Usability of PublishedSEE Data

Munir Shoga

The Radiation Group, Inc.

8/30/07

Bibliography of Author

• Graduated from Rutgers Univ and hold MS & Ph.D degs. in Elec. Engg (solid state devices)

• I was the SEU guy at Hughes / Boeing for ~ 20 years• From part to system level, I assessed all space programs at

Hughes/Boeing for 18 years ( > 50 programs)• Have over 40 publications & presentations in SEE and other

semiconductor devices• Tested or supported over 2000 hours of beam time SEE testing

parts and, some more, doing FXR & TID testing• Holds four patents and two pending• Two Boeing awards for technical excellence

Where can I find Test Data?

• Own data on C:\, D:\, flash memory cards, CDs, on one of laptops / PCs, in the office or at work, or on somebody else’s PC, etc.

• In various conference and none conference journals and proceedings

• Various internet websites and databases

Doing Your Job

• You may have– To do unit analysis of some 20 parts or many

units on a system– You may have to design space hardware– Planning for a SEE test– You may need to perform rate prediction– May not have sufficient budget– Program schedule does not allow a test

How to get data?

• Search all PC hardware• E-mail or call colleagues at work or in other

companies• Search all available journals and proceedings• Search the internet (vendors and other available

databases), etc.• Do own testing

Can I use published data?

• Bias, temperature, frequency, or operating conditions are different than the published test data

• The test data is old?

• Did the part process / design change?

• Is there a vendor or fab location change?

• Is there sufficient data?

How useful is the Data?

• Will the data answer my questions:– Upset (SEU) characteristics– Transient (SET) characteristics– Latchup, burnout, gate rupture, SEFI, stuck

bit, etc.

• Do I need to do more testing?

When to use published data?

• For critical applications you MUST test to your operational bias conditions, orbital conditions, and program requirements - You may use published data when writing your test plan

• For Non-Critical applications you may:– Use the data – Use transient (SET) characteristics in your design

• If you do not have budget to test

• If schedule does not allow for a test

• You may use the data but with a good engineering judgment

Introducing Single Event Effects Database Software

• Tow versions are available now for MS Windows:

– SEE PRO 2007 for desktop– SEE NET PRO, a Client – Server (for the

enterprise)

SEE PRO & SEE NET PRO

• Contains all published data, 1983 - 2007

• Presented in a powerful & easy to search software interface

• Two versions: desktop and Client – Server for the Enterprise

• Updates every 6-months

SEE PRO cont’d

• It contains 24 years of test data (heavy ion, proton, and neutron)

• It has either a data set of cross sections vs. LET/Energy or just the LET Threshold and saturated cross section

• Data collected from conference proceedings, journals, and various Internet web sites

• Within minutes you can get useful part’s data

SEE PRO cont’d

• Enterprise access to the data• Has e-mail address of most testers and hence one can

e-mail the tester for a report or row data • Any one with credentials can add data, reports, etc• Very important: for companies with many individuals

conducting tests and have lots of data, this is one place for every one to save their data and reports

• If some one leaves the company you know that all his test data and reports are in SEE PRO

Who is it for?

• For aerospace and avionic companies' survivability and design engineers

• Manufacturers building units and boards for space an avionics

• For consultants supporting space systems

• For component manufacturers to find out their parts SEE performance and their competition’s

• For researchers to investigate trends in technology, function, operational characteristics, etc.

Conclusion

• SEE PRO / SEE NET PRO– Reduce cost of searching SEE test data– Helps in planning new SEE testing– Helps design engineers in their part’s

selection– A place to organize all your SEE test data and

reports– Updates will be made every 6-months

Future Database

• Complete suite of radiation effects. It will contain:– TID data– Displacement damage– FXR data– Material database

Contact Information

Munir Shoga

The Radiation Group, Inc.

30251 Golden Lantern # 413

Laguna Niguel, CA 92677

Phone: (562) 858-0942

Fax: (949) 215-1620

E-Mail: munir@SEUdata.com

www.SEUdata.com