10 gigabit ethernet test and measurement challenges · presented by: brian scott geoff waters 10...

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presented by: Brian Scott Geoff Waters 10 Gigabit Ethernet Test and Measurement Challenges August 1, 2002

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presented by:

Brian Scott

Geoff Waters

10 Gigabit Ethernet Test and Measurement Challenges10 Gigabit Ethernet Test and Measurement Challenges

August 1, 2002

Page 2

10 Gigabit Ethernet Standard10 Gigabit Ethernet Standard• 10 Gigabit Ethernet standard is IEEE 802.3ae • Draft P802.3aeD5.0 was ratified on June 14, 2002• Original intention: Scale 1 Gigabit Ethernet (802.3z) to

10 Gb/s• Some tests proved to be extremely difficult to execute

at 10 Gb/s • 10 GbE Serial Optics Test:

• Stressed-eye receiver sensitivity• Building in the calibrated levels of

deterministic and random jitter • Transmitter jitter through bathtub curve

analysis

Page 3

AgendaAgenda• Standard specifies test

and measurement requirements at all layers

• Today’s topics:• Clause 52: Physical

Medium Dependentsublayer

• Clause 47: 10 Gigabit Attachment Unit Interface (XAUI)

Page 4

The Evolution of IEEE 802.3aeThe Evolution of IEEE 802.3ae• Clause 52: 10 GbE PMD Sublayer Serial Optics Tests:

• New Stressed Receiver Conformance Test• Simplified and changed stressed eye

• Transmitter and Dispersion Penalty Test• Replaces bathtub curve analysis

• XAUI Test:• New 10 Gigabit Ethernet Attachment Unit Interface

(XAUI) between MAC and PCS with 4 lanes of 3.125 Gb/s

• Allows the elimination of the 74 signal-wide interface (XGMII) and associated skew problems

• New 64b/66b line coding (translates 8b/10b)

Page 5

“Golden” Test Fiber

Error Detector

O/E

DUT

CDR

40 MHz Source

>40 MHz Jitter

10.3125 GHz Source

LPF

Modulator

OpticalAtten.

Laser1310 Rx

Tx

10 dB Coupler

Stressed Conditioner

Reference Receiver

Transmitter and Dispersion Penalty Test

Stressed Receiver Conformance Test

IEEE 802.3ae Clause 52 Test SetupIEEE 802.3ae Clause 52 Test Setup

Pattern Generator

1-2 GHz Source

OpticalAtten.

Page 6

Stressed Receiver Conformance TestStressed Receiver Conformance Test• Sinusoidal jitter

modulates the clock timing of the pattern generator

• Sinusoidal interference signal summed with jittered data pattern

• Summed signal low-pass filtered

• Apply the worst case compliant transmitter signal to the receiver

• Verify a BER of better than 1x10-12 is achieved

0 to 40MHz

10.3125GHz

Clock

PatternGenerator

~1-2 GHzsine

7.5 GHzLPF Laser

0 to 40MHz

10.3125GHz

Clock

PatternGenerator

~1-2 GHzsine

7.5 GHzLPF Laser Atten.

Page 7

The “Stressed Eye”The “Stressed Eye”

• Eye impairments include:• Sinusoidal jitter• Horizontal eye

closure • Inter-symbol

interference (ISI)/ Vertical Eye Closure Penalty (VECP)

• Attenuation

Page 8

Stressed Eye ExampleStressed Eye Example• While the concept is

straightforward, construction of the stressed eye requires a careful, systematic approach

• Insufficient stress allows weak parts to appear compliant

• Excessive stress makes possibly good receivers appear non-compliant

Page 9

Building the Stressed EyeBuilding the Stressed Eye• 52.9.10 Stress receiver

conformance test• The standard defines

the test equipment and the procedure

Page 10

Receiver Test Block DiagramReceiver Test Block Diagram

• Stressed eye construction process• PRBS >= 210-1• Set transmitter extinction ratio• Measure Optical Modulation

Amplitude (OMA)• Add ISI induced VECP relative to

OMA• <67% due to filtering

• Add remaining VECP through sinusoidal interferer and sinusoidal jitter

• Iterate (all) to achieve correct VECP

• Attenuate signal to required OMA

• Step through complete sinusoidal jitter template

71612CPG

N1015AJitter Testset

E4422B1-2 GHz

83732B10.3125 GHz

71501D

StressedEye

Testset

Switch

86100B86107A86106B

DUT

DCA

Attenuation

8163B81560A81591A

Rx

70820AJitter Calibration

N1016A

40 MHz 33250A

Page 11

Building the Stressed EyeBuilding the Stressed Eye

• PRBS >= 210-1• Set transmitter

extinction ratio

71612CPG

Stressed EyeTestset

N1016A

Page 12

• Measure Optical Modulation Amplitude (OMA)

• Set nominal Vertical Eye Closure

Building the Stressed EyeBuilding the Stressed Eye

Nominal “1” level

Nominal “0” level

Page 13

Building the Stressed EyeBuilding the Stressed Eye

• Add ISI induced VECP relative to OMA

• <67% due to filtering

71612CPG

Stressed EyeTestset

N1016A

Page 14

Building the Stressed EyeBuilding the Stressed Eye

• Add VECP through sinusoidal jitter

Stressed EyeTestset

N1016AN1015AJitter Testset

83732B10.3125 GHz

70820AJitter Calibration

40 MHz 33250A

Page 15

Building the Stressed EyeBuilding the Stressed Eye

• Add remaining VECP through sinusoidal interferer

Stressed EyeTestset

N1016A

E4422B1-2 GHz

Page 16

71612C

70820AJitter Calibration

Building the Stressed EyeBuilding the Stressed Eye

• Stressed eye construction process

• Iterate (all) to achieve correct VECP

• Attenuate signal to required OMA

• Step through complete sinusoidal jitter template

• Monitor BER at the receiver

PG

N1015AJitter Testset

E4422B1-2 GHz

83732B10.3125 GHz

71501D

opticalSwitch

86100B86107A86106B

DUT

DCA

Attenuation

8163B81560A81591A

Rx

StressedEye

Testset

N1016A

40 MHz 33250A

Page 17

Transmitter and Dispersion Penalty TestTransmitter and Dispersion Penalty Test• 1 Gigabit Ethernet tested with the jitter bathtub

curve• Initial attempts to do 10 Gb/s bathtubs were

unsuccessful as most devices failed!• Some test system error detectors had jitter

problems which masked the true performance of transmitters

• While error detectors existed that generated accurate bathtubs, the clause 52 standards committee chose an alternative test methodology for characterizing optical 10 Gb/s transmitters

• Overall transmitter performance (including jitter) characterized through the “Transmitter and Dispersion Penalty” test or “TDP”

Page 18

Transmitter and Dispersion Penalty TestTransmitter and Dispersion Penalty Test

• 52.9.11 Transmitter and Dispersion Penalty Measurement• The standard defines

the test equipment and the procedure

Page 19

Transmitter and Dispersion Penalty TestTransmitter and Dispersion Penalty Test

71612CError Detector11982A

O/E

83434A CDR

DUT

Tx10 dB Coupler

“Golden” Test Fiber

OpticalAtten.

opticalSwitch

Reference Transmitter

N1016A

8163B81560A

8163B81591A

Amp.

• A test bed including a reference transmitter and reference receiver is characterized for BER with a known level of signal attenuation

• The transmitter under test is substituted for the reference transmitter.

• The TDP figure is the sensitivity level that the system attenuation must be reduced to in order to return to the test bed BER level.

10-12

+/- 5 ps

X X

Page 20

Clause 52 PMD Measurement SummaryClause 52 PMD Measurement Summary

• Stressed Receiver Conformance Test:

• Difficult to construct

• Solution is available that is compliant, calibrated, repeatable and adjustable.

• Transmitter and Dispersion Penalty Test:

• Test Solution can be constructed to successfully complete the test Reference Transmitter Eye

N1016A Stressed Eye Test Set

Stressed Eye

Page 21

Where XAUI FitsWhere XAUI Fits

Page 22

Benefits of Using XAUIBenefits of Using XAUI

• Self-clocked XAUI eliminate clock-to-data and data skew issues• Robust CML differential, un-clocked interface allows trace

lengths of 18”on FR4• Commonality with emerging Fibre Channel, Infiniband and

SONET standards• Bi-directional interface requires only 16 point-to-point

connections

Page 23

XENPAK Module Block DiagramXENPAK Module Block Diagram

Page 24

XAUI - A Self-Managed InterfaceXAUI - A Self-Managed Interface

• Supports robust 8B/10B transmission code• Extra code groups are used for control

signaling• Control words used during IPG and idle

periods for word and lane alignment• This happens without upper layer support• Therefore XAUI functions as a self-managed

interface

Page 25

XGXS DeskewXGXS DeskewSkewed data at receiver input. Skew - 18 bits

Deskew lanes by lining up Align code-groups

Taken from IEEE 802.3ae task force XAUI/XGXS proposal

Page 26

Clock Tolerance Compensation Clock Tolerance Compensation

• XAUI allows for independent clock domains on each side of the link

• Clocks will be at different rates within specified tolerance limits

• Clock Tolerance Compensation (CTC) adds or deletes R code/word to equalize the data rates

Page 27

Challenges of XAUI BER TestingChallenges of XAUI BER Testing

• XENPAK Clock tolerance compensation (CTC) mechanism can make the output non-deterministic

• Scrambler/de-scrambler complicates testing from 3G XAUI to 10G serial optical

• Turning scrambler off results in long runs of zeros with inadequate timing information

• De-skew pattern must be transmitted before required data

• BER is not measured during the transmission of the de-skew pattern

Page 28

XENPAK BER Testing - SolutionsXENPAK BER Testing - Solutions

• CTC ‘frozen’ by synchronizing test equipment to 156.25 MHz reference oscillator in XENPAK

• Generation of four 3.125 Gb/s outputs • Required de-skew pattern may be transmitted • Data capture and post processing allows

direct input to output testing

Page 29

802.3ae Loopback & Embedded Testing802.3ae Loopback & Embedded Testing

• Loopback at PCS, WIS and PMA proposed• Internal pattern generator and error detector• Range of test patterns including PRBS• Identical patterns may be stored in test

equipment custom pattern memory • XAUI i/o and serial optical i/o may be tested• Vendor-specific implementation of these

features offers more testing flexibility• Many vendors loop-back at 10G

Page 30

Serial vs. Parallel BERTSerial vs. Parallel BERT

71612C Serial BERT:• Up to 12.5 Gb/s• General purpose/simple• Differential serial output• One single-ended error

detector input• Four single-ended outputs

up to 3.125 Gb/s• Custom pattern memory• Flexible interfacing• Bathtub jitter (XAUI)• CJPAT/CRPAT etc• 10G Stressed Eye (802.3ae)

81250 Parallel BERT:• Up to 10.8 Gb/s• Modular/expandable/complex• Multiplex to higher rates (PRWS)• Differential inputs and outputs• Adjustable skew between outputs• Variable timing & levels for all

channels• Custom pattern memory• Data capture/post processing

DITO (3G->10G) • CJPAT/CRPAT etc• Bathtub jitter (XAUI)

Page 31

71612C BERT – XAUI Test Applications 71612C BERT – XAUI Test Applications

• Sub-rate outputs:• Four outputs at 1/4 of the main serial

output rate (max 12.5 Gb/s) are available

• Alternate pattern mode – synchronous selection of two different custom transmit patterns

• Enables de-skewing of the XAUI lanes before BER measurement is performed on the required data pattern

Page 32

XAUI BER using XENPAK Clock InputXAUI BER using XENPAK Clock Input

1 2 3

XENPAKDUT

10Gb/s Tx

10Gb/s Rx

XAUI-out

Patterns A & B

1 of 4

Referenceclock in

156.25MHz

10MHz ReferenceE8241A RF Source

86100B DCA(optional)

Electrical

Optical

2.5 GHz/16

0

XAUI-in

3.125 Gb/s clock

from 71612C

Pattern C

12.5 GHz

clock

71612C Pattern Generator 70843C Error Detector

Page 33

XAUI BER using CDR & Multiplier XAUI BER using CDR & Multiplier

1 2 3

XENPAKDUT

10Gb/s Tx

10Gb/s Rx

XAUI-out

PatternsA & B

1 of 4

86100B DCA(optional)

Electrical

Optical

0

XAUI-in

3.125 Gb/s clock

from 71612C

Pattern C12.5 GHz

clock

71612C Pattern Generator 70843C Error Detector

3.125 Gb/s CDR

Clock DataX4 Clockmultiplier

Page 34

XAUI BER using XENPAK Clock Input XAUI BER using XENPAK Clock Input

1 2 3

XENPAKDUT

10Gb/s Tx

10Gb/s Rx

XAUI-out

Patterns A & B

Referenceclock in

156.25MHz

86100B DCA(optional)

Electrical

Optical

0

XAUI-in

81250 ParBERT

Color Key to Modules

• Firewire interface• E4808A Clock Module• E4866A 10.8Gb/s ParBERT• E4861/62B 3.35Gb/s ParBERT

Page 35

10 Gb/s BER using CDR10 Gb/s BER using CDR

XENPAK DUT

10Gb/s Tx

10Gb/s Rx

86100B DCA(optional)Optical

10.3125 Gb/s clock

from 71612C

10.3125 GHz

clock

71612C Pattern Generator 70843C Error Detector

83433AE/O

83434A O/E

Internal

loop-back

Data Input

Page 36

Serial BERT Sub-rate ProgrammingSerial BERT Sub-rate Programming

• Low Frequency Test Pattern (802.3ae)• Pattern consists of alternating groups of

five ones and zeros• BERT programmed with appropriate 12.5

Gb/s serial pattern such that required 3.125 Gb/s patterns appears at sub-rate outputs

111111111111111111110000000000000000000011111111111111111111…Sub-rate 0 1 1 1 1 1 0 0 0 0 0 1 1 1 1 1…Sub-rate 1 1 1 1 1 0 0 0 0 0 1 1 1 1 1…Etc.

Page 37

Creation of Deskew Pattern Creation of Deskew Pattern

Pattern Bp00000000111111111111111111110000111100001111111100000000000000000000111100001111000000001111111111111111….

0011111010 1100000101 00111110101100000101…-K28.5 +K28.5 -K28.5

This is the required repeating K28.5 sync or ‘K’ word taking into account running disparity rules

The alignment word (A word) and start-of-data word are similarly programmed according to the pattern structure defined in 802.3ae

3.125 Gb/s outputs would output every fourth bit

Page 38

Deskew Pattern (continued)Deskew Pattern (continued)

• Alternate de-skew pattern is run once before the main data pattern

• Both de-skew and main data alternate patterns must be of equal length

• Follow pattern structure rules and fill the end of de-skew pattern out with data characters -not more special control characters

• The characters chosen must end with negative disparity because rules require data to start with negative disparity

Page 39

81250 ParBERT Sequence Editor81250 ParBERT Sequence Editor

• Select appropriate pre-defined test patterns

Page 40

Post-processing with ParBERT Post-processing with ParBERT

• Data used from Ethernet Frame Editor

• XAUI and Serial Analysis

Results:# of frames# of CRC Errors# of Frame Bits# of Idle BitsErrors per LaneError Rate per Lane

Page 41

SummarySummary

• 10 GbE Specifications require new test procedures

• 10 GbE Measurement Resources & Solutions• www.agilent.com/find/10ge

• Specific Product Information:• www.agilent.com/comms/jitter• www.agilent.com/comms/71612c• www.agilent.com/find/parbert• www.agilent.com/comms/routertester

Page 42

Additional InformationAdditional Information

Page 43

Clock Multiplication and DivisionClock Multiplication and Division

• 81250 ParBERT can change an external clock input frequency by ratio m/n; m and n = 1- 255

• XENPAK internal clock 3.125GHz +/-100ppm,1 Hz resolution (RefClk)

• XAUI/RefClk: m/n = 20

• Serial/RefClk: m/n = 66

• Serial/XAUI: m/n = 33/10

Page 44

XAUI BER using CDRXAUI BER using CDR

XENPAKDUT

10Gb/s Tx

10Gb/s Rx

XAUI-out

86100B DCA(optional)

Electrical

Optical

XAUI-in

83434A O/E

Clock Input Data Input

81250 ParBERT Color Key to Modules

• Firewire interface• E4808A Clock Module• E4866A 10.8Gb/s• E4861/62B 3.35Gb/s

Page 45

10Gb/s BER using XENPAK Clock Input10Gb/s BER using XENPAK Clock Input

XENPAK DUT

10Gb/s Tx

10Gb/s Rx

Referenceclock in

156.25 MHz

10MHz ReferenceE8241A RF Source

86100B DCA(optional)Optical

2.5 GHz/16

10.3125 GHz

clock

71612C Pattern Generator 70843C Error Detector

83433A E/O

83434A O/EClock Input Data Input

Internal

loop-back

Page 46

10Gb/s BER using XENPAK Clock Input 10Gb/s BER using XENPAK Clock Input

XENPAK DUT

10Gb/s Tx

10Gb/s Rx

Referenceclock in

156.25MHz

86100B DCA(optional)Optical

83433A E/O

83434A O/E

Clock Input Data Input

Internal

loop-back

81250 ParBERT Color Key to Modules

• Firewire interface• E4808A Clock Module• E4866A 10.8Gb/s• E4861/62B 3.35Gb/s

Page 47

10Gb/s BER using CDR10Gb/s BER using CDR

XENPAK DUT

10Gb/s Tx

10Gb/s Rx

86100B DCA(optional)Optical

83433A E/O

83434A O/E

Clock Input Data Input

Internal

loop-back

1 2 3 Patterns A & B0

E486

7A 1

0.8G

Par

BERT

E480

8A C

lock

Mod

ule

Fire

wire

inte

rfac

e

E480

8A C

lock

Mod

ule

E486

1/63

B 3.

35Gb

Par

BERT

E486

1/63

B 3.

35Gb

Par

BERT

E486

6A 1

0.8G

Par

BERT

E480

8A C

lock

Mod

ule

E480

8A C

lock

Mod

ule

E486

1/62

B 3.

35Gb

Par

BERT

E486

1/62

B 3.

35Gb

Par

BERT

81250 ParBERT