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The top documents tagged [fault f1 test set]
Dec. 19, 2005ATS05: Agrawal and Doshi1 Concurrent Test Generation Auburn University, Department of Electrical and Computer Engineering Auburn, AL 36849,
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Independence Fault Collapsing and Concurrent Test Generation Thesis Advisor: Vishwani D. Agrawal Committee Members: Victor P. Nelson, Charles E. Stroud
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