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Soalan pjpk-tingkatan-4
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Edge contact effect on thermal elastohydrodynamic lubrication of finite contact lines
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Risk Factors of Corneal Graft Failure
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Increased Pancreatic Islet Glucose-Induced Insulin Secretion in the Prevention of Diabetes Following Voluntary Running Exercise in ZDF Rats
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Type and Timing of Services Following Postnatal Discharge: Do They Make a Difference?
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Endogenous K+/H+ Exchange Activity in the Sf9 Insect Cell Line
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What Remains to Be Done to Allow Quantitative X-Ray Microanalysis Performed with EDS to Become a True Characterization Technique?
What Remains to Be Done to Allow Quantitative X-Ray Microanalysis Performed with EDS to Become a True Characterization Technique?
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Dark-field imaging based on post-processed electron backscatter diffraction patterns of bulk crystalline materials in a scanning electron microscope
Dark-field imaging based on post-processed electron backscatter diffraction patterns of bulk crystalline materials in a scanning electron microscope
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Ionic liquid-based observation technique for nonconductive materials in the scanning electron microscope: Application to the characterization of a rare earth ore
Ionic liquid-based observation technique for nonconductive materials in the scanning electron microscope: Application to the characterization of a rare earth ore
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[IEEE 2012 15th International Conference on Interactive Collaborative Learning (ICL) - Villach, Austria (2012.09.26-2012.09.28)] 2012 15th International Conference on Interactive Collaborative
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Microstructure Refinement of Cold-Sprayed Copper Investigated By Electron Channeling Contrast Imaging
Microstructure Refinement of Cold-Sprayed Copper Investigated By Electron Channeling Contrast Imaging
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Acquisition parameters optimization of a transmission electron forward scatter diffraction system in a cold-field emission scanning electron microscope for nanomaterials characterization
Acquisition parameters optimization of a transmission electron forward scatter diffraction system in a cold-field emission scanning electron microscope for nanomaterials characterization
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