×
Log in
Upload File
Most Popular
Study
Business
Design
Technology
Travel
Explore all categories
The top documents tagged [cd variation]
Weir PW Analysis of wafer-chuck influence on features Dataset:80_D2_1_2 Features: Device: 8-25 6x5 1:1 / Level: ASML AMD 100 1-2 T 320-640nm LotName No:80D2_1_2
216 views
Management of Process Laboratory in Mill Environment By D K Singhal Chandpur Enterprises Ltd., Sargam Theatre, Chandpur
[email protected]
[email protected]
227 views
Free-Flight Measurements of Sphere Drag at Subsonic, Transonic Supersonic, And Hyper Sonic Speeds for Continuum, Transition, And Near-Free-Molecular Flow Conditions
113 views
In Situ Meas Ecs 213 May 2008
270 views
Closing the Loop in Interconnect Analyses and Optimization: CMP Fill, Lithography and Timing Puneet Gupta 1 Andrew B. Kahng 1,2,3 O.S. Nakagawa 1 Kambiz
215 views
Enhanced Resist and Etch CD Control by Design Perturbation
43 views
7CD Variation and feeding relationships
31 views
Magazine summer98 p18
220 views