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Kurt Chen / Q. A. Manager
Report Number: 011141-ERefer Number: 000908-EDecember 18, 2001
EMC UPDATE TEST REPORT
For
Panel PC
Applicant : Advantech Co., Ltd.Trade Name : ADVANTECH
Model Number : PPC-153TDate : December 18, 2001Date of test : December 12 ~ 14, 2001Revision : 00Reference Standard:
Standards Results (Pass/Fail)EN 55022: 1998EN 61000-3-2: 1995 + A1: 1998 + A2: 1998 + A14: 2000EN 61000-3-3: 1995 + A1: 2001EN 55024: 1998 + A1: 2001 - IEC 61000-4-2: 1995 + A2: 2000 - IEC 61000-4-3: 1995 - IEC 61000-4-4: 1996 - IEC 61000-4-5: 1995
- IEC 61000-4-6: 1996- IEC 61000-4-8: 1993- IEC 61000-4-11: 1994
PASSPASSPASSPASSPASSPASSPASSPASSPASS PASSPASS
Description of Rev.00:
1. Applicant adds one HDD, one FDD, one DVD-ROM and one CD-R/RW to re-test.(Please refer to have ** mark items on this report)
2. Other information please refer to reports (990591-E Rev.00, 000763-E Rev.00, 000908 Rev.00) and this (011141) test report.
Approved by Authorized Signatory:
Accredited Lab. of NEMO, A2LA, BCIQ Page 1 of 49Listed Lab. of FCC, VCCI, MOC A2LA Certificate #: 824.01 (for Emission)
NEMKO Authorization #: ELA 124 (for EMC) Rev. 00
Report Number: 011141-ERefer Number: 000908-EDecember 18, 2001
PRODUCT INFORMATION
Housing Type: Plastic
EUT Power Rating: 85 ~ 264Vac, 50/60Hz, 80W
AC power during Test: 230VAC/50Hz
Power Supply Manufacturer: SKYNET
Power Supply Model Number: SNP-8086-A
AC Power Cord Type: Unshielded, 1.8m (Detachable)
DC Power Cable Type: N/A
Memory Capacity: Installed: 128MB
CPU Manufacturer: Intel Model: Celeron 466MHz
Model: Pentium III 850MHz
OSC/Clock Frequencies: 66/100 MHz
CPU Board Manufacturer: ADVANTECH Model: PCM 9571
HDD Manufacturer: IBM Model: DBCA-204860
**Fujitsu Model: MHK2060AT
FDD Manufacturer: Y-E DATA Model: YD-702J
**NEC Model: FD1238T
CD-ROM Manufacturer: Toshiba Model: XM-1902B
**Quanta Storage Inc. Model: SCR-242
DVD-ROM Manufacturer: **MKE Model: SR-8175-C
Quanta Storage Inc. Model: SDR-081
CD-R/RW Manufacturer: **KME Model: UJDA330
15” TFT LCD Panel Manufacturer: Toshiba Model: LTM15C151A
Samsung Model: LT150X1
CHUNGHWA Model: CLAA150XA03
VGA Card Manufacturer: SILICON MOTION Model: SM1721
Sound Card Manufacturer: ESS TECH Model: ESS 1946S
Accredited Lab. of NEMO, A2LA, BCIQ Page 2Listed Lab. of FCC, VCCI, MOC A2LA Certificate #: 824.01 (for Emission)
NEMKO Authorization #: ELA 124 (for EMC) Rev. 00
Report Number: 011141-ERefer Number: 000908-EDecember 18, 2001
I/O Port of EUT:
I/O PORT TYPES Q’TY TESTED WITH
1).Parallel Port 1 1
2).Serial Port 4 4
3).Video Port 1 1
4).PS/2 Keyboard/Mouse Port 1 1
5).Game Port 1 1
6).Microphone Port 1 1
7).Line-in Port 1 1
8).Line-out Port 1 1
9).LAN Port 1 1
10). USB Port 2 2
Accredited Lab. of NEMO, A2LA, BCIQ Page 3Listed Lab. of FCC, VCCI, MOC A2LA Certificate #: 824.01 (for Emission)
NEMKO Authorization #: ELA 124 (for EMC) Rev. 00
Report Number: 011141-ERefer Number: 000908-EDecember 18, 2001
BLOCK DIAGRAM OF TEST SETUPSYSTEM DIAGRAM OF CONNECTIONS BETWEEN EUT AND SIMULATORS
EUT: Panel PCTrade Name: ADVANTECHModel Number: PPC-153T
Power Cord: Unshielded, 1.8m
Accredited Lab. of NEMO, A2LA, BCIQ Page 4Listed Lab. of FCC, VCCI, MOC A2LA Certificate #: 824.01 (for Emission)
NEMKO Authorization #: ELA 124 (for EMC) Rev. 00
Panel PC(EUT)
1. Monitor
2. Modem
3. Modem
4. Printer
5. PS/2 Keyboard
6. PS/2 Mouse
7. Mouse
8. Mouse
9. Speaker
10. USB Mouse
13. Walkman
12. Joystick
LAN Cable
16. Notebook PC(Remote)
11. USB Mouse
14. Microphone
15. HUB
9. Speaker
Report Number: 011141-ERefer Number: 000908-EDecember 18, 2001
Accredited Lab. of NEMO, A2LA, BCIQ Page 5Listed Lab. of FCC, VCCI, MOC A2LA Certificate #: 824.01 (for Emission)
NEMKO Authorization #: ELA 124 (for EMC) Rev. 00
Report Number: 011141-ERefer Number: 000908-EDecember 18, 2001
SUPPORT EQUIPMENTNo. Equipment Model
#Serial
#FCCID
Trade Name Data Cable
PowerCord
1. 1 Monitor CPD-G200 2716046 FCC DoC SONYShielded, 1.8m
with one Core
Unshielded,
1.8m
2. Modem 231AA A25531083541 BFJ9D93108US HayesShielded,
1.8m
Unshielded,
1.8m
3. 2 Modem 231AA A04231083662 BFJ9D93108US HayesShielded,
1.8m
Unshielded,
1.8m
4. Printer 2225C 3006S67978 DSI6XU2225 HPShielded,
1.8m
Unshielded,
1.8m
5. PS/2 Keyboard SK-2800C B1C790BCPJCN6L GYUR79SK CompaqShielded,
1.6mN/A
6. 4 PS/2 Mouse M-CAA43 LZE02802014 FCC DoC LogitechShielded,
1.8mN/A
7. 5 Mouse M-MM43 LZE93352988 FCC DoC LogitechShielded,
1.8mN/A
8. 7 Mouse M-CAA43 LZA1175313L FCC DoC LogitechShielded,
1.8mN/A
9. 8 Speaker DS-207 N/A N/A Lousan Unshielded,1.2m N/A
10. USB Mouse M-BB48 LZE92250102 FCC DoC LogitechShielded,
1.8mN/A
11. USB Mouse M-BB48 LZE01450726 FCC DoC LogitechShielded,
1.8mN/A
12. Joystick G-ZA-PHI PHB03800161 N/A Logitech Shielded,2.3m N/A
13. Walkman RQ-L10 GB003969 N/A PanasonicShielded,
2.1mN/A
14. Microphone DM-510 I5-3 N/A KOKAShielded,
2.1mN/A
15. HUB(Remote) UP 206 100825 N/A PRO-COMM
LAN Cable:
Unshielded, 5m
Unshielded,
1.5m
16. Notebook PC(Remote)
Omnibook
510N/A FCC DoC HP
LAN Cable:
Unshielded, 1.0m
AC I/P:
Unshielded, 1.8m
DC I/P:
Unshielded, 1.8m
Note: All the above equipment/cables were placed in worse case positions to maximize emission signals Accredited Lab. of NEMO, A2LA, BCIQ Page 6Listed Lab. of FCC, VCCI, MOC A2LA Certificate #: 824.01 (for Emission)
NEMKO Authorization #: ELA 124 (for EMC) Rev. 00
Report Number: 011141-ERefer Number: 000908-EDecember 18, 2001
during emission test.
Grounding: Grounding was in accordance with the manufacturer’s requirements and conditions for the intended use.
Accredited Lab. of NEMO, A2LA, BCIQ Page 7Listed Lab. of FCC, VCCI, MOC A2LA Certificate #: 824.01 (for Emission)
NEMKO Authorization #: ELA 124 (for EMC) Rev. 00
Report Number: 011141-ERefer Number: 000908-EDecember 18, 2001
TEST EQUIPMENT LIST (EMISSION)
Instrumentation: The following list contains equipment used at C & C Laboratory, Co., Ltd. for testing. The equipment conforms to the CISPR 16-1 / ANSI C63.2-1988 Specifications for Electromagnetic Interference and Field Strength Instrumentation from 9kHz to 1.0 / 2.0 GHz. Equipment used during the tests:
Open Area Test Site: # 4
Open Area Test Site # 4EQUIPMENT
TYPEMFR MODEL
NUMBERSERIAL
NUMBERLASTCAL.
CAL DUE.
Spectrum Analyzer ADVANTEST R3132 91700456 02/21/2001 02/20/2002
EMI Test Receiver R&S ESVS10 846285/016 04/16/2001 04/15/2002
Precision Dipole SCHWAZBECK VHAP 998/999 05/17/2001 05/16/2002
Precision Dipole SCHWAZBECK UHAP 981/982 05/17/2001 05/16/2002
Bilog Antenna CHASE CBL 6112B 2462 01/16/2001 01/15/2002
Turn Table Chance most N/A N/A N.C.R N.C.R
Antenna Tower Chance most N/A N/A N.C.R N.C.R
Controller Chance most N/A N/A N.C.R N.C.R
RF Switch ANRITSU MP59B M51067 N.C.R N.C.R
Site NSA C&C Lab. N/A N/A 11/24/2001 11/23/2002
Conducted Emission Test Site: # 4
Conducted Emission Test Site # 4EQUIPMENT
TYPEMFR MODEL
NUMBERSERIAL
NUMBERLASTCAL.
CAL DUE.
EMI Test Receiver R&S ESCS30 845552/030 12/12/2001 12/11/2002
LISN R&S ESH2-Z5 848773/014 10/27/2001 10/26/2002
LISN EMCO 3825/2 9003/1382 02/08/2001 02/07/2002
2X2 WIRE ISN R&S ENY22 830661/027 04/06/2001 04/05/2002
FOUR WIRE ISN R&S ENY41 830663/024 04/04/2001 04/03/2002
The calibrations of the measuring instruments, including any accessories that may effect such calibration, are checked frequently to assure their accuracy. Adjustments are made and correction factors applied in accordance with instructions contained in the manual for the measuring instrument.
Accredited Lab. of NEMO, A2LA, BCIQ Page 8Listed Lab. of FCC, VCCI, MOC A2LA Certificate #: 824.01 (for Emission)
NEMKO Authorization #: ELA 124 (for EMC) Rev. 00
Report Number: 011141-ERefer Number: 000908-EDecember 18, 2001
TEST EQUIPMENT LIST
Power Harmonic & Voltage Fluctuation/Flicker Measurement (61000-3-2&-3-3)EQUIPMENT
TYPEMFR MODEL
NUMBERSERIAL
NUMBERLASTCAL.
CAL DUE.
Harmonic & Flicker
Tester
HAEFELY
TRENCHPHF555 080 419-25 10/12/2001 10/11/2002
ESD test (61000-4-2)EQUIPMENT
TYPEMFR MODEL
NUMBERSERIAL
NUMBERLASTCAL.
CAL DUE.
ESD GeneratorHAEFELY
TRENCHPESD 1600 H710203 09/01/2001 08/31/2002
Radiated Electromagnetic Field immunity Measurement (61000-4-3)EQUIPMENT
TYPEMFR MODEL
NUMBERSERIAL
NUMBERLASTCAL.
CAL DUE.
Signal Generator Maconi 2022D 119246/003 08/20/2001 08/19/2002
Power Amplifier M2S A00181/ 1000 9801-112 N/A N/A
Power Amplifier M2SAC8113/ 800-
250A9801-179 N/A N/A
Power Antenna EMCO 93141 9712-1083 N/A N/A
EM PROBE GW EMR-30 L-0013 03/13/2001 03/12/2002
Fast Transients/Burst test (61000-4-4)EQUIPMENT
TYPEMFR MODEL
NUMBERSERIAL
NUMBERLASTCAL.
CAL DUE.
Fast Transients/Burst
Generator
HAEFELY
TRENCHPEFT- JUNIOR 583 333-117 08/21/2001 08/20/2002
ClampHAEFELY
TRENCH093 506.1 080 421.13 N/A N/A
Accredited Lab. of NEMO, A2LA, BCIQ Page 9Listed Lab. of FCC, VCCI, MOC A2LA Certificate #: 824.01 (for Emission)
NEMKO Authorization #: ELA 124 (for EMC) Rev. 00
Report Number: 011141-ERefer Number: 000908-EDecember 18, 2001
Accredited Lab. of NEMO, A2LA, BCIQ Page 10Listed Lab. of FCC, VCCI, MOC A2LA Certificate #: 824.01 (for Emission)
NEMKO Authorization #: ELA 124 (for EMC) Rev. 00
Report Number: 011141-ERefer Number: 000908-EDecember 18, 2001
Surge Immunity test (61000-4-5)EQUIPMENT
TYPEMFR MODEL
NUMBERSERIAL
NUMBERLASTCAL.
CAL DUE.
Surge TesterHAEFELY
TRENCHPSUGER 4010 583 334-71 09/01/2001 08/31/2002
CDNHAEFELY
TRENCHIP6.2 148342 03/22/2001 03/21/2002
CDNHAEFELY
TRENCHDEC1A 148050 01/17/2001 01/16/2002
CS test (61000-4-6)EQUIPMENT
TYPEMFR MODEL
NUMBERSERIAL
NUMBERLASTCAL.
CAL DUE.
Signal Generator Maconi 2022D 119246/003 08/20/2001 08/19/2002
CDN MEB M3 3683 09/14/2001 09/13/2002
CDN Lüthi 801-M3 1879 03/05/2001 03/04/2002
CDN MEB M2 A3002010 04/17/2001 04/16/2002
Power Amplifier M2S A00181/ 1000 9801-112 N/A N/A
Clamp MEB KEMZ-801 13 602 N/A N/A
Voltage Dips/Short Interruption and Voltage Variation Immunity test (61000-4-11)EQUIPMENT
TYPEMFR MODEL
NUMBERSERIAL
NUMBERLASTCAL.
CAL DUE.
Dips/Interruption and
Variations Simulator
HAEFELY
TRENCHPLINE 1610 080 344-05 02/08/2001 02/07/2002
Accredited Lab. of NEMO, A2LA, BCIQ Page 11Listed Lab. of FCC, VCCI, MOC A2LA Certificate #: 824.01 (for Emission)
NEMKO Authorization #: ELA 124 (for EMC) Rev. 00
Report Number: 011141-ERefer Number: 000908-EDecember 18, 2001
EUT Configuration during measurement:
1) Pre-scan mode are list as below:
Mode(s): (Customer defined)
1. Resolution 1024 x 768 + CPU Intel PIII 850MHz + NEC FDD + Fujitsu HDD + UJDA330 DVD-ROM(With Touch Screen)
2. Resolution 800 x 600 + CPU Intel PIII 850MHz + NEC FDD + Fujitsu HDD + UJDA330 DVD-ROM(With Touch Screen)
3. Resolution 640 x 480 + CPU Intel PIII 850MHz + NEC FDD + Fujitsu HDD + UJDA330 DVD-ROM(With Touch Screen)
4. Resolution 1024 x 768 + CPU Intel PIII 850MHz + NEC FDD + Fujitsu HDD + SCR-242 CD-ROM(With Touch Screen)
5. Resolution 1024 x 768 + CPU Intel PIII 850MHz + NEC FDD + Fujitsu HDD + SDR-081 DVD-ROM(With Touch Screen)
6. Resolution 1024 x 768 + CPU Intel PIII 850MHz + NEC FDD + Fujitsu HDD + SR-8175-C CD-ROM(With Touch Screen)
2) After pre-scan, found mode 1 producing the highest emission level, used this mode for all final test.
Accredited Lab. of NEMO, A2LA, BCIQ Page 12Listed Lab. of FCC, VCCI, MOC A2LA Certificate #: 824.01 (for Emission)
NEMKO Authorization #: ELA 124 (for EMC) Rev. 00
Report Number: 011141-ERefer Number: 000908-EDecember 18, 2001
SUMMARY DATA(LINE CONDUCTED TEST)
Model Number: PPC-153T
Tested by: Jason Lin Location: Site # 4
Test Mode: Mode 1
Test Results: Passed
Temperature: 24oC Humidity: 70%RH
(The chart below shows the highest readings taken from the final data)
L1 = Line One (Hot side) / L2 = Line Two (Neutral side)
**NOTE: “---” denotes the emission level was or more than 2dB below the Average limit, so no re-check anymore.
Accredited Lab. of NEMO, A2LA, BCIQ Page 13Listed Lab. of FCC, VCCI, MOC A2LA Certificate #: 824.01 (for Emission)
NEMKO Authorization #: ELA 124 (for EMC) Rev. 00
Report Number: 011141-ERefer Number: 000908-EDecember 18, 2001
SUMMARY DATA(COMMON MODE CONDUCTED EMISSION MEASUREMENT)
(LAN Port)
Model Number: PPC-153T Location: Site # 4
Tested by: Jason Lin
Test Mode: Mode 1
Test Results: Passed
Temperature: 15oC / 12 oC (10/100) Humidity: 71% / 73% RH (10/100)
(The chart below shows the highest readings taken from the final data)
**NOTE: “---” denotes the emission level was or more than 2dB below the Average limit, so no re-check anymore.
Accredited Lab. of NEMO, A2LA, BCIQ Page 14Listed Lab. of FCC, VCCI, MOC A2LA Certificate #: 824.01 (for Emission)
NEMKO Authorization #: ELA 124 (for EMC) Rev. 00
Report Number: 011141-ERefer Number: 000908-EDecember 18, 2001
SUMMARY DATA
(RADIATED EMISSION TEST)
Model Number: PPC-153T Location: Site # 4
Tested by: Jason Lin Polar: Vertical--10m
Test Mode: Mode 1 Test Results: Passed
Detector Function: Quasi-Peak
Temperature: 16oC Humidity: 70%RH
(The chart below shows the highest readings taken from the final data)====================================================================
Freq. Raw Corr. Emiss. Limits MarginData Factor Level
(MHz) ( dBuV/m ) (dB) ( dBuV/m ) (dB)==================================================================== 36.27 10.7 16.5 27.2 30.0 -2.8---------------------------------------------------------------------------- 65.29 18.9 6.7 25.6 30.0 -4.4---------------------------------------------------------------------------- 130.71 13.8 12.4 26.2 30.0 -3.8---------------------------------------------------------------------------- 163.61 15.9 10.9 26.8 30.0 -3.2---------------------------------------------------------------------------- 168.05 14.2 10.8 25.0 30.0 -5.0---------------------------------------------------------------------------- 294.34 17.3 15.0 32.3 37.0 -4.7----------------------------------------------------------------------------
Accredited Lab. of NEMO, A2LA, BCIQ Page 15Listed Lab. of FCC, VCCI, MOC A2LA Certificate #: 824.01 (for Emission)
NEMKO Authorization #: ELA 124 (for EMC) Rev. 00
Report Number: 011141-ERefer Number: 000908-EDecember 18, 2001
SUMMARY DATA
(RADIATED EMISSION TEST)
Model Number: PPC-153T Location: Site # 4
Tested by: Jason Lin Polar: Horizontal--10m
Test Mode: Mode 1 Test Results: Passed
Detector Function: Quasi-Peak
Temperature: 16oC Humidity: 70%RH
(The chart below shows the highest readings taken from the final data)====================================================================
Freq. Raw Corr. Emiss. Limits MarginData Factor Level
(MHz) ( dBuV/m ) (dB) ( dBuV/m ) (dB)==================================================================== 145.26 15.7 11.6 27.3 30.0 -2.7---------------------------------------------------------------------------- 163.18 14.9 10.9 25.8 30.0 -4.2---------------------------------------------------------------------------- 228.41 15.1 11.8 26.9 30.0 -3.1---------------------------------------------------------------------------- 620.17 9.7 22.0 31.7 37.0 -5.3---------------------------------------------------------------------------- 652.51 10.9 22.1 33.0 37.0 -4.0---------------------------------------------------------------------------- 704.28 11.6 21.7 33.3 37.0 -3.7----------------------------------------------------------------------------
Accredited Lab. of NEMO, A2LA, BCIQ Page 16Listed Lab. of FCC, VCCI, MOC A2LA Certificate #: 824.01 (for Emission)
NEMKO Authorization #: ELA 124 (for EMC) Rev. 00
Report Number: 011141-ERefer Number: 000908-EDecember 18, 2001
SECTION 2 EN 61000-3-2 & EN 61000-3-3 (POWER HARMONICS & VOLTAGE FLUCTUATION / FLICKER)
POWER HARMONICS MEASUREMENT
Port : AC mainsBasic Standard : EN 61000-3-2 (1995 + A1: 1998 + A2: 1998 + A14: 2000)Limits : V CLASS A ; CLASS DTester : Jason LinTemperature : 18oCHumidity : 49%
VOLTAGE FLUCTUATION/FLICKER MEASUREMENT
Port : AC mainsBasic Standard : EN 61000-3-3 (1995)Limits : §5 of EN 61000-3-3Tester : Jason LinTemperature : 18oCHumidity : 49%
Block Diagram of Test Setup:
Result:Please see the attached test data.
Accredited Lab. of NEMO, A2LA, BCIQ Page 17Listed Lab. of FCC, VCCI, MOC A2LA Certificate #: 824.01 (for Emission)
NEMKO Authorization #: ELA 124 (for EMC) Rev. 00
Harmonics & FlickerAnalyzer
+Power Source
( PF 555 ) EUT Support UnitsPower cord
0.8m
Report Number: 011141-ERefer Number: 000908-EDecember 18, 2001
----------------------------------------------------------------------EN 61000-3-2 TEST REPORT 2001/12/13 07:56 PM----------------------------------------------------------------------
Unit: PANEL PC
Model No.: PPC-153T
Remarks: TEMP:18℃ HUMIDITY:49%
Operator: Jason Lin
=====================================================================
TEST SETUP ----------
Test Freq.: 50.00 Hz. Test Voltage: 230.0 vacWaveform : SINE Test Time: 2.5 min.Classification : CLASS A Test Type: STEADY-STATE
Prog. Zo Enabled: YES Prog. Zo: 0.000
Motor Driven with Phase Angle Control: NOImpedance selected: DIRECT
Synthetic R+L Enabled: NOResistance: 0.380 Ohms Inductance: 460.000 uH
MAX WATTS: 61.1W
Accredited Lab. of NEMO, A2LA, BCIQ Page 18Listed Lab. of FCC, VCCI, MOC A2LA Certificate #: 824.01 (for Emission)
NEMKO Authorization #: ELA 124 (for EMC) Rev. 00
Report Number: 011141-ERefer Number: 000908-EDecember 18, 2001
TEST DATA---------
Result: PASS
Harmonic Current Results-------------------------------------------
Hn AMPS LO Limit HI Limit Result
0 0.000 0.000 0.000 PASS1 0.263 NaN NaN PASS2 0.002 1.080 1.080 PASS3 0.239 2.300 2.300 PASS4 0.002 0.430 0.430 PASS5 0.217 1.140 1.140 PASS6 0.002 0.300 0.300 PASS7 0.190 0.770 0.770 PASS8 0.001 0.230 0.230 PASS9 0.159 0.400 0.400 PASS10 0.001 0.184 0.184 PASS11 0.127 0.330 0.330 PASS12 0.001 0.153 0.153 PASS13 0.097 0.210 0.210 PASS14 0.000 0.131 0.131 PASS15 0.071 0.150 0.150 PASS16 0.000 0.115 0.115 PASS17 0.050 0.132 0.132 PASS18 0.000 0.102 0.102 PASS19 0.035 0.118 0.118 PASS20 0.000 0.092 0.092 PASS
Accredited Lab. of NEMO, A2LA, BCIQ Page 19Listed Lab. of FCC, VCCI, MOC A2LA Certificate #: 824.01 (for Emission)
NEMKO Authorization #: ELA 124 (for EMC) Rev. 00
Report Number: 011141-ERefer Number: 000908-EDecember 18, 2001
21 0.023 0.107 0.107 PASS22 0.000 0.084 0.084 PASS23 0.015 0.098 0.098 PASS24 0.000 0.077 0.077 PASS25 0.009 0.090 0.090 PASS26 0.000 0.071 0.071 PASS27 0.005 0.083 0.083 PASS28 0.000 0.066 0.066 PASS29 0.005 0.078 0.078 PASS30 0.000 0.061 0.061 PASS31 0.006 0.073 0.073 PASS32 0.000 0.058 0.058 PASS33 0.006 0.068 0.068 PASS34 0.000 0.054 0.054 PASS35 0.005 0.064 0.064 PASS36 0.000 0.051 0.051 PASS37 0.004 0.061 0.061 PASS38 0.000 0.048 0.048 PASS39 0.004 0.058 0.058 PASS40 0.000 0.046 0.046 PASS
END OF REPORT
Accredited Lab. of NEMO, A2LA, BCIQ Page 20Listed Lab. of FCC, VCCI, MOC A2LA Certificate #: 824.01 (for Emission)
NEMKO Authorization #: ELA 124 (for EMC) Rev. 00
Report Number: 011141-ERefer Number: 000908-EDecember 18, 2001
----------------------------------------------------------------------EN 61000-3-3 TEST REPORT 2001/12/13 08:15 PM----------------------------------------------------------------------
Unit: PANEL PC
Model No.: PPC-153T (Continue)
Remarks: TEMP:18℃ HUMIDITY:49%
Operator: Jason Lin
=====================================================================
TEST SETUP ----------
Test Freq.: 50.00 Hz. Test Voltage: 230.0 vacWaveform : SINETest Time: 10.0 min. Tshort: 10.0 min.
Prog. Zo Enabled: YES Prog. Zo: 0.000
Voltage Change less than once per Hour: NOImpedance selected: DIRECT
Synthetic R+L Enabled: NOResistance: 0.380 Ohms Inductance: 460.000 uH
Accredited Lab. of NEMO, A2LA, BCIQ Page 21Listed Lab. of FCC, VCCI, MOC A2LA Certificate #: 824.01 (for Emission)
NEMKO Authorization #: ELA 124 (for EMC) Rev. 00
Report Number: 011141-ERefer Number: 000908-EDecember 18, 2001
TEST DATA ---------
Result: PASS
EUT Data Limit Result Test Enabled
Pst max 0.001 1.00 PASS truePlt max 0.001 0.65 PASS truedc % 0.00 3.00 PASS truedmax % 0.00 4.00 PASS trued(t) sec. 0.00 0.20 PASS true
Power Source DataSource Pst max 0.020 0.400 PASS true% THD 0.03 3.00 PASS true
END OF REPORT
Accredited Lab. of NEMO, A2LA, BCIQ Page 22Listed Lab. of FCC, VCCI, MOC A2LA Certificate #: 824.01 (for Emission)
NEMKO Authorization #: ELA 124 (for EMC) Rev. 00
Report Number: 011141-ERefer Number: 000908-EDecember 18, 2001
----------------------------------------------------------------------EN 61000-3-3 TEST REPORT 2001/12/13 08:29 PM----------------------------------------------------------------------
Unit: PANEL PC
Model No.: PPC-153T (Manual Switch)
Remarks: TEMP:18℃ HUMIDITY:49%
Operator: JASON
=====================================================================
TEST SETUP ----------
Test Freq.: 50.00 Hz. Test Voltage: 230.0 vacWaveform : SINETest Time: 10.0 min. Tshort: 10.0 min.
Prog. Zo Enabled: YES Prog. Zo: 0.000
Voltage Change less than once per Hour: NOImpedance selected: DIRECT
Synthetic R+L Enabled: NOResistance: 0.380 Ohms Inductance: 460.000 uH
Accredited Lab. of NEMO, A2LA, BCIQ Page 23Listed Lab. of FCC, VCCI, MOC A2LA Certificate #: 824.01 (for Emission)
NEMKO Authorization #: ELA 124 (for EMC) Rev. 00
Report Number: 011141-ERefer Number: 000908-EDecember 18, 2001
TEST DATA ---------
Result: PASS
EUT Data Limit Result Test Enabled
Pst max 0.085 1.00 PASS truePlt max 0.085 0.65 PASS truedc % 0.00 3.00 PASS truedmax % 0.00 4.00 PASS trued(t) sec. 0.00 0.20 PASS true
Power Source DataSource Pst max 0.020 0.400 PASS true% THD 0.03 3.00 PASS true
END OF REPORT
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NEMKO Authorization #: ELA 124 (for EMC) Rev. 00
Report Number: 011141-ERefer Number: 000908-EDecember 18, 2001
SECTION 3 IEC 61000-4-2 (ELECTROSTATIC DISCHARGE)
ELECTROSTATIC DISCHARGE (ESD) IMMUNITY TEST
Port : EnclosureBasic Standard : IEC 61000-4-2Test Level : ± 8 kV (Air Discharge)
± 4 kV (Contact Discharge)± 4 kV (Indirect Discharge)
Performance Criteria : B ( Standard require )Tester : Jason LinTemperature/Humidity: 14oC/47%
Block Diagram of Test Setup:( The 470 k ohm resistors are installed per standard requirement )
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Ground Reference Plane
Wooden Table
Support units
EUT&
Support Units
VCP
HCP>1m
0.8m
Report Number: 011141-ERefer Number: 000908-EDecember 18, 2001
Test Procedure:1. The EUT was located 0.1 m minimum from all side of the HCP.2. The support units were located 1 m minimum away from the EUT.3. A scroll ‘H’ test program was loaded and executed in Windows mode.4. The EUT sent above message to EUT and related peripherals through the test.5. Active the communication function if the EUT with such port(s).6. As per the requirement of EN 55024; applying direct contact discharge at the sides other than front of
EUT at minimum 50 discharges (25 positive and 25 negative) if applicable, can’t be applied direct contact discharge side of EUT then the indirect discharge shall be applied. One of the test points shall be subjected to at least 50 indirect discharge (contact) to the front edge of horizontal coupling plane.
7. Other parts of EUT where it is not possible to perform contact discharge then selecting appropriate points of EUT for air discharge, a minimum of 10 single air discharges shall be applied.
8. The application of ESD to the contact of open connectors is not required.9. Putting a mark on EUT to show tested points. The following test condition was followed during the tests.
Note: As per the A2 to IEC 61000-4-2, a bleed resistor cable is connected between the EUT and HCP during the test.
The electrostatic discharges were applied as follows:Amount of Discharges
Voltage Coupling Result (Pass/Fail)
Mini 25 /Point 4kV Contact Discharge PassMini 25 /Point 4kV Indirect Discharge HCP (Front) PassMini 25 /Point 4kV Indirect Discharge VCP (Left) N/AMini 25 /Point 4kV Indirect Discharge VCP (Back) N/AMini 25 /Point 4kV Indirect Discharge VCP (Right) N/AMini 10 /Point 8kV Air Discharge Pass
*** The tested points to EUT please refer to attach pages.(Blue arrow mark for contact discharge, red arrow mark for air discharge.)
Performance & Result:
V Criteria A: The apparatus continues to operate as intended. No degradation of performance or loss of function is allowed below a performance level specified by the manufacturer, when the apparatus is used as intended. In some cases the performance level may be replaced by a permissible loss of performance.
Criteria B: The apparatus continues to operate as intended after the test. No degradation of performance or loss of function is allowed below a performance level specified by the manufacturer, when the apparatus is used as intended. In some cases the performance level may be replaced by a permissible loss of performance. During the test, degradation of performance is however allowed.
Criteria C: Temporary loss of function is allowed, provided the functions self recoverable or can be Accredited Lab. of NEMO, A2LA, BCIQ Page 26Listed Lab. of FCC, VCCI, MOC A2LA Certificate #: 824.01 (for Emission)
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Report Number: 011141-ERefer Number: 000908-EDecember 18, 2001
restored by the operation of controls.
V PASS FAILED
Observation: No any function degraded during the tests.
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NEMKO Authorization #: ELA 124 (for EMC) Rev. 00
Report Number: 011141-ERefer Number: 000908-EDecember 18, 2001
The Tested Points of EUT:(Photo 1 of 2)
(Photo 2 of 2)
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Report Number: 011141-ERefer Number: 000908-EDecember 18, 2001
SECTION 4 IEC 61000-4-3 (RADIATED ELECTROMAGNETIC FIELD )
RADIATED ELECTROMAGNETIC FIELD IMMUNITY TEST
Port : EnclosureBasic Standard : IEC 61000-4-3 Requirements : 3 V/m / with 80% AM. 1kHz Modulation. Performance Criteria : A ( Standard require )Tester : Jason LinTemperature : 14oCHumidity : 47%
Block Diagram of Test Setup:
3 meter
1.5 meter
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Power Amp SignalGenerator
EUT Monitoring by using a camera
0.8m
Control Room
7x3x3 ChamberEUT & Support Units
PC Controller to control S.G. & PA as well as forward power
Report Number: 011141-ERefer Number: 000908-EDecember 18, 2001
Test Procedure:
1. The EUT was located at the edge of supporting table keep 3 meter away from transmitting antenna, it just the calibrated square area of field uniformity. The support units were located outside of the uniformity area, but the cable(s) connected with EUT were exposed to the calibrated field as per IEC 61000-4-3.
2. A scroll ‘H’ messages were displayed on part of screen of EUT and an enlarged ‘H’ characters were displayed on the other part of screen of EUT.
3. Adjusting the monitoring camera to monitor the ‘H’ message as clear as possible.4. Setting the testing parameters of RS test software per IEC 61000-4-3.5. Performing the pre-test at each side of with double specified level (6V/m) at 4% steps.6. From the result of pre-test in step 5, choice the worst side of EUT for final test from 80 MHz to 1000
MHz at 1% steps.7. Recording the test result in following table.8. It is not necessary to perform test as per annex A of EN 55024 if the EUT doesn’t belong to TTE product.
IEC 61000-4-3 Preliminary test conditions:Test level : 6V/mSteps : 4 % of fundamental;Dwell Time : 3 sec
Range (MHz) Field Modulation Polarity Position (°) Result (Pass/Fail)80-1000 6V Yes H Front Pass80-1000 6V Yes V Front Pass80-1000 6V Yes H Right Pass80-1000 6V Yes V Right Pass80-1000 6V Yes H Back Pass80-1000 6V Yes V Back Pass80-1000 6V Yes H Left Pass80-1000 6V Yes V Left Pass
IEC 61000-4-3 Final test conditions:Test level : 3V/mSteps : 1 % of fundamental;Dwell Time : 3 sec
Range (MHz) Field Modulation Polarity Position (°) Result (Pass/Fail)80-1000 3V Yes H Back Pass80-1000 3V Yes V Back Pass
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Report Number: 011141-ERefer Number: 000908-EDecember 18, 2001
Performance & Result:
V Criteria A: The apparatus continues to operate as intended. No degradation of performance or loss of function is allowed below a performance level specified by the manufacturer, when the apparatus is used as intended. In some cases the performance level may be replaced by a permissible loss of performance.
Criteria B: The apparatus continues to operate as intended after the test. No degradation of performance or loss of function is allowed below a performance level specified by the manufacturer, when the apparatus is used as intended. In some cases the performance level may be replaced by a permissible loss of performance. During the test, degradation of performance is however allowed.
Criteria C: Temporary loss of function is allowed, provided the functions self-recoverable or can be restored by the operation of controls.
V PASS FAILED
Observation: No any function degraded during the tests.
Accredited Lab. of NEMO, A2LA, BCIQ Page 31Listed Lab. of FCC, VCCI, MOC A2LA Certificate #: 824.01 (for Emission)
NEMKO Authorization #: ELA 124 (for EMC) Rev. 00
Report Number: 011141-ERefer Number: 000908-EDecember 18, 2001
SECTION 5 IEC 61000-4-4 (FAST TRANSIENTS/BURST)
FAST TRANSIENTS/BURST IMMUNITY TEST
Port : On Power Supply Lines and Data CableBasic Standard : IEC 61000-4-4Requirements : +/- 1kV for Power Supply Lines
+/- 0.5kV for Data CablePerformance Criteria : B ( Standard require )Tester : Jason LinTemperature : 18oCHumidity : 49%
Block Diagram of Test Setup:
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NEMKO Authorization #: ELA 124 (for EMC) Rev. 00
Controller Computer
EFT/Burst/SurgeGenerator
EUTSupport Units
AC80cm
Non-Conductive TableLine
Injection ClampBurst Generator
To Load
AC Line
Comm. Line ≥ 3 m EUT
80cmNon-Conductive
Table
10cm
Report Number: 011141-ERefer Number: 000908-EDecember 18, 2001
Test Procedure:
1. The EUT and support units were located on a wooden table 0.8 m away from ground reference plane.2. A 1.0 meter long power cord was attached to EUT during the test.3. The length of communication cable between communication port and clamp was keeping within 1 meter.4. A test program was loaded and executed in Windows mode.5. The data was sent to EUT filling the screens with upper case of “H” patterns.6. The test program exercised related support units sequentially.7. Repeating step 3 to 6 through the test.8. Recording the test result as shown in following table.
Test conditions:Impulse Frequency: 5kHzTr/Th: 5/50nsBurst Duration: 15msBurst Period: 3Hz
Inject Line Voltage kV Inject Method Result (Pass/Fail)L1 +/- 1 Direct PassN +/- 1 Direct PassPE +/- 1 Direct Pass
L1+N +/- 1 Direct PassL1+PE +/- 1 Direct PassN+PE +/- 1 Direct Pass
L1 + N + PE +/- 1 Direct PassLAN Cable +/- 0.5 Clamp Pass
Performance & Result:
V Criteria A: The apparatus continues to operate as intended. No degradation of performance or loss of function is allowed below a performance level specified by the manufacturer, when the apparatus is used as intended. In some cases the performance level may be replaced by a permissible loss of performance.
Criteria B: The apparatus continues to operate as intended after the test. No degradation of performance or loss of function is allowed below a performance level specified by the manufacturer, when the apparatus is used as intended. In some cases the performance level may be replaced by a permissible loss of performance. During the test, degradation of performance is however allowed.
Criteria C: Temporary loss of function is allowed, provided the functions self recoverable or can be restored by the operation of controls.
Accredited Lab. of NEMO, A2LA, BCIQ Page 33Listed Lab. of FCC, VCCI, MOC A2LA Certificate #: 824.01 (for Emission)
NEMKO Authorization #: ELA 124 (for EMC) Rev. 00
Report Number: 011141-ERefer Number: 000908-EDecember 18, 2001
V PASS FAILED
Observation: No any function degraded during the tests.
Accredited Lab. of NEMO, A2LA, BCIQ Page 34Listed Lab. of FCC, VCCI, MOC A2LA Certificate #: 824.01 (for Emission)
NEMKO Authorization #: ELA 124 (for EMC) Rev. 00
Report Number: 011141-ERefer Number: 000908-EDecember 18, 2001
SECTION 6 IEC 61000-4-5 ( SURGE IMMUNITY )
SURGE IMMUNITY TEST
Port : Power Cord
Basic Standard : IEC 61000-4-5
Requirements : +/- 1kV (Line to Line)
: +/- 2kV (Line to Ground)
Performance Criteria : B ( Standard require )
Tester : Jason Lin
Temperature : 14oC
Humidity : 47%
Block Diagram of Test Setup:
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NEMKO Authorization #: ELA 124 (for EMC) Rev. 00
Surge Immunity Test
Controller Computer
EUT&
Support Units
80 mm
To ACSource
Report Number: 011141-ERefer Number: 000908-EDecember 18, 2001
Test Procedure:
1. The EUT and support units were located on a wooden table 0.8 m away from ground floor.2. A test program was loaded and executed in Windows mode.3. The data was sent to EUT filling the screens with upper case of “H” patterns.4. The test program exercised related support units sequentially.5. Repeating step 3 to 4 through the test.6. Recording the test result as shown in following table.
Test conditions:Voltage Waveform : 1.2/50 usCurrent Waveform : 8/20 usPolarity : Positive/NegativePhase angle : 0o, 90o, 270o
Number of Test : 5
Coupling Line Voltage (kV) Polarity Coupling Method Result (Pass/Fail)L1-L2 1 Positive Capacitive PassL1-PE 2 Positive Capacitive PassL2-PE 2 Positive Capacitive PassL1-L2 1 Negative Capacitive PassL1-PE 2 Negative Capacitive PassL2-PE 2 Negative Capacitive Pass
Performance & Result:
V Criteria A: The apparatus continues to operate as intended. No degradation of performance or loss of function is allowed below a performance level specified by the manufacturer, when the apparatus is used as intended. In some cases the performance level may be replaced by a permissible loss of performance.
Criteria B: The apparatus continues to operate as intended after the test. No degradation of performance or loss of function is allowed below a performance level specified by the manufacturer, when the apparatus is used as intended. In some cases the performance level may be replaced by a permissible loss of performance. During the test, degradation of performance is however allowed.
Criteria C: Temporary loss of function is allowed, provided the functions self recoverable or can be restored by the operation of controls.
V PASS FAILED
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NEMKO Authorization #: ELA 124 (for EMC) Rev. 00
Report Number: 011141-ERefer Number: 000908-EDecember 18, 2001
Observation: No any function degraded during the tests.
Accredited Lab. of NEMO, A2LA, BCIQ Page 37Listed Lab. of FCC, VCCI, MOC A2LA Certificate #: 824.01 (for Emission)
NEMKO Authorization #: ELA 124 (for EMC) Rev. 00
Report Number: 011141-ERefer Number: 000908-EDecember 18, 2001
SECTION 7 IEC 61000-4-6 (CONDUCTED DISTRBANCE/INDUCED BY RADIO-FREQUENCY FIELD)
Port : AC Port and LAN CableBasic Standard : IEC 61000-4-6Requirements : 3V with modulatedInjection Method : CDN-M3 for Power Cord
EM-Clamp for LAN CablePerformance Criteria : A (Standard require)Tester : Jason LinTemperature : 14oCHumidity : 47%
Block Diagram of Test Setup:
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CDN
EUT and Support units Power
AmplifierPCController
Ground Reference Plane
10 cm isolation supporter
0.1m< L <0.3m
PowerAmplifier
PCController
EM-Clamp
EUT & Support Units
Support Units
Ground Reference Plane
3 - 5 cm isolation supporter
0.1m<L<0.3m
10 cm isolation supporter
Report Number: 011141-ERefer Number: 000908-EDecember 18, 2001
Test Procedure:
1. The EUT and support units were located at a ground reference plane with the interposition of a 0.1 m thickness insulating support and the CDN was located on GRP directly.
2. A ‘H’ messages were displayed on screen of EUT.3. Adjusting the monitoring camera to monitor the ‘H’ message as clear as possible.4. Setting the testing parameters of CS test software per IEC 61000-4-6.5. Recording the test result in following table.
Test conditions:Frequency Range : 0.15MHz-80MHzFrequency Step : 1% of fundamentalDwell Time : 3 sec
Range (MHz) Field Modulation Result (Pass/Fail)
0.15-80 3V Yes Pass
Performance & Result:
V Criteria A: The apparatus continues to operate as intended. No degradation of performance or loss of function is allowed below a performance level specified by the manufacturer, when the apparatus is used as intended. In some cases the performance level may be replaced by a permissible loss of performance.
Criteria B: The apparatus continues to operate as intended after the test. No degradation of performance or loss of function is allowed below a performance level specified by the manufacturer, when the apparatus is used as intended. In some cases the performance level may be replaced by a permissible loss of performance. During the test, degradation of performance is however allowed.
Criteria C: Temporary loss of function is allowed, provided the functions self-recoverable or can be restored by the operation of controls.
V PASS FAILED
Observation: No any function degraded during the tests.
Accredited Lab. of NEMO, A2LA, BCIQ Page 39Listed Lab. of FCC, VCCI, MOC A2LA Certificate #: 824.01 (for Emission)
NEMKO Authorization #: ELA 124 (for EMC) Rev. 00
Report Number: 011141-ERefer Number: 000908-EDecember 18, 2001
SECTION 8 IEC 61000-4-8 (POWER FREQUENCY MAGNETIC FIELD IMMUNITY TEST)
Port : EnclosureBasic Standard : IEC 61000-4-8Requirements : 1 A/mPerformance Criteria : A (Standard Required)Tester : Jason LinTemperature : 14 oCTemperature / Humidity : 47%
Block Diagram of Test Setup:
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EUT
SignalGenerator
To Earth Ground
To Earth Ground
Induction Coil
10mm thickInsulation Support
1/2 Dimension of EUT
Report Number: 011141-ERefer Number: 000908-EDecember 18, 2001
Test Procedure:
1. The EUT and support units were located on Ground Reference Plane with the interposition of a 0.1 m thickness insulation support.
2. Putting the induction coil on horizontal direction.( X direction )3. A test program was loaded and executed in Windows mode.4. The data was sent to the screen of EUT and filling the screen with upper case of “H” patterns.5. The test program exercised related support units sequentially.6. Repeating step 3 to 5 through the test.7. Recording the test result as shown in following table.8. Rotating the induction coil by 90o ( Y direction ) then repeat step 3 to 7.9. Rotating the induction coil by 90 o again ( Z direction ) then repeat step 3 to 7.
*. Test conditions:Field Strength: 1A/mPower Freq.: 50HzOrientation: X, Y, Z
Orientation Field Result (Pass/Fail) RemarkX 1A PassY 1A PassZ 1A Pass
Performance & Result:V Criteria A: The apparatus continues to operate as intended. No degradation of performance or loss
of function is allowed below a performance level specified by the manufacturer, when the apparatus is used as intended. In some cases the performance level may be replaced by a permissible loss of performance.
V Criteria B: The apparatus continues to operate as intended after the test. No degradation of performance or loss of function is allowed below a performance level specified by the manufacturer, when the apparatus is used as intended. In some cases the performance level may be replaced by a permissible loss of performance. During the test, degradation of performance is however allowed.
V Criteria C: Temporary loss of function is allowed, provided the functions self recoverable or can be restored by the operation of controls.
V PASS FAILED
Observation: No any function degraded during the tests.
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NEMKO Authorization #: ELA 124 (for EMC) Rev. 00
Report Number: 011141-ERefer Number: 000908-EDecember 18, 2001
SECTION 9 IEC 61000-4-11 (VOLTAGE DIPS, SHORT INTERRUPTIONS AND VOLTAGE VARIATIONS )
VOLTAGE DIPS / SHORT INTERRUPTIONSPort : AC mainsBasic Standard : IEC 61000-4-11 (1994)Requirement : PHASE ANGLE 0, 45, 90, 135, 180, 225, 270, 315 degrees
Voltage Dips
Test Level% UT
Reduction(%)
Duration( periods )
PerformanceCriteria
5 95 0.5 B70 30 25 C
Voltage Interceptions
Test Level% UT
Reduction(%)
Duration( periods )
PerformanceCriteria
5 95 250 C
Test Interval : Min. 10 sec.Tester : Jason LinTemperature : 14oCHumidity : 47%
Block Diagram of Test Setup:
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Dips/Interruption and Variations Simulator
Controller Computer
EUT&
Support Units
80 mm
To AC Source
Report Number: 011141-ERefer Number: 000908-EDecember 18, 2001
Test Procedure:1. The EUT and support units were located on a wooden table, 0.8 m away from ground floor.2. A test program was loaded and executed in Windows mode.3. The data was sent to EUT filling the screens with upper case of “H” patterns.4. The test program exercised related support units sequentially.5. Setting the parameter of tests and then Perform the test software of test simulator.6. Conditions changes to occur at 0 degree crossover point of the voltage waveform.7. Repeating step 3 to 4 through the test.8. Recording the test result in test record form.
Test conditions:The duration with a sequence of three dips/interruptions with interval of 10 s minimum( Between each test event )Voltage Dips:
Test Level% UT
Reduction(%)
Duration ( periods)
Observation Meet PerformanceCriteria
0 100 0.5 Normal A70 30 25 Normal A
Voltage Interruptions:Test Level
% UT
Reduction(%)
Duration ( periods)
Observation Meet PerformanceCriteria
0 100 250 EUT shut down, but can be recovered by manual, as the events disappear.
B
Performance & Result: Criteria A: The apparatus continues to operate as intended. No degradation of performance or loss
of function is allowed below a performance level specified by the manufacturer, when the apparatus is used as intended. In some cases the performance level may be replaced by a permissible loss of performance.
Criteria B: The apparatus continues to operate as intended after the test. No degradation of performance or loss of function is allowed below a performance level specified by the manufacturer, when the apparatus is used as intended. In some cases the performance level may be replaced by a permissible loss of performance. During the test, degradation of performance is however allowed.
Criteria C: Temporary loss of function is allowed, provided the functions self recoverable or can be restored by the operation of controls.
V PASS FAILED
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Report Number: 011141-ERefer Number: 000908-EDecember 18, 2001
APPENDIX 1
PHOTOGRAPHS OF TEST SETUP
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Report Number: 011141-ERefer Number: 000908-EDecember 18, 2001
LINE CONDUCTED EMISSION TEST (EN55022)Front View
Back View
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Report Number: 011141-ERefer Number: 000908-EDecember 18, 2001
COMMON MODE CONDUCTED EMISSION TEST
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NEMKO Authorization #: ELA 124 (for EMC) Rev. 00
Report Number: 011141-ERefer Number: 000908-EDecember 18, 2001
RADIATED EMISSION TEST (EN55022)Front View
Back View
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NEMKO Authorization #: ELA 124 (for EMC) Rev. 00
Report Number: 011141-ERefer Number: 000908-EDecember 18, 2001
POWER HARMONIC & VOLTAGE FLUCTUATION / FLICKER TEST (IEC 61000-3-2; IEC 61000-3-3)
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NEMKO Authorization #: ELA 124 (for EMC) Rev. 00
Report Number: 011141-ERefer Number: 000908-EDecember 18, 2001
ELECTROSTATIC DISCHARGE TEST (IEC 61000-4-2)
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NEMKO Authorization #: ELA 124 (for EMC) Rev. 00
Report Number: 011141-ERefer Number: 000908-EDecember 18, 2001
RADIATED ELECTROMAGNETIC FIELD (IEC 61000-4-3)
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NEMKO Authorization #: ELA 124 (for EMC) Rev. 00
Report Number: 011141-ERefer Number: 000908-EDecember 18, 2001
FAST TRANSIENTS/BURST TEST (IEC 61000-4-4)
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NEMKO Authorization #: ELA 124 (for EMC) Rev. 00
Report Number: 011141-ERefer Number: 000908-EDecember 18, 2001
SURGE IMMUNITY TEST (IEC 61000-4-5)
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Report Number: 011141-ERefer Number: 000908-EDecember 18, 2001
CONDUCTED DISTURBANCE, INDUCED BY RADIO-FREQUENCY FIELDS TEST (IEC 61000-4-6)
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Report Number: 011141-ERefer Number: 000908-EDecember 18, 2001
POWER FREQUENCY MAGNETIC FIELD IMMUNITY TEST (IEC 61000-4-8)
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NEMKO Authorization #: ELA 124 (for EMC) Rev. 00
Report Number: 011141-ERefer Number: 000908-EDecember 18, 2001
VOLTAGE DIPS / INTERRUPTION TEST (IEC 61000-4-11)
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