www.fluxim.com

litos solar cell and (O/P)LED stability measurement platform

Specifications

• Up to 32 devices in 4 independent airtight chambers equipped with humidity sensors

• Maximum voltage: 10 V

• Maximum current: 20 mA / channel

• Full temperature control 0 - 150oC

• Sample size up to 2 inch

• Advanced lifetime analysis

• Parallel channels

• Flexible sample design

• Temperature control

• Fully automated

• Airtight weathering chambers

• OLED and PV versions available

• Full capabilities for ISOS protocols

• Professional, user-friendly software

Advantages

• Design customized to customer’s sample layout (multiple layouts possible)

• Modular: connect several systems together

• Compatible with atmosphere-controlling equipment

• Automatic parameter extraction and plotting over time

laoss

• All-in-one characterization platform to extract device and material parameters

• Combine with Setfos simulations to compare experiment to theory

• Easy-to-use large-area software Laoss simulates OLEDs and solar cells up to the module scale

• Optimize electrodes with coupled electro-thermal modelling

Other Fluxim products

• User-friendly thin film stack design software for OLEDs and solar cells

• Combined electronic, excitonic and optical simulation

phelos

• Angular spectrometer to analyse emitter distribution and orientation

•Measure EL, PL, Lm/W, Cd/A as a function of the emission angle and determine EQE

For solar cells

• Maximum power point tracking, constant voltage/current

• Two-colour LED illumination with UV (configurable)

• >10 sun equivalent illumination for accelerated testing

• In-situ UV-vis absorption possible for bleaching detection (extra spectrometer module)

• In-situ PL and EL measurements possible

For OLEDs

• Constant current, constant light, constant voltage

• Bottom and top emitter- compatible

• In-situ spectrometer available (extra module)

• Luminescence measurements

• Patented OLED accelerated ageing and lifetime estimation integrated

In combination with Paios, repeated full characterization of the devices can be automatically performed including:

• J-V curves

• Transient measurements (CELIV, DLTS, TPV, TPC, TEL …)

• Impedance spectroscopy / CV

• IMPS / IMVS (for solar cells)

• All measurements as function of temperature

www.fluxim.com

Degradation

Degradation

サイバネットシステム株式会社

【本 社】

〒101-0022 東京都千代田区神田練塀町３ 富士ソフトビル

Tel: (03)5297-3703 Fax: (03)5297-3646

e-mail : optsales@cybernet.co.jp

https://www.cybernet.co.jp/litos/