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The top documents tagged [worstcase test clock]
Externally Tested Scan Circuit with Built-In Activity Monitor and Adaptive Test Clock Priyadharshini Shanmugasundaram
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Vishwani D. Agrawal
221 views
Priyadharshini Shanmugasundaram
[email protected]
Vishwani D. Agrawal
[email protected]
DYNAMIC SCAN CLOCK CONTROL FOR TEST TIME REDUCTION MAINTAINING
218 views
Externally Tested Scan Circuit with Built-In Activity Monitor and Adaptive Test Clock
68 views
Dynamic Scan Clock Control In BIST Circuits
51 views