the standard 8 dec06

Vol. 20, No. 4 The Newsletter of the Measurement Quality Division, American Society for Quality December 2006

2007 NCSL International Workshop & Symposium2007 NCSL International Workshop & SymposiumSt. Paul RiverCentre, St. Paul, MinnesotaSt. Paul RiverCentre, St. Paul, Minnesota

July 29 ~ August 2, 2007July 29 ~ August 2, 2007(303) 440(303) 440--33393339

2007 Measurement Science Conference (MSC)2007 Measurement Science Conference (MSC)Long Beach Convention Center, Long Beach, CaliforniaLong Beach Convention Center, Long Beach, California

January 22 ~ 26, 2007January 22 ~ 26, 2007(866) 672(866) 672--63276327

DeWayne Byrle Sharp August 12, 1926 - October 31, 2006

The Standard’s Founding Editor

The Standard is published quarterly by the Measurement Quality Division of ASQ; deadlines are February 15, May 15, August 15 and November 15. Text infor-mation intended for publication can be sent via electronic mail as an attachment in MS Word format (Times New Roman, 11 pt). Use single spacing between sen-tences. Graphics/illustrations must be sent as a separate attachment, in jpg format. Photographs of MQD activities are always welcome. Publication of articles, prod-uct releases, advertisements or technical information does not imply endorsement by MQD or ASQ. While The Standard makes every effort to ensure the accuracy of articles, the publication disclaims responsibility for statements of fact or opinion made by the authors or other contributors. Material from The Standard may not be reproduced without permission of ASQ. Copyrights in the United States and all other countries are reserved. Website information: MQD’s homepage can be found at http://www.asq.org/measure. © 2006 ASQ, MQD. All rights reserved.

The Standard Vol 20, No. 4, December 2006

Managing Editor and Publisher Jay L. Bucher 6700 Royal View Dr. De Forest, WI 53532-2775 Voice: 608-277-2522 Fax: 608-846-4269 Email: [email protected] [email protected]

AdvertisingSubmit your draft copy to Jay Bucher, with a request for a quotation. Indicate size desired. Since The Standard is published ‘in-house’ the requester must submit a photo or graphic of their logo, if applicable. The following rates apply:Business card size ............................ $100 1/8 page .......................................... $150 1/4 page ........................................... $200 1/3 page ........................................... $250 ½ page ............................................. $300 Full page ......................................... $550

Advertisements will be accepted on a ‘per issue’ basis only; no long-term contracts will be available at present. Advertising must be clearly distinguished as an ad. Ads must be related to measurement quality, quality of measurement, or a related quality field. Ads must not imply endorsement by the Measure-ment Quality Division or ASQ.

Letters to the Editor The Standard welcomes letters from mem-bers and subscribers. Letters should clearly state whether the author is expressing opin-ion or presenting facts with supporting infor-mation. Commendation, encouragement, constructive critique, suggestions, and alter-native approaches are accepted. If the con-tent is more than 200 words, we may delete portions to hold that limit. We reserve the right to edit letters and papers.

Information for AuthorsThe Standard publishes papers on the qual-ity of measurements and the measurement of quality at all levels ranging from relatively simple tutorial material to state-of-the-art. Papers published in The Standard are not referred in the usual sense, except to ascer-tain that facts are correctly stated and to as-sure that opinion and fact are clearly distin-guished one from another. The Editor re-serves the right to edit any paper.

TABLE OF CONTENTSLetter’s to the Editor .......................................................................4 Chair’s Column...............................................................................5 Chair-Elect’s Column .....................................................................6 Financial Report..............................................................................6 Demistifying Test Uncertainty Ratios ............................................7 CCT Exam Review Workshop........................................................8 The Learning Curve ......................................................................11 Defining “A Professional” - A personal letter from Phil Painchaud to Dr. Eugene Watson (1994) .................................................15 The Learning Curve ......................................................................22 DeWayne Burle Sharp (Obituary) ................................................27 Book Review.................................................................................31 NCSL International Workshop & Symposium 2007 info.............34 MQD Officers and Committee Chairs ..........................................35 MQD Regional Councilors …………………………………… ..36 ASQ Southwest Conference: Seven Basic Quality Tools.............38 New Books From ASQ Quality Press...........................................41 MSC 2007 Brochure .....................................................................43

FROM THE DESK OF THE EDITOR/PUBLISHEROn behalf of the officers and committee chairs of MQD, I’d like to express our condolences to the Sharp family. DeWayne, The Standard’s founding editor passed away on October 31st, 2006. Phil P. has graciously provided an obituary in this edition.

In case all of our illustrious CCT recipients have not gotten the word, additional CCT challenge coins can be purchased (a limit of 2 extra coins) at a cost of $15.00 per coin. This can be accomplished by sending me (in the capacity of MQD Treasurer) your name, address, CCT certification number, and the exact amount in the form of a check or money order made out to Measurement Quality Division. Please include your email address in case there are any questions.

HAPPY HOLIDAYS

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Why doesn’t anyone send in new ideas for

articles, or suggestions for topics of discussion?

I’m getting tired of seeing the same stuff month after month, and year

after year.

I’ve got an idea — why not ask the readers for their suggestions… ain’t I smart?

You think you have it bad? I have to live with these three. How about helping all of us out and submit your ideas for topics, or articles that you have written, or ones that you have read and think our readers might enjoy. We appreciate all the help we can get. All you have to do is send them as an attachment to the editor. Thank you.

Drawings courtesy of a.Yumi

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Letters to the Editor

The following letter was received after the Septem-ber 2006 edition of The Standard:

Mr. Bucher,

Chris Grachanen’s article on the Unwritten Cali-bration Technique was exactly the same situation my company recently encountered. My research into finding documentation of this technique also ended with similar results. However, I did find the method clearly described in the operation of the step/jog function (page 4-8) in the Manual for the Ruska 7250 Pressure Controller, which is available h t t p : / / w w w . g e s e n s i n g . c o m / p r o d u c t s /hpdp_model7250xi.htm?bc=bc_ruska).

This situation also highlighted the lack of docu-mentation of the often reference to “Good Metrol-ogy Practice”. Where can I get a copy of this mythical book? I’ve been in the metrology for nearly 20 years, and as most other metrology pro-fessionals realize these GMetP’s is often just logi-cal common sense. As in Mr. Grachanen’s and our situations, “tribal knowledge”, GMetP, and com-mon accepted practice are not adequate answers for an auditor from Missouri. Perhaps it’s time for a companion to the Metrology Handbook?

Thank you for your time.

Kind Regards,

Philip Mistretta, CCT Project Manager, Lab Operations Transcat Inc.Rochester, NY Ph. 1-800-724-3541 x 255 Fax 585-352-4320 Mobil 585-615-2476 [email protected]://www.transcat.com

Here’s my reply:

Phil, I’ve copied Chris on your email, which I find both informative and very enlightening. Unfortu-nately, my new book, The Quality Calibration Handbook, Developing and Managing a Calibra-tion Program (http://qualitypress.asq.org/perl/catalog.cgi?item=H1293) does not have enough of what you correctly refer to as GMetPs (me likie this acronym), and is now in book stores, so I can-not make updates to this edition. However, you’ve tweaked my enthusiasm for writing just such a book. Of course, I would have to ask for the com-bined experience and training from my fellow pro-fessionals to put together a comprehensive, and accurate book.

Thank you so much for letting us know your thoughts and opinions. As the managing editor and publisher of The Standard, I receive little or no feedback from our readers, and I greatly appreciate your comments.

BTW, congratulations on earning your CCT. We hope you enjoy the unique CCT challenge coin.

Jay L. Bucher, ASQ Sr. Member, CCT Managing Editor/Publisher of The Standard

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CHAIR’S COLUMNBy Graeme C. Payne

It is with sadness that I note the recent passing of DeWayne Sharp, one of the founding members of the Measurement Quality Division. Among other accom-plishments, DeWayne was the Editor of this newsletter, The Standard, for the first nine years of the Division. Be sure to see the article about DeWayne on page 27.

The Division held its annual conference, jointly with Inspection Division, on September 28 and 29. The conference was held at the Sinclair Community Col-lege in downtown Dayton, Ohio. It was well attended in spite of limited advance publicity. Current plans call for the 2007 conference to be held at the same loca-tion. The Division conference is an ideal venue for presenting or hearing papers that are more technical, or more focused on our profession, than are typically

accepted for ASQ's World Congress. You may do well to consider submitting something when the call for papers comes out, especially if it is something that is of immediate practical use. If you don't want to submit a paper, consider attending the conference when the announcement comes out next year. With more papers relevant to our work, and lower cost for the conference, it's a good value.

The CCT recognition coins are being distributed. At this point, if you became Certified as a Calibration Technician before June 2006 you should have already received your coin. Please let me know if you have not.

In the past couple of months the Division participated as an exhibitor at two widely separated Section events. On October 14, I had one of the Division's exhibit booths at the first ASQ Southwest Confer-ence. That conference was a joint effort of Phoenix and Tucson Sections (0704 and 0707) in Arizona, and the Nogales, Mexico Subsection that is sponsored by the Tucson Section. A few days later Jun Bautista exhibited with the other display booth at the Division Night event held by Worcester, Massa-chusetts Section (0110). The Division's presence was very well received in both places. If you are hav-ing similar Section events, local or regional conferences, or other events where it may be beneficial for the Division to “show the flag”, please let a member of the leadership team know. I can't promise we can be present at every event, but they will be seriously considered.

Finally, just to highlight the uncertainties of the current job market, as I write this I am also looking for a job again ...

Graeme C. Payne 2006-2007 Chairperson Email: [email protected]

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CHAIR-ELECT’S COLUMNBy Rick Roberson

You’re fired. Two words no one wants directed at them; but some-times they need to be said. While many of us are in a position not responsible for hiring and firing, this article is for the people that are. I have a question for those people: why aren’t you doing your

job? I encounter people every day and wonder “why do they keep this guy (or girl) working here?” This question pops into my head at many business’ that I go to (and sometimes where I work). I’m not advocating firing people for a sim-ple mistake, but we have all worked with people that have continued to perform below acceptable levels even after months of chances. These are the people I’m talking about. Some people just don’t have the skills to do the job they are in. If I was a professional basketball player, I would think I would be fired quickly. Could you imagine a NBA team with a short out of shape no talent player that they wouldn’t get rid of? There are also people that no matter how much you try to motivate them, they just don’t want to work. Your job as a manager is to ensure the work gets done, so that the company will make a profit. Not firing someone that de-serves it can bring down the rest of the workers. If someone slacking off doesn’t get fired, why should I do my job? Not everyone will react this way, some workers will do their best no matter what happens around them; but some will react to the situation. If people deserve to get fired, they should. It may be a good thing for them. If no one tells them this job isn’t for them, they will continue to do a bad job. I understand that firing someone isn’t easy, and most people don’t want to fire someone, but if that is your job, you must do it. Remember, your boss may be reading this article, and realize you aren’t doing your job.

A wonderful subject this holiday season. Everyone can send hate mail to: [email protected]

FINANCIAL REPORTBy Jay Bucher

The following are the current totals from the MQD accounts:

Checking account: $44,759.55

Money market account: $75,564.24

During the period of January 1, 2006 to June 30, 2006, the division received royalties from the sale of The Metrology Handbook of $2,247.82.

For the life of the edition, 2,193 books have been sold.

Respectfully,

Jay L. Bucher MQD Treasurer

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DEMISTIFYING TEST UNCERTAINTY RATIOS Christopher L. Grachanen

Test uncertainty ratios (TURs) sometime referred to as Test accuracy ratios (TARs) are probably the widest used method for reporting uncer-tainty information about the calibration of a unit under test (UUT) rela-tive to its calibration standards. Reporting TURs became a defacto cali-bration practice with the release of MIL-STD-45662 “Calibration Sys-tems Requirements” (June 1980), superseded by MIL-STD-45662A (August 1988) and subsequently retired and replaced by ANSI/NCSL Z540-1-1994, "American National Standards for Calibration - Cali-bration Laboratories and Measuring and Test Equipment - General

Requirements". Note: ANSI/NCSL Z540-1-1994 was recently updated to ANSI/NCSL Z540-3-2006.

Pertinent to this discussion is ISO/IEC 17025:1999 “General Requirements for the Competence of Test-ing and Calibration Laboratories” becoming an American national standard (ANSI/ ISO/IEC 17025:1999) in July of 2000 (ISO/IEC 17025:1999 replaced ISO/IEC Guide 25:1990 & EN 45001:1989). Note: ANSI/ISO/IEC 17025:1999 has since been updated to ANSI/ISO/IEC 17025:2005.

Now let’s talk TURs. MIL-STD-45662A Section 5.2, ‘Adequacy of Measurement Standards’ specified the following:

‘Measurement standards used by the contractor for calibrating M&TE and other measurement stan-dards shall be traceable and shall have the accuracy, stability, range and resolution required for the intended use. Unless otherwise specified in the contract requirements, the collective uncertainty of the measurement standards shall not exceed 25 percent of the acceptable tolerance for each characteristic being calibrated. The contractor's calibration system description may include provisions for deviating from the uncertainty requirements, provided the adequacy of the calibration is not degraded. All devia-tions shall be documented.’

Simply stated this section says that a calibration standard’s uncertainty shall be at least four times smaller than the UUT’s uncertainty e.g. 4:1 TUR, unless provisions are documented as to the deviation from this requirement i.e. less than a 4:1 TUR, with the qualifier that the adequacy of calibration is not degraded. So for calibration purposes a TUR is simply a ratio comparing a UUT tolerance span (for a symmetrical tolerance) to a calibration standard’s uncertainty. Uncertainty is loosely given to include the aggregate of all uncertainty components making up the measurement process used for calibration. The upcoming new revision of the National Conference of Standards Laboratories International (NCSLI), Recommended Practice 3 (RP-3) entitled ‘Calibration Procedures’ is slated to have an appendix ad-dressing tolerance testing providing guidance for calculating TURs based on a 95% expanded uncer-tainty of the measurement process used for calibration. Using a 95% expanded uncertainty measurement process used for calibration, a TUR is calculated as:

UUT Tolerance span (for a symmetrical tolerance) TUR = ___________________________________________________ 2 time the 95% expanded uncertainty of the measurement process

(Continued on page 8)

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ANSI/ISO/IEC 17025:2005, section 5.4.6 ‘Estimation uncertainty of measurement’, sub-section 2 Note 2, infers the legitimate use of TURs (a well-recognized test method) for denoting measurement uncer-tainty:

‘In those cases where a well-recognized test method specifies limits to the values of the major sources of uncertainty of measurement and specifies the form of presentation of calculated results, the laboratory is considered to have satisfied this clause by following the test method and reporting instructions (see 5.10).’

Since the release of my freeware, Uncertainty Calculator, I am often asked questions regarding measure-ment uncertainty and TURs. Two of the most asked questions are: 1) How do TURs relate to measure-ment uncertainty and 2) Can I legitimately use TURs to denote measurement uncertainty for a calibra-tion in my laboratory? The best explanations I have found for these questions come from two A2LA News releases (the newsletter of the American Association for Laboratory Accreditation). The first one, December-Number 83, relates the following regarding the legitimate use of TURs:

‘One of the most common decision rules involves ensuring that the measurement uncertainty is relatively small compared to the specification. For example, when a specification describes an interval with an upper and lower limit and if the ratio of the uncertainty of measurement to the specified interval is rea-sonably small (e.g., 1:3 or 1:4), then a statement of compliance can be made if the measurement result falls within the specification limits and a statement of noncompliance can be made if it falls outside of the specification limit. If the measurement result falls on one of the specification limits, then neither compliance nor noncompliance can be stated.

The simplest decision rule is "if the measurement result lies within the specification limits, then the product meets the specification, otherwise it fails to meet the specification." Although this rule explicitly ignores measurement uncertainty, seemingly in contradiction of ISO/IEC 17025 requirements (sections 5.10.3.1 and 5.10.4.2), it is allowed per ILAC-G8: “More often, the specification requires a compliance statement in the certificate or report but makes no reference to taking into account the effect of uncer-tainty on the assessment of compliance. In such cases it may be appropriate for the user to make a judg-ment of compliance, based on whether the test result is within the specified limits with no account taken of the uncertainty” ...

Accreditation bodies cannot dictate to accredited laboratories which decision rules must be used in a specific situation since the basis for making statements of compliance is ultimately a matter to be de-cided upon by the laboratory and customer. For that reason, it is vitally important that the laboratory understand the needs of the customer and that the customer clearly state to the laboratory how compli-ance decisions should be made.’

(Continued from page 7)


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The second A2LA News, April-Number 84 relates TURs to measurement uncertainty:

‘Calibration certificates or reports can present measurement uncertainty either explicitly or implicitly. Explicit statements are straight forward and are either applied to each data point or to the calibration process across the range of the calibration. Implicit statements typically appear as either a ratio or as a statement referencing a specification with defined uncertainties. The test uncertainty ratio (TUR) is probably the most common statement of uncertainty and is defined as the ratio of the tolerance of the unit under test (calibrated item) to the expanded uncertainty of the measurand or calibration process. If one knows the tolerance of the unit under test (found primarily in manufacturer’s operating manuals and/or method specifications) and the ratio is presented on the calibration certificate, one can algebrai-cally determine the expanded uncertainty. However, the calibration laboratory still has to prove that it meets the criteria, otherwise it cannot claim that ratio…’

Thus per the aforementioned A2LA News releases one can assert that TURs are a legitimate and viable method for implicitly denoting the uncertainty measurement process used for calibration when agreed upon with a customer. Best business practice is for a calibration laboratory to adequately document evi-dence i.e. design of experiment results, successful completion of proficiency tests, etc., that it can achieve a reported TUR. This is especially true in light of laboratory accreditation assessments.


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ASQ hosted another CCT exam review workshop September 22 and 23, 2006. Eleven CCTs were in attendance, and worked on the next two exams to be given in December, 2006, and June, 2007. The group was also efficient enough to add additional questions to the item pool on their second day of work. We would like to thank Mary Rehm for again providing her expertise and bubbly personality to the workshop.

On behalf of Chris Grachanen, the CCT subcommittee chair, and Graham Payne, our MQD chair, I’d like to thank all of the attendees for taking the time out of their busy lives, both personal and profes-sional, to help review and improve the upcoming CCT exams. Without their assistance and hard work, we would be limited in the number of items available for each exam, and the quality of each item would not be what it is today without their sacrifices and inputs. Congratulations also go out to the new CCT recipients from the June 2006 exam who volunteered their time so quickly to become a part of the CCT program. They truly are Subject Matter Experts, as are all the rest of the attendees. Pictured below are the attendees, just prior to dispersing at the end of the workshop.

From left to right; Jay Bucher (Promega Corp.– MQD Treasurer), Sara Ethier (Haematologic Technolo-gies), Jason Koehn (Boeing Co.), Mark Murray (Bionetics), Rob Schreur (Eaton-Aerospace), George S. Rine (Metrology & Calibration Concepts, LLC), Mike Sumich (AFMETCAL), Emelia Beckley (Rogers Corp.), Woody Niemann (AFMETCAL), Rick Roberson (Bionetics– MQD Chair-elect), and Albert Yau (Hunjan Moulded Product).

CCT Exam Review Workshop September 22 & 23, 2006

ASQ Headquarters, Milwaukee, WI

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THE LEARNING CURVEBy Phil Painchaud

This is the forty-seventh in an uninterrupted series of essays charted to be on the general sub-ject of Metrology Education. We are now in our fourteenth year of writing these open let-ters to our esteemed Boss, the Editor-in-Chief of this some-what periodic journal (the Man-aging Editor takes exception to

this remark…we have produced an edition quar-terly, including this one, for the past two years. Maybe it is time for Phil to update his column in-tro). As usual we shall attempt to remain close to our charted topic which we sometimes cannot due to the lack of current viable inputs on the subject. Dear Boss: This issue we are fortunate to be able to have a col-umn right smack on the chartered subject. I was making a half hearted attempt to go through one of the many piles of old dusty papers taking up space in what is sometimes laughingly referred to as my office. Out fell an old reprint from the IEEE(Institute of Electrical and Electronics Engineers)Instrumentation and Measurement Society News-letter, dated FALL 1990! That’s two years before I started writing this column! It featured a ‘White Paper’ entitled “Education in Measurement Sci-ence” written by an old friend, Mr. Fred Hume. Fred and I have been good friends with consider-able mutual respect since he was a young engineer at the old North American Aviation Downey Facil-ity Calibration Laboratory long before they became Autonetics and moved to Anaheim. He later went to Fluke in Washington and eventually became a Senior Vice-President. From there he went to Keithley in Ohio and became Executive-Vice President. He retired from there and is now Presi-dent/CEO of DATA I/O in Redmond, Washington.

The I&M Newsletter has been out of publication for many years now so I wrote to Fred and asked his permission of quote from his ‘White Paper”. His reply was so overwhelmingly enthusiastic that I have decided to go a step further and used his ‘White Paper’ intact—no changes.

EDUCATION IN MEASUREMENT SCIENCE by

Frederick R. Hume

Introduction

For some time there has been a quiet debate about education in measurement science. In reality it has been not so much of a debate as the expression of many views of a complex subject. These views were explored during IMTC/90 in a panel session, “Education in Emerging Measurement Technolo-gies from the Viewpoint of the Executive Suite,” organized by Mr. Phillip A. Painchaud.

The breadth of the subject was sufficiently great to cause many of those at the session to wonder if anything useful could come from the presentations and subsequent discussion. While there was clearly a diversity of opinion, it is to the credit of the dis-tinguished panelists, and the audience, that what emerged, was a rather complete description of the underlying problems and a consensus that some-thing should be done about it.

“The average graduating engineer or scientist knows little about measurement science.”

Some industrial leaders believe that measurement science is a necessary part of the education of every engineer and scientist and that a separate curriculum and degree is unnecessary. There is evidence to support this view as many professional engineers and scientists in a position where meas-urement science is the end rather than the means find themselves in their position by chance rather than by career planning. Others see a need for educational programs developed specifically to produce professionals educate in measurement science to fill positions in governmental and indus-trial standards and calibration laboratories, and there appears to be rationale for several levels of educational attainment in such a program.

There appears to be a need for continuing educa-tion programs for professionals already employed in positions where measurement science is an im-portant part of the job. The daily practice of meas-


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urement science may not ensure competence in emerging technologies, nor does knowledge of emerging technologies guarantee good measure-ments.

There is a view that the need for education in measurement science is far broader than that ex-pressed in any of the above. Every educated person needs understanding of measurement science, that is the scientific approach to measurement and in-terpretation of results, to be able to function in the information age that is upon us. History supports this view. Every educated individual, just a century ago, was expected to read science, to be scientifi-cally literate and numerate in a broad sense. De-grees in natural philosophy at one time were prevalent at educational institutions. The lay-scientist of yesteryear has nearly disappeared.

Even the average graduating engineer of scientist knows little about measurement science, and is generally unschooled in its vocabulary as well as its substance. The graduate in the liberal arts and the social sciences is in a similar if not worse situation. The scientific debates over such hot top-ics as global warming and cold fusion attest to the need for more complete education in measurement science including such elements as experiment de-sign, error propagation and analysis, traceability, and data analysis and display. Even the skilled practitioners of measurement science lack, or fail to use, a rigorous grammar to describe results.

From this brief summary of the positions presented during the panel session, it is easily seen that the complexity of the problem is great and will not likely yield to simple solutions. It is not even clear what elements of the problem can and should be addressed by the society and what elements of the problem can and should be addressed by the Soci-ety and what elements of the problem should be given to others. There is also the issue of the time horizon of a particular solution. For example, it is obvious that some of the solutions involve changes in education. Those changes will take considerable time to address, as anyone involved in higher edu-cation will affirm.

The Problem:

After you have reviewed the complexity of the problem as identified by the panelists, it is perhaps ludicrous for me to suggest a single statement to comprehend it. There is some merit, however, to put forth an all-encompassing statement as the starting point for developing a solution. In sum-mary then, the problem is this:

Measurement science is not recognized as an es-sential element of the curricula in every scientific course, and instrument and measurement system design is not recognized as an essential engineer-ing discipline.

Before proposing a solution, I would like you to consider some of the constraints that limit the num-ber and scope of possible solutions.

The Constraints:

To the outside, measurement science is not per-ceived to be glamorous work. If a graduating engi-neer has an opportunity to choose between a posi-tion in design and a position in a measurement laboratory, he or she will likely choose the design position.

“There is a need to integrate simple statistics into the assigned problems in undergraduate courses.”

Second, the most important measurements, those that have the greatest impact on society, are made by individuals who do not perceive themselves to be specialists in measurement science. Any solution to the broad scope of the problem must encompass more than the relatively small community of those who consider themselves metrologists.

Some of the problem is bound up with statistics. Statistics taught at the upper division level in an engineering or science curriculum is often abstract and taught without relevance to real measurement problems. There is a need to integrate simple sta-tistics into the assigned problems in the under-graduate science courses to prepare the student for the theoretical material that they will later be ex-pected to master and most importantly give them



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tools that they will use in all of their scientific en-deavors. Measurement science should be to the engineer what a tape measure is to a carpenter.

Fourth, students are not taught to measure “everything.” Too often they are allowed to meas-ure what they can measure instead of being taught to measure what they need to measure. They never learn that to understand something they have to measure it.

Fifth, the four-year curriculum is so full that it is difficult to add another complete subject matter to the education of the engineer or scientist. This con-straint is a blessing. It means that measurement science must be integrated with existing subject rather than represent a separate course that the student may elect, or more likely not, to take.

The scope of measurement science is broad, en-compassing innumerable disciplines in physical and chemical sciences and engineering each re-quiring special knowledge so any degree program would by definition be limited to a specific disci-pline. The difficulty of creating a degree program in a specific discipline is immense; the thought of developing a sufficient number of these is beyond reality.

Measurement science is intensive, incorporating many elements such as: design of experiments, er-ror analysis, parameter selection, data display, data analysis, traceability, error propagation, noise, convolution of parameters, and sensitivity analysis. These are tools that should be applied to a measurement problem in any discipline. Most graduating engineers and scientists have a rudi-mentary knowledge of these tools at best.

Industry forecasts of personnel needs are often sketchy and incomplete, and are always subject to huge uncertainties, albeit not by evil intent as some would suggest. Any attempt to forecast the future requirements for metrologists in the narrow defini-tion of the word, i.e. individuals working in meas-urement laboratories, is likely to be subject to the same uncertainties as any forecast and the conse-quences may be worse than having no forecast at all.

Finally, the body of knowledge that we represent by the term measurement science is not fully codi-fied. Where it is, in the form of international stan-dards, the rules are not followed. There is continu-ing disagreement, ignorance, and unwillingness to observe the few rules that do exist. For example, multiple sets of units are still in use, and multiple sets of standards are used.

The Questions:

Several questions were raised during the panel discussion that are quite provocative and can be useful in making the problem real. Some of these are:

Should measurement science exist as a separate discipline, a thing to itself? Certainly it does, to-day. Should it exist as a discipline coequal with mathematics, physics and chemistry?

Can statistics professors become acquainted with real measurement problems and be persuaded to incorporate them in their textbooks and class ex-amples?

Are many educational programs misguided in teaching technology instead of teaching engineer-ing or science?

Can measurement science as an educational ele-ment be pushed, or is it more likely to be incorpo-rated in the curriculum by the pull forces of de-mand?

Must we resort to subterfuge to get measurement science integrated into the undergraduate curricu-lum?

How can professors maintain awareness of current measurement needs and practice?

The Solution:

The problem as stated is multi-dimensional. It cov-ers every scientific discipline including the social sciences. It covers education at every level from primary to post-graduate. The solution must begin



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with a recognition that the problem exists, and that problem is in education. No such formal recogni-tion exists either in the Society or in education in-stitutions. Since the problem is in education, the solution is in education.

The basic of measurement should be a part of each course in science. A general course in “measurements” will not be sufficiently focused on the specific problems a given student will encoun-ter in their professional life. Institutions of higher education should actively seed the involvement of practitioners of measurement science during the development of curricula and, perhaps, even in the teaching of some course material.

It is clear, however, that no progress will be made until the problem becomes apparent at the highest levels of the educational systems. A piecemeal so-lution at the lowest levels will not work, whether restricted geographically or in a degree program.

A solution has to involve the institutions of higher education. The institutions must be convinced of the importance of measurement science and make it a part of the education of the academically in-clined students who will become the professors of the future. This solution can be faulted in that it is slow and the benefits will not be apparent for many years. One can’t help but wonder if there is some easier, simpler method, one that will produce re-sults within four or five years. Perhaps a better solution will emerge during the review of this posi-tion paper – one that will achieve a consensus of support and that will be enthusiastically endorsed by the community of educators, engineers and sci-entist active in the field.

Throughout this paper, I have used the term, meas-urement science, instead of metrology to avoid the usual restricted sense of the latter. By measure-ment science I mean that body of knowledge one should use in the practice of measurement that lies outside of and is independent of the specific techni-cal discipline. It should be noted that some would argue whether such independence can exist. Where mistakes are made in the restatement of various positions and arguments, they are entirely mine. If some of the points strike a responsive chord it is

due to the quality of the discussion that occurred during the session.

I thank the distinguished panelists, Peter Clifford of the City University of London, Carl Quinn of Simco, Joe Simmons of the National Institute of Standards and Technology, and Doug Strain of ESI, for contributing so much to this session. I would like to thank, also, those who have been so kind as to suggest improvements to this paper, spe-cifically, Steve Adam, Professor Nigel Hancock, Helmut Hellwig, Professor Mike Lucas, and Phil Painchaud. My sincere thanks to Phil for conceiv-ing so provocative and useful a session. I had the distinct honor to serve as moderator.

There it is, word for word, exactly as it was pub-lished in the IEEE I&M Newsletter. I intend to ex-amine in depth and discuss in more detail several of the points that Fred made in this ‘White Paper’ in my next column, Number 48. If any of you have particular points you might like explored, please address your comments, opinions, and questions directly to me. I shall be pleased to credit, publish, and comment on them—I promise.

Meanwhile I am at the same old stand:

PHIL PAINCHAUD 1110 West Dorothy Drive Brea, CA 92821-2017 Phone: 714-529-6604 FAX: 714-529-1109 e-mail: [email protected] e-mail: [email protected]

PROLOGUE: A few days ago our Editor sent me a large quantity of data in digital form (back issues of The Standard). While searching my hard drive for a place to store that macroscopic collection of bit and bytes, I rediscovered a letter that I had writ-ten to Dr. Eugene Watson over twelve years ago. As a lark I sent it on to Jay along with the confir-mation of receipt of what he had sent to me. As a total surprise to me, he came back telling me that he wanted to print it and needed my permission!While this was originally a very personal letter



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from me to Watson, through no doing on my part it was now in the public domain. Gene had printed it in its entirety in his University Departmental Newsletter, “The Squawk Sheet”. I understood that over 5000 copies had been distributed on the campus and elsewhere by request. In addition, he had heard that three professional societies had requested permission of the University to reprint it. I was also told that a visit-ing delegation from Mainland China requested and was granted permission to translate it into Mandarin and distribute it in their country.

In reading this, keep in mind that it was intended to be a very personal letter written by me to my good friend, Dr. Watson at his specific request. In preparing it for Jay, I have done nothing to alter the text of the theme except to correct some spelling and punctuation; and to remove a few spurious words and to add a few connecting words to smooth out the rough spots. PAP

February 13, 1994 Dr. Eugene Watson 11889 Menlo Avenue Hawthorne, CA 90250

Dear Gene:

A few weeks ago, while we were sitting in the Cal State Dominguez Hills booth, at the Measurement Science Conference, we happened to start discussing the current apparent deterioration of today's profes-sional societies, specifically the Precision Measurements Association. You asked me if I could put some of that discussion into writing as you wanted to use it as lecture material in your Masters in Quality pro-gram; and I agreed to try — if you were not in too much of a hurry.

Well I have finally gotten “a round tuit", or at least to attempting to start it. This discourse will be nei-ther brief, concise, nor organized. It will be in my usual wordy rambling style (although I am usually somewhat organized). You should be familiar with it. I wrote a regular column for the “PMA NEWS-NOTES", “RAMBLINGS FROM THE EXECUTIVE DIRECTOR", during the period while you were In-ternational President of the Precision Measurements Association. And they did ramble!! But enough of this bantering, let's get down to business.

As I recall our conversation started with a question from you, "Why (in my opinion, at least) has the prestige of the PMA (and several other professional societies for that matter) degenerated so much in recent years? I replied over simplistically, "Because they no longer have genuine professionals exclu-sively holding office and ‘running' them." My "2X4-between-the-eyes" one liners often provoke discus-sion; this one was no exception.

Let's start by trying to define a Professional (by this I mean ‘Professional’ as a stand-alone noun and not as a descriptive adjective), and as we shall see, this can become a very complex problem. The great late Quality Guru, Dr. W. Edwards Demming is reputed to have once said, “For every complex problem, there is an obvious simple solution — always wrong!!!" I believe that defining Professionals and Pro-fessionalism falls within that area. And, that a substantial part of this problem has been generated by people attempting to generate simple definitions — usually for their own benefit — and "always wrong".



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It is true that Professionalism is frequently attempted to be defined in terms of education, technical train-ing, managerial stratum, pay scale, “manuality” (Hey, I think that I just invented a new word) of the work performed, dress code, or you name it.

—To illustrate the absurdity of some of the criteria often used by many people to determine professional status: Once, many years ago when I was a member of the committee to select the laureate recipient for the "Andrew J. Woodington Award for Professionalism in Metrology", there had been a candidate pro-posed whose sole ‘qualifications’ were suave European manners, impeccable dress, and a slight accent!!

His management at the large aerospace facility where he was employed had hired and classified him as a Professional in their Metrology Organization solely on these factors alone. He had no education or train-ing, nor had he any experience for that matter, in any pertinent technical discipline; yet he had been as-signed to a responsible middle management position in their large, highly technical, and otherwise well respected metrology organization.

He had eagerly volunteered his services to the Measurement Science Conference organization. He had been assigned considerable Conference responsibility based upon his employment level, and he had seemingly ardently embraced that assignment.

Awhile later, he came to those who were depending upon him and announced that he was quitting then and there because his "employer had refused to pay him overtime for his volunteered MSC respon-sibilities"!!

When asked for documentation on his efforts to date, as time was becoming critical, he answered, "I am a manager and as such I do not perform tasks myself. I oversee those who do perform the work. I was not assigned any staff to perform these tasks for me and, since I do not recruit personnel, naturally noth-ing was done!" Despite this performance there were those in the Conference hierarchy who still believed that he was a true Professional because of his very suave manners, his slight European accent, his impec-cable dress, and because an employer had so classified him! (— Note: He was rejected for the Award! — Shortly thereafter his employer eliminated him.)

True Professionalism is completely unrelated to any of those factors mentioned above. It has nothing to do with achievement, or more precisely, with the level of achievement. There are Professionals at the entry levels as well as at the highest possible summus. And, there are non-Professionals (and also, I am sorry to say, un-Professionals) in those positions as well. It is also unrelated to compensation; there are true Professionals among the homeless and destitute as well as among the most affluent. Some people believe that by receiving money for performance of some service, that alone makes one a "Professional” in that field. — No way! [e.g.; Professional prostitutes — Professional Bank Robbers — ?????] True Professionalism is a very difficult (if not impossible) attribute to define. But let's try anyhow:

First, a true Professional must be totally committed and dedicated to whatever task or series of tasks in which he has agreed to participate, without regard for compensation. And, he must be willing and able to both obtain and to consummate these responsibilities without the solicitation of, or the intervention of, outside individuals or organizations (i.e. personal agents or labor unions.) In fact the very concept of Professionalism is the anathema of unionism; the two cannot co-exist in the same world. (A sort of mat-ter vs. anti-matter situation.)

Once committed, the Professional completes the task irrespective of whatever obstacles develop. True,



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occasionally there are unforeseen developments that can make the task completion physically impossi-ble. For example; in the case of our fine mannered friend described above, he could have been trans-ferred by his employer to a wild outpost on Attu; which would have made his physical performance of the agreed upon tasks impractical (but it would in no way have exculpated him from his failure to have started the work himself with or without a staff.)

Over the years I have talked to many young people, often to Metrology Technicians, aspiring to become Professional Metrologists in the upper strata. Frequently they have complained to me that they "cannot do this or cannot do that” towards professional achievement, "because our Union won't let us"; or some-times even "our manager (or management) won't let us", or "our company won't pay for it"!

Invariably I reply: — "What has that got to do with it?" “Why are you in a union in the first place if you aspire to become a Professional?" Or "Why are you working for a manager (or management) who are so un-professional themselves as to impede rather that enhance your Professional development?” Or, "What do you mean the company won't pay for it? Your Professional development is YOUR responsi-bility alone. It is not your employer’s responsibility to pay for any part of the costs of your professional training, including tuition, Professional Organization dues, text books, seminars, and the like. It is your sole and personal responsibility to withstand all of these costs. IF your employer wishes to compensate you for expenditures you have made towards your Professional development WITHOUT STRINGS AT-TACHED, then by all means accept it and cherish that employer as there are very few of them among those MBA run organizations today that can look that far ahead — "

“It is true that jobs are scarce, but places at the top among the True Professionals are even more scarce. You must decide early in your career development whether you are intending to become a drone with artificial ‘security’ in a comfortable cocoon, or whether you truly aspire for the apogean position of the True Professional; and then stick to it without deviation for the rest of your career. In other words, the True Professional must be totally dedicated to becoming and remaining a True Professional for life. It is not something that can be turned on or off as might suit the mood of the moment or as might comple-ment the color of one's tie or scarf. There is no compromise, and like virginity, the decision is final for life." — I have repeated those above statements many times.

Next, to be a True Professional, one must forever divorce oneself from pecuniary goals as being the pri-mary or even a major objective. By this I most certainly do not mean that Professionals must take a mo-nastic vow of poverty and live a penury lifestyle. Quite to the contrary! Gene, both of us know both from experience and by observation that a True Professional, living rigidly by professional precepts, can in-deed achieve a very comfortable lifestyle for himself and his family. (Remember, however that ‘comfortable' is in no way synonymous with `greed' and/or `avarice’, as many in the present generation seem to believe.)

Let me illustrate this point: A few weeks ago, while driving through Seattle I got caught behind a city bus. Staring me in the face I saw a sign on the back of that bus advertising an HMO. It said: —

"WHEN THE PROFIT MOTIVE IS REMOVED,THE PHYSICIAN CAN BECOME THE TRUE HEALER".

Since I had already started this letter and it was on my mind, I became sensitive to the possibility of paraphrasing it to the context of my theme. So I pondered; "Physicians are generally considered to be Professionals, and we all know that few physicians, irrespective of whether they are in private practice



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or employed by an organization, are starving unless they choose to; therefore why can I not expand this truism generically to include other Professionals?" Thus: —

WHEN THE PROFIT MOTIVE IS REMOVED, THE PRACTIONERCAN BECOME THE TRUE PROFESSIONAL.

Those two attributes are important, but they are only the beginners, there are several more just as impor-tant attributes; however there is one additional attribute which is so supremely vital that we will leave it for last.

The next attribute I shall discuss is CLASS. If you think that Professionalism is difficult to define, wait until you try this one. I was almost ready to give up, but as a Professional, I am not permitted the luxury of quitting, as I gave you my word that this task would be consummated.

There is nothing at all amiss for a Professional seeking and using assistance, (provided that the assis-tance is acknowledged freely and openly). I finally found a definition of “CLASS", much better than any that I could write in an Ann Landers’ Column in The Los Angeles Times. (Sorry, I could not find the publication date). It goes like this:-

—— CLASS ——

CLASS never runs scared. It is sure-footed and confident. It can handle whatever comes along.

CLASS has a sense of humor. It knows that a good laugh is the best lubricant for oiling the machin-ery of human relations.

CLASS never makes excuses. It takes its lumps and learns from past mistakes.

CLASS knows that good manners are nothing more than a series of petty sacrifices.

CLASS bespeaks an aristocracy that has nothing to do with money. Some extremely wealthy peo-ple have no class at all while others who are struggling to make ends meet are loaded with it.

CLASS is real. You can't fake it. The person with class makes everybody feel comfortable because he is comfortable himself.

If you have CLASS you've got it made. If you don’t have CLASS, no matter what else you have, it doesn't make any difference.

—ANN LANDERS—

I can't add much to that, except to reiterate that a Professional must have CLASS.

While I was searching for a satisfactory definition for Class, I also found a very good one for Maturity, another essential attribute of a Professional. Again it is from Ann Landers, in the Los Angeles Times,January 8, 1991. (Don't you believe for one minute that I am just a smitten Ann Landers buff; I also read her sister Abbey's column faithfully. There is a lot of learning to be had from those two women.) Next attribute; a Professional must be MATURE. And here I am not referring to physical maturity, but rather psychological, emotional, and ethical maturity. Ann describes them far better than I can do: ---



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—— MATURITY —— MATURITY is the ability to control anger and settle differences without violence or destruction.

MATURITY is patience. It is the willingness to pass up immediate pleasure in favor of long-term gain.

MATURITY is perseverance, the ability to sweat out a project or other situation in spite of heavy opposition and discouraging setbacks.

MATURITY is the capacity to face unpleasantness and frustration, discomfort and defeat, without complaint or collapse.

MATURITY is humility. It is being big enough to say, "I was wrong." And, when right, the mature person needs not experience the satisfaction of saying, "I told you so."

MATURITY is the ability to make a decision and follow through. The immature spend their lives exploring endless possibilities and then doing nothing.

MATURITY means dependability, keeping one's word and coming through in a crisis. The imma-ture are masters of the alibi. They are conflicted and disorganized. Their lives are a maze of broken promises, former friends, unfinished business and good intentions that never materialize.

MATURITY is the art of living in peace with what we cannot change, the courage to change what we know should be changed, and the wisdom to know the difference.

----------ANN LANDERS---------- All that I can add to that is, "A True Professional must have MATURITY"!

Gene, the way my ramblings are going, this letter could become a life-time career in itself. I have many other things that I want to accomplish before I tread off this mortal soil, so we must bring it to a halt soon despite the pleasure I am having writing it. Before we finish, let's examine just one more attribute of the True Professional and one that I feel is the most vital of all: i.e., PERSONAL AND INTEL-LECTUAL IINTEGRITY.

Most Professional attributes must naturally take a form or manifestation commensurate with the require-ments of the specific profession of the Professional of interest. I am not a physician, I am not an attor-ney, I am not a clergyman, and I am not even a nuclear physicist. I would like to believe that I am a Metrologist, a Professional in Metrology; in the science of measurement. So I feel that in order to au-thoritatively discuss this attribute of Professionalism, I must draw from my own field for illustration and example.

I often lecture (`soapbox' might be a better term) to young aspirants to Metrology (or to anyone else who listens, willing or not) on the topic of INTEGRITY. I usually start by saying something like this: "A Metrologist's Integrity and his Ethics must be at all times absolute and unquestioned. And this applies to his personal life as well as his public (or professional) life. Ethics and Integrity cannot ever be tog-gled off and on. If switched off, even for a fleeting instant, confidence in that individual is lost for-ever.—— "



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"Look at it this way", I have often explained, "The precise combination of factors effecting a specific measurement exist only once; they probably will never again be precisely repeated throughout all eter-nity. The Metrologist makes and reports the measurement knowing that all of these pertinent factors have been accounted for and have been included in his algorithm. In doing so he attests that:

“He has, in the first place, measured the correct parameter(s) for the problem at hand, and not just those ones which happened to be of interest to him personally, or were at that moment more politi-cally correct, or just happened to fit his personal expertise or the resources available to him.

"He knows and has adhered to the correct measurement procedure;

"He has selected and used the proper measurement implement whose parameters are currently certi-fied to valid and accredited measurement criteria;

"He has evaluated all knowable environmental factors and has suitably compensated for their effects on the measurement of interest;

"He himself has the knowledge, the skills, and the abilities to perform the measurement, evaluate the data, and report the results factually, irrespective of the consequences of the truth."

"And he must be able do all of this knowing that no one will ever be able to `check up on him by repeating the measurement precisely as he performed it. —

`As the precise combination of those factors effecting that measurement will never again exist through all eternity'!

Only when the Measurer can and always does perform in this manner can he truly be called a Metrolo-gist. And a true Metrologist must be a True Professional.——"

As I said before I am not qualified to draw Integrity and Ethics illustrations for other disciplines, but I believe that you can draw your own illustrations for other technologies patterned after my illustration above. Just let me say that the True Professional must have unquestioned and unquestionable Ethics and Integrity.

Well Gene, this is a long way from where we started, seven pages and seventy kilobytes from your ques-tion about why the apparent decline of today's Professional organizations.

Now let me ask you a question. How many of the people you know, especially those who are heading today’s Professional organizations, possess ALL of the attributes that I have discussed above? A TrueProfessional must possess and live all of them, all of the time. Thanks Gene for your invitation to let me expound, I hope that I have explicated (or is that pontifi-cated?) to your satisfaction.

Sincerely,

PHIL PAINCHAUD



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EPILOGUE: Now that you have read my personal letter to Dr. Watson that just happened to get pub-lished, you could logically ask, “What happened next?” “Did you receive any responses?” The answer is: ‘Directly No’. I received not a single direct response from the five thousand odd readers of the Dominguez Hills Newsletter, or from the (estimated) 20-25 thousand Professional Society reprint read-ers, and none from the however so many Mandarin translation readers.

I did receive a request from Dr. Don Drum at Butler County College to redo that letter into a full blown lecture for presentation before that institution’s Metrology classes. That I did and over a span two years it was repeated eight times including three special versions requested by the Administration. One was for the general public of Butler County (that was covered by the local TV station and two local AM/FM stations); a second for presentation before an invited audience consisting of students and faculties from seven regional universities, and a specially revised version for presentation to the students of the Phi-losophy curriculum there at Butler.

When Dr. Watson saw the video tapes of the Butler presentations, he asked me to again present the lec-ture before several of his Masters in Quality classes, both on-campus and on-site. But that wasn’t the end; when the Sigma Xi Scientific Research Honor Society decided to hold its National Honors Award Meeting on the Dominguez Hills campus, Dr. Watson (who was Vice-President of the local chapter) was tapped to produce a keynote speaker. “Phil, could you take that 2½ hour lecture and condense it into a 10 minute keynote?” “No way!” But I did manage to squeeze to 25 minutes.

When I thought it was all over, the Precision Measurement Society (the local group in the San Francisco Bay Area, not to be confused with the international group the Precision Measurements Association based in the Los Angeles Area) heard about it and asked me to come to San Jose and present it at a cou-ple of their meetings. This I did. When the PMA heard about this of course I was compelled to present it before their Orange County Section.

What did I gain from all of this? Monetarily speaking, I received “not a farthing” — had I accepted any pecuniary remuneration I might have lost my amateur status. On the other hand the Professional gratifi-cation I have received from these efforts is almost beyond comprehension. I find it difficult to describe the satisfaction one can acquire when you have many apt listeners hanging onto your words, permeating them inward, and attempting to comprehend them in terms of themselves.

I would not be wholly truthful, and hence not a true Professional, if I did not admit that there has been some non-monetary compensation. In recognition of my work at Dominguez Hills, Dr. Watson knowing my love for classic technical tomes, arraigned to have me presented with a set of the MIT Radiation Laboratory Series, long out of print. I suppose that it was he who influenced the Sigma Xi Scientific Re-search Honor Society to present me with a copy of ALTERNATING CURRENT BRIDGE METHODS by B, HAUGE, ScD., a book that I have coveted since my college days. Butler, in a very public ceremony, bestowed their unique DISTINGUSHED VISITING SCHOLAR AWARD and if that were not enough, created a permanent VISITING CHAIR OF METROLOGY.

The moral of this story is that you can never predict what might result from a casual conversation be-tween two old friends who just happen to sit in an empty booth at a Measurement Science Conference to rest their weary feet.

Phil A. Painchaud


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THE LEARNING CURVEBy Phil Painchaud

This is the forty-eighth in a somewhat uninterrupted series of essays originally charted to be on the general subject of Me-trology Education. We are now in our fourteenth year of writing these open letters to our es-teemed Boss, the Editor-in-Chief. As usual we shall attempt to remain with our charted topic

which frequently we cannot due to the lack of cur-rent viable inputs on the subject. (Why is it that you folks from Butler, Ridgeway, and Dominguez Hills and those other institutions professing to be teaching Metrology are continually ‘hiding your light under a bushel’? Speak up of your accom-plishments and let us publicize them!).

Dear Boss:

We do not usually go in for much humor in this column, however I think that this one is worth re-peating. I found it among a pile of old papers. I have no idea from whence it came or who sent it. It was on a sheet torn from some other publication with only the date showing—September 2002. It was titled ON THE LIGHTER SIDE.

As we all know, it takes one calorie to heat one gram of water one degree Celsius. Translated into meaningful terms, this means that if you eat a very cold dessert (generally consisting of water in large part), the natural processes that raise the consumed dessert to body temperature during the digestive cycle literally sucks the calories out of the only available source, your body fat.

For example: A dessert served and eaten at near 0 °C (32.2 °F) will in a short time be raised to the normal body temperature of 37 °C (98.6 °F). For each gram of dessert eaten, that process takes ap-proximately 37 calories as stated above. The av-erage dessert portion is 6 ounces, or 168 grams. Therefore, by operation of thermodynamic law 6,216 calories (1 calorie/gram/degree x 37 °C x 168 grams) are extracted from body fat as the des-sert’s temperature is normalized. Allowing for the

1,200 latent calories in the dessert, the net calorie loss is approximately 5,000 calories. Obviously, the more cold dessert you eat, the better off you are and the faster you will lose weight, if that is your goal.

This process works equally well when drinking very cold beer in frosted glasses. Each ounce of beer contains 16 latent calories, but extracts 1,036 calories (6,216 calories per 6 ounce portion) in the temperature normalizing process. Thus the net calories loss per ounce of beer is 1,020 calo-ries. It doesn’t take a rocket scientist to calculate that 12,240 calories (12 ounces x 1,020 calories/ounce) are extracted from the body in the process of drinking a can of beer.

Frozen desserts such as ice cream, are even more beneficial, since it takes 83 calories/gram to melt them (i.e., raise them to 0 °C) and an additional 37 calories/gram to raise them to body tempera-ture. The results are remarkable, and beat run-ning hands down.

Unfortunately for those who eat pizza as an ex-cuse to drink beer, pizza (loaded with latent calo-ries and served above body temperature) induces an opposite effect. But, thankfully, as the astute reader should have already reasoned, the obvious solution is to drink a lot of beer with pizza and to follow up immediately with large bowels of ice cream.

We could all be thin if we were to adhere relig-iously to a pizza, beer, and ice cream diet.

[AUTHOR’S NOTE AND DISCLAIMER: SINCE I DO NOT KNOW NOT THE ORIGIN OR THE SOURCE OF THE ABOVE ADVICE, I AM UNABLE TO VOUCH FOR LEGITI-MACY OR EFFICACY. THE READER MUST EXPERIMENT AT HIS/HER OWN RISK. —PAP]

In our last issue (Column 47), we reprinted a “White Paper” written by an old friend, Mr. Fred Hume. I promised you that in subsequent issues I would discuss some of the points Mr. Hume raised.


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He asked six questions:

1.-Should measurement science exist as a sepa-rate discipline, a thing to itself? Certainly it does, today. Should it exist as a discipline coequal with mathematics, physics and chemistry?

2.-Can statistics professors become acquainted with real measurement problems and be per-suaded to incorporate them in their textbooks and class examples?

3.-Are many educational programs misguided in teaching technology instead of teaching engineer-ing or science?

4.-Can measurement science as an educational element be pushed, or is it more likely to be incor-porated in the curriculum by the pull forces of demand?

5.-Must we resort to subterfuge to get measure-ment science integrated into the undergraduate curriculum?

6.-How can professors maintain awareness of current measurement needs and practices.

Now let us discuss those questions one at a time. Of course this discussion will inevitably be biased with my personal opinions. If you do not care for what I believe, challenge me, right here in this col-umn.

First question: “Should measurement science exist as a separate discipline, a thing unto itself? Cer-tainly it does, today. Should it exist as a discipline coequal with mathematics, physics and chemis-try?”

First answer: Measurement Science (Metrology) does indeed exist as a separate science and always has. The fact that this has not been so in the minds of many otherwise knowledgeable people does not make it non-existent. If it were not a distinct defin-able discipline, and has not been so for millennia past, how could the great Lord Kelvin have fin-ished his immortal quotation: “----so therefore,without Metrology there can be no science”. It is

not just co-equal with Mathematics and the sci-ences of Chemistry and Physics, it is fundamental to them. In retrospect, it appears that Mathematics must have been developed as a tool to quantize early man’s measurements (probably of his land holdings as he transformed from hunter to agrar-ian). It was later, as man became interested in the Matter and the Forces that had to deal with, that he began to need to quantize those matters of interest. Thus the quantizing tool of Mathematics became involved and the sciences of Chemistry and Phys-ics became created.

Second question: “Can statistics professors be-come acquainted with real measurement problems and be persuaded to incorporate them in their textbooks and class examples?”

Second answer: ‘Statistics Professors’ are, at least in my experience, simply Mathematics Professors who just happen to be teaching that branch of mathematics we call Statistics. My personal experi-ences with Mathematics instructors in general may not have been typical, but with a single exception, I found them to be a very poor lot indeed—far re-moved from reality and usually with poor teaching abilities. Too bad that all of our mathematics/statistics instructors cannot be modeled after Pro-fessor Charlie Eppes of the TV Show ‘NUMB3RS’! I will not be a defeatist and say that it cannot be done, but it may require a long uphill battle to persuade most of the teaching branch of the Mathematics fraternity, Statistics or otherwise, to join the real world and include Metrology appli-cations within their theoretical curricula.

Third question: “Are many educational programs misguided in teaching technology instead of teaching engineering or science?”

Third answer: Here we could be caught in a seman-tics trap. I know of no rigid incontrovertible defini-tion for the term Technology in respect to curricula. Everyone involved or interested seems to have gen-erated and applied their own definitions and ex-pects the world understand their precise semantic implications. If Mr. Hume in this White Paper was equating Technology Education with VocationalTraining, then the answer might be “Maybe yes



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and maybe no”. It depends entirely on what are the objectives of that Program at that institution.

We must keep in mind that the Metrologist, the Metrology Engineer, and the Metrology Technolo-gist (or Technician if you prefer) are three distinct individuals; each with distinct but overlapping backgrounds and job requirements; each with dif-ferent educational/training requirements; and each vitally essential to our overall Metrology practice. (We might here note that the Calibrator is a highly trained specialist within the Metrology Technolo-gist category.) The practice of the Science of Me-trology is totally dependent upon these three dis-tinct specialists—the loss of any one makes the existence of either of the other two virtually mean-ingless.

The purpose of this column for the past fourteen years has to stress the need for increased education for Metrologists and to a lesser degree, Metrology Engineers. We do not deliberately overlook the vocational training of the Metrology technologists, as we agree that they are as vitally essential as are the other two categories; however it appears that training opportunities for Technologists do exist. They may need recruiting assistance, but they do exist. Some, such as the Military Schools, have been doing a commendable job of producing supe-rior Calibrators and other Technologists.

Well Boss, I am starting to run out of space, but I do have a question—I wonder how many of our rank and file members are reading The Standardand this Column? So I am going to run a small con-test to give me a clue. In Column 46 (remember all of THE LEARNING CURVE columns are num-bered) near the end I asked a question. I am not going to repeat the question as I want you to go back and look it up. I am offering a real prize for the best and most complete answer. The prize: I have in my pocket a nice crisp United States Treas-ury Note, Serial Number AL95095590C in the sum of $100. That item, or equivalent, will go to the individual who furnishes me with what I consider to be the best and most complete answer to that question.

Naturally we must have a few rules:

1: I shall be the sole judge of the eligibility of any winner and of the completeness and accu-racy of their answer.

2: Only rank and file members of the Measure-ment Quality Division in good standing (i.e. dues paid up) will be eligible. All officers and coordinators, past and present and all staff members are ineligible.

3: All answers must be in written form and sent via U.S Mail. No phone calls, Faxes, e-mail, smoke signals, telegrams, or semaphores.

4: All answers must be in my hands (not just postmarked) by January 2, 2007.

5: No prize will be awarded if no answer, in my judgment, meets my criteria for accuracy and or completeness. In the unlikely case of duplicate winners the prize will be split.

I am still at the same old stand:

PHIL PAINCHAUD 1110 WEST DOROTHY DRIVE BREA CA, 92821-2107 Phone: 1-714-529-6604 Fax: 1-714-529-1109 e-mail: [email protected] or

[email protected]


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Participants from Phoenix, Tucson, and Nogales were on hand, October 14, 2006, to listen/participate in our first annual Southwest Conference. Tom Pyzdek, one of the foremost authorities on Quality Engi-neering/Six Sigma, gave a through overview on the seven quality tools. Our conference dealt with a ba-sic concept in the quality ream – how to make sense of all that data. This was accomplished in a dy-namic Quality Café demonstration of the seven quality tools. Everyone enjoyed the structure and the hands on approach to the topic. Mark your calendar for the next years Southwest Conference.

I’d like to personally thank Michael Say (CCT#328) for volunteering to assist the MQD.

Elías Monreal ASQ0707 Chair Elect

The following are photos taken during the conference.

Our illustrious Chair, Graeme Payne in front of the MQD traveling booth. Thanks, Graeme, for attend-ing and representing our division.

On the following page are two more photos. The first, I assume (we all know what happens when we do that…) is Tom Pyzdek giving his presentation. The second photo is another one of Graeme, but there were no accompanying explanations given with the photos. Sorry. I could make a wild guess, or add something cute, but I’m already in enough trouble with what I put under photos as it is.

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DeWAYNE BURLE SHARP

AUGUST 12, 1926—OCTOBER 31, 2006

Wednesday, September 11, 1963 was a rainy day in Chicago. In a conference room of McCormick Place, I had just finished delivering a requested paper on the pooling of measurement devices before an audience of skeptics during the Annual Convention of the Instrument Society of America. Naturally there were a number of individuals that wanted to question me afterwards concerning my paper. One, a large tall fellow, seemed reticent and hung back until all of the rest had their say. When it was finally down to just the two of us, he stepped up, introduced himself, and presented me with a card. But the card was unusual—it did not conform to the norm for business cards—it was neatly hand printed! I must have done a double take for he quickly explained, that although he was head of the Metrology functions for the San Jose facility of IBM Corporation, his organization reported through the Manufacturing channels. And, that current IBM Policy prohibited any Manufacturing personnel having printed business cards. Here indeed was someone after my own heart—one who knew how to legally circumvent illogical pol-icy in order to get a job done! There and then was bonded a friendship, closer than between many broth-ers, one that lasted for forty-three years.

A half year later, by chance we were both attending a conference in Palo Alto; there our earlier acquaint-anceship became renewed and, as circumstances proved, became greatly strengthened. DeWayne was a Board Member of a local Bay Area professional group; I was President of another similar organization in Southern California. Both he and I were endeavoring to merge the two and eliminate unnecessary ri-valry. Somehow severe personal animosities had developed between members of the two groups. He invited me to speak before his Board to try to quell the bitterness. When I arrived, both he and I were


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very adamantly told that my presence was not welcome and, that if he persisted, severe repercussions might surely occur to him. DeWayne, undaunted, then made a long pointed speech stressing open mind-edness, fair play, good manners, and tolerance. I was then allowed to speak before very a non-receptive audience—he in turn was immediately voted off of the Board, and was never again permitted to hold office in that organization. A friendship was proven. However, he did eventually gain the top office in that other organization.

Several years later, my employment took me from Southern California to Oakland—not that far from San Jose. I still had that hand printed card with a telephone number on it. I called it and said, “If you come up to Oakland, I’ll buy lunch”. That was the beginning of a close relationship and frequent visits both ways and the many things that we did together.

During the remainder of our relationship he: Served on the “California Professional Metrology Commit-tee”, an agency of the California Legislature charted to develop legislation for the licensing of practitio-ners in the Measurement Sciences; was appointed by Governor Ronald Reagan to the “Governor’s Com-mission for the Upgrading of the California Weights & Measures System”; was appointed an Official United States Delegate to the International Electro-Technical Commission 31st General Assembly in London and in Washington to the 33rd two years later; this official travel was on diplomatic passports and took him not only to London where he was, with his wife, formally received at the Court of St, James, but also to Paris, Einhoven, Berlin, Stuttgart, Sindlefigen, Mainz, Budapest, and Copenhagen. In Budapest he presided at the formation meetings of Working Group 1, Technical Committee 66A (Pulse Techniques and Apparatus) of the IEC, charged with the task of developing the International Standard in Time Domain. In an allied capacity he was Vice-Chair of the IEEE Sub-Committee on Pulse Tech-niques, the organization paralleling the IEC in the development of the United States version of the Stan-dard.

Nevertheless, he also had a singular career well removed from the political area. He headed the premier Metrology laboratory of the IBM Corporation and established within it the West Coast anchor of the NBS “Round Robin” voltage certification program. He became Chairman of the IBM Corporate Metrol-ogy Task Force, the organization responsible for unifying Metrology operations throughout the Corpora-tion. DeWayne went on up within IBM to create a function dedicated to developing and selling applica-tions of their products for unconventional uses.

He became active in the Instrument Society of America and was the principal contributor to their West Coast journal; he held office in the local Silicon Valley Section. He served two two year terms as Direc-tor of the ISA Metrology Division; he became a Regional Vice-President and was eventually made an ISA Fellow.

After being voted off of the Board of the aforementioned Bay Area society, he joined the other organiza-tion, the Precision Measurements Association, and helped found the San Francisco Bay Area Section, where he eventually became a Director on the National Board and later International President.

He conceived the concept of and vigorously recommended the creation of the Measurement Science Conference; he became active in it; and headed it during its most tumultuous year, 1978. There he showed the sageness of a Supreme Court Justice in arbitrating a threatened suit of comprehensive mag-nitude by a disgruntled exhibitor. He showed compassion and strength in his expedient handling of the loss of a key staff member to a deranged murderer by recommending, in his memory, the creation of and selling the concept of the Woodington Award, to become the highest possible recognition that the Me-



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trology Community can bestow on one of its members.

He became the Founding Editor of this publication, THE STANDARD, the periodic journal of the Measurement Quality Division of the American Society for Quality, and guided it through its early dec-ade.

But these are all things that DeWayne accomplished professionally, what about him personally? During our many years of close contact and traveling together, he told me many things about himself. I not cer-tain that I have many of these bits and pieces in proper chronologic order, but I shall try.

Like most people, DeWayne was born, but unlike most people he was born by accident— in Canada. You see DeWayne’s father had a new job out in one of the Western States and his mother was traveling by train to join him. As you know some trains from Buffalo to Detroit travel through Ontario, Canada. Mrs. Sharp went into labor while the train was in Ontario, the conductor had the train stopped and she was taken to a nearby hospital to complete the delivery. Thus DeWayne was never eligible to become President of the United States—he was foreign born—by accident!

Mr. Sharp eventually landed a longer term job building the Grand Coulee Dam in Washington State. So DeWayne spent his early years and youth in the town of Grand Coulee, Washing-ton. They later moved to Seattle where DeWayne went to Lincoln High School four years behind my late wife, Arlene. They both suffered under the same martinet English teacher, the knowledge of which endeared them when they met years later.

When World War II came along, DeWayne like most young men of his generation, went into a service; he to the Navy. There he trained as an Electronic Technician and was eventually assigned to serve on a hospital ship attached to the Seventh Fleet in the Southwest Pacific. Out of the service he, like so many of us, went on to school; he to the University of Washington, where eventually he majored in Journal-ism. That got him into small radio stations throughout the Mountain States reading the news, but he found that he could also be a disk jockey at the same time— that paid a little more. Thus he became known as “MONTANA SLIM” for some listeners and as “STAY UP STAN THE ALL NIGHT RE-CORD MAN” to others.

With this country western experience behind him he got the news spot at a much larger station in Mount Vernon, Washington. That station was building a TV outlet and needed an engineer, so with his Navy electronics background he was able to quickly acquired a degree in Electronics and the necessary FCC license, and got to run the station. But the wanderlust struck again and he headed for Alaska. There he met Virginia and the result you should know, a family of three children, and I am not sure of how many grandchildren.

Well, radio station disk jockeying in Alaska is not the most lucrative occupation to have when you are trying to raise a family, so there was a move to Denver and a job at the Martin defense plant. That move got him into Metrology. He was assigned to create the Metrology Organization from the ground up. IBM heard of the things that he did there and lured him and his family to San Jose to do the same for them. The rest is history as I have narrated in the beginning of this saga.



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During my many years of life I have lost many kinfolk and friends, but none have struck at me more deeply than the lost of DeWayne Sharp. Good bye old Friend and farewell.

I’ll close with the moniker you assigned to me several years ago in one of your numerous editorials:

YOUR RESIDENT PUNDENT, THE SAGE OF THE BREA HILLSPhil Painchaud


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BOOK REVIEW Note: I generally do Book Reviews as an integral part of one of my columns; in this case however, our Editor has requested it be done as a ‘stand alone’. Phil Painchaud

Title: The Quality Calibration Handbook

Sub-Title: Developing and Managing a Calibration Program

Author: Jay L. Bucher

Publisher: American Society for Quality, Quality Press, Milwaukee. 53203

Copywrite: © 2007 American Society for Quality

Library of Congress Number: 2006-027515

International Standard Book Number: ISBN—10:0-87389-704-8

Contents: 4 Parts consisting of 20 Chapters, 204 Pages, 24 Figures, 10 Tables

Price: Not Available (see the Editor’s note at the end of this review)

It is difficult enough to properly and unbiasedly analyze and review a published book, but this one pre-sented certain unusual problems. First and foremost, the book has not as yet been printed and distributed, thus it had to be analyzed from a downloaded copy of the final draft on a computer screen. (204 pages is an unreasonable quantity to print on a computer printer) This indeed creates a difficult environment for careful examination. A second item of concern, the author is our Editor; hence a certain degree of con-servatism (not generally characteristic of us) must be maintained in order to not damage an otherwise harmonious relationship.

Those of you who are regular readers of our column, THE LEARNING CURVE in the ASQ/QMD jour-nal THE STANDARD should be familiar with the thesis we have presented many times: The practice of Metrology is like a three legged stool, all three legs are equally important and necessary for its support and stability. These three legs are the Metrologist, the Metrology Engineer, and the Metrology Tech-nologist (The Calibrator being a highly trained specialist, a very special sub-set of the Metrology Tech-nologist.). And that in the ideal Metrology organization, these three are under the direction of an Ad-ministrative Metrologist, an individual who has an adequately acceptable and demonstrated compe-tency in all of the functions and all of the technologies required of his subordinates, as well a mastery of the arts of Administration and Leadership.

After studying this book we are not quite sure how it is aimed. First of all its title says that it is a “HANDBOOK”. I beg to differ with the author, a “Handbook” is a document intended to be a refresher or reference for someone already well versed in the subject of interest. This work is definitely not aimed at the already practitioner of Calibration Management, but rather at the aspirant. Thus it more probably should be classified and titled as a Text Book or even possibly as an Instruction Manual; thus following the more traditional usage that a Text is a document intended to Educate the reader in the principles of the topic or interest, both fundamental and advanced; and an Instruction Manual is a “how to do it”document (e.g., the Instruction Manual that came with your VCR.) intended to Train an operative in the use of certain devices or procedures.


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The Author in his PREFACE touches upon the incompetence of certain Auditors; this brings to mind an old New England adage we learned many years ago: “Thems that can, do; thems that can’t, teach”. This could easily be revised to fit today’s environment as “Thems that can’t, audit”. We ourselves have ex-perienced many instances of similar encounters. Too often such nonsense comes not just from the agents of the Regulatory Agencies, but from within ones own organization. This is usually due to ignorance by hierarchal administrative personnel as well as Auditors of the differences between a good calibration procedure and a factory checkout procedure. In the case of a recently assembled measurement instru-ment coming off the assembly line, a proper Factory Checkout Procedure assumes that everything is wrong with it and indicates steps required to do everything necessary to adjust or otherwise correct it to become within specifications. In the case of an measurement instrument having been in service and be-ing returned for calibration, a proper Calibration Procedure assumes that everything is correct with itand indicate steps required to try to prove otherwise without adjustment; and if proven otherwise, then to adjust and record the necessary adjustment. Unfortunately however, at least in our experience, many Auditors are ignorant of that nuance.

In his Chapter One, the Author’s “Great Train Wreck” analogy is a good example of the necessity for adequate Calibrations, but with his avowed Air Force background we are curious why he did not use two more recent and closer to home examples: the loss during the late 1940’s of an entire squadron of SAC nuclear bombers due to improper frequency calibrations of their radio location gear; and infamous “Iraqi Turkey Shoot” of the early 1990’s so well analyzed in the late Retired Master Chief Claude Forroux’s famous “White Paper” to Congress. While the examples the Author uses are in no way bad, the use of either or both of these could be more forceful examples for driving home his very valid point.

We are quite astonished that on Page 9, while repeating Kelvin’s famous pronouncement that the Author left out the punch line; “So therefore, if Science is Measurement, then without Metrology there can be no Science”. However we could go on “ad nausium” ‘nit picking’ seeming discrepancies both minor and major, but such would serve no purpose, as the Author has produced an outstanding pioneer work, and as we all know nothing is perfect. Many seeming discrepancies are opinional, and we should be thankful that we live in a coterie where we can all have and can express differing opinions on the same matters. Never-the-less we would like to point out two more discrepancies.

The Author makes constant use of the requirements laid down within ISO and FDA documents—there is nothing wrong with that except that many organizations are under the jurisdiction of other regulatory agencies that have their own requirements and must therefore conform to MIL STNDS, MIL SPECS, FAA REGS, etc., or non-public agency documents imposed by various customers. The existence and importance of these should have been noted.

In Chapter 20 the Author mentioned six organizations concerned with Metrology operations in some manner or another. There are at least eight more, several of these are even more important than some mentioned by the Author:

1: American Association for Laboratory Accreditation (AALA) 2: American National Standards Institute (ANSI) 3: American Society of Mechanical Engineers (ASME) 4: American Society for the Testing of Materials (ASTM) 5: International Electro-Technical Commission (IEC) 6: International Standardizing Organization (ISO) 7: International Society for Weighing and Measurement (ISWM) 8: National Conference on Weights and Measures (NCWM)



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Now for the big question: Do we recommend the acquisition of this document by those individuals de-siring to further themselves in the Metrology field? By all means, YES! But keep in mind it is not a Handbook as its title suggests. It is not a training manual for Calibrators as one could assume. It is more of text book for the education of the Administrative Metrologist who is destined to be over a broader set of Metrology related functions than just Calibration alone. We believe that the words “CALIBRATION” and “HANDBOOK” should be removed from the title as they diminish the true value of this pioneering effort.

Next question: Do we intend to acquire this document for our own personal library when it becomes available? By all means, YES! And we say this without knowing what the price will be asked by the publisher.

Phil A. Painchaud

EDITOR’S NOTE: On Quality Press: http://qualitypress.asq.org/perl/catalog.cgi?item=H1293Member Price: $48.00 List/Forum-Division Price: $80.00 On Amazon: http://www.amazon.com/o/ASIN/0873897048/ref=pd_rvi_gw_1/002-6401306-8733629Price: $50.40— See the Quality Press flyer at the end of this edition for a discount notice and coupon.


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ChairGraeme C. Payne GK Systems, Inc. 4440 Weston Drive SW, Suite B Lilburn, GA 30047 USA Voice: (770) 931-4004 / Fax (866) 887-9344 E-mail: [email protected]

Chair-ElectRichard D. Roberson 10301 Clinkenbeard Rd NE Norman, OK 73026 Voice (405) 321-8580 E-mail: [email protected]

Secretary, Certification Chair, WebsiteManager, NCSL International Representative

Christopher L. Grachanen Manager, Houston Metrology Group Hewlett-PackardP. O. Box 692000 MS070110 Houston, TX 77269-2000 Voice (281) 518-8486 / Fax (281) 518-7275 E-mail: [email protected]

Treasurer, Publication Chair, Newsletter Editor/Publisher, Share Point Administrator

Jay L. Bucher Bucherview Metrology Services 6700 Royal View Dr. De Forest, WI 53532-2775 Voice (608) 277-2522 / Fax (608) 846-4269 E-mail: [email protected] [email protected]

Immediate Past Chair, Nominating ChairProgram Chair

Dilip A. ShahE = mc3 Solutions 197 Great Oaks Trail #130 Wadsworth, Ohio 44281-8215 Voice (330) 328-4400 / Fax (330) 336-3974 E-mail: [email protected], [email protected]

Joe Simmons ScholarshipNorm Belecki 7413 Mill Run Dr Derwood, MD 20855-1156 Voice (301) 869-4520 E-mail: [email protected]

Standards Committee RepresentativeRobert M. Graham Primary AC Standards Lab Sandia National LaboratoriesP.O. Box 5800, M.S. 0665 Albuquerque, NM 87185-0665 Phone: (505) 845-0434 Fax: (505) 844-6096 E-mail: [email protected]

Examining ChairDuane AllenU. S. Navy P.O. Box 5000, Code MS11 Corona, CA 92878-5000 Voice (909) 273-4783 / Fax (909) 273-4599 E-mail: [email protected]

HistorianKeela Sniadach Promega Corp. 5445 East Cheryl Parkway Madison, WI 53711 Voice (608) 298-4681 / Fax (608) 277-2516 E-mail: [email protected]

ASQ Division AdministratorMs. Jennifer Admussen, CQIA Voice (800) 248-1946, x7736 E-mail: [email protected]

MEASUREMENT QUALITY DIVISION OFFICERS AND COMMITTEE CHAIRS

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ASQ MEASUREMENT QUALITY DIVISION REGIONAL COUNCILORS

Regional Councilors represent the Division to members and Sections in their geographic areas. Regional Councilors are appointed for renewable two-year terms, and are advisory members of the Division leadership team.Region 1 (CT, MA, ME, NH, RI, VT)

Mr. Jun Bautista Genzyme Cambridge, MA 02142 E-mail: [email protected]

Region 2 (NJ, NY, PA) Volunteer Opportunity!

Region 3 (CT, NJ, NY)

Mr. Eduardo M. Heidelberg PfizerParlin, NJ 08859 E-mail: [email protected]

Region 4 (Canada)

Mr. Alexander T. C. Lau ExxonMobil Whitby, ON L1R 1R1 E-mail: [email protected]

Region 5 (DC, DE, MD, PA, VA)

Mr. Richard A. Litts Litts Quality Technologies Downington, PA 19335 E-mail: [email protected]

Region 6 (AK, CA, HI, ID, MT, OR, UT, WA, WY)

Volunteer Opportunity!

Region 7 (AZ, CA, NV, part of Mexico)

Mr. Randy D. Farmer Metrology Solutions Chula Vista, CA 91913 E-mail: [email protected]

Region 8 (OH, PA) Dilip A. Shah E = mc3 Solutions Wadsworth, Ohio 44281-8215E-mail: [email protected], [email protected]

Region 9 (IN, KY, OH)

Mr. Ryan Fischer, ASQ CCT Laboratory Accreditation Bureau New Haven, IN 46774 E-mail: [email protected]

Region 10 (OH, MI) Volunteer Opportunity!

Region 11 (NC, SC, TN, VA) Volunteer Opportunity!

Region 12 (IL, MN, ND, SD, WI)

Dr. Donald S. Ermer ASQ Fellow; Eugene L. Grant Medal (2001) University of Wisconsin—Madison Madison, WI 53706 E-mail: [email protected]

Region 13 (CO, IA, KS, MO, NE, SD, WY)

Volunteer Opportunity!

Region 14 (AR, LA, NM, OK, TX, part of Mexico)

Mr. R. Keith Bennett TRANSCAT Kingwood, TX 77339 E-mail: [email protected]

Region 15 (AL, FL, GA, LA, MS, Puerto Rico)

Mr. E. Bryan Miller ASQ Fellow Bryan Miller Consulting Florence, AL 35633 E-mail: [email protected]

Region 25 (all other countries) Volunteer Opportunity!

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1 of 2

ASQ Southwest Conference October 14, 2006

Seven Basic Quality Tools: Quality Café Output

Cause and Effect Diagram

Use 5 why’s with fishbone (root cause method)

Use “because” instead of “why” Works well with small groups (5-10) Color code branches Use multi-voting and pareto to show results Use “ringer” in team to ask “stupid questions” POEM-People, Organization, Equipment, Manufacturing Gemba-Walk the process Don’t confuse solutions with causes Keeping team focused on the effect of interest Separate controllable from un-controllable Use it for identifying good causes, not just defects or problems Just Do It

Check Sheets

Use for data collection Supports the other tools As a Checklist

o To be sure everything is done o Keep sequence of process – flow chart o Memory aid o Audits: ISO9000

As a Graphical Checklist o Give information very quickly o For small sample sizes o Visually represents information

As a Data Collection Chart o Very easy to do o Need to be clear about what you need to collect o Does not take a lot of training o Operator or data collector gets distracted-need to be specific

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Control Charts

People take data personally o This is a process tool

Control limits are calculated o Based on data

o Not specification limits Used extensively for repeatable processes If process changes, then change control limits by recalculating Identify variation in the process Cycle time tracking

o X-MRValidates a process Visual Tool

Flow Charts

Purposeo Document, simplicity, communication, outlining, decision

making, clarification, gap analysis, team building, continuous improvement, brainstorming

Techniqueso SIPOC, value stream, flow charting symbols, relationship

diagrams, spaghetti diagrams, Post It notes, color coordination, swim lane, deployment, detailed, process map

Tips and Tricks o Get the right people, food, walk the process, pre-work, pictures,

standardized tool Tools

o Visio, I-graphics, Lean View, EVSM, Pathmaker Benefits

o Team building, standardization, eliminate waste, exposes the hidden factory, forces you to think, helps understand complexity, creates common understanding, paints a picture

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Histograms

Best to use when sequence of x-axis cannot be changed o Usually numerical

Used in combination with others o Helps show the big picture

Sample size is important Defining bin size and number is important

o This impacts the distribution It is a “snap shot” Can be used to compare to customer requirements Data does not need to be normally distributed

Pareto

Quick and visual o Less intimidating

It helps organize the data o 80/20o Highest to lowest

Communication tool De-personalizes data “Slice and dice” many ways Obvious is not always correct Helps focus the problem Good management reporting tool

Scatter Plots

Looks for correlation, not cause and effect With lots of variables, find correlation quickly Make sure you plot the right “stuff”

o Don’t plot ice cream sales v. shark attacks Helps you see patterns that don’t show up with other tools Identify outliers, they can “mess things up”

Limitations, only 2 variables Practical, graphical, and analytical Used best with regression analysis

Non-ProfitU.S. Postage

PAIDMilwaukee, WIPermit No. 5419

600 N. Plankinton Ave.Milwaukee, WI 53201-3005t: 414-272-8575800-248-1946f: 414-272-1734www.asq.org

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H1291 - The CertifiedQuality EngineerHandbook, Second Edition Donald W. Benbow, Roger W. Berger, Ahmad K. Elshennawy, and H. Fred Walker

This comprehensive, all-in-oneresource focuses on the updatedBody of Knowledge for the ASQCertified Quality Engineer exam.Every quality engineering concept and technique is covered, including managementand leadership, quality systems development and implementation, and reliabilityand risk management. A supplemental CD-ROM includesa simulated exam and a sampleexam, with answers included for both. Available November 2006

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ISBN 978-0-87389-700-6

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H1293 - The QualityCalibration Handbook:Developing andManaging aCalibration ProgramJay L. Bucher

Some industries have tighterrequirements than others on howthey treat calibration; some aremore specific about how theirstandards are read, while beingvague about what is needed tomeet calibration. Is there onetried-and-true quality calibrationsystem that every organizationcan use as a foundation for itspersonalized program? Therecertainly is, and The QualityCalibration Handbook describesit. By using the quality calibration system outlined anddemonstrated, any organizationcan put together its own versionto meet its specific requirementsand/or regulations.Approx. 250 pages. 2007. 7 x 10 hardcover. ISBN 978-0-87389-704-4. Item: H1293 Member Price: $48.00List/Forum/Division Price: $80.00

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There are sufficient processes in place in almost any modernsales and marketing departmentto make them fertile ground forprocess improvement using Six Sigma’s powerful DMAICapproach. This book provides abrief overview of Six Sigma andthen presents several case studiesof Six Sigma being applied totransactional processes. Some of the examples are classic SixSigma projects, while others aresimply the application of SixSigma tools to some commonsales and marketing challenges.

Some are skeptical that a standardized, fact-based problem-solving approach likeSix Sigma can be applied to the“art” of sales and marketing. In fact, Six Sigma does not suppress creativity but ratherprovides a framework to helpchannel it. Six Sigma also provides those in sales and marketing guidance on where tobegin solving a problem andwhat questions to ask along the way.Available November 2006

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2007

FRONTBACK

January 22 ~ 26, 2007

MEASUREMENTSCIENCE

CONFERENCESYMPOSIUM AND WORKSHOP

NIST Seminars on January 22-23 Tutorial Workshops on January 23-24 Technical Program on January 25 - 26

LONG BEACH CONVENTION CENTERLong Beach, California

http://www.msc-conf.com

Apply Metrology...Rule the World

MSC 2007-Facing Pages:MSC 2007-Facing Pages.qxd 11/2/2006 3:35 PM Page 1

2 Measurement Science Conference 2007

MSC 2007 PRESIDENT’S MESSAGE

WHAT IS MSC?

The Measurement Science Conference was founded in 1970 to promoteeducation and professionalism in measurement science and related disciplines. TheConference has grown and matured to meet the needs of dynamic measurementtechnologies as well as to address pertinent national and global measurementissues. Based in California, the MSC has attracted experts from around the worldas speakers, exhibitors and attendees.

47

In a global economy, it is more important than ever to ensure that a volt measured inCairo is the same as a volt measured in Chicago, or that a meter in Berlin is the same as ameter in Brussels. To that end, the theme for the 2007 Measurement Science Conferenceis: "Apply Metrology…Rule the World". In keeping with the theme, the conference willfocus on how measurements are made, how they are managed, and how they are audited inorder to support product quality, product maintenance, product safety, and interstate andinternational trade.

Some changes await the attendees of the 2007 MSC. Most notably, after years at theDisneyland Hotel, the conference is moving to the Long Beach Convention Center. Unlikeprevious years, the Exhibit Hall will open early on Wednesday to give the attendees moretime to browse the booths and talk to our knowledgeable exhibitors about metrologyproducts, services, and technology.

So…you ask…why Long Beach? There are a host of fine restaurants, activities, shops,and attractions within walking distance. You won't want to miss the Queen Mary…andCatalina excursions depart right from Long Beach Harbor. In addition, it is convenientlylocated near beaches, amusement parks, museums, and more. Getting to Long Beach iseasy, too. LAX, John Wayne, and Long Beach airports are each within a few miles. Thenew venue will provide attendees and their guests with new scenery, new faces, and thesame standard of quality technical program and quality exhibits that you've come to expectfrom MSC.

I hope to see you in Long Beach to take part in what may well bethe "Greatest Conference in the History of the World!"…the 2007Measurement Science Conference.

Bob Fritzsche

President, MSC 2007

2007 CONFERENCE TIMELINE

Monday, January 22, 20077:00 AM - 8:00 AM Continental Breakfast7:00 AM - 5:00 PM Registration & Guest Program Ticket Sales8:00 AM - 5:00 PM NIST Seminars10:00 AM - 10:30 AM Morning Break12:00 PM - 1:00 PM Lunch3:00 PM - 3:30 PM Afternoon Break6:00 PM - 7:30 PM NIST Reception

Tuesday, January 23, 20077:00 AM - 8:00 AM Continental Breakfast 7:00 AM - 5:00 PM Registration & Guest Program Ticket Sales8:00 AM - 5:00 PM NIST Seminars8:00 AM - 5:00 PM Tutorial Workshops10:00 AM - 10:30 AM Morning Break12:00 PM - 1:00 PM Lunch3:00 PM - 3:30 PM Afternoon Break

Wednesday, January 24, 20077:00 AM - 8:00 AM Continental Breakfast7:00 AM - 5:30 PM Registration & Guest Program Ticket Sales7:00 AM - 8:00 AM Tutorial Speakers Breakfast8:00 AM - 5:00 PM Tutorial Workshops10:00 AM - 10:30 AM Morning Break12:00 PM - 8:00 PM Exhibits Open12:00 PM - 1:00 PM Lunch in Exhibit Hall12:00 PM - 7:00 PM Registration & Guest Program Ticket Sales3:00 PM - 3:30 PM Afternoon Break in Exhibit Hall5:30 PM - 8:00 PM Exhibitors Reception

Thursday, January 25, 20077:00 AM - 5:00 PM Registration & Guest Program Ticket Sales7:00 AM - 8:00 AM Guest Program Continental Breakfast7:00 AM - 8:00 AM Speakers Breakfast8:00 AM - 9:00 AM Continental Breakfast9:00 AM - 10:00 AM General Session - Keynote Speaker10:00 AM - 5:00 PM Exhibit Hall Open10:00 AM - 10:45 AM Morning Break/Continental Breakfast Continued10:45 AM - 12:15 PM Technical Session 112:15 PM - 1:50 PM Luncheon / Speaker2:00 PM - 3:30 PM Technical Session 23:30 PM - 4:00 PM Afternoon Break4:00 PM - 5:30 PM Technical Session 38:00 PM - 10:00 PM Presidents Reception

Friday, January 26, 20078:00 AM - 3:00 PM Registration7:00 AM - 8:00 AM Guest Program Continental Breakfast7:00 AM - 8:00 AM Speakers Breakfast8:00 AM - 8:45 AM Continental Breakfast9:00 AM - 12:30 PM Exhibit Hall Open 8:30 AM -10:00 AM Technical Session 410:00 AM - 10:45 AM Morning Break10:45 AM -12:15 PM Technical Session 512:15 PM - 1:50 PM Luncheon / Speaker2:00 PM - 3:30 PM Technical Session 64:00 PM - 5:00 PM Door Prizes

The 2008 MSC conference will welcome Kara Harmon, Geotest-MarvinTest Systems, Inc. as our new president. It will be held at the Disneyland HotelConvention Center in Anaheim, California from March 10 to 14 2008.

MSC 2008 Preview

MSC SCHOLARSHIPSThe Measurement Science Conference has an established fund to award scholarships to students

in an Engineering, Science or Quality Assurance degree program. The scholarship program placesemphasis on papers or projects that discuss the advancement of measurement science technology.These scholarships will be awarded to the students at the luncheon on Friday, January 26, 2007.

Students from participating schools must submit scholarship applications on or before FridayNovember 17, 2006 to be eligible for the 2007 MSC Scholarship Awards. An MSC sub-committeeevaluates all applications and provides a list of finalists to the MSC Board of Directors. The Board selectsthe scholarship recipients from this list of finalists.

MSC Scholarship Award recipients recognized during the 2006 MSC Conference were from theCalifornia State Polytechnic University, Pomona; CSU Long Beach; UC Irvine, CSU Los Angeles,University of Michigan and CSU Chico.

If you are interested in more information regarding the MSC Scholarship Program, please contactMiguel Cerezo at 805-447-1128 or [email protected]


INVITE FRIENDS AND FAMILY!

Long Beach is a happening city! And the convention center is conveniently locatedin the heart of downtown. With the free Passport shuttle you can easily explore thearea on your own without a car. To top it off our two custom MSC tours will give yourfriends and family an extra special California experience.

Thursday, January 25 9:00 a.m. – 5:00 p.m.

The spectacular Getty Center Los Angeles is a must see for all ages. The Getty’scollection of Western art from the Middle Ages to the present is only part of its appeal.You can also explore a gorgeous garden descending a stream and climaxing in a floweredmaze. Or take an architectural tour of Richard Meier’s modernist complex. And fromevery corner you can enjoy breathtaking views of Los Angeles and the Pacific Ocean.Then rest with an espresso in one of the elegant patios. It’s like spending a day in anItalian hilltop town.

Friday, January 26 9:00 a.m. – 1:00 p.m.

Long Beach has two star attractions and we will see both: The world-classAquarium of the Pacific and the majestic Queen Mary ocean liner. At the Aquarium wewill take a private “Overview” tour highlighting the marine life of SouthernCalifornia/Baja, the Tropical Pacific, and the Northern Pacific. On the Queen Mary wewill take a private “Behind the Scenes” tour focusing on the ship’s luxurious stateroomsand Art Deco public salons. Plan on this one for sure!

Tours are $50.00 per person. A discount of $10 is offered for advancereservations. Contact Pamela Thames at [email protected] or (714) 897-3442.

346

The Measurement Science Conference and the management and staff of the Hyatt RegencyHotel are pleased to invite you to the 2007 MSC Conference.

The room rates are: Single/Double . . . . . . . . . .$165.00

Triple Occupancy. . . . . . . . $190.00

The Government Rate is: Single Occupancy. . . . .$110

Double Occupancy . . . $135

Triple Occupancy. . . . . $160

Registration: Phone: (800) 233-1234 (Group reservation)

Hyatt Regency Long Beach

200 South Pine Avenue

Long Beach, CA 90802

Please mention the Hyatt in Long beach and the Measurement Science Conference when registering.

HOTEL INFORMATION

Exhibitor Booth WebsiteNIST/NVLAP 314 www.nist.gov/nvlap

Northrop Grumman Corporation 109 www.ngc.com

Norvada LLC 515 www.norvadallc.com

NSWC Corona Measurement Science Dept 401 www.corona.navy.mil

NSWC Corona Product Engineering Dept 403 www.corona.navy.mil

NSWC Metbench 400 www.corona.navy.mil

Ohm-Labs, Inc. 203 www.ohm-labs.com

On Time Support, Inc 225 www.ontimesupport.com

One Red X Software, Inc 108 www.1redx.com

Opto-Cal, Inc 309 www.optocal.com

Paroscientific, Inc 215 www.paroscientific.com

Pond Engineering Laboratories 245 www.pondengineering.com

Pratt & Whitney 223 www.prattandwhitney.com

Primary Standards North America, Inc 140 www.primarystandards.com

RH Systems 344 www.rhsystems.net

Rigol Technologies 533 www.rigolna.com

Rohde & Schwarz Inc. 402 www.rohde-schwarz.com/usa

SanSueB 110 www.sansueb.com

Sartorius Corporation 230 www.sartorius.com

SIMCO Electronics 436 www.simco.com

Standard Calibration, Inc. 135 www.standardcal.com

TAC/Control Systems 415 www.tac-americas.com

Technology Resource Center 308 www.trcinc.net

TEGAM 525 www.tegam.com

Tektronix 435 www.tektronix.com

TestEquity 437 www.testequity.com

Thunder Scientific 137 www.thunderscientific.com

Tovey Engineering 505 www.toveyengineering.com

Transcat 322 www.transcat.com

Troemner 328 www.troemner.com

Universal Label 521 www.ultcalibration.com

Vaisala Inc 501 www.vaisala.com

Veriteq Instruments 335 www.veriteq.com

Western Environmental 324 www.westernenvironmental.com

WIKA Instrument Company 114 www.wika.com

Wilmington Instrument Company 231 www.calcert.com

Workplace Training 117 www.wptraining.com

Yokogawa Corporation of America 428 www.yokogawa.com

American Society for Quality (ASQ) ASQ - Measurement Quality Division

A2LACalifornia State University Dominguez Hills (CSUDH)

Government Industry Data Exchange Program (GIDEP) IEEE Instrumentation and Measurement Society

International Accreditation Service, Inc. Instrument Society of America (ISA)

International Society for Weighing and Measuring (ISWM) International Metrology Organization (IMEKO)

National Association For Proficiency Testing (NAPT) National Institute of Standards and Technology (NIST)

U.S. Naval Observatory Time Service Dept. PTTI (Precision Time & Time Interval)

Califomia State University Long Beach (CSULB) National Conference of Standards Laboratories (NCSL)

San Diego Biometrology Society Community College of Aurora

National Cooperation for Laboratory Accreditation (NACLA) Navy Metrology and Calibration Program

Air Force Metrology and Calibration Program Army Primary Standard Laboratory

Association of Measurement Professionals(AMP)

SPONSORS

EXCITING GUESTS PROGRAM



2007 NIST SEMINARS MONDAY-TUESDAY, JANUARY 22-23, 2007

45

N02 - NIST Pressure and Vacuum Measurement

Instructors: Jay H. Hendricks and Patrick J. Abbott

NIST Pressure and Vacuum Group

Making good pressure measurements from ultra-high vacuum toatmospheric pressure requires the correct use of many kinds of gauges.Among the most widely used are ionization gauges, spinning rotor gauges,thermal conductivity gauges, capacitance diaphragm gauges, quartz bourdontube gauges, and resonant silicon gauges. However, the incorrect use of anyof these gauges can result in bad measurements that cost time and money.

This two-day course will cover the fundamentals of pressuremeasurements from 10-8 Pa to 10+5 Pa (10-10 to 10+3 torr), focusing on theselection and proper use of appropriate gauging technology for a givenapplication. A survey of calibration techniques will be presented along withrecommendations for obtaining best performance. A small vacuum systemwill be set up for a live demonstration of some of the gauges discussed in thecourse. Attendees are invited to share their own pressure measurementproblems for in-class discussion.

For further information, contact Jay Hendricks at (301) 975-4836,[email protected] or Patrick Abbott at (301) 975-4838,[email protected].

N03 - NIST Fluid Flow Measurement

Instructor:G. E. Mattingly, NIST Senior Scientist

for Fluid Flow Measurement (Retired)

T. Kegel, Senior Staff Engineer, CEESI, Nunn, CO

This seminar will present the basic concepts of flow measurement forliquids and gases. The focus will be on practical metering aspects withemphasis on how to make satisfactory fluid quantity and flow ratemeasurements. It will cover flow measurement terminology and standards,basic metering principles and descriptions, and practical examples andapplications. Wide ranges of fluid conditions and flow metering situationsand techniques will be described and discussed with results of specificapplications. Special emphasis is made for meters installed where flow meterinstallation conditions are "non-ideal". Additionally, flow meter calibrationconcepts and techniques - especially the practical aspects - will be presentedso that flow meter users are informed and knowledgeable about how toestablish and maintain satisfactory systems for fluid quantity and flow ratemeasurement. The flow laboratory accreditation process and procedureswill also be presented so that the advantages of this important aspect of flowmeasurement are understood, with the many benefits as well as theassociated efforts and costs.

For further information, contact G. E. Mattingly at 301.975.5939,[email protected], or T. Kegel at

970.897.2711, [email protected].

See Hall Layout Map in Back of Centerfold

Photography Services Available During 2007 MSC

The Official Photographer of the 2007 Measurement Science Conference, Ms Marie Roberts, will beavailable during the conference to take custom photos of exhibitors, individuals, families, business groups,etc. in addition to her regular duties of photographing the conference.

The photos will be digital and will be delivered during the conference in the form of a picture CD.

Photos of exhibitors booths and exhibitors personnel ( Business Photos) will cost $65 for up to 5images on the CD.

Photos of individuals, small groups, families etc. (Personal Photos) will cost $20 for up to 3 images onthe CD.

All picture CD’s will be delivered during the conference.

Please contact Marie during the conference or make advanced arrangements by e-mail [email protected] or phone at 714 505 2277

MSC 2007 EXHIBITORS

Exhibitor Booth WebsiteAccu Cal Incorporated 406 www.accucal.com

Accurate Instrument Repair 320 www.air-cal.com

Advanced Test Equipment 306 www.atecorp.com

Agilent Technologies 313 www.agilent.com

A.K.O. 116 www.akotorque.com

Ametek, Inc. 447 www.ametek.com

Andeen - Hagerling, Inc. 514 www.andeen-hagerling.com

ARTEL 331 www.artel-usa.com

Ashcroft, Inc 228 www.ashcroftinc.com

AssetSmart 307 www.assetsmart.com

Bios International Corporation 208 www.biosint.com

Colorado Engineering 234 www.ceesi.com

Condec 221 www.4condec.com

Crystal Engineering 440 www.crystalengineering.net

CSC 413 www.csc.com

Data Proof 216 www.dataproof.com

Davis Inotek Instruments LLC 303 www.davis.com

DH Instruments 144 www.dhinstruments.com

Edison 213 www.edisonmudcats.com

Flow Dynamics 212 www.flow-dynamics.com

Fluke Corporation 319 www.calibration.fluke.com

Gauge Repair Services 129 www.gaugerepairservice.com

GE Infrastructure Sensor 337 www.ge.com

GIDEP 409 www.gidep.org

Guildline Instruments Limited 429 www.guildlineUSA.com

Gulf Calibration Services Inc. 412 www.gcscalibration.com

Hart Scientific 319 www.hartscientific.com

IET Labs Inc. 329 www.ietlabs.com

Indy Soft 302 www.indysoft.com

Insco 229 www.insco.us

Interface Inc 210 www.interfaceforce.com

International Radiation Detectors, Inc. 431 www.ird-inc.com

Isotech North America 434 www.isotechna.com

Kaymont Consolidated Industries 408 www.optonline.net

King Nutronics Corporation 209 www.kingnutronics.com

Lambda Americas 230 www.lambda-emi.com

Lockheed Martin Technical Operations 207 www.lockheed.com

Masy Systems, Inc. 201 www.masy.com

Measurement International, Inc 219 www.mintl.com

Mensor Corporation 112 www.mensor.com

Mettler Toledo 301 www.mt.com

Navy Primary Standards Lab 407 www.navy.mil


5

N04 - Hands-on Workshop on Estimating and Reporting

Measurement Uncertainty

Instructors : Will Guthrie, Hung-kung Liu

NIST Statistical Engineering Division

This workshop on uncertainty estimation will describe the statisticalframework and methods needed to develop uncertainty statements basedon the “ISO Guide to the Expression of Uncertainty in Measurement”.Methods for uncertainty estimation will be illustrated with many practicalexamples from different metrological areas. The workshop will alsoinclude hands-on examples to be analyzed by the participants. The hands-on examples will be done using propagation of uncertainty formulas, theKragten spreadsheet, an easy-to-use computational tool for propagationof uncertainty, and other open-source uncertainty calculators.

Pre-requisites:

1. Laptop computers with Microsoft Excel are required to do thehands-on exercises. Participants who have access to a laptop should bringone. Some extra laptops are also available for those who cannot bringtheir own. Please contact the instructors in advance if you will need alaptop.

2. Participants should have some experience with the use of MicrosoftExcel for the analysis of data. As part of the hands-on exercises, it will benecessary for participants to be able to copy and paste spreadsheetcontents and to enter simple formulas. Advanced knowledge of Excel isnot required.

For additional technical information, contact

Will Guthrie at (301) 975-2854, [email protected].


Publications Robert Johnson

NSWC Corona [email protected]

Public Relations Troy Clarke

[email protected]

Secretary Chris Contreras

NSWC Corona Divisionchristopher.contreras @navy.mil

Tutorials/NIST Seminars Arman Hovakemian

NSWC Corona Division [email protected]

SpeakersBob Everly

[email protected]

Arrangements Frank Mendoza

The Boeing Company [email protected]

ExhibitsKara Harmon

Geotest-Marvin Test Systems [email protected]

Finance Alan Ho

The Boeing [email protected]

Publicity John Schulz Consultant

[email protected]

Registration John Bowman

Fluke Corporation [email protected]

Registration Cindy Becker


ProgramsMark Kaufman


Door Prizes Larry Yates

Acumen [email protected]

Awards Nidal Kerdiya

eDoc Publish, [email protected]

Committee Support Doug Sugg


Evaluation Chet Franklin

[email protected]

Scholarships/NCSLi LiaisonMiguel Cerezo

[email protected]

e-Commerce, Intranet Richard Schumacher


Guest Programs Pamela Thames

[email protected]

A/V, Meetings, SpecialEvents

Karen Jackson GIDEP

[email protected]

NIST Liaison Georgia Harris

[email protected]

Exhibits Assistant Tony Ambrose

Tektronix [email protected]

LogisticsRey Cheesman

NSWC Corona Divison [email protected]

Program Assistant Patricia Leyva

NAVAIR North Island [email protected]

Marketing Tim Mason

[email protected]

NIST Liaison Val Miller

[email protected]

Site SelectionChet Crane

eDOC Publish Inc [email protected]

Committee Administrator Diana Poulton


Education Jeff Sedor

B Braun Medical [email protected]

SponsorsJohn Fishell


Chairman of the Board John Fishell


PresidentBob Fritzsche


Executive VP Kara Harmon

Geotest-Marvin Test Systems Inc. [email protected]

Board Treasurer Alan Ho

The Boeing [email protected]

Board Secretary John Schulz Consultant

[email protected]

DirectorJohn Bowman

Fluke Corporation [email protected]

DirectorMiguel Cerezo

[email protected]

Director, Alternate Nidal Kerdiya

eDoc Publish, Inc. [email protected]

BOARD OF DIRECTORS

CONFERENCE COMMITTEE

MSC 2007 ORGANIZATION


Measurement Science Conference 2007 436

MSC 2007 TUTORIAL WORKSHOPS The 2007 MSC will host the following Tutorial Workshops. Tutorial Workshops are

either full day or half day, offered same day in the morning and afternoon or only in themorning. Tutorial Workshops will begin on Tuesday, January 23, 2007 and end onWednesday, January 24, 2007.

TUESDAY, JANUARY 23rd TUTORIAL WORKSHOPS

WORKSHOP P (AM Only): Optical Detectors and Laser Measurements

Instructors: Marla Dowell and John LehmanCourtesy of NIST Optoelectronics Division

Abstract: Optical detectors constantly evolve with the implementationof new materials and fabrication techniques that are intended to enhance theperformance and reduce the cost of existing detector types. Optical detectorsare often written about and explained with jargon that obstructs acomprehensive understanding of the many and varied detector types. Forexample, a detector is often informally referred to be the material from whichit is made, such as a "germanium detector", or the principal upon which itoperates, such as a "photodiode", or the primary use, such as an "IR detector"or "fast pulse detector". Despite the obviously different meanings of each ofthese detector types, the names may simply refer to the same physical device.In this workshop, we will present an introduction to optical detectors, discusscalibration of optical detectors for laser measurements, and describe nationaltraceability for calibration of optical detectors for laser power and energymeasurements.

Tutorial Objectives:1.Introduction to optical detectors for laser measurements2.Describe calibration of optical detectors for laser measurements3.Describe national traceability for calibration of optical detectors

for laser measurements4.Describe basic detector properties and operation 5.Provide a short informal quizFor more information, contact Marla Dowell 303.497.7455,

[email protected], or John Lehman 303.497.3654, [email protected].

WORKSHOP Q (Full-Day):

Accreditation: Challenges and Solutions IInstructor: Hershal Brewer Courtesy of International Accreditation Service (IAS)

Abstract: Accreditation for laboratories is on the increase, and understanding thechallenges and standard involved in accreditation is crucial. This workshop will addresscommon issues encountered by laboratories seeking accreditation. These issues include:

The scope of accreditation

Measurement uncertainties

Traceability

Proficiency testing for laboratories

Management review and internal audit

Personnel qualification

Records

Computer systems and software

Sub-contracting and purchasing

Customer complaints and corrective action

Reporting calibration results

Marketing the accredited laboratory

General criteria for selecting the accrediting body (AB)

For more information, contact Hershal C. Brewer at

(562) 699-0541 ext. 3309 or [email protected]

The upper and lower dynamic control limit, µ ± 2 , were calculated from theupdated mean and standard deviation, µ and , based on the repeat measurements ofa check standard, and were compared with the fixed control limit, y ± CL (ControlLimit), calculated from the uncertainty budget of the check standard. If the dynamiccontrol limit is close to the fixed control limit, then, the reproducibility tests of thecheck standard support the estimated uncertainty of measurement. Otherwise, theuncertainty of measurement might be either over- or under-estimated, and mightneed to be revised.

Uncertainty II

10:45 – Friday, January 26

Session Developer: Sharon N. Nicholas, NSWC Corona,[email protected]

Merits and Limitations of ISO-GUM and Draft GUM Supplement 1 UsingSimple Linear Calibration for Illustration

Raghu Kacker, NIST

We will discuss the merits and limitations of the International Organization forStandardization (ISO) Guide to the Expression of Uncertainty in Measurement(GUM) and the draft GUM Supplement 1 for evaluating and expressing uncertainty inmeasurement. We use a measurement equation for simple linear calibration as anillustration. It includes both Type A and Type B input variables. We consider threescenarios: (i) the measurement equation is linear with one Type B input variablehaving a normal distribution, (ii) the measurement equation is non-linear with twoType B input variables each having a normal distribution, and (iii) the measurementequation is non-linear with two Type B input variables each having a rectangulardistribution. We consider both small and large uncertainties for the Type B inputvariables. In each case, we use Bayesian statistics for the Type A evaluations. Thisdiscussion is based on a recent paper, Comparison of ISO-GUM, draft GUMSupplement 1, and Bayesian statistics using simple linear calibration, published inMetrologia, (2006).

The Student’s t-Distribution Uncovered

James Jenkins, QUAMETEC

Today computers have allowed us to do things our predecessors could only dreamabout. When W.S. Gosset published the derivation of the t-distribution in 1908, hedid not have the luxury of testing his theories with a computer. Gosset specialized indeveloping an approach for estimating sigma when using small sample sets. Today inmeasurement science with the requirement of measurement uncertainty estimation,we too are seeking sigma with small sample sets. This paper examines the results ofestimating sigma using the normal distribution and the Student’s t-distribution as perISO GUM Method. Analysis data is based on results obtained using Monte Carloexperiments involving large populations of data, in which the population distributionis qualified as “normal” and the sigma and mean values are reliably known.Experimental standard deviations are computed thousands of times using variousmethods. The results from these trials are considered surprising as least. Thesupporting Excel workbook contains calculations involving over 100,000 openfunctions and formulas that will be made available to all interested parties for review.Author recommends a 3GHZ processor or better be used to run macros.

Balancing Risk to Minimize Testing Costs

Mark Kuster, Pantex Metrology

Product quality and safety testing costs money. Costs include purchasing andmaintaining test equipment (TE), rejecting good product, accepting bad product, andresolving OOT notifications from calibration laboratories. Given the trade-offsbetween TE accuracy and its life cycle costs and the costs of bad test decisions, whatis the best way to apply limited resources? What are the risks, what uncertainties arerequired, and what is the optimum reliability target and calibration interval? Which ismore cost effective: Higher reliability targets or more accurate equipment? Whatare the relative impacts on safety and quality of errors in the cal lab and theproduction floor? This paper applies basic risk, uncertainty, and interval analysis tohelp address these questions.


42

Lean Manufacturing is a systematic approach to identifying and eliminating waste.Normally associated with manufacturing processes, the concepts lend themselveswell to service based processes as well, including calibration.

Implementing the lean manufacturing approach will improve the overallperformance of a calibration laboratory. Overall performance includes the turnaround time, quality of work, and profitability.

Uncertainty I


Session Developer: Don Felt, Amgen

Consumer Risk-Based Attribute Gage Design and Build

Ricardo Nicholas, Boeing

Measurement uncertainty is predominantly evaluated for bilateral or unilateralmeasurements. One example might be the measurement of an internal thread ringpitch diameter based on variables data. There is also a need to evaluate themeasurement uncertainty of pitch diameter Go Gages and Not Go Gages, based onattribute data. These types of gages will here be referred to as Attribute Gages.There are two application categories for risk-based attribute gaging. One is intendedto optimize the design of the gage to achieve the target consumer risk, and the otheris to evaluate a preexisting design to verify that the target consumer risk has not beenexceeded. These two categories will be referred to as Attribute Gage as Designedand Attribute Gage as Built. The respective uncertainty evaluations are notequivalent.

Included are two determinations of the acceptability of a product’s internal thread,for each of the two application categories, when each pitch diameter measurement isto be made with a Go Thread Plug Gage.

k=3.9… Why Not?

Howard Zion, Transcat, Inc.

This paper will begin with an elementary review of the differences between TARand TUR, underscoring the reasons for ISO-17025 and the GUM. In the discussionon TUR, a demonstration of the application of k=2 will be presented with respect tothe UUT’s tolerance.

Previous Metrology papers discussing ‘Indeterminate’ calibration results will beaddressed and quantified, illustrating the probability that a reading may indeed be outof tolerance (OOT). When attempting to determine this probability using k=2 forthe reporting of a TUR, a problem arises if the entire area under the NormalProbability Density Function is not considered. The result is a misrepresentation ofthe OOT probability.

This will lead to the concept that, although k=2 is a good reporting format for theuncertainty of a measurement, TURs should be standardized using k=3.9. It is theauthor’s hope that this will spark discussion that will take the Metrology industry tothe next step in tackling this ‘Indeterminate’ area.

Verifying Measurement Uncertainty Using a Control Chart with DynamicControl Limit

John Song, NIST

Reporting uncertainty of measurement is usually the last, but not least, step in ameasurement procedure. It is a time consuming process, and mistakes leading toeither over- or under-estimated uncertainties might happen. A control chart with adynamic control limit can be used for promoting the process of developing anuncertainty budget, and verifying the developed measurement uncertainties. In theSurface and Microform Metrology Group of the Precision Engineering Division atNIST, a standardized procedure was developed in the early of 1990s for reportinguncertainty of measurements for NIST surface roughness and step heightcalibrations. A set of check standards covering a range of step heights from 0.02937µm to 22.90 µm and a range of roughness from 0.3 µm to 3 µm Ra was repeatedlymeasured for measurement quality control. These historical measurement dataincluded control limits established by various measurements and model calculations.As an alternative approach, we have recently developed a control chart with adynamic control limit and analyzed the historical measurement data using thedynamic control limit. The results of this new analysis support the uncertaintyprocedure and provide useful information for future revision of the uncertaintyprocedure.


WORKSHOP R (Full Day):

Analytical Chemistry for Metrologists Instructor: Jerry D. Messman Courtesy of Stranaska LLC

Abstract: Designed as an introductory tutorial on selected topics ofanalytical chemistry, this workshop is intended for metrologists andcalibration specialists who have no formal background or educational trainingin analytical chemistry. It is not a tutorial per se on the calibration andqualification of analytical instruments.

Analytical measuring instruments (e.g., spectrometers,chromatographs, electrochemical analyzers, etc), and the analyticaltechniques and methodologies for which they are used, are based onappropriate fundamental principles of analytical chemistry and appliedphysics. Building scientific defensibility, confidence, and credibility into thescience-based calibration and performance evaluation of these instruments,relative to the analytical methods for which they are used, requires aworking knowledge of analytical chemistry.

Although it is taught from an academic perspective, this tutorialworkshop includes practical ramifications of the theory and conceptsrelevant to many of the analytical measurement techniques whichmetrologists may encounter in their workplace. The instructive goal here isto empower the metrologist with an awareness and sufficient insight into thebasics of analytical chemistry. The intended workshop outcome willfacilitate an efficient and cost-effective approach to analytical calibrationprojects through an improvement in scientific communications and technicalinteractions with analytical laboratory managers, scientists, technicians, andinstrument operators.

Workshop participants will acquire a basic introduction to theterminology, simplified theory (minimum of equations and math), andconcepts of selected topics in analytical chemistry. Such knowledge formsthe backbone of the underlying principles and distinctions for scientificapproaches to sample and standard preparation, sample presentation,analysis, and calibration/qualification in analytical measurement techniques.Interactive class exercises include problem-solving examples of analyticalchemistry in practice.Selected workshop topics include:

Analytical data reporting – decimal places, significant figures Mole concept – Avogadro’s Number, SI traceability Solution concentration units (e.g., molarity, normality, etc) Chemical nomenclature, laws, equations, balancing rules Atomic structure - isotopes, oxidation (valence) states, ionization Energy Levels – Electronic, vibrational Atomic and molecular weights, gravimetric factors Chemical bonding - covalent, ionic, hydrogen Acid-base theory - equilibria, dissociation, solubility, buffers, pH Redox potentials Isomerization, polarization, chirality, speciation Analytical measurement techniques Optical spectroscopy – atomic, molecular Separations – chromatography (gas, liquid, ion) Electrochemistry Mass Spectrometry

For additional information on this tutorial workshop, please contactJerry Messman

at (970) 282-3840 or [email protected]



Session 3F: Lean/Six Sigma

4:00 – Thursday, January 25

Session Developer: Ed Corpuz, NSWC Corona, [email protected]

Applying the Theory of Constraints in a Production Calibration Environment

Dean S. Williams, Duke Energy Corporation

The Theory of Constraints (TOC) as developed and presented by Dr. EliyahuGoldratt in his best selling book, “The Goal”, has direct applicability to productionactivities in calibration laboratories, metrology support organizations, and measuringand test equipment manufacturing environments.

TOC is based on focusing on production from an overall system approach ratherthan local optimization of individual aspects of the production environment. Startingwith the development and clear statement of the organization’s goal, the principles ofTOC can be applied to quickly and systematically removing barriers that keep anorganization from fully achieving its potential.

Using the example of a chain of many links (the production system), TOC focuseson identifying and strengthening the weakest link as the optimum method forimproving the productivity of the overall system. Through a 5-step process, theweakest link (or constraint, or bottleneck in production) is addressed in a way thatoptimizes the overall effectiveness of the system.

The Duke Energy Standards Lab, which is an internal corporate calibration facility,is tasked with providing its customers with calibrated measuring and test equipmentand metrology services to support plant maintenance and testing activities. Withdozens of customer groups and over 12,000 calibrations to perform each year through10 lab areas, the Standards Lab often faced production challenges as evidenced byperiodic backlogs and less than optimum turn times. To better meet its goal ofensuring that the right measurement resource was in the right place at the right time,the Standards Lab applied TOC to the production calibration laboratoryenvironment.

This paper presents the step by step process the Standards Lab went through toidentify and eliminate constraints and improve its overall support of its customers.The Standards Lab started by clearly defining its overall goal and worked to obtainbuy in from internal and external stakeholders. With the goal established, it usedtechniques of TOC to identify the weakest link in its production process and tooksteps to eliminate that constraint. This resulted in a reduction of backlog,improvement of turn times and an overall reduction in the stress and frustration levelswithin various functions in the organization.

As part of implementing TOC the Standards Lab was able to identify, in additionto the limiting constraint, other processes and activities, which when viewed from anoverall production system perspective had been locally optimized instead of beingaligned to best meet the system objectives. By addressing these misalignments theStandards Lab made additional gains in meeting its goal.

Finally, the paper presents lessons learned from applying TOC to a calibrationproduction environment as well as a valuable lesson on the affects of multi-taskinglearned from critical chain project management, an outgrowth of the logical thinkingprocesses originally defined in TOC.

Implementing Measurement Uncertainty and Reliability Into Your Business

William B. Miller, Lockheed Martin

A process improvement team was established to research measurement reliabilityrequirements, review past lessons learned, and suggest possible options in order toimplement the best suggestion for a long term, measurement assurance solution touncertainty analysis and reliability. Technical vendor audits, internal evaluations,increased outsourcing, and ISO standards in place of Military standards have givenrise to a universal concern to improve the measurement assurance processes. Topicswill include measurement assurance process flow, cost, timelines, training,documentation, implementation results, and uncertainty analysis. The results of theresearch, implementation results and future plans will be presented.

Calibration on a Diet: Implementing Lean Manufacturing in a CalibrationLaboratory

Timothy Francis, GE SensingAs management of a service operation, we are always looking for ways to reduce

the turn-a-round time for the customer, increase profitability for the organization, andmaintain a high quality level in our service. This paper deals with using amanufacturing tool for identifying and eliminating waste in the CalibrationLaboratory.

WORKSHOP S (AM Only):

Improving your organization through Proficiency Testing Instructor: Jeff C. Gust Courtesy of Quametec Proficiency Testing Services

Proficiency testing is an objective means of determining laboratorycompetency. Employing a sound proficiency test program for yourlaboratory is a proactive means to improve all aspects of laboratoryactivities. This tutorial will cover topics such as understanding the qualityrequirements associated with proficiency testing; philosophy of proficiencytest design; establishing a reference value for a proficiency test; estimatinguncertainty for a proficiency test; analyzing results and interpreting theproficiency test report from a user prospective. Real (anonymous) data willbe presented for analysis by the workshop participants in order tounderstand common laboratory errors that were discovered throughproficiency testing.

For more information, contact Jeff Gust, (260) 244-7450 [email protected]

WORKSHOP T:

Temperature Presenters: Ron Ainsworth / Tom Wiandt

Abstract: This presentation is a review of the fundamentals oftemperature calibration. Topics include calibration equipment, calibrationtechniques, curve fitting issues, and the mathematics important tothermometry. Types of thermometers covered include platinum resistancethermometers, thermistors, thermocouples, and combinedthermometer/readout systems. This segment is intended for those who arenew to temperature calibration, those who need to validate what theyalready know, or those who just have some nagging questions that need tobe answered.

WORKSHOP U:

Power Quality

WEDNESDAY, JANUARY 24th TUTORIAL WORKSHOPS

WORKSHOP A:

Gas Flow Calibration and Uncertainties Using molbloc/molbox Instructors: Larry Renda and Greg Secord Courtesy of: DH Instruments, Inc.

Abstract: This tutorial covers the principles and operation of the DHImolbloc/molbox system. The focus is on the practical application ofmolbloc/molbox to perform a variety of typical calibration and measurementtasks and the determination of the associated uncertainties. Participantslearn techniques for test setup, execution, and data collection, supported byexample calibration setups with actual measurement hardware. The coursealso includes a review of the fundamentals of mass flow measurement, theoperating theory of molbloc/molbox, the determination of uncertaintybudgets, and DHI's calibration methods.

For additional information on this Tutorial Workshop, please contactLarry Renda at [email protected].



Transformation of a Military Calibration Organization to a Modern andEconomic Service Provider

LtCol Gerhard Mihm, German Armed Forces Calibration Service

With the current cost cuts taking place in the military and the resulting need forcooperation in military operations, calibration requirements need to be consideredtoo. With the increasing number of measurement equipment and its requirements onone side, and all the present cost cuts and reduction of personnel on the other side, anew modern and somehow independent system had to be created.

This presentation identifies the situation - starting with a classic organizationrunning about 20 laboratories nation-wide in Germany, in the continental U.S., and anumber of mobile labs - and its development in a transformation process to a modernand economic organization. It shows which tools were used to identify a largecompanies’ calibration needs, and how and where the centralizing of calibrationabilities and capabilities can be helpful and effective - and where they are not.

This presentation will give hints for especially large organizations’ or companies’calibration systems to become more effective providing adequate services on a moreeconomic/affordable scale.

Managing the Changing Corporation

Chet Franklin, CSC, [email protected]

One of our biggest challenges for any manager is dealing with change. It happensto all of us, the only difference being in the magnitude of the change. As a manageryou have two choices: 1) You can react to the changes as they happen – sometimescalled “Fire Fighting”, or “Dodging the Bullet”; or 2) You can manage the responsesto the change and affect the impact on your organization.

You can manage the change or let it manage you! Some of the influence factorsto consider are: Organizational Culture; Tradition; Status Quo; Tribal Knowledge;and Values; to name a few. Many people consider changes to be threatening and theyoften resist. Some people resist changes more vigorously than others. The managermust recognize and deal with both active and passive resistance to change.

Business Processes2:00 – Thursday, January 25

Building the Business Case for a True Enterprise Calibration ManagementApplication

Brian E. Thompson, AssetSmartThe term “enterprise” has many connotations, especially when defining an

“enterprise” calibration management software application. Today it is common tolearn of “Common System” metrology committees embarking on evaluatingenterprise solutions for their organizations. The reason is because most organizationsare now able to cost effectively deploy an enterprise system using a web-based userinterface for all laboratory sites and divisions as it allows easy access from anywherein the world as long as the user has access to a standard web browser. It is importantto not be fooled by “pseudo enterprise” systems that may only offer “stale” reportsthat have been posted to a website possibly weeks ago or offer limited webfunctionality like only being able to change the location or custodian of an asset. Atrue enterprise calibration solution will offer ALL functionality via the web in real-time, ensuring authorized persons will always have access to CURRENT informationat all times. Below are other characteristics and the value a “true enterprise”calibration software application offers in building the business case to evaluate currenttechnology:

• ONE single software installation for total metrology visibility

• Eliminate fragmented “silo” systems

• Improvements to Business and Operational Processes

• Compliance Assurance

• Standard Connectivity to Other Applications

• Internal IT Cost Savings

• Savings Associated with Eliminating Legacy Systems

Six Thinking Hats

Anthony Griffin, Teamworks

Participants will be introduced to the specific Parallel Thinking skills and tools ofDr. Edward de Bono's Six Thinking Hats®, how Parallel Thinking differs fromtraditional thinking, and how it (i.e., Six Thinking Hats) can be immediately applied tomeasurement problems, team decision-making, change management issues, problem-solving, and meeting management.

WORKSHOP C:

Stopwatch and Timer Calibrations IInstructor: Robert Graham Courtesy of: Sandia National Laboratories

Abstract: This course will cover the basics of calibratingstopwatches and timers, using NIST Special Publication 960-12,Stopwatch and Timer Calibrations, as a reference (copies of which will beprovided to the students). Topics to be covered include:

Introduction to stopwatch and timer calibrations Descriptions of the timing devices that need calibration and why Interpreting manufacturer’s specifications Various calibration methods and the standards required Practice sessions in the different methods Determining uncertainty budgets and the calculations needed for

each method

Questions about this class can be directed to Robert Graham [email protected].

WORKSHOP D:

Humidity Measurement Tutorial Instructor: Ken Soleyn Courtesy of: GE Infrastructure Sensing

Abstract:The Humidity Measurement Tutorial providesmetrologist, engineers and technicians as well as those specifying andoperating metrology, process, and building automation instruments andcontrols with an overview of humidity measurement and instrumentationfundamentals. Humidity control is a very important parameter forenergy management, process control, product testing and processvalidation of various parameters such as heat transfer, dimensionalstability, emissions control and power management, yet the science ofhumidity measurement is often very difficult to understand. Theemphasis is placed on providing insight into the design and calibration ofhumidity and trace moisture instrumentation. The workshop includesdiscussions of various humidity measurement technologies. A CD-Romwith humidity parameter conversion software and technical papers on thesubject is provided subject.

For additional information on this workshop, please contact KenSoleyn at (978) 437-1000 Ext. 1924, or [email protected].


39Measurement Science Conference 2007

There are many low-cost solutions to these problems. Powering EMO circuitsfrom 24 V d.c. instead of 24 V a.c.; de-rating power supplies or choosing SEMI F47certified power supplies; inserting time delays; or just a small software changes mighthelp to solve a problem. Yet another common equipment failure mechanism involvessome obscure sequence of events. For example, a voltage sag is applied to theequipment and its main contactor opens with a bang. But further investigationreveals that a small relay connected in series with the main contactor coil actuallyopened because it received an open relay contact from a stray water sensor. Thatsensor, in turn, opened because its small 24 Vd.c. supply output dropped to 18Vduring the voltage sag. (In this case, the solution is an inexpensive bulk capacitoracross the 24 Vdc supply.)

SEMI F47-0200 is going at the moment through its 5-year revision and updatecycle and will be harmonized with IEC 61000-4-34, which is the respectiveinternational Voltage Sag Immunity standard.

Committee for Equipment Specifications (A panel discussion)


Panel Moderator: Charlie Motzko, C.A. Motzko & Associates

NSCLI RP-12 Determining and Reporting Measurement Uncertainties (A paneldiscussion)


Panel Moderator: Suzanne Castrup, Integrated Sciences Group

RP-1 Calibration Intervals (A panel discussion)


Panel Moderator: Donald W. Wyatt, Diversified Data Systems, Inc.

Test Equipment Management, Business Solutions for Efficient M&TEManagement (A panel discussion)


Panel Moderator: James E. Smith, Boeing

ANSI Z540.3 Handbook (A panel discussion)


Panel Moderator: Chet Franklin, CSC, [email protected]

Education (A panel discussion)


Panel Moderator:

Managing Change


Session Developer: Chet Franklin, CSC, [email protected]

Anticipating and Embracing Change

Dr. Carroll Brickenkamp, The Pi Group, Inc.

We might be more comfortable with change if we could anticipate it rather thanreact to it. But how is this possible, since no one can know the future? We willexplore one process that has proven its worth many times, called scenario planning.This process will provide not just directions of change, but best- and worse-casescenarios against which an organization can evaluate its abilities to cope if the futureleans towards any combination of the scenarios. We will provide an outline for thisprocess and, using some examples from metrology technology trends, show how itcan enhance our ability to deal with change and reduce our fear of the unknown. Ifwe incorporate this methodology as a continuous process in our organization (and forour individual selves), we will be acknowledging the inevitability of change, and learnto embrace it and its inevitability.

10

WORKSHOP E:

Very Low Pressure Calibration Instructors: Mike Bair and Karl Kurtz Courtesy of: DH Instruments, Inc.

Abstract: This workshop focuses on the special challenges of verylow gauge and differential pressure calibration. Though specific to lowpressure, topics range from the fundamental concepts of pressuremeasurements to the practical issues encountered in hardware setups,data acquisition, and the measurement process, and can be applied tomany other types of pressure measurements. The measurementinfluences and uncertainties that dominate at very low pressure areanalyzed. Participants experience hands-on measurement exercisesillustrating the points discussed.

For additional information on this workshop, please contact: Karl Kurtz at (602) 431-9100 Ext, 203, [email protected], or Michael Bair,at ( 602).431-9400 Ext. 234,

[email protected].

WORKSHOP F:

Elements of a Quality Laboratory Instructor: Suzi Wesch

Courtesy of: Suzi Wesch Abstract:This course discusses issues in creating a balance between

science and quality for organizations. In today’s competitive businessenvironment, meeting requirements of regulations and statutory isdifficult.

This course presents basic concepts of quality based on complianceand voluntary activities that can improve management of the laboratory.The course is designed for individuals, such as laboratory supervisors,group leaders, and project leaders who want to have a betterunderstanding of the basics for balancing science and quality in alaboratory.

For additional information, please contact Suzi Wesch [email protected].

WORKSHOP G:

Microwave Power Calibation Instructors: Andy Brush, CEO, TEGAM Inc. Mike Eckart, Senior Applications Engineer, TEGAM Inc. Robert Kilgore, Chief Metrologist, Northrop Grumman SureCAL Courtesy of Tegam Inc., Northrop Grumman

Abstract:The Microwave Power Calibration Workshop will presentpractical topics relating to effective transfer of calibration in microwavepower sensors. The construction and characterization of microwavestandards will be covered, with a brief on the sources of error in typicalprimary standards. The methodologies for transferring betweenstandards, with discussion of sources of error will be presented in depth,with examples. Different types of power sensors and methods forcalibrating them, including associated uncertainty, will be discussed.Calculations and required measurement for reducing error by correctingfor port mismatch will be covered with examples. The Workshop willconclude with a presentation on issues related to automating thecalibration process using software.


1138Measurement Science Conference 2007

AC Power Measurements


Stricter Enforcement of SEMI F47 Throughout Metrology Tools in 2006Andreas Eberhard, Power Standards Lab

Every modern test and measurement instrument can be sensitive to briefdisturbances on the AC power mains. Electrical systems are subject to a wide varietyof power quality problems, which can interrupt production processes, affect sensitiveequipment, and cause downtime, scrap, and capacity losses. The most commondisturbance, by far, is a brief reduction in voltage, lasting for a few hundredmilliseconds. These 'voltage sags' (in American English) or 'voltage dips' (in BritishEnglish) are the most common power problem encountered in semiconductor Fabsaround the world.

Why SEMI F47 Voltage Sag requirements? Some years ago, the solution tovoltage sags was to use vast UPS or battery systems. But with more and more300mm Fabs in operation, maintenance and regular replacement of such costlydevices is a burden to every manufacturing facility. UPS and battery systems shall notbe used in any tools (exception: FAB UPS for data systems).

Due to the extreme automation in new 300mm semiconductor Fabs and only afew people inside the Fab, end-users want to have tools that are able to continue torun even after a voltage sag occurred. This continued operation is the Pass-Failcriteria outlined in SEMI F47-0200: "Equipment must continue to operate withoutinterrupt during conditions identified in the area above the defined line".

The SEMI F47 standard introduced a well thought out voltage-to-time curve thatmost semiconductor processing, metrology, and automated test equipment will beexposed to during normal operation.

What are the requirements?

•SEMI F47 requires that tools tolerate the following voltage sags

50% remaining voltage, 50% missing voltage, for 200 milliseconds

70% remaining voltage, 30% missing voltage, for 500 milliseconds

80% remaining voltage, 20% missing voltage for 1 second

•In addition, SEMI F47 recommends, but does not require, that tools tolerate

0% remaining voltage, 100% missing voltage, for 1 cycle

80% remaining voltage, 20% missing voltage, for 10 seconds

Standard SEMI F47 voltage sag ride-through curve that is used in the processindustry

Who enforces SEMI F47? Like any other SEMI standards, SEMI F47 is not a legalrequirement, but required by most semiconductor manufacturers such as Intel, TI,IBM, Samsung, etc., around the world. Every new semiconductor manufacturing

tool that enters a SEMI Fab has to comply with the SEMI F47 Voltage Sagrequirements. It is used both for semiconductor equipment and for components andsubsystems within semiconductor equipment. Enforcement is entirely customer-driven; the procurement agents of semiconductor equipment know the economicconsequences of sag-induced failures and generally refuse to pay for new equipmentthat fails the SEMI F47 immunity requirement. More and more tool manufacturersrequire the same from their component suppliers (power supplies, vacuum pumps,HF generators, etc.). SEMI F47 Testing and Certification is usually an essential partof any tool purchase specification.

What are common responses to voltage sags, and how to address these problems?• Emergency Off (EMO) circuitry • Instrument and controller power supplies • Motion control drives • Voltage monitoring relays • Circuit breakers open due to increased current on phases without dip • Sensor faults or errors • Robot failure • Internal communication errors • Computer re-boots • Graceful restoration using power quality sensors(http://www.powerstandards.com/pqrelay.htm)

WORKSHOP H:

ISO/IEC 17025 Laboratory Accreditation – Who’s Who and What’s What?

Instructor: Roxanne Robinson

Courtesy of: A2LA

Abstract: This tutorial will explain the conformity assessment and laboratoryaccreditation hierarchy at both the international and national levels and explain howaccreditation bodies receive international recognition and use the mutual recognitionarrangements to the benefit of the accredited laboratories. We’ll cover in somedetail the ISO/IEC 17011 requirements that are placed on accreditation bodies andwould affect the accredited laboratory and then spend time on a review of theISO/IEC 17025 requirements.

For additional information on this Tutorial Workshop, please contact RoxanneRobinson at (301) 644-3208, [email protected].

WORKSHOP I (*AM only):

Balance and Scale: Calibration and Use

Instructors: Val Miller/NIST

Mark Ruefenacht/Heusser Neweigh

Courtesy of Heusser Neweigh, NIST

*Note: This Tutorial Workshop will be offered once in the morning only. It isintended to be taken in conjunction with Workshop J.

Abstract: Weighing processes are a significant part of many manufacturingand analytical processes. This workshop will present an overview of the calibrationand use of weighing devices in the analytical environment. It will focus on the use ofweighing techniques, correct procedures, eliminating and minimizing sources oferrors, and compliance with the weighing requirements of the USP, FDA and ASTM.Classification schemes and calibration procedures for balances and scales will becovered. The approach will discuss the selection and use of standards, artifacts,procedures, facilities, equipment, measurement assurance, and software todetermine how each contributes to the quality of mass measurements, the impact onthe overall laboratory capability, and the effect on the production environment.

For additional information, contact Val Miller at (301) [email protected].

WORKSHOP J (**PM only):

Balance and Scale, and Weighing Process Uncertainties

Instructors: Val Miller/NIST

Mark Ruefenact/Heusser Neweigh

Courtesy of: NIST, Heusser Neweigh

**Note: This Tutorial Workshop will be offered once in the afternoon only. Itis intended to be taken in conjunction with Workshop I.

One requirement of traceability of measurement results is calculating theassociated measurement uncertainty. This tutorial will present concepts andmethods for calculating and evaluating the uncertainty of balance and scalecalibrations. Weighing processes in the industrial and analytical environments willalso be discussed. Attention will be focused on the sources of errors in weighingoperations, methodologies for estimating the magnitude of errors, and computationand reporting of the measurement uncertainty associated with reported weighingmeasurement results. This approach is based on the content of NIST IR6919,Recommended Guide for Determining and Reporting Uncertainties for Balances andScales.

For additional information, contact Val Miller at (301) 975-3602,[email protected].



A new facility for spectral power, irradiance, and radiance responsivity calibrationsusing uniform sources (SIRCUS) has been developed at NIST. In the facility, high-power tunable lasers replace conventional lamp-monochromator systems. With upto six orders of magnitude more power, these lasers are coupled into integratingspheres with an exit port to produce either uniform irradiance at a reference plane oruniform radiance within the sphere exit port at high radiant flux levels. Test detectorsare calibrated directly against standard irradiance detectors. Because of the highpower and wavelength stability of the source, calibrations can be made withuncertainties as low as, or better than, the best optical power measurements. Inmore advanced applications, large aperture instruments, e.g. telescopes, and detectorarray-based imaging systems, requiring tests in uniform, monochromatic fields, havebeen characterized. SIRCUS has been used for the detector-based realization of theradiance temperature scale and a new realization of the candela.

Lasers ultimately determine the spectral coverage available on SIRCUS while theuncertainties achievable are determined by the quality of the standard irradiancedetectors. SIRCUS can perform system-level spectral irradiance and radianceresponsivity calibrations of electro-optical sensors, radiometers, and spectrometers.There are two separate SIRCUS facilities: the UV-Vis-NIR SIRCUS and the IRSIRCUS. The UV-Vis-NIR SIRCUS covers the spectral range from 200 nm to 1000nm. Continuous spectral coverage is provided in the IR SIRCUS from 700 nm to 5.3nm. SIRCUS supports programs with other government agencies, among themNASA, NOAA, and USGS, as well as programs NIST has established with defenseand environmental space-based remote sensing companies.

Emissivity: The Crux of Accurate Radiometric Measurement

Frank Liebmann, Fluke Corporation – Hart Scientific Division

Infrared (IR) radiometry is a very useful form of temperature measurement. Itsadvantages over contact thermometry are that it has quick response times and it doesnot have to come in contact with the area being measured. One of its majordrawbacks is that it not as accurate as contact thermometry. One of the majorsources of this uncertainty is the emissivity of the surface being measured. This istrue for calibration of these devices as well. The best way to calibrate an IRthermometer is by use of a near perfect blackbody. However, a near perfectblackbody is not always a practical option for calibration. Flat plates are needed forcalibration of some IR thermometers. Emissivity is not always well behaved.Emissivity can vary with time, meaning that a flat plate’s surface coating needs tohave a burn in time established. Emissivity can also vary with wavelength andtemperature. This paper discusses the sources of error for flat plate emissivity.Knowledge of these sources leads to a more accurate calibration of IR thermometers.

Characterization of Integrating Spheres for Ultraviolet Radiation

Ping-Shine Shaw, NIST

Integrating spheres play an indispensable role when it comes to diffusing anddepolarizing radiation. They are widely used in radiometric applications because oftheir superior performance in transforming radiation to a nearly ideal Lambertiandistribution despite variations in the conditions of the incident radiation. In the visible,polytetrafluoroethylene (PTFE) has proven to be the best material for integratingspheres because of high reflectivity and chemical inertness. For UV application downto 200 nm, however, it was known for a long time that PTFE material fluorescesunder UV irradiation and such effect must be accounted for in analyzingmeasurement results. We have studied the performance of integrating spheres in theUV region with wavelengths as short as 200 nm. Two techniques were used for thisstudy; first, the spectral throughput of an integrating sphere irradiated by a deuteriumlamp was analyzed by a spectrometer. Second, a laser beam was directed into anintegrating sphere and spectrally dispersed Laser Induced Fluorescence (LIF) wasstudied. Significant absorption and fluorescence features occur in the UV from anintegrating sphere and are attributed to the contamination of the integrating sphere.The implication for using integrating spheres for UV measurement is discussed.

WORKSHOP K/L (Full Day):

Calibration and Testing 101 – Back to Basics, Practical Applications of Measurement Standard Requirements

Instructors: Jesse Morse, Fluke

Tim Mason, Edison ESI

Jim (Smitty) Smith, Boeing IDS

John Bowman, Fluke

Courtesy of Fluke, Edison ESI, and Boeing IDS

Abstract: This tutorial will present and examine a number of elements relatingto the functions, features and concerns of a working calibration/testing lab & itspersonnel. The selection of topics is not traditionally covered in a Metrology trainingseminar. Design of the presentation covers items more of interest to individuals whoare working in new disciplines, their Managers, Leads, Trainers or those whoseformal calibration/testing experience has been limited to “On-the-Job Training”(OJT).

Emphasis has been made to combine a series of short overviews that willprovide a broad spectrum of information with reference material to lead the student tofurther pursue those topics of priority or interest. This holistic approach builds uponelements of the measurement quality program, its impact on performance and specificskill sets both technical and standard compliance. This information is presented in acasual and relaxed atmosphere.

Key Areas: While many attributes contribute to a successful calibration program this tutorial will cover:

· History & growth of dependence on reliable measurements

· An intro to uncertainty, requirements, needs and basics w/ demo

· Surviving an audit, compliance what, how & when to run

· Dimensional basics, uses & applications

· IEC safety code impact on technicians & users

· Technician qualities & skill sets-what makes a good measurement

· Training program features & elements of a calibration cert

· Customer/Supplier relations as it relates to a calibration/ test lab function.

· ANSI Z540 changes and focus

Who Should Attend?

Calibration Managers & related staff, Instrument, Test & Quality engineerswanting to augment or reinforce current skills; Companies & Programs looking intocreating or extending their calibration/testing functions; Current “Program”representatives interested in enhancing their understanding of the measurement field;and Metrology/Calibration/ Test technicians who are looking to expand their skill setwith a broader knowledge of the application of measurement science.

For more information, please contact Tim Mason, [email protected];

James Smith, [email protected]; Jesse Morse, [email protected]

or John Bowman, [email protected]

WORKSHOP M (Full Day):

Advanced Uncertainty: Analysis Using Excel

Where Does Monte Carlo Simulation Fit In?

Instructors: Alan Steele and Rob Douglas

Courtesy of Institute for National Measurement Standards/National ResearchCouncil Canada

This is a hands-on tutorial: you must bring your own Windows notebook computer,pre-loaded with Excel (97 or later, and to have downloaded Borland's C compiler if you wishto participate in parts of the tutorial dealing with writing DLLs in C to be called from Excelmacros.


36 Measurement Science Conference 2007 13

Flow II


Session Developer: Tom Kegel, Colorado Engineering Experiment Station, Inc.

Test Program to Establish Direct NIST Traceability to a High Pressure,High Flow Rate Natural Gas Facility

Tom Kegel, Colorado Engineering Experiment Station, Inc.

New NIST/CEESI Natural Gas Flow Standard

Aaron Johnson, NIST

Automated Calibration of Primary Flow Provers

Harvey Padden, Bios International Corporation

Dissemination of quality calibrations has always been of critical importance. Formany types of calibrations, proper application of instruments is the most importantfactor in maintaining the quality of field calibrations. This is particularly true in thecase of gas flow calibration. Shippable primary standards exist, but proper applicationis still an important issue.

Interestingly, we, the makers of precision primary gas flow calibrators, face thesame problem as our users. If we include our less expensive primary provers, we havethe problem of assuring quality control of thousands of calibrations per year on aproduction basis. So, to paraphrase the ancients, who will prove the provers?

This is a problem that will become more common as other primary and high-accuracy devices are migrated from the lab to field use. While relatively simple forsuch artifacts as gauge blocks or voltage standards, it is a very complex problem forprimary flow provers.

How, then, to automate measurement of piston leakage tare, as well as high-accuracy flow comparisons with master devices at a variety of flow rates on anautomated basis, assuring maintenance of calibration quality?

We have designed a system for our internal use that valves various flows todevices under test while keeping inventory volume to the low, required value, alongwith the control circuitry to interface all the devices to master DryCal provers. Wewill discuss the process, mechanical and electrical designs in detail. We will alsodescribe the software used to control the process, including the preparation ofcomplete calibration certificates.

Flow III



Interlaboratory Flow Comparison of Two NIST Primary Flow StandardsUsing Critical Flow Venturis in Series

Aaron Johnson, NIST

Optical Radiation Metrology


Session Developer: Dr. Uwe Arp, NIST

Detector Spectral Power, Irradiance, and Radiance ResponsivityCalibrations Using Uniform Sources From 210 nm to 5,000 nm

George P. Eppeldauer, NIST

Detectors are traditionally calibrated for spectral radiant power responsivity usinglamp-monochromator systems to tune the wavelength of the excitation source.Silicon detectors can be calibrated in the visible spectral region with combinedstandard uncertainties at the 0.1% level. In many applications, the amount of lightfalling on a surface (irradiance) or the amount of light emitted from a source(radiance) are to be known and an instrument’s irradiance or radiance responsivitymust be measured. Because of the low flux in lamp-monochromator systems,instruments cannot be directly calibrated for irradiance or radiance responsivities.Also, primarily because of the low radiant flux in lamp-monochromator systems, theuncertainty in radiant power responsivity calibrations increases dramatically in boththe UV and the IR spectral regions.

The first Supplement to the ISO Guide to the Expression ofUncertainty in Measurement, even in its 2004 draft, defines a standardprocedure for evaluating uncertainties in difficult circumstances and forvalidating uncertainty methods. It proposes “Monte Carlo simulation” asa standard method. In this tutorial you will learn to use and to modifyExcel macros that perform the Monte Carlo simulations proposed in theISO Guide’s draft Supplement One.

The tutorial will cover the basics of Monte Carlo simulation byprogramming in Visual Basic for Applications (VBA), Excel’sprogramming language for macros. You will need to be comfortableprogramming in some variety of BASIC, since you will be modifying theinner loop (of tens to hundreds of lines of code) of our Monte Carloroutines to simulate the system or systems chosen from your workplace.

Although VBA suffices for many simulations, some others requireaccess to special programs written in C or FORTRAN, which areimpractical to rewrite and revalidate in VBA. Some applications requirethe faster execution offered by a fully compiled language (more that 10xfaster than VBA). Knowing how to harness C or FORTRAN will giveyou the confidence to tackle more complex problems – although you maybe delighted to find how powerful VBA can be even without invoking Cor FORTRAN routines.

The tutorial will address how to interface routines from higher-levellanguages: for hands-on work it will use examples from C together withthe freely-available Borland C compiler. If you want to participate in C-language hands-on examples, you should also pre-load your computerwith this compiler (details are at http://inms-ienm.nrc-cnrc.gc.ca/qde/montecarlo/choosedownloads.html#paragraph02).

In the afternoon we will discuss how Monte Carlo simulation can beused for measurement science beyond simple uncertainty analysis. Wewill show how to invoke powerful tests of measurement science, byaggregating normalized errors (En) as a mean-square chi-squared-likestatistic. We will use Monte Carlo simulation to evaluate rigorously theappropriate probabilities, which can depart significantly from analytic chi-squared functions. The tutorial’s last focus will be on how to maketoolkits and document them so that they are suitable for use by others,and on documenting a procedure’s validation for your quality system.

This workshop is advancing the usage of Excel features for MonteCarlo method described in the GUM’s draft Supplement One formeasurement uncertainty calculations. Modifying the Excel macros toperform the Monte Carlo simulations will be presented.

For additional technical information, contact Alan Steele,[email protected],

or Robert Douglas, [email protected].

WORKSHOP N (Full Day):

Measurement Uncertainty: Fundamental Applications/Considerations

Instructor: Dilip Shah

Courtesy of: E=mc3 Solutions

This is a beginner to intermediate level workshop targeted toward metrologists,technicians, and engineers. This workshop will also be useful for procurers ofcalibration services. This workshop covers the measurement uncertaintyfundamentals for metrology professionals new to the subject. Statistical conceptsrelevant to metrology and measurement uncertainty are introduced, explained, anddemonstrated. Topics from the U.S. Guide to the Expression of Uncertainty inMeasurement (ANSI/NCSL Z540-2-1997) are covered.



and OILM point out the importance of traceability and the mutual recognition of allcorresponding MRAs. That includes the full acceptance of CIPM-Key comparisonreference values in all member states of CIPM, ILAC, and OIML.

At last, the paper gives a view toward the so-called Harmonized EuropeanReference Value for the Natural Gas Cubic Meter, which is being disseminated allover Europe since 4 May 2004. In the meantime, it has also been accepted on othercontinents as the national reference, e.g. Canada via NRC-TCC.

It turns out that this Harmonized European Reference Value is exactly the sameas the above mentioned CIPM/BIPM Key Comparison Reference Value for naturalgas. The metrological consequences and benefits of such a Key ComparisonReference Value for international trade will be discussed. This HarmonizedReference Value has already been accepted in nearly all Eastern and WesternEuropean countries as well as in Canada. It turns out that there are significantdifferences between the U.S., Europe, and Asia in their view to metrology and theirway how to disseminate reference values.

A Similarity Theory for the Thermal Mass Flow Sensor and Its GasConversion Factor

Dr. Chiun Wang, Celerity, Inc.

This paper proposes a similarity theory for the capillary thermal mass flow sensor.The theory expresses the sensor output, divided by the gas thermal conductivity, asa function of the Péclet number, i.e. (RePr), of the flow inside of the sensor tube. Thetheory compares favorably with experimental data collected for a wide range of gasesover a wide range of flow rate. The similarity model is useful because it not onlydescribes the sensor output as a function of the flow rate, but also provides a methodto scale the sensor output characteritic curve from gas to gas by using the thermal-physical properties alone. The similarity model is applicable in both the linear and thenonlinear range of the sensor. In the linear range, the model condenses into theconventional gas conversion factors widely in use by the thermal mass flow controllerindustry.

A Multi-Functional Thermistor for Simultaneous Measurement ofTemperature and Wind Velocity

Akihiko Shimoyama, Saga University

Originally, the various sensors are devices to detect some single physical quantity,excluding the physical quantity that is not necessary by the collection or calibration.However, we think that the physical quantity in the natural world does not show anindependent change and generally conglomerated change. Then, we propose theconcept of a multi-functional measurement, which makes from conglomerateinformation to individual information. Here, we report that information on thetemperature and the wind velocity as the physical quantities were obtained by usinga multi-functional measurement of a thermistor.

The thermistor has the different characteristics and the information except thetemperature so as the humidity and the wind velocity, when the current of thethermistor increases. Therefore, the thermistor current of 2.5 mA and 5 mA areused. The database and the orignal processing are used for the purpose of makingfrom conglomerate information to individual information. The database is made at atemperature from 25°C to 35°C (1°C step) and at a wind velocity from 1 m/s to 4 m/s(1 m/s step) in the condition with a fixed humidity of 30% ± 10%. We use the methodof signal processing using approximate expression of the least square method.

The measurement is carried out at 28.7°C in temperature and 1.5, 2.5, and 3.5m/s in wind velocity by using a multi-functional measurement in the point except thedatabase. As a result, it was agreed to the value of standard sensors by about 0.1°Cfor the temperature and about 0.1 m/s for the wind velocity.

It was found to be able to measure the temperature and the wind velocity by usinga multi-functional measurement in the range from 25°C to 35°C and from 1 m/s to 4m/s using the thermistor current of 2.5mA and 5 mA.

14

Building on the fundamentals, the workshop proceeds to cover practicalexamples encountered in metrology using a hands-on approach fordetermining measurement uncertainty. This workshop breaks down themeasurement uncertainty determination into a 7-step process. As eachstep is covered, a computer spreadsheet template is developed to calculateand document the uncertainty data. Examples and techniques related tometrology and measurement; including Test Uncertainty Ratios (TURs),control charting applications in metrology, and data validation are discussedduring the workshop to ensure that participants leave the session withpractical and timesaving techniques that can be utilized in their profession.

For further information on this workshop, contact Dilip A. Shah, (330)328-4400, or [email protected].

WORKSHOP O (Full Day):

Understanding Meter Calibration for Dimensional Calibration Technicians

Instructor: Mitch Johnson Courtesy of:Donaldson Company, Inc.

This workshop presents, in a practical set-up, the calibration ofvoltmeters, current meters, ohmmeters, and multimeters using amultifunction meter calibrator. It includes the theory and workingprinciples of different types of meters.

For further information on this Tutorial Workshop, contact MitchJohnson at( 952) 703-4703

or [email protected]


Keynote Speaker: Thursday, January 25, 2007 9:00 AM

Speaker: PROFESSOR ANDREW WALLARD

Professor Andrew Wallard has been the Director of theBureau International des Poids et Mesures in Sèvres, Francesince January 2004. Professor. Wallard was awarded a firstclass honours degree in physics from St. Andrews University,

Scotland in 1968, and a PhD in 1972. He worked as a laser physicist at the UK'sNational Physical Laboratory (NPL) until 1978. He then spent 12 years invarious central Government positions, including the Prime Minister's CabinetOffice, and the Department of Trade and Industry where he was a specialadvisor to various Ministers. He has broad experience of science andtechnology policy and also managed several industrial programs or researchsupport, which were operated by the UK Government and the EuropeanCommunity. He specialized in University/industry collaboration.

Professor Wallard returned to the NPL in 1990 as Deputy Director and,subsequently, the NPL's Chief Metrologist. From 2005, he was a member ofthe International Committee for Weights and Measures (CIPM) and Presidentof the Consultative Committees for Photometry and Radiometry (CCPR) andfor Acoustics, Ultrasonics, and Vibration (CCAUV).

Professor Wallard was subsequently elected as the Director of theInternational Bureau of Weights and Measures (BIPM). The BIPMcoordinates world metrology and is an Inter-Governmental body under theTreaty of the Metre, supported by over 60 countries.

Professor Wallard was a Vice President of the UK's Institute of Physicsuntil 2005, is a Professor at the University of Wales, and has been awardedseveral national and international honours for his contribution to measurementscience and technology.

Professor Wallard is a member of the Board of the National Conference ofStandards Laboratories International (NCSLI); the Scientific Academy ofTurin; the UK's Physical Society; a Fellow of the Institute of Physics; aChartered Physicist, Engineer, and Scientist; and a life Fellow of the RoyalSociety of Arts, Manufactures, and Science.

Professor Wallard has published some forty refereed papers, generally onlaser physics and metrology, numerous conference proceedings, and hascontributed to various books on metrology.

Thursday, January 25, 2007 Luncheon Speaker

Speaker: Richard Y. Chang

Richard Chang has always been driven by his passion forpersonal and organizational excellence. In his youth, he masteredthree musical instruments and excelled at a variety of sports,including roller skating, tennis, swimming, water polo, volleyball,and bowling. As a freshman at UCLA, he won the NationalCollegiate Singles Championship in bowling, was named amateur

bowler of the year for Southern California, and joined the professional tour.

Chang is now CEO of Richard Chang Associates, Inc., a diversifiedperformance-improving consulting, training, and publishing firm headquartered inLake Forest, California. He is internationally recognized for his strategic planning,performance measurement, quality improvement, organizational development,product realization, change management, and human resource developmentexpertise. As an internal business practitioner, he held management and senior


paper will focus on how such smart sensors could be capitalized on in the Navy’sNetwork Centric vision to vastly reduce ship and Fleet calibration workloads andincrease ship readiness via remote shore based monitoring and distance support.

Currently, the Navy’s Integrated Condition Assessment System (ICAS) receivesboth monitoring and control systems parameter information (temperature, pressure,rpm, vibration, etc.) from analog based sensors and manually logged data (via PDAtype devices). These analog sensor channels are periodically (nominally every twoyears) calibrated manually. During these biannual manual calibrations, most of thesesensors are found to still be within acceptable bounds. With digital ‘plug & play’smart sensors with BIT capability, not only could the sensor parameter informationbe continually captured by ICAS, but the sensor heath information, last calibrationdate, sensor serial/model number, application/location, and calibration constantsinformation could also be available within the smart sensor and continually madeavailable to the ICAS database as well. Additionally, smart sensors lend themselveswell to computer controlled calibration; hence when sensor calibration proceduresare conducted, a calibration controller computer could automatically capturecalibration data.

Utilizing and leveraging the same ship to shore means described in the paper“Revolutionizing Maintenance through Remote Monitoring via ICAS & DistanceSupport” (reference 2), all this shipboard smart sensor calibration data could beremotely monitored and captured into the Navy’s shore based Metrology andCalibration (METCAL) databases. This data could then be continually analyzed byshore side metrology experts to optimally tailor calibration periodicities andsignificantly pare down and schedule any near term ship sensors calibration “to do”lists. In most instances, sensor calibration condition change (i.e., drift) is a slowprogression. Thus, with the above infrastructure, by anticipating (via shore basedMETCAL statistical analysis experts), only necessary calibrations can be scheduledand conducted before the sensor calibration condition might affect proper ship systemoperation. In the occasional cases when an individual smart sensor’s health goes froma stable condition to a rapidly disintegrating condition, the shore based experts wouldbe able to catch it as it is happening and potentially remotely troubleshoot the sensorwhile a ship is underway, hence minimizing equipment down-time and increasingmission readiness. This could all occur with little or no ship’s force intervention.

Flow I



The World Reference Value for High Pressure Natural Gas Flow asApproved by CIPM Key Comparisons

Dietrich Dopheide, Physikalisch-Technische Bundesastalt (PTB)

Key Comparisons (KCs) have been conducted to get international referencevalues for all quantities of interest under the auspices of the BIPM (InternationalBureau for Weight and Measures) as well as the CIPM (International Conference forWeight and Measures), which is the highest metrological authority worldwide.Among these KCs, the flow area is of economic importance and Key Comparisons fornatural gas flow at high pressure and larger flow rates as well as for compressed airhave been conducted successfully among all interested National Metrology Institutes.

The outcome of such a KC is the international Key Comparisons Reference Value(KCRV), which is then considered to be the worldwide best available realization ofNatural Gas Flow at high pressure. (World Reference Value).

These KCs have been conducted among the National Primary Standards of allnations worldwide, represented by their National Metrology Institutes (NMIs), andwere finalized in December 2004 for natural gas. The Key Comparison ReferenceValue was approved by the BIPM in April 2005, has been published at the BIPM web-site in January 2006, and is open for the public.

The paper describes the procedures, the participating high-pressure gas facilities,the outcome, and important conclusions for international as well as national gastrade. An internationally accepted reference value for the gas cubic meter will bemore and more important in a liberalized gas market. For the international pipelinegrid in Europe, which covers among others Spain, France, Benelux, Germany, and alltransit countries towards Russia, a common and international recommendedreference value will help to lower technical barriers in international trade. It is TheCIPM-MRA and the ILAC-MRA as well as the recent commonstatement/declaration dated January 2006 between CIPM, ILAC,

SPEAKERS


leadership positions in four organizations. He has served as an external consultant toa wide variety of domestic and international organizations, including Toshiba,Citibank, McDonald’s, Universal Studios, Fidelity Investments, Nortel Networks,and Nabisco. Chang has also served as the 1999 chair of the board of the AmericanSociety for Training and Development and as a judge for the prestigious MalcolmBaldrige National Quality Award.

Chang is the best-selling author or co-author of more than twenty-five books onbusiness and personal development and is the award-winning author of over tentraining videotapes, including his most recent release, The Passion Plan. A sought-after resource, he has made numerous presentations to organizations around theworld and has been featured by CNNfn, Making It!, Investor’s Business Daily,Entrepreneur Magazine, Gannett News Service, Reader’s Digest, Knight-Ridder, i-village.com (AOL), and ka-ching.com (Oxygen).


Temperature


Sesion Depeloper: Michel F. Holleron, NPSLStudy of a New Fixed-Point System for Calibration Short Secondary Platinum

Resistance ThermometerRong Ding, Fluke Corporation – Hart Scientific Division

A new fixed-point system was developed to calibrate short (8 – 12 inches)secondary platinum resistance thermometer (PRT) and industrial platinum resistancethermometer (IPRT). The system includes a modified metal-cased fixed-point cellbased on the existing metal-cased fixed-point cell, which was recently developed tocalibrate secondary PRT (12 inches), and a maintenance furnace with three-zonecontroller that provides excellent vertical temperature uniformity. The design andstructure of the new fixed-point system is described in the paper. The system wastested with tin and zinc freezing-point cells. The testing results, including the inter-comparison with primary cells, are presented and the freezing plateaus are fullyevaluated and discussed in the paper.

Methods for Evaluating the Condition of Platinum Resistance Thermometers

Mingjian Zhao, Fluke Corporation – Hart Scientific Division

Standard platinum resistance thermometers (SPRTs) and secondary platinumresistance thermometers (PRTs) are widely used as standard or referencethermometers to calibrate other thermometers and to measure temperature preciselyin temperature laboratories. These applications require the PRTs or SPRTs to besufficiently accurate and operating properly. Using thermometers that have unstableor uncharacteristic resistances produces unsatisfactory or invalid results, withpossibly very costly consequences. PRTs are fragile and are often inadvertentlydamaged by severe conditions or even routine use. Unless there is a system in placefor frequently evaluating the condition of PRTs, loss of accuracy, when it occurs, maybe unrecognized. It is important for quality assurance that all thermometers be testedregularly. There are convenient methods available for this. When a thermometer hasbeen found to be damaged or inaccurate it is also important to be able todiscern the cause so it can be avoided in the future, since it is expensive toreplace and recalibrate PRTs, especially SPRTs. Knowing what kind ofdamaged has occurred, it might even be possible to restore the thermometer toa nearly normal condition. Useful methods of evaluation tell when a PRT orSPRT has lost accuracy, indicate what kind of damage it has received, what thelikely causes of the damage are, and what actions should be taken. In this papersuch methods for evaluating PRTS and SPRTS are presented, which involve afew simple measurements and analyses of these in comparison with previousmeasurements. Research and testing from which these methods originate willbe explained. Interpretations of possible measurement results are discussedand recommended actions based on the results are proposed. These methodsare useful not only in the evaluation of SPRTs and PRTs, but may also beapplied to industrial platinum resistance thermometers (IPRTs).

Sensors (A panel discussion)


Transformation of Shipboard Sensors Calibration via Smart BIT/BICEnabled Sensors, Remote Monitoring, and Distance

Randy Rupnow, NSWC Corona, [email protected]

This paper discusses a proposed new approach for calibration support of largenumbers of future shipboard installed hull, mechanical, and electrical (HM&E)sensors. Rather than calibrating sensors on a fixed schedule as is the current norm,ships outfitted with digitally intelligent sensors, which have means built in to assesstheir own health [via robust built-in test (BIT), with the most robust possibly beingbuilt-in calibration (BIC)] could be used to automatically indicate when calibration isnecessary. These sensor attributes are discussed in depth in the paper “NewCalibration Strategies to Support Reduced Crew Sizes” (reference 1). Hence, this

Thursday, 25 January

Track A

1. United States Measurement System

2. Metrology History

3. Advances in Standards

Track B

1. Calibration Issues in FDA Regulated Environments

2. Public Safety

Track C

1. DC – Low Frequency

2. RF & Microwave

3. Calibration Technology for Dynamic Parameters

Track D

1. Flow I

2. Flow II

3. Flow III

Track E

1. Committee for Equipment Specifications

2. NSCLI RP-12 Determining and Reporting Measurement

Uncertainties

3. RP-1 Calibration Intervals

TECHNICAL PROGRAM SUMMARY



stress wave transmission. In order to eliminate reflected wave effect, themeasurement data are truncated and, as a result, some error is introduced. A methodfor compensating the sensor response characteristics is presented using the truncateddata. An example shows the application of quasi- function calibration for high-pressure sensors.

Physical/Mechanical


The In-House Capability of an Optical CMM Calibration for any CompanyShawn Mason, Boston Scientific

This paper will present the in-house development and implementation of acalibration process for calibrating an Optical CMM.

Topics covered:

• Issues and problems encountered during the development

• Uncertainty components and an uncertainty budget

• Calibration process

• Future improvements

• Conclusion

DIN ISO 6789 – European Norm for Torque Wrench Calibration

Capt. Peter Jaeger, German Armed Forces Calibration Service

With the relatively new European norm for Torque Wrenche Calibration DIN ISO6789, released in October 2003, the German Armed Forces - and all civil companiesusing torque wrenches too - had to reconsider the purpose of these tools to beadvanved from just tools to measurement equipment.

Torque wrenches the German Airforce uses have always been checked andmonitored - frequently and/or prior to use – as a request for aircraft safety. But sincethe European norm DIN ISO 6789 was released, perfomance testing of torquewrenches is not enough anymore - a full calibration has to be done - according to astandardized procedure, including evaluation of uncertainty and calibrationcertificate.

Theoretical thoughts in a calibraton laboratory and every day use requirementsmet. This presentation will:

• Give an introduction into the european norm DIN ISO 6789

• Point out its basic requirements

• Show the problems that occured while calibration

• Give a short preview of usuable equipment including adapting U.S.-madeequipment

• Document calibration experiences of a big company holding several 10.000torque wrenches

• Give hints for using the norm

This presentation tries to point out general and basic demands and showexperiences, problems and known solutions.

A Review of Shock and Vibration Calibration Methods of Accelerometers

Marco Peres, Modal Shop

Shock and vibration phenomena are present around us in everything that moves.The accelerometer, either alone or with other electrical components, produces anelectrical output signal related to the applied motion. Accurate accelerometercalibration is a way to provide physical meaning to this electrical output and it is aprerequisite for quality measurements. Methods, systems, and standards onaccelerometer calibration are discussed, providing an overview on current technologyavailable for calibrating and testing accelerometer performance characteristics.

Track F

1. Managing Change

2. Business Processes

3. Lean/Six Sigma

Friday, 26 January

Track A

1. Equipment Practices and Processes

2.UID and RFID

3.Accreditation

Track B

1. Metrology Education from a Quality Perspective

2. Applying Measurement Quality

Track C

1. Physical/Mechanical

2. Temperature

3. Sensors

Track D

1.Optical Radiation Metrology

2. AC Power Measurements

Track E

1. Test Equipment Management, Business Solutions for

Efficient M&TE Management

2. ANSI Z540.3 Handbook

3. Education

Track F

1. Uncertainty I

2. Uncertainty II



Four waveform patterns are available with the MG3700A:

- The standard built-in waveform pattern.

- Various optional waveform patterns

- Optional IQ-producer waveform generation software

- Data created by general signal generation software changed into waveformpatterns.

The IQ-producer waveform generation software conforms to variouscommunication systems. IQ sample data files (in ASCII format) generated bycommon EDA (Electronic Design Automation) tools can be converted to waveformpattern files.

The Problem(s) with Microwave Power Measurements

Ronald Ginley, NIST

Microwave power measurements are used to support almost every segment ofthe microwave electronics industry. It is very important for these measurements tobe as accurate as possible. Recently we have found several different problems thataffect microwave power measurements. This paper will explore these problems,which include rf leakage, common-mode, and other noise signals, ground loops, andcompensation beads. Data related to these problems will be presented.

Calibration Technology for Dynamic Parameters


Session Developer: Jing Zu, North University of China

Uncertainty Analysis of Frequency Response of Pressure Transducer

Dr. Zhijie Zhang, North University of China

Frequency response is the major specification in dynamic measurement systems.Furthermore, the differences of estimated frequency response will add to dynamicuncertainty. Uncertainty analysis on frequency response of transducers has been animportant job in evaluating measurement systems and the results.

In this paper, uncertainty of frequency response is defined as statistic result, whichis based on experimental data of multiple dynamic calibrations. Uncertainty offrequency response is derived from the average amplitude response and the phaseresponse, which reflect their biasing in a certain probability level.

The paper describes three kinds of typical dynamic calibration methods, which arerespectively used by Quasi- pressure signal generator. Sine-wave pressure signalgenerator, step pressure signal generator, and modeling methods of transducers ormeasurement system using dynamic calibration results. Some mathematic modelsare used, such as regression model, time-sequence model, neural network, and so on.The paper also analyzes effect of model arithmetic on frequency response.

Traceable Dynamic Calibration for High Temperature Sensors

Hanchang Zhou, National Key Laboratory for Electronic MeasurementTechnology, North University of China

The first dynamic calibration results for temperature sensors at 2,000°C usingCO2 laser as excitation sources are reported. The short optical pulse rise and falltime of the high power laser makes it possible to heat up the sensing surface of thesensor being calibrated to a high temperature transiently. It is considered the truetemperature vs. time relation during dynamic calibration can be received by the fastresponse infrared detector. The traceability is accomplished successfully throughunbroken chain of comparisons with appropriate standard at the same calibrationsystem.

Keywords: Dynamic Calibration, Temperature Sensors, Laser, and traceability.

Quasi- Function Calibration of Dynamic Characteristic of High-Pressure Transducer

Jing Zu, North University of China

After defining dynamic characteristic calibration of high-pressure (over 100MPa)sensors, the paper presents the principle of quasi- function calibration, an approachto implement quasi- function calibration by use of a Hopkinson bar and liquid oil for

United States Measurement System (A panel discussion)


Panel Moderator: Steve Doty, NSWC Corona, [email protected]

Metrology History


Session Developer: Miguel Cerezo, Amgen, [email protected]

Ancient Chinese Volumetric StandardsMiguel Cerezo, Amgen, [email protected]

20 C – A Short History of the Standard Reference Temperature for Length

Theodore D. Doiron, NIST

While most dimensional metrologists know that the reference temperature fordimensional measurement is 20°C, very few know how or why that temperature waschosen. Many people have thought it was, in some sense, arbitrary. In actuality, thedecision was the result of 20 years of thought, discussion, and negotiations thatresulted in the International Committee of Weights and Measures (CIPM)unanimous adoption of 20°C as the reference temperature on 17 April 1931. Ofparticular interest is a personal letter from C. E. Johansson, the inventor of gaugeblocks, that discusses his studies and efforts to satisfy a worldwide market in the faceof wide spread variations in the reference temperature for length measurements.

Measurement Uncertainty: A History

Dr. Dennis Jackson, NSWC Corona, [email protected]

The methodologies used to estimate the uncertainty in measurements have gonethrough a very interesting evolution. Initial methodologies based in classical statisticalmethods suffered because observed data taken during a measurement session doesnot adequately represent all the error sources inherent in a measurement. It was alsoexceptionally difficult to estimate the uncertainty of complex measurement equationsusing standard probabilty theory.

The most recent version of the GUM allowed for the incorporation of theseunrepresented error sources using knowledge based methods. These knowledgebased methods are reminiscent of (though not exactly implementations of) Bayesianstatistical methods. In addition, the uncertainty of measurement equations was dealtwith using a Taylor Series Expansion method, which could be applied in a cookbookfashion. The acceptance of the GUM has not provided a universally understoodmethodology, but it has provided a solid foundation for measurement uncertaintyestimation practices.

Much of the current thinking in future directions for uncertainty analysis involvesthe use of more formal Bayesian methods supported by Monte Carlo computation.The Bayesian methods satisfy the need for a more formal foundation for the use ofknowledge based methods, while Monte Carlo computation deals with the dramaticincrease in complexity introduced by the Bayesian methods. In addition, Monte Carlomethods provide for more exact estimation of the uncertainty measurementequations than is provided for by the GUM Taylor Series Expansion method.

Other important directions for uncertainty analysis involve the development ofobserved data methods to estimate the uncertainty of error sources currently handledusing knowledge based methods. This lifts some parts of uncertainty analysis fromthe shadowy realm of knowledge assumption, to the more firm foundation of dataanalysis. These estimation methods use experimental design and statistical analysisof variance to estimate the uncertainty of error components.

In addition, there is an active interest in estimating uncertainty as a function oftime. Without a time component, a mesurement uncertainty expression is only validat the time of the measurement. For manufacturers interested in describing theuncertainty associated with a measurement instrument, the need to predictuncertainty over a period of time is very relevant. Some manufacturers are alreadydoing a pretty good job of this.

ABSTRACTS



Advances in Standards


Study of Procedure of Primary Standard Pressure Balance Characterization

Dr. Alaa Eldin, A. El-Tawil, NIST

A primary pressure standard that can be metrologically characterized in acomplete and an independent way with reference only to the basic units of the S.I.system, is defined as force per unit area (pressure balance) or the height of a liquidcolumn (liquid manometer). Pressure balances are excellent primary standards formeasuring pressure with high resolution and high accuracy. Characterization ofprimary standard pressure balance (controlled clearance) will be presented in thiswork. Study of the metrological characteristics of a controlled clearance pressurebalance, PG-67, has been carried out according to Heydemann and Welch modelusing diethyl-hexyl-sebacate as a working fluid, is presented through this work. Toattain this, experiment for determination of the short term pressure stability at allapplicable jacket pressure and pressure points was carried out. The effects of jacketpressures on the pressure stability as well as the optimum jacket pressure that couldbe used to provide the lowest pressure scattering at each pressure point weredetermined. On the other hand, to improve the pressure stability a pressure balancewas used to generate, control, and measure the jacket pressure instead of pressuresensor. A procedure to determine the coefficient “d” in Heydemann and Welchmodel was proposed and implemented. With little modifications, it was used tomeasure the zero pressure effective area for NIS 200 PCA. The procedure is fasterthan the normal cross floating procedure and it does not suffer from the personal errorsince the balancing point is determined through pressure sensor and computerprogram. Comparing its results with the normal procedure shows the advantage ofthe new procedure in eliminating the drift and reducing the instability of the oiltemperatures comes from the long operating time, besides saving the timing of theexperimental work.

Calculations of the generated pressure using the characterized primary standardwas carried out with proposed uncertainty budget for the generated pressures.

Uncertainty Examination Obtained in Calibration of (1… 10) Kg Set ByUsing Subdivision Method or Multiplication Method

Adriana Valcu, National Institute of Metrology

The realization, maintenance, and dissemination of the IS base unit “kilogram” isone of the tasks of the NMI’s mass laboratories and is assured by means of referencestandards, which are traceable to the International Kilogram Prototype through themass of the National Prototypes.

This paper describes the dissemination of mass scale from 1 kg reference standardto weights of E1 class between (1...10) kg using one of two methods of calibration:subdivision or multiplication. The paper compares type A uncertainty obtained byboth methods.

The subdivision method presented deals with a link of standards where themeasurements start downwards from 10 kg to 1 kg (using Romanovski model). Themultiplication method is the one usually used in many calibration laboratories andstarts from 1 kg to 10 kg.

The objective in the search for better design is obtaining a minimum value of thediagonals elements in the inversion matrices. The paper also presents an example ofcalibration and uncertainty calculation.

Equipment Practices and Processes


An Integrated Certification Strategy for Modular Instrumentation TestPlatforms

David Manor, Geotest – Marvin Test Systems, Inc.

During the past 15 years, the deployment of modular test systems formanufacturing test applications has proliferated. Starting with VXI in the early 1990s,card modular architectures have become an integral part of ATE systems. Today, theprimary card modular architecture is based on the PXI standard with thousands of

Computer-Controlled Nuclear Magnetic Resonance Magnetometer forMagnetic Field Standard

Dr. Terumitsu Shirai, Calibration Lab, Japan Electric Meters InspectionCorporation

In order to establish the magnetic field standard up to approximately 3 T, NuclearMagnetic Resonance (NMR) is widely used. In Japan Electric Meters InspectionCorporation (JEMIC), we have also established the standards from 2.5 T to 30 mTby using a commercially available NMR magnetometer. However, it is necessary toevaluate some factors of the measurement uncertainty. Therefore, we haveinvestigated the detection resolution of the NMR magnetometer with the“superimposed small magnetic field method” and an extremely stable magnetic fieldgenerator.

In this paper, a high-resolution computer-controlled NMR magnetometer wasinvestigated. The developed NMR magnetometer consists of a sine-wave generator,a phase-sensitive demodulator, and a digital voltmeter. Its resolution is evaluatedusing a permanent type magnetic field generator in a magnetic field of 299.2 mT.

As a result of discussion, it was shown that the resolution of our NMR is morethan approximately 0.3 µT.

RF & Microwave

2:00 – Thursday, January 25, 2007

Session Developer: James C. Wheeler, NPSLThe Challenges of Precision Analog Modulation Measurement

Paul Roberts, Fluke Corporation

In today’s digital world, many established analog techniques are being replaced bymodern digital alternatives. Digital modulation is now commonplace, particularly inmobile communications, but traditional analog amplitude and frequency modulationare still in widespread use. Laboratories performing RF calibration report that analogmodulation meters and analyzers are a part of their workload that cannot be ignored.When a new RF calibration source was designed, precision analog modulation wasincluded to address this workload. This paper describes the digital signal processingbased techniques used to measure its modulated outputs, and explores the challengesin assessing modulation measurement uncertainties and validating the resultsobtained.

Calibration Issues and Considerations for Digital Modulations-ErrorVector Magnitude (EVM) Performance Test

Dr. Brian Lee, Anritsu Company

Mobile communication systems are evolving to higher speed and increasedwideband modulation. Cellular phones and WLANs are handling more information.Broadcast and information service systems are moving toward digitization.Converting from analog modulation to digital modulation advances informationservices and provides more effective frequency utilization. New wirelesscommunication systems increase user mobility.

Measuring digital signals is not as straightforward as the procedure in measuringtheir analog counterparts. Error Vector Magnitude (EVM), a measure of signalquality, provides both a simple, quantitative figure-of-merit for a digitally modulatedsignal and for uncovering the underlying causes of signal impairments and distortion.The error vector is the vector difference at a given time between the ideal referencesignal and the measured signal. Expressed another way, it is the residual noise anddistortion remaining after an ideal version of the signal has been stripped away. EVMis the root-mean-square (RMS) value of the error vector over time at the instants ofthe symbol clock transitions. The paper describes the error vector magnitude andrelated measurements, and discusses how the accuracy of a vector signal analyzer isdetermined. This paper will also discuss the performance test procedure for makingan EVM measurement and its calibration requirement. We will use a vector signalgenerator (MG3700A) and a signal analyzer (MS 2781A) for the demonstration. TheMG3700A Vector Signal Generator supports digital modulation of signals for all majorwireless communication systems. It is a 160 MHz high-speed arbitrary waveformbaseband generator including wide vector modulation bandwidth and large capacityARB memory. By choosing an arbitrary waveform pattern, a modulation signal can beoutput that meets the requirement of various communication systems.



PXI-based systems in use today, and with current market growth exceeding 35%CAGR. The flexibility and configurability associated with today's modulararchitectures also creates new challenges for the calibration and certification of thesesystems. Unlike "box" instruments, which are stand-alone entities and can be easilyremoved and recertified, card modular instruments like PXI require system"infrastructure" - i.e., a backplane and system software in order to function. Andwhile an ATE system may include a system level accuracy verification or certificationprocess, some type of process or methodology is still required to recertify thosemodules requiring periodic recertification or calibration. Historically, the process forrecertification of modular instruments has been to remove and return the modules tothe OEM or a third party test house, resulting in system down time. However, apreferred method is to a recertify the modules within the host test system. Thispaper discusses how the development and inclusion of a standards module as part ofthe modular test system can help create an integrated certification strategy formodular instrumentation test platforms. By judicious selection and use of frequency,resistance and voltage standards, in conjunction with test software, a certificationstrategy can be developed that supports the certification of measurement and sourceinstrumentation resources within the test system – minimizing system down time andoffering test managers added flexibility for supporting in-house certification ofmodular test system components.

An Application of Accelerated Lifetime Design (Design Makes a Difference!)

Dr. Adriana Hornikova, NIST

The durability and lifetime of storage media, such as CDs and DVDs, wasinvestigated utilizing an accelerated testing experiment. An optimally designedexperiment was determined to minimize the bias and uncertainty of the predictedmedian lifetime at ambient conditions. This approach will apply for different CD andDVD manufactures and types.

The ISO 18 927 and ANSI standards specify five different stress conditions inconjunction with the Eyring model, for predicting the ambient life expectancy of CDsand DVDs. For variance stabilization we used the logarithm of the failure times forthe least squares regression fit to predict failure at ambient conditions. A simulationwas carried out to determine the optimal accelerated testing design for this study, andto determine the lifetime estimates (and uncertainty) at ambient.

Measurement of Solderability and Printability of Solder Pastes Using ACImpedance Methods

Dr. Mohammad Amin, National University

The solderability and the printability of soldering depend upon both the quality ofthe flux in a solder paste and the surface condition of the substrate of a printed circuitboard. The values of these attributes of a solder paste degrade with time andexposure to an atmosphere with high humidity and temperature. This paper brieflydiscusses how AC Impedance methods can be used to evaluate the solderability andthe printability of a solder paste under different conditions. In this study, a number ofgood and bad solder pastes were evaluated and their circuit parameters weredetermined. These values were found to be significantly different for good samplesand bad samples. It was observed that the AC electrical impedance data werecorrelated with the physical and chemical changes occurring within solder pastes.The outcome of this research helped to design a Statistical Process Control tool(IS4000) that assists manufacturers in rapidly determining solder paste productionlife, providing accurate and quick incoming inspection information for new solderpaste, and more tightly controlling changes in the solder paste during manufacturing.

Keywords: Solder Paste, Flux, Activator, Substrate, Rheology, Activation Energy,SPC, Impedance, and Relaxation Time Constant.

UID and RFID (A panel discussion)


Panel Moderator: Craig Macdougall, NSWC Corona,[email protected]

Metrology Education from a Quality Perspective


Session Developer: Duane Allen, NSWC Corona, [email protected]

Measurement Science Training Assurance

Emil Hazarian, NSWC Corona, [email protected]

This paper will discuss the development of a training program for theMeasurement Science Department at NSWC Corona, aimed at satisfying thetechnical rigors and other U.S. Navy requirements. The paper describes theadaptation of the training program to the quality assurance principles and format,through redundancy elimination and providing training uniformity and continuity,both vertical and horizontal.

Applying Measurement Quality


Session Developer: Dilip Shah, E=MC3 Solutions

DC – Low Frequency


Calibration System for Inductive Voltage Divider in Japan ElectricMeters Inspection Corporation

Akihiko Shimoyama, Japan Electric Meters Inspection Corporation

Japan Electric Meters Inspection Corporation (JEMIC) has been performing thecalibration of the inductive voltage divider (IVD) for approximately thirty years. Anational standard of IVD, as the voltage ratio standard in the field of alternatingcurrent (AC), was established in the National Metrology Institute of Japan, NationalInstitute of Advanced Industrial Science and Technology (NMIJ/AIST) in 2005.Therefore, an IVD calibration system with high accuracy to extend the calibrationrange was reconstructed in JEMIC.

This paper describes the principle of new IVD calibration system developed by thecooperation of NMIJ and the calibration method of IVD. A secondary standard forthe voltage ratio standard maintained in JEMIC is an IVD with five dials using theprinciple of a two-stage transformer. The first dial of a secondary standard IVD iscalibrated by NMIJ at 10 Vrms and 1 kHz. The standard of IVD is extended using anIVD calibration system at ratios up to 1 in 104, at voltages up to 150 Vrms, and atfrequencies from 50 Hz to 10 kHz. The unit under test of IVD is calibrated bycomparing with the standard IVD at a 1:1 ratio.

Furthermore, the calibration work is efficiently executed, and consequently, thecalibration of one dial (ten points) of an IVD can usually be accomplished in about 15minutes. The best measurement capabilities (BMCs) are 0.2 ppm (k = 2) for in-phaseand 4 ppm (k = 2) for quadrature at 10 Vrms and 1 kHz.

Recent Improvements in AC-DC Difference Calibration Service forThermal Transfer Standards at NIS, Egypt

Mamdouh M. Halawa, Electrical Metrology Department, National Institutefor Standards (NIS)

This paper gives a brief summary of the AC-DC difference calibrationservice for thermal transfer standards at the National Institute for Standards(NIS), Egypt. Related subjects discussed include automated calibrationsystem, bi-lateral intercomparison (with NPL, UK), the efficiency test, a newcurrent shunt for thermal current converters, and recent research into thermaltransfer standard.


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Accreditation


Session Developer: Patty Leyva, NPSL, NPSL, [email protected] the Navy to NVLAP and Back Again – A Tale of Two Programs

Steve Doty, NSWC Corona, [email protected]

In 1981, a young man left a small town in Illinois to join the Navy and see theworld. He became involved in the Navy Metrology and Calibration Program as anInstrumentman. Upon leaving the Navy after eight years, he went to work at theNational Institute of Standards and Technology (NIST) as a member of the Pressureand Vacuum Group. Eight years later, he became a staff member of NIST’s NationalVoluntary Laboratory Accreditation Program (NVLAP). In 2005 and not quite asyoung, he finds himself as the Program Manager for the Joint Naval AuditCertification Program (JNAC). These are his stories. This paper examines therequirements, processes, similarities, and differences of the two programs. This paperwill also discuss recent accomplishments and future plans of the Joint Naval AuditCertification Program.

Managing Change in an ISO/IEC 17025 Environment

Kelly Huckabone, Fisher Scientific Canada

The word “change” has many different definitions. Some as elegant as “becomingdifferent in essence” or as rigid as “a deviation from a currently established baseline”.Whatever the definition, the word “change” can evoke fear in people if the change isnot clearly communicated and implemented in a planned and systematic fashion. Inan ISO/IEC 17025 environment, “change” can create havoc and jeopardize theintegrity of the Management System if not implemented correctly. A mature 17025Management System can support change much more effectively than a system in theearly stages of development (recent accreditation).

Walk Like an Egyptian – Get Accredited

Bill Thompson, NSWC Corona, [email protected]

For many years the United States government has shared a successful foreignrelationship with the Egyptian government. Part of that relationship has beenbetween the United States Militaries and the Egyptian Militaries for procurement andsupport of military air and sea platforms and hardware. In particular, the UnitedStates Navy has played a vital role in establishing a metrology program with theEgyptian Air Force.

The Ancient Egyptian Measurement system has been noted as one of thefoundations for today’s measurement system. The system is identified as one of theearliest uniform systems of weights and measures. Most metrology engineers andtechnicians are familiar with the ancient Egyptian Royal Cubit as the standard usedto measure length during the rule of the Pharaohs. Little did anyone know that themeasurement system that was used to build the pyramids would be carried toestablish, what is today, the largest U.S. recognized ISO/IEC 17025 AccreditedEgyptian Primary Standards Laboratory in the Middle East.

How big is the lab? What were some of the hurdles to get over to establish alaboratory of this magnitude and capability in the middle of the desert? What are themeasurement parameters of the lab? What are the accuracies of the measurementparameters? What did it take to get an ISO/IEC 17025 Certificate of Accreditation?Where do we go from here? All of these questions, and more, will be answered inthis paper and presentation as we learn to Walk Like An Egyptian - Get Accredited.

Calibration Issues in FDA Regulated Environments


Session Developer: Raul Troncoso, Amgen

Uncertainty Analysis for Pipettes in Medical Laboratories

Sharon N. Nicholas, NSWC Corona, [email protected]

Pipettes are the best tools, which are applied in Medical laboratories, fortransferring or liquoring the exact amount of sample volume in patient’s tests.Therefore, pipettes require calibration at least every six months to check for accuracyand reproductivity.

To check pipettes for good or bad conditions, the Medical Technologist mustcalibrate the pipette, use the calibration results to calculate uncertainty, and thencompare uncertainty results against the specification of the Standard OperatingProcedure (SOP). This comparison method will help to determine the accuracy ofthe pipettes.

This paper will demonstrate and provide examples on the role of UncertaintyAnalysis for pipettes after their calibrations were performed in Medical Laboratories.

Bringing Calibration Maintenance Together: Asset Management forRegulated Life Science Companies

Bryce Johannes, Blue Mountain Quality Resources

Under regulatory and business pressures, life science companies are increasinglylooking for a single system to handle calibration and maintenance management.Regulated life science companies are leading the way on this harmonization becauseof the unique collaboration required in order to keep equipment, instruments, andprocesses in the validated state. In this context, information sharing, automaticnotifications, and change control approval routing are all key areas of collaborationmade easier under a single system.

In some cases, because of the volume of calibrations and strict compliancerequirements, calibration personnel have been able to convince management to usetheir best-in-class calibration system for maintenance management as well. Formaintenance, however, this has meant giving up work orders and integrated inventorymanagement. Just as commonly, the maintenance personnel, because of theirtypically larger budgets and impact on productivity, have been able to push theirsystem on calibration. For calibration personnel, this usually means using a workorder system that adds several minutes to each calibration and giving up richness andusability in such key areas as measurement data collection and reverse standardstraceability.

This presentation will provide an overview of the driving forces behind thisharmonization and the latest solutions for bringing calibration, maintenance, andvalidation personnel into a single software system without requiring anyone tocompromise on their productivity or compliance.

Public Safety


Session Developer: Hershal Brewer, International Accreditation Service (IAS)

Verification of Electrical Safety Testers: A Better Approach

Dale Beard, Fluke Corporation

Instrumentation to test the safety of electricity installations, appliances, machines,and electrical/electronic devices is becoming more prevalent, driven by new regulatorystandards designed to protect users from electrocution and fire hazards. Examples ofmandatory, annual testing standards are the UK EN 61557 and the German equivalent,VDE 0100. Both are to ensure safety compliance in commercial and residential electricalinstallations. Other standards, like EN 60601/60335/60950/61010 and VDE 0700, aredesigned to ensure the safety of electrical appliances and machines. Other types ofsafety compliance testing are done in the final stages of electronic device manufacturingto ensure product safety and robustness, to comply with standards like CE. As thesestandards have become mandatory in numerous countries throughout the world,electrical safety tests are becoming commonplace as test specialists, technicians, andproduction engineers need to demonstrate that installations, appliances, and devicesconform to strict government or test body standards. The instrumentation used tomake these tests fall into a number of categories: Insulation testers, Installation testers,Portable Appliance Testers, Earth Resistance Testers, Ground Bond Testers, HiPottesters, and Electrical Safety Analyzers. They are used in a variety of applications andindustries, from electrical appliance manufacturers, to electricians, contractors, hotels,hospitals, aerospace companies, plant maintenance, and so on.

In the past, it has been a challenge for metrologists to properly verify electricaltesters’ performance, especially for those testers with high voltages, high currents, andextreme resistance measurement capability. This paper describes the functionality ofthe electrical testers and discusses requirements to verify their performance. It will alsocover an improved method of verifying many of these devices and the challenges thedesign engineers faced when building these techniques into a new calibrator.


MEASUREMENT SCIENCE CONFERENCEEXHIBIT HALL LAYOUT


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