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Abstract Booklet
Workshop on Ultrafast Electron Sources for Diffraction and Microscopy Applications
December 12-14, 2012
University of California, Los Angeles
Workshop on Ultrafast Electron Sources for Diffraction and Microscopy Applications December 12-14, 2012
1
Recent years have witnessed tremendous progress in our understanding of the ultrafast and ultrasmall world thanks to the development of ultrafast optical lasers and the advent of X-ray Free Electron Laser (XFEL). Other approaches that utilize electrons as a probe have been demonstrating in smaller scale setups capabilities complementary to X-ray based techniques. Electron based techniques enjoy many unique advantages, such as large interaction cross-section, compact size and cost effectiveness. The development of high-brightness electron sources directly led to the success of XFEL; and at the same time, such high-brightness sources have opened the door to the direct investigation of the physical, chemical and biological dynamics processes with atomic spatial and temporal resolution by Ultrafast Electron Diffraction and Microscopy.
The near term future promises further exciting developments as many schemes have been recently proposed and experimentally demonstrated to improve temporal resolution in electron-based material studies. These include raising the energy to MeV levels, RF and magnetic bunch compression, laser-plasma electron sources, and RF streak diffraction mode. In transmission electron microscopy, the introduction of aberration and chromatic corrections has allowed TEMs to achieve unsurpassed spatial resolution. The addition of ultrafast temporal resolution is the next frontier in electron microscopy.
In this framework we would like to hold a workshop at UCLA, and invite all groups involved in ultrafast electron sources to help our growing community define what are the limitations and the potentials opened by such novel techniques. The workshop objectives are to inform the broad scientific communities – accelerator, electron scattering and ultrafast science, the latest development in ultrafast electron sources, and to identify critical technologies and high impact scientific opportunities. The issues we would like to address at the workshop: which of the beam characteristics need to be further improved? What processes or material studies will take most advantage from the unique properties of the source? What are the limits (and the requirements) in temporal resolution?
The connections with the conventional ultrafast structural dynamics investigation tools like conventional ultrafast electron diffraction, transmission electron microscopes as well as the complementarities with the x-ray diffraction and imaging communities will be also explored.
Topics include: Beam sources for Ultrafast Electron Diffraction. RF guns, laser-plasma based injectors,
DC photoguns. Compression methods: Magnetic, RF structures. Timing. Synchronization. Jitter control. Samples. Liquid, gas and solid phases. Electron Damage.
Workshop on Ultrafast Electron Sources for Diffraction and Microscopy Applications December 12-14, 2012
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Detectors and Diagnostics. Strong electron lenses. Imaging mode. Electron Microscopy. Scientific opportunities.
Organizing Committee: P. Musumeci (UCLA), X. J. Wang (BNL), R. K. Li (UCLA) Science Advisory Committee: J. Rosenzweig (UCLA), J. Spence (ASU), A. Zewail (Caltech), J. Zhang (Shanghai JiaoTong University), Y. Zhu (BNL) Program Committee: P. Baum (LMU), J. Cao (FSU), F. Carbone (EPFL), M. Chen (Tohoku University), R. Falcone (UC Berkeley), J. Hastings (SLAC), H. Ihee (KAIST), J. Luiten (TU/e), B. Reed (LLNL), B. Siwick (McGill University), C.X. Tang (Tsinghua University)
Workshop on Ultrafast Electron Sources for Diffraction and Microscopy Applications December 12-14, 2012
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THANK YOU TO OUR SPONSORS
visit us at www.radiabeam.com or email us at [email protected] for more information
magnets· diagnostics· rf structures
turnkey accelerator systems
research and development
RadiaBeam Technologies provides beam diagnostics, RF structures, magnets and other components to the accelerator community in standard and custom con�gurations. Our range of products includes:
• RF structures, including linacs, bunchers and deflectors in S, L and X-band• RF photoinjectors, cathodes and emittance compensation solenoids• Profile monitors, pepper pots, slits halo scrapers and wire scanners• Michelson and spatial interferometers for bunch length measurements• Adjustable permanent magnet final focus systems• Air- and water-cooled solenoids, spectrometers, quadrupoles and
steerers
RadiaBeam also has an active research program in collaboration with National Labs and universities. Current topics of interest include:
• Novel acceleration techniques• Ultrashort period, high temperature insertion devices• High resolution diagnostics• Novel cathode materials and methods• Industrial, security and medical applications of accelerators
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Power (0.28% rms)
Workshop on Ultrafast Electron Sources for Diffraction and Microscopy Applications December 12-14, 2012
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Wednesday, Dec. 12th 2012 8:00-9:00 Registration and Breakfast 9:00-9:10 Opening 9:10-9:40 Scientific Opportunities with Ultrafast Electron Diffraction and Microscopy
J. Cao (Florida State Univ.) 9:40-10:10 State of Art of Electron Microscopy and Future challenges
L. Fitting Kourkoutis (Cornell Univ.) 10:10-10:40 Coffee break 10:40-11:05 Femtosecond electron diffraction: heralding the era of atomically-resolved
dynamics G. Sciaini (DESY and Univ. of Hamburg)
11:05-11:30 MeV UED and Its Applications for Correlated Material Studies P. Zhu (BNL and Shanghai Jiaotong Univ.)
11:30-11:55 REGAE: RF photoinjector based UED at DESY S. Manz (DESY)
11:55-12:10 Lattice response to femtosecond laser excitation of Nickel studied by time resolved transmission electron diffraction C. Streubühr (Univ. of Duisburg-Essen)
12:10-12:25 Snapshot imaging of Electron Pulse Dynamics for High-Brightness Ultrafast Diffraction and Microscopy Z. Tao (Michigan State Univ.)
12:25-13:30 Lunch 13:30-13:55 Movie Mode Dynamic Transmission Electron Microscopy
B. Reed (LLNL) 13:55-14:20 Granularity effects in high-brightness electron beams
B. van der Geer (TU/e/Pulsar Physics) 14:20-14:45 Four-dimensional electron tomography
O.-H. Kwon (Caltech) 14:45-15:00 Proposed Addition of Ultra-fast Imaging Capabilities to Sandia’s In-situ Ion
Irradiation TEM K. Hattar (Sandia National Laboratory)
15:00-15:20 Discussion: Beam requirements for ultrafast microscopy applications 15:20-15:40 Coffee break 15:40-17:30 Poster session, wine reception, and Pegasus Lab tour 17:30 Dinner on your own
Workshop on Ultrafast Electron Sources for Diffraction and Microscopy Applications December 12-14, 2012
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Thursday, Dec. 13th 2012
8:00-9:00 Breakfast 9:00-9:25 MeV electron diffraction and microscopy in Osaka University
J. Yang (Osaka Univ.) 9:25-9:50 Ultrafast electron diffraction with radio-frequency compressed electron
pulses B. J. Siwick (McGill Univ.)
9:50-10:05 Plans of UED experiments at the X-Band Test Area C. Limborg-Deprey (SLAC)
10:05-10:20 Ultrafast diffraction with single electrons F. Kirchner (LMU)
10:20-10:40 Discussion: Comparison between compressed DC and RF guns 10:40-11:00 Coffee break 11:00-11:25 Sub-fs-precision, ultrafast laser-based optical and microwave timing and
synchronization J. Kim (KAIST)
11:25-11:50 Femtosecond synchronization of lasers and electron beams J. Byrd (LBNL)
11:50-12:05 Radiofrequency phase space manipulation of ultrashort electron beams J. Luiten (TU/e)
12:05-12:20 Innovative Low-Energy Ultra-Fast Electron Diffraction (UED) System L. Faillace (RadiaBeam Technologies)
12:20-12:30 Discussion: Limits in timing and temporal resolution 12:30-13:30 Lunch 13:30-13:55 Ultrafast ultracold electron bunches and space-charge effects in cold ion
bunches R. Scholten (Univ. of Melbourne)
13:55-14:20 Ultrashort electron beams from laser gated tips P. Hommelhoff (Univ. of Erlangen and MPQ)
14:20-14:35 Application of laser-triggered nanometer-sized electron sources in ultrafast low-energy electron diffraction and ultrafast transmission electron microscopy S. Schäfer (Univ. of Göttingen)
14:35-14:50 Field Emission and Channeling Radiation for High-Spectral-Brilliance X-Ray Sources
Workshop on Ultrafast Electron Sources for Diffraction and Microscopy Applications December 12-14, 2012
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C. Brau (Vanderbilt Univ.) 14:50-15:10 Discussion: Where advanced sources can help? Ultimate limit in brightness. 15:10-15:30 Coffee break 15:30-15:55 Ultrafast electron sources based on plasmas produced by intense
femtosecond laser pulses S. Sakabe (Kyoto Univ.)
15:55-16:20 Toward a high quality electron source from a laser wakefield accelerator for electron diffraction J. Faure (LOA)
16:20-16:35 Ultrashort electron source from laser-plasma interaction J. Liu (SIOFM, CAS)
16:35-16:50 Concept for femtosecond point-projection imaging of nanostructures with coherent low-energy electron pulses M. Müller (Fritz-Haber-Institut)
16:50-17:05 m*: A route to ultra-bright photocathodes A. Schroeder (Univ. of Illinois at Chicago)
17:05-17:25 Discussion: Where advanced sources can help? Ultimate limit in brightness. 18:00 Banquet at the UCLA Faculty Center
Friday, Dec. 14th 2012
8:00-9:00 Registration and Breakfast
9:00-9:25 Ultrafast Gas Electron Diffraction M. Centurion (Univ. of Nebraska-Lincoln)
9:25-9:50 Liquid Jets for Ultrafast Diffraction Experiments U. Weierstall (Arizona State Univ.)
9:50-10:05 Designing in-situ experiments in gas and liquid environments for the DTEM P. Abellan (PNNL)
10:05-10:20 Time-resolved gas electron diffraction - building a new apparatus in Edinburgh D. Wann (Univ. of Edinburgh)
10:20-10:40 Coffee break 10:40-11:05 Photoelectron Pulse Properties from Free-Free Transitions in Ultrafast
Transmission Electron Microscopy D. Flannigan (Univ. of Minnesota)
11:05-11:30 Near Field 4D Electron Microscopy S. T. Park (Caltech)
Workshop on Ultrafast Electron Sources for Diffraction and Microscopy Applications December 12-14, 2012
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11:30-11:45 Ultrafast Processes on Surfaces Studied by Time-Resolved Reflection High Energy Electron Diffraction T. Frigge (Univ. of Duisburg-Essen)
11:45-12:00 Determination of Directional Atomic Displacement from Femtosecond Laser Excited Bismuth in Time Resolved Electron Diffraction P. Zhou (Univ. of Duisburg-Essen)
12:00-12:30 Applications of ultrafast electron diffraction C. Y. Ruan (Michigan State Univ.)
12:30 Closing of the Workshop 13:30 Pegasus Lab tour
Poster Session
1. A High Repetition rate-high brightness electron source for Time-Resolved electron diffraction and microscopy D. Filippetto, F. Sannibale, M. Zolotorev (Lawrence Berkeley National Laboratory)
2. Collimated Quasi-monoenergetic Electron Emission at locked phases from the Laser-Driven Surface Plasma Wave Y. Tian (Shanghai Institute of Optics and Fine Mechanics, Chinese Academy of Sciences)
3. Complex Acoustic Waves in Graphite Observed by Convergent-Beam Ultrafast Electron Crystallography W. Liang (Cal Tech)
4. Continuous MeV Electron Diffraction using a Flat Electron Beam F. Fu, R. Li, X. Wang and D. Xiang (Shanghai Jiao Tong University, SLAC National Accelerator Laboratory, UCLA, Brookhaven National Laboratory)
5. Controlled molecules for time-resolved electron Diffraction Experiments N. Mueller (Center for Free-Electron Laser Science, DESY and University of Hamburg)
6. Design and Implementation of a Flexible Beamline for FS Electron Diffraction Experiments G. Mancini (LUMES – EPFL)
7. Development of High Brightness Electron Source Laboratory at Fermilab
Workshop on Ultrafast Electron Sources for Diffraction and Microscopy Applications December 12-14, 2012
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H. Panuganti (Northern Illinois University)
8. Development of Hybrid Gun for the High Brightness Beam Generation A. Fukasawa, S. K. Mahapatra, H. To, B. Baumgartner, J. B. Rosenzweig, P. Musumeci, R. Li, UCLA, CA, USA David Alesini, Luca Ficcadenti, Bruno Spataro, INFN/LNF, Frascati, Italy A. Valloni, Luigi Palumbo, Rome University La Sapienza, Rome, Italy
9. Dispersion Compensation for Attosecond Electron Pulses M. Centurion (University of Nebraska – Lincoln)
10. High Brightness Sub-picosecond Electron Pulse Generation J. Li (East China Normal University, State Key Laboratory of Precision Spectroscopy)
11. Multi-Objective Molecular Dynamics Simulations with the GPT Code B. van der Geer (Pulsar Physics)
12. Time Resolved Electron Diffraction on Nanomaterials P. Zhou (Faculty of Physics, University of Duisburg-Essen)
13. Ultracold and Ultrafast Electrons Diffracted from Graphene E. Vredenbregt (Eindhoven University of Technology)
14. Ultrafast Time Resolved Surface Sensitive Electron Diffraction with Tilted Pump Pulse Fronts C. Streubühr (Faculty of Physics, University of Duisburg-Essen)
Workshop on Ultrafast Electron Sources for Diffraction and Microscopy Applications December 12-14, 2012
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Scientific Opportunities with Ultrafast Electron Diffraction and Microscopy
Presenter: J. Cao (Florida State Univ.)
In the past ten years, we have witnessed rapid advancement of ultrafast electron
diffraction and microscopy. In many cases, these techniques have demonstrated
the unprecedented capability of directly probing the dynamical processes at the
relevant atomic time and length scales, thus providing new scientific
opportunities in the fields of biology, chemistry, physics, and materials science.
This talk will highlight some of these recent development and applications as well
as some future perspectives.
Workshop on Ultrafast Electron Sources for Diffraction and Microscopy Applications December 12-14, 2012
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State of Art of Electron Microscopy and Future challenges
Presenter: L. Fitting Kourkoutis (Cornell University)
L. Fitting Kourkoutis, J. A. Mundy, D. A. Muller*
School of Applied and Engineering Physics, Cornell University, Ithaca, NY 14853
*Kavli Institute at Cornell for Nanoscale Science
Atomic-resolution spectroscopic imaging in state-of-the-art electron microscopes is now capable of unraveling bonding details at buried interfaces and clusters, providing both physical and electronic structure information [1]. The thousand-fold increase in electron energy loss spectroscopy (EELS) mapping speeds over conventional microscopes allows us to collect data from millions of spectra. In complex electronic materials interfaces and defects can dramatically change the macroscopic properties of the system. Using spectroscopic imaging microscopic inhomogeneities, atomic-scale interdiffusion and bonding changes can now readily be characterized and correlated with the macroscopic properties of the structure [2]. [1] D. A. Muller, L. F. Kourkoutis, M. Murfitt, J. H. Song, H. Y. Hwang, J. Silcox, N. Dellby, O. L. Krivanek, Science 319, 1073 (2008). [2] L. F. Kourkoutis, J. H. Song, H. Y. Hwang, D. A. Muller, Proc. Natl. Acad. Sci. 107, 11682 (2010).
Workshop on Ultrafast Electron Sources for Diffraction and Microscopy Applications December 12-14, 2012
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Femtosecond Electron Diffraction: Heralding the Era of Atomically-Resolved Dynamics
Presenter: G. Sciaini (DESY and University of Hamburg)
One of the great dream experiments in Science is to directly observe atomic
motions as they occur. Femtosecond electron diffraction provided the first ‘light’
of sufficient intensity to achieve this goal by attaining atomic resolution to
structural changes on the relevant timescales. During my talk I will cover the
technical progress that made this new level of acuity possible and give a survey of
the new insights gained from an atomic level perspective of structural dynamics1.
Thermally and purely electronically driven atomic displacements are going to be
discussed as well as phenomena involving strongly correlated charge density
wave systems. I will finalize my talk showing recent results obtained for an
organic crystal composed by light scattering centers. Here, we implemented a
recently developed ultra-bright femtosecond electron source to obtain an
atomically-resolved map of the relevant molecular motions driving the photo-
induced insulator-to-metal phase transition in the organic charge-transfer salt
(EDO-TTF)2PF6. This study is the first in its kind and illustrates the potential of
ultra-bright femtosecond electron sources to provide new insights into complex
dynamical phenomena relevant to chemistry and biology.
Workshop on Ultrafast Electron Sources for Diffraction and Microscopy Applications December 12-14, 2012
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MeV UED and Its Applications for Correlated Material Studies
Presenter: P. Zhu (BNL and Shanghai Jiaotong University)
MeV electron diffraction with a 100-fs time resolution and 5-fC single-shot-
imaging sensitivity has been experimentally demonstrated. The MeV-UED has
been successfully employed to study ultrafast melting of charge-density-wave in
TaSe2 and orbit-order dynamics in La.5Sr1.5MnO4.
Workshop on Ultrafast Electron Sources for Diffraction and Microscopy Applications December 12-14, 2012
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REGAE: RF Photoinjector Based UED at DESY
Presenter: S. Manz (DESY)
S. Manz1, D. Zhang1, A. Casandruc1, J. Hirscht1, S. Bayesteh3, S. Keskin1, M. Felber2, J. Nicholls4, F. Mayet3, M. Hachmann3, T. Gehrke3, S. Jangam1, A. Marx1, S. Hayes1,
K. Pichugin1, H. Delsim-Hashemi2, H. Schlarb2, M. Hoffmann2, M. Huening2, G. Moriena4, G. Sciaini1, M. Hada1, K. Floettmann2, R. J. Dwayne Miller1, 4
1 Max Planck Research Department for Structural Dynamics, University of Hamburg, CFEL, Luruper Chaussee 149, 22761 Hamburg, Germany
2 DESY Hamburg, Notkestrasse 85, 22607 Hamburg, Germany
3 Institute of Experimental Physics, CFEL, Luruper Chaussee 149, 22761 Hamburg, Germany
4 Departments of Chemistry and Physics, University of Toronto, Toronto, Ontario M5S 3H6, Canada
The relativistic electron gun for atomic exploration (REGAE) has been designed to
study structure and dynamics in a wide range of systems. Aiming for a time
resolution of far less than 100 fs, we plan to observe fast structural changes in
solid, solution and gas phase with single-shot femtosecond electron diffraction in
the energy range from 2 – 5 MeV. The presentation will describe the
experimental setup and report on the current status of static electron diffraction.
The feasibility of performing real space imaging with REGAE will be discussed as
well.
Workshop on Ultrafast Electron Sources for Diffraction and Microscopy Applications December 12-14, 2012
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Lattice Response to Femtosecond Laser Excitation of Nickel Studied By Time Resolved Transmission Electron Diffraction
Presenter: C. Streubühr (Univ. of Duisburg-Essen)
Ferromagnetic Nickel is widely studied in ultrafast magnetism, and direct
information on the femtosecond lattice dynamics is required. Here will present an
ultrafast transmission electron diffraction study of the lattice response of thin
free-standing Nickel single-crystalline films. The time-dependent diffraction
intensities were analyzed and are found to be inconsistent with simple lattice
heating. This yet unaccounted disagreement between the experimental results
and an explanation in terms of simple lattice heating will be shown.
Workshop on Ultrafast Electron Sources for Diffraction and Microscopy Applications December 12-14, 2012
17
Snapshot imaging of Electron Pulse Dynamics for High-Brightness Ultrafast Diffraction and Microscopy
Presenter: Z. Tao (Michigan State Univ.)
We present the methods and results employing the shadow projection imaging
technique to directly interrogate the space charge effects of the ultrashort,
intense photoelectron pulses shortly after photoemission and during the free-
space expansion in a dc photo-gun geometry. Combined with analytical Gaussian
model and ab initio three-step photoemission model with fast multipole method,
we elucidate several essential space-charge-led features. The agreements
between theoretical models and experimental results enable us to understand
the non-linear effects in space charge dynamics and evaluate its impacts on the
performance of the next generation high-brightness ultrafast electron diffraction
and imaging systems.
Workshop on Ultrafast Electron Sources for Diffraction and Microscopy Applications December 12-14, 2012
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Movie Mode Dynamic Transmission Electron Microscopy
Presenter: B. Reed (LLNL)
The dynamic transmission electron microscope (DTEM) combines pulsed lasers
with a modified TEM column to capture the details of fast, irreversible processes
in materials. Specifically, the DTEM is designed to capture a complete real-space
image in a single nanosecond-scale exposure. This has revealed previously
invisible details of phase transformations, microstructural evolution, and solid-
state chemical reactions. A recent upgrade the LLNL DTEM yielded a new "movie
mode" capability, which captures 9 independent real-space images or diffraction
patterns in the space of a few microseconds, thus enabling an entirely new class
of experiments including the quantification of individual nucleation and growth
events.
Workshop on Ultrafast Electron Sources for Diffraction and Microscopy Applications December 12-14, 2012
19
Granularity effects in high-brightness electron beams
Presenter: B. van der Geer (TU/e/Pulsar Physics)
Electron sources based on laser-cooling and trapping techniques are a relatively
new reality in the field of charge particle accelerators. The dynamics of these
sources are governed by stochastic effects, and not by the usually dominant
space-charge forces. As the high-brightness field moves towards increasingly
higher brightness, these stochastic effects will play an increasingly important role.
In this presentation I will discuss the physics of these granularity effects and show
their effect using molecular dynamics simulations with the GPT code where we
track each and every particle in realistic fields and including all pair-wise
interactions.
Workshop on Ultrafast Electron Sources for Diffraction and Microscopy Applications December 12-14, 2012
20
Four-dimensional electron tomography
Presenter: O.-H. Kwon (Caltech)
Electron tomography provides three-dimensional (3D) imaging of equilibrium
structures of materials and biological specimens. Here, we present the
development of 4D electron tomography by integrating the fourth dimension
(time resolution) with the 3D spatial resolution obtained from a tilt-series of 2D
projections of an object. The methodology utilizes the ultimate spatiotemporal
resolution of ultrafast electron microscopy, in which femtosecond electron pulses
are chirped [1]. A series of time-framed tomograms constitute a movie, thus,
enabling the studies of transient structures, as demonstrated with carbon
nanotubes of various modes of vibration [2]. Also presented is stereographic
imaging, in analogy to 4D electron tomography, for a nanostructure in
complicated motion [3]. References [1] S. T. Park, O.-H. Kwon, A. H. Zewail, New J.
Phys. 14, 053046 (2012).[2] O.-H. Kwon, A. H. Zewail, Science 328, 1668 (2010).[3]
O.-H. Kwon, H. S. Park, J. S. Baskin, A. H. Zewail, Nano Lett. 10, 3190 (2010).
Workshop on Ultrafast Electron Sources for Diffraction and Microscopy Applications December 12-14, 2012
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Proposed Addition of Ultra-fast Imaging Capabilities to Sandia’s In-situ Ion Irradiation TEM
Presenter: K. Hattar (Sandia National Laboratory)
Understanding the nucleation and interactions of various radiation defect
structures is essential to predicting the performance of systems ranging from
satellites to nuclear power plants. Sandia National Laboratories’ Ion beam Lab has
recently developed an in situ ion irradiation transmission electron microscope
that permits real time observation of these interactions. In addition to the
nanoscale resolution permitted by the TEM, a sub-microsecond temporal
resolution is needed to capture the intermediate structures. These intermediate
structures are essential in identifying the active mechanisms present. The
feasibility of such an addition to the current system is currently under research.
Workshop on Ultrafast Electron Sources for Diffraction and Microscopy Applications December 12-14, 2012
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MeV Electron Diffraction and Microscopy in Osaka University
Presenter: J. Yang (Osaka Univ.)
The visualization of fundamental dynamic processes in matter occurring on
femtosecond time scales has attracted much attention in chemistry, material
science and biology. Ultrafast electron diffraction and microscopy (UED and UEM)
provide a real-time observation of structural dynamics in matter by recording the
change in the characteristics of electron diffractions or images in the pump state
and the unpump state. We have developed both a relativistic-energy UED and a
prototype of relativistic-energy UEM using a femtosecond photocathode RF gun.
In this paper, we will report the results of the femtosecond electron bunch
generation in the RF gun, the ultrafast electron diffractions and the first
experiments of relativistic-energy electron imaging.
Workshop on Ultrafast Electron Sources for Diffraction and Microscopy Applications December 12-14, 2012
23
Ultrafast Electron Diffraction with Radio-Frequency Compressed Electron Pulses
Presenter: B. J. Siwick (McGill Univ.)
In this talk I will give an overview of ultrafast electron diffraction (UED) using
radio-frequency (RF) compressed electron pulses in the 100keV energy range.
The concepts involved in recompressing femtosecond laser produced electron
bunches with RF cavities will be discussed along with their practical
implementation at McGill University. Novel methods to characterize the
temporal impulse response function in pump-probe geometry using laser fields
and streak cameras will also be described. At pC bunch charges time resolution in
this instrument is ~350 fs FWHM, currently limited by RF/laser synchronization
jitter not the recompressed electron pulse duration which we estimate to be 150
+/- 50 fs FWHM. The instrument performance in UED experiments will be
demonstrated through two examples involving photo-induced structural
dynamics in materials.
Workshop on Ultrafast Electron Sources for Diffraction and Microscopy Applications December 12-14, 2012
24
UED Experiments at the X-Band Test Area
Presenter: C. Limborg-Deprey (SLAC)
The XTA is a photoinjector equipped exclusively with X-Band RF accelerator
components, a 5.5 cell gun, a linac and a transverse deflector. Early next year, the
XTA will be modified with minor changes to run UED experiments. A first
experiment will utilize ~ps long electron pulses streaked with the transverse
deflector. The second experiment will utilize ~10 fs electron pulses out of an RF
compressor. Simulations indicate that 3MeV, kA, 10fs rms, 0.2 mrad e-bunches
could be used. The first experiment will give a reference in view of solving the
challenging issue of synchronization/pulse identification met in single shot
experiments.
Workshop on Ultrafast Electron Sources for Diffraction and Microscopy Applications December 12-14, 2012
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Ultrafast Diffraction with Single Electrons
Presenter: F. Kirchner (LMU)
We report on the generation of single-electron pulses for advancing ultrafast
diffraction to the time scale of electronic motion. Tailored excitation of metallic
photocathodes produces single-electron pulses with a minimized dispersion and
divergence. A microwave cavity can be used to further compress the wave
packets in time. ‘Isochronic’ magnetic lenses avoid the temporal distortions
introduced by the imaging system. The transverse coherence of the pulses
exceeds 20 nm, sufficient to cover biomolecular systems. We discuss the
perspectives and possibilities that these advancements may bring about.
Workshop on Ultrafast Electron Sources for Diffraction and Microscopy Applications December 12-14, 2012
26
Sub-fs-precision, Ultrafast Laser-Based Optical and Microwave Timing and Synchronization
Presenter: J. Kim (KAIST)
I will introduce the most recent progress in subfemtosecond-precision optical and
microwave timing and synchronization based on ultrafast fiber lasers. The topics
will be (a) the optimization of timing jitter in ultrafast fiber lasers to the sub-fs
regime, (b) the extraction of microwave signals from ultrafast fiber lasers with
sub-fs jitter and stability, (c) long-distance synchronization of remote ultrafast
lasers and microwave sources with sub-10-fs drift maintained more than a week.
The combination of these techniques will culminate in a modular, flexible, sub-fs-
precision timing system for various types of local and remote ultrafast pump-
probe experiments.
Workshop on Ultrafast Electron Sources for Diffraction and Microscopy Applications December 12-14, 2012
27
Femtosecond Synchronization of Lasers and Electron Beams
Presenter: J. Byrd (LBNL)
I will describe the development of femtosecond synchronization of electron
beams and ultrafast lasers at the fsec level and the its application to accelerators,
particularly linac-driven free electron lasers. I will then describe how these
techniques might be applied to smaller facilities for ultrafast electron diffraction.
Workshop on Ultrafast Electron Sources for Diffraction and Microscopy Applications December 12-14, 2012
28
Radiofrequency Phase Space Manipulation of Ultrashort Electron Beams
Presenter: J. Luiten (TU/e)
The development of ultrafast time-dependent electron optics is required to fully
exploit the potential of ultrashort high-brightness electron beams. We are
investigating various ways to manipulate the 6D phase space distribution of
pulsed electron beams with resonant radiofrequency cavities. Besides bunch
compression, TM-010 cavities may be employed to reduce energy spread and as
time-dependent lenses, allowing correction of spherical aberrations. Deflecting
TM-110 cavities are usually applied for bunch length diagnostics, but may also
serve as fast beam choppers, enabling significant improvements of UEM in
stroboscopic mode. Time-of-flight femtosecond EELS may be realized by the
combination of TM-110 and TM-010 cavities.
Workshop on Ultrafast Electron Sources for Diffraction and Microscopy Applications December 12-14, 2012
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Innovative Low-Energy Ultra-Fast Electron Diffraction (UED) System
Presenter: L. Faillace (RadiaBeam Technologies)
RadiaBeam, in collaboration with UCLA, is developing an innovative, inexpensive,
low-energy ultra-fast electron diffraction (UED) system which allows us to
reconstruct a single ultrafast event with a single pulse of electrons. Time resolved
measurement of atomic motion is one of the frontiers of modern science, and
advancements in this area will greatly improve our understanding of the basic
processes in materials science, chemistry and biology. The high-frequency (GHz),
high voltage, phase-locked RF field in the deflector allows temporal resolution as
fine as sub-100 fs.
Workshop on Ultrafast Electron Sources for Diffraction and Microscopy Applications December 12-14, 2012
30
Ultrafast Ultracold Electron Bunches and Space-Charge Effects in Cold Ion Bunches
Presenter: R. Scholten (Univ. of Melbourne)
Cold atom electron and ion sources based on photoionisation of laser-cooled
atoms offer interesting opportunities for diffractive imaging with high transverse
coherence, and investigation of self-field effects. We have demonstrated that
femtosecond excitation can produce electron bunches that are colder than might
be expected given the time-bandwidth limit of the excitation pulses. In separate
work, we have found unusual structures forming during the propagation of ion
bunches that are initially spherically symmetrical. I will describe our results and
models for these phenomena.
Workshop on Ultrafast Electron Sources for Diffraction and Microscopy Applications December 12-14, 2012
31
Ultrashort Electron Beams from Laser Gated Tips
Presenter: P. Hommelhoff (Univ. of Erlangen and MPQ)
We will report on a tip based electron source that is optimized to maintain short
electron pulse duration and low emittance. The source is based on a nanometer
sharp tungsten needle tip in 310-orientation on which we focus femtosecond
laser pulses, in combination with a two-anode structure that allows us to
accelerate low charge electron pulses fast to 30 keV. This way, the unavoidable
energy-width-to-timing jitter is minimized. We estimate an electron timing jitter
(pulse duration) of less than 30fs at a target, possibly down to 10fs, and will
present first experimental results.
Workshop on Ultrafast Electron Sources for Diffraction and Microscopy Applications December 12-14, 2012
32
Application of Laser-Triggered Nanometer-Sized Electron Sources in Ultrafast Low-Energy Electron Diffraction and
Ultrafast Transmission Electron Microscopy
Presenter: S. Schäfer (Univ. of Göttingen)
Photoelectron emission from sharp metal tips has received great attention in
recent years. Compared to the widely utilized flat photocathodes, tip-based
photoemitters have potential benefits due to their nanometer-sized emission
area and their large static field-enhancement at the tip apex. Here, we discuss
design considerations for the application of tip-based photoemitters in UTEM and
ULEED. Special emphasis is placed on the quantitative analysis of effective source
dimensions, brightness, coherence and temporal pulse broadening. Numerical
trajectory simulations are compared to experimental results for a laser-triggered
low-energy electron source with picosecond temporal pulse width and a high-
brightness UTEM source.
Workshop on Ultrafast Electron Sources for Diffraction and Microscopy Applications December 12-14, 2012
33
Field Emission and Channeling Radiation for High-Spectral-Brilliance X-Ray Sources
Presenter: C. Brau (Vanderbilt University)
For 30-MeV electrons incident on a diamond crystal, channeling X-rays appear
near 56 keV. High spectral brilliance requires a small focal spot at the crystal. The
emittance from a gated field-emitter cathode is 4 nm, which can be focused to a
40-nm spot at 30 MeV. Simulations indicate that emittance growth is small. In
the coming months, we will test the cathodes in an rf gun at Niowave. Next year,
we will begin X-ray experiments using the 4.5-MeV A0 injector at Fermilab,
followed by experiments at the 40-MeV ASTA accelerator.
Workshop on Ultrafast Electron Sources for Diffraction and Microscopy Applications December 12-14, 2012
34
Ultrafast Electron Sources Based on Plasmas Produced by Intense Femtosecond Laser Pulses
Presenter: S. Sakabe (Kyoto Univ.)
Using electron pulses accelerated by intense femtosecond laser pulses and
compressed by a static phase rotator, single-shot ultrafast electron diffraction has
been demonstrated. The electron pulses of several hundreds keV are generated
by irradiating tightly focused terawatt femtosecond laser pulses on a polyethylene
foil target, and the pulses are compressed by using an achromatic bending
magnet system. The pulse duration of the electron pulse beam has been
measured by detecting the electrons scattered by intense femtosecond laser
pulses in a direction perpendicular to the electron beam. These femtosecond
electron pulses could have an intensity to take a single-shot diffraction pattern.
Workshop on Ultrafast Electron Sources for Diffraction and Microscopy Applications December 12-14, 2012
35
Toward a High Quality Electron Source from a Laser Wakefield Accelerator for Electron Diffraction
Presenter: J. Faure (LOA)
In this talk, we will review the principles and performances of laser wakefield
accelerators, and focus in particular on their possibility of producing femtosecond
relativistic electron bunches [1]. Femtosecond electron bunches with 100 MeV
energy and few percent energy spread are now commonly produced in laser
wakefield accelerators [2,3]. However, for ultrafast electron diffraction
applications, lower energies in the MeV range are desirable. We will show how
laser wakefield accelerators can be scaled down to MeV energy levels using a
laser system with millijoule energy and kHz repetition rate [4]. Such a source has
intrinsic advantages which could be beneficial to ultrafast electron diffraction:
femtosecond bunch duration, picocoulomb charge and perfect synchronization
(jitter free) with the driving laser pulse. We will also show the results of the first
experiments using a mJ kHz laser system for accelerating electrons. Electrons at
100 keV and kHz repetition rate were produced and used to produce diffraction
patterns on a polycrystalline aluminum thin foil. References [1] O. Lundh et al.,
Nat. Phys. 7 219 (2011) [2] J. Faure et al., Nature 444 737 (2006) [3] C. Rechatin et
al., Phys. Rev. Lett. 102 164801 (2009) [4] A. Lifschitz and V. Malka, NJP 14 053045
(2012)
Workshop on Ultrafast Electron Sources for Diffraction and Microscopy Applications December 12-14, 2012
36
Ultrashort Electron Source from Laser-Plasma Interaction
Presenter: J. Liu (SIOFM, CAS)
By irradiating a flat Al target with femtosecond laser pulses at moderate
intensities of ~1017W/cm2, we obtained stable collimated quasi-monoenergetic
electron beams at ~100 keV close to the specular direction. The periodic
repetition of the electron emission leads to a pulse train of collimated quasi-
monoenergetic electrons with sub-femtosecond duration. The generated quasi-
monoenergetic electron beams with ultrashort duration will find potential
applications in 4D ultrafast time-resolved electron diffraction on a femtosecond
or even attosecond timescale.
Workshop on Ultrafast Electron Sources for Diffraction and Microscopy Applications December 12-14, 2012
37
Concept for Femtosecond Point-Projection Imaging of Nanostructures with Coherent Low-Energy Electron Pulses
Presenter: M. Müller (Fritz-Haber-Institut)
We report on the development of an approach for time-resolved imaging of
nanostructures based on a metal nanotip used as laser-triggered low-energy
electron point source (LEEPS) delivering highly coherent ultrashort electron
pulses. Due to their high sensitivity to electric fields, low-energy electron pulses
are particularly well-suited for mapping transient electric fields and charge
distributions in photoexcited nanostructures. We present first experimental data
on LEEPS projection imaging with femtosecond electron pulses, demonstrating
spatial resolution of several 10 nm. For the upcoming implementation of pump-
probe measurements we expect ~100 femtosecond temporal resolution,
supported by numerical simulations of the electron pulse propagation.
Workshop on Ultrafast Electron Sources for Diffraction and Microscopy Applications December 12-14, 2012
38
m*: A Route to Ultra-bright Photocathodes
Presenter: A. Schroeder (Univ. of Illinois at Chicago)
Robust and low divergence laser-driven pulsed electron sources are the ideal high
brightness sources for ultrafast electron diffraction and microscopy. It is now
evident that the electron effective mass, m*, of the state from which the electron
is emitted plays a key role in determining the transverse emittance, and hence
brightness, of pulsed electron sources. A theoretical formalism, strongly
supported by experimental evidence, will be presented to illustrate the influence
that m* has on electron emission; thereby providing a clear new route towards
laser-driven, ultra-low divergence, planar photocathodes. This work was
supported by DOE NNSA-SSAA grant number DE-FG52-09NA29451.
Workshop on Ultrafast Electron Sources for Diffraction and Microscopy Applications December 12-14, 2012
39
Ultrafast Gas Electron Diffraction
Presenter: M. Centurion (Univ. of Nebraska-Lincoln)
We will present recent results on ultrafast electron diffraction from isolated
molecules, and discuss opportunities and challenges for future gas phase
experiments. We have recently demonstrated 3D imaging of a symmetric top
molecule by using a femtosecond laser to align the molecules, and a femtosecond
electron pulse to capture the diffraction pattern while the molecules are aligned.
The 3D structure of the molecule was retrieved by combining the information
from multiple diffraction patterns corresponding to different projections of the
molecule. This result opens the door to imaging more complex molecules and to
image dynamics on femtosecond time scales.
Workshop on Ultrafast Electron Sources for Diffraction and Microscopy Applications December 12-14, 2012
40
Liquid Jets for Ultrafast Diffraction Experiments
Presenter: U. Weierstall (Arizona State Univ.)
A liquid jet injector has been developed to deliver fully solvated samples into a
probe beam under vacuum conditions. The injector was designed for X-ray
scattering studies of biological nanocrystals and molecules using X-ray Free
Electron Lasers, but is also of interest to ultrafast electron diffraction
experiments. By utilizing a Gas Dynamic Virtual Nozzle (GDVN) to generate a
sample-containing liquid jet of diameter ranging from 300 nm to 20 μm, the
injector avoids the clogging problems with conventional Rayleigh jets. Preliminary
studies using a GDVN for electron diffraction were carried out in the
environmental chamber of a transmission electron microscope.
Workshop on Ultrafast Electron Sources for Diffraction and Microscopy Applications December 12-14, 2012
41
Designing In-situ Experiments in Gas and Liquid Environments for the DTEM
Presenter: P. Abellan (PNNL)
The Dynamic Transmission Electron Microscope (DTEM) at PNNL has been
designed to achieve a combined temporal and spatial resolution of ~10-6s and
~10-10m. This spatio-temporal range covers diverse areas of research in
biochemistry, electrochemistry and catalysis. Critical to all experiments is the
reproducibility of variable conditions around the sample, which may be
maintained using in-situ gas and liquid holders. These environmental holders
allow for localized reactions to be observed with atomic resolution (for pressures
up to 800 Torr in the gas stage). Here, we show our approach to implement in-
situ experiments in gases and liquids inside the DTEM.
Workshop on Ultrafast Electron Sources for Diffraction and Microscopy Applications December 12-14, 2012
42
Time-resolved Gas Electron Diffraction - Building a New Apparatus in Edinburgh
Presenter: D. Wann (Univ. of Edinburgh)
Having worked for many years on time-averaged structures from gas electron
diffraction, the Wann group are now building an apparatus for time-resolved
diffraction. Based on a compact electron gun design, we have started to construct
a new pulsed-source 100 keV set-up, with the first electrons planned for early
2013. Simulations will be presented that predict a resolution of approximately
500 fs in the first instance. Further improvements can be imagined by accounting
for velocity mismatch. Quantum chemical calculations have also been used to
plan the initial experiments that will be performed.
Workshop on Ultrafast Electron Sources for Diffraction and Microscopy Applications December 12-14, 2012
43
Photoelectron Pulse Properties from Free-Free Transitions in Ultrafast Transmission Electron Microscopy
Presenter: D. Flannigan (Univ. of Minnesota)
In this talk, I will describe how ultrafast transmission electron microscopy can be
used to image and control the spatial distribution of femtosecond pulse-
modulated free-free transitions near nanostructures. This is achieved by using an
energy-filter to select a specific electron energy distribution to form the images
while varying the temporal overlap of the photon and photoelectron packets.
Further, I will describe how the properties of the femtosecond photoelectron
packet (distribution and duration) can be measured at the specimen by operating
in the low beam-current regime and quantifying the temporal response of the
low-loss region in the electron-energy spectra.
Workshop on Ultrafast Electron Sources for Diffraction and Microscopy Applications December 12-14, 2012
44
Near Field 4D Electron Microscopy
Presenter: S. T. Park (Caltech)
4D electron microscopy utilizes a pulsed electron packet to image structural
dynamics of nanomaterial, induced by an optical pulse, in real time. In the vicinity
of nanostructures, electrons can directly interact with scattered photons, and
either gain or lose light quanta. This near field photon-electron interaction
enables visualization of nanoscale particles, and is termed photon-induced near
field electron microscopy (PINEM). Here, we give an account of the experimental
results and the theoretical understanding of PINEM, and discuss the impact on
electron microscopy and its applications.
Workshop on Ultrafast Electron Sources for Diffraction and Microscopy Applications December 12-14, 2012
45
Ultrafast Processes on Surfaces Studied by Time-Resolved Reflection High Energy Electron Diffraction
Presenter: T. Frigge (Univ. of Duisburg-Essen)
We study ultrafast processes on surfaces by time-resolved RHEED. In our pump-
probe setup the sample is excited by 50 fs-laser pulses (800 nm). Electron pulses
(7-30 keV) are generated in a Au-photocathode. An incidence angle of 3-6°
ensures surface sensitivity. The velocity mismatch is compensated by tilting the
laser pulse front, which improves the time resolution to 1.8 ps. The transient
temperature is observed through the Debye-Waller effect. Self-organized
nanoscale Ge-clusters were grown on Si(001) in-situ under UHV conditions.
RHEED diffraction patterns allowed the simultaneous investigation of the
transient response of the two different cluster types through spot profile analysis.
Workshop on Ultrafast Electron Sources for Diffraction and Microscopy Applications December 12-14, 2012
46
Determination of Directional Atomic Displacement from Femtosecond Laser Excited Bismuth in Time Resolved
Electron Diffraction
Presenter: P. Zhou (Univ. of Duisburg-Essen)
Time resolved transmission electron diffraction was performed to study the
lattice response of femtosecond laser excited crystalline Bismuth membranes.
The lattice vibration can be driven either indirectly by the relaxation of hot
electrons or directly by the coupling of the laser pulses with the lattice via
nonlinear-optical mechanisms in preferential directions. These different excitation
mechanisms produce distinct signatures in the electron diffraction patterns which
were analyzed by inspection of individual diffraction orders and at different
incidences of the electron beam.
Workshop on Ultrafast Electron Sources for Diffraction and Microscopy Applications December 12-14, 2012
47
Applications of Ultrafast Electron Diffraction
Presenter: C. Y. Ruan (Michigan State Univ.)
The large Ewald sphere and scattering cross-section, and the easiness of forming a
nanoscale focused beam make the electron probes uniquely suited for studying
nanomaterials and complex systems in diffraction and imaging. I will describe
various methods developed and progresses made in the last decade in ultrafast
electron diffraction, which have been applied to study nanoscale materials
transformation and energy transport, plasmonics, and structurally correlated
electronic phase transitions in complex materials. I will also discuss how the
advances of future high-brightness electron microscope can deepen these
investigations and enable imaging of functioning devices with high temporal and
spatial resolutions.
Workshop on Ultrafast Electron Sources for Diffraction and Microscopy Applications December 12-14, 2012
48
A High Repetition Rate-High Brightness Electron Source for Time-Resolved Electron Diffraction and Microscopy
D. Filippetto, F. Sannibale, M. Zolotorev (Lawrence Berkeley National Laboratory)
The advent of RF photo-guns has boosted up the 6D brightness of produced
electron beams by almost two orders of magnitude. The high electric field at the
emission plane enables the creation of sub-picosecond pulses with enough charge
(105-106 electrons) to be used as probe in single-shot time-resolved experiments.
On the other hand, the low repetition rate (10-100 Hz) and the moderate stability
associated with such sources limit the range of applicability to true single-shot
experiments, and the typical time jitter (~ps) poses a lower limit on time
resolution.
The APEX photo-injector is a MHz source of bright beams, merging the high fields
of RF technology with the high repetition rate typical of synchrotron radiation
sources. In will be able to provide electron beams from tents of femtoseconds to
picoseconds beams at MHz repetition rate, with energies up to 750 keV. The high
repetition rate increases the feedback bandwidth, promising time jitters below
well below 100 fs. The electron transport line will be equipped with two
solenoids, an rf buncher, a deflecting cavity and a dispersive region for
longitudinal phase space diagnostic.
Here we report some preliminary considerations in using such source for ultrafast
electron diffraction experiments.
Workshop on Ultrafast Electron Sources for Diffraction and Microscopy Applications December 12-14, 2012
49
Collimated Quasi-monoenergetic Electron Emission at Locked Phases from the Laser-Driven Surface Plasma Wave
Y. Tian (Shanghai Institute of Optics and Fine Mechanics, Chinese Academy of Sciences)
We demonstrate stable collimated quasi-monoenergetic e-beam generation close
to the specular direction by irradiating a flat Al target with femtosecond laser
pulses at moderate intensities. We find that some accelerated electrons more or
less along the specular direction are ejected from the laser-driven surface plasma
wave at locked phases periodically, and inevitably steered slightly toward the
target normal by the ponderomotive force of the combined field of the incident
laser and its coherent reflection. The periodic repetition of the electron emission,
every optical cycle, leads to a pulse train of collimated e-beam with sub-cycle
duration.
Workshop on Ultrafast Electron Sources for Diffraction and Microscopy Applications December 12-14, 2012
50
Complex Acoustic Waves in Graphite Observed by Convergent-Beam Ultrafast Electron Crystallography
W. Liang (Cal Tech)
The second generation of Ultrafast Electron Crystallography (UEC) at Caltech
provides ultrashort electron pulses with tunable probe sizes and convergence
angles. Thereby, a wide area of diffraction experiments becomes feasible.
Employing the convergent-beam mode of UEC, we can investigate
inhomogeneous ultrafast dynamics through Kikuchi diffraction. Intricate laser-
induced acoustic waves in single-crystal graphite were mapped out by the
temporal evolution of Kikuchi patterns. These results demonstrate the unique
ultrafast probe sensitivity of UEC to atomic motions in inhomogeneous systems
and open up new areas for future UEC studies.
Workshop on Ultrafast Electron Sources for Diffraction and Microscopy Applications December 12-14, 2012
51
Continuous MeV electron Diffraction using a Flat Electron Beam
Feichao Fu1,2, Renkai Li3, Xijie Wang4 and Dao Xiang2
1. Department of Physics, Shanghai Jiao Tong University, Shanghai, China 2. SLAC National Accelerator Laboratory, Menlo Park, CA, USA
3. Department of Physics and Astronomy, UCLA, Los Angeles, CA, USA 4. Brookhaven National Laboratory, Upton, NY, USA
In a single-shot continuously time-resolved MeV ultra-fast electron diffraction
system, a thin slit is applied to minimize overlap of diffraction patterns that are
streaked in time by an rf deflecting cavity, which results only part of the
diffraction patterns are recorded at the detector screen.
In this paper, we propose to replace the standard round cathode laser beam
with a flat laser beam with large aspect ratio to obtain sharp recorded
patterns. Given the same area of the laser beam, we convert the simulated
patterns to radial intensity distributions which indicate higher S/N ratio and
better spatial resolution.
Workshop on Ultrafast Electron Sources for Diffraction and Microscopy Applications December 12-14, 2012
52
Controlled Molecules for Time-resolved Electron Diffraction Experiments
N. Mueller (Center for Free-Electron Laser Science, DESY and University of Hamburg)
Controlled molecule imaging increases the amount of information observable
when investigating molecular dynamics by electron diffraction, photoelectron
measurements, or FEL light sources. We prepare gas-phase samples of state-
selected and spatially oriented molecules. The angular distribution of the
molecules is probed by strong-field ionization using velocity map imaging.
Structural information can be gained by ultrafast electron diffraction. A
picosecond electron diffraction setup is under construction and will be combined
with the existing molecular beam setup to investigate complex molecular motions
of the prepared well-defined samples.
Workshop on Ultrafast Electron Sources for Diffraction and Microscopy Applications December 12-14, 2012
53
Design and Implementation of a Flexible Beamline for FS Electron Diffraction Experiments
G. Mancini (LUMES – EPFL)
We discuss the design and implementation of a flexible beamline for femtosecond
electron diffraction experiments in transmission or reflection geometry. By the
use of a radiofrequency compression cavity synchronized to our laser system, in
combination with a set of electron optics, we can control the beam properties in
terms of charge per pulse, transverse spot-size on the sample and temporal
duration of the bunches. The characterization of the beam is performed via a
light-electrons cross-correlation experiment and we demonstrate an overall
temporal resolution around 300 fs for bunches containing up to 105 electrons at a
repetition rate of 20 kHz.
Workshop on Ultrafast Electron Sources for Diffraction and Microscopy Applications December 12-14, 2012
54
Development of High Brightness Electron Source Laboratory at Fermilab
H. Panuganti (Northern Illinois University)
Fermilab is currently commissioning a low energy (4-5 MeV) facility based on an L-
band (1.3 GHz) electron source ― the High Brightness Electron Source Laboratory
(HBESL). The facility is dedicated to R&D on novel cathodes, low energy beam
dynamics, and development of short wavelength radiation sources. HBESL
incorporates a Ti:Sapphire laser system with a sub-fs (6 fs) oscillator as an integral
part of its goal to develop a Tera-watt laser system. In this contribution we will
present the current commissioning of the laser system, and discuss our plans and
preliminary results on our on-going studies (three-photon emission and field
emission).
Workshop on Ultrafast Electron Sources for Diffraction and Microscopy Applications December 12-14, 2012
55
Development of Hybrid Gun for the High Brightness Beam Generation
A. Fukasawa, S. K. Mahapatra, H. To, B. Baumgartner, J. B. Rosenzweig, P. Musumeci, R. Li, UCLA, CA, USA
David Alesini, Luca Ficcadenti, Bruno Spataro, INFN/LNF, Frascati, Italy
A. Valloni, Luigi Palumbo, Rome University La Sapienza, Rome, Italy
We are developing a novel electron beam source, so called ‘hybrid gun’. It has
both standing wave (SW) and traveling wave (TW) cells in one RF structure.
The SW part works as an RF gun, and the TW part is used to add energy
modulation in the longitudinal direction, so that the beam is compressed by
ballistic bunching. A PARMELA simulation showed it is possible to generate the
beam with the charge 10 pC, energy 3 MeV, the rms bunch length 70 fs, and
the normalized emittance 0.3 mm.mrad. We have made the structure and
commissioned it up to 10 MW successfully, although the design input power is
25 MW. The generation of the beam is expected in January, 2013.
Workshop on Ultrafast Electron Sources for Diffraction and Microscopy Applications December 12-14, 2012
56
Dispersion Compensation for Attosecond Electron Pulses
M. Centurion (University of Nebraska – Lincoln)
We propose a device to compensate for the dispersion of attosecond electron
pulses. The device uses only static electric and magnetic fields and therefore does
not require synchronization to the pulsed electron source. Analogous to the well-
known optical dispersion compensator, an Electron Dispersion Compensator
separates paths by energy in space. Magnetic fields are used as the dispersing
element, while a Wien filter is used for compensation of the electron arrival
times. We analyze a device with a size of centimeters, which can be applied to
ultrafast electron diffraction and microscopy, and fundamental studies.
Workshop on Ultrafast Electron Sources for Diffraction and Microscopy Applications December 12-14, 2012
57
High Brightness Sub-picosecond Electron Pulse Generation
J. Li (East China Normal University, State Key Laboratory of Precision Spectroscopy)
Femtosecond electron gun determines the temporal resolution of UED system.
The pulse duration of high-brightness electron bunch will be broadened because
of the space charge effect which results in the loss of temporal resolution. In our
setup, a DC acceleration and RF compression technology is applied to generate
sub-picosecond electron pulses with ≥ 105 electrons. The electrons are firstly
accelerated by a 10MV/m DC electric field, and then pass through a 3.2GHz RF
compression cavity with TM010 mode phase-locked to femtosecond laser
oscillator. The electron bunch acquires a chirp inversely to SC expansion, and so it
will be compressed.
Workshop on Ultrafast Electron Sources for Diffraction and Microscopy Applications December 12-14, 2012
58
Multi-Objective Molecular Dynamics Simulations with the GPT Code
B. van der Geer (Pulsar Physics)
In the high-brightness community we typically want it all: Lots of charge, low
emittance and short pulse-duration. During the design process it is common to
take space-charge forces into account, but at higher brightness stochastic effects
play an increasingly important role. Furthermore we need to include higher order
lens aberrations and external constraints. Advances in computational speed and
numerical algorithms allow us to run multi-objective optimizations with the GPT
code, taking into account all relevant physics affecting bunch quality at the
sample. This automatically shows trade-offs between conflicting objectives in
addition to providing the global optimum for the entire system.
Workshop on Ultrafast Electron Sources for Diffraction and Microscopy Applications December 12-14, 2012
59
Time Resolved Electron Diffraction on Nanomaterials
P. Zhou (Faculty of Physics, University of Duisburg-Essen)
Experimental investigations of different nanomaterials with time-resolved
electron diffraction are reported. The experiments were performed either in
reflection (GaAs nanowires) or in transmission (gold nanoparticles) geometry. In
reflection geometry space charge effects have a substantial influence on the
observed changes in the diffraction signals. Nevertheless, it is still possible to gain
information about the lattice response by analyzing the diffraction orders
individually. In contrast, transmission diffraction is less effected by space charge
so that ultrafast lattice heating can be readily observed. The results demonstrate
the possibilities and limitations of time resolved electron diffraction on
nanomaterials.
Workshop on Ultrafast Electron Sources for Diffraction and Microscopy Applications December 12-14, 2012
60
Ultracold and Ultrafast Electrons Diffracted from Graphene
E. Vredenbregt (Eindhoven University of Technology)
We develop a new class of electron source using pulsed photoionization of
trapped atoms to create intense electron pulses with large coherence length.
Temperatures of a few Kelvin are achieved for tens of thousands electrons. We
now report on picosecond pulses using ultrafast lasers for the ionization step. Low
temperatures can still be achieved despite the photon energy spread. We explain
this surprising result from electron trajectories resulting from photoionization,
and show how polarization effects can be understood. Diffraction from graphene
is used to characterize the coherence of the beam. Characterization of the bunch
length using a streak cavity follows.
Workshop on Ultrafast Electron Sources for Diffraction and Microscopy Applications December 12-14, 2012
61
Ultrafast Time Resolved Surface Sensitive Electron Diffraction with Tilted Pump Pulse Fronts
C. Streubühr (Faculty of Physics, University of Duisburg-Essen)
Time resolved reflection high energy electron diffraction (TR-RHEED) is a surface
sensitive technique to investigate the lattice dynamics of surfaces. The different
velocities of light and electrons result in a time mismatch between the laser
excitation and electron probe pulse (velocity mismatch). As a consequence the
temporal resolution is limited. In this contribution we report the use of an optical
setup capable of matching the pulse front of the laser to the electron pulse. The
improvement of the temporal resolution is demonstrated by measuring the
ultrafast lattice heating of Pb islands on a Si(111) surface.