2014-2015 general brochure-eng-23jan2015 - horiba...xplora nano afm-raman nanolog® fluorescence...

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France:USA:Japan:Germany:Italy:UK: China:

Brazil:

Singapore: Indonesia: Thailand:Vietnam: Korea: Other:

HORIBA Jobin Yvon S.A.S., 16-18 rue du Canal, 91165 Longjumeau cedex - Tel: +33 (0)1 69 74 72 00 - Fax: +33 (0)1 69 09 07 21 - Email: [email protected] Instruments Inc., 3880 Park Avenue, Edison, NJ 08820-3012 - Toll-free: +1-866-562-4698 - Tel: +1 732 494 8660 - Fax: +1 732 549 5125 - Email: [email protected] Ltd., Tokyo Branch Offi ce, 2-6, KandaAwaji-cho, Chiyoda-ku, Tokyo 101-0063, Japan - Tel: +81-(0)3 6206 4721 - Fax: +81 (0)3 6206 4730 - Email: [email protected] Jobin Yvon GmbH, Hauptstrasse 1, 82008 Unterhaching - Tel: +49 (0)89 4623 17-0 - Fax: +49 (0)89 4623 17-99 - Email: [email protected] Jobin Yvon Srl., Via Cesare Pavese 21, 20090 Opera (Milano) - Tel: +39 2 5760 3050 - Fax: +39 2 5760 0876 - Email: [email protected] UK Ltd., 2 Dalston Gardens, Stanmore, Middlesex HA7 1BQ - Tel: +44 (0)20 8204 8142 - Fax: +44 (0)20 8204 6142 - Email: [email protected] (China) Trading Co. Ltd., Unit D 1F, Bldg A, Srynnex International Park, No. 1068 West Tianshan Road, Shanghai 200335 - Tel: +86 (0)21 6289 6060 - Fax: +86 (0)21 6289 5553 Email: [email protected] HORIBA Instruments Brasil Ltda., Rua Presbítero Plínio Alves de Souza, 645, Loteamento Polo Multivias, Bairro Medeiros, Jundiaí / SP, CEP 13.212-181 - Tel: +55 (0)11 2923 5400 Fax: +55 (0)11 2923 5490 - Email: infocientifi [email protected] Instruments (Singapore) Pte Ltd., 10 Ubi Crescent, #05-11/12, Ubi Techpark 408564 Singapore - Tel: +65 6745 8300, +65 6745 8155PT. HORIBA Indonesia, Ruko Jalur Sutera Jl. Jalur Sutera Blok 20 A No. 16-17 Tangerang, Banten 15144, Indonesia - Tel: +62 21 30448525, +62 21 30448521 - Email: [email protected] (Thailand) Ltd., 393, 395, 397, 399, 401, 403 Latya Road, Somdetchaophraya, Khlongsan Bangkok 10600 THAILAND - Tel: +66 2 861 5995 - Fax : +66 2 861 52 00HORIBA Instruments (Singapore) Pte Ltd., Unit 10, 4 Floor, CMC Tower, Duy Tan Street, Dich Vong Hau Ward, Cau Giay District, Hanoi, Vietnam - Tel: +84 4 3795 8552, +84 4 3795 8553HORIBA Korea Ltd., 10, Dogok-ro 6 gil, Gangnam-gu,Seoul, 135-860, Korea - Tel: +82 (0)2 753-7911 - Fax: +82 (0)2 756 4972Tel: +33 (0)1 69 74 72 00 - Email: [email protected]

Supporting research and development with new ideas and technologies

PRODUCT CATALOGUE 2014-2015OPTICAL SPECTROSCOPY MOLECULAR SPECTROSCOPY ELEMENTAL ANALYSIS

PARTICLE CHARACTERIZATION SURFACE CHARACTERIZATION

CONTENTS

P 05

P 14

P 06

P 16

P 08

P 18

P 10

P 20

P 12

P 21

Forensics

Automotive

Bio/Life Science

Energy/Solar Cell

Petrochemistry

Archeometry

Advanced Material

Batteries

Earth Science/Enviromental

Organic Electronics

[Application]

22 - 28

29 - 39

40 - 49

50 - 51

52 - 57

58

59

OPTICAL SPECTROSCOPY

MOLECULARSPECTROSCOPY & ANALYSIS

SURFACE CHARACTERIZATION

PARTICLE SIZEANALYSIS

ELEMENTAL ANALYSIS

Scientifi c Gratings / VUV Systems /OEM Gratings & Spectrometers / Optical Spectroscopy

Raman Spectroscopy / Fluorescence Spectroscopy /Surface Plasmon Resonance imaging

Ellipsometry / GD-OES / Plasma Profi ling-TOFMS /SEM-Cathodoluminescence / Microscopy

Particle Analyzers

ICP-OES / X-ray Fluorescence Analyzers / Energy Dispersive X-ray (EDXRF) / Micro Analyzers / C/S/O/N/H Analyzers / Sulfur-in-Oil Analyzers

History Timeline

ABOUT HORIBA Scientifi c

59

History Timeline

AB

OU

T HO

RIB

A S

cientifi c

Amédée Jobin appointed (CEO)

Gustave Yvon appointed (CEO)

JOBIN YVON established

Established by J.B. Soleil. Collaboration with Fresnel, Arago, Régnault, Babinet

Introduced a saccharimeter

Acquisition of SPEX, Edison, NJ, USA

UVISEL Spectroscopic Ellipsometer received "Yves Rocard" award

Development of the UVISEL Spectroscopic Ellipsometer

The fi rst holographic diffraction grating is introduced

Acquisition of DILOR (Raman Spectrometry), Villeneuve d’Ascq, France

Acquisition of SOFIE (process control), Arpajon, France

1996

JOBIN YVON merged into HORIBA Group

HORIBA HORIBA JOBIN YVON

1819

1988

1989

1967

1923

1848

1892

1911

1992

19951995

1994

1996

2002

2006

2008

2012

2013

2011

2010

2009

1997

1953

2000

1976

1978

LabRAM XploRA INV won the "One of the Best New Instruments of 2010" award in China

HORIBA,Ltd. established

HORIBA developed the Japan's fi rst energy-dispersive X-ray analyzer

HORIBA developed "Cardy", the world's fi rst fl at, card-type, pH meter

HORIBA developed the world's fi rst X-ray microscope analyzer

Jobin Yvon received an award from NASA for its contribution to various space projects in NASA, France, Germany, Italy, and Japan (UVS Mars, SUBALU).

The combined Raman and FTIR Micro-spectroscope received the Gold Award from the Pittcon Exhibition

HORIBA Jobin Yvon joined HORIBA Scientifi c

HORIBA completed construction on Europe's largest R&D center in France

MicOS won the award "One of the Best New Instruments of 2013" in China

LabRAM HR Evolution won the "One of the Best New Instruments of 2012" award in China

Auto SE won EuroAsia IC Industry New System Award 2008

Aqualog won the "One of the Best New Instruments of 2011" award in China

Received the JPL award from NASA for the manufacturing of three outstanding space diffraction gratings for the Orbiting Carbon Observatory

ABOUT HORIBA Scientifi c

58

AB

OU

T HO

RIB

A S

cientifi c

HORIBA Scientific, part of HORIBA Group, provides an extensive array of instruments and solutions for applications across a broad range of scientific R&D and QC measurements. HORIBA Scientific is a world leader in elemental analysis, fluorescence, forensics, GD-OES, ICP, particle characterization, Raman, spectroscopic ellipsometry, sulphur-in-oil, water quality and XRF. Our instruments are found in universities and industries around the world. Proven quality and trusted performance have established widespread confi dence in the HORIBA Brand.

The HORIBA Group of worldwide companies, part of HORIBA, Ltd, headquartered in Kyoto, Japan, provides an extensive array of instruments and systems for applications ranging from automotive R&D, process and environmental monitoring, in-vitro medical diagnostics, semiconductor manufacturing and metrology, to a broad range of scientifi c R&D and QC measurements.

http://www.horiba.com/scientifi c

HORIBA Scientifi c Worldwide

Main Manufacture Centre

Sulfur-in-Oil Analyzers

Ultima Expert

XGT-5200WR

MESA-50 / MESA-50K

XGT-7200V / XGT-5200

EMIA-920V2

EMGA-930

SLFA-2800

SLFA-60

LA-960 and LA-960 (Dry unit)

LA-300

SZ-100

LabRAM HR Evolution

XploRA INV

XploRA Plus

XploRA One

T64000

XploRA Nano

LabRAM HR Evolution Nano

Combiscope XploRA

Aqualog® / Dual-FL

Fluorolog®-3

Fluorolog Extreme

FluoroMax®-4 / Plus (P/TCSPC)

NanoLog®

DeltaPro / DeltaFlex

FluoroCube / UltraFast

DeltaMyc

QuantaMaster 400 / 800

EasyRatioPro

RatioMaster

XelPleX

OpenPlex

UVISEL 2

UVISEL

Auto SE

Smart SE

In-situ Series

UVISEL 2 VUV

GD Profi ler 2

PP-TOFMS

Flex-CLUE

HCLUE

SmartSPM

CombiScope

Gold coated master gratings

Multi-layer dielectric gratings

VUV custom gratings

Custom gratings for astronomy and space fl ight

VUV Spectrometers

Plane gratings

Customized spectrometers

Microscope Optical Spectrometer (MicOS)

EasyLife X / EasyLife L

MicroHR

iHR320 / iHR550

FHR640 / FHR1000

1000M / 1250M

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30

30

30

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30

33

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25

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55

57

Scientifi c Gratings

VUV Systems

Optical Spectroscopy

Raman Spectroscopy

Surface Plasmon Resonance imaging (SPRi)

Fluorescence Spectroscopy

Ellipsometry

GD-OES

SEM-Cathodoluminescence

Microscopy

ICP-OES

X-Ray Fluorescence Analyzers

C/S/O/N/H Analyzers

Particle Analyzers

Plasma Profi ling-TOFMS

OEM Gratings & Spectrometers

OPTICAL SPECTROSCOPY

MOLECULAR SPECTROSCOPY and ANALYSIS

SURFACE CHARACTERIZATION

ELEMENTAL ANALYSIS

PARTICLE ANALYSIS

Products & Application

Measurement range: 0-9.9999 %Repeat accuracy: 15 ppm or less (with a 1 % sample)Lower detection limit: 20 ppmSample requirement: 4-10 mL Measurement time: User-set from 10 to 600 seconds

Measurement range: 0-0.999 %Repeat accuracy: 5 ppm or less (with a 1 % sample) 1.6 ppm or less (with a 0 % sample)Lower detection limit: 5 ppm or lessSample requirement: 4-10 mLMeasurement time: User-set from 10 to 600 seconds

Sulfur-In-O

il-Analysis

Sulfur-In-Oil-Analysis

57

原子核

SLFA-2800

SLFA-60

Principle

Key Applications

X-Ray fl uorescence is a non-destructive analytical technique which allows quantitative characterization. The SLFA series is equipped with a multi-channel spectral analyzer for high-precision analysis and function for multi-dimensional data processing.

Petroleum products such as heavy oil, naphtha oil, crude oil, shale oil.

Features

Features

Easy-to-read large screenCoherent large printoutsAutomatic compensation of C/H ratioSpectrum measurement Turntable for sequential analysis and priority measurements*8 position auto sampler is available

Small size, light weight, robust construction, portable sulfer-in-oil analyzerAuto correction function for air pressure, temperature, C/H ratio and interfering elements, meanwhile no need for inert gas protection.Long life time of X-Ray tube characterized with auto protection mechanism.External output: Printer, USB memory, USB connect with PC, print out results and spectrum.Newly updated operation interface and keyboard layout, clear and simple.

Disposal Sample cell

Fluorescence X-ray Generation

EMGA-930Oxygen/Nitrogen/Hydrogen AnalyzerC

arbon/S

ulfur/Oxygen/N

itrogen/Hyd

rogen Analysis

56

Carbon/Sulfur/Oxygen/Nitrogen/Hydrogen Analysis

Features

Automated crucible supply system and auto cleaner achieve the full-automatic operation of EMGA.

Super high performanceUser-friendly softwareFully supported accessories offer simple operationImproved, easier to use mechanismDual Sample/Flux introduction mechanism

Measuring Range:Oxygen: 0.04 ppm-5 %Nitrogen: 0.04 ppm-3 %Hydrogen: 0.08 - 0.25 %Up to 100 % is possible by decreasing the sample weight.

Accuracy (repeatability):Oxygen/Nitrogen:SD ≦ 0.02 ppm or more RSD ≦ 0.5 % (Reference gas)HydrogenSD ≦ 0.04 ppm or more RSD ≦ 2.0 % (Reference gas)

Inert Gas Fusion in Impulse Furnace:Able to set the generating power 0-8.0 kWMaximum temperature: 3000 Celsius

Measurement Time:Usually: 40 sec to 120 sec

Spectral Fingerprint of fi bers, paint and

inks, drugs, gun shot residue, etc

Traces and particle analysis

Chemical imaging in seconds

Remote analysis through glass/plastic bags

OneClick point-and-shoot operation

Traceable Results with NIST calibration

standards

DeltaMycFluorescence Lifetime Microscope Spectrometer

XGT-5200 / 7200X-Ray Fluorescence Analyzer

P.36 P.53XploRA ExaminaRaman Spectrometer

P.30

[Application 01]

05Forensic

Forensic science is the scientifi c method of gathering and examining information about the past which is then used in a court of law. With HORIBA Scientifi c’s non-destructive and fast analysis methods, both on-site and in the lab, tests can be carried out to investigate and establish facts in criminal and civil courts of law.

We provide evidence of crime with non-destructive and fast analysis methods

Forensics

Key applications

Application example Application example Application example

Key applications Key applications

Gun shot residue

Banknote identifi cation

Fingerprint imaging

Paint/pigment analysis

Explosives analysis

Banknote authentication

and identifi cation

Spectral image analysis Optical image of a magazine page, transmitted X-Ray image (TX) and iodine (I) and silver (Ag) XRF images of fingerprint. The analysis was made in the area highlighted in the optical image.

Fluorescence lifetime image overlaid on a cameraimage of a patterned area of a banknote.

XploRA Nano AFM-Raman

Nanolog®Fluorescence Spectrometer

UVISEL 2Ellipsometry

P.30 P.35 P.42

AFM image Raman image

06 Advanced Material

[Application 02]

New materials such as ultra-fi ne particles, optical catalysts, hybrid materials and polymer gels are attracting the attention of research and development. In order to show the characteristics of these new materials, not only are manufacturing and forming processes important, but so are the analytical skills and analytic technologies that evaluate them. HORIBA contributes to the growth of the industry by supporting the development of cutting-edge materials based on the latest analysis systems and application development.

In the development of cutting-edge materials that attract the attention of the industry, various evaluations and analysis is required

Advanced Materials

Key applications



Raman-AFM co-localization image of graphene

* Tip Enhanced Raman Spectroscopy

Micro spot on graphene with patented vision system3-D matrix of SWCNT

AFM-Raman simultaneous localization

imaging

TERS*- chemical fi ngerprint at the nanoscale

Physical property & chemical structure analysis

Nano material growth mechanism studies

Carbon nanotubes chirality and diameters

Carbon nanotubes luminescence

mechanism

Quantum dot size adjustment

Luminous effi ciency of nano-materials

Thickness, optical constants

Material / surface modifi cation

Roughness, porosity

Gradient layer, interface

Transmission, refl ectivity curve

Carb

on/Sulfur/O

xygen/Nitrogen/H

ydrogen A

nalysis

Carbon/Sulfur/Oxygen/Nitrogen/Hydrogen Analysis

55Carbon/Sulfur AnalyzerThe EMIA-V2 series measures carbon and sulfur extracted during combustion in a programmable high frequency furnace without conversion. Combustion control is achieved through the use of the high-frequency induction furnace method. Appropriate heat-control in accordance with the analysis objective enables high-precision analysis for all types of samples.

The EMGA series is a simultaneous oxygen, nitrogen & hydrogen elemental analyzer with high accuracy and repeatability suited to cutting-edge technology's R&D, as well as quality control in the market of steel, new materials, catalysts, etc.The oxygen is measured as carbon monoxide and carbon dioxide by two non-dispersive infrared detectors; The nitrogen by a thermal conductivity detector, and the hydrogen with a non-dispersive infrared detector as H2O.

Oxygen/Nitrogen/Hydrogen Analyzer

EMIA-920V2Carbon/Sulfur Analyzer

Iron and steelBattery materials

Ceramics Electronic materialsCatalytic agents

Non-ferrous metalsNew materials

Principle

Key Applications

Features

"Auto cleaner" mechanism reduces maintenance work The dust fi lter heating mechanism provides stable analysis with extremely low gas absorption Real-time simultaneous detection of CO/CO2/SO2 without an oxidizing (CO-CO2) or SO3 trapping reagents.Wide variety of self diagnostics Programmed temperature curve for optimizing combustion.

Measuring Range:Carbon: 0.3 ppm - 6 % (m/m) Sulfur: 0.3 ppm - 1 % (m/m)Measurement range can be expanded by reducing sample weight below standard weight

Accuracy (repeatability):Carbon: C ≦ 0.3 ppm or more RSD ≦ 0.5 %Sulfur: S ≦ 0.3 ppm or more RSD ≦ 0.5 %

High-frequency Combustion FurnaceAnode output: 2.3 kW Maximum oscillation frequency: 20 MHz

Measurement Time:Usually: 30 sec to 60 sec

X-R

ay Fluorescence

54

X-Ray Fluorescence

Analysis of Pb-free Solder

Mapping Analysis of Au Wire

Optical image

Optical image Analysis result with 1.2 mm Analysis result with 400 μm

Mapping result of Pb solder

X-Ray guide tube diameter: φ1.2 mm mapping area 10 cm measurement time: 30 min

1000ppm

3000ppm

5000ppm

2000ppm10000ppm

under 500ppm

Analysis of a Relief Image from a Nepalese Manuscript

Analysis of Geology

Pb is clearly detected in micro spot area

XGT-5000 (Conventional model)XGT-5200 (SDD type)

Analysis of a single pin in an IC terminal is possible due to the high spatial resolution XGT guide tube.

Pitch: 0.5 mm

Measurement Condition: X-Ray Tube Voltage:30 kV; X-Ray Tube Current:1.0 mA; X-Ray Radiation Diameter:100 μmSamples Measured: Relief Image from a Nepalese Manuscript.The Book of Constant Life in Sanskrit (Kojukai Ver.C)

Because the X-Rays penetrated into the paper, it was possible to detect not only the surface layer of the pigment, but also the components of underlying layers where the image had been painted over. (*This depends on the combination of elements contained in the material and the material thickness) The results of analysis using XGT have verifi ed the types of coloring pigments as well as the techniques used to apply the pigments.Through the collection this type of data, it may also be possible to surmise who created this important cultural asset, as well as the location and era in which it was created.

Transmission X-Ray image

RGB Composition image(R:Au G:Cu B:Pb)

Function of Analysis

Generate a spectrum from a user defi ned region within the element image.

Spectra from different regions can be compared in order to identify their differences in elemental composition.

Element images can be generated dur ing acquisition, or at any time afterwards. SImply select the element and view its distribution image.

Applications Examples

GD Profi ler 2GD-OES

XGT - 5200 / 7200X-Ray Fluorescence Analyzer

P.47 P.45 P.53HCLUESEM-Cathodoluminescence

Other ApplicationsAdvanced materials Evaluation parameters HORIBA instrument analysis

Intelligent polymers

CrystallinitySize of polymer particlesFilm thickness and anisotropy evaluation

Raman spectroscopy Particle size distribution analyzerSpectroscopic ellipsometry

Spectroscopic ellipsometryGD-OES

Raman spectroscopy Particle size distribution analyzer Spectroscopic ellipsometry

GD-OES

SEM-EDX ICP-OES

Particle size distribution analyzerRaman spectroscopy SEM-CLGD-OES

Fluorescent X-Rays

Raman spectroscopy Fluorescence spectroscopy Particle size distribution analyzer SEM-EDX

Particle size distribution analyzerSEM-CLFluorescent X-Rays

ICP-OES

Graded refractive indexCheck interface state

Check of non-reaction residuesParticle size of nanopore particlesRefractive index and extinctioncoeffi cient of composite layers Concentration distribution of constituent elements Elemental analysis of micro parts Trace element analysisNon-agglomeration and uniformlydispersed state of composite materials Principal component and trace element analysisTrace element analysisParticle size and distribution stateCrystallinity, polymorphism identifi cation and stressConcentration distribution of constituent elements Principal component and trace element analysis Crystallinity, chirality and diameterChirality Particle size and distribution state Distribution state of supported metal particles

Functionally graded material

Nanocomposite

Fine ceramics

Carbon nanotubes

Organic and inorganic hybrid materials

07Advanced Materials

Key applications



GaN nano pyramid image with CL. The pseudo-color is showing the variation in composition in the 350–450 nm emission range.

Mapping of a filled polymer shows the distribution of Calcium Silicate with small particles of Iron. The transmitted X-Ray image illustrates internal differences in density/structure.

Compositional depth profi le of an LED chip

Defects analysis on nano materials

Heterogeneity image analysis in nano scale

Carrier concentration characterization of

nano semiconductor

Nano material growth mechanism studies

Quality control of LED chips

Coating analysis of new

semiconductors

Surface coating analysis of hard

disks, glass, ceramics, etc

Inorganics

Semiconductors

Additives in plastics

Multi-layer thickness analysis

Internal structure and voids

XploRA INVRaman Spectrometer

DeltaMycFluorescence Lifetime Microscope Spectrometer

P.30 P.36 SZ-100Particle Analyzer

P.51

08 Bio / Life Science

Key applications



Biomacromolecule identifi cation

Bacteria, identifi cation and classifi cation

Drug distribution in cells/tissues

Early disease diagnosis

Label-free in-vivo and in-vitro analysis

Biomacromolecule conformational change

Quantifi cation of biomolecules

Enzymatic activity and cell viability

Molecular interactions

FRET

Protein aggregates

Liposomes and virus

Protein's Zeta potential

Nile Red distribution in Bovine embryo(Courtesy of Igor Chourpa, Pharmacy Faculty,University of Tours)

Measurement results of the particle size of lysozyme and isoelectric point

FLIM measurement (left, showing average lifetime) and representative decay profi les (right) from FITCBSA in and outside an irradiated area.

[Application 03]

Complex and elaborate mechanisms of l i fe phenomena that organisms perform are clarified through science and technology

Bio /Life Science

Life science is the scientifi c pursuit of life. This contributes to improving the QoL (Quality of Life) and the progress of drug development and medical treatment, and is connected to mankind's ultimate concern, living life in good health. Life phenomena play a large role in materials, and the understanding of this mechanism from a physicochemical aspect greatly contributes to our understanding of life. HORIBA Scientifi c has applied high-precision optical and sensing technologies to this industry which were cultivated in various fields starting with advanced materials, and we continue to contribute to the realization of living life in good health.

53

X-Ray Fluorescence

X-R

ay Fluorescence

XGT-5200WRX-Ray Analytical Microscope

MESA-50/MESA-50KX-Ray Fluorescence Analyzer

XGT-7200V/XGT-5200X-Ray Analytical Microscope

Electronics Pharmaceuticals Food Materials Geology Environmental Archeometry

The new MESA-50K offers a large chamber

Principle

Key Applications

X-Ray fl uorescence is a non-destructive analytical technique which allows qualitative and quantitative characterization of solids, liquids and powders.Micro-XRF combines these properties with microscopic analysis, so that individual particles and features can be analyzed, and element distribution images can be generated.

4. An external electron is taken in and the molecule is stabilized

1. Absorption of primary X-Ray 2. An electron is knocked out by the primary X-Ray

3. Unstable State --Energy is generated when an outer-shell electron falls back to the inner shell = Fluorescence X-Ray

Features

Features

Features

X-Ray beam diameter, select from: φ10 μm, 50 μm, 100 μm, 400 μm, 1.2 mm, 3 mm Detectable elements: Na-USample chamber atmosphere: Open airSample size:350 (W) × 400 (D) × 40 (H) mm

The world’s smallest probe size:φ10 μmSDD: Liquid nitrogen (LN2) freeCompliant with RoHS / ELV / halogen free directivesSimple, accurate sample positioningThickness measurement, multi-point analysis, Excel data management software

Speedy: High throughput analysisSmall: Portable, small footprint and light weightSimple: Reduced routine maintenance work (LN2 free operation)

Smart: Chinese / English user interfaceExcel data management tool

The world’s smallest probe size:φ10 μmDetectable elements Sodium (Na) to Uranium (U)Detector: SDD (Silicon Drift Detector)

Acquisition: Single point/multipoint (point/line/grid)

Hyperspectral XRF imaging Transmitted X-Ray image / Elemental imageThickness measurement

Detector: SDD (Silicon Drift Detector)Detectable elements: Al (13)~U (92)Sample type: Solid, Liquid, powderX-Ray irradiation size: 1.2 mm, 3 mm,7 mm (Automatic switching)

Four types of X-Ray primary fi lter (Automatic switching)

Power supply: 100~240 V, 50/60 Hz battery

X-Ray beam diameter: 10 μm, 50 μm, 100 μm, 400 μm, 1.2 mmDetectable elements: Na-USample chamber: Switchable vacuum/atmospheric chamber Sample size: 300 (W) x 400 (D) x 80 (H)

ICP

-OE

S

52

ICP-OES

Software superiority:

Ultima Expert Unique plasma torch design offers the most versatile and accurate analysesAccessories for varied applicationsHigh resolution and full wavelength coverageEasy to handle, easy to maintain

Performance through a simplifi ed method developmentFlexibility in analysis with multiple tasks sequenceImage navigator displays the full spectra acquired and offers unique features for qualitative and semi-quantitative analysis

Metals (steel, ferrous metals and non-ferrous metals)Biology, medical, food Environment (tap water, environmental water, soil, atmospheric dust)

Concomitant metals analyzer

Organics introduction system

Metallurgy, Geology & Mining: Environmental, Food & Agriculture: Precious Metals:

Autosampler

Simultaneous measurement of hydride and non-hydride forming elements without changing the introduction system. Easy to use.

Used in analysis of wear metal, oil, gasoline, biodiesel and suspension solution, etc.

Control sample analysis by software

Principle

Key Applications

Software

ICP-OES is an analytical technique used for the detection of trace elements. The sample is nebulized then transferred to an argon plasma. It is decomposed, atomized and ionized whereby the atoms and ions are excited. The intensity of the light emitted when the atoms or ions return to lower levels of energy is measured. Each element emits light at characteristic wavelengths and these lines can be used for quantitative or qualitative analysis.

The robustness of the Ultima Expert makes it ideal for applications common to mining, chemicals manufacture, salt production, wear metals in oil analysis, petrochemicals, metallurgical production and precious metal refi ning. Ultima Experts offers maximum effi ciency for your most demanding applications.

The analyst software package of the Ultima Expert extends instrument capability beyond analytical performance, featuring advanced user guidance from sample to results.

For elemental analysis in the presence of line-rich spectrum elements such as iron, tungsten or rare earth elements, the Ultima Expert delivers the highest performance.

Major and trace elements analysis in varying matrices along with reliability and confi dence in the fi nal results.

Ultima Expert is the only ICP-OES spectrometer on the market to provide ultimate accuracy for major precious metals analysis.

Ultima Expert is a unique combination of ultimate performance with comprehensive assistance tools designed to simplify method development. Ult ima Expert integrates our high efficiency Jobin Yvon optical design capable of achieving optimal performance for a large variety of sample types and matrices. More than 70 elements can be analyzed with ICP-OES, including Cl and Br.

Geological minerals (rare earth elements,etc)Chemistry, drug, petroleum, resin, ceramics

NEWNEW

Features

Accessories

OEMOEM Grating & Spectrometers

CombiScopeMicroscopy

P.39 P.24 P.49XelPleXSurface Plasmon Resonance imaging (SPRi)

09Bio / Life Science

Every compound has a function and a role, as do aggregates. HORIBA's technology helps to clarify the connection between these types of life phenomena (functions) and expression mechanisms.

Key applications



Label-free analysis of protein and DNA

Intermolecular binding specifi city

Molecular modifi cation

Molecular dynamics analysis

Automatic biochemical analyzer

Chemiluminescence immunoassay

Real-time fl uorescence quantifi cation

The structure of macromolecules

Mechanic properties of macromolecule

Process of macromolecule activities

Cell and organelle topography

Direct comparison of binding parameters in only one experiment

Alternanthera mosaic potex virus. Sample courtesy of Prof. O. V. Karpova and Dr. M. V. Arhipenko, Lomonosov Moscow State University, Faculty of Biology

Grating effi ciency for biomed application

Life

Tissues / organs

Micro-organisms

Organelles

Compounds

Molecules

Atoms and ions

Sugars, Lipids etc.

Proteins, DNA etc.

XploRA PLUSRaman Spectrometer

P.30

CaCO3 Carbon

PbSO4/PbCO3

PbSO4/(Ca,Mn)CO3

Aqualog® / Dual-FLFluorescence Spectrometer

P.34 SZ-100Particle Analyzer

P.51

10 Earth Science / Environmental

Key applications



Chemical composition of aerosols

Aerosol particles-atmospheric reaction

Polymers/organics degradation analysis

Contaminants/pesticide residue detection

Bacteria/microbiological analysis

Colored dissolved organic matter research

Disinfection by-products research

Organic pollutant analysis

Carbon migration mechanism

Analysis of suspended particles in

waste water treatment

Analysis and treatment of oil

refi nery waste water

Analysis of sediment particles

Molecular images of the lead-rich necrotic zone onthe leaf surface (Courtesy of Sophie Sobanska,University of Lille)

The relationship between the Zeta potential valueof suspended particles and the additives of wastewater treatment

3-D matrix of water sample

EnvironmentalEarth ScienceHORIBA ensures a safe living environment with multiple analysis

Our lives are affected by a variety of factors in our environment, such as the quality of food, medicines, crops, atmospheric and radioactive pollution, to name a few, all of which impact our survival.

y

[Application 04] 51

Particle Analysis

Particle A

nalysis

Fraction cell / cell holder:

Autofi ll pump:

LA-300Laser Scattering Particle Size Distribution Analyzer

SZ-100Particle Size/Zeta Potential/Molecular Weight

Features

Features SZ-100 Optical Confi guration

Measurement Method:Mie scattered theoryMeasurement Range:0.1 μm-600 μmSample Amount:10 mg-5 gDispersion Medium :180-250 mLMeasurement Time: less than 20 sec

Small and compact Stable and robustAutomatic alignment Navigation systemEasy operation

Material: Tempax (R) glassVolume: 5 mL

Flow Rate: More than 1.2 L/minPower: AC 100/120/230 V ±10 %, 50/60 Hz, 80 VA

Accessories

Particle Size

Zeta Potential

Molecular Weight

Measurement Principle: Dynamic Light ScatteringMeasurement Range: 0.3 nm-8 μmAccuracy: ±2 % (NIST - traceable standard particles 100 nm)

Measurement Angles: 90° & 173° (automatic or manual selection)

Sample volume:12 μL to 4 ml

Measurement Principle: Laser Doppler ElectrophoresisMeasurement Range: –200 to +200 mV (no actual limits)

Sample Volume:100 μL

Measurement Principle: Debye plotMeasurement Range: 1000 to 2 ×107 Da

A single device analyzes three parametersTwo angle system enables analysis of a wide range of high concentration and diluted samplesLowest sample volumeCell design minimizes EOF

Particle A

nalysis

50

Particle Analysis

Static Light Scattering (SLS)

Mini fl ow (Small volume circulation system, Solvent resistant):

Fraction cell:

Dynamic Light Scattering (DLS)

Fraction cell Paste cell PeristalticAuto samplerMini fl ow

LA-960Laser Scattering Particle Size Distribution Analyzer

LA-960 (Dry unit)Powder Jet Dry Feeder System

Ceramics Pigments & Inks

Cosmetics

Colloids

Pharmaceuticals

NanomaterialsBatteries

Macromolecules Nanocapsules

Principle

Key Applications

When light strikes particles, scattering (diffraction) occurs. Detectors can receive different electrical signals according to the intensity and angles of scattered light. And sample size distribution is calculated from these electrical signals based on Mie theory. Light scattering method has excellent reproducibility and accuracy.

Dynamic Light Scattering is the measurement of fl uctuations in scattered light intensity with time. These fl uctuations in intensity are due to the random Brownian motion of the nanoparticle. Since larger particles diffuse more slowly than small particles, one can readily relate particle size to measured fl uctuations in light scattering intensity. With modern instruments, the technique is rapid and reliable.

Minimize sample and dispersant volume requirements with all the convenience of a fully-automated circulation system.The software controls all sequences such as fi ll, rinse and drain; No manual operation required.

This accessory is ideal when the total sample amount is small, the sample or dispersant is toxic, or you wish to recover the measurement sample.

Features

Features

The world’s widest dynamic rangeThe world’s fastest analysisInnovative optical systemGuaranteed high data accuracy:± 0.6% and high data repeatability: ±0.1% performance with NIST-traceable standard particles down to 20 nm

Measurement Method:Mie scattered theoryMeasurement Range: 10 nm-5000 μmSample Amount: 10 mg~5 gDispersion Medium: 180 mL~250 mLMeasurement Time: 1 minute from dispersion liquid filling to measurement to rinseUltrasonic probe: 30 W (Max:130W) Frequency: 20 kHz, 7-levels selection

Automatic control of sample feeder rateQuick and easy switch between wet and dry measurementsOne instrument suits all sample requirementsInstalled on the main unit, requires no additional spaceEasy disassembly and easy maintenance

Dispersant method:Injector drive forced dispersion in airSample Supply Method: Vibrating feederMeasurement range:0.1 μm~5000 μmMeasurement time: 2 seconds from start to measurement

Accessories

Food

Catalysts

Flex-CLUESEM-Cathodoluminescence

XGT - 5200X-Ray Fluorescence Analyzer

P.47 P.53P.52Ultima Expert ICP-OES

Zircon CL Analysis Elemental and optical image of micrometeoritesOnly t race Ga wi l l a f fect the magnet ism and microstructure of NdFeB products In rare earth elements analysis: For rare earth elements, only high resolution ICP-OES can separate those spectral interferences. Left image: resolution of <5 pm. Right image: If resolution goes to about 10 pm, the Ga signal will be lost.

11Earth Science / Environmental

Key applications



Identifi cation of minerals

Distribution analysis of minerals

Trace elements inside minerals

Analysis of mineral formation

Quantitative analysis of contaminants in soils

Marine/ocean sediments

Toxic element build up in tissue/cells

Airborne particles and air fi lters

Composition of minerals / rocks

Recycling materials

Rare earth elements analysis

Precious metals analysis

Alloy and mineral samples

XploRA PLUSRaman Spectrometer

Aqualog® / Dual-FLFluorescence Spectrometer

P.30 P.34 P.50LA-960Particle Analyzer

12 Petrochemistry

[Application 05]

The petrochemical industry refers to oil as a raw material to produce chemicals, mainly various fuels (gasoline, kerosene, diesel oil, lubricating oil, liquefied petroleum, gas petroleum, coke, paraffi n, asphalt, etc.). HORIBA Scientifi c offers a variety of analytical instruments for lubricating oil and other types of complex mixtures in the petrochemical industry.

Analysis of oil and its upstream and down stream products

Petrochemistry

Key applications


Key applications Key applicationsComposition analysis of oil

Grade of maturity analysis of kerogen

Structural analysis of chemicals

Monitoring reaction process

Catalysis study

Qualitative analysis of oil properties

Source rock maturity

Oil and gas properties discrimination

through aromatic hydrocarbons analysis

Analysis of sulfur content in crude oil

Water pollution

Petroleum coke

Catalyst

Spray drops generated from fuel injector

or spray nozzle

Oil drops of aqueous emulsion

Surface modifi ed polymer pellet(Courtesy of Dr Liangrong Yang, Institute of ProcessEngineering, CAS)

3-D matrix of a sample of petroleum Particle size distributions of asphalt emulsion

Microscopy

Microscop

y

49

Sample size: 2 mm thickness, 25 mm diameterHeating: up to 60 °CCooling: below room temperature down to 5 °CSample positioning range: 5x5 mmPositioning resolution: 1 μmCell size: 40x40x12 mmVolume of liquid: 3 mlCapability of liquid exchangeAutoclave and ultrasonic cleaning of cell parts

SmartSPM

CombiScope

Relative humidity range 10 % - 90 %Relative humidity stability ±1%Humidity sensor inside environmental chamber

Humidity controlVacuum chamber, turbo-molecular pump, scroll pump, vacuum gaugeVacuum level 10-2 PaVacuum chamber can be used to create controlled environment with different gases (air, carbon dioxide, nitrogen, argon, helium) under required humidity.

Cantilever holder

Liquid cell Cooler / Heater

Operation in Liquids

Environmental Control

Accessories

The Smar tSPM Scann ing Probe Microscope is the fi rst 100% automated system that offers its cutting-edge technology of ultra-fast, metrological and high resolution measurements for the most advanced materials research at the nanoscale in all AFM and STM modes.

The CombiScope Scanning Probe Microscope is an advanced research instrument. I t perfectly combines inverted optical and atomic force microscopies, and unleashes the power of both techniques providing the i ns t rumen t ad jus tmen t and measu rement au tomat ion , h igh resolution and integration flexibility.

Fully automated High speed, high resolution 100x100x15 μm MagicScan piezo stack scannersAll SPM modes availableAdvanced closed-loop control Low driftNot sensitive to vibration1300 nm AFM laser Integration with RamanOpaque samples

Fully automated High resolution 100x100x15 μm fl exure guided scannersAll SPM modes availableAdvanced closed-loop control 1300 nm AFM laser Integration with RamanOpen system for different optical pathsTransparent, biological samples

Features

Features

Vacuum control

Principle

Microscop

y

48

Magnetic Force Microscopy (MFM)

Kelvin Probe (Surface Potential Microscopy)

Capacitance and Electric Force Microscopy (EFM)

Force curve measurementsPiezo Response Force MicroscopyNanolithography; Nanoindentation; Nanomanipulation

Contact AFMSemi-contact / intermittent contact AFMTrue Non-contact AFMTopography / Phase ImagingLateral Force Microscopy (LFM)

Force Modulation

STM (Scanning Tunneling Microscopy)

SFM (Shear Force Microscopy)

Also available on the same platform:

* Corresponding probes required for each measuring mode

Scanner’s performance at different scales

Magnetic structure of surface domains in Yttrium Iron Garnet (YIG) fi lm MFM image, closed loop active.

Magnetic Force Nanolithography

3 micron scan of Ag nanoparticles

Vector local anodic oxidation on CoCrfi lm. 4 microns scan

Atomic Resolution on HOPG, LFM. 3nm scan. NO fi ltering in Fourier space.

92 micron scan of patterned fi lm

Arrow shows START and END points. 1 micron scan

3 micron scan. Collagen (Type I) absorbed on mica from buffer solution.

Laser beam

4 Section Photodiode

AFM Probe

Atomic force microscopy is a very high-resolution type of scanning probe microscopy, providing 3D surface profiles with sub-nanometric resolution, more than 1000 times better than the optical diffraction limit.

A sharp tip attached to a relatively soft cantilever is brought near the surface of the sample. Cantilever defl ection is measured by detecting displacement of a laser beam refl ected on the back side of the cantilever.

Key Applications

AFM Modes and Applications

Material ScienceNanolithography

PolymersSurface Chemistry

SensorsLife Science

Microscopy

iHR550Optical spectroscopy

SLFA-60Sulfur-In-Oil-Analyzer

P.52 P.26 P.57Ultima Expert ICP-OES

13Petrochemistry

Key applications



EQE spectra of amorphous and annealed Zn (OEP) fi lms

Result of petroleum measurement for shale oil, the mining process is different from the conventional mining process. At the same time,the sulfur content test is also very important.SLFA-60 is stable, solid and light, all of which help meet the demands of sulfur testing in mining, separating and transportation, to name a few

Above is the analysis of gasoline with and without oxygen kit for K analysis. Left image is without oxygen kit; Right image is with the oxygen kit, and shows a flatter background. This can improve the limits of detection (LoD) of K. Note: In undiluted lubricating oil, the LoD can achieve ppb level

Sulfur in oil measurementTunable light sources

Absorption/Transmission/Refl ectance

Quantum effi ciency measurements

For lubricating oil analysis:

Additive elements analysis

Wear metal elements analysis

ICP-OES is successfully used in

petrochemistry to determine the quality

of intermediate and fi nal products

LabRAM HR EvolutionRaman Spectrometer


P.30 P.42 P.50LA-960Particle Analyzer

14 Automotive

Evaluation of DLC coating fi lm

Surface roughness

Structure of the sample

DLChardebed fi lm

Metal substate

Applications example Applications example Applications example

Key applications Key applications Key applications

Graphite and polymer analysis of fuel cell. Diamond Like Carbon (DLC) fi lm used as a protective coating for automotive frictional parts was evaluated. It was determined from the analysis that the DLC hardened fi lm is 6000 Å and the surface roughness is 60 Å. In addition, it was not only possible to measure the fi lm thickness but also the correlation between the hardness and refractive index of DLC.

Catalysts for automobiles are used to remove the HC, CO, NOx in the exhaust gas. To assure the product quality of the catalyst, controlling the particle size distribution not only of the precious metal, but also of the ceramic particles, is important. To accomplish this task, particle size distribution analyzers are necessary.

Analysis of paint

Analysis of corrosion of metal

DLC coating analysis

Analysis of battery materials

Composite polymers

Thickness, optical constants

Roughness, porosity

Gradient layer, interface

Transmission, refl ectivity curve

Paints, coatings

Catalyst for exhaust gas treatment

Lithium battery materials used in

the new energy automobile

Coatings

Metal powder for alloy smelting

Tires

Particle size of the carbons (Particle size distribution analyzer) in aluminum (Hydrogen analysis analyzer)

Carbon and sulphur in the rubber (Carbon and sulphur analyzer)

Engine

Heavy metals in the engine oil (ICP-OES, Fluorescent X-Rays)

Carbon content in the casting (Carbon analyzer)

Particle size of the raw materials such as crude steel (Particle size distribution analyzer)

Carbon and hydrogen in titanium (Carbon and hydrogen

analyzers)

Gaseous adsorption on catalyst (Raman spectroscopy)

Battery (battery-related)Positive and negative electrode evaluation(Raman spectroscopy, SEM-EDX ,etc.)

Quality evaluation of separators (GD-OES, Fluorescent X-Rays, etc)

Degradation analysis of electrolytes (ICP-OES)

In recent years, new battery materials and power device materials that are used in electric vehicles and fuel cell vehicles have been actively researched. Moreover, in response to further fuel consumption improvements and exhaust emission regulations for existing internal combustion engine vehicles, weight reduction based on new material development and catalyst development for exhaust emission purification is being continued. HORIBA Scientific supports the research and development of next-generation vehicles with various analytical instruments, and offers technology that can contribute to development.

Supporting new material development that is indispensable to the enhanced performance of next-generation vehicles

[Application 06]

Automotive

(Sample:Ceramic,Medium size:10μm)

SEM-Cathodoluminescence

47

SE

M-C

athodolum

inescence

Principle

Key Applications

Cathodoluminescence (CL): photons (light) emitted from a luminescent sample in response to electron-beam impact. CL is collected by the optical interface and analyzed spectroscopically, providing detailed information on the physical properties of the sample down to the nanoscale.

SecondaryElectrons

BackscatteredElectrons

Auger Electrons

XrayPhotons(CL)

Electron Beam

CL is a powerful technique to characterize defects, trace elements, and impurities in materials across a large range of applications.

Mineralogy/Geology:

Life Sciences

Material Sciences:

Forensics

Semiconductor and optoelectronic materials, dielectrics/ceramics, the oxide fi lms, glass

Crystals, carbonates, diamonds, zircon,calcite, dolomite, etc

CL Spectra and Imaging Example

fi gure 1, Hyperspectral CL mapping

fi gure 2, SE image

fi gure 3, CL spectral (RGB)

CL Spectroscopy

Fast CL Imaging

CL spectroscopy is an outstanding method to detect and identify trace elements in natural and synthetic minerals.

SWIFT™-The fas t mapping for synchronization of the e-beam with the CCD.

The image (Fig. 3) is presented in pseudo-color, showing the variation in composition in the 350 nm~450 nm emission range.

Flex-CLUEFlexible CL spectral system

Flex-CLUE is the ideal fl exible package to handle high-performance CL analysis, for a wide range of applications. Based on a dedicated fiber-optic interface, Flex-CLUE offers a compact and remote CL solution perfectly adapted to an SEM environment where space or access is limited.

FeaturesHigh effi ciency optics designed to match fi ber with spectrometer aperturePoint measurement, mappingLarge choices of diffraction gratingsSpectrometer focal length from 140 to 320 mmSpectral range: UV-Visible optical fi ber 200 nm~1000 nm visible-near-IR optical fi ber 400 nm~1700 nm

HCLUEHigh-effi ciency CL system

FeaturesHCLUE, with its mirror-based optical interface, combines the modularity of our spectrometers with the high sens i t i v i ty o f our la rge range of detectors. HCLUE is the perfect tool to analyze very weak CL signals, keeping optimum performance over a wide spectral range.

All-refl ective opticsHigh sensitivityPoint measurement, mappingLarge choice of diffraction gratingsSpectrometer focal length from 320 to 550 mmSpectral range: Enhanced UV to extended near-IR 185 nm~2500 nm

PP-TOFMS

1 mbar

10-6 mbar

Example

Plasma Profi ling – TOFMS

Principle

Key Applications

Features

PP-TOFMS couples a glow discharge plasma to an ultra-fast Time of Flight Mass Spectrometer and provides chemical analysis of solid materials as a function of depth with high speed, high resolution and high sensitivity.

Dopants profi lingSurface and bulk contaminants identifi cation Corrosion science and technology Nanostructures characterization

Sample

Erosion rate 30 nm/s

Plasma Source

lnterface

Full Mass Spectrumevery 30 μs

Extraction

Detector

RF Generator

Ar

Isotopic Profi ling in 18O enriched Tantalum Oxide Impurities Identifi cation: i, Si, PV

Mg in InGaN Quantitative Measurement

Up to mid 1018 at/cm3 upon calibration

Quantitative Implanted Boron in Si

100 keV10B+-1014atom/cm2 Depth profi le in 15 seconds

Pisonero et al, Solar Energy Materials and Solar Cells, 94,1352(2010)

Courtesy of Prof. Bensaoula, University of Houston

Fast and direct analysis: Without any preliminary preparation and UHV chamberAll types of materials and coatingsFull mass coverage: Offers elemental (from H to U) and molecular information, including isotopic monitoring Unique 3D dataHigh depth resolution: layers as thin as 1 nm can be measuredThin and thick layers: thickness up to 100 μmSemi-quantitative analysis: Minimal matrix effects due to the separation of sputtering and ionization processes

Acquisition rate: 33 kHz to cover elements up to U (a full spectrum every 30 μs)

Mass resolving power: 3500 at m/s 208, high resolution 5000 at m/z 208Dynamic range: 107

Mass accuracy (m/z error/true m/z): 40 ppmSensitivity: 103 cps/ppmDepth resolution: nmBoth negative and positive ion mode Flexible blanking capability up to 4 ionsEasy and horizontal sample mounting

Specifi cations

Courtesy of C.VenzagoTempez & al., Surface and interface Analysis, 41,966 (2009)

Plasm

a Profi ling – TO

FMS

46

A1 3.8 x 1020 3.9 x 1020 ± 2.1 x 1019

A2 -- 4.0 x 1020 ± 2.8 x 1019

A3 1.7 x 1020 2.6 x 1020 ± 1.3 x 1019

A4 4.4 x 1018 4.6 x 1018 ± 1.6 x 1018

A5 1.8 x 1020 2.1 x 1020 ± 1.0 x 1019

Sample PP-TOFMSElectrolyticCapacitance Voltage

WheelHydrogen in aluminium (hydrogen analyzer)


XGT - 5200X-Ray Fluorescence Analyzer

P.45 P.53EMIA-920V2C/S/O/N/H Analyzer

P.55

15Automotive

Applications example Applications example Applications example

Key applications Key applications Key applications

In a high temperature environment, the carbon in the nickel alloy affects the performance of the alloy. The deposition of carbon causes the materials to become brittle, reduces the corrosion resistance and reduces the mechanical strength.

Composition depth profi le of galvanized steel sheet Wear particles of magnesium and steel alloys

Coating thickness and composition of galvanized steel sheetsDetermination of harmful elements of color-coated sheetsProcess monitoring nitriding and carburizingDetermination of phosphate/passivation fi lms, etc

Engine wear analysis

ELV regulation analysis

Analysis of metal carbon and sulfur

Analysis of inorganic carbon and

sulfur elements

Analytical examples of all vehicle parts

BodyParticle size of paint (Particle size distribution analyzer)

Carbon, nitrogen and hydrogen in iron and steel (Carbon, nitrogen and hydrogen analyzers)

Elemental depth profi le of paint fi lm (GD-OES)



P.30 P.45

Appearance of LiO2 (red) in lithium cell after manycharges and discharges

Optical constants of microcrystalline silicon Composition depth profile of lithium battery anode after discharging


P.42

Depth (μm)

Concentration (at.%

)

Key applications



Electrode/electrolyte materials

In-situ monitoring of charging

and discharging reaction

Research on electrode doping

Layer thickness, optical constants, bandgap

Analysis of the effect of the process to the layer

Gradient, interface layer

Mapping of inhomogeneous layers

In-situ monitoring

Electrode composition of Li batteries

Concentration change of elements

after charging and discharging

Monitoring the lifetime of batteries

16 Battery

[Application 07]

Lithium battery usage has spread due to increased demand of portable electronic devices and computers. In the future, the market could further expand with the increased demand in power generation system storage batteries, including electric car batteries and renewable energy from solar batteries and wind power generation. HORIBA is contributing to the further improvement of lithium battery energy and power density, increased safety, and life span enhancement with complete solutions.

Improving energy and power density, as well as improving safety and increasing life span

BatteriesGD Profi ler 2Pulsed RF GD-OES Easy mounting (No UHV)

Erosion rate up to micrometers per minuteAnalyze conductive or nonconductive samples and coatingsQuantitative depth profi lingAll elements can be measured in one shot (including C, H, O, N and Cl)Depth resolution is in the nm rangeUnique Pulsed RF model can be applied to fragile samples and coatingsAdheres to ISO14707 and 16962 standards

Wavelength range covers110 nm~800 nmUp to 47 elements channelsOptical resolution between 18 and 25 pm for all elementsSensitivity of RF-GD-OES is in the range of 1017atoms/cm2

The 0.64 m monochromator option, available only from HORIBA Scientific, provides the perfect tool to increase instrument flexibility by allowing any element to be added to the analytical program (n+1)Typical precision of 0.4 % for the main elements and an analysis time of about 90 secondsHORIBA Scientifi c provides calibrations for both bulk and compositional depth profi le (CDP) for alloys of Fe, Al, Cu, Ti, Ni, Co, Zn, Sn and Pb using Certifi ed Reference Materials. Custom calibrations are also available

FeaturesSpecifi cations

GD-OES

45

GD

-OE

S

GD Result SIMS Result

Thin fi lmsPowders

SemiconductorsMetallic alloys

Surface treatmentsCoated steel

Oxidation/Corrosion researchPolymer coatings

PVD/CVD coatingsCeramic/Glass

GD-OES

GD

-OE

S

44 Principle

Key Applications

Working Principle

RF-GD-OES systems are powerful tools to analyze material surface and interface elements. GD-OES combines a glow discharge powered by a radio frequency (RF) source with an optical emission spectrometer. Surface atoms of a sample are sputtered and eroded by Ar ions, layer by layer. The extracted atoms are excited by collisions in the plasma and emit some light. The emission light is detected by HDD through a polychromator (HDD: High Dynamic Range Detector).

Polychromater

Spectrometer Source

Sample

HJY Grating

Rowland circleHigh Dynamic Detector

Primary slit

Lens

Secondary slit

RF Glow Discharge Source

Sample

Cooling

Arwindow

Vacuum

vacuum

Anode

Hard disk analysis

A zoom of the near-surface region above (left) reveals the lubricant layer, diamond-like carbon protective layer, and the cobalt-chromium magnetic alloy and chromium layers, each layer approximately 20-30 nm thick, which were successively deposited over the disks. Sampling time of the near-surface region was 0.01 seconds. The image in (b) is a high magnifi cation view of the area in the red box at the top of (a) above.

Hard coating analysis

The above depth profi le shows the analysis of 25 layers of AIN/TIN (20 nm each) deposited on SI.

Comparison of the GD-OES and Secondary Ion Mass Spectrometry (SIMS)(Thin barrier anodic oxidation of aluminum)

A comparison of the GD-OES analysis and that of secondary ion mass spectrometry (SIMS) was made for this sample. The distribution of chromium in the fi lm compares well between the two techniques, however, the time of analysis was quite different. In GD-OES the time to reach the metal/oxide interface was 9 seconds, as compared to 60 minutes to reach this interface with SIMS.

Distance from oxide surface ( nm )

Cr

4.0

2.0

00 50

7nm

Inte

nsity

(a.u

.)

Distance from oxide surface ( nm )A film after anodizing in a sodium chromate solution

EMIA-920V2C/S/O/N/H Analyzer

XGT-5200X-Ray Fluorescence Analyzer

P.50 P.55 P.53

Evaluation of the effect on particle size distribution with different size ball-milling

Optical image, elements image and spectrum of separator of Li-ion battery

Lithium ion rechargeable batteries are one of the most popular types of rechargeable battery for portable electronics, like mobile phones and laptop computers.Carbon affects the lifetime of electrodes, so its concentration should be measured during the manufacturing process to confi rm that it's kept low.

LA-960Particle Analyzer Analyzer

Examples of HORIBA Scientifi c solutions

17Battery

Active Materials

Electrodes

Anodes

PVDF-based

SBR system

Positive electrode: AINegativeelectrode: CuPolyolefi n, etc.

Binders

Separator

Collecting foil

Causes of degradation HORIBA analysis instrument

Electrodes Anode

Key applications



Particle size distribution of positive

electrode material

Particle size distribution of negative

electrode material

Foreign materials in separator

Metal particles inspection

Elements analysis in metal material

Elements analysis in inorganics

Crystallinity and crystal structural change based on Li-ion insertion and removalAtomization-based reactivity infl uence

Oxygen evolution in high-temperature environmentsElution of Mn ions (Mn system)Li Stoichiometry anomaly Contamination, moisture absorption and oxidation toward active materialsUneven distribution and gaps in active materialCrystallinity Evaluation of carbons based on Li-ion insertion and removalAtomization-based reactivity infl uence

Reactivity decrease due to SEI formationContamination, moisture absorption and oxidation toward active materialsUneven distribution and gaps in active material

Oxidation of cells based on residual NMPSeparation and uneven distribution due to binding failure

pH control of negative electrode slurry adjustment process and part ic le s ize managementSeparation and uneven distribution due to binding failure

Surface oxidation and corrosion

Separator damage from shattering and burrs

Surface oxidation and corrosion

Raman Spectroscopy

Particle size distribution analyzer, SEM-EDXOxygen analysis analyzer

ICP-OESGD-OESFluorescent X-Rays, carbon and sulphur analysis analyzerFluorescent X-rays, SEM-EDXRaman SpectroscopySEM-CLParticle size distribution measuring apparatus, SEM-EDXGD-OESFluorescent X-Rays, carbon and sulphur analysis analyzerFluorescent X-Rays, SEM-EDX

pH, Particle size distribution analyzer

SEM-EDX

GD-OES, SEM-EDX

GD-OES, SEM-EDX

Fluorescent X-Rays, SEM-EDX

Residual gas analyzerSEM-EDX

Separator (foreign matter)

Coating

Binders and conductive assistants

Binders

SEI

Anode active material (Crystallinity)

Cathode active materials (Composition)

Precipitated phase (Oxides)



P.30 P.45UVISEL 2Ellipsometry

P.42

18 Energy / Solar cell

[Application 08]

Solar batteries are utilized as renewable energy, and HORIBA's analysis and control systems demonstrate superior performance. We are contributing to the high effi ciency and quality improvement of solar batteries in the semiconductor and FPD processes.

Improving the analysis, evaluation, cell lifespan and durability of solar cell materials, from semiconductor materials to dye-sensitization

EnergySolar Cells

Key applications



Calculation of Si crystalline ratio Optical constants of microcrystalline silicon Compositional depth profi le of a solar cell

Si solar cells crystallinity ratio

measurement

Crystal size analysis of Si solar cells

Structure analysis of thin fi lm solar cells

Charge and discharge analysis

Deposition process of PV

Interlamination diffusion of PV

Surface and composition of PV

Fast depth profi ling

Layer thickness, optical constants

Analysis of the effect of the process on

the layer

Gradient, interface layer

Mapping of inhomogeneous layers

In-situ monitoring

AUTO Soft & DeltaPsi

Smart SEModular Ellipsometer

GaN

TH

ICKN

ESS

(Å)

0

20

40

60

0 10 20 30 40 50 60 70

200 C

600 C

450 C

150 C 70 C

In-situ Series

UVISEL 2 VUV

Ellipsometry

Ellip

sometry

43Features

Features

Features

Key applications

The Smart-SE is an innovative and fl exible ellipsometer which provides fast results in either an ex-situ or in-situ confi guration.

Simple push button operationLiquid crystal based modulation; no moving optical componentsCCD-based for fast spectralacquisition-patented vision systemAbility to change the angle of incidenceIn-situ confi guration is availableFixed spectral range of450 nm~1000 nm

Monitor fi lm thicknessMonitor interface and composition

Equip excitation and detection heads on fi lm produce system to:

In-situ thickness monitoring for GaN fi lm growth

UVISEL 2 VUV is specially designed for VUV measurement. There is no oxygen absorpt ion wi th acquis i t ion. I t ’s an unique VUV spectral ellipsometer for high accurancy, unique fast measurement, fast vacuum ability, allowing you to change samples quickly, and using low amounts of nitrogen.

1 nm 50% HfO2 / 50% void

c-Si

36.4 nm HfO2

Model for sample; Ellipsometry is very sensitive to ultra thin fi lm in VUV range.

Phase modulation with PEM at as high as 50 KHz frequencyComplete nitrogen purge in 45 secondsAchieve target vacuum in 2 minutesMeasurement of the whole spectral range in 8 minutesTwo working models: nitrogen purge and vacuum, continous nitrogen purgeSpectral range: 147 nm~850 nm, 147 nm~2100 nm

optical constant of HfO2 Modeling and fi tting

Ultra thin fi lmsNew materials study for 157 nm lithography generationOrganic materials, polymersHigh k materials: HfO2, Al2O3, TiO2, HfxAlyOz

Anti-refl ective coatingsStudy of the electronics transitions in all types of semiconducting and dielectric fi lmsStepper optics: MgF2, CaF2, LaF3

UVISEL 2Fully Automated Ellipsometer

UVISELIn-line Ellipsometer

Auto SEFast Automatic Ellipsometer

Ellipsometry

Ellip

sometry

42The new UVISEL 2 is the next generation of scanning scientific ellipsometers that delivers the highest level of performance in an innovative, integrated, and fully automated design.

Micro-electronics Graphene

Fully automated and integratedNew optics and electronics for fast and accurate measurementsPhase modulation with a high frequency PEM for fast data acquisition and no moving optical components8 achromatic microspots down to 35 μmPatented vision system Automatic XYZ stage for mapping, auto-focus, and tiltSpectral range from 190 nm ~ 1000 nm or 190 nm ~ 2100 nm

The UVISEL spectroscopic phase modulated ellipsometer is a turn-key thin fi lm metrology instrument for in-line measurement of thin fi lm thickness and optical properties. It features rapid measurement capability with data acquired every 50 ms for powerful control of thin fi lm uniformity across the entire spectral range.

Ultra-thin monolayerFused silica substrate

Change in signal for 10 A thick monolayer at the Brewster angle

Highly fl exible scanning systemSeveral achromatic microspotsIn situ capability for real-time measurements during deposition/etchingPhase modulation with a high frequency PEM for fast data acquisition and no moving optical componentsAccessories include an auto XY stage, a temperature cell, an electrochemical cell, a liquid cell, and a sealed cell for organic fi lmsVarious spectral ranges from 190 nm~2100 nm

Features

Features

FeaturesThe Auto SE is a fast, easy-to-use automatic ellipsometer that provides results and reports in a matter of seconds, making it an ideal instrument for routine thin film measurements.

One button start

Fully automated and integrated; simple push button operationLiquid crystal-based modulation; no moving optical componentsCCD-based for fast spectral acquisitionSeveral microspot sizes down to 25 μm and a patented vision systemFixed angle of incidence at 70°Fixed spectral range of 450 nm~1000 nm

P.50LA-960Particle Analyzer

P.47HCLUESEM-Cathodoluminescence

Fluorolog®- 3Fluorescence Spectrometer

P.35

19Energy / Solar cell

Key applications



Inorganic powder in aluminium slurry

used in silicon solar cells

Materials in Nanocrystalline photovoltaic

cells

Silver slurry used in the front gate of

solar cells

Analysis of substrates

Analysis of doping and impurities

Analysis of heterostructures

Dislocation and lattice mismatch

studies

Optical properties of battery materials

Composition and properties of doped

materials

Light conversion effi ciency measurement

luminescence mechanism

Particle size distributions of TiO2 in dye-sensitized solar cell

Emission spectra measured on wafer under a microscope

Cathodoluminescence spectra of GaN and AlGaN

Crystal silicon-based

Thin-fi lm Silicon-based

CIGS-based compounds

Organic based dye-sensitation

Raw material Silicon

Texture formation

Pn junction formation (Thermal diffusion)

Oxide fi lm removal

Curing and fi ring

Anti-refl ection coating formation

Electrode formation SealingWashingWafer slices

Ingot (Single crystal/polycrystalline)

Glass substrate

Transparent electrodes patterning

Microcrystalline silicon layers deposition (p-i-n

layers)

Black electrode formation

Black electrode patterning

p-i-n layers patterning

Buffer layer deposition (Oxide fi lm deposition)

Amorphous layers deposition (p-i-n layers) SealingWashing WashingTexture formation

Transparent electrode formationGlass substrate

MO electrode formation

CdS buffer layers fi lm deposition

In fi lm formation

Formation of ZnO window layers

CIGS fi lm formation (Selenide) SealingWashing Patterning PatterningFormation of

CU-GA fi lm

Glass substrate MO electrode formation

Counter electrodes formation

Electrolytes (Redox Mediator Filling) SealingWashing Patterning

Impurity control Material analysis

Material analysis

Material analysis

Material analysis

Fluid control

Fluid control

Fluid control

Fluid control

Pure water measurement and waste water monitoring




Chemical solution monitoring




Film deposition process control/Thin fi lm analysis




XploRA NanoAFM-Raman

Auto SEEllipsometry

Fluorolog®- 3Fluorescence Spectrometer

P.30 P.42 P.35

Colorimetric analysis of light-emitting devicesThiol Self Assembled Monolayer AFM (left) and Raman (right) mapping

Optical properties of AIN and the overlayer

20 Organic Electronics

[Application 09]

As a cost-effective and good-performance technology, organic electronics, such as OLED, OEL, TFT and OPV are making a profound influence on the information industry, in fact, on whole economy and society. HORIBA Scientifi c provides excellent solutions for the study and characterization of organic electronic materials.

Better characterization, better organic electronics

Organic Electronics

Key applications



Crystal type analysis

Doping/defect research

Stress distribution

Identify pollutants

Photo- and electroluminescence

Layer thickness, optical constants

Anisotropy, crystalinity

Alloy ratio

Energy gap

Photoresistance, polymers

Optical properties of luminescence materials

Absolute quantum effi ciency measurement

Colorimetric analysis

Life-time analysis

Phase modulated spectroscopic ellipsometers use a photoelastic modulator (PEM) to perform modulation without any mechanical movement, resulting in:

Uniqueness of phase modulated spectroscopicEllipsometry: Accurate measurement of around 0° and 180°

State-of-the-art control of the PEM allows for very high system stability

Measurement number

Stability (3days) -NIST 100 nm

0 20 40 60 80 100 120

980979978977976975974973972971970

Thic

knes

s(A

ngst

rom

s)

Excellent signal/noise ratio from FUV to NIRSensitivity over the full range of Ψ and Δ

Ellipsometry

Ellip

sometry

41Technical Features

Software: AutoSoft and DeltaPsi2

Phase Modulated Technology: The Best Accuracy with High Stability

Patented Imaging System

The most accurate measurement of Delta and Psi High stability

AutoSoft - Three Easy Steps! DeltaPsi2 - Powerful and Advanced Modeling

The patented vision system enables clear visualization of the measurement beam spot on all types of thin fi lm materials, including rough, smooth, transparent, and refl ective surfaces:

Exact spot positioning within a small feature, or find a uniform area on the sampleAssists with spot positioning when the sample is placed inside an accessoryIsolation of front and backside reflections of transparent materials for simplifi ed modeling

The microspot allows for a reduction in beam size for measurements within small features on patterned samples. The microspot optics are achromatic and the spot size is constant with wavelength.

Load Sample Surface roughnessGraded layersComposition / crystallinityInterface layers

Treatment of backside refl ections for transparent substratesLarge library of material optical constants based on dispersion relations

Anisotropic fi lmsThickness uniformityDepolarization factorPeriodic structuresPorous layers

Obtain Accurate Results

Run Measurement

Automatic sample adjustmentVisualization of the spot on the sample

Thin fi lm result status: in or out of tolerance limitsAutomatic reporting: thickness, optical constants, uniformity, etc.

Select an experimental recipe in the ready-to-use application databaseMeasure at a single position or at multiple positions to map thin fi lm uniformity

Film thickness from a few Angstroms to tens of micronsOptical constants (n,k)Material properties: compound alloy composition, porosity, crystallinity, anisotropy, optical bandgap

Ellipsometry

Ellip

sometry

40 Principle

Key Applications

Spectroscopic ellipsometry is a non-destructive and non-contact optical technique which is based on the change in the polarization state of light as it is refl ected obliquely from a thin fi lm sample. Ellipsometry utilizes a model-based approach to determine thin fi lm thickness, optical properties, and more.

Measurement Modeling Results

Light source

Polarizer

Detector

Analyzer

PEM

Sample

Optical constants

Film thickness

Information Obtained from EllipsometryNon-destructive and non-contactVery sensitive, especially to ultra-thin fi lms (<10 nm)In-situ real-time monitoring of thin film deposition or etching by rapid kinetic measurementsNo sample preparation

Technical Features

Displays

Semiconductors

Photovoltaics

Optical Coatings

Optoelectronics

Nanotechnology and Biotechnology

TFT LCDLTPS LCDOLEDPlasma display panelFlexible displays

Transistors: HEMT, OTFT, MOSFET, CMOSMemory: PZT, BSTDielectricsHigh k and low k materialsPhotoresist, polymersData storage: GeSbTe, DLC

II-VI, III-V, and Si solar cellsTransparent conducting oxidesOrganic solar cellsPolymer solar cellsAnti-refl ection coatings

Carbon nanotubesNano compositesBiosensorsProteins, DNA, lipidsLiquid ambients and interfacesSAM, LB layers

Laser diodesGraded materialsOxidized porous siliconIR materialsNon-linear optical devices, LiNbO3

Anti-refl ection coatingsElectrochromic coatingsProtective coatingsMirrorsColor fi ltersGlass

Fluorolog®- 3 XGT-7200V/XGT-5200Fluorescence Spectrometer X-Ray Fluorescence Analyzer

P.35 P.53HE SeriesRaman Spectrometer

21Archeometry

[Application 10]

In the long annals of human history, countless works of art have been created by our ancestors, such as beautiful jade sculptures, paintings, ceramics, textiles, glass, and more. Investigating the minerals, pigments, enamel, fi bers and lacquer helps protect these priceless relics and helps us understand human culture. HORIBA Scientific can help analyze the cultural relics and artifacts, quickly and non-destructively.

Precious cultural relics and art need non-destructive and fast analysis

Archeometry

Key applications



Paint/pigment analysis

Art and antiques restoration

Metals and alloys

Paints, inks and pigments

Gemstones

Corrosion products

Internal analysis of authenticity

Pigment analysis and authentication

Glaze color analysis of ceramic

Composition and aging of silk

Corrosion analysis of metalware

Mineral and fl uid inclusion

Red fresco pigment analysis of Pompeii Micro-XRF imaging of an ancient Nepalese manuscript

Fluorescence lifetime image overlaid on a camera image of a patterned area of a banknote.

About Us

Key Applications

Gold coated master gratings

VUV custom gratings

Custom gratings for astronomy and space fl ight

Multi-layer dielectric gratings

Products

Manufacturing

22

Scientifi c G

ratings

Scientifi c Gratings

Founded in 1819, HORIBA Scientifi c, formerly Jobin Yvon, has been leading the industry in optics for spectroscopy for over 190 years. Our leadership in optics has been demonstrated by the continuing development of both ruled and holographic grating technology, including the invention of aberration-corrected holographic gratings and ion-etched blazed holographic gratings.

We are partnering with leading researchers, worldwide, to explore new technology areas and to provide higher specifi cations.

HORIBA’s scientifi c/custom diffraction gratings are found in cutting-edge scientifi c applications including ultrafast and high-energy lasers, space fl ight instruments, astronomy, and synchrotron spectrometers.

Pulse compression for high power lasers360 mm x 565 mm1200 gr/mm, 1480 gr/mm, 1740 gr/mm800 nm, 1064 nm, 1550 nm>90 %

Application:

Maximum size: Groove density:

Wavelength:Effi ciency:

Application:

Application:

Provide custom design gratings for astronomy and space experiments

Application:

Maximum size: Groove density: Wavelength: Effi ciency:

Pulse compression for high power lasers430 mm x 470 mm1740 gr/mm1053 nm92-95 %

Provide custom design based on specific requirements:

Mechanics ruling

Holographic recording

High precision replication

Constant groove spacing gratingsVariable groove spacing gratingsVariable groove depth gratingsSpherical gratingsCylindrical gratingsToroidal gratings

Groove density: up to 5600 gr/mmRefl ection or transmission grating designLow stray light and high effi ciencySpectral range from EUV to Mid-IRSpace qualifi ed - TRL9

Astronomy and space experiments

The SPRi-CFM is an automatic printer that uses flow deposition for printing biomolecules. Samples are cycled over the surface and captured from solution, leading to higher biomolecule density, better spot uniformity and improved assay sensitivity.

Biomolecule spotted withdifferent printing pins6×5 matrix

spots

11×11 matrixspots

16×16 matrixspots

SPRi-Arrayer

39XelPleX

OpenPlex

SPRi-CFM

SPRi-CFM printing of a protein from a low to a high concentration in quadruplicate


Surface P

lasmon R

esonance imaging (S

PR

i)

NEWNEW

Screenshot of the SPRi-View software

XelPleX is the ideal solution for label-free bio-assays. XelPleX combines the power of multiplexing (measuring multiple interactions

simultaneously) and the sensitivity of Surface Plasmon Resonance, resulting in high-resolution kinetic profi les.

Multiplex detection of several hundred interactionsLabel-free interaction detection of proteins, peptides, DNA, RNA, cells, small molecules Real-time monitoringDetermination of kinetic parameters and affi nityDifference image display gives a direct view of reactions as the experiment unfoldsTemperature controlSample recovery functionSample recyclingUser-friendly software

Features

Features

Features

Features

OpenPlex is a flexible Surface Plasmon Resonance imaging system. It is a robust and compact system designed for simplicity and versatility. Its open format, dedicated sensor chips and manual operation enables many types of experiments.

With the courtesy of Dr Marinella Sandros from JSNN, USA

Label-free interaction analysis Real-time monitoring of kinetic curves Determination of affi nity/kinetic parameters Multiplexed imaging (up to 400 spots)

Different fl ow cell confi gurationsMinimal maintenance

Easy to usePrints onto SPRi-Biochips, SPRi-Slides™ and standard glass slidesCapture and deposition ofmolecules from complex samplesNo cross-contaminationIncreased spotting reproducibility and uniformityEnhanced assay sensitivity

Easy to operate with fast system start up and simple installationRobust, compact and portable designOperates with uniquely optimized composite printing pinsIntegrated micro-array image processing and data analysis toolsPrints onto different supports

Accessories

SPRi-Arrayer makes it easy to print biological micro-arrays on a biochip surface to suit your experiment, whether it’s gold, glass or membrane substrate, thus adding versatility to your experiment or assay.

CRP_Specifi c Aptamer Control

38


Surface P

lasmon R

esonance imaging (S

PR

i)

Principle

Key Applications

PrincipleSurface Plasmon Resonance imaging (SPRi) is an optical detection process that occurs when a polarized light hits a prism covered by a thin (gold) metal layer. Under certain conditions (wavelength, polarization and incidence angle), free electrons at the surface of the biochip absorb incident light photons and convert them into surface plasmon waves. A dip in refl ectivity of the light is seen under these SPR conditions.

The SPR imaging technology takes SPR analysis a step further for biomolecular interaction analysis. It is a sensitive label-free method of visualizing the entire biochip via a video CCD camera. This design enables the biochips to be prepared in an array format with each active site (spot) providing SPR information simultaneously and in real-time.

Exit port Injection port

Prism

Light source

Detector

Features

SPRi Combined with MALDI Mass Spectrometry (MS)

Optimization and comparison parameters

Test for different concentrations, buffers or pH on the same sensor chip, and optimize the experimental conditions of your interaction models. Use as many replicate spots as you wish to be more confi dent in the results.

Spot up to several hundred different molecules on the biochipMonitor the biomolecular interactions of each spot simultaneously in real timeHave access to quantitative and qualitative information (kinetic curve and

difference image) simultaneously.

DNA / RNA

DNA / DNA

Protein / carbohydrate

DNA / Protein

Antibody / Bacteria Peptide / Protein

Protein / Protein

Combination of SPRi and MALDI-MS Analysis- Analysis on the same biochipDirect MS analysis on SPRi microarray chip- No recovery of the sampleMultiplexed analysis of many spatially resolved samples- Save time and consumables

Instant affi nity profi ling

By using a single-injection step the affinity of analytes binding to different ligands can be determined using only one analyte concentration injection (no regeneration step required) – saving you time and samples.

Small molecule detection

The revolutionary optical and fluidics units obtain unsurpassed performance for high-sensitivity measurements. The instrument is compatible with the use of solvents, such as DMSO.

Rank and screen your molecules

Multiplexing helps you to rank and screen molecules such as antibodies or aptamers according to affinity or kinetic rates, easily and rapidly.

TGM/TGS SeriesSpectrometer

PGM/PGS SeriesSpectrometer

VHR 640/1000Spectrometer

UVL Series Spectrometer

23

VUV Systems

VU

V S

ystems

About Us

Key Applications

Applications

Applications

Applications

Applications

HORIBA Scientifi c supplies vacuum spectroscopy components covering 1 nm to NIR in vacuum environment, such as light sources, sample chambers, monochromators, detectors, accessories, and more. Our instruments are designed using state-of-the-art spherical, plane, toroidal or cylindrical optics, gratings and mirrors with micro mechanic movements in High and Ultra High Vacuum chambers. We offer our technical expertise in customizing optical spectroscopy systems with high throughput, low aberration, and high resolution optimized for your spectral ranges and applications.

Tunable VUV light sources, VUV fl uorescence excitation, transmission/refl ection/absorption, XPS, plasma spectroscopy, VUV photoluminescence, VUV laser, high-order harmonic generation.HORIBA Scientifi c also offers customized VUV optical spectroscopy systems, including full synchrotron beamlines.

Optical design: single gratingsGrating: spherical type IV gratingSpectral range: 50 nm - 600 nmFocal length: 200 mm and 300 mmSpectral resolution: better than 0.1 nmVacuum: 10-5 mbar/10-9 mbarCompatible with single channel detectors & non-vacuum systems

Optical design: single gratingGrating: aberration-corrected toroidal master/replica gratingSpectral range: 1 nm - 400 nmFocal length: 300 mm - 4500 mmSpectral resolution: up to 0.01 nmVacuum: 10-6 mbar/10-9 mbarCompatible with single/multi-channel detectors & non-vacuum systems

Optical design: mirror + gratingGrating: aberration-corrected plane master/replica gratingMirror: toroidal mirrorSpectral range: 1 nm - 125 nmFocal length: 200 mm - 1000 mmSpectral resolution: up to 0.008 nmVacuum: 10-8 mbar/10-9 mbarCompatible with single/multi-channel detectors & non-vacuum systems

Optical design: Czemy-TurnerGrating: plane gratingMirror: toroidal mirrorSpectral range: 100 nm - 15 μmFocal length: 640 mm/1000 mmSpectral resolution: up to 0.005 nmVacuum: 10-5 mbarCompatible with single/multi-channel detectors

XPSPlasma spectroscopyHigh-order harmonic generationVUV laser

XPSPlasma spectroscopyVUV photoluminescenceVUV fl uorescenceSpace

VUV tunable light sourcesTransmission-refl ectionLaser harmonic fi lterFluorescence Excitation / Emission

XPSPlasma spectroscopyHigh-order harmonic generationVUV laserSynchrotron

OEM Gratings & Spectrometers

24OE

M G

ratings & S

pectrom

eters

About Us

Key Applications

Products

HORIBA Scientifi c, formerly Jobin Yvon, continues transferring its valuable knowledge obtained in the production of high-end scientifi c gratings and instruments to volume production of industry gratings and spectrometers. Thanks to its strong capability in research and development in optical spectroscopy design and production, HORIBA Scientifi c continuously cooperates with instrument manufacturers to help them update their own products, increasing their added value and developing their next generation of instrumentation.

HORIBA’s OEM products are widely used in many applications, including biomed, light source measurement, HPLC, water and gas analysis, telecom, ICP, Raman, fl uorescence, lasers, etc.

According to customers’ requirements and applications, HORIBA Scientific can provide gratings, spectrometer modules and complete solutions. Our experts in optical spectroscopy will share their experience, work with customized specifi cations, and help fi nalize products’ designs, all at a reasonable price.

As a major OEM provider in optical spectroscopy, HORIBA Scientifi c observes a strict confi dentiality policy and is fully compliant with the industry standards, including NDA, traceability, and quality control. Our OEM division pursues a long term win-win cooperation with customers and manufacturers, alike.

Type I holographic concave grating

Diffraction gratings

Type IV aberration-corrected monochromator grating

Customized spectrometers

Type IV aberration-corrected fl at fi eld grating

Customized optical spectroscopy solutions

37

QuantaMaster 800

EasyRatioPro

RatioMaster


Fluorescence Sp

ectroscopy

300 mm focal length monochromatorsAutomated triple grating turretAutomated illuminator and detector fl ipping mirrorsMany NIR detection options

Ideal for intracellular ion imagingFura-2 [Ca++], FRET, BCECF [pH]High speed imaging limited only by camera technologyDedicated ratiometric protocolsPatented illuminator technologyPatented user interface

Ideal for intracellular ion imagingFura-2 [Ca++], FRET, BCECF [pH]Photon counting detectionMillisecond detection speedsDedicated ratiometric protocolsPatented illuminator technology

Ideal for intracellular ion measurementsFura-2 [Ca++], FRET, BCECF [pH]Switch excitation wavelengths in millisecondsMaximize dynamic range of your fl uorescence probeDetermine ideal wavelengths for any fl uorescence probeAcquire highest quality results in challenging multiple-probe experimentsMeasure fast transients, up to 250 ratios per second

HORIBA PTI Photon Technology, Inc. is a leading supplier of research spectrofluorometers, serving universities and research labs, industrial and biomedical markets. PTI is the world leader in microscopy-based fluorometers, especially for intracellular ion imaging. PTI also manufactures and distributes lasers and other optical components under the Optical Building Blocks (OBB) brand. PTI has joined the HORIBA family of companies, allowing us to expand presence in the microscopy and biomedical markets served by PTI’s product portfolio.

QuantaMaster 400Steady-State Spectrofl uorometer

PTI QuantaMaster™ 400 steady-state spectrofluorometer is an affordable and extremely sensit ive photon counting spectrofluorometer. It features state-of-the-art high throughput monochromators with a triple motorized grating turret for easy extension of the spectral range, and motorized flipping mirrors to make it easy to work with additional light sources and detectors.

QuantaMaster™ 800 UV-VIS Rapid Exci tat ion is the latest h igh-speed mult i-wavelength rat io f luorescence system from PTI. It incorporates our patented DeltaRAM X™ random access monochromator into our standard steady- state spectrofluorometer to allow for rapid ratiometric measurements. Together with PTI’s spectroscopy software, the PTI QuantaMaster™ 800 will meet your highest demands and is perfect for a multiple user environment.

PTI is offering a completely new revolutionary system for the collection and analysis of ratio-metric imaging data for calcium, pH, and intracellular ion imaging! The PTI EasyRatioPro with Warp Drive interface is a complete imaging system featuring dramat ic power, h igh speed image acquisition and more! PTI EasyRatioPro’s easy to use software, along with its unique user interface, Warp Drive, allows you to efficiently gather superb quality data. PTI EasyRatioPro is the most comprehensive system of its kind, giving you control over your imaging world like never before.

The PTI RatioMaster™ is a microscope-based ratio spectrofluorometer for the collection and analysis of ratio-metric photometry data for calcium, pH, and in t race l lu la r ion and FRET. The PTI RatioMaster™ offers researchers amazingly high speed measurements, along with solid, dependable and sensitive detection. PTI RatioMaster™ is the only choice for both speed and sensitivity!

Features

Features

Features

Features

High speed spectrofl uorometer

Fluorescence imaging system

Fluorescence microscopy system

36

FluoroCube / UltraFast

DeltaMyc

DeltaPro / DeltaFlex


Fluorescence Sp

ectroscopy

NEWNEW

Features

Features

Features

DeltaPro / DeltaFlex are the new generation of turn-key TCSPC fl uorescence lifetime systems. It employs the accuracy of time-correlated single photon counting (TCSPC). This system enables the seamless measurement of luminescence lifetimes from picoseconds to 1 second, using our DeltaHub timing electronics. De l taF lex coup le w i th emiss ion monochromators (Uv-Vis or NIR range)for wavelength selection and complete spectral collection such as TRES.

Lifetime - measure 25 ps to 1 sOperation up to 100 MHz with DeltaDiode light sourcesStandard sample holder with magnetic stirrer and temperature sensor Measure rotational correlation times using optional polarizers Kinetic TCSPC-1 to 10000 decaysmeasured sequentially in 1 ms to 1 min per decay

A compact f luorescence system o p t i m i z e d f o r u s e i n l i f e t i m e measurement. FluoroCube / UltraFast combined the latest miniatur ized light source and detector technology with proven TCSPC electronics and automation to offer the most flexible and user-friendly photon counting lifetime system available today.

Fully modular: Measures picoseconds to secondsMost comprehensive range of excitation sources covering UV to NIR (laser diodes, LEDs and fl ashlamps)T i-sapphi re laser and mul t i -photon compatibilityHighly integrated picosecond detector modules, and MCP-PMTs for the ultimate in time resolution.

Anthrancene crystals

Fluorescence imagingLife time imaging

Anthrancene crystals

DeltaMyc is the user-friendly instrument for investigating dynamic events in microscopic samples, such as energy-t ransfer and molecu lar b ind ing. DeltaMyc is an advanced system to apply time-resolved fluorescence spectroscopy on the micron-scale.

Accessories

Fully-automated compact optical lifetime module for automated switching filters, dichroic fi lters and pinholesConfocal head uni t with automated pinholes (100 μm~1000 μm) New laser diode (DeltaDiode™) with high repetition-rate lasers (up to 100 MHz), operated in CW or pulsed modeIntuitive data-acquisition and analysis software FRET software routine for transfer effi ciency and molecular distance

Integrating sphereAutomated polarizers Automated four-position thermostated cuvette-holder

Microsense


25

Op

tical Sp

ectroscopy

About Us

Typical Applications

HORIBA Scientific’s Optical Spectroscopy Division provides component-based systems configured to match your experiments’ requirements. Our spectrometers, detectors, and accessories can be confi gured many different ways to provide a fl exible, high performance spectroscopy platform for your laboratory. Some common confi gurations that we routinely provide are described below.

PL is a simple yet powerful technique for characterizing semiconductor materials. An iHR550, equipped with a CCD and InGaAs detector, is an excellent general purpose photoluminescence measurement system. Separate optical configurations can be designed for room temperature PL and low-temperature PL using the same iHR spectrometer. iHR spectrometers provide the fl exibility that allow you to change experiments and optical confi gurations as needed.

Raman spectroscopy is quickly becoming a popular method for investigating chemical structures and composition. We offer full flexibility in designing a component-based Raman detection configuration, with choice of iHR spectrometers, with SynapseTM or SymphonyTM CCD, and InGaAs detectors. Our systems are best suited for researchers desiring maximum fl exibility to implement their own collection optics, connect to existing microscopes, or for researchers with budget limitations who need high sensitivity detection systems, and who have the option to expand and upgrade in the future.

With HORIBA Scientific spectroscopy components, you can design a custom fl uorometer using iHR spectrometers as the excitation and emission spectrometers, with a choice of excitation sources, sample compartments and detectors from our extensive catalog of products and accessories. Full system control is available through our SynerJY® software.

Absorption, transmission, and reflectance spectroscopy techniques are commonly used to determine the properties of materials. The modularity of a HORIBA Scientifi c spectroscopy system outperforms a traditional UV-VIS spectrophotometer by allowing you to expand your experiment capabilities. The automated triple grating turret, coupled with our motorized order sorting fi lter wheel, dual exit ports of the iHR320, and a wide variety of light sources and detectors, provides the fl exibility required to cover all wavelength ranges from 180 nm to 20 microns.

Simultaneous recordings of spectra from multiple locations in a plasma plume can provide critical information about spatially-related phenomena. A fiber with multiple inputs can collect light from different points in the plasma and arrange the signals into a line of points at the entrance slit of the spectrograph. Taking advantage of the imaging capability of an iHR spectrograph and Synapse CCD system, the spatially separated data is collected on the CCD and represents independent simultaneous optical emission spectra from different fi ber collected points.

Photoluminescence (PL)

Raman Spectroscopy

Fluorescence

Absorption / Transmission / Refl ectance

Plasma / Emission Analysis

26

Op

tical Sp

ectroscopy

Fully integrated, high throughputWide spectral range, simple to useVersatile and compatible with multiple lasersDown-looking or side-looking objective availableCost effective microspectrometer

Versatility, high performance in a small packageMicroHR compatible with CCD/IGA array, PMT or solid state detectorIdeal for at-line diagnostics, fi eld measurement, etc.

Superior imaging performancePatented on-axis grating drive Asymmetric layout eliminates re-diffracted lightChoice of 2 entrance and 2 exit portsIdeal for photoluminescence, Raman, fl uorescence, etc

MicOS

MicroHRSmall spectrometer

iHR320 / 550Imaging spectrometer

FHR640 / FHR1000High resolution spectrometer High spectral resolution

High scanning speed, reduces overall experiment timeRobust cast body for optimal performance without wavelength shifts and signal loss

Very easy to operateLow cost time-resolved fi lter-based fl uorometerIdeal for undergraduate teaching labsIdeal as a lifetime companion to any spectrofl uorometerComprehensive decay analysis software, MEM distribution analysis

EasyLife X / EasyLife LLow cost fl uorescencelifetime fi lter fl uorometer

Monochromators

Microscope Optical Spectrometer


NEWNEW

Features

Features

Features

Features

Features

Spectral range: 200 nm~1600 nmSpectrometer: iHR320/iHR550Spectral resolution: 0.18 nm/0.1 nmStage: manual or motorized

Focal length: 320 mm / 550 mmGrating size (mm): 68 x 68 / 76 x 76Aperture ratio: 4.1 / 6.4PMT resolution: 0.06 nm / 0.025 nmCCD resolution: 0.18 nm / 0.1 nmStray light: 1.5 x 10-4 / 1 x 10-5

Grating number: up to 3Slit: auto

Focal length: 140 mmAperture ratio: 3.88PMT resolution: 0.25Dispersion: 5.25 nm/ mm

Lifetime range: 100 ps~4 μs/μs~300 msExcitation source: pulsed nanosecond LEDs/pulsed xenon lampOptical pulse width: 1.5 ns/4 μsExcitation range:265 nm~670 nm / 200 nm~2000 nmEmission range:200 nm~650 nm (900 nm option)185 nm~680 nm (900 nm option)

Focal length: 640 mm / 1000 mmGrating size (mm): 80 x 110 or 110 x 110Aperture ratio: 5.4 / 9PMT resolution: 0.016 nm / 0.01 nmDispersion (nm/mm): 1.2 / 0.8Scan speed: 300 nm/s

Light source: 150 W Xenon lampSesitivity (SNR)- 6000:1 FSD method*- 16000:1 RMS methodAll-refl ective opticsTime-correlated single-photon counting (TCSPC) accessory for lifetime determinations Phosphorimeter accessory for long-lived luminescence determinations

Light source: 450W Xenon lampSpectra range: 185 nm~14 μmSensitivity (SNR)- 12000 > 10000:1 FSD method*- 30000 > 20000:1 RMS methodAll-refl ective opticsTotally computer-controlledInterchange wide range of computer-controlled accessories: spectrometers, detectors, sources, and more

Fluorolog Extreme

Fluorolog®-3

NanoLog®

FluoroMax®-4/Plus (P/TCSPC)


Fluorescence Sp

ectroscopy

35Features

Features

Features

Features

NEWNEW

The Fluorolog®-3 is a unique, modular system which al lows the researcher to in terchange a versat i le range of accessories to correspond perfectly with the characteristics of a given sample. From analysis of steady-state or molecular dynamics to IR probes, the Fluorolog®-3 comes equipped with a wide range and limitless configuration of accessories to enhance the accuracy and speed of your application.

The F luoro log® Extreme seamless ly combines our fluorometers with the high intensity and broad wavelength range of the supercontinuum lasers. It is a very bright source that simultaneously puts out light at a very wide spectral range from just above 400 nm to over 2 μm. Because of their brightness and broad spectral range, they make excellent sources for steady-state and lifetime (ps to 10 s) measurements.

The FluoroMax® ser ies is a compact spectrofl uorometer, yet it employs photon-counting for the ultimate sensitivity in f luorescence investigations as well as features not found in most table-top fl uorescence-detection systems.

3-D matrix scan over a range of excitation wavelengths of a sample of petroleum

Select any excitation wavelength (400 nm~2 μm)More excitation power for weak fl uorescence signals, especially in the NIRAll-refl ective opticsComplete optical, mechanical and software integration

The NanoLog® series of spectrofl uorometers are specif ically designed for research in nanotechnology and the frontiers of nanomaterials. A complete spectrum can be scanned as fast in as a few milliseconds, and a full excitation-emission matrix scan can be taken in as little as seconds.

Emission-excitation scan of a mixture of single-walled carbon nanotubes

*Note: This method considers that noise is also infl uenced by factors like the quality of the optics and scattered light in the system.

Rapid excitation-emission matrices in secondsHigh sensitivity in near-IR with InGaAs arrayAll-refl ective opticsEases qualifi cation and quantifi cation of species and families of SWCNTs Resolve mixtures of quantum dots simultaneously Modular design to accommodate any experimental setup Compatible with a variety of detectors from UV to near-IR

Excitation:360nm

Inte

nsity

Emission Wavelength (nm)

Fluo

resc

ence

(a.u

.) 1.14

1.12

1.10

1.08

1.06

1.04

1.02

1.00

800

900

1000

1100

1200

1300

1400

1500

1600

Wavelength (nm)

Fluo

resc

ence

0450 500 550 600 650

700

Wavelength (nm)

600000

500000

400000

300000

200000

100000

Aqualog® / Dual-FL


Fluorescence Sp

ectroscopy

34 Principle

Fluorescence is luminescence that results when an electron of a molecule absorbs energy of a specifi c wavelength, and then falls back from a higher energy-level to its original level, releasing the energy as light.

HORIBA Scientifi c, the global leader in Fluorescence Spectroscopy instrumentation, offers the most extensive line of Fluorescence Steady-State, Fluorescence Lifetime, hybrid instruments and microscope-based solutions.

Energy

Internal conversion

Ground-state Electrons

Fluorescence

Heat loss to enviroment

AbsorptionS2 excited state

S1 excited state

Nonradiative dissipation:FRET and quenching

Chemistry

Materials science Cosmetics

Quantum yields of OLEDNanotubes (SWCNT)

characterizationQuantum dotsRare-earth luminescent materials

Characterization of new organic moleculesFluorescent probesReaction mechanisms and quantum dotsAnalysis of nanoparticles

Characterization ofsunscreensPigmentationcharacterizationSkin-aging studiesSkin, hair, and tooth fl uorescence

Dosage of chemical solutions

Key Applications

Biology/Life science

Cell mechanismsInteractions of proteinsSinglet-oxygen detectionMembrane mobilityIntracellular calcium fl ow

EmissionExcitation

Collagen

Derm

Skin

Tryptophan

Fluorescence of the skin, hair and teeth

Analysis of nanoparticles of erbium in YbPO4 with the Fluorolog®-3

Emission spectra of quantum dots

Emission spectra of a wafer using the Fluorolog®-3 coupled with a microscope (Diameter of the zone studied: 1 μm)

Aqualog® / Dual-FL combine the world’s only CCD-based benchtop spectrofl uorometer with a UV-VIS spectrophotometer. It is the only instrument to simultaneously measure both absorbance spectra and fl uorescence Excitation-Emission Matrices.

EEMs are acquired up to 100 times faster than with other instruments. Dedicated software automates traceable Quinine Sulfate Unit calibration and correction of inner-fi lter effects and Rayleigh and Raman scattering lines.

Features

The only true simultaneousabsorbance-fl uorescence system availableThe fastest acquisition speed of EEMs (s~min)Light source: 150 W Xenon lampSpectra range: 200 nm~800 nm(UV-NIR model, full-range calibration)

Sensitivity (SNR) > 20000:1Double excitation monochromatorTE-cooled CCDAll-refl ective optics

The effects of IFE on the EEM

1000M / 1250MUltra high resolution spectrometer

Focal length: 1000 mm/1250 mmAperture ratio: 8/9PMT resolution: 0.008 nm/0.006 nmDispersion (nm/mm): 0.8/0.65Step Size: 0.00025 nm

Spectral range: 190 nm~20 μmIncluding: PMT, Si, Ge, InGaAs, InAs, InSb, PbS, PbSe, HgCdTeCooling system: Thermoelectric or liquid nitrogen

Ultra-high spectral resolutionFine step size

27

Op

tical Sp

ectroscopy

Ultra bright optical powerIdeal for solar illuminatorsIdeal for tunable monochromator illuminationChoice of lamps (75 W Xe,100 W Hg, 100 W TH, 150 W Xe, 200 W Hg/Xe)Choice of ellipsoidal reflectors (f/1, f/2.5, f/4.5 )Air tight “ozone free” lamp housing6X better collection than traditional vertical lamp housings

Ultimate optical power (100 watts)Ideal for solar illuminatorsIdeal for tunable monochromator illuminationChoice of 1000 W Xe or 1000 W Hg/Xef/4 ellipsoidal refl ectorAir-cooled illuminatorQuick snap lamp replacement6X better collection than traditional vertical lamp housings

Sleek design with close coupled GHz pre-amplifier, CFD and fast rise-time PMT Instrument response function from <180 psSaturation limit of 10 MHzOptional interlock and overload protection featureWavelength range: 230 nm ~ 920 nm (3 models)

We provide deuterium lamps, xenon lamps, Tungsten-Halogen lamps, globar sources, and spectral range covers from 180 nm to 20 μm.

Spectral range: 200 nm-2200 nmIncluding: CCD/InGaAs array, with choice of pixel size and pixel number Choices include: open-electrode, front-illuminated, back-illuminated and deep-depleted High sensitivity, low noise, superior linearityCooling system: thermoelectric or liquid nitrogen

KiloArcPowerArc broadband light source broadband light source

Optical SpectroscopyFeatures

Detectors

Light sources

Single channel detectors

Multi-channel detectors

PPD detectors

Highly specialized source for live cell fl uorescence dynamicsIdeal for intracellular ratio fl uorescence (excitation ratios)Fura-2 [Ca++], FRET, BCECF [pH]2 ms to switch between any two wavelengthsUltra high speed, up to 400 ratios/secondTunable from 250 nm to 650 nmIncludes liquid light guideAdapters for any fl uorescence microscopeCompatible with a variety of 3rd party software platforms

Various kinds of sources: SpectraLED, NanoLED, DeltaDiodePlug-and-play operationExcitation ranges available: 250 nm~1310 nmOptical pulses as short as 50 psRepetition rates up to 100 MHz

Providing a full line of spectroscopic accessories

Fastest commercially available TCSPC electronicsDeadtime of <10 ns - matched perfectly to 100 MHz repetition rate of DeltaDiode for nearly lossless photon countingCollect lifetimes from 25 ps to 1 s seamlessly - 11 orders of magnitude-great solution for multi-user facilityMeasure up to 10,000 decays sequentially, with acquisition times from 1 ms to 60 s per decay (Kinetic mode)

28

SynerJY® software: based on OriginTM

LabSpec-OSD software: extended Raman spectral processing functionalityIncludes software development kit to develop customized routinesLabVIEW VIs are available free of charge

DeltaRAM X

DeltaHub

Light sources for lifetimes

Op

tical Sp

ectroscopy


Millisecond switching fl uorescence microscope illuminator

Ultra low deadtime TCSPC Module

Accessories

Software

Sample compartments

Filter wheel and fi lters

Fiber and fi ber adapters

Chopper and lock-in amplifi er

33Fully automated operation, start measuring within minutes not hours!Compatible with red and NIR Raman excitation lines thanks to 1.3 μm AFM laser diodeTop and side* R-AFM optical coupling with high NA (up to 100X, 0.7 NA)Co-localized AFM-Raman image with optimized illumination spot size from the topTERS-ready label free chemical nano-imaging from top/sideFast TERS mapping with SWIFTTM

Integrated software platformHORIBA Scientifi c TERS tips (10 years experience with LPCIM)

XploRA Nano

LabRAM HR Evolution Nano

Combiscope XploRA

Composite Raman image a, b. Single Wall Carbon Nanotubes TERS images showing spatial resolution below 20 nm.c. Scanning Tunneling Microscope image (same as b)

**Top/Side and Bottom access can be proposed upon request

A. B. C.

Topography AFM image

See "Atomic Force Microscope" on page 48

AFM – Raman

AFM

– Ram

an

Conventional Micro-Raman provides diffraction limited sub-micron spatial resolution. Co-localized measurement is all about overlapping a Raman map with an AFM map (topography, phase, capacitance, etc.)

The better the mechanical and software coupling between the two instruments, the closer to the diffraction limited spot size, the better the information you get!

TERS is the unique way to obtain chemical-structural-stress information at the nanoscale, at ambient temperature and pressure, without labelling your samples with dyes or fl uorescent probes!

But a good TERS measurement requires the highest level of stability, the best collection effi ciency, and good TERS tips, which only HORIBA Scientifi c can offer!

Features

Features

XploRa Nano is a fully integrated compact AFM-Raman system. It combines high performance with ease-of-use, speed and reliability.

Combiscope XploRA is a fully integrated c o m p a c t A F M - R a m a n s y s t e m dedicated to transparent samples (sensors, biophysics, biochemistry, etc).

HR Evo Nano is a fully integrated AFM-Raman system. It offers full automation and versatile compatibility with outstanding performance.

Raman excitation lines from blue (473 nm) to NIR (785 nm)High spectral resolution

Raman excitation lines from blue (473 nm) to NIR (785 nm)

High spectral resolution

Raman excitation lines from DUV (229 nm) to NIR (1064 nm)

Ultra high spectral resolution

Co-localized image with highest spatial resolution with up to 1.4 NA objectives TERS-ready system for nanoscale spatial resolutions in Raman imagingBottom optical coupling with inverted microscopeFully automated operationOpen access for sample handling and other techniques couplingCompatible with DuoScanTM and SWIFTTM fast imaging

Colocalized Raman-AFM TERS: Tip Enhanced Raman Spectroscopy

NEWNEW

NEWNEW

NEWNEW

32

Raman Spectroscopy

Ram

an Sp

ectroscopy

Software

Transmission Raman

AFM - Raman

SEM - Raman

Auto calibrationMulti-language interface (including Chinese) FLAT correction (Real-time spectral optimization) One-click operation for multiple tasks and data analysisParticleFinder* Multivariate Analysis (MVA)*Spectrum database-searching and database-building*VBS and ActiveX for customization and remote control3D volume*Multiwell plate control * (*options)

LabSpec 6 is an innovative Raman software suite for complete instrument control and data-processing. It combines simplicity with powerful and versatile functionality, and opens up the full range of experiment protocols.

Fully integrated MVA module*ParticleFinder module* for automated particle location and analysis

FLAT correction for automated fl uorescence removal

FLAT correction for automated fl uorescence removal

Multiple-laser confi gurationOne-time fast acquisition to get full volume informationSuitable for applications in materials, polymers, pharmaceuticals, food, etc.

Transmission Raman is a macro sampling technique, specially designed for one-time acquisition of the full volume. It is ideally suited for bulk analysis of opaque/turbid materials, such as content uniformity or polymorphism in pharmaceutical tablets.

Refl ection Raman

Transmission Raman

Laser illuminationSignal collection

Laser illumination

Signal collection

Co-localized AFM and Raman imagesTip-Enhanced Raman Spectroscopy (TERS) Versatile confi gurations: Top/bottom/side illumination

HORIBA Scientifi c partners with most of the world’s leading AFM/STM/NSOM manufacturers to provide multi-functional and reliable solutions for your requirements.

Refl ection mode Transmission mode

SEM - Raman

SEM providing morphology informationRaman for chemical analysisPL providing electronic structure informationUnique cathodoluminescence (CL) signal-collection mode

HORIBA Scientif ic partners with most of the world’s leading Scanning Electron Microscope (SEM) manufacturers to provide multicharacterization capabilities.

Raman Spectroscopy

29

Ram

an Sp

ectroscopy

Key Applications

Principle

Raman spectroscopy is a light-scattering technique. Interaction of laser light with a sample’s molecules results in a Raman spectrum which is extremely information rich, providing:

Chemical composition and distributionMolecular structures and functional group characterizationCrystal forms, chirality, stress, doping, defect/disorder, etc.Phase transformation/reaction monitoringSpectral imaging/multilayer analysis

Carbon nanotube

Graphene

Others

Carbon materials

Geology

Pharmaceuticals and Cosmetics

Semiconductors

Jewelry, Museum, Forensics

Life Sciences

sp2 and sp3 structure Hard disk driversDLC-coating propertiesDiamond quality and provenance

Layers, defects, etc.

Diameter, chirality, doping, etc.Stress/Strain AnalysisDoping/DefectContaminationsSuperlattice structureCrystal form analysisPhotoluminescence (PL)micro-analysis

Minerals/Crystal formsFluid inclusionPhase transformationIn-situ high/lowtemperature reactionThermal oxidation oforganic materialsFluorescence micro-analysis

Chemical identification and distributionAPI quantifi cation High-throughput screening Polymorphs, crystal-form transformation and thermal-stability analysis

Gemstones/JadeMetalware corrosion Printing inks/PigmentsDrugsCellulose/TextilesHandwriting authenticationExplosives/Bullet remnants

Bio-macromolecule (lipids, proteins, carbohydrates, DNA, etc.)Bacteria location, identifi cation and classifi cationCell analysis (cell imaging)

Drug counterfeiting and additive detectionDrug-cell interactionReal-time reaction monitoring and terminal product detection

Drug distribution in cells/tissuesDiseases & early diagnosis, oncologyLabel-free in-vivo and in-vitro analysis

Rayleigh Scattering

Raman scattering

XploRA PLUS

XploRA ONE

T64000

LabRAM HR EvolutionLatest Raman spectrometer with high resolution30

2010

2011中国科学仪器发展年会组委会

2010

年度科学仪器优秀新品奖

年度科学仪器优秀新品奖

2012

中国科学仪器发展年会组委会

XploRA INVMulti-functional Raman and imaging spectrometer

Raman Spectroscopy

Ram

an Sp

ectroscopy

Biology

Raman Instrumentation with intelligent automation

Raman instrumentation with high sensitivity

Triple Raman spectrometer

NEWNEW

NEWNEW

The unique 800 mm focal length provides the highest spectral resolution on the single-stage spectrometer market. It offers fully automated and versatile capability with excellent performance.

Integrated inverted Raman microscope des i gned spec i f i ca l l y f o r use w i t h biomedical or biological samples. It retains the full functionality of standard Raman measurements, and offers ultrafast Raman/fl uorescence/PL imaging, etc.

Integrated upright Raman microscope retains the full functionality of common Raman measurements, and offers ultrafast Raman/fluorescence/PL imaging, etc. It is ideally suited for applications such as chemistry, food, pharmaceuticals, geology, archaeology, evidence identifi cation, jewelry identifi cation, etc.

The XploRA ONE offers new capabilities to the industrial and analytical user, providing the highest performance Raman, in a cost effective and robust instrument package. It is ideal for routine analytical, research and quality testing applications.

The T64000 system is designed to provide a versatile platform for Raman analysis with high performance. With ultimate fl exibility, it allows choices of single/triple additive/triple subtractive operation modes, microscope/macro-chamber sampling, and the use of continuously variable lasers.

Features

Features

Features

Features

Features

Upright/Inverted research microscopeUV-VIS-NIR rangeHighly automatedHigh spectral resolutionUltra low frequency < 10 cm–1

True confocal measurement, high spatial resolutionUltra-fast Raman / PL imagingAFM and other combinations

Inverted research microscopeFully automated laser switchingAutocalibration, autovalidation, autoexposure, autofocusTrue confocal measurement, high spatial resolutionUltra-fast Raman / PL imagingAFM and other combinations

Ultra high resolution down to 0.15 cm–1

(triple additive)Ultra low frequency down to 5 cm–1 (triple subtractive)High throughput (single mode)continuously variable lasersUV-VIS-NIR rangeTrue confocal measurement, high spatial resolution Microscope/macro-chamberCompatible with a broad range of options and accessories

Upright research microscopeFully automated laser switchingAutocalibration, autovalidation, autoexposure, autofocusTrue confocal measurement, high spatial resolutionUltra-fast Raman/PL imagingAFM and other combinations

Upright research microscopeOneClick operation, fast andaccurate analysisAutocalibration, autovalidation,autoexposure, autofocusTrue confocal measurementSWIFT, Ultra-fast Raman imagingRegulatory compliance: 21 CFR11

31DuoScan

Ultra Low Frequency (ULF)

Microscope options

SWIFT

Specialized stages

Macro/large sample measurements

Key Features

Macro-mapping over large areas Mapping without moving the sample, scanning step size down to 50 nmAverage info of a user-defi ned macro spot

SWIFT is an ultra-fast mapping technique. The unique design signifi cantly reduces mapping time to seconds or minutes (Compared to hours needed for traditional mapping).

DuoScan provides multi-imaging functions:

Macro-mapping for fast location of different minerals by combining DuoScan and motorized stage

Mapping of whole pharmaceutical tablet over 7×16 mm2 for fast location of different ingredients within 9 min.

CalciteDolomiteRhodocrositeMg-SideriteMagnesiteAragonite

AspirinCaffeineParacetamol

Cooling/heating stages up to 1500° C or down to 4 KCatalytic cells for corrosive or conductive carrier gasesElectrochemical cellsDiamond anvil and pressure cells High-precision piezo-driven stages

The ULF module allows low frequency measurements down to 10 cm–1. Low- and high-frequency spectral features can be acquired simultaneously with high throughput.

Low frequency of Si / Ge superlattice, laser: 633 nm Cooling / heating stage High-precision piezo-driven stage

Polarized light visualizationDark-fi eld illuminationDifferential interference contrastFluorescence microscopy

Open-space microscope Liquid cellsRaman probe for remote control 90° macro measurements

Identifi cation and location of different bacteria with fl uorescence microscope option

Stained glass from Notre Dame de Paris by remote Raman probe

Raman Spectroscopy

Ram

an Sp

ectroscopy

2014-2015 general brochure-eng-23jan2015 - horiba...xplora nano afm-raman nanolog® fluorescence...

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