AFM ATOMIC FORCE MICROSCOPY

Typical configuration of an AFM. (1): Cantilever, (2): Support for cantilever, (3): Piezoelectric element(to oscillate cantilever at its eigen frequency.), (4): Tip (Fixed to open end of a cantilever, acts as the probe), (5): Detector of deflection and motion of the cantilever, (6): Sample to be measured by AFM, (7): xyz drive, (moves sample (6) and stage (8) in x, y, and z directions with respect to a tip apex (4)), and (8): Stage

Abilities: force measurement imaging and manipulation

0 20 40 60 80 100-3000

-2000

-1000

0

1000

2000

3000

4000

dis

tan

ce [

nm

]

distance [m]

0 20 40 60 80 100-1000

0

1000

2000

3000

4000

5000

dis

tan

ce [

nm

]

distance [m]

-20 0 20 40 60 80 100 120 140

-3000

-2000

-1000

0

1000

2000

3000

4000

5000

dis

tan

ce [

nm

]

distance [m]

4600 4800 5000 5200 5400 5600

-0.6

-0.4

-0.2

0.0

0.2

0.4

0.6

0.8

1.0

V

distance [nm]

0.0 0.5 1.0 1.5 2.0 2.5 3.0 3.5 4.0 4.5 5.0 5.50

2

4

6

8

10n

um

be

r o

f s

am

ple

s

average value of Young's modulus [MPa]

MY healthy tissue

P149

NIŻSZY MODUŁ YOUNGA DLA TKANEK PRAWIDLOWYCH

Penetration depth DZ is calculated using the formula: