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The top documents tagged [test data registers]
(Jtag) boundary scan test - a practical approach - harry bleeker - peter van den eijnden - frans de jong - kluwer academic
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BTW 2010 An IEEE 1149.7 Update : Standard Reduced-pin and Enhanced-functionality Test Access Port and Boundary-Scan Architecture Adam W Ley ASSET InterTech,
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Presenter : Chien-Hung Chen Tsung-Cheng Lin Kuan-Fu Kuo 20090331 EICE team Open On-Chip Debugger Ch6. Design and Architecture
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The Hierarchical Scan Description Language (HSDL) was developed by to complement BSDL
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TAP (Test Access Port) JTAG course June 2006 Avraham Pinto
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National Sun Yat-sen University Embedded System Laboratory
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