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Validierung und Verifikation mit der NI Plattform
Sascha Egger
National Instruments Switzerland GmbH
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Today, We’ll Explore:
Validation and Verification
The Challenges of Developing Test and Measurement Systems
Introduction to the NI Automated Test Platform
Scaling Up Production with Parallel Testing
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Validation and Verification
• Validation Tests
• Does the product satisfy its
intended usage?
• Did you build the right
product?
• High level and exploratory
• Example: Usability test
• Verification Tests
• Does the product satisfy its
requirements or design?
• Did you build the product
right?
• Detailed and conclusive
• Example: Manufacturing
test
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MP3 player
Internet/E-mail
Cellular Phone
Digital Camera
Gaming
High resolution
display
Smart Phone
PDA
Today’s Designs: Converging Complexity
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Today’s Challenges: The Traditional Approach
Oscilloscope
Logic Analyzer
Spectrum Analyzer
Digital Multi Meter
(DMM)
Communications Analyzer
LCR Meter
Function
Generator
Power Supply
Pattern Generator
Programmable
Switch
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Traditional Testing Solutions
Challenging to Develop and
Maintain
• Disaggregate hardware
• Closed software solutions
• Conflicting programming approaches
• Limited analysis and visualization
• Hard to integrate new technologies
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Introduction to the NI
Automated Test Platform
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Components of an Automated Test System
NI LabVIEW LabWindows™/CVI Other Software
Measurement Studio, Visual
Studio.NET™, …
RF Measurements Bus Interfaces (GPIB/LXI/Serial)
Signal Generation PC or Embedded Controller
Switching PXI Chassis
Fixturing/
Mass Interconnects
SO
FT
WA
RE
H
AR
DW
AR
E
Test Development Software
NI TestStand Test Management, Test Deployment
IVI, VISA, NI-DAQ, NI-DMM, NI-SCOPE, NI-FGEN, NI-HSDIO, …
Test Management Software
Drivers, Services, Hardware Abstraction
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Common Needs
No matter the industry, every company has testing needs for their products to ensure quality. A proper automated testing framework (either built in-house or off-the-shelf) should:
1. Provide a flexible, open test architecture
2. Eliminate programming of common test executive tasks
3. Enable reuse of existing test code
4. Simplify updates and long-term maintenance
5. Accelerate test system development
6. Ensure high test system performance
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Test Executive – Build or Buy?
• Build (in-house) • Pros
– Meets custom needs
– Leveraging of code from current solution
– Utilizes existing developer talent
• Cons
– SW Maintenance
– Training
– Major development effort
– Different groups often create different test executives
• Buy (COTS) • Pros
– Training & certification courses
– Flexible architecture
– Built-in reporting and database logging
– Existing worldwide developer base
• Cons
– Overkill for basic sequencing
– Lack of full control over code base
– Price
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TestStand Accelerates Construction and
Deployment of Advanced Test Architectures
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NI TestStand – Test Management Software
• Graphical development
environment
• Automate tests written in
any language
• Multithreaded sequence
execution
• ASCII, HTML/Web, XML,
and ATML report
generation
• Access, Oracle,
SQL Server database
connectivity
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• Use drag-and-drop
step creation
• View and edit existing
step properties with
fewer clicks
• No programming
needed, just
configuration
Streamlined Sequence Editor
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NI TestStand – Operator Interfaces
• Full Featured and Simple User Interfaces are provided in
NI LabVIEW, NI LabWindows™/CVI, C#, C++, and
VB.NET
• TestStand Deployment Utility builds a simple installer with
necessary dependencies
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Choosing a Development Environment
• Faster/Easier Development and Debugging
– Complete and intuitive graphical environment, hierarchal dataflow-oriented design
• High-Performance Execution – Efficient and fast executables, advanced
multithreading capabilities, proven reliability
• Components – VIs, DLLs, COM, A Reusable/Standard
ActiveX server and component capabilities
• Designed for Engineers – 3rd party bench-top instrument support with
more than 10,000 instrument drivers, powerful visualization capabilities, and scientific analysis tools
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Example Test Application
• Automated Test of a consumer electronic device
• Power On Test and Battery Test
o PXI-Power supply and PXI-Digital Multimeter (DMM)
o OR a PXI-Source Measurement Unit (SMU)
• RF Tests (LTE Test, 802.11b/g/n Test)
o PXI RF-Signal Analyzer
• Audio Test (Mikrophone Test, Speaker Test)
o PXI-DSA
• User Input Test (Button Test)
o PXI- digital I/O Module Unit under Test (UUT)
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Example
UUT
Hardware Drivers
LabVIEW
NI TestStand
Hardware
(. . .) C/C++ .NET other
Software
Call Sound Quality Test.vi
NI-Scope, NI-FGEN, NI-DAQmx etc.
Pass Fail
PXI Digitizer, PXI-FGEN, PXI-DAQ etc.
Call Power Consumption Test.vi Call Memory Test.vi
Hardware
Systemlevel
ADE
Driver
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PXI - The Industry-leading Platform for Test,
Measurement and Control
PXI Controllers Performance embedded – Windows or RT OS
Remote control via desktop or laptop
PXI Chassis Options ranging from low-cost, 4-slot desktop
to high-performance 18-slot rack-mount
PXI Modules >1,500 options from over 60 PXI vendors
Software Flexible driver APIs, example code,
soft front panels and configuration
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Complete PXI Instrumentation Portfolio
Multifunction I/O
FPGA / Reconfigurable I/O
Digital I/O
Analog Input / Output
Vision and Motion
Counter / Timer / Clock
DAQ and Control
Oscilloscopes
High-Speed Digital I/O
Digital Multimeters
Signal Generators
Switching
RF Analyzers & Generators
Instruments
GPIB, USB, LAN
RS232 / RS485
CAN, LIN, DeviceNet
SCSI, Ethernet
VXI - VME
Boundary Scan / JTAG
Interfaces
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Software-Designed Instruments
Typical Modular Instrument Software-Designed Instrument
Software on the PC using the
Instruments API (i.e. IVI or NI-Scope)
Fixed
FPGA
Firmware
FPGA-
Code
Host-Software controlling Instrument
through API or custom interface
Similar hardware architecture and measurement quality
Out-of-the-box
functionality
with FPGA
enhancements
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Software-Designed Instruments:
Detect events faster and deterministically
Dead time
Continuous acquisition and processing
without dead time capturing all events
Missed event
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Demo: Time Domain Mask Trigger
• Acquire only signals (i.e. a glitch) that follow an given
envelope or path
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Demo: Time Domain Mask Trigger
Host FPGA
Application-Specific Host VIs Application-Specific FPGA VIs
Instrument Driver Instrument Driver FPGA VIs
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Fixturing/Mass Interconnects
• Hardware designed for quick
connection and disconnection
with high signal reliability
• Very important for test systems
with large numbers of test points
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Scaling up Production
with Parallel Testing
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Increasing Hardware Utilization with Switching
PXI-2532 8x64 Matrix
DM
M
+
- LED 1 (blue)
LED 2 (white)
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Graphical Configuration
Excel Integration
Easy channel aliasing
Automatic routing
Interactive Debug Panel
Simplified ADE integration
Integrated TestStand deployment
+
NI Switch Executive Intelligent Switch Management Software
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Switch Automation with NI TestStand
Create or import switch
system configuration file into
NI Switch Executive
Configure the Switching
property in NI TestStand to
call preconfigured routes and
route groups
Step 1
Step 2
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Switch Automation with NI TestStand
• Multithreaded Process Models
• Test sequence remains the same
• Add code for switching and code to avoid resource conflicts
Test Sequence for sequential
UUT tests Test Sequence for parallel
UUT tests
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Sequential vs. Parallel vs. Auto-scheduled
Execution
• Simple 1 UUT test fixture
• Extremely simple code structure
• 12 time blocks for 4 units
• Multiple UUTs in parallel
• Switching allows hardware to be shared
• ~30–60% decrease in testing time
• Same HW setup as above
• TestStand auto-schedules resources
• ~15–20% further decrease in testing time
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Resource Usage Profiler
• Provides immediate visualization and performance
statistics for all current executions, threads, and resources
• A fully optimized test should take 4X the longest test time
Sequential Execution Parallel Execution Auto-Scheduled Execution
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• Smaller size
• Higher performance
• Flexible
• Easily upgraded
• User-defined
• Integrated
Synchronization
• Low power consumption
Summary: NI’s Value Proposition
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National Instruments Services and Support
• Technical Support
• Web support resources
• Application engineers worldwide
• Premier support
• Instructor Led Training
• NI TestStand 1 – Test Development
• NI TestStand 2 – Framework Development
• Thousands of engineers trained each year
• Certification
• Certified TestStand Developer (CTD)
• Certified TestStand Architect (CTA)
ni.com/services
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• White papers
• Application notes
• Examples
• Other NI seminars
• Request callback support
• And much more… – ni.com/teststand
– ni.com/pxi