thin film solar cell simulations with fdtd - eth...
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Thin film solar cell simulations with FDTD
Matthew Mishrikey, Prof. Ch. Hafner (IFH) Dr. P. Losio
(Oerlikon
Solar)
5th
Workshop on Numerical Methods for Optical Nano
Structures
July 7th, 2009
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Problem Description
Thin film solar cell designTrial and error manufacture vs. computer simulation
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Problem Description
Goals
- Estimate potential of new ZnO
morphologies by simulation
- Optimize Si
layer thicknesses (current matching condition)
- Whole day optimization (angular incidence)
- Determine if simulation is an alternative to cost-intensive manual optimization
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Methods
Boundary discretization methods+ Excellent for 2D geometries-
Accuracy convergence breakdown for noisy, singular surfaces-
Large, dense matrices in 3D
FEM+ Gridding+ Higher order convergence (hp-FEM)- Matrices get difficult with Nonlinear materials+/-
Modular, but difficult to implement
FDTD+ Broadband results with high frequency resolution+ Simple methods are more extensible-
Material modeling-
Gridding
problems (staircasing), grid refinement+ Free (meep)
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Accuracy test
Compare FDTD with analytical result for 1D layered structure, using fitted material models, normal incidence
FDTD: resolution of 600 cells per micrometer
energy
5%23%68%3%
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Absorption Rate
Polarization field P
P evolves with E according to D.E.
Meep
lets you keep track of absorption (or gain) energies (only in a
box now)
absorption rate
nestedscatterer
Computes abs. rate within this box
Lossy ‘rotten egg’
scatterer: Easy to compute loss in egg, less easy to integrate loss in yolk or egg white
illumination
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Simplified 2D Geometry
Triangular roughness with 2 geometric parameters
Brute force analysis of optimal absorption rate
α
in {10 20 30 40 50 60}sx
in {0.25 0.35 …
0.85}
We can use a mirror symmetry reduce the domain by a factor of 2
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Simplified 2D Geometry
Absorption rate plotted for each geometry
Strong dependence of absorption rate on roughness angle αWeaker dependence on lattice size
Sample timing info:
Lattice width sx
= 250 nm sx
= 650 nm sx
= 850 nm
decay = 1e-07 18 min 50 min 74 min
decay = 1e-12 25 min 166 min 115 min
best
worst
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Reflectivity spectra for best and worst geometries
Simplified 2D Geometry
Absorption strongest at shorter lambda, as can be surmised from material data
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Simplified 2D Geometry
Angle α
evolution of reflectivity spectra for a fixed lattice constant
Peaks are trackable, and generally shrinking
As seen by crossover in previous plots, it’s possible for a larger angle α
to have a worse overall absorption rate
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Semi-periodic Roughness Geometry
We can obtain more realistic reflection spectra with a more random surface
Also, we can check if absorption increases with more structure variation (surface shift and scaling)
2.2 μm
Progressive shiftand/or
Scaled back-reflector
γ
= 105°
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Semi-periodic Roughness Geometry
Quad core: ~ 12.5 hours per polarization, field decay 1e-10
grating lobes
improved absorption
γ
= 100°
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Semi-periodic Roughness Geometry
In the case of offset, mcSi/ZnO
interface is shifted right by 300 nm, and back reflector by 450 nm
yscale
factor of back reflector is not entirely intuitive!
best performance with matched back reflector
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Preliminary Conclusions
We can characterize cell performance as a function of surface morphology.
Know behaviors are confirmable, e.g. more ZnO
roughness yields more absorption.
Lattice constant for triangular gratings is not as critical as roughness angle α.
More lattice constant simulations will resolve absorption resonance patterns.
Offset roughness geometries have little effect on reflectance spectra, and a similarly contoured back reflected appears optimal (more sample points needed!).
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Future work
1.
Charge transport simulations –
extract and match currents of p-i-n
layers Compare with simulations including material properties for doped
layers
2.
Obtain better material data for shorter wavelengths, compare peak absorption with peak quantum efficiency of published result [Krc, 2002]
3.
Non-normal incidence characterization (Whole-day optimization) -> nonlinear effects?
4.
Further investigation of roughness/randomness; fourier
decomposition of AFM surfaces