amplifier with integrated bias source and gain control in metal housing

20 × 50 × 40 mm³coaxial (MCX),

50 Ω termination+ 5 V ... + 12 V DC

KeteK tia ModuleaPPlication exaMPle FloW cYtoMetrYClear peak separation of fluorescent particle intensities due to excellent PDE, low noise and high linearity of the KETEK SiPM TIA Module

The SiPM TIA Module with PM3315-WB shows excellent linear behaviour, both for short and long light pulses.

sipm

aPPlications

Medical iMaging

looking inside the body for early detection and treatment of disease.

Ultra-fast light detection down to single photon level.

Excellent energy resolution for rapid isotope identification.

HigH energY PHYsicsUnderstanding how our universe works at its most fundamental level.

bio- PHotonics

Excellent properties for highest measurement accuracy in the laboratory or at the point-of-care.

sorting & recYcling

Fast and energy resolvent detectors for high through-put sorting facilities.

lidar & 3d-ranging

Hazard & tHreat detection

POSITrOn EMISSIOn TOMOGrAPHy (PET)

GAMMA CAMErA COMPTOn CAMErA InTrAOPErATIVE PrOBES SInGlE PHOTOn EMISSIOn

TOMOGrAPHy (SPECT) OPTICAl TOMOGrAPHy

X-rAy SCAnnInG ArEA MOnITOrS ISOTOPE IDEnTIFIErS rADIATIOn SPECTrOSCOPy DOSE METErS SPECTrOSCOPIC PErSOnAl

rADIATIOn DETECTOrS (SPrD) nEUTrOn DETECTIOn

CAlOrIMETErS TrIGGEr DETECTOrS CHErEnKOV TElESCOPES nEUTrOn DETECTIOn

CyTOMETry TWO-PHOTOn EXCITATIOn

MICrOSCOPy FlUOrESCEnCE AnAlySIS FlUOrESCEnCE lIFETIME

MICrOSCOPy SPECTrOSCOPy

CArGO SCAnnInG SOrTInG & rECyClInG MInInG BOrDEr COnTrOl

DrOnES AUTOnOMOUS VEHIClES CArTOGrAPHy rOBOTICS

Headquarters in MunicH ketek

ketek GmbH Hofer Str. 3 81737 München Germany

www.ketek.net info@ketek.net

phone +49 89 673 467 70 fax +49 89 673 467 77

ISo 9001:2015 Certified

En 55016En 61000

Passau

SalzburgGarmisch Partenkirchen

lindau

Stuttgart

regensburg nuremberg M-Flughafen

99

992

998

99

9696

95

998

995

MuniCH