noise and capacitor m.friedl, r.thalmeier, h.yin (hephy vienna) 24 september 2015

Noise and CapacitorM.Friedl, R.Thalmeier, H.Yin (HEPHY Vienna)

24 September 2015

24 September 2015

M.Friedl, R.Thalmeier, H.Yin: Noise and Capacitor 2

Richard @ Trieste:“increase C asmuch as possible”

Capacitor

Presently: 10nF / 500V (0805 size) New: 100nF / 200V (0805 size)

TDK CGJ4J3X7T2D104K125AA Reel (2000 pcs.) ordered last Friday, delivered on

Tuesday

Voltage rating reduction is not an issue, because with new cap we can still bias up to 400V DSSDs do not withstand much more than 200V

24 September 2015

M.Friedl, R.Thalmeier, H.Yin: Noise and Capacitor 3

Test Setup with FADC System Sine

generator injects CM noise via transformer

Tested with DESY modules (single DSSD) and L5.903 (class B ladder)

24 September 2015

M.Friedl, R.Thalmeier, H.Yin: Noise and Capacitor 4

Results of L3 (Noise Injected in n-Side)

24 September 2015

M.Friedl, R.Thalmeier, H.Yin: Noise and Capacitor 5

Chip average Strip RMS (without CMC) vs. noise frequency With 10nF With 100nF

Results of L5 (Noise Injected in n-Side)

Chip average Strip RMS (without CMC) vs. noise frequency With 10nF With 100nF 24 September

2015M.Friedl, R.Thalmeier, H.Yin: Noise and Capacitor 6

Results of L6 (Noise Injected in L5 n)

Significant effect also on L6 module (even though injection is still done on L5 n-side) Both modules are attached to same DC/DC converters

24 September 2015

M.Friedl, R.Thalmeier, H.Yin: Noise and Capacitor 7

Results of L5.903 FW (Noise Injected in n)

24 September 2015

M.Friedl, R.Thalmeier, H.Yin: Noise and Capacitor 8

Chip average Strip RMS (without CMC) vs. noise frequency With 10nF With 100nF

Other Results

APV hangs up above certain noise injection level Fully reproducible

Threshold is increased by a factor of ~10 when changing 10nF 100nF

24 September 2015

M.Friedl, R.Thalmeier, H.Yin: Noise and Capacitor 9

Source Test with FW Module of L5.903 (1/2) p-side:

24 September 2015

M.Friedl, R.Thalmeier, H.Yin: Noise and Capacitor 10

10nF

100nF

Source Test with FW Module of L5.903 (2/2) n-side:

24 September 2015

M.Friedl, R.Thalmeier, H.Yin: Noise and Capacitor 11

10nF

100nF

Summary Noise immunity can be significantly improved by

increasing 10nF 100nF Shown in all noise injection measurements No impact on source measurement without noise

injection

Recommendation: Use 100nF caps for Origami flex assembly (received by

Toru today) Replace 10nF with 100nF on hybrid boards (delivered to

Pisa, on the way to Melbourne)

Cap locations on Origamis and hybrid boards are specified on the following pages 24 September

2015M.Friedl, R.Thalmeier, H.Yin: Noise and Capacitor 12

Capacitor Location (1/4)

Origami_-z and _ce

24 September 2015

M.Friedl, R.Thalmeier, H.Yin: Noise and Capacitor 13

Origami_+z

Capacitor Location (2/4)

24 September 2015

M.Friedl, R.Thalmeier, H.Yin: Noise and Capacitor 14

L3 hybrid, P side L3 hybrid, N side

Capacitor Location (3/4)

24 September 2015

M.Friedl, R.Thalmeier, H.Yin: Noise and Capacitor 15

L6_+z (FW) hybrid, P side

L6_+z (FW) hybrid, N side

Capacitor Location (4/4)

24 September 2015

M.Friedl, R.Thalmeier, H.Yin: Noise and Capacitor 16

L6_-z (BW) hybrid, P side

L6_-z (BW) hybrid, N side