x ray diffraction

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X Ray Diffraction Lectures 6-8

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X Ray Diffraction

Lectures 6-8

Bragg Diffraction

Miller Indices

These figures from:http://en.wikipedia.org/wiki/Miller_indexLook up the site and also read this topicFrom a book for better understanding

Diffraction

Silicon

Cu

passivation

diffusionbarrier

Data: Baker, Kretschmann, Arzt, Acta Mat. 49, 2145 (2001)

-200

-100

0

100

200

300

400

500

0 80 160 240 320 400 480 560 640

Passivated 1.0 µm Cu Film(111) grains(100) grains

Stre

ss (M

Pa)

Temperature (oC)

Stress (MPa)

XRD v/s curvature measurements

Kraft and Nix, J. Appl. Phys., 83 (6), March 1998, p 3035

Welzel et al., J. Appl. Cryst., 38, 2005, p 1-29

http://www.doitpoms.ac.uk/tlplib/fibre_composites/lamina_loading.php?printable=1

X Ray strain measurement (Isotropic)

X Ray strain measurement

Psi angles for <422> family of planesIn (111) oriented film

Cornella et al. Appl. Phys. Lett.71(20), November 1997, p 2949

Kraft and Nix, J. Appl. Phys.,83 (6), March 1998, p 3035

Grazing Incidence X-Ray Scattering

Penetration of x-raysinto the sample is astrong function ofIncidence angle

From: http://ssrl.slac.stanford.edu/materialscatter/scatter-grazing.html

Grazing Incidence X-Ray Scattering

GIXS measurement (Al film)critical angle = 0.2 degrees

Doerner and Brennan Journal of Applied Physics, 63 p 126 (1988)

PURE AL, 8700 eV

By varying the incident angle, φ, it is possible to sample different depths into thefilm. Thus we can measure the strains at various depths with this technique.

GIXS