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Class: Sensor measu Prof: Bruno Ando’ Objectives: Basics for the design measurement systems Contents Basics on sensor Resistive sensors Gauges and RTD Conditioning ele Reactive sensors Conditioning ele Active sensors: T and Ferroelectric Charge amplifier Absolute sensors Prof. B. Andò Examination Colloquium and labora Teaching materials Slides (to be consid available from: http://www2.diees.unict. Books: E. Doebelin: Mesur Pallas-Areny J.G. W Conditioning. Absolute sensors acceleration) Other sensors (Fo Digital sensors a Multi-sensor sys Innovative mater Basics on techno Basics on signal rs and advanced urement systems n and the synthesis of sensors and rs s: potentiometers, Strain D sensors. ectronics for resistive sensors s: capacitive, Inductive, LVDT ectronics for reactive sensors Thermocouples, Piezoelectric c sensors r and measurement amplifier s (displacement, velocity, 1 atory report dered only as a route for contents), .it/users/bando/ando/didattica.html rement systems, Mc Graw Hill; Webster: Sensors and Signal s (displacement, velocity, orce, pressure, flux, etc.) and ultrasound sensor stems and sensor networks rials for sensors ologies for sensors processing

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Page 1: Class: Sensors and advanced measurement systems … · Class: Sensors and measurement systems Prof: Bruno Ando’ Objectives: Basicsforthedesign measurementsystems Contents Basics

Class: Sensors and measurement systems

Prof: Bruno Ando’

Objectives: Basics for the designmeasurement systems

Contents Basics on sensors Resistive sensors: potentiometers, Strain

Gauges and RTD sensors. Conditioning electronics for resistive sensors Reactive sensors: capacitive, Inductive, LVDT Conditioning electronics for reactive sensors Active sensors: Thermocouples, Piezoelectric

and Ferroelectric sensors Charge amplifier and measurement amplifier Absolute sensors (displacement, velocity,

Prof. B. Andò

Examination Colloquium and laboratory report

Teaching materials

Slides (to be considered only as a route for contentsavailable from:

http://www2.diees.unict.it/users/bando/ando/didattica.html

Books: E. Doebelin: Mesurement Pallas-Areny J.G. Webster:

Conditioning.

Absolute sensors (displacement, velocity, acceleration)

Other sensors (Force, pressure, flux, etc.) Digital sensors and ultrasound sensor Multi-sensor systems and sensor networks Innovative materials for sensors Basics on technologies for sensors Basics on signal processing

Sensors and advancedmeasurement systems

design and the synthesis of sensors and

Basics on sensorsResistive sensors: potentiometers, Strain Gauges and RTD sensors. Conditioning electronics for resistive sensorsReactive sensors: capacitive, Inductive, LVDTConditioning electronics for reactive sensorsActive sensors: Thermocouples, Piezoelectric and Ferroelectric sensorsCharge amplifier and measurement amplifier Absolute sensors (displacement, velocity,

1

Colloquium and laboratory report

to be considered only as a route for contents),

://www2.diees.unict.it/users/bando/ando/didattica.html

Mesurement systems, Mc Graw Hill;J.G. Webster: Sensors and Signal

Absolute sensors (displacement, velocity,

Other sensors (Force, pressure, flux, etc.)Digital sensors and ultrasound sensor

sensor systems and sensor networksInnovative materials for sensorsBasics on technologies for sensorsBasics on signal processing

Page 2: Class: Sensors and advanced measurement systems … · Class: Sensors and measurement systems Prof: Bruno Ando’ Objectives: Basicsforthedesign measurementsystems Contents Basics

Environment

Systemunder

measurmentTrasducer

Auxiliary System

Introduction on sensors

Prof. B. Andò

System

•During this course you will learn about:

•Physics of sensors: how the sensor is done.

•Sensing principles and modeling: how the sensor works.

•(Smart)Sensing systems: sensors cooperation and smart signal processing .

•Sensor Applications!

Environment

OUTPUTto

Load/UserTrasducer

Auxiliary System

Introduction on sensors

System

During this course you will learn about:

Physics of sensors: how the sensor is done.

Sensing principles and modeling: how the

(Smart)Sensing systems: sensors cooperation and smart signal processing .

Page 3: Class: Sensors and advanced measurement systems … · Class: Sensors and measurement systems Prof: Bruno Ando’ Objectives: Basicsforthedesign measurementsystems Contents Basics

Sensor applicationsSensor applications

Prof. B. Andò

Sensor applicationsSensor applications

Page 4: Class: Sensors and advanced measurement systems … · Class: Sensors and measurement systems Prof: Bruno Ando’ Objectives: Basicsforthedesign measurementsystems Contents Basics

Parking sensors

Prof. B. Andò

Parking sensors

Page 5: Class: Sensors and advanced measurement systems … · Class: Sensors and measurement systems Prof: Bruno Ando’ Objectives: Basicsforthedesign measurementsystems Contents Basics

Parking sensors

Prof. B. Andò

Parking sensors

Page 6: Class: Sensors and advanced measurement systems … · Class: Sensors and measurement systems Prof: Bruno Ando’ Objectives: Basicsforthedesign measurementsystems Contents Basics

Temperature sensors

Prof. B. Andò

Temperature sensors

Page 7: Class: Sensors and advanced measurement systems … · Class: Sensors and measurement systems Prof: Bruno Ando’ Objectives: Basicsforthedesign measurementsystems Contents Basics

Deformation sensors

Prof. B. Andò

Deformation sensors

Page 8: Class: Sensors and advanced measurement systems … · Class: Sensors and measurement systems Prof: Bruno Ando’ Objectives: Basicsforthedesign measurementsystems Contents Basics

Smartphones

Prof. B. Andò

Smartphones

Page 9: Class: Sensors and advanced measurement systems … · Class: Sensors and measurement systems Prof: Bruno Ando’ Objectives: Basicsforthedesign measurementsystems Contents Basics

Smartphones

Prof. B. Andò

Smartphones

Page 10: Class: Sensors and advanced measurement systems … · Class: Sensors and measurement systems Prof: Bruno Ando’ Objectives: Basicsforthedesign measurementsystems Contents Basics

The smartphone is a terminal…..

The smartphone is a terminal…..

Page 11: Class: Sensors and advanced measurement systems … · Class: Sensors and measurement systems Prof: Bruno Ando’ Objectives: Basicsforthedesign measurementsystems Contents Basics

Transducers convert aelectrical quantity, with obvious

HOW? It’s a Sensing Methodology

An example: a seismicconverts inertial quantities

Transducers

Prof. B. Andò

a physical quantity in aobvious adavntages…

HOW? Methodology issue!!

seismic sensor whichquantities into a displacement.

Transducers

Page 12: Class: Sensors and advanced measurement systems … · Class: Sensors and measurement systems Prof: Bruno Ando’ Objectives: Basicsforthedesign measurementsystems Contents Basics

Seismic sensor: the model

Transducers

Prof. B. Andò

oi

m

mm

xxM

xx

xBxM

B(xm-xi)

model

Transducers

oso

oi

imsi

xkxB

xx

xxkx

M

xm

Ks(xm-xi)

Page 13: Class: Sensors and advanced measurement systems … · Class: Sensors and measurement systems Prof: Bruno Ando’ Objectives: Basicsforthedesign measurementsystems Contents Basics

2

i

o

i

o

ss

xs

xs

x

x

An example: seismic sensors

..as a acceleration sensor

Prof. B. Andò

22 2

1

nnss

sensors

sensor..

Page 14: Class: Sensors and advanced measurement systems … · Class: Sensors and measurement systems Prof: Bruno Ando’ Objectives: Basicsforthedesign measurementsystems Contents Basics

ss

ss

x

x

ni

o

n2 22

2

An example: seismic sensors

..as a displacement sensor

Prof. B. Andò

MK

B

M

K

s

sn

2,

sensors

sensor..

Page 15: Class: Sensors and advanced measurement systems … · Class: Sensors and measurement systems Prof: Bruno Ando’ Objectives: Basicsforthedesign measurementsystems Contents Basics

i

o

i

o

ss

sx

xs

x

x

An example: seismic sensors

..as a velocity sensor..

Prof. B. Andò

22 2 nnss

s

sensors

Page 16: Class: Sensors and advanced measurement systems … · Class: Sensors and measurement systems Prof: Bruno Ando’ Objectives: Basicsforthedesign measurementsystems Contents Basics

How to realize sensors?How to realize sensors?It’s a TechnologyIt’s a Technology

••PCBPCB

••MicroMicro--technology: technology:

MicromachinedMicromachined

Inertial SensorsInertial Sensors

••NanoNano--technology: technology:

Prof. B. Andò

••Screen printingScreen printing

••Inkjet Printing: Inkjet Printing: IJP sensorsIJP sensors

How to realize sensors?How to realize sensors?It’s a TechnologyIt’s a Technology issues!issues!

technology: technology: MEMSMEMS

technology: technology: NANO SensorsNANO Sensors

IJP sensorsIJP sensors

Page 17: Class: Sensors and advanced measurement systems … · Class: Sensors and measurement systems Prof: Bruno Ando’ Objectives: Basicsforthedesign measurementsystems Contents Basics

How to realize sensors?How to realize sensors?

It’s a TechnologyIt’s a Technology

Prof. B. Andò

How to realize sensors?How to realize sensors?

It’s a TechnologyIt’s a Technology issues!issues!

Page 18: Class: Sensors and advanced measurement systems … · Class: Sensors and measurement systems Prof: Bruno Ando’ Objectives: Basicsforthedesign measurementsystems Contents Basics

MEMS MEMS

Prof. B. Andò

MEMS MEMS

18

Page 19: Class: Sensors and advanced measurement systems … · Class: Sensors and measurement systems Prof: Bruno Ando’ Objectives: Basicsforthedesign measurementsystems Contents Basics

MEMS MEMS

Prof. B. Andò

MEMS MEMS

19

Page 20: Class: Sensors and advanced measurement systems … · Class: Sensors and measurement systems Prof: Bruno Ando’ Objectives: Basicsforthedesign measurementsystems Contents Basics

MEMS MEMS

Prof. B. Andò

MEMS MEMS

20

Page 21: Class: Sensors and advanced measurement systems … · Class: Sensors and measurement systems Prof: Bruno Ando’ Objectives: Basicsforthedesign measurementsystems Contents Basics

MEMS MEMS

Prof. B. Andò

MEMS MEMS

21

Page 22: Class: Sensors and advanced measurement systems … · Class: Sensors and measurement systems Prof: Bruno Ando’ Objectives: Basicsforthedesign measurementsystems Contents Basics

MEMS MEMS

Prof. B. Andò

MEMS MEMS

22

Page 23: Class: Sensors and advanced measurement systems … · Class: Sensors and measurement systems Prof: Bruno Ando’ Objectives: Basicsforthedesign measurementsystems Contents Basics

MEMS MEMS

Prof. B. Andò

MEMS MEMS

23

Page 24: Class: Sensors and advanced measurement systems … · Class: Sensors and measurement systems Prof: Bruno Ando’ Objectives: Basicsforthedesign measurementsystems Contents Basics

MEMS MEMS

Prof. B. Andò

MEMS MEMS

24

Page 25: Class: Sensors and advanced measurement systems … · Class: Sensors and measurement systems Prof: Bruno Ando’ Objectives: Basicsforthedesign measurementsystems Contents Basics

IfFL

SG1

200 m

MEMS MEMS

Prof. B. Andò

BIf FL

SG2

T

MEMS MEMS

Page 26: Class: Sensors and advanced measurement systems … · Class: Sensors and measurement systems Prof: Bruno Ando’ Objectives: Basicsforthedesign measurementsystems Contents Basics

How to realize?How to realize?

TechnologyTechnology

MEMSMEMS

MicromachinedMicromachined

Prof. B. Andò

SEM image: interdigitated comb

SEM image: vertical resonator

SEM image: vertical

How to realize?How to realize?

TechnologyTechnology issues!issues!

MEMSMEMS

MicromachinedMicromachined Inertial SensorsInertial Sensors

SEM image: vertical resonator

SEM image: magnetic torsional coils

Page 27: Class: Sensors and advanced measurement systems … · Class: Sensors and measurement systems Prof: Bruno Ando’ Objectives: Basicsforthedesign measurementsystems Contents Basics

If

If FL

FL

SG1

200 m

An example….An example….

MEMS MEMS -- MicromachinedMicromachinedSensorsSensors

Prof. B. Andò

If

FSG1

SG2

B

SG2

T

An example….An example….

MicromachinedMicromachined Inertial Inertial SensorsSensors

27

BIf

FL

FL SG3

SG4

Page 28: Class: Sensors and advanced measurement systems … · Class: Sensors and measurement systems Prof: Bruno Ando’ Objectives: Basicsforthedesign measurementsystems Contents Basics

InkJet Printed Sensors

Prof. B. Andò

InkJet Printed Sensors

Page 29: Class: Sensors and advanced measurement systems … · Class: Sensors and measurement systems Prof: Bruno Ando’ Objectives: Basicsforthedesign measurementsystems Contents Basics

Natura del segnaled’uscita

Chimico

... ... ...

Meccanico

Natura del segnaled’uscita

Chimico

... ... ...

Meccanico

Sensors classification

•Output format•Type of Measurand•Readout strategy

Prof. B. Andò

Natura del misurando

Spostamento

Pressione

Termica

Chimica

... ... ... ...

... ... ... ...Res

istivoElettrico

... ... ...

Natura del misurando

Spostamento

Pressione

Termica

Chimica

... ... ... ...

... ... ... ...Res

istivoElettrico

... ... ...

segnale

Capac

itivo

Self gen

eratin

g

Self gen

eratin

g

segnale

Capac

itivo

Self gen

eratin

g

Self gen

eratin

g

classification

Measurand

Naturadel

sensore

Resist

ivo

Capac

itivo

Indu

ttivo

Ottico

... ...

...

Self gen

eratin

g

Self gen

eratin

g

Naturadel

sensore

Resist

ivo

Capac

itivo

Indu

ttivo

Ottico

... ...

...

Self gen

eratin

g

Self gen

eratin

g

29

Page 30: Class: Sensors and advanced measurement systems … · Class: Sensors and measurement systems Prof: Bruno Ando’ Objectives: Basicsforthedesign measurementsystems Contents Basics

International Vocabulary Metrology Basic and

General Concepts and Associated Terms (VIM)3rd Edition

Vocabulaire international de métrologie Concepts fondamentaux et généraux

et termes associés (VIM)3ème Édition

Prof. B. Andò

International Vocabulary of Metrology Basic and

General Concepts and Associated Terms (VIM)3rd Edition

Vocabulaire international de métrologie Concepts fondamentaux et généraux

et termes associés (VIM)3ème Édition

Page 31: Class: Sensors and advanced measurement systems … · Class: Sensors and measurement systems Prof: Bruno Ando’ Objectives: Basicsforthedesign measurementsystems Contents Basics

Prof. B. Andò

Page 32: Class: Sensors and advanced measurement systems … · Class: Sensors and measurement systems Prof: Bruno Ando’ Objectives: Basicsforthedesign measurementsystems Contents Basics

Prof. B. Andò

Page 33: Class: Sensors and advanced measurement systems … · Class: Sensors and measurement systems Prof: Bruno Ando’ Objectives: Basicsforthedesign measurementsystems Contents Basics

JCGM ForewordIn 1997 the Joint Committee for Guides in Metrology (JCGM), chaired by the Director of the BIPM, was formed by the seven International Organizations that had prepared the original versions of the Guide to the Expression of Uncertainty in Measurement (GUM) and the International Vocabulary of Basic and General Terms in Metrology (VIM).

The Joint Committee was originally made up of representatives from the •International Bureau of Weights and Measures (BIPM), the•International Electrotechnical Commission (IEC),• the International Federation of Clinical Chemistry and•Laboratory Medicine (IFCC),• the International Organization for Standardization (ISO), •the InternationalUnion of Pure and Applied Chemistry

VIM

Prof. B. Andò

•the InternationalUnion of Pure and Applied Chemistry (IUPAC), •the International Union of Pure and Applied Physics (IUPAP), •the International Organization of Legal Metrology (OIML).

In 2005, the International Laboratory Accreditation Cooperation (ILAC) officially joined the seven founding internationalorganizations.

In 1997 the Joint Committee for Guides in Metrology (JCGM), chaired by the Director of the BIPM, was formed by the seven International Organizations that had prepared the original versions of the Guide to the Expression of Uncertainty in Measurement (GUM) and the International Vocabulary of Basic and General Terms in Metrology (VIM).

was originally made up of

International Bureau of Weights and Measures (BIPM), theInternational Electrotechnical Commission (IEC),the International Federation of Clinical Chemistry and

the International Organization for Standardization (ISO), the InternationalUnion of Pure and Applied Chemistry the InternationalUnion of Pure and Applied Chemistry

the International Union of Pure and Applied Physics (IUPAP), the International Organization of Legal Metrology (OIML).

In 2005, the International Laboratory Accreditation Cooperation (ILAC) officially joined the seven founding international

Page 34: Class: Sensors and advanced measurement systems … · Class: Sensors and measurement systems Prof: Bruno Ando’ Objectives: Basicsforthedesign measurementsystems Contents Basics

VIM

Prof. B. Andò

Page 35: Class: Sensors and advanced measurement systems … · Class: Sensors and measurement systems Prof: Bruno Ando’ Objectives: Basicsforthedesign measurementsystems Contents Basics

1.2 kind of quantityKind: aspect common to mutually comparable

EXAMPLEThe quantities diameter, circumference, and wavelength are generally considered to be quantities of the same kind, namely, of the kind of quantity called length.

Note 2 Quantities of the same kind within a given quantities have the same quantity dimension.

1.3 system of quantitiesset of quantities together with a set of nonequations relating those quantities

1.4 base quantity

VIM

Prof. B. Andò

1.4 base quantityquantity in a conventionally chosen subset of a given system of quantities, where no subset quantity can beexpressed in terms of the others

Note 1 The subset mentioned in the definition is termed the “set of base quantities”.

1.5 derived quantityquantity, in a system of quantities, defined in terms of the base quantities of that systemEXAMPLEIn a system of quantities having the base quantities length and mass, mass density is a derived quantity defined as the quotient of mass and volume (length to the third power).

aspect common to mutually comparable quantities

The quantities diameter, circumference, and wavelength are generally considered to be quantities of the same kind, namely, of the kind of quantity called length.

Note 2 Quantities of the same kind within a given system of quantities have the same quantity dimension.

quantities together with a set of non-contradictory equations relating those quantities

quantity in a conventionally chosen subset of a given system of quantities, where no subset quantity can be

Note 1 The subset mentioned in the definition is termed the

quantity, in a system of quantities, defined in terms of the base quantities of that system

In a system of quantities having the base quantities length and mass, mass density is a derived quantity defined as the quotient of mass and volume (length to the third power).

Page 36: Class: Sensors and advanced measurement systems … · Class: Sensors and measurement systems Prof: Bruno Ando’ Objectives: Basicsforthedesign measurementsystems Contents Basics

1.6 International System of Quantities ISQsystem of quantities based on the seven base quantities length, mass, time, electric current, thermodynamictemperature, amount of substance, and luminous intensity

Note 1 This system of quantities is published in the ISO 80000 and IEC 80000 series Quantities and units.Note 2 The International System of Units (SI), see item 1.16, is based on the ISQ.

……

1.9 measurement unit (unit of measurement)real scalar quantity, defined and adopted by convention, with which any other quantity of the same kind can express the ratio of the two quantities as a number

1.10 base unit

VIM

Prof. B. Andò

1.10 base unitmeasurement unit that is adopted by convention for a base quantity

EXAMPLEIn the SI, the metre is the base unit of length. In the CGS systems the centimetre is the base unit of length.

1.11 derived unitmeasurement unit for a derived quantity

EXAMPLESThe metre per second, symbol m/s, and the centimetre per second, symbol cm/s, are derived units of speed in the hour, symbol km/h, is a measurement unit of speed outside the SI but accepted for use with the SI.

1.6 International System of Quantities ISQseven base quantities

length, mass, time, electric current, thermodynamictemperature, amount of substance, and luminous intensity

Note 1 This system of quantities is published in the ISO 80000 and IEC 80000 series Quantities and units.

International System of Units (SI), see item 1.16, is

unit of measurement)quantity, defined and adopted by convention, with

which any other quantity of the same kind can be compared to express the ratio of the two quantities as a number

measurement unit that is adopted by convention for a base

SI, the metre is the base unit of length. In the CGS systems length.

measurement unit for a derived quantity

The metre per second, symbol m/s, and the centimetre per second, symbol cm/s, are derived units of speed in the SI. The kilometre per hour, symbol km/h, is a measurement unit of speed outside the SI

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1.16 International System of Units (SI)system of units based on the International System of Quantities, their names and symbols, including aseries of prefixes and their names and symbols, together with rules for their use, adopted by the General Conference on Weights and Measures (CGPM)

Note 1 The SI is founded on the seven ISQ and the names and symbols of the units that are contained in the following table.

VIM

Prof. B. Andò

1.19 quantity valuevalue of a quantitynumber and reference together expressing magnitude of a quantity

1.16 International System of Units (SI)system of units based on the International System of Quantities, their names and symbols, including aseries of prefixes and their names and symbols, together with rules for their use, adopted by the General Conference on

Note 1 The SI is founded on the seven base quantities of the ISQ and the names and symbols of the corresponding base units that are contained in the following table.

number and reference together expressing magnitude of a

Page 38: Class: Sensors and advanced measurement systems … · Class: Sensors and measurement systems Prof: Bruno Ando’ Objectives: Basicsforthedesign measurementsystems Contents Basics

2.1 measurementprocess of experimentally obtainingcan reasonably be attributed to a

Note 3 Measurement presupposescommensurate with the intended usemeasurement procedure, and aoperating according to the specifiedincluding the measurement conditions

2.2 metrologyscience of measurement and its application

Note Metrology includes all theoreticalmeasurement, whatever the measurementapplication.

2.3 measurand

VIM

Prof. B. Andò

2.3 measurandquantity intended to be measuredNote 1 The specification of a measurandkind of quantity, description ofbody, or substance carrying thecomponent, and the chemical entities

Note 3 The measurement, includingconditions under which the measurementthe phenomenon, body, or substancemeasured may differ from the measurandadequate correction is necessary.

EXAMPLESa) The potential difference betweendecrease when using a voltmeterconductance to perform the measurementdifference can be calculated from theand the voltmeter.

one or more quantity values thatquantity

presupposes a description of the quantityuse of a measurement result, aa calibrated measuring system

specified measurement procedure,conditions.

application

theoretical and practical aspects ofmeasurement uncertainty and field of

measuredmeasurand requires knowledge of the

of the state of the phenomenon,quantity, including any relevant

entities involved.

including the measuring system and themeasurement is carried out, might change

substance such that the quantity beingmeasurand as defined. In this case

between the terminals of a battery mayvoltmeter with a significant internalmeasurement. The opencircuit potential

the internal resistances of the battery

Page 39: Class: Sensors and advanced measurement systems … · Class: Sensors and measurement systems Prof: Bruno Ando’ Objectives: Basicsforthedesign measurementsystems Contents Basics

2.4 measurement principlephenomenon serving as the basis of a

EXAMPLESa) Thermoelectric effect applied to the measurement of temperature.

2.5 measurement methodgeneric description of a logical organization of operations used in a measurement

Note Measurement methods may be qualified in various ways such as:• substitution measurement method• differential measurement method, and• null measurement method;or• direct measurement method, and• indirect measurement method.

VIM

Prof. B. Andò

2.6 measurement proceduredetailed description of a measurement according to one or more measurement principles and to a given measurement method, based on a measurement model and including any calculation to obtain a measurement result

Note 2 A measurement procedure can include a statement concerning a target measurement uncertainty.

2.7 reference measurement proceduremeasurement procedure accepted as providing measurement results fit for their intended use in assessing measurement trueness of measured quantity values obtained from other measurement procedures for quantities of the same kind, in calibration, or in characterizing reference materials.

phenomenon serving as the basis of a measurement

Thermoelectric effect applied to the measurement of temperature.

generic description of a logical organization of operations used in a

Note Measurement methods may be qualified in various ways such as:method,

, and

measurement according to one or more measurement principles and to a given measurement method, based on a measurement model and including any calculation to

Note 2 A measurement procedure can include a statement concerning target measurement uncertainty.

proceduremeasurement procedure accepted as providing measurement results fit for their intended use in assessing measurement trueness of measured quantity values obtained from other measurement procedures for quantities of the same kind, in calibration, or in characterizing reference materials.

Page 40: Class: Sensors and advanced measurement systems … · Class: Sensors and measurement systems Prof: Bruno Ando’ Objectives: Basicsforthedesign measurementsystems Contents Basics

2.9 measurement resultset of quantity values being attributed to a measurand together with any other available relevant

Note 1 A measurement result generally contains “relevant information” about the set of quantity values, such that some may be more representative of the measurand than others. This may be expressed in the form of a probability density function (PDF).

Note 2 A measurement result is generally expressed as a single quantity value and a measurement uncertainty. If the measurement uncertainty is considered to be negligible for some measurement result may be expressed as a single measured quantity value. In many fields, this is the common way of expressing a measurement result.

2.10 measured quantity valuequantity value representing a measurement result

VIM

Prof. B. Andò

Note 1 For a measurement involving replicate indications, each indication can be used to provide a corresponding measured quantity value. This set of individual measured quantity values can be used to calculate a resulting measured quantity value, such as an average or median, usually with a decreased associated measurement uncertainty.

Note 4 In the GUM, the terms “result of measurement” and “estimate of the value of the measurand” or just “estimate of the measurand” are used for ‘measured quantity value’.

quantity values being attributed to a measurand together with any other available relevant information

Note 1 A measurement result generally contains “relevant information” about the such that some may be more representative of the

measurand than others. This may be expressed in the form of a probability

Note 2 A measurement result is generally expressed as a single measured measurement uncertainty. If the measurement

uncertainty is considered to be negligible for some purpose, the measurement result may be expressed as a single measured quantity value. In many fields, this is the common way of expressing a measurement result.

quantity value representing a measurement result

measurement involving replicate indications, each indication corresponding measured quantity value. This set of

individual measured quantity values can be used to calculate a resulting measured quantity value, such as an average or median, usually with a

measurement uncertainty.

Note 4 In the GUM, the terms “result of measurement” and “estimate of the value “estimate of the measurand” are used for ‘measured

Page 41: Class: Sensors and advanced measurement systems … · Class: Sensors and measurement systems Prof: Bruno Ando’ Objectives: Basicsforthedesign measurementsystems Contents Basics

2.11 true quantity value (true value)quantity value consistent with the definition of a quantity

Note 1 In the Error Approach to describing is considered unique and, in practice, unknowable. The Uncertainty Approach is to recognize that, owing to the inherently incomplete amount of detail in the definition of a quantity, there is not a single true quantity value but rather a set of true quantity values consistent with the definition.However, this set of values is, in principle and in practice, unknowable.

Note 2 In the special case of a fundamental constant, the quantity is considered to have a single true quantity value.

Note 3 When the definitional uncertainty associated with the measurand is considered to be negligible compared to the other components of the measurement uncertainty, the measurand may be “essentially unique” true quantity value. This is the approach taken by the GUM and associated documents, where the word “true” is considered to be redundant.

VIM

Prof. B. Andò

true value)quantity value consistent with the definition of a quantity

In the Error Approach to describing measurement, a true quantity value practice, unknowable. The Uncertainty Approach

inherently incomplete amount of detail in the , there is not a single true quantity value but rather a set

of true quantity values consistent with the definition.However, this set of values is, in principle and in practice, unknowable.

Note 2 In the special case of a fundamental constant, the quantity is considered

definitional uncertainty associated with the measurand is compared to the other components of the

measurement uncertainty, the measurand may be considered to have an “essentially unique” true quantity value. This is the approach taken by the GUM and associated documents, where the word “true” is considered to be redundant.

Page 42: Class: Sensors and advanced measurement systems … · Class: Sensors and measurement systems Prof: Bruno Ando’ Objectives: Basicsforthedesign measurementsystems Contents Basics

2.13 measurement accuracycloseness of agreement between a and a true quantity value of a measurand

Note 1 The concept ‘measurement accuracy’ is not a a numerical quantity value.A measurement is said to be more accurate when it offers a smaller measurement error.

Note 3 ‘Measurement accuracy’ is sometimes understood as closeness of agreement between measured quantity values that are being attributed to the measurand.

2.15 measurement precision (precision)closeness of agreement between quantity values obtained by replicate measurements on the same or similar objects under specified conditions

VIM

Prof. B. Andò

the same or similar objects under specified conditions

Note 1 Measurement precision is usually expressed numerically by measures of imprecision, such as standard deviation, variance, or coefficient of variation under the specified conditions of measurement.

Note 2 The ‘specified conditions’ can be, for example, of measurement, intermediate precision conditions of measurement, or reproducibility conditions of measurement

Note 3 Measurement precision is used to define intermediate measurement precision, and measurement reproducibility.

Note 4 Sometimes ‘measurement precision’ is erroneously used to mean measurement accuracy.

closeness of agreement between a measured quantity value and a true quantity value of a measurand

Note 1 The concept ‘measurement accuracy’ is not a quantity and is not given

measurement is said to be more accurate when it offers a smaller

Note 3 ‘Measurement accuracy’ is sometimes understood as closeness of quantity values that are being attributed to the

precision)closeness of agreement between indications or measured quantity values obtained by replicate measurements on the same or similar objects under specified conditionsthe same or similar objects under specified conditions

Note 1 Measurement precision is usually expressed numerically by measures of standard deviation, variance, or coefficient of variation

measurement.

Note 2 The ‘specified conditions’ can be, for example, repeatability conditions intermediate precision conditions of measurement, or

measurement

Note 3 Measurement precision is used to define measurement repeatability, precision, and measurement reproducibility.

Note 4 Sometimes ‘measurement precision’ is erroneously used to mean

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2.16 measurement errormeasured quantity value minus a reference quantity value

Note 1 The concept of ‘measurement error’ can be used botha) when there is a single reference quantity value to refer to, which occurs if a

calibration is made by means of a measurement standard with a measured quantity value having a or if a conventional quantity value is given, in measurement error is known, and

b) if a measurand is supposed to be represented by a unique true quantity value or a set of true quantity values of negligible range, in which case the measurement error is not known.

2.17 systematic measurementcomponent of measurement error that in replicate measurements remains constant or varies in a manner

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manner

Note 2 Systematic measurement error, and its causes, can be known or unknown. A correction can be applied to compensate for a known systematic measurement error.

Note 3 Systematic measurement error equals measurement error minus measurement error.

2.18 measurement biasestimate of a systematic measurement error

2.19 random measurement errorcomponent of measurement error that in replicate measurements varies in an unpredictable manner

Note 1 A reference quantity value for a random measurement error is the average that would ensue from an infinite number of replicate measurements of the same measurand.

measured quantity value minus a reference quantity value

Note 1 The concept of ‘measurement error’ can be used bothwhen there is a single reference quantity value to refer to, which occurs if a

measurement standard with a measured quantity value having a negligible measurement uncertainty or if a conventional quantity value is given, in which case the

is supposed to be represented by a unique true quantity true quantity values of negligible range, in which case the

measurement errormeasurement error that in replicate

measurements remains constant or varies in a predictable

Note 2 Systematic measurement error, and its causes, can be known or applied to compensate for a known systematic

Note 3 Systematic measurement error equals measurement error minus random

systematic measurement error

errormeasurement error that in replicate

measurements varies in an unpredictable manner

reference quantity value for a random measurement error is the an infinite number of replicate measurements of

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2.20 repeatability condition of measurementcondition of measurement, out of a set of conditions that includes the same measurement procedure, sameoperators, same measuring system, same operating conditions and same location, and replicate measurements on the same or similar objects over a short period of time

2.24 reproducibility condition of measurementcondition of measurement, out of a set of conditions that includes different locations, operators, measuring systems, and replicate measurements on the same or similar objects

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repeatability condition of measurementcondition of measurement, out of a set of conditions that includes the same measurement procedure, sameoperators, same measuring system, same operating conditions and same location, and replicate measurements on the same

short period of time

2.24 reproducibility condition of measurementcondition of measurement, out of a set of conditions that includes different locations, operators, measuring systems, and replicate measurements on the same or similar objects

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2.26 measurement uncertaintynon-negative parameter characterizing the dispersion of the values being attributed to a measurand, based on the information used

Note 1 Measurement uncertainty includes components arising from systematic effects, such as components associated with quantity values of measurement standards, as well as uncertainty. Sometimes estimated systematic effects are not corrected for but, instead, associated measurement uncertainty components are incorporated.

Note 2 The parameter may be, for example, a standard deviation called standard measurement uncertainty (or a specified multiple of it), or the halfwidth of an interval, having a stated coverage

Note 3 Measurement uncertainty comprises, in general, many components. Some of these may be evaluated by Type A evaluation of measurement uncertainty from the statistical distribution of the quantity of measurements and can be characterized by standard deviations. The other components, which may be evaluated by

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other components, which may be evaluated by measurement uncertainty, can also be characterized by standard deviations, evaluated from probability density functions based on information.

Note 4 In general, for a given set of information, it is understood that the measurement uncertainty is associated with a stated quantity value attributed to the measurand. A modification of this value results in a modification of the associated uncertainty.

2.27 definitional uncertainty component of measurement uncertainty resulting from the finite amount of detail in the definition of a

Note 1 Definitional uncertainty is the practical minimum measurement uncertainty achievable in any measurement of a given measurand.

Note 2 Any change in the descriptive detail leads to another definitional uncertainty.

Note 3 In the GUM:1995, D.3.4, and in IEC 60359 the concept ‘definitional uncertainty’ is termed “intrinsic uncertainty”. .

2.26 measurement uncertaintynegative parameter characterizing the dispersion of the quantity

values being attributed to a measurand, based on the information

Note 1 Measurement uncertainty includes components arising from systematic effects, such as components associated with corrections and the assigned quantity values of measurement standards, as well as the definitional uncertainty. Sometimes estimated systematic effects are not corrected for

instead, associated measurement uncertainty components are incorporated.

Note 2 The parameter may be, for example, a standard deviation called standard measurement uncertainty (or a specified multiple of it), or the half-width of an interval, having a stated coverage probability.

Note 3 Measurement uncertainty comprises, in general, many components. Type A evaluation of measurement

uncertainty from the statistical distribution of the quantity values from series measurements and can be characterized by standard deviations. The

components, which may be evaluated by Type B evaluation of components, which may be evaluated by Type B evaluation of be characterized by standard deviations,

evaluated from probability density functions based on experience or other

Note 4 In general, for a given set of information, it is understood that the measurement uncertainty is associated with a stated quantity value attributed to the measurand. A modification of this value results in a modification of the

measurement uncertainty resulting from the finite amount of detail in the definition of a measurand

Note 1 Definitional uncertainty is the practical minimum measurement uncertainty measurement of a given measurand.

Note 2 Any change in the descriptive detail leads to another definitional

Note 3 In the GUM:1995, D.3.4, and in IEC 60359 the concept ‘definitional uncertainty”. .

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2.28 Type A evaluation of measurement uncertaintyevaluation of a component of measurement uncertainty by a statistical analysis of measured quantity values obtained under defined measurement conditions

Note 1 For various types of measurement conditions, see of measurement, intermediate precision condition of measurement, and reproducibility condition of measurement.

Note 2 For information about statistical analysis, see e.g. the GUM:1995.

2.29 Type B evaluation of measurement uncertainty evaluation of a component of measurement uncertainty determined by means other than a Type A measurement uncertainty

EXAMPLESEvaluation based on information

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Evaluation based on information• associated with authoritative published quantity values,• associated with the quantity value of a certified reference material,• obtained from a calibration certificate,• about drift,• obtained from the accuracy class of a verified measuring instrument,• obtained from limits deduced through personal experience.

2.30 standard measurement uncertaintymeasurement uncertainty expressed as a standard deviation

2.31 combined standard measurement uncertaintystandard measurement uncertainty that is obtained using the individual standard measurement uncertainties associated with the input quantities in a measurement model

2.32 relative standard measurement uncertaintystandard measurement uncertainty divided by the absolute value of the measured quantity value.

Type A evaluation of measurement uncertaintymeasurement uncertainty by a

statistical analysis of measured quantity values obtained under defined measurement conditions

Note 1 For various types of measurement conditions, see repeatability condition intermediate precision condition of measurement, and

measurement.

Note 2 For information about statistical analysis, see e.g. the GUM:1995.

Type B evaluation of measurement uncertainty measurement uncertainty

determined by means other than a Type A evaluation of

quantity values,certified reference material,

accuracy class of a verified measuring instrument,• obtained from limits deduced through personal experience.

2.30 standard measurement uncertaintymeasurement uncertainty expressed as a standard deviation

2.31 combined standard measurement uncertaintystandard measurement uncertainty that is obtained using the individual standard measurement uncertainties associated with the input quantities

2.32 relative standard measurement uncertaintydivided by the absolute value of the

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2.36 coverage intervalinterval containing the set of true quantity values of a measurand with a stated probability, based on the information available

2.37 coverage probabilityprobability that the set of true quantity values of a measurand is contained within a specified coverage

2.39 calibrationoperation that, under specified conditions, in a first step ìestablishes a relation between the quantity values provided by measurement standards and corresponding indications with associated measurement uncertainties and, in a second step, uses this information to establish a relation for obtaining a result from an indication

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Note 1 A calibration may be expressed by a statement, calibration function, calibration diagram, calibration curve, or calibration table. In some cases it may consist of an additive or multiplicative correction of the indication with associated measurement uncertainty.

Note 2 Calibration should not be confused with system, often mistakenly called “self-calibration”, nor with calibration.

Note 3 Often, the first step alone in the above definition is perceived as being calibration.

2.44 verificationprovision of objective evidence that a given item fulfils specified requirements

2.45 validationverification, where the specified requirements are adequate for an intended use

true quantity values of a measurand with a stated probability, based on the

true quantity values of a measurand is contained within a specified coverage interval

operation that, under specified conditions, in a first step ìestablishes a quantity values with measurement uncertainties

provided by measurement standards and corresponding indications associated measurement uncertainties and, in a second step, uses

this information to establish a relation for obtaining a measurement

Note 1 A calibration may be expressed by a statement, calibration function, calibration curve, or calibration table. In some cases it

may consist of an additive or multiplicative correction of the indication with

Note 2 Calibration should not be confused with adjustment of a measuring calibration”, nor with verification of

Note 3 Often, the first step alone in the above definition is perceived as being

provision of objective evidence that a given item fulfils specified

verification, where the specified requirements are adequate for an

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2.47 metrological compatibility of measurement resultsmetrological compatibility property of a set of measurement results for a specified measurand, such that the absolute value of the difference of any pair of measured quantity values from two different measurement results is smaller than some chosen multiple of the standard measurement uncertainty of that difference

2.48 measurement modelmathematical relation among all quantities known to be involved in a measurement

2.49 measurement functionfunction of quantities, the value of which, when calculated using known quantity values for the input quantities in a measurement model, is a measured quantity value of the output quantity in the

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model, is a measured quantity value of the output quantity in the measurement model

2.52 influence quantityquantity that, in a direct measurement, does not affect the quantity that is actually measured, but affects the relation between the indication and the measurement result

metrological compatibility of measurement resultsproperty of a set of measurement

results for a specified measurand, such that the absolute value of the difference of any pair of measured quantity values from two different measurement results is smaller than some chosen multiple of the standard measurement uncertainty of that

mathematical relation among all quantities known to be involved

function of quantities, the value of which, when calculated using known quantity values for the input quantities in a measurement model, is a measured quantity value of the output quantity in the model, is a measured quantity value of the output quantity in the

quantity that, in a direct measurement, does not affect the quantity that is actually measured, but affects the relation between the indication and the measurement result

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Chapter 3: Devices for measurement3.1 measuring instrumentdevice used for making measurements, alone or in conjunction with one or more supplementary devices

3.2 measuring systemset of one or more measuring instruments and often other devices, including any reagent and supply, assembled and adapted to give information used to generate measured quantity values within specified intervals for quantities of specified kinds

3.3 indicating measuring instrumentmeasuring instrument providing an output signal carrying information about the value of the quantity being measuredEXAMPLESa) Voltmeter,b) micrometer,c) thermometer,d) electronic balance.

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d) electronic balance.

Note 2 An output signal may be presented in visual or acoustic form. It may also be transmitted to one or more other devices.

3.4 displaying measuring instrumentindicating measuring instrument where the output signal is presented in visual form

3.5 scale of a displaying measuring instrumentpart of a displaying measuring instrument, consisting of an ordered set of marks together with any associated quantity values

3.8 sensorelement of a measuring system that is directly affected by a phenomenon, body, or substance carrying a

Chapter 3: Devices for measurement

device used for making measurements, alone or in conjunction with one

set of one or more measuring instruments and often other devices, including any reagent and supply, assembled and adapted to give information used to generate measured quantity values within specified intervals for quantities of specified kinds

3.3 indicating measuring instrumentmeasuring instrument providing an output signal carrying information

being measured

Note 2 An output signal may be presented in visual or acoustic form. It may also be

3.4 displaying measuring instrumentindicating measuring instrument where the output signal is presented in

scale of a displaying measuring instrumentpart of a displaying measuring instrument, consisting of an ordered set of

associated quantity values

element of a measuring system that is directly affected by a phenomenon, body, or substance carrying a quantity to be measured

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3.11 adjustment of a measuring systemset of operations carried out on a measuring system so that it provides prescribed indications corresponding to given values of a quantity to be measured

Note 1 Types of adjustment of a measuring system include measuring system, offset adjustment, and span adjustment (sometimes called gain adjustment).

Note 2 Adjustment of a measuring system should not be confused with which is a prerequisite for adjustment.

Note 3 After an adjustment of a measuring system, the measuring system usually must be recalibrated.

3.12 zero adjustment of a measuring systemadjustment of a measuring system so that it provides a null indication corresponding to a zero value of a

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Prof. B. Andò

indication corresponding to a zero value of a measured

adjustment of a measuring systemset of operations carried out on a measuring system so that it provides prescribed indications corresponding to given values of

Note 1 Types of adjustment of a measuring system include zero adjustment of a adjustment, and span adjustment (sometimes called

Note 2 Adjustment of a measuring system should not be confused with calibration,

Note 3 After an adjustment of a measuring system, the measuring system usually

zero adjustment of a measuring systemadjustment of a measuring system so that it provides a null indication corresponding to a zero value of a quantity to be indication corresponding to a zero value of a quantity to be

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Chapter 4: Properties of measuring devices

4.1 indicationquantity value provided by a measuring instrument or a measuring system

Note 1 An indication may be presented in visual or acoustic form or may be transferred to another device.An indication is often given by the position of a pointer on the display for analog outputs, a displayed or printed number for digital outputs, a code pattern for code outputs, or an assigned quantity value for

Note 2 An indication and a corresponding value of the are not necessarily values of quantities of the same

4.3 indication intervalset of quantity values bounded by extreme possible indications

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set of quantity values bounded by extreme possible indications

Note 1 An indication interval is usually stated in terms of its smallest and greatest quantity values, for example, “99 V to 201 V”.

Note 2 In some fields the term is “range of indications”.

4.7 measuring interval (working interval)set of values of quantities of the same kind that can be measured by a given measuring instrument or measuring system with specified instrumental uncertainty, under defined conditions

Note 1 In some fields the term is “measuring range” or “measurement range”.

Note 2 The lower limit of a measuring interval should not be confused with detection limit.

Chapter 4: Properties of measuring devices

quantity value provided by a measuring instrument or a

Note 1 An indication may be presented in visual or acoustic form or may be

An indication is often given by the position of a pointer on the display for analog outputs, a displayed or printed number for digital outputs, a code pattern for code outputs, or an assigned quantity value for material measures.

Note 2 An indication and a corresponding value of the quantity being measured of quantities of the same kind.

set of quantity values bounded by extreme possible indicationsset of quantity values bounded by extreme possible indications

Note 1 An indication interval is usually stated in terms of its smallest and greatest example, “99 V to 201 V”.

Note 2 In some fields the term is “range of indications”.

working interval)set of values of quantities of the same kind that can be measured by a given measuring instrument or measuring system with specified instrumental uncertainty, under defined conditions

Note 1 In some fields the term is “measuring range” or “measurement range”.

Note 2 The lower limit of a measuring interval should not be confused with

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4.9 rated operating conditionoperating condition that must be fulfilled during measurement in order that a measuring instrument or measuring system perform as designed

Note Rated operating conditions generally specify intervals of being measured and for any influence quantity.

4.10 limiting operating conditionextreme operating condition that a measuring instrument or measuring system is required to withstand without damage, and without degradation of specified metrological properties, when it is subsequently operated under its rated operating conditions

Note 1 Limiting conditions for storage, transport or operation can differ.Note 2 Limiting conditions can include limiting measured and of any influence quantity

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measured and of any influence quantity

4.12 sensitivity of a measuring systemquotient of the change in an indication of a measuring system and the corresponding change in a value of a measured

4.14 resolutionsmallest change in a quantity being measured that causes a perceptible change in the corresponding

Note The resolution can depend on, for example, noise (internal or external) or friction. It may also depend on the value of a quantity being measured.

operating condition that must be fulfilled during measurement in order that a measuring instrument or measuring system perform

Note Rated operating conditions generally specify intervals of values for a quantity influence quantity.

4.10 limiting operating conditionextreme operating condition that a measuring instrument or measuring system is required to withstand without damage, and without degradation of specified metrological properties, when it is subsequently operated under its rated operating conditions

Note 1 Limiting conditions for storage, transport or operation can differ.Note 2 Limiting conditions can include limiting values of a quantity being

quantityquantity

sensitivity of a measuring systemquotient of the change in an indication of a measuring system and the corresponding change in a value of a quantity being

smallest change in a quantity being measured that causes a perceptible change in the corresponding indication

Note The resolution can depend on, for example, noise (internal or external) or value of a quantity being measured.

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4.24 instrumental measurement uncertaintycomponent of measurement uncertainty arising from a measuring instrument or measuring system in

Note 1 Instrumental measurement uncertainty is obtained through calibration of a measuring instrument or measuring system, except for a primary measurement standard for which other means are used.

Note 2 Instrumental uncertainty is used in a Type B evaluation of measurement uncertainty.

Note 3 Information relevant to instrumental measurement uncertainty may be given in the instrument specifications.

4.30 calibration diagramgraphical expression of the relation between indication and corresponding measurement result

Note 1 A calibration diagram is the strip of the plane defined by the axis of the

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Note 1 A calibration diagram is the strip of the plane defined by the axis of the indication and the axis of the measurement result, that represents the relation between an indication and a set of measured quantity values. A onerelation is given, and the width of the strip for a given indication provides the instrumental measurement uncertainty.

Note 2 Alternative expressions of the relation include a associated measurement uncertainty, a calibration table, or a set of functions.

Note 3 This concept pertains to a calibration when the instrumental measurement uncertainty is large in comparison with the measurement uncertainties associated with the quantity values of

4.31 calibration curveexpression of the relation between indication and corresponding measured quantity value

Note A calibration curve expresses a one-measurement result as it bears no information about the uncertainty.

4.24 instrumental measurement uncertaintycomponent of measurement uncertainty arising from a measuring instrument or measuring system in use

Instrumental measurement uncertainty is obtained through calibration of a measuring system, except for a primary measurement

standard for which other means are used.

Instrumental uncertainty is used in a Type B evaluation of measurement

Information relevant to instrumental measurement uncertainty may be given

graphical expression of the relation between indication and corresponding measurement result

A calibration diagram is the strip of the plane defined by the axis of the A calibration diagram is the strip of the plane defined by the axis of the measurement result, that represents the relation

between an indication and a set of measured quantity values. A one-to-many relation is given, and the width of the strip for a given indication provides the

Alternative expressions of the relation include a calibration curve and uncertainty, a calibration table, or a set of functions.

calibration when the instrumental comparison with the measurement

quantity values of measurement standards.

expression of the relation between indication and corresponding

-to-one relation that does not supply a bears no information about the measurement

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Chapter 5: Measurement standards (Etalons)5.1 measurement standardetalonrealization of the definition of a given quantity, with stated quantity value and associated measurement uncertainty, used as a reference

5.3 national measurement standardmeasurement standard recognized by national authority to serve in a state or economy as the basis for assigning quantity values to other measurement standards for the kind of quantity concerned

5.4 primary measurement standardmeasurement standard established using a primary reference measurement procedure, or created as an

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measurement procedure, or created as an convention

5.5 secondary measurement standardsecondary standardmeasurement standard established through calibration with respect to a primary measurement standard for a quantity of the same kind

5.6 reference measurement standardmeasurement standard designated for the calibration of other measurement standards for quantities of a given kind in a given organization or at a given location

Chapter 5: Measurement standards (Etalons)

realization of the definition of a given quantity, with stated quantity value and associated measurement uncertainty, used as

5.3 national measurement standardmeasurement standard recognized by national authority to serve in a state or economy as the basis for assigning quantity values to other measurement standards for the kind of quantity

5.4 primary measurement standardmeasurement standard established using a primary reference measurement procedure, or created as an artifact, chosen by measurement procedure, or created as an artifact, chosen by

5.5 secondary measurement standard

measurement standard established through calibration with respect to a primary measurement standard for a quantity of the

5.6 reference measurement standardmeasurement standard designated for the calibration of other measurement standards for quantities of a given kind in a given organization or at a given location

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5.7 working measurement standardmeasurement standard that is used routinely to calibrate or verify measuring instruments or measuring

Note 1 A working measurement standard is usually calibrated with respect to a reference measurement standard.

Note 2 In relation to verification, the terms “check standard” or “control standard” are also sometimes used.

5.8 travelling measurement standardtravelling standardmeasurement standard, sometimes of special construction, intended for transport between different

EXAMPLEPortable battery-operated caesium

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Portable battery-operated caesiumstandard.

5.9 transfer measurement devicetransfer devicedevice used as an intermediary to compare measurement standards

5.7 working measurement standardmeasurement standard that is used routinely to calibrate or verify measuring instruments or measuring Systems

Note 1 A working measurement standard is usually calibrated with respect to a

verification, the terms “check standard” or “control

5.8 travelling measurement standard

measurement standard, sometimes of special construction, intended for transport between different locations

operated caesium-133 frequency measurement operated caesium-133 frequency measurement

5.9 transfer measurement device

device used as an intermediary to compare measurement

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Environment

Systemunder

measurmentSensor

Introduction on sensors

Prof. B. Andò

Auxiliary System

Environment

Load/UserSensor

Introduction on sensors

Auxiliary System

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Static metrological characteristics

Calibration diagram

•Calibration curve

•Cal. Uncertainty

•Responsivity

•Linearity

•Resolution

•Repeatibility

•Hysteresis

Metrological Characteristics

Introduction

M

Prof. B. Andò

•Hysteresis

•Stability

M

L0

M0+

M0-

M0

characteristics

Metrological Characteristics

Introduction on sensors

SENSORM L

L

Calibration curve

Uncertainty band

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•Transduction fucntion

L(t)=f[M(t)]

•Influencing quantities:

L(t)=f[M(t),•]

Basics on

SENSORf()

M L

Prof. B. Andò

•The time:

L(t)=f[M(t),•,t]

•Calibration function:

M(t)=f

fucntion

(t)=f[M(t)]

:

L(t)=f[M(t),•]

on sensors

Lf -1()

M

L(t)=f[M(t),•,t]

M(t)=f -1[L(t)]

58

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Basics on

The responsivity

SENSORf()

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Prof. B. Andò

• The responsivity is the ratio betweenand the input variation

• Its value is the inverse of the slopepoint of the curve

• In case of a linear fuinction itthe function slope

R

on sensors

responsivity

Lf -1()

M

59

between the output variation

slope of the tangent in one

coincides with the inverse of

DM

DL

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Responsivity

Example: the potentiometer

eex

Basics on

Prof. B. Andò

t

p

i

t

ip

x

R

Dx

DRS

x

xRR

0

0

t

p

t

ex

x

PR

x

eS

the potentiometer

eo

xt

xi

Rp

on sensors

60

p

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……. Other metrological characteristics

•Resolution

•Repeatibility

•Reproducibility

•Linearity

Basics on

Prof. B. Andò

characteristics

on sensors

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• Linearity: disclosure betweenlinear model

Basics on

Prof. B. Andò

between the calibration curve and a

on sensors

62

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Non linearity can beuncertainty band!!!

Example:

PotentiometerR= 20 Ω;

P=0.1 W;

Range: 2 cm;

Linearity error: 0.05 FSO

Basics on

Prof. B. Andò

2

20

X

RS

The uncertainty given by the linearity

05.0

3

*05.0

FSO

be included in the

on sensors

63

cm/10

linearity error is:

cm06.03

2*05

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Absolute constant value model

The above model compromise low values of the

Basics on Non linearity uncertainty

Prof. B. Andò

The above model compromise low values of the operating range

Relative Value Model

The above model produces problems for low values of the operating range

Absolute constant value

The above model compromise low values of the

on sensorsNon linearity uncertainty

64

The above model compromise low values of the

The above model produces problems for low values of the operating range

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Mixed model

Basics on

Prof. B. Andò

on sensors

65

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•Caratteristiche metrologichedinamico (Dynamic

•Risposta in frequenzaCampo di frequenze di non distorsione (Frequency range)

Frequency interval assuring a frequency response which amplitude is within a defined tolerance band.

Basics on

Prof. B. Andò

•Frequenza difrequency)

metrologiche in regime(Dynamic characteristics)

frequenza (Frequency response)Campo di frequenze di non distorsione

Frequency interval assuring a frequency response which amplitude is within a defined tolerance band.

on sensors

di risonanza (Resonant

66

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•Caratteristiche metrologichedinamico (Dynamic

Risposta al gradino (Step

•Sovraelongazione (Overshoot)

•Tempo morto (Deat

•Tempo di salita (Rise

•Tempo di risposta (Response

•Tempo di assestamento

•Frequenza delle(Ringing frequency)

•Risposta libera (natural

Basics on

Prof. B. Andò

•Risposta libera (natural

metrologiche in regime(Dynamic characteristics)

(Step responce)

(Overshoot)

(Deat time)

(Rise time)

(Response time)

assestamento (Settling time)

oscillazioni di assestamento

(natural responce)

on sensors

67

(natural responce)

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•Tempo di vita (Life Time)

•Numero di cicli (cicling

•Tempo di funzionamento

•Tempo di magazzino

•Affidabilità: è dovutadebolezza strutturalefunzionamento alsicurezza:

•Degradazione:delle caratteristiche

Basics on

Prof. B. Andò

delle caratteristiche

•Rottura: Improvvisacaratteristiche.

•MTBF (Mean time betweenmedio fra guasti)

MTBF = (N. dispositvi in esameN. totale di

Time)

(cicling life)

funzionamento (operating life)

magazzino (storage life)

dovuta a guasti o dastrutturale del sensore o da

di fuori dei limiti di

Variazione gradualecaratteristiche nel tempo

on sensors

caratteristiche nel tempo

Improvvisa degradazione delle

68

between failure - tempo

esame x N. ore di uso) /di guasti

Page 69: Class: Sensors and advanced measurement systems … · Class: Sensors and measurement systems Prof: Bruno Ando’ Objectives: Basicsforthedesign measurementsystems Contents Basics

•The calibration is aestimate the metrological

Calibration

SMMeasurand

Influencing

Prof. B. Andò

device (sensor, instrument)

• Static calibration and dynamic

M

L0

M0+

M0-

M0

procedure aimed tometrological characteristics of a

Calibration

S lReadings

Influencing Inputs

instrument).

dynamic calibration

L

Calibration curve

Uncertainty band

Page 70: Class: Sensors and advanced measurement systems … · Class: Sensors and measurement systems Prof: Bruno Ando’ Objectives: Basicsforthedesign measurementsystems Contents Basics

Operatively

•During the calibratilonsystem inputs must be

Calibration

SMMeasurand

Influencing

Prof. B. Andò

system inputs must bethe considered input. Thein the considered operating

•The obtained IN/OUTthe condition defined by

Operatively….

calibratilon procedure all thebe kept constant except

Calibration

S lReadings

Influencing Inputs

70

be kept constant exceptThe latter must be swept

operating range.

relationship is valid inby the other inputs.

Page 71: Class: Sensors and advanced measurement systems … · Class: Sensors and measurement systems Prof: Bruno Ando’ Objectives: Basicsforthedesign measurementsystems Contents Basics

What do we have to measure?

Calibration

SMMeasurand

Influencing

Prof. B. Andò

What do we have to measure?

Which must be the accuracy of the measurement system?

•Each influencing input

Random and polarizinginput and the importancemeasurements.

•The considered input musttimes better) measured.

What do we have to measure?

Calibration

S lReadings

Influencing Inputs

What do we have to measure?

Which must be the accuracy of the measurement system?

input must be measured.

polarizing effects of influencingimportance of replicated

must be accurately (10

Page 72: Class: Sensors and advanced measurement systems … · Class: Sensors and measurement systems Prof: Bruno Ando’ Objectives: Basicsforthedesign measurementsystems Contents Basics

OPERATIVELY

1. Instrument inspectionall (meaningfull) system

2. Maintaining fixed the

3. Assuring a reliableconsidered input;

4. Build the calibration

Calibration

Prof. B. Andò

-2 0 2 40

1

2

3

4

5

6

7

8

9

10

Pre

ssio

ne d

i rife

rim

ento

(kP

a)

Pressione indicata (lettura) (kPa)

Readings

Measu

rand

OPERATIVELY

inspection and investigation onsystem inputs;

the influencing input

reliable sweep of the

diagram.

Calibration

6 8 10 12

Pressione indicata (lettura) (kPa)

Readings

Page 73: Class: Sensors and advanced measurement systems … · Class: Sensors and measurement systems Prof: Bruno Ando’ Objectives: Basicsforthedesign measurementsystems Contents Basics

Regime of statistic control

•Real influencing inputs

•Other influencing inputs

•We can say thatconsiderationj is in statistic

the effect of othernegligible and they globally

Calibration

Prof. B. Andò

negligible and they globallyinfluence.

Regime of statistic control

inputs

inputs

the system understatistic control if:

influencing inputs isglobally act as a random

Calibration

73

globally act as a random

Page 74: Class: Sensors and advanced measurement systems … · Class: Sensors and measurement systems Prof: Bruno Ando’ Objectives: Basicsforthedesign measurementsystems Contents Basics

The regime of statistic control must be assesed!

Data coming from an observationstatistic control mustdistribution.

• An euristich approach: the

Data Analysis (EDA).

Calibration

Prof. B. Andò

• An analytical method: the

The regime of statistic control must be assesed!

observation in regime ofmust have a Random

An euristich approach: the 4-plot Explanatory Data Analysis (EDA).

Calibration

74

An analytical method: the 2.

Page 75: Class: Sensors and advanced measurement systems … · Class: Sensors and measurement systems Prof: Bruno Ando’ Objectives: Basicsforthedesign measurementsystems Contents Basics

4-plot (Explanatory

• Run sequence plot

• Lag Plot

Calibration

Regime of statistic control

Prof. B. Andò

• Histogram ;

• Normal Probability Plot.

(Explanatory Data Analysis)

Run sequence plot

Calibration

Regime of statistic control

Normal Probability Plot.

Page 76: Class: Sensors and advanced measurement systems … · Class: Sensors and measurement systems Prof: Bruno Ando’ Objectives: Basicsforthedesign measurementsystems Contents Basics

In case of random signal:

Calibration

Regime of statistic control

Prof. B. Andò

:

Calibration

Regime of statistic control

Page 77: Class: Sensors and advanced measurement systems … · Class: Sensors and measurement systems Prof: Bruno Ando’ Objectives: Basicsforthedesign measurementsystems Contents Basics

Calibration

Regime of statistic control

Prof. B. Andò

Case of a random signalperiodic signal.

Calibration

Regime of statistic control

signal superimposed to a

Page 78: Class: Sensors and advanced measurement systems … · Class: Sensors and measurement systems Prof: Bruno Ando’ Objectives: Basicsforthedesign measurementsystems Contents Basics

N p ressio n e, k P a

1 1 0 .022 1 0 .203 1 0 .264 1 0 .20

Example

Let’s suppose to acquirepressure sensor, nominally,condition.

Calibration

Regime of statistic control

Pressure, kPa

Prof. B. Andò

4 1 0 .205 1 0 .226 1 0 .137 9 .9 78 1 0 .129 1 0 .09

10 9 .9 011 1 0 .0512 1 0 .1713 1 0 .4214 1 0 .2115 1 0 .2316 1 0 .2117 9 .9 818 1 0 .19 1 0 .0420 9 .8 1

p ressio n e, k P a

1 0 .02 1 0 .20 1 0 .26 1 0 .20

acquire 20 measures from anominally, in the same

Calibration

Regime of statistic control

1 0 .20 1 0 .22 1 0 .13 9 .9 7

1 0 .12 1 0 .09 9 .9 0

1 0 .05 1 0 .17 1 0 .42 1 0 .21 1 0 .23 1 0 .21 9 .9 8

1 0 .10 1 0 .04 9 .8 1

Page 79: Class: Sensors and advanced measurement systems … · Class: Sensors and measurement systems Prof: Bruno Ando’ Objectives: Basicsforthedesign measurementsystems Contents Basics

Histogram

Sorting data and definingoperating range, the following

della ampiezza

finestra campioni di numeroZ

Calibration

Regime of statistic control

Prof. B. Andò

intervals belonging to thefollowing quantity an be defined:

finestra della

letture di totale numero /

Calibration

Regime of statistic control

79

Page 80: Class: Sensors and advanced measurement systems … · Class: Sensors and measurement systems Prof: Bruno Ando’ Objectives: Basicsforthedesign measurementsystems Contents Basics

2 method

•Define GROUPS by sorting

intervals belonging to the

•Number of groups:

•In case of sample number

Calibration

Regime of statistic control

Prof. B. Andò

•In case of sample number

20 and 40, groups

samples/group must be

•If n>40 the Kendal-Stuart

used to find the optimal

G N187.

method

sorting data and defining

the operating range.

number ranging between

Calibration

Regime of statistic control

80

number ranging between

with at least five

be formed.

Stuart expression can be

optimal number of groups:

N 10 4.

Page 81: Class: Sensors and advanced measurement systems … · Class: Sensors and measurement systems Prof: Bruno Ando’ Objectives: Basicsforthedesign measurementsystems Contents Basics

The following quantity must

where:

n is the group number.

2

1

i

n

2 method

Calibration

Regime of statistic control

Prof. B. Andò

n0 is the real number of elements

ne is the expected numbergroup in case of a Gaussian

must be estimated:

0

2n n

ne

e

method

Calibration

Regime of statistic control

81

elements in the group

number of elements in theGaussian distribution.

Page 82: Class: Sensors and advanced measurement systems … · Class: Sensors and measurement systems Prof: Bruno Ando’ Objectives: Basicsforthedesign measurementsystems Contents Basics

ne can be estimated by the

1) Estimate the normalizedgroup

2) Estimate for each group

2 method

Calibration

Regime of statistic control

x

W

Prof. B. Andò

2) Estimate for each group

3) Estimate

4) Estimate the Degree of

Number of

( .

(

PEs

groupxP

Pne *

the following steps:

normalized boundary of each

group the probability

method

Calibration

Regime of statistic control

x

82

group the probability

of freedom:

groups-3

)03,10

)

x

group

N*

Page 83: Class: Sensors and advanced measurement systems … · Class: Sensors and measurement systems Prof: Bruno Ando’ Objectives: Basicsforthedesign measurementsystems Contents Basics

2 method

Calibration

Regime of statistic control

Data Sorted Interval Normalized

10,02 9,81

10,2 9,9

xW .

(

PEs

xP

Prof. B. Andò

10,2 9,9

10,26 9,97

10,2 9,98

10,22 10,02 10,03 -0,58958741 0,2777

10,13 10,04

9,97 10,05

10,12 10,09

10,09 10,1

9,9 10,11 10,115 0,0253197 0,2324

10,05 10,12

10,17 10,13

10,42 10,17

10,21 10,2

10,23 10,2 10,205 0,67639782 0,2405

10,11 10,21

9,98 10,22

10,1 10,23

10,04 10,26

9,81 10,42 0,2494

method

Calibration

Regime of statistic control

F ne no (no-ne)^2/ne

0

0

)03,10(

)

xP

group

NPne *

0

0

0

0,2777 5,5547 5 0,055387978

0

0

0

0

0,2324 4,6473 5 0,026763322

0

0

0

0

0,2405 4,8101 5 0,007495648

0

0

0

0

0,2494 4,9879 5 2,94454E-05

X2 0,089676394

Page 84: Class: Sensors and advanced measurement systems … · Class: Sensors and measurement systems Prof: Bruno Ando’ Objectives: Basicsforthedesign measurementsystems Contents Basics

Once 2 has been estimated the following table will give the probability the distribution could be

Gaussian.

2 method

Calibration

Regime of statistic control

Prof. B. Andò

The case in the example is in between

has been estimated the following table will give the probability the distribution could be

Gaussian.

method

Calibration

Regime of statistic control

84The case in the example is in between

Page 85: Class: Sensors and advanced measurement systems … · Class: Sensors and measurement systems Prof: Bruno Ando’ Objectives: Basicsforthedesign measurementsystems Contents Basics

A model of the device

SMMeasurand

Influencing

Calibration

Estimation of the calibration diagram

Prof. B. Andò

A model of the deviceobtained:

l=f(m) (transduction function)

m=f-1(l) (calibration function)

device behaviour must be

S lReadings

Influencing Inputs

Calibration

Estimation of the calibration diagram

85

device behaviour must be

l=f(m) (transduction function)

(l) (calibration function)

Page 86: Class: Sensors and advanced measurement systems … · Class: Sensors and measurement systems Prof: Bruno Ando’ Objectives: Basicsforthedesign measurementsystems Contents Basics

Calibration

Estimation of the calibration diagram

How do we find the transduction function?

SMMeasurand

Influencing

Prof. B. Andò

TWO APPROACHES

For each value of m

1) several readings are

2) A couple of readingsfor increasing valuedecreasing value of m,behaviours.

transduction function?

l=f(m)

Calibration

Estimation of the calibration diagram

How do we find the transduction function?

lReadings

Influencing Inputs

TWO APPROACHES

performed

readings are accomplished; onevalue of m and one for

m, to evidence hysteretic

transduction function?

l=f(m)

Page 87: Class: Sensors and advanced measurement systems … · Class: Sensors and measurement systems Prof: Bruno Ando’ Objectives: Basicsforthedesign measurementsystems Contents Basics

Calibration

Performing several readings per each value of the measurand

0 1 2 3 4 5-2

0

2

4

6

8

10

12

Pressione di riferimento (kPa)

Pre

ssio

ne indic

ata

(le

ttura

) (k

Pa)

rea

din

gs

Prof. B. Andò

Performing two readings per each value of the measurand

Pressione di riferimento (kPa)

0 1 2 3 4 5-2

0

2

4

6

8

10

12

qi Pressione di riferimento (kPa)

q0 P

ressio

ne

in

dic

ata

(le

ttu

ra)

(kP

a)

measurand

rea

din

gs

measurand

Calibration

Performing several readings per each value of the measurand

6 7 8 9 10

Pressione di riferimento (kPa)

Performing two readings per each value of the measurand

Pressione di riferimento (kPa)

6 7 8 9 10

qi Pressione di riferimento (kPa)

measurand

measurand

Page 88: Class: Sensors and advanced measurement systems … · Class: Sensors and measurement systems Prof: Bruno Ando’ Objectives: Basicsforthedesign measurementsystems Contents Basics

Supposing the following model (transduction function)

a LMS approach can be used for parameters estimation.

2

2

lm

mN

mmlNa

aml

Calibration

Estimation of the transduction curve

Prof. B. Andò

2

2

mN

lmb

Coefficient variances are:

aml est

Estimated values of readingscalculated:

Supposing the following model (transduction

a LMS approach can be used for parameters

2

mml

m

lm

b

Calibration

Estimation of the transduction curve

88

2m

mml

22

22l2

b

22

2l2

a

mmN

mss

mmN

sNs

bam

readings can be hence

Page 89: Class: Sensors and advanced measurement systems … · Class: Sensors and measurement systems Prof: Bruno Ando’ Objectives: Basicsforthedesign measurementsystems Contents Basics

Supposing the following model (transduction function)

The LMS implementation:

aml

Calibration

Estimation of the transduction curve

M L1 L2

0 -0.53

1 0.08

2 1.01

[H

Prof. B. Andò

2 1.01

3 1.71

4 3.18

5 4.31

6 5.03

7 6.59

8 7.62

9 8.77

10 9.79

H(pinv

par2X1

lestimated

Supposing the following model (transduction

The LMS implementation:

b

Calibration

Estimation of the transduction curve

par Hl

]ones(10,1) M[

10X1 2X110X2

'H)H'H()H 12X10 10X2

2X2

2X10

2X10

l pinv(H)par 10X12X102X1

par Hestimated

Page 90: Class: Sensors and advanced measurement systems … · Class: Sensors and measurement systems Prof: Bruno Ando’ Objectives: Basicsforthedesign measurementsystems Contents Basics

Supposing the following model (transduction function)

The LMS implementation in case of a single reading

aml

Calibration

Estimation of the transduction curve

[H

M L

0 -0,53

1 0,08

2 1,01

3 1,71

4 3,18

Prof. B. Andò

H(pinv

pinv(H)par 2X102X1

lestimated

4 3,18

5 4,31

6 5,03

7 6,59

8 7,62

9 8,77

Supposing the following model (transduction

The LMS implementation in case of a single reading

b

Calibration

Estimation of the transduction curve

par Hl

]ones(10,1) M[

10X1 2X110X2

'H)H'H()H 12X10 10X2

2X2

2X10

2X10

l pinv(H)10X12X10

par H

Page 91: Class: Sensors and advanced measurement systems … · Class: Sensors and measurement systems Prof: Bruno Ando’ Objectives: Basicsforthedesign measurementsystems Contents Basics

l

CalibrationSupposing the following model (transduction function)

The LMS implementation in case of multiple readings (20)

M[H

200X1

M L

0 -0,53

1 0,08

2 1,01

3 1,71

4 3,18

5 4,31

6 5,03

7 6,59

8 7,62

9 8,77

0 -1,22

1 0,26

2 1,38

3 2,15

Prof. B. Andò

)H(pinv

par2X1

lestimated

0['H

3 2,15

4 3,42

5 4,51

6 5,61

7 6,64

8 7,9

9 8,44

. .

. .

0 -1,37

1 0,38

2 0,82

3 2,33

4 3,05

5 4,27

6 5

7 6,64

8 7,54

9 8,92

bam

CalibrationSupposing the following model (transduction function)

The LMS implementation in case of multiple readings (20)

par Hl

)]ones(200,1 M

200X1 2X1200X2

'H)H'H() 12X200 200X2

2X2

2X200

2X200

l pinv(H)200X12X200

par Hestimated

9] 8 7 6 5 4 3 2 1 0

Page 92: Class: Sensors and advanced measurement systems … · Class: Sensors and measurement systems Prof: Bruno Ando’ Objectives: Basicsforthedesign measurementsystems Contents Basics

Prof. B. Andò

Page 93: Class: Sensors and advanced measurement systems … · Class: Sensors and measurement systems Prof: Bruno Ando’ Objectives: Basicsforthedesign measurementsystems Contents Basics

Prof. B. Andò

Page 94: Class: Sensors and advanced measurement systems … · Class: Sensors and measurement systems Prof: Bruno Ando’ Objectives: Basicsforthedesign measurementsystems Contents Basics

Calibration

Examples of the transduction curve

0 1 2 3 4 5-2

0

2

4

6

8

10

12

Pre

ssio

ne indic

ata

(le

ttura

) (k

Pa)

Several readings:

rea

din

gs

Prof. B. Andò

Pressione di riferimento (kPa)

A couple of readings one forone for decreasing value of

0 1 2 3 4 5-2

0

2

4

6

8

10

12

qi Pressione di riferimento (kPa)

q0 P

ressio

ne indic

ata

(le

ttura

) (k

Pa)

measurand

measurand

rea

din

gs

Calibration

Examples of the transduction curve

6 7 8 9 10

Pressione di riferimento (kPa)

increasing value of m andof m

6 7 8 9 10

qi Pressione di riferimento (kPa)

measurand

measurand

Page 95: Class: Sensors and advanced measurement systems … · Class: Sensors and measurement systems Prof: Bruno Ando’ Objectives: Basicsforthedesign measurementsystems Contents Basics

Calibration

In case of tworeadings, thestandard deviation,l, must beestimated takinginto accountresiduals betweenreadings and modelestimation related toall values of minspected. The

Estimation of the uncertainty bandM

0

1

2

3

4

5

6

7

8

9

10

0

Prof. B. Andò

inspected. Thehypothesis of a l

constant over thewhole range of m isperformed.

0

1

2

3

4

5

6

7

8

9

10

CalibrationEstimation of the uncertainty band

L L_Est Res

0 -1.12 -0.85 0.27

1 0.21 0.24 0.03

2 1.18 1.32 0.14

3 2.09 2.40 0.31

4 3.33 3.48 0.15

5 4.50 4.56 0.06

6 5.26 5.65 0.39

7 6.59 6.73 0.14

8 7.73 7.81 0.08

9 8.68 8.89 0.21

10 9.80 9.98 0.18

0 -0.69 -0.85 -0.160 -0.69 -0.85 -0.16

1 0.42 0.24 -0.18

2 1.65 1.32 -0.33

3 2.48 2.40 -0.08

4 3.62 3.48 -0.14

5 4.71 4.56 -0.15

6 5.87 5.65 -0.22

7 6.89 6.73 -0.16

8 7.92 7.81 -0.11

9 9.10 8.89 -0.21

10 10.20 9.98 -0.22

UL 0.20

Page 96: Class: Sensors and advanced measurement systems … · Class: Sensors and measurement systems Prof: Bruno Ando’ Objectives: Basicsforthedesign measurementsystems Contents Basics

Calibration

In case of several readings,m the standard deviation,between model estimationsbe estimated.

Estimation of the uncertainty band

M L1 L2 L3 L4 L5 L6 L7 L8 L9 L10 L11

0 -0.53 -1.22 -0.84 -1.61 -1.38 -1.14 -1.32 -1.35 -1.08 -1.41 -1.24

1 0.08 0.26 0.35 0.19 0.60 0.14 0.44 0.40 0.49 0.15 0.56

2 1.01 1.38 1.42 0.79 1.41 1.10 1.16 1.41 1.37 1.05 1.15

3 1.71 2.15 1.74 2.19 2.02 1.95 2.03 2.14 1.92 2.44 1.94

4 3.18 3.42 3.60 3.52 3.69 3.46 3.24 3.39 3.39 2.98 3.62

5 4.31 4.51 4.59 4.57 4.17 4.03 4.52 4.30 4.05 4.34 4.18

6 5.03 5.61 5.35 5.12 5.32 5.38 5.51 5.39 5.03 5.06 5.46

7 6.59 6.64 6.39 6.51 6.56 6.69 6.47 6.92 6.80 6.45 6.71

Prof. B. Andò

7 6.59 6.64 6.39 6.51 6.56 6.69 6.47 6.92 6.80 6.45 6.71

8 7.62 7.90 7.71 7.69 7.83 7.90 7.80 8.04 7.66 7.65 7.61

9 8.77 8.44 8.96 8.74 8.54 8.85 8.87 8.66 8.95 8.77 8.52

10 9.79 9.81 9.58 9.51 10.11 9.57 9.59 9.89 9.78 9.89 9.85

L_Est R1 R2 R3 R4 R5 R6 R7 R8 R9 R10 R11

-1.05 0.52 -0.17 0.22 -0.55 -0.33 -0.09 -0.27 -0.30 -0.03 -0.35 -0.19

0.03 0.05 0.23 0.32 0.16 0.56 0.11 0.41 0.37 0.45 0.12 0.52

1.12 -0.11 0.26 0.30 -0.33 0.29 -0.02 0.03 0.29 0.25 -0.07 0.03

2.21 -0.49 -0.05 -0.47 -0.02 -0.19 -0.26 -0.18 -0.07 -0.28 0.23 -0.26

3.29 -0.12 0.13 0.31 0.23 0.39 0.17 -0.05 0.09 0.09 -0.32 0.33

4.38 -0.07 0.13 0.21 0.19 -0.21 -0.35 0.14 -0.08 -0.33 -0.04 -0.20

5.47 -0.44 0.14 -0.12 -0.35 -0.15 -0.08 0.04 -0.08 -0.44 -0.40 -0.01

6.55 0.03 0.09 -0.16 -0.04 0.01 0.14 -0.08 0.36 0.25 -0.10 0.16

7.64 -0.02 0.26 0.07 0.05 0.19 0.26 0.15 0.40 0.02 0.01 -0.03

8.73 0.04 -0.28 0.23 0.01 -0.19 0.12 0.14 -0.06 0.23 0.04 -0.21

9.81 -0.02 -0.01 -0.24 -0.31 0.29 -0.25 -0.22 0.07 -0.03 0.07 0.04

Calibration

readings, for each value ofdeviation, Ul, of residuals

estimations and readings can

Estimation of the uncertainty band

L12 L13 L14 L15 L16 L17 L18 L19 L20

-1.24 -0.87 -1.15 -1.22 -1.54 -1.21 -1.14 -1.21 -0.96 -1.37

0.56 0.41 -0.03 0.22 -0.10 0.30 0.31 0.00 0.09 0.38

1.15 1.22 1.08 1.01 0.86 1.39 1.05 1.36 1.28 0.82

1.94 2.19 2.07 2.15 2.14 1.79 1.88 2.10 2.04 2.33

3.62 3.10 3.58 2.88 3.01 2.95 3.54 3.53 3.17 3.05

4.18 4.69 4.60 4.63 4.48 4.18 4.86 4.64 4.68 4.27

5.46 4.92 5.46 5.28 5.16 5.53 5.43 5.53 5.00 5.00

6.71 6.87 6.58 6.56 6.30 6.10 6.37 6.39 6.45 6.646.71 6.87 6.58 6.56 6.30 6.10 6.37 6.39 6.45 6.64

7.61 7.82 7.69 7.55 7.67 7.90 7.34 7.96 7.86 7.54

8.52 8.76 8.67 8.41 8.85 8.91 8.77 8.74 8.68 8.92

9.85 9.70 9.82 9.66 9.87 9.80 9.50 9.68 10.00 10.04

R12 R13 R14 R15 R16 R17 R18 R19 R20 UL

-0.19 0.19 -0.10 -0.16 -0.49 -0.16 -0.09 -0.16 0.10 -0.32 0.25

0.52 0.38 -0.06 0.19 -0.13 0.27 0.27 -0.03 0.06 0.35 0.20

0.03 0.10 -0.05 -0.11 -0.26 0.27 -0.07 0.24 0.16 -0.30 0.20

-0.26 -0.02 -0.13 -0.05 -0.07 -0.41 -0.33 -0.11 -0.16 0.13 0.18

0.33 -0.19 0.29 -0.41 -0.28 -0.34 0.24 0.24 -0.13 -0.24 0.26

-0.20 0.31 0.22 0.25 0.09 -0.20 0.48 0.26 0.30 -0.11 0.24

-0.01 -0.55 -0.01 -0.18 -0.31 0.06 -0.04 0.06 -0.47 -0.47 0.21

0.16 0.31 0.02 0.00 -0.25 -0.46 -0.19 -0.17 -0.10 0.09 0.20

-0.03 0.18 0.05 -0.09 0.03 0.26 -0.30 0.32 0.21 -0.10 0.17

-0.21 0.04 -0.05 -0.32 0.13 0.18 0.05 0.01 -0.05 0.19 0.16

0.04 -0.12 0.00 -0.15 0.06 -0.01 -0.32 -0.13 0.19 0.23 0.17

max(UL) 0.26

Page 97: Class: Sensors and advanced measurement systems … · Class: Sensors and measurement systems Prof: Bruno Ando’ Objectives: Basicsforthedesign measurementsystems Contents Basics

Calibration

Estimation of the residuals

M L Lestimated

0 -0,53 -1,05

1 0,08 0,03

2 1,01 1,12

3 1,71 2,21

4 3,18 3,29

5 4,31 4,38

6 5,03 5,47

7 6,59 6,55

8 7,62 7,64

9 8,77 8,73

0 -1,22 -1,05

1 0,26 0,03

2 1,38 1,12

Prof. B. Andò

2 1,38 1,12

3 2,15 2,21

4 3,42 3,29

5 4,51 4,38

6 5,61 5,47

7 6,64 6,55

8 7,9 7,64

9 8,44 8,73

. . .

. . .

0 -1,37 -1,05

1 0,38 0,03

2 0,82 1,12

3 2,33 2,21

4 3,05 3,29

5 4,27 4,38

6 5 5,47

7 6,64 6,55

8 7,54 7,64

9 8,92 8,73

Calibration

Estimation of the residuals

Lestimated Residuals

-1,05 -0,52

0,03 -0,05

1,12 0,11

2,21 0,5

3,29 0,11

4,38 0,07

5,47 0,44

6,55 -0,04

7,64 0,02

8,73 -0,04

-1,05 0,17

0,03 -0,23

1,12 -0,261,12 -0,26

2,21 0,06

3,29 -0,13

4,38 -0,13

5,47 -0,14

6,55 -0,09

7,64 -0,26

8,73 0,29

.

.

-1,05 0,32

0,03 -0,35

1,12 0,3

2,21 -0,12

3,29 0,24

4,38 0,11

5,47 0,47

6,55 -0,09

7,64 0,1

8,73 -0,19

Page 98: Class: Sensors and advanced measurement systems … · Class: Sensors and measurement systems Prof: Bruno Ando’ Objectives: Basicsforthedesign measurementsystems Contents Basics

Calibration

Estimation of the calibration diagram

SMMeasurand

Influencing

In case of a linear model, the calibration function obtained:

Prof. B. Andò

lm

as well as the uncertainty band:

Um

obtained:

Calibration

Estimation of the calibration diagram

lReadings

Influencing Inputs

In case of a linear model, the calibration function can be easily

a

b

as well as the uncertainty band:

a

Ul

Page 99: Class: Sensors and advanced measurement systems … · Class: Sensors and measurement systems Prof: Bruno Ando’ Objectives: Basicsforthedesign measurementsystems Contents Basics

Calibration

Estimation of the calibration diagram

SMMeasurand

Influencing

A couple of readings one forone for decreasing value

Prof. B. Andò

A coverage factor equal to 3

-2 0 2 4-2

0

2

4

6

8

10

12

qi P

ressio

ne d

i rife

rim

ento

(kP

a)

q0 Pressione indicata (lettura) (kPa)

Me

asu

ran

d

Readings

Calibration

Estimation of the calibration diagram

lReadings

Influencing Inputs

for increasing value of m andvalue of m

A coverage factor equal to 3 has been used!

6 8 10

q0 Pressione indicata (lettura) (kPa)

Readings

Page 100: Class: Sensors and advanced measurement systems … · Class: Sensors and measurement systems Prof: Bruno Ando’ Objectives: Basicsforthedesign measurementsystems Contents Basics

Calibration

Estimation of the calibration diagram

SMMeasurand

Influencing

Several readings:

Using a coverage factor equal to 3

Prof. B. Andò

Using a coverage factor equal to 3practically, the uncertainty band contains all the readings!

-2 0 2 4-2

0

2

4

6

8

10

12

Pre

ssio

ne d

i rife

rim

ento

(kP

a)

Pressione indicata (lettura) (kPa)

Me

asu

ran

d

Readings

Calibration

Estimation of the calibration diagram

lReadings

Influencing Inputs

Using a coverage factor equal to 3 means that, Using a coverage factor equal to 3 means that, practically, the uncertainty band contains all the

6 8 10 12

Pressione indicata (lettura) (kPa)

Readings

Page 101: Class: Sensors and advanced measurement systems … · Class: Sensors and measurement systems Prof: Bruno Ando’ Objectives: Basicsforthedesign measurementsystems Contents Basics

Calibration

Estimation of the calibration diagram

SMMeasurand

Influencing

Several readings:

12

Prof. B. Andò

A coverage factor equal to 3

-2 0 2 4-2

0

2

4

6

8

10

12

Pre

ssio

ne d

i rife

rim

ento

(kP

a)

Pressione indicata (lettura) (kPa)

Readings

Me

asu

ran

d

Calibration

Estimation of the calibration diagram

lReadings

Influencing Inputs

A coverage factor equal to 3 has been used!

4 6 8 10

Pressione indicata (lettura) (kPa)

Readings