advanced component characterization and modeling

Advanced ComponentCharacterization and Modeling

From Small-Signal to Large-Signal

- All in One -

2 Copyright 2005 NMDG Engineeringhttp://www.nmdg.be/http://www.nmdg.be/

Outline

Introduction Component Characterization A Large-Signal Network Analyzer The Absolute Calibration The MT4463 - The Hardware The MT4463 - All in One - MT4463 Modules

– High - Impedance Probing– Real-Time PA Analysis– Measurement-Based Behavioral Modeling

Component Characterization and Modeling Services Conclusion


A Vector Network Analyzer

2221212

2121111

aSaSb

aSaSb

TransistorRFICSystem

Measurement System

1a

1b

Analysis

sexperimentdifferent ngrepresenti with

,,, 2211

i

baba iiii

2a

2b

50

Experiment 1


Measurement System

1a

1b2a

2b

50

Experiment 2

f0 f0

f0

Superposition

f0

LINEAR BEHAVIOR


Component Characterization

DC Characterization

S-parameters at

different bias points

(option: pulsed)

Nonlinear Characteristics: Compression, AM-AM and AM-PM, TOI, Harmonic Distortion, Spectral Re-growth, Source- and Load-pull etc …. ????

ST

RA

IGH

TF

OR

WA

RD

MA

NY

PO

SS

IBIL

ITIE

S


Component Characterization

Power Meter

Vector Network Analyzer

ActiveHF

ActiveHF

Spectrum Analyzer

Power Meter

ActiveHF

Vector Signal Generator

ActiveHF

Vector SignalAnalyzer

LinearS-parameters

Compression

Harmonics

Spectral Regrowth

ActiveHF

CompressionDelivered Power

ActiveHF

Power Meter

Harmonics

Spectrum Analyzer

50 Ohm Termination

Source and Load Tuning

Oscilloscope

Power Meter

ActiveHF

Power Meter

In-circuitInspection

Different Setups for different aspects

without systematic approach

How to help the circuit designers,needing good models?


A Large - Signal Network Analyzerf0 2f0 3f0 ...


RealisticStimulus

RealisticStimulus

Measurement System

1v

1i2v

2i1a

1b

2a

2b

0)|,,,,(

0)|,,,,(

2121

2121

ftiivvg

ftiivvf MEASURING

– Travelling Waves (A, B)

– Voltage/Current (V, I)

AT THE COMPONENT PORTS

REPRESENTING IN– Frequency (f)

– Time (t)

– Freq - time

(envelope)

Meas-based model

Characterization Analysis

NONLINEAR BEHAVIOR


Component Characterization under CW Stimulus

Freq. (GHz)

1 2 3 4DC

DUT

Z1

Z2

Freq. (GHz)

1 2 3 4DC

Freq. (GHz)

1 2 3 4DC

Freq. (GHz)

1 2 3 4DC

Freq. (GHz)

1 2 3 4DC

All voltages and currents or waves are represented by a fundamental and harmonics (including DC)

Complex Fourier coefficients Xh of waveforms

X0

X1

X2

X3

X4


Component Characterization under Modulation

Freq. (GHz)

1 2 3 4DC

DUTZ1 Z2

Freq. (GHz)

1 2 3 4DC

Freq. (GHz)

1 2 3 4DC

Freq. (GHz)

1 2 3 4DC

Freq. (GHz)

1 2 3 4DC

Complex Fourier coefficients Xh(t) of waveforms

Phasor

Amplitude

Phase

Fast change (GHz)

Slow change (MHz)

Modulation

X0(t)

X1(t)

X2(t)

X3(t)

X4(t)

time

time time

time time


Component Characterization under Periodic Modulation

Freq. (GHz)

1 2 3 4DC

DUT

Z1

Z2

Freq. (GHz)

1 2 3DC

Complex Fourier coefficients Xhm of waveforms

Freq. (GHz)

1 2 3DC

Freq. (GHz)

1 2 3DC

Freq. (GHz)

1 2 3DC

Phasor

Amplitude

Phase

PeriodicModulation

X0i

X1i

X2i X3i

The class of signal is extendable to any type of multi-tone signal


Complete SpectrumWaveforms

Harmonics and Periodic Modulation

50 Ohmor

tuner

Acquisition

Calibration

Stimulus

Response

ReferencePlanes

ModulationSource

Large-Signal Network Analyzer


Acquisition in LSNA

Filter

Filter

Filter

Filter

PC

Acq

uisi

tion

Uni

t

LO

Sampling Converter


Harmonic Sampling - Signal Class: Continuous Wave LP

IF Bandwidth

1 2 3

50 fLO 100 fLO 150 fLO

Freq. (MHz)1 2 3

RF

IF

fLO=19.98 MHz = (1GHz-1MHz)/501 MHz

2 MHz3 MHz


Harmonic Sampling - Signal Class: Narrowband Modulation LP

IF Bandwidth

1 2 3

50 fLO100 fLO 150 fLO

Freq. (MHz)1 2 3

RF

IF

fLO=19.98 MHz = (1GHz-1MHz)/50

1 MHz

2 MHz3 MHz


Harmonic Sampling - Signal Class: Broadband Modulation

Freq. (GHz)1 2 3

150 fLO

Freq. (MHz)

RF

IF

BW Adapted sampling process

BW of Periodic Broadband Modulation = 2* BW IF data acquisition

BW2BW MHz

LP


Practical Limitations of LSNA

Large-Signal Network analysis will be performed using periodic stimuli

– one - tone and harmonics– periodic modulation and harmonics– other types of multi - tones are possible

The devices under test maintain periodicity in their response


50 Ohmor

tuner

Acquisition

Calibration

Stimulus

Response

ReferencePlanes

ModulationSource

LSNA Calibration

Measured waves

Actual waves at DUT

7 relative error termssame as a VNAAbsolute magnitude

and phase error term

ma1mb1

ma2mb2

DUTa1DUTa2

DUTb1

DUTb2

m

m

m

m

DUT

DUT

DUT

DUT

b

a

b

a

K

b

a

b

a

2

2

1

1

22

22

11

1

2

2

1

1

00

00

00

001

F0=1GHz

freq

1GH

z

2GH

z

3GH

z


Relative Calibration: Load-Open-Short

50 Ohm

Acquisition

50 Ohm

LoadOpenShort

50 Ohm

Acquisition

50 Ohm Thru

{f0, 2 f0, …, n f0}

Calibration for all multi - tones

22

22

11

1

00

00

00

001

K

{f0, 2 f0, …, n f0}

f0 = 1GHz


Power Calibration

50 Ohm

Acquisition

Power Meter{f0, 2 f0, …, n f0}

22

22

11

1

00

00

00

001

K

f0 = 1GHz

Amplitude

{f0, 2 f0, …, n f0}

freq

1GH

z

2GH

z

3GH

z


Phase Calibration

50 Ohm

Acquisition

Harmonic PhaseReference

f0

...f0

50 Ohm

22

22

11

1

00

00

00

001

K

f0 = 1GHz

Phase

{f0, 2 f0, …, n f0}

freq

1GH

z

2GH

z

3GH

z


Measurement Traceability

Relative Cal Phase Cal Power Cal

National Standards

Agilent Nose-to-NoseStandard (*)

(*) Licensed to Maury and NMDG

EOS

(NIST) (demonstratedalready with NIST)


MT4463

MT4463A - 20 GHz MT4463B - 50 GHz


Adapting MT4463 to different needs

MT4463A/B

Active HF ComponentCharacterization

Complete

Accurate

DC IVCharacterization

Small-Signal

Large-Signal

ModulationCharacterization

ActiveTuning

PassiveTuning

Under differentImpedance Conditions

Adding … Modulation Capability

Adding … DC Capability

Adding … Tuners

Adding … Pre-match Tuner … Second Source


MT4463A - 20 GHz

System Source

Test Set

Test Board

Sampling Converter

PC Acquisition Unit

Harmonic Phase ReferenceAmplifier

Pulse GeneratorPower Sensor

Power Meter


MT4463B - 50 GHz

System Source

Test Set -Calibration Module

Sampling Converter

PC Acquisition Unit

Harmonic Phase ReferenceAmplifier

Pulse GeneratorPower Sensor

Power Meter

Test Set -Reflectometers


The Test Set - 50 GHz - On WaferMT4466B001

ReflectometerReflectometer

Calibration Module


The Software LSNA v1.1.0

DC Characterization (using script) Small - Signal: S-parameters Large - Signal: Provides calibrated measurements of voltages

and currents or incident and reflected waves in reference planes at the device under test under periodic stimulus in mismatched conditions

Graphical User Interface supporting basic functionality– Control– Data Visualization

Open system– Powerful scripting language to develop own applications– API to connect into your tools

• MATLAB• LabVIEW ...


Easy control via GUI

De-embedding

Ranging

Save data

ConfigureSystem

CalibrateSystem

Modulation

SOLTLRRMTRL


Calibration using GUI

DC calibration eliminates the cable losses

In this case: DC is not applied via bias tees but separately via port 3 and 4

SOLT Calibration


From small - signal to large - signal with ONE connection

Commercial available FET in fixture

Test Port 1

Test Port 2

Absolute Calibration

Deembedding

Bias Control

Vgs = -0.3 V Vds = 1.5 V

Synthesizer Control


Measuring S-parameters

Power Controlat Port 1

Persistencymode

Frequency Range: 600 MHz – 20, 40 or 50 GHz (depending on Test Set and Source)

Supported Calibration techniques: SOLT, LRRM, TRL

S11

S21 S22

S12Markers

Power Controlat Port 2


Large-Signal Measurements - CW - Voltage/Current

Time domain


Large-Signal Measurements - CW - Voltage Waves

Time domain


Large-Signal Measurements - CW - Voltage/Current

Frequency domain


DC-IV curve and load lineSmall-signal - 50 Ohm Termination

Large-signal - 50 Ohm Termination

Large-signal - non-50 Ohm Termination


Input and Load impedance under CW

Impedance at fundamental non-50 Ohm Termination

Impedance at 2nd harmonicnon-50 Ohm Termination


Periodic Modulation - Multi-tone generation

Generation of Multi-tone

Carrier

Modulation

Tones


Large-Signal Measurements - Modulation - Voltage/Current

Frequency domain



Frequency domain

Zoom into one of the spectral components



Frequency - Time domain


Dynamic AM/AM and AM/PM (two-tone 2kHz spacing)


Dynamic HDA (two-tone 2kHz spacing)


Powerful Scripting Language

Fast development of prototypes andnew applications,

exploiting all MT4463 capabilities,using Mathematica™


Connecting to your development tools

Data export• Citifile• Table• CSV

Talk to your instrumentsthrough

your own tools

Connection via LabVIEW

Connection via C-program

Connection via others

C-callable

DLLDLL

Stimulus Response


In-Circuit coherent and calibrated HF Signal Probing(*)

58

1012131415

Pin (dBm)

-10

-8

-6

-4

-2

0

2

4

6

8

10

-3

-2,5

-2

-1,5

-1

-0,5

0

0,5

1

1,5

-10

-8

-6

-4

-2

0

2

4

6

8

10

(*) With courtesy of CNES and IRCOM


Real-Time PA Analysis - Setup

Triplexer

f0 f0

2f0

i1 i2

DUTv1 v2

3f0

(optional)

(optional)

Offset +smart signal

to scan amplitudeand phase

MT4463


Real - time PA Analysis and Load pull

on-wafer

FET

2 GHz

vG=-0.9V

vD=3.0V

GainReactive PowerHarmonic Power...

Power source


max Pdel 10.13 dBm 10.04 dBm harmonics (0.1 dB)@ 68.5 + j 8.5 71.7 + j 7.1 flat surface4 additional points: || < 0.1 dB

Real-time load-pullCompared to classical load-pull


Measurement - Based Behavioral ModelSetup and boundaries

setup

sweeppower

regionmismatch

grida2

equid.


Integration of model into simulator (ADS)

FDD + DACcomponent

CITI file regular grid

no triangulationrequired


Verification of model (load-pull)

contours basedon HB simulations

on regular polar gridusing MBBM

imported into ADS

contours basedon classical

load-pull dataimported into ADSafter triangulation


Verification of model (source-pull)

contours basedon HB simulations

on regular polar gridusing MBBM

imported into ADS

contours basedon classical

source-pull dataimported into ADS after triangulation


Model Capabilities

Compression / Gain Source - and Load - pull with most power

characteristics Modulation Prediction

(even under mismatches)

QPSK at input

QPSK at output

Spectral Re-growthat inputat output

Mismatched Condition

Dynamic Compression

Input Power

Out

put P

ower


NMDG Characterization Service

With one single connection to the component, you get– DC I-V characteristics - S-parameters at different bias points

– Broadband voltage and current waveforms • at the input and output of the test device • including fundamental, harmonic and modulation behaviour • for different bias conditions, powers and at different frequencies• under continuous wave stimulus• under different impedances

Diodes

Transistors

Amplifiers

(De)Modulators

RF Switches

O/E components

RF MEMS

...


NMDG Characterization Service

With one single connection to the component, you get– Dynamic Loadlines

– Intermodulation / IM3

- Static and Dynamic Harmonic DistortionAnalysis (amplitude and phase)

- … and many more on request

- Measurement data connection in circuit design tools


NMDG Advanced Characterization Service

Requires customized engineering

Hot S-parameter measurements Stability analysis under hot conditions Large-signal measurements under pulsed conditions Measurement of input impedance of sources, oscillators under

hot conditions Conversion matrices Characterization of frequency translating devices, e.g. mixers In-circuit measurements using high-impedance or active probes

On request: Other large-signal characteristics can be measured


NMDG Modeling Service

Only Measurement - Based Behavioral Models Capabilities

– Accurate and complete at a specified fundamental frequency for a given input power range and a range of source and load impedances

– The bias circuitry is assumed to be part of the component– Modulation prediction is possible under quasi-static

assumptions

Key Values– Fast availability of accurate model

speeds up concurrent design– Simulate your active HF components

under mismatched conditions, fast andaccurately


HF Measurement System Consulting Closing the gap between instruments and the increasing complexity to

characterize and test HF active components and circuits

Key Values– Focus on your design and production,

not on developing measurement systems– Eliminate the guess work in your measurements

by adding the proper calibration– Extend your signal analysis capability to in-circuit testing

through software and additional hardware

CircuitDesignTools

Graphical User Interface Development

Signal Processingand

Algorithm Development

Instrument Control

NMDG offers ...


HF Measurement System Consulting

In - circuitHF Signal Testing

withcalibration at the component

Stimulus - ResponseMeasurement System

for HF and High-Speed Signals

CalibrationSoftware

CorrectionCoefficients

Calibration Planes


HF Measurement System Consulting

58

1012131415

Pin (dBm)

-10

-8

-6

-4

-2

0

2

4

6

8

10

-3

-2,5

-2

-1,5

-1

-0,5

0

0,5

1

1,5

-10

-8

-6

-4

-2

0

2

4

6

8

10

In - Circuit coherent and calibrated HF Signal Probing (*)

(*) With courtesy of CNES and IRCOM


Conclusion MT4463 is one instrument to study the nonlinear behavior in all its

aspects– from small - signal to large -signal with one connection– under CW and modulation condition in mismatched environments

MT4463 it is the only instrument providing the complete state of a component, compatible with present simulators

MT4436 is designed to evolve over - time securing your investment

NMDG Characterization and Modeling ServiceNMDG Characterization and Modeling Servicegive you

The MT4463 Experienceat low risk

NMDG HF System ConsultingNMDG HF System Consultingbrings NMDG Expertise

to your bench

advanced component characterization and modeling

Documents

nmdg engineeringhttp

sampling signal class

modelingfrom smallsignal

hardwarethe mt4463

periodic modulationfreq

different bias points

harmonic distortion

spectral regrowth