Space Radiation Effectsin Electronic Components.

Len AdamsLen AdamsProfessor Associate, Professor Associate, Brunel Brunel Univ.Univ.

Consultant to Spur Electron.Consultant to Spur Electron.For: PA and Safety Office. For: PA and Safety Office.

May 2003 May 2003

Space Radiation Effects in Electronic Components

Structure of Presentation1.1. Space radiation environment Space radiation environment 2.2. Radiation effects in electronic components.Radiation effects in electronic components.3.3. Radiation testingRadiation testing4.4. Use of commercial componentsUse of commercial components5.5. Guide to Guide to comradcomrad--uk uk resourceresource6.6. Open discussionOpen discussion

Space Radiation EnvironmentOverview

Complex and DynamicComplex and Dynamic

Trapped Radiation Trapped Radiation –– ‘‘BeltsBelts’’ of energetic electrons of energetic electrons and protonsand protons

Cosmic Rays (Energetic Ions)Cosmic Rays (Energetic Ions)

Solar Event protons Solar Event protons

Space Radiation EnvironmentTrapped Radiation

Electrons and Protons are trapped in the Electrons and Protons are trapped in the Earths magnetic field, forming the Earths magnetic field, forming the ‘‘Van Van AllenAllen’’ belts.belts.

Electrons up to 7 Electrons up to 7 MeVMeV

Protons up to a few hundred Protons up to a few hundred MeVMeV..

Electron Belts

Proton Belts

Space Radiation EnvironmentTransiting Radiation

Very high energy Galactic Cosmic Rays Very high energy Galactic Cosmic Rays originating from outside the solar systemoriginating from outside the solar system

Solar Events. (XSolar Events. (X--rays, protons and heavy rays, protons and heavy ions)ions)

Space Radiation EnvironmentGalactic Cosmic Rays

85% Protons, 14% Alpha particles, 1% 85% Protons, 14% Alpha particles, 1% Heavy Nuclei.Heavy Nuclei.Energies up to Energies up to GeVGeVExpressed in terms of Linear Energy Expressed in terms of Linear Energy Transfer (LET) for radiation effects Transfer (LET) for radiation effects purposespurposes

Space Radiation EnvironmentSolar Flares

Occur mostly near first and last year of Occur mostly near first and last year of solar maximumsolar maximum

Solar Events, composed mainly of protons Solar Events, composed mainly of protons with minor constituent of alpha particles, with minor constituent of alpha particles, heavy ions and electronsheavy ions and electrons

Space Radiation EnvironmentSouth Atlantic Anomaly

Distortion of the earthDistortion of the earth’’s magnetic field s magnetic field allows the proton belts to extend to very allows the proton belts to extend to very low altitudes in the region of South Americalow altitudes in the region of South America

Low Earth Orbiting satellites will be Low Earth Orbiting satellites will be exposed to high energy protons in this exposed to high energy protons in this regionregion

Space Station. 1 year dose-depth curve.

Space Station . Non-Ionizing Energy Loss spectrum.

Space Station. Orbit averaged LET spectra

Space Station. Proton flux as a function of orbital time.

Radiation Effects in Components(1) IONIZATION

Mechanism : Charge generation, trapping and Mechanism : Charge generation, trapping and buildbuild--up in insulating layers.up in insulating layers.

Due to: Electrons, Protons.Due to: Electrons, Protons.

Main Effects: Parameter drift. Increased Main Effects: Parameter drift. Increased leakage currents. Loss of noise immunity. leakage currents. Loss of noise immunity. Eventual functional failureEventual functional failure

Radiation Effects in Components(2) DISPLACEMENT

DAMAGEMechanism: Disruption of crystal latticeMechanism: Disruption of crystal lattice

Due to: ProtonsDue to: Protons

Main Effects: Reduced gain, increased Main Effects: Reduced gain, increased ‘‘ONON’’resistance, reduced LED output, reduced resistance, reduced LED output, reduced charge transfer efficiency in charge transfer efficiency in CCDsCCDs. .

Radiation Effects in Components(3) SINGLE EVENT

Mechanism: Dense path of localised Mechanism: Dense path of localised ionizationionization from a single particle from a single particle ‘‘hithit’’

Due to: Cosmic rays, high energy protons.Due to: Cosmic rays, high energy protons.

Main Effects: Transient current pulses, variety Main Effects: Transient current pulses, variety of transient and permanent of transient and permanent ‘‘Single Event Single Event EffectsEffects’’

Single Event Current Pulse

SEU Mechanism in CMOS bistable

Radiation Effects in Components(4) Single Event Effects in detailLatchLatch--up. Permanent, potentially destructiveup. Permanent, potentially destructiveBit flips (Bit flips (‘‘Single Event UpsetSingle Event Upset’’) in ) in bistablesbistablesHigh Anomalous Current (HAC), High Anomalous Current (HAC), ‘‘snapsnap--backback’’Heavy Ion Induced BurnHeavy Ion Induced Burn--out in power MOSout in power MOSSingle Event Gate Rupture (SEGR)Single Event Gate Rupture (SEGR)Single Event Transient, noise pulses, false outputsSingle Event Transient, noise pulses, false outputs‘‘Soft LatchSoft Latch’’ (device or system (device or system ‘‘lock uplock up’’))

Typical Single Event Transient Requirements.

Output voltage swing of rail voltage to Output voltage swing of rail voltage to ground and ground to rail voltage.ground and ground to rail voltage.Duration:Duration:15 microseconds for Op15 microseconds for Op--Amps.Amps.10 microseconds for comparators, voltage 10 microseconds for comparators, voltage regulators and voltage references.regulators and voltage references.100 nanoseconds for 100 nanoseconds for optoopto--couplers.couplers.

Radiation TestingSpecifications and Standards

Total Total Ionizing Ionizing Dose: Dose: SCCSCC--22900 (ESA22900 (ESA--SCC) SCC) Mil Std 883E Method 1019.6 (DESC) Mil Std 883E Method 1019.6 (DESC) ASTM F1892 (includes ELDRS)ASTM F1892 (includes ELDRS)Single Event:Single Event:SCCSCC--29500 (ESA29500 (ESA--SCC)SCC)EIA/JEDEC Standard EIA/JESD57EIA/JEDEC Standard EIA/JESD57ASTM F1192ASTM F1192

Radiation TestingImportant Considerations

Choice of radiation source.Choice of radiation source.Specifications and StandardsSpecifications and StandardsWorst case or application biasWorst case or application biasTest softwareTest softwareNumber of samplesNumber of samplesTraceabilityTraceabilityDatabasingDatabasing

Radiation TestingChoice of Source

Total Total Ionizing Ionizing Dose: CoDose: Co--60 gamma or 60 gamma or 11--3 3 MeV MeV electrons (electrons (Linac Linac or or VdGVdG))

Displacement Damage: Protons (10Displacement Damage: Protons (10--20 20 MeVMeV), ), Neutrons (1 Neutrons (1 MeVMeV), Electrons (3), Electrons (3--5 5 MeVMeV))

Single Event: Heavy Ion Accelerator (ESASingle Event: Heavy Ion Accelerator (ESA--Louvain Louvain HIF), Proton Accelerator (ESAHIF), Proton Accelerator (ESA--PSI PIF)PSI PIF)CfCf--252 252 ‘‘CASECASE’’ laboratory system.laboratory system.

Typical Radiation Verification (RVT) requirements.

TECHNOLOGYTECHNOLOGY REQUIREMENTREQUIREMENT DOSE RATEDOSE RATE

Bipolar TransistorBipolar Transistor Data > 10 yrsData > 10 yrs High or LowHigh or Low

MOS TransistorMOS Transistor All diffusion lotsAll diffusion lots High or LowHigh or Low

Linear ICsLinear ICs All diffusion lotsAll diffusion lots LowLow

MOS Digital ICsMOS Digital ICs Data > 1 yrData > 1 yr High or LowHigh or Low

Bipolar Digital ICsBipolar Digital ICs Data > 10 yrsData > 10 yrs LowLow

ASICsASICs, FPGA., FPGA. Data > 2 yrsData > 2 yrs LowLow

MOS RAM, ROMMOS RAM, ROM Data > 2 yrsData > 2 yrs High or LowHigh or Low

Bipolar RAM, ROMBipolar RAM, ROM Data > 6 yrsData > 6 yrs LowLow

OptoelectronicsOptoelectronics All diffusion lotsAll diffusion lots High or LowHigh or Low

Technologies generally considered to be radiation tolerant (~ 300 krad)

Diodes (other than Diodes (other than zenerzener).).TTL logic (e.g. 54xx series).TTL logic (e.g. 54xx series).ECL (Emitter Coupled Logic).ECL (Emitter Coupled Logic).GaAs GaAs (Gallium (Gallium ArsenideArsenide) technologies.) technologies.Microwave devices.Microwave devices.Crystals. Crystals. Most passives.Most passives.

Radiation TestingSample Size/Traceability

Sample Size:Sample Size:Total Total Ionizing Ionizing Dose. Minimum 5 samples. Dose. Minimum 5 samples. 4 test, 1 reference.4 test, 1 reference.Single Event. 3 samples recommended.Single Event. 3 samples recommended.TraceabilityTraceability::Use single LotUse single Lot--DateDate--Code for test and flight Code for test and flight hardware.hardware.

Dose-rates for testing.

-- High Dose Rate:High Dose Rate:SCC 22900 Window 1. 1SCC 22900 Window 1. 1--10 10 radsrads/sec./sec.MIL883E 1019.6. 50MIL883E 1019.6. 50--300 300 radsrads/sec./sec.

-- Low Dose Rate:Low Dose Rate:SCC 22900 Window 2. 0.01SCC 22900 Window 2. 0.01--0.1 0.1 radsrads/sec./sec.MIL883E 1019.6. 0.01 MIL883E 1019.6. 0.01 radsrads/sec./sec.

Elevated Temp.Elevated Temp. 0.50.5--5 5 radsrads/sec./sec.

Radiation TestingTest Software (Single Event)

Test pattern dependence. All 1, All 0, Test pattern dependence. All 1, All 0, Alternate 1Alternate 1--0, Chequerboard, MOVI.0, Chequerboard, MOVI.Different sensitivities for different registers.Different sensitivities for different registers.Dead Time. (detect flip/record/rewrite) Dead Time. (detect flip/record/rewrite) How to test Processors (How to test Processors (‘‘Golden ChipGolden Chip’’ ?)?)Possibility to run application software ?Possibility to run application software ?Beware of software/hardware interaction.Beware of software/hardware interaction.

Radiation TestingAnd finally……

TEST IT LIKE YOU FLY ITTEST IT LIKE YOU FLY IT

FLY IT LIKE YOU TEST ITFLY IT LIKE YOU TEST IT

(Ken (Ken LaBelLaBel. GSFC). GSFC)

Use of Commercial Components

The use of commercial technology does The use of commercial technology does NOT necessarily result in costNOT necessarily result in cost--saving.saving.

Cost of Ownership is the important Cost of Ownership is the important consideration.consideration.

First choice should always be QML or First choice should always be QML or Space Quality components if available.Space Quality components if available.

Why Use Commercial Technology ?

Complexity of functionsComplexity of functions

PerformancePerformance

Availability (limited number of QML/Space Availability (limited number of QML/Space suppliers).suppliers).

What are the drawbacks of commercial technology?

Little or no Little or no traceabilitytraceabilityRapid and unannounced design and process Rapid and unannounced design and process changes.changes.Rapid obsolescenceRapid obsolescencePackaging Issues (Plastic).Packaging Issues (Plastic).

-- Effect of burnEffect of burn--in on radiation responsein on radiation response-- Deep dielectric charging in space (?)Deep dielectric charging in space (?)

COTS Hardness Assurance

Define the hazardDefine the hazardEvaluate the hazardEvaluate the hazardDefine requirementsDefine requirementsEvaluate device usageEvaluate device usageDiscuss with designersDiscuss with designersIterate process as necessaryIterate process as necessary

Risk Assessment & Mitigation

Components list review by a radiation expertComponents list review by a radiation expertGood Radiation Design Margin (2Good Radiation Design Margin (2--5)5)Fully characterise key componentsFully characterise key componentsLimit the use of new technologiesLimit the use of new technologiesEliminate or shield marginal technologiesEliminate or shield marginal technologiesMaintain awareness of developments in radiation Maintain awareness of developments in radiation effectseffectsDo not cut back on testingDo not cut back on testingLook for system solutionsLook for system solutions

Countermeasures/MitigationTotal Ionizing Dose.

Additional shielding. Only effective in electron dominated Additional shielding. Only effective in electron dominated environments.environments.

Cold redundancy (Cold redundancy (‘‘sparingsparing’’). Not effective for all ). Not effective for all technologies.technologies.

Generous Generous deratingderating..

Robust electronic design. High drive currents, low fanRobust electronic design. High drive currents, low fan--out out or loading. Large gain margins, high noise immunity etc. or loading. Large gain margins, high noise immunity etc.

Countermeasures/Mitigation. Single Event Effects

Note that additional shielding is NOT effective.Note that additional shielding is NOT effective.

Ensure systems are not sensitive to transient effects.Ensure systems are not sensitive to transient effects.

Use fault tolerant design techniques.Use fault tolerant design techniques.

Use Error Detection and Correction for critical circuits.Use Error Detection and Correction for critical circuits.

Ensure systems can reEnsure systems can re--boot autonomously.boot autonomously.

COMRAD-UKAn integrated Web resource of components radiation effects

data.

Why Integrated Web Resource ?

COMRAD provides more than a database.COMRAD provides more than a database.it includes :it includes :

Components radiation effects database.Components radiation effects database.A tutorial handbook.A tutorial handbook.Links to radiation effects sites.Links to radiation effects sites.Links to manufacturers sites.Links to manufacturers sites.Links to publications in .Links to publications in .pdf pdf format.format.‘‘Experts ForumExperts Forum’’ for technical discussions.for technical discussions.

Available from COMRAD-UK Home Page

TermsTerms LinksLinks GlossaryGlossary

IndexIndex SearchSearch Total DoseTotal Dose

Heavy IonHeavy Ion NeutronNeutron ProtonProton

SponsorsSponsors ManufacturersManufacturers SeminarsSeminars

HandbookHandbook Publications Publications & News& News

Experts ForumExperts Forum

Welcome to COMRAD

This web site is the primary source of information on the internet for

COMponent RADiation data. Please feel free to browse and review the information contained herein.

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Origins of COMRAD-UK Database

ESA RADFX (on discs)ESA RADFX (on discs)Database Round Table (RADECS 1993)Database Round Table (RADECS 1993)Discussions with Space Agencies, Scientific Discussions with Space Agencies, Scientific Institutes and IndustryInstitutes and IndustryDiscussions with CERN LHC Project and Discussions with CERN LHC Project and Detector groups.Detector groups.

Aims of COMRAD-UK Database

To be To be ‘‘informativeinformative’’ not not ‘‘regulatoryregulatory’’..To contain recent data and be continuously To contain recent data and be continuously updated.updated.To provide data summary and detailed tabulated To provide data summary and detailed tabulated data (if available).data (if available).To provide contact details for the test authority.To provide contact details for the test authority.To be expandable for HighTo be expandable for High--Energy Physics and Energy Physics and AvionicsAvionics

COMRAD-UK Database status.

700 Total Dose records700 Total Dose records280 Single Event Records280 Single Event RecordsBeing updated on a monthly basisBeing updated on a monthly basisPrimary data resources:Primary data resources:

IEEE NSREC Data Workshop and ProceedingsIEEE NSREC Data Workshop and ProceedingsRADECS Data Workshop and ProceedingsRADECS Data Workshop and ProceedingsESA Contract Reports.ESA Contract Reports.IEEE Publications.IEEE Publications.CERN reports and publicationsCERN reports and publications

Origins of COMRAD-UK Handbook

ESA Radiation Design Handbook. PSSESA Radiation Design Handbook. PSS--609609Handbook of Radiation Effects. OUP 1993.Handbook of Radiation Effects. OUP 1993.The use of commercial components in aerospace The use of commercial components in aerospace technology. BNSC Contract Report 1999.technology. BNSC Contract Report 1999.Participation in CERN RDParticipation in CERN RD--49 collaboration. 49 collaboration. ‘‘Hardened microelectronics and commercial Hardened microelectronics and commercial componentscomponents’’..Various international seminars and workshops Various international seminars and workshops over past 5 years.over past 5 years.

Aims of COMRAD-UK Handbook

A brief (100 page) tutorial guide to the space A brief (100 page) tutorial guide to the space application of components.application of components.To assist in the assessment of components in the To assist in the assessment of components in the COMRAD database for any particular mission.COMRAD database for any particular mission.Provides guidance on Hardness Assurance Provides guidance on Hardness Assurance practices.practices.Discusses the application of commercial Discusses the application of commercial components.components.

Handbook Contents

The Space Radiation EnvironmentThe Space Radiation EnvironmentRadiation Effects Prediction TechniquesRadiation Effects Prediction TechniquesRadiation Effects in Electronic ComponentsRadiation Effects in Electronic ComponentsDesigning Tolerant SystemsDesigning Tolerant SystemsRadiation Effects DatabasesRadiation Effects DatabasesRadiation TestingRadiation TestingHardness Assurance ManagementHardness Assurance ManagementRecommended Procurement PracticesRecommended Procurement Practices

COMRAD-UKExperts Forum

The Experts Forum allows users to post The Experts Forum allows users to post queries on the Webqueries on the Web--site. site. These will, as far as possible, be answered These will, as far as possible, be answered by Spur Electron but it is also possible for by Spur Electron but it is also possible for other users to provide an input and start a other users to provide an input and start a discussion.discussion.

Summary

COMRADCOMRAD--UK is a Web based integrated source UK is a Web based integrated source of components radiation effects data.of components radiation effects data.COMRADCOMRAD--UK is coUK is co--sponsored by the British sponsored by the British National Space Centre and maintained on their National Space Centre and maintained on their behalf by SPURbehalf by SPUR--Electron.Electron.The site is under continuous development The site is under continuous development -- comments and suggestions are welcome.comments and suggestions are welcome.

–– comradcomrad--ukuk.net.net–– radinforadinfo@@spurelectronspurelectron.com.com

Hardness Assurance in the real world

WE HAVENWE HAVEN’’T GOT THE MONEYT GOT THE MONEYSO WESO WE’’VE GOT TO THINK.VE GOT TO THINK.(Lord Rutherford 1871(Lord Rutherford 1871--1937)1937)