smartsensor hd nema environmental and surge · 2019. 2. 21. · as contracted by wavetronix,...

SmartSensor HD NEMA Environmental and Surge

Test Report

WX-501-0020

Wavetronix products mentioned:SmartSensor HD

As contracted by Wavetronix, Professional Testing Inc. performed NEMA environmental and surge testing between April 3–9, 2007. The following report documents the results of the test and is unedited by Wavetronix.

Professional Testing (EMI) Inc.1601 FM 1460, Suite BRound Rock, Texas 78664

1601 FM 1460, Suite B Round Rock, TX 78664 e-mail: [email protected] (512)244-3371 Fax: (512)244-1846

May 1, 2007 Wavetronix Ross Ericksen 380 S. Technology Court Lindon, UT 84604 Dear Ross: Thank you for the opportunity to perform Environmental and Surge testing on the SS125 SmartSensor™ for Wavetronix. Enclosed is a copy of the Environmental report with test details, charts and photographs. If you have any questions or comments about this report or the testing performed, feel free to contact me. Sincerely,

Jason Anderson Director of Testing Services Enclosure

Professional Testing (EMI), Inc. 1601 FM 1460, Suite B Round Rock, Texas 78664 (512) 244-3371 Fax (512) 244-1846 Project Number: 07337-10/30 Test Dates: 04/03/2007 to 04/09/2007 Report Date: 05/07/2007 This report has 33 total pages. Test Report reviewed by Test Report written by Test Performed by

John Crawford Reliability Technician

Steve Derrick Reliability Technician

Jason Anderson Director of Testing Services

Annette Rice Technical Writer

Eric Lifsey EMC Engineer

05/07/2007 05/07/2007 04/25/2007

ENVIRONMENTAL AND SURGE

TEST REPORT

WAVETRONIX

SS125 SMARTSENSOR™ Wavetronix 380 S. Technology Court Lindon, UT 84604

Wavetronix – SS125 SmartSensor™ Environmental & Surge Test Report

07337-10/30 May 1, 2007 Page i of 31

Contents Summary ......................................................................................................................................... 3 1.0 Introduction......................................................................................................................... 4

1.1 Scope............................................................................................................................... 4 1.2 EUT Description ............................................................................................................. 4 1.3 Description of Test Equipment ....................................................................................... 4 1.4 Applicable Documents.................................................................................................... 5 1.5 Test Requirements .......................................................................................................... 5

2.0 Test Results......................................................................................................................... 6 2.1 Storage Temperature Testing.......................................................................................... 6 2.1.1 Low Storage Temperature Test............................................................................... 6 2.1.2 High Storage Temperature Test .............................................................................. 6 2.2 Low Temperature, Low DC Supply Voltage Test C ...................................................... 6 2.3 Low Temperature, High DC Supply Voltage Test D ..................................................... 7 2.4 High Temperature, High DC Supply Voltage Test E ..................................................... 7 2.5 High Temperature, Low Voltage Supply Test F............................................................. 7 2.6 Test Termination Test G ................................................................................................. 8 2.7 Vibration Testing ............................................................................................................ 8 2.7.1 Resonant Search...................................................................................................... 8 2.7.2 Endurance Test........................................................................................................ 8 2.8 Shock (Impact) Test........................................................................................................ 9 2.9 Transient Test.................................................................................................................. 9 2.9.1 Transient Test Results........................................................................................... 10

Appendix A Data Sheets............................................................................................................ 12 Appendix B Photographs........................................................................................................... 21 End of Report................................................................................................................................ 31 Tables Table: Summary of Test Results..................................................................................................... 3 Table 1.3.1 PTI Test Equipment ................................................................................................ 4 Table 1.3.2 Vibration Data Channel Designation ...................................................................... 4 Table 1.4 Applicable Documents................................................................................................ 5 Table 1.5 Test Requirements Summary...................................................................................... 5 Table 2.1 Low Storage Temperature Test Results...................................................................... 6 Table 2.2 High Storage Temperature Test Results ..................................................................... 6 Table 2.2 Low Temperature, Low DC Supply Test Results....................................................... 7 Table 2.3 Low Temperature, High DC Supply Voltage Test Results......................................... 7 Table 2.4 High Temperature, High DC Supply Voltage Test Results........................................ 7 Table 2.5 High Temperature, Low Voltage Supply Test Results ............................................... 8 Table 2.6 Test Termination Results ............................................................................................ 8

Wavetronix – SS125 SmartSensor™ Environmental & Surge Test Report

07337-10/30 May 1, 2007 Page ii of 31

Table 2.7.1 Resonant Search Test Results ................................................................................. 8 Table 2.7.2 Endurance Test Results........................................................................................... 9 Table 2.8 Shock Test Results...................................................................................................... 9 Table 2.9 Transient Test Equipment ......................................................................................... 10 Data Sheets Figure 1: Transient Test Setup...................................................................................................... 11 Figure 2.1.1 Storage Temperature Chart ................................................................................... 13 Figure 2.2.1 Thermal Temperature Chart.................................................................................. 13 Figure 2.3.1 Run # 5 X Axis Resonant Search.......................................................................... 14 Figure 2.3.2 Run # 3 Y Axis Resonant Search.......................................................................... 14 Figure 2.3.3 Run # 1 Z Axis Resonant Search .......................................................................... 15 Figure 2.3.4 Run # 6 X Axis Dwell at 30 Hz ............................................................................ 15 Figure 2.3.4 Run # 4 Y Axis Dwell 30 Hz ................................................................................ 16 Figure 2.3.5 Run # 2 Z Axis Dwell at 30 Hz............................................................................. 16 Figure 2.4.1 - X Axis Shock Pulses........................................................................................... 17 Figure 2.4.2 + X Axis Shock Pulses.......................................................................................... 17 Figure 2.4.3 - Y Axis Shock Pulses........................................................................................... 18 Figure 2.4.4 + Y Axis Shock Pulses.......................................................................................... 18 Figure 2.4.5 - Z Axis Shock Pulse............................................................................................. 19 Figure 2.4.6 + Z Axis Shock Pulses .......................................................................................... 19 Photographs Photograph 2.1.1: Storage Temp Chamber Setup........................................................................ 22 Photograph 2.2.1: Humidity & Temperature Chart ..................................................................... 22 Photograph 2.2.2: NEMA Thermal Test Setup............................................................................ 23 Photograph 2.2.3: NEMA Thermal Test Setup - Outside Chamber ............................................ 23 Photograph 2.3.1: X Axis Test Setup for Vibration and Shock Tests ......................................... 24 Photograph 2.3.2: X Axis C1 Control for Vibration and Shock Tests ........................................ 24 Photograph 2.3.3: X Axis R1 Response for Vibration and Shock tests....................................... 25 Photograph 2.3.4: Y Axis setup for Vibration and Shock tests ................................................... 25 Photograph 2.3.5: Y Axis C1 Control on end of table for Vibration and Shock tests ................. 26 Photograph 2.3.6: Y Axis R1 Response for vibe and shock tests................................................ 26 Photograph 2.3.7: Z axis setup for vibe and shock ...................................................................... 27 Photograph 2.3.8: C1 Control on table for Z Axis Vibration and Shock..................................... 27 Photograph 2.3.9: Z Axis R1 Response on unit for Vibration and Shock ................................... 28 Photograph 2.4.1: NEMA Transients 001 Setup sans gen and scope.......................................... 28 Photograph 2.4.2: NEMA Transients 004 EUT closeup.............................................................. 29

Wavetronix – SS125 SmartSensor™ Environmental and Surge Test Report

07337-10/30 May 1, 2007 Page 3 of 31

Summary The SS125 SmartSensor™ unit was subjected to specific environmental and immunity testing in accordance to the Wavetronix SmartSensor™ HD NEMA Testing Procedures. The tests performed were to determine the reliability of the SS125 SmartSensor™ unit when exposed to the Storage Temperature (low and high), High Temperature DC Supply Voltage, Low Temperature DC Supply Voltage, Vibration, Shock and Surge Immunity tests. The table below outlines the tests performed and the specific standard. Table: Summary of Test Results

Test Procedure Test Description Results NEMA 2.1.5 Storage Temperature – Low PASS NEMA 2.1.5 Storage Temperature – High PASS NEMA 2.8.1.3 Transients, DC Powered Units PASS NEMA 2.2.7.3 Test C Low Temperature, Low DC Supply Voltage PASS NEMA 2.2.7.4 Test D Low Temperature, High DC Supply Voltage PASS NEMA 2.2.7.5 Test E High Temperature, High DC Supply Voltage PASS NEMA 2.2.7.6 Test F High Temperature, Low Voltage Supply PASS NEMA 2.2.7.7 Test G Test Termination PASS NEMA 2.2.8.3 Resonant Search (Vibration) PASS NEMA 2.2.8.4 Endurance Test (Vibration) PASS NEMA 2.2.9.3 Shock (Impact) Test PASS EN 61000-4-5 Surge Immunity PASS


07337-10/30 May 1, 2007 Page 4 of 31

1.0 Introduction 1.1 Scope This report describes the extent to which the Equipment Under Test (EUT) performed to the various conditions to which it was tested and the manner in which that testing was conducted. The Quotation # 17234 outlined the test procedure to be followed during actual testing. There were no deviations from the test procedures.

1.2 EUT Description The product tested was the Wavetronix SS125 SmartSensor™.

1.3 Description of Test Equipment The equipment used in the procedure is described by manufacturer, model, and serial number and, when applicable, calibration dates as shown in Table 1.3.1. Table 1.3.1 PTI Test Equipment

Asset # Equipment Manufacturer Model Serial Number

Calibration Due

1533 Shaker Controller Dactron V2.10 7221624 04/03/08 1070 PCI DSP Card Dactron V2.0 3410179 N/A 1534 Power Amp Ling DMA4016E 035 N/A 1535 Shaker Table Ling 335VH 154 N/A 1012 Accelerometer Dytran 3055B1G 1632 09/12/07 1016 Signal Conditioner Endevco 133 AY36 12/13/07 1520 Accelerometer Endevco 2220D EY84 08/23/07 0525 Thermal Chamber Tenney T40RS 12334 9/26/07 0881 Thermal Chamber Thermotron S-1.2C 27131 9/26/07 0867 Meter Mastech MAS-345 20011048192 10/11/07 0498 Data Logger Fluke 2625A 6843609 7/24/07

Table 1.3.2 defines the accelerometer direction and the channel input to the vibration control computer: Table 1.3.2 Vibration Data Channel Designation

Input Channel Description Color Input 1 (1632) C1 Control on Table White Input 2 (EY84) R1 Response Red


07337-10/30 May 1, 2007 Page 5 of 31

1.4 Applicable Documents The testing was conducted in accordance with the Documents listed in Table 1.4. Table 1.4 Applicable Documents

Document Section Wavetronix SmartSensor™ HD NEMA Testing Procedures 2.1, 2.2 and 2.8

1.5 Test Requirements Table 1.5 lists the testing requirements to which the EUT was subjected. Table 1.5 Test Requirements Summary NEMA 2.1.5 Storage Temperature – Low NEMA 2.1.5 Storage Temperature – High NEMA 2.2.7.3 Test C Low Temperature, Low DC Supply Voltage NEMA 2.2.7.4 Test D Low Temperature, High DC Supply Voltage NEMA 2.2.7.5 Test E High Temperature, High DC Supply Voltage NEMA 2.2.7.6 Test F High Temperature, Low Voltage Supply NEMA 2.2.7.7 Test G Test Termination NEMA 2.2.8.3 Resonant Search (Vibration) NEMA 2.2.8.4 Endurance Test (Vibration) NEMA 2.2.9.3 Shock (Impact) Test NEMA 2.8.1.3 Transients, DC Powered Units


07337-10/30 May 1, 2007 Page 6 of 31

2.0 Test Results 2.1 Storage Temperature Testing The EUT was subjected to tests derived from the 2003 NEMA TS2 test standards. The EUT was subjected to storage temperature range of -45°C (-50°F) to +85°C (+185°F). 2.1.1 Low Storage Temperature Test The EUT was subjected to storage (low) temperature testing as outlined in Section 2.1.5.1 of the Wavetronix SmartSensor™ HD NEMA Testing Procedures. The EUT was non-operational throughout the 24 hour Low Storage Temperature Test. Functional tests were performed before and after testing. The detailed test data can be located in Appendix A and photographs are shown in Appendix B. Table 2.1 Low Storage Temperature Test Results

EUT Test Results S/N U100000120 PASS

2.1.2 High Storage Temperature Test The tested equipment was subjected to storage (high) temperature testing as outlined in Section 2.1.5.1 of the Wavetronix SmartSensor™ HD NEMA Testing Procedures. The EUT was non-operational throughout the 24 hour High Storage Temperature Test. Functional tests were performed before and after testing. The detailed test data can be located in Appendix A and photographs are shown in Appendix B. Table 2.2 High Storage Temperature Test Results


2.2 Low Temperature, Low DC Supply Voltage Test C The tested equipment was subjected to tests derived from the 2003 NEMA TS2 test standards. The test procedures were outlined in Section 2.2.7.3 Test C of the Wavetronix SmartSensor™ HD NEMA Testing Procedures. The EUT was subjected to the following test conditions; -34ºC (-30ºF) and a Low DC voltage of 10.8 VDC. The EUT was operational for a minimum of 5 hours. The DC voltage was then removed for a minimum of 5 hours. Power was restored and the EUT function was verified. A functional test was performed before and after the voltage test. The detailed test data can be located in Appendix A and photographs are shown in Appendix B.


07337-10/30 May 1, 2007 Page 7 of 31

Table 2.2 Low Temperature, Low DC Supply Test Results EUT Test Results

S/N U100000120 PASS

2.3 Low Temperature, High DC Supply Voltage Test D The tested equipment was subjected to tests derived from the 2003 NEMA TS2 test standards. The test procedures were outlined in Section 2.2.7.4 Test D of the Wavetronix SmartSensor™ HD NEMA Testing Procedures. The EUT was subjected to the following test conditions; -34ºC (-30ºF) and a High DC voltage of 26.5 VDC. A 1 hour operational temperature soak was performed. With the test software running, the voltage was removed for 30 seconds and then restored. The SmartSensor™ operation was verified. The off/on power sequence was repeated 3 times. A functional test was performed before and after the voltage test. The detailed test data can be located in Appendix A and photographs are shown in Appendix B. Table 2.3 Low Temperature, High DC Supply Voltage Test Results


2.4 High Temperature, High DC Supply Voltage Test E The tested equipment was subjected to tests derived from the 2003 NEMA TS2 test standards. The test procedures were outlined in Section 2.2.7.5 Test E of the Wavetronix SmartSensor™ HD NEMA Testing Procedures. The EUT was subjected to the following test conditions; 74ºC (+165ºF) and a High DC supply voltage of 26.5 VDC. The EUT was operational throughout the 15 hours of testing. A functional test was performed before and after the voltage test. The detailed test data can be located in Appendix A and photographs are shown in Appendix B. Table 2.4 High Temperature, High DC Supply Voltage Test Results


2.5 High Temperature, Low Voltage Supply Test F The tested equipment was subjected to tests derived from the 2003 NEMA TS2 test standards. The test procedures were outlined in Section 2.2.7.6 Test E of the Wavetronix SmartSensor™ HD NEMA Testing Procedures. The EUT was subjected to the following test conditions; 74ºC (+165ºF) and a Low DC voltage of 10.8 VDC with an 18% relative humidity and 46ºC (109ºF) wet bulb. The EUT was operational throughout testing. A functional test was performed before and after the voltage test. The detailed test data can be located in Appendix A and photographs are shown in Appendix B.


07337-10/30 May 1, 2007 Page 8 of 31

Table 2.5 High Temperature, Low Voltage Supply Test Results EUT Test Results

S/N U100000120 PASS

2.6 Test Termination Test G The tested equipment was subjected to tests derived from the 2003 NEMA TS2 test standards. The test procedures were outlined in Section 2.2.7.7 Test G of the Wavetronix SmartSensor™ HD NEMA Testing Procedures. The EUT was subjected to the following test conditions; 15 ºC (60ºF) to 27 ºC (80ºF) and a DC voltage of 12.0 VDC. A 1 hour temperature soak was performed. The detailed test data can be located in Appendix A and photographs are shown in Appendix B Table 2.6 Test Termination Results


2.7 Vibration Testing 2.7.1 Resonant Search The tested equipment was subjected to tests derived from the 2003 NEMA TS2 test standards. The test procedures were outlined in Section 2.2.8.3 of the Wavetronix SmartSensor™ HD NEMA Testing Procedures. The EUT was subjected to the following test conditions; double amplitude displacement of 0.015 inches from 5 to 30 Hz for 12-1/2 minutes (sweep up & down) in each axis. The detailed test data can be located in Appendix A and photographs are shown in Appendix B Table 2.7.1 Resonant Search Test Results

EUT Axis Test Results X Run #5 Pass Y Run #3 Pass S/N U100000119 Z Run #1 Pass

2.7.2 Endurance Test The tested equipment was subjected to tests derived from the 2003 NEMA TS2 test standards. The test procedures were outlined in Section 2.2.8.4 of the Wavetronix SmartSensor™ HD NEMA Testing Procedures. The EUT was subjected to the following test conditions; resonant frequency for a period of 1 hour at amplitude resulting in 0.5g acceleration. If no resonant frequency is found, dwell at 30 Hz for 1 hour. The detailed test data can be located in Appendix A and photographs are shown in Appendix B.


07337-10/30 May 1, 2007 Page 9 of 31

Table 2.7.2 Endurance Test Results

EUT Axis Test Results Notes

X Run #6 Pass Dwell 30 Hz Y Run #3 Pass Dwell 30 Hz S/N U100000119 Z Run #1 Pass Dwell 30 Hz

2.8 Shock (Impact) Test The tested equipment was subjected to tests derived from the 2003 NEMA TS2 test standards. The test procedures were outlined in Section 2.2.9.2 of the Wavetronix SmartSensor™ HD NEMA Testing Procedures. The EUT was subjected to the following test conditions; using electrodynamic shaker for 10g 11ms half-sine shock pulses in each axis (3 plus pulses and 3 minus pulses applied). The detailed test data can be located in Appendix A and photographs are shown in Appendix B. Table 2.8 Shock Test Results

EUT Axis Test Results - X Pass + X Pass - Y Pass + Y Pass - Z Pass

S/N U100000119

+ Z Pass

2.9 Transient Test Transient testing was performed on the EUT using the procedures of NEMA. The EUT was placed in the approximate center of the RGP and was powered and operated in a normal configuration. EUT operation was observed for any indications of erratic operation. Terminal #5 is reference ground for transients. Required source impedance is 1000 Ohms. A 999 Ohm resistor constructed accordingly. Disconnect DB connectors while applying transients. Connect to verify EUT operating after each pulse session is completed. Apply 10 us impulses at 300 V, 1 ms rise, 5 pulses per second per terminal per polarity. Humidity must be no greater than 86%. Measured the DC voltage at terminal block locations #1 & #4. Test software set to run over lunch break prior to test: 403 passes, no errors. A drawing showing the test setup is given as Figure 1.


07337-10/30 May 1, 2007 Page 10 of 31

2.9.1 Transient Test Results The EUT was subjected to transient testing on April 10, 2007. No adverse indications were noted during the performance of the test. Therefore, the EUT met the NEMA criteria. The EUT passed the required NEMA performance criteria. Table 2.9 Transient Test Equipment

Asset # Manufacturer Model # Description Calibration Due 0265 PTI None 5uH LISNs 2007-09-27 None Mastech MAS-345 DMM 2007-10-09 1117 hp 6296A DC Power Supply CIU 0384 Solar 8282 Surge Generator CIU None PTI Copper test bench N/A None PTI n/a 999 Ohm resistor, built for test CIU None 12000 µF 35 WVDC capacitor n/a


07337-10/30 May 1, 2007 Page 11 of 31

Figure 1: Transient Test Setup


07337-10/30 May 1, 2007 Page 12 of 31

Appendix A Data Sheets


07337-10/30 May 1, 2007 Page 13 of 31

Wavetronix Cold and Hot Storage M/N SS125 S/N U100000120

-60

-40

-20

0

20

40

60

80

1004/

5/20

07 1

5:00

4/5/

2007

17:

01

4/5/

2007

19:

02

4/5/

2007

21:

03

4/6/

2007

23:

04

4/6/

2007

1:0

5

4/6/

2007

3:0

6

4/6/

2007

5:0

7

4/6/

2007

7:0

8

4/6/

2007

9:0

9

4/6/

2007

11:

10

4/6/

2007

13:

11

4/6/

2007

15:

12

4/6/

2007

17:

13

4/6/

2007

19:

14

4/6/

2007

21:

15

4/7/

2007

23:

16

4/7/

2007

1:1

7

4/7/

2007

3:1

8

4/7/

2007

5:1

9

4/7/

2007

7:2

0

4/7/

2007

9:2

1

4/7/

2007

11:

22

4/7/

2007

13:

23

4/7/

2007

15:

24

4/7/

2007

17:

25

4/7/

2007

19:

26

4/7/

2007

21:

27

4/8/

2007

23:

28

4/8/

2007

1:2

9

4/8/

2007

3:3

0

4/8/

2007

5:3

1

4/8/

2007

7:3

2

4/8/

2007

9:3

3

4/8/

2007

11:

34

4/8/

2007

13:

35

4/8/

2007

15:

36

Date/Time

Cha

mbe

r Tem

pera

ture

Chamber Temperature

Figure 2.1.1 Storage Temperature Chart

Wavetronix NEMA Thermal

-40

-20

0

20

40

60

80

4/3/

2007

7:4

0

4/3/

2007

9:0

8

4/3/

2007

10:

36

4/3/

2007

12:

00

4/3/

2007

13:

28

4/3/

2007

14:

55

4/3/

2007

16:

23

4/3/

2007

17:

50

4/3/

2007

19:

18

4/3/

2007

20:

46

4/4/

2007

22:

14

4/4/

2007

23:

42

4/4/

2007

1:1

0

4/4/

2007

2:3

8

4/4/

2007

4:0

6

4/4/

2007

5:3

4

4/4/

2007

7:0

2

4/4/

2007

8:3

0

4/4/

2007

9:5

7

4/4/

2007

11:

23

4/4/

2007

12:

51

4/4/

2007

14:

18

4/4/

2007

15:

46

4/4/

2007

17:

14

4/4/

2007

18:

42

4/4/

2007

20:

10

4/4/

2007

21:

38

4/5/

2007

23:

06

4/5/

2007

0:3

4

4/5/

2007

2:0

2

4/5/

2007

3:3

0

4/5/

2007

4:5

8

4/5/

2007

6:2

6

4/5/

2007

7:5

3

4/5/

2007

9:2

0

4/5/

2007

10:

48

4/5/

2007

12:

15

4/5/

2007

13:

43

Date/Time

Tem

pera

ture

Deg

rees

C

Chamber Temperature

Figure 2.2.1 Thermal Temperature Chart


07337-10/30 May 1, 2007 Page 14 of 31

Run # 5 X axis Sine Resonant Search Model # SS125 SN S125U100000119 Project File Name: NEMA 2.2.8.3 Resonant Search 5-30 Hz.prj Profile Name: NEMA 2.2.8.3 Resonant Search 5-30 Hz 0.015 DA Test Type: Swept Sine Run Folder: \Run Default Apr 09, 2007 13-14-01

profile(f)

high-alarm(f)

low-alarm(f)

C1 Control: Peak = 0.019 gn

R1 Response: Peak = 0.018 gn

35.005.00 10.00

5.0000

0.0010

0.0100

0.1000

1.0000

Frequency (Hz)

gn

Level: 100 % Control Peak: 0.018630 gn Full Level Time: 00:12:30 Sweep Type: Logarithmic Frequency: 5.001230 Hz Demand Peak: 0.019172 gn Time Remaining: 00:00:00 Sweep Rate: 0.414 Oct/Min Data saved at 01:27:39 PM, Monday, April 09, 2007

Figure 2.3.1 Run # 5 X Axis Resonant Search Run # 3 Y axis Sine Resonant Search Model # SS125 SN S125U100000119 Project File Name: NEMA 2.2.8.3 Resonant Search 5-30 Hz.prj Profile Name: NEMA 2.2.8.3 Resonant Search 5-30 Hz 0.015 DA Test Type: Swept Sine Run Folder: \Run Default Apr 09, 2007 11-49-23

profile(f)

high-alarm(f)

low-alarm(f)



35.005.00 10.00

5.0000

0.0010

0.0100

0.1000

1.0000

Frequency (Hz)

gn

Level: 100 % Control Peak: 0.018798 gn Full Level Time: 00:12:30 Sweep Type: Logarithmic Frequency: 5.000719 Hz Demand Peak: 0.019172 gn Time Remaining: 00:00:00 Sweep Rate: 0.414 Oct/Min Data saved at 12:02:10 PM, Monday, April 09, 2007

Figure 2.3.2 Run # 3 Y Axis Resonant Search


07337-10/30 May 1, 2007 Page 15 of 31

Run # 1 Z axis Sine Resonant Search Model # SS125 SN S125U100000119 Project File Name: NEMA 2.2.8.3 Resonant Search 5-30 Hz.prj Profile Name: NEMA 2.2.8.3 Resonant Search 5-30 Hz 0.015 DA Test Type: Swept Sine Run Folder: \Run Default Apr 09, 2007 09-39-15

profile(f)

high-alarm(f)

low-alarm(f)



35.005.00 10.00

5.0000

0.0010

0.0100

0.1000

1.0000

Frequency (Hz)

gn

Level: 100 % Control Peak: 0.018929 gn Full Level Time: 00:12:30 Sweep Type: Logarithmic Frequency: 5.001230 Hz Demand Peak: 0.019172 gn Time Remaining: 00:00:00 Sweep Rate: 0.414 Oct/Min Data saved at 09:51:59 AM, Monday, April 09, 2007

Figure 2.3.3 Run # 1 Z Axis Resonant Search Run # 6 X Axis Dwell 30 Hz 1 Hr Model # SS125 SN SS125U100000119 Project File Name: NEMA 2.2.8.4 Resonant Dwell 30 Hz 0.5g 1 hr.prj Profile Name: 30 Hz Dwell 0.5g Test Type: Swept Sine Run Folder: \Run Default Apr 09, 2007 13-30-00

profile(f)


control(f)

35.005.00 10.00

10.0000

0.0010

0.0100

0.1000

1.0000

Frequency (Hz)

gn

12

Signal X Y1 control(f) 30.0649 0.4998122 R1 Response 30.0649 0.415908

R1 Response: 30.0649, 0.4159

Level: 100 % Control Peak: 0.499812 gn Full Level Time: 01:00:00 Sweep Type: Logarithmic Frequency: 30.000000 Hz Demand Peak: 0.500000 gn Time Remaining: 00:00:00 Sweep Rate: 1 Oct/Min Data saved at 02:30:27 PM, Monday, April 09, 2007

Figure 2.3.4 Run # 6 X Axis Dwell at 30 Hz


07337-10/30 May 1, 2007 Page 16 of 31

Run # 4 Y Axis Dwell 30 Hz 1 Hr Model # SS125 SN SS125U100000119 Project File Name: NEMA 2.2.8.4 Resonant Dwell 30 Hz 0.5g 1 hr.prj Profile Name: 30 Hz Dwell 0.5g Test Type: Swept Sine Run Folder: \Run Default Apr 09, 2007 12-03-33

profile(f)


control(f)

35.005.00 10.00

10.0000

0.0010

0.0100

0.1000

1.0000

Frequency (Hz)

gn

12


R1 Response: 30.0649, 0.4734

Level: 100 % Control Peak: 0.500045 gn Full Level Time: 01:00:00 Sweep Type: Logarithmic Frequency: 30.000000 Hz Demand Peak: 0.500000 gn Time Remaining: 00:00:00 Sweep Rate: 1 Oct/Min Data saved at 01:03:49 PM, Monday, April 09, 2007

Figure 2.3.4 Run # 4 Y Axis Dwell 30 Hz Run # 2 Z Axis Dwell 30 Hz 1 Hr Model # SS125 SN SS125U100000119 Project File Name: Sine Dwell 30 Hz 0.5g control.prj Profile Name: 10 Test Type: Swept Sine Run Folder: \Run Default Apr 09, 2007 10-02-07

profile(f)


control(f)

35.005.00 10.00

10.0000

0.0010

0.0100

0.1000

1.0000

Frequency (Hz)

gn

12


R1 Response: 30.0649, 0.4599

Level: 100 % Control Peak: 0.499920 gn Full Level Time: 01:00:00 Sweep Type: Logarithmic Frequency: 30.000000 Hz Demand Peak: 0.500000 gn Time Remaining: 00:00:00 Sweep Rate: 1 Oct/Min Data saved at 11:03:33 AM, Monday, April 09, 2007

Figure 2.3.5 Run # 2 Z Axis Dwell at 30 Hz


07337-10/30 May 1, 2007 Page 17 of 31

- X Axis Shock pulses PN SS125 SN SS125U100000119 Project File Name: Classical Shock 10 g 11ms Half Sine (SHOCK).prj Profile Name: 10gn 11mSec Test Type: Classical Shock Run Folder: \Run Default Apr 09, 2007 14-33-47

profile(t)

high-abort(t)

low-abort(t)

R1 response: Peak = 9.208 gn


22-11 -9 -6 -3 0 3 6 9 12 15 18 21

40.0000

-40.0000

-35.0000

-30.0000

-25.0000

-20.0000

-15.0000

-10.0000

-5.0000

0

5.0000

10.0000

15.0000

20.0000

25.0000

30.0000

35.0000

Time (Milliseconds)

gn

Level: 100 % Block Size: 4096 Elapsed Pulses: 7 Frame Time: 0.682667 Seconds Control Peak: 10.087080 gn Control RMS: 1.002049 gn Full Level Elapsed Pulses: 3 dT: 0.000167 Seconds Demand Peak: 10.000000 gn Demand RMS: 0.997329 gn Remaining Pulses: 0 Pulse Type: Half Sine Amplitude: 10.000000 gn Data saved at 02:34:14 PM, Monday, April 09, 2007

Figure 2.4.1 - X Axis Shock Pulses + X Axis Shock pulses PN SS125 SN SS125U100000119 Project File Name: Classical Shock 10 g 11ms Half Sine (SHOCK).prj Profile Name: 10gn 11mSec Test Type: Classical Shock Run Folder: \Run Default Apr 09, 2007 14-32-14

profile(t)

high-abort(t)

low-abort(t)



22-11 -9 -6 -3 0 3 6 9 12 15 18 21

40.0000

-40.0000

-35.0000

-30.0000

-25.0000

-20.0000

-15.0000

-10.0000

-5.0000

0

5.0000

10.0000

15.0000

20.0000

25.0000

30.0000

35.0000

Time (Milliseconds)

gn


Figure 2.4.2 + X Axis Shock Pulses


07337-10/30 May 1, 2007 Page 18 of 31

- Y Axis Shock pulses PN SS125 SN SS125U100000119 Project File Name: Classical Shock 10 g 11ms Half Sine (SHOCK).prj Profile Name: 10gn 11mSec Test Type: Classical Shock Run Folder: \Run Default Apr 09, 2007 13-07-16

profile(t)

high-abort(t)

low-abort(t)



22-11 -9 -6 -3 0 3 6 9 12 15 18 21

40.0000

-40.0000

-35.0000

-30.0000

-25.0000

-20.0000

-15.0000

-10.0000

-5.0000

0

5.0000

10.0000

15.0000

20.0000

25.0000

30.0000

35.0000

Time (Milliseconds)

gn


Figure 2.4.3 - Y Axis Shock Pulses + Y Axis Shock pulses PN SS125 SN SS125U100000119 Project File Name: Classical Shock 10 g 11ms Half Sine (SHOCK).prj Profile Name: 10gn 11mSec Test Type: Classical Shock Run Folder: \Run Default Apr 09, 2007 13-05-43

profile(t)

high-abort(t)

low-abort(t)



22-11 -9 -6 -3 0 3 6 9 12 15 18 21

40.0000

-40.0000

-35.0000

-30.0000

-25.0000

-20.0000

-15.0000

-10.0000

-5.0000

0

5.0000

10.0000

15.0000

20.0000

25.0000

30.0000

35.0000

Time (Milliseconds)

gn


Figure 2.4.4 + Y Axis Shock Pulses


07337-10/30 May 1, 2007 Page 19 of 31

- Z Axis Shock pulses PN SS125 SN SS125U100000119 Project File Name: Classical Shock 10 g 11ms Half Sine (SHOCK).prj Profile Name: 10gn 11mSec Test Type: Classical Shock Run Folder: \Run Default Apr 09, 2007 11-13-41

profile(t)

high-abort(t)

low-abort(t)



22-11 -9 -6 -3 0 3 6 9 12 15 18 21

40.0000

-20.0000

-16.0000

-12.0000

-8.0000

-4.0000

0

4.0000

8.0000

12.0000

16.0000

20.0000

24.0000

28.0000

32.0000

36.0000

Time (Milliseconds)

gn

Level: 100 % Block Size: 4096 Elapsed Pulses: 7 Frame Time: 0.682667 Seconds Control Peak: 10.016088 gn Control RMS: 1.001313 gn Full Level Elapsed Pulses: 3 dT: 0.000167 Seconds Demand Peak: 10.000000 gn Demand RMS: 0.997329 gn Remaining Pulses: 0 Pulse Type: Half Sine Amplitude: 10.000000 gn Data saved at 11:15:15 AM, Monday, April 09, 2007

Figure 2.4.5 - Z Axis Shock Pulse + Z-Axis Shock pulses PN SS125 SN SS125U100000119 Project File Name: Classical Shock 10 g 11ms Half Sine (SHOCK).prj Profile Name: 10gn 11mSec Test Type: Classical Shock Run Folder: \Run Default Apr 09, 2007 11-10-02

profile(t)

high-abort(t)

low-abort(t)



22-11 -9 -6 -3 0 3 6 9 12 15 18 21

20.0000

-20.0000

-17.5000

-15.0000

-12.5000

-10.0000

-7.5000

-5.0000

-2.5000

0

2.5000

5.0000

7.5000

10.0000

12.5000

15.0000

17.5000

Time (Milliseconds)

gn

Level: 100 % Block Size: 4096 Elapsed Pulses: 7 Frame Time: 0.682667 Seconds Control Peak: 10.032835 gn Control RMS: 1.001092 gn Full Level Elapsed Pulses: 3 dT: 0.000167 Seconds Demand Peak: 10.000000 gn Demand RMS: 0.997329 gn Remaining Pulses: 0 Pulse Type: Half Sine Amplitude: 10.000000 gn Data saved at 11:11:47 AM, Monday, April 09, 2007

Figure 2.4.6 + Z Axis Shock Pulses


07337-10/30 May 1, 2007 Page 20 of 31

Professional Testing (EMI), Inc. NEMA

Transient Immunity Testing Technical Data Sheet

Test Date: 2007-04-10 Client: Wavetronix Project #: 07337-10 Supervisor: Jason Anderson EUT: SS-125 S/N U100000119 Operator: Eric Lifsey Ambient Temperature: 21.8º C Barometric Pressure: 29.65 inches Relative Humidity: 49% Terminal # Name Positive Transient

3 +DC X 7 +485 X 8 -485 X

11 232 RX X 12 232 RX X 13 232 CTS X 14 232 RTS X

Operating Voltage: 10.8 VDC Verify green/red wire to diode/inductor per client instructions. Test software results: 7 passes, no errors.

Terminal # Name Positive Transient

3 +DC X 7 +485 X 8 -485 X

11 232 RX X 12 232 RX X 13 232 CTS X 14 232 RTS X

Operating Voltage: 26.5 VDC Test software: 7 passes, no errors.

Terminal # Name Negative Transient

3 +DC X 7 +485 X 8 -485 X

11 232 RX X 12 232 RX X 13 232 CTS X 14 232 RTS X

Operating Voltage: 10.8 VDC Wired green/red wire to diode/inductor per client instructions. Test software: 7 passes, no errors.

Terminal # Name Negative Transient

3 +DC X 7 +485 X 8 -485 X

11 232 RX X 12 232 RX X 13 232 CTS X 14 232 RTS X

Operating Voltage: 26.5 VDC Test software: 12 passes, no errors. After test completed the diode/inductor wiring returned to condition as received.


07337-10/30 May 1, 2007 Page 21 of 31

Appendix B Photographs


07337-10/30 May 1, 2007 Page 22 of 31

Photograph 2.1.1: Storage Temp Chamber Setup

Photograph 2.2.1: Humidity & Temperature Chart


07337-10/30 May 1, 2007 Page 23 of 31

Photograph 2.2.2: NEMA Thermal Test Setup

Photograph 2.2.3: NEMA Thermal Test Setup - Outside Chamber


07337-10/30 May 1, 2007 Page 24 of 31

Photograph 2.3.1: X Axis Test Setup for Vibration and Shock Tests

Photograph 2.3.2: X Axis C1 Control for Vibration and Shock Tests


07337-10/30 May 1, 2007 Page 25 of 31

Photograph 2.3.3: X Axis R1 Response for Vibration and Shock tests

Photograph 2.3.4: Y Axis setup for Vibration and Shock tests


07337-10/30 May 1, 2007 Page 26 of 31

Photograph 2.3.5: Y Axis C1 Control on end of table for Vibration and Shock tests

Photograph 2.3.6: Y Axis R1 Response for vibe and shock tests


07337-10/30 May 1, 2007 Page 27 of 31

Photograph 2.3.7: Z axis setup for vibe and shock

Photograph 2.3.8: C1 Control on table for Z Axis Vibration and Shock


07337-10/30 May 1, 2007 Page 28 of 31

Photograph 2.3.9: Z Axis R1 Response on unit for Vibration and Shock

Photograph 2.4.1: NEMA Transients 001 Setup sans gen and scope


07337-10/30 May 1, 2007 Page 29 of 31

Photograph 2.4.2: NEMA Transients 004 EUT closeup


07337-10/30 May 1, 2007 Page 30 of 31


07337-10/30 May 1, 2007 Page 31 of 31

End of Report

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