shelley begley application development engineer agilent technologies electromagnetic properties of...
TRANSCRIPT
![Page 1: Shelley Begley Application Development Engineer Agilent Technologies Electromagnetic Properties of Materials: Characterization at Microwave Frequencies](https://reader031.vdocuments.mx/reader031/viewer/2022032723/56649cfa5503460f949cc779/html5/thumbnails/1.jpg)
Shelley BegleyApplication Development EngineerAgilent Technologies
Electromagnetic Properties of Materials: Characterization at Microwave Frequencies and Beyond
![Page 2: Shelley Begley Application Development Engineer Agilent Technologies Electromagnetic Properties of Materials: Characterization at Microwave Frequencies](https://reader031.vdocuments.mx/reader031/viewer/2022032723/56649cfa5503460f949cc779/html5/thumbnails/2.jpg)
Definitions
Measurement TechniquesParallel Plate Coaxial Probe
Transmission Line and Free-Space Resonant Cavity
Summary
Agenda
![Page 3: Shelley Begley Application Development Engineer Agilent Technologies Electromagnetic Properties of Materials: Characterization at Microwave Frequencies](https://reader031.vdocuments.mx/reader031/viewer/2022032723/56649cfa5503460f949cc779/html5/thumbnails/3.jpg)
DefinitionsPermittivity is a physical quantity that describes how an electric field affects and is affected by a dielectric medium and is determined by the ability of a material to polarize in response to an applied electric field, and thereby to cancel, partially, the field inside the material. Permittivity relates therefore to a material's ability to transmit (or "permit") an electric field…The permittivity of a material is usually given relative to that of vacuum, as a relative permittivity, (also called dielectric constant in some cases)….- Wikipedia
DkDkDfDf
'r 'r "
r"r
![Page 4: Shelley Begley Application Development Engineer Agilent Technologies Electromagnetic Properties of Materials: Characterization at Microwave Frequencies](https://reader031.vdocuments.mx/reader031/viewer/2022032723/56649cfa5503460f949cc779/html5/thumbnails/4.jpg)
Permittivity and Permeability Definitions
interaction of a material in the presence of an external electric field.
"'
0
rrrj
Permittivity (Dielectric Constant)
![Page 5: Shelley Begley Application Development Engineer Agilent Technologies Electromagnetic Properties of Materials: Characterization at Microwave Frequencies](https://reader031.vdocuments.mx/reader031/viewer/2022032723/56649cfa5503460f949cc779/html5/thumbnails/5.jpg)
Permittivity and Permeability Definitions
interaction of a material in the presence of an external electric field.
"'
0
rrrj
Permittivity (Dielectric Constant)
DkDk
![Page 6: Shelley Begley Application Development Engineer Agilent Technologies Electromagnetic Properties of Materials: Characterization at Microwave Frequencies](https://reader031.vdocuments.mx/reader031/viewer/2022032723/56649cfa5503460f949cc779/html5/thumbnails/6.jpg)
Permittivity and Permeability Definitions
interaction of a material in the presence of an external electric field.
"'
0
rrrj
"'
0rr j
interaction of a material in the presence of an external magnetic field.
Permittivity (Dielectric Constant)
Permeability
DkDk
![Page 7: Shelley Begley Application Development Engineer Agilent Technologies Electromagnetic Properties of Materials: Characterization at Microwave Frequencies](https://reader031.vdocuments.mx/reader031/viewer/2022032723/56649cfa5503460f949cc779/html5/thumbnails/7.jpg)
Permittivity and Permeability Definitions
interaction of a material in the presence of an external electric field.
"'
0
rrrj
"'
0rr j
interaction of a material in the presence of an external magnetic field.
Permittivity (Dielectric Constant)
Permeability
DkDk
![Page 8: Shelley Begley Application Development Engineer Agilent Technologies Electromagnetic Properties of Materials: Characterization at Microwave Frequencies](https://reader031.vdocuments.mx/reader031/viewer/2022032723/56649cfa5503460f949cc779/html5/thumbnails/8.jpg)
"'rrr j "'
rrr j
Electromagnetic Field Interaction
Electric Magnetic
Permittivity Permeability
FieldsFields
STORAGE
MUT
STORAGE
![Page 9: Shelley Begley Application Development Engineer Agilent Technologies Electromagnetic Properties of Materials: Characterization at Microwave Frequencies](https://reader031.vdocuments.mx/reader031/viewer/2022032723/56649cfa5503460f949cc779/html5/thumbnails/9.jpg)
"'rrr j "'
rrr j
Electromagnetic Field Interaction
Electric Magnetic
Permittivity Permeability
FieldsFields
STORAGE
LOSS
MUT
STORAGE
LOSS
![Page 10: Shelley Begley Application Development Engineer Agilent Technologies Electromagnetic Properties of Materials: Characterization at Microwave Frequencies](https://reader031.vdocuments.mx/reader031/viewer/2022032723/56649cfa5503460f949cc779/html5/thumbnails/10.jpg)
Loss Tangent
'
"
tanr
r
'
"
tanr
r
CycleperStoredEnergy
CycleperLostEnergy
QD
1tan
CycleperStoredEnergy
CycleperLostEnergy
QD
1tan
Dissipation FactorDD
Quality FactorQQ
r
'r
''r
DfDf
![Page 11: Shelley Begley Application Development Engineer Agilent Technologies Electromagnetic Properties of Materials: Characterization at Microwave Frequencies](https://reader031.vdocuments.mx/reader031/viewer/2022032723/56649cfa5503460f949cc779/html5/thumbnails/11.jpg)
Relaxation Constant
= Time required for 1/e of an aligned system to return to equilibrium or random state, in seconds.
cc f
2
11
cc f
2
11
11
10
100
10 100
Water at 20o C
f, GHz
most energy is lost at 1/
'r'r
"r"r
js
1
)( :equation Debye
js
1
)( :equation Debye
![Page 12: Shelley Begley Application Development Engineer Agilent Technologies Electromagnetic Properties of Materials: Characterization at Microwave Frequencies](https://reader031.vdocuments.mx/reader031/viewer/2022032723/56649cfa5503460f949cc779/html5/thumbnails/12.jpg)
Measurement Techniques
Parallel Plate
ResonantCavity
TransmissionLine including
Free Space
CoaxialProbe
![Page 13: Shelley Begley Application Development Engineer Agilent Technologies Electromagnetic Properties of Materials: Characterization at Microwave Frequencies](https://reader031.vdocuments.mx/reader031/viewer/2022032723/56649cfa5503460f949cc779/html5/thumbnails/13.jpg)
Which Technique is Best?
It Depends…
![Page 14: Shelley Begley Application Development Engineer Agilent Technologies Electromagnetic Properties of Materials: Characterization at Microwave Frequencies](https://reader031.vdocuments.mx/reader031/viewer/2022032723/56649cfa5503460f949cc779/html5/thumbnails/14.jpg)
Frequency of interest
Expected value of er
Required measurement accuracy
Which Technique is Best?
It Depends… on
![Page 15: Shelley Begley Application Development Engineer Agilent Technologies Electromagnetic Properties of Materials: Characterization at Microwave Frequencies](https://reader031.vdocuments.mx/reader031/viewer/2022032723/56649cfa5503460f949cc779/html5/thumbnails/15.jpg)
Frequency of interest
Expected value of er
Required measurement accuracy
Material properties (i.e., homogeneous, isotropic)
Form of material (i.e., liquid, powder, solid, sheet)
Sample size restrictions
Which Technique is Best?
It Depends… on
![Page 16: Shelley Begley Application Development Engineer Agilent Technologies Electromagnetic Properties of Materials: Characterization at Microwave Frequencies](https://reader031.vdocuments.mx/reader031/viewer/2022032723/56649cfa5503460f949cc779/html5/thumbnails/16.jpg)
Frequency of interest
Expected value of er
Required measurement accuracy
Material properties (i.e., homogeneous, isotropic)
Form of material (i.e., liquid, powder, solid, sheet)
Sample size restrictions
Destructive or non-destructive
Contacting or non-contacting
Temperature
Which Technique is Best?
It Depends… on
![Page 17: Shelley Begley Application Development Engineer Agilent Technologies Electromagnetic Properties of Materials: Characterization at Microwave Frequencies](https://reader031.vdocuments.mx/reader031/viewer/2022032723/56649cfa5503460f949cc779/html5/thumbnails/17.jpg)
Measurement Techniques vs. Frequency and Material Loss
Parallel Plate
Frequency
Loss
Transmission line
Resonant Cavity
Coaxial Probe
MicrowaveRF Millimeter-waveLow frequency
High
Medium
Low
Free Space
50 MHz 20 GHz 40 GHz 60 GHz5 GHz 500+ GHz
![Page 18: Shelley Begley Application Development Engineer Agilent Technologies Electromagnetic Properties of Materials: Characterization at Microwave Frequencies](https://reader031.vdocuments.mx/reader031/viewer/2022032723/56649cfa5503460f949cc779/html5/thumbnails/18.jpg)
Measurement Techniques vs. Frequency and Material Loss
Frequency
Loss
Coaxial Probe
MicrowaveRF Millimeter-waveLow frequency
High
Medium
Low
50 MHz 20 GHz 40 GHz 60 GHz5 GHz 500+ GHz
![Page 19: Shelley Begley Application Development Engineer Agilent Technologies Electromagnetic Properties of Materials: Characterization at Microwave Frequencies](https://reader031.vdocuments.mx/reader031/viewer/2022032723/56649cfa5503460f949cc779/html5/thumbnails/19.jpg)
Measurement Techniques vs. Frequency and Material Loss
Frequency
Loss
Coaxial Probe
MicrowaveRF Millimeter-waveLow frequency
High
Medium
Low
50 MHz 20 GHz 40 GHz 60 GHz5 GHz 500+ GHz
![Page 20: Shelley Begley Application Development Engineer Agilent Technologies Electromagnetic Properties of Materials: Characterization at Microwave Frequencies](https://reader031.vdocuments.mx/reader031/viewer/2022032723/56649cfa5503460f949cc779/html5/thumbnails/20.jpg)
Measurement Techniques vs. Frequency and Material Loss
Frequency
Loss
Transmission line
Coaxial Probe
MicrowaveRF Millimeter-waveLow frequency
High
Medium
Low
Free Space
50 MHz 20 GHz 40 GHz 60 GHz5 GHz 500+ GHz
![Page 21: Shelley Begley Application Development Engineer Agilent Technologies Electromagnetic Properties of Materials: Characterization at Microwave Frequencies](https://reader031.vdocuments.mx/reader031/viewer/2022032723/56649cfa5503460f949cc779/html5/thumbnails/21.jpg)
Measurement Techniques vs. Frequency and Material Loss
Frequency
Loss
Transmission line
Coaxial Probe
MicrowaveRF Millimeter-waveLow frequency
High
Medium
Low
Free Space
50 MHz 20 GHz 40 GHz 60 GHz5 GHz 500+ GHz
![Page 22: Shelley Begley Application Development Engineer Agilent Technologies Electromagnetic Properties of Materials: Characterization at Microwave Frequencies](https://reader031.vdocuments.mx/reader031/viewer/2022032723/56649cfa5503460f949cc779/html5/thumbnails/22.jpg)
Measurement Techniques vs. Frequency and Material Loss
Parallel Plate
Frequency
Loss
Transmission line
Coaxial Probe
MicrowaveRF Millimeter-waveLow frequency
High
Medium
Low
Free Space
50 MHz 20 GHz 40 GHz 60 GHz5 GHz 500+ GHz
![Page 23: Shelley Begley Application Development Engineer Agilent Technologies Electromagnetic Properties of Materials: Characterization at Microwave Frequencies](https://reader031.vdocuments.mx/reader031/viewer/2022032723/56649cfa5503460f949cc779/html5/thumbnails/23.jpg)
Measurement Techniques vs. Frequency and Material Loss
Parallel Plate
Frequency
Loss
Transmission line
Resonant Cavity
Coaxial Probe
MicrowaveRF Millimeter-waveLow frequency
High
Medium
Low
Free Space
50 MHz 20 GHz 40 GHz 60 GHz5 GHz 500+ GHz
![Page 24: Shelley Begley Application Development Engineer Agilent Technologies Electromagnetic Properties of Materials: Characterization at Microwave Frequencies](https://reader031.vdocuments.mx/reader031/viewer/2022032723/56649cfa5503460f949cc779/html5/thumbnails/24.jpg)
Parallel Plate Capacitor System
tA
Cr
0
'
tA
Cr
0
'
LCR or Impedance Analyzer
Dielectric Test Fixture
(magnetic fixture also available)
Dtan Dtan
tA
![Page 25: Shelley Begley Application Development Engineer Agilent Technologies Electromagnetic Properties of Materials: Characterization at Microwave Frequencies](https://reader031.vdocuments.mx/reader031/viewer/2022032723/56649cfa5503460f949cc779/html5/thumbnails/25.jpg)
Impedance Analyzers and Fixtures
![Page 26: Shelley Begley Application Development Engineer Agilent Technologies Electromagnetic Properties of Materials: Characterization at Microwave Frequencies](https://reader031.vdocuments.mx/reader031/viewer/2022032723/56649cfa5503460f949cc779/html5/thumbnails/26.jpg)
Measurement Techniques that use a Vector Network Analyzer
•Coaxial Probe
•Transmission Line and Free-space
•Resonant Cavity
![Page 27: Shelley Begley Application Development Engineer Agilent Technologies Electromagnetic Properties of Materials: Characterization at Microwave Frequencies](https://reader031.vdocuments.mx/reader031/viewer/2022032723/56649cfa5503460f949cc779/html5/thumbnails/27.jpg)
Coaxial Probe System
Network Analyzer (or E4991A Impedance
Analyzer)
85070EDielectric
Probe
GP-IB or LAN
Computer (not required for
PNA)
85070E Software (included in kit)
![Page 28: Shelley Begley Application Development Engineer Agilent Technologies Electromagnetic Properties of Materials: Characterization at Microwave Frequencies](https://reader031.vdocuments.mx/reader031/viewer/2022032723/56649cfa5503460f949cc779/html5/thumbnails/28.jpg)
Material assumptions:
• effectively infinite thickness
• non-magnetic
• isotropic
• homogeneous
• no air gaps or bubbles
Material assumptions:
• effectively infinite thickness
• non-magnetic
• isotropic
• homogeneous
• no air gaps or bubbles
Coaxial Probe
11
Reflection
(S )
![Page 29: Shelley Begley Application Development Engineer Agilent Technologies Electromagnetic Properties of Materials: Characterization at Microwave Frequencies](https://reader031.vdocuments.mx/reader031/viewer/2022032723/56649cfa5503460f949cc779/html5/thumbnails/29.jpg)
Three Probe Designs
High Temperature Probe
•0.200 – 20GHz (low end 0.01GHz with impedance analyzer)•Withstands -40 to 200 degrees C •Survives corrosive chemicals•Flanged design allows measuring flat surfaced solids.
![Page 30: Shelley Begley Application Development Engineer Agilent Technologies Electromagnetic Properties of Materials: Characterization at Microwave Frequencies](https://reader031.vdocuments.mx/reader031/viewer/2022032723/56649cfa5503460f949cc779/html5/thumbnails/30.jpg)
Three Probe Designs
Slim Form Probe
•0.500 – 50GHz•Low cost consumable design•Fits in tight spaces, smaller sample sizes •For liquids and soft semi-solids only
![Page 31: Shelley Begley Application Development Engineer Agilent Technologies Electromagnetic Properties of Materials: Characterization at Microwave Frequencies](https://reader031.vdocuments.mx/reader031/viewer/2022032723/56649cfa5503460f949cc779/html5/thumbnails/31.jpg)
Three Probe Designs
Performance Probe
Combines rugged high temperature performance with high frequency performance, all in one slim design.
•0.500 – 50GHz•Withstands -40 to 200 degrees C•Hermetically sealed on both ends, OK for autoclave•Food grade stainless steel
![Page 32: Shelley Begley Application Development Engineer Agilent Technologies Electromagnetic Properties of Materials: Characterization at Microwave Frequencies](https://reader031.vdocuments.mx/reader031/viewer/2022032723/56649cfa5503460f949cc779/html5/thumbnails/32.jpg)
Transmission Line System
Network Analyzer
GPIB or LAN
Sample holder connected between coax
cables
Computer (not required for
PNA)
85071E Materials Measurement
Software
![Page 33: Shelley Begley Application Development Engineer Agilent Technologies Electromagnetic Properties of Materials: Characterization at Microwave Frequencies](https://reader031.vdocuments.mx/reader031/viewer/2022032723/56649cfa5503460f949cc779/html5/thumbnails/33.jpg)
Transmission Line
l
Reflection(S )11
Transmission(S )21
Material assumptions:
• sample fills fixture cross section
• no air gaps at fixture walls
• flat faces, perpendicular to long axis
• Known thickness > 20/360 λ
Material assumptions:
• sample fills fixture cross section
• no air gaps at fixture walls
• flat faces, perpendicular to long axis
• Known thickness > 20/360 λ
![Page 34: Shelley Begley Application Development Engineer Agilent Technologies Electromagnetic Properties of Materials: Characterization at Microwave Frequencies](https://reader031.vdocuments.mx/reader031/viewer/2022032723/56649cfa5503460f949cc779/html5/thumbnails/34.jpg)
Transmission Line Sample Holders
Waveguide
Coaxial
![Page 35: Shelley Begley Application Development Engineer Agilent Technologies Electromagnetic Properties of Materials: Characterization at Microwave Frequencies](https://reader031.vdocuments.mx/reader031/viewer/2022032723/56649cfa5503460f949cc779/html5/thumbnails/35.jpg)
Transmission Algorithms
(85071E also has three reflection algorithms)
Algorithm Measured S-parameters
Optimum Length Output
Nicolson-Ross S11,S21,S12,S22 /4r and r
Precision (NIST) S11,S21,S12,S22 n r
Fast S21,S12 n r
![Page 36: Shelley Begley Application Development Engineer Agilent Technologies Electromagnetic Properties of Materials: Characterization at Microwave Frequencies](https://reader031.vdocuments.mx/reader031/viewer/2022032723/56649cfa5503460f949cc779/html5/thumbnails/36.jpg)
Computer (not required for
PNA)
85071E Materials Measurement
Software
Transmission Free-Space System
GP-IB or LAN
Network Analyzer
Sample holder fixtured between two antennae
![Page 37: Shelley Begley Application Development Engineer Agilent Technologies Electromagnetic Properties of Materials: Characterization at Microwave Frequencies](https://reader031.vdocuments.mx/reader031/viewer/2022032723/56649cfa5503460f949cc779/html5/thumbnails/37.jpg)
Transmission Free-Space
Material assumptions:
• Flat parallel faced samples
• Sample in non-reactive region
• Beam spot is contained in sample
• Known thickness > 20/360 λ
Material assumptions:
• Flat parallel faced samples
• Sample in non-reactive region
• Beam spot is contained in sample
• Known thickness > 20/360 λ
l
Reflection
(S11 )
Transmission
(S21 )
![Page 38: Shelley Begley Application Development Engineer Agilent Technologies Electromagnetic Properties of Materials: Characterization at Microwave Frequencies](https://reader031.vdocuments.mx/reader031/viewer/2022032723/56649cfa5503460f949cc779/html5/thumbnails/38.jpg)
Non-Contacting method for High or Low Temperature Tests.
Free Space with Furnace
![Page 39: Shelley Begley Application Development Engineer Agilent Technologies Electromagnetic Properties of Materials: Characterization at Microwave Frequencies](https://reader031.vdocuments.mx/reader031/viewer/2022032723/56649cfa5503460f949cc779/html5/thumbnails/39.jpg)
75-110GHz Free Space System
![Page 40: Shelley Begley Application Development Engineer Agilent Technologies Electromagnetic Properties of Materials: Characterization at Microwave Frequencies](https://reader031.vdocuments.mx/reader031/viewer/2022032723/56649cfa5503460f949cc779/html5/thumbnails/40.jpg)
Free Space 75-110GHz Quasi-Optical System
Agilent Technical
Forum
Free Space Materials
Characterization
15 October 2008
Page 40
![Page 41: Shelley Begley Application Development Engineer Agilent Technologies Electromagnetic Properties of Materials: Characterization at Microwave Frequencies](https://reader031.vdocuments.mx/reader031/viewer/2022032723/56649cfa5503460f949cc779/html5/thumbnails/41.jpg)
Free Space 75-110GHz Quasi-Optical System
![Page 42: Shelley Begley Application Development Engineer Agilent Technologies Electromagnetic Properties of Materials: Characterization at Microwave Frequencies](https://reader031.vdocuments.mx/reader031/viewer/2022032723/56649cfa5503460f949cc779/html5/thumbnails/42.jpg)
Free Space 75-110GHz Quasi-Optical System
![Page 43: Shelley Begley Application Development Engineer Agilent Technologies Electromagnetic Properties of Materials: Characterization at Microwave Frequencies](https://reader031.vdocuments.mx/reader031/viewer/2022032723/56649cfa5503460f949cc779/html5/thumbnails/43.jpg)
Free Space 75-110GHz Quasi-Optical System
![Page 44: Shelley Begley Application Development Engineer Agilent Technologies Electromagnetic Properties of Materials: Characterization at Microwave Frequencies](https://reader031.vdocuments.mx/reader031/viewer/2022032723/56649cfa5503460f949cc779/html5/thumbnails/44.jpg)
Free Space 75-110GHz Quasi-Optical System
![Page 45: Shelley Begley Application Development Engineer Agilent Technologies Electromagnetic Properties of Materials: Characterization at Microwave Frequencies](https://reader031.vdocuments.mx/reader031/viewer/2022032723/56649cfa5503460f949cc779/html5/thumbnails/45.jpg)
Reflectivity Measurement System
GP-IB or LAN
Network Analyzer with Time Domain
option
NRL Arch Fixture with MUT
Computer (not required
for PNA)
85071E Materials
Measurement Software
with Reflectivity Option 200
![Page 46: Shelley Begley Application Development Engineer Agilent Technologies Electromagnetic Properties of Materials: Characterization at Microwave Frequencies](https://reader031.vdocuments.mx/reader031/viewer/2022032723/56649cfa5503460f949cc779/html5/thumbnails/46.jpg)
NRL Arch
Incident Wave
Reflected
Wave
port 1 port 2
MUT
S21
Results in dB
![Page 47: Shelley Begley Application Development Engineer Agilent Technologies Electromagnetic Properties of Materials: Characterization at Microwave Frequencies](https://reader031.vdocuments.mx/reader031/viewer/2022032723/56649cfa5503460f949cc779/html5/thumbnails/47.jpg)
Resonant Cavity System
Resonant Cavity with sample
connected between ports.
Network Analyzer
GP-IB or LAN
Computer (not required for
PNA)
Resonant Cavity Software
![Page 48: Shelley Begley Application Development Engineer Agilent Technologies Electromagnetic Properties of Materials: Characterization at Microwave Frequencies](https://reader031.vdocuments.mx/reader031/viewer/2022032723/56649cfa5503460f949cc779/html5/thumbnails/48.jpg)
Resonant Cavity Technique
Q
fs ffc
sQc
empty cavity
sample insertedfc = Resonant Frequency of Empty Cavity
fs = Resonant Frequency of Filled Cavity
Qc = Q of Empty Cavity
Qs = Q of Filled Cavity
Vs = Volume of Empty Cavity
Vc = Volume of Sample
ASTM 2520
![Page 49: Shelley Begley Application Development Engineer Agilent Technologies Electromagnetic Properties of Materials: Characterization at Microwave Frequencies](https://reader031.vdocuments.mx/reader031/viewer/2022032723/56649cfa5503460f949cc779/html5/thumbnails/49.jpg)
Resonant Cavity Fixtures
Agilent Split Cylinder Resonator IPC TM-650-
2.5.5.5.13
Split Post Dielectric Resonators from
QWED
ASTM 2520 Waveguide Resonators
![Page 50: Shelley Begley Application Development Engineer Agilent Technologies Electromagnetic Properties of Materials: Characterization at Microwave Frequencies](https://reader031.vdocuments.mx/reader031/viewer/2022032723/56649cfa5503460f949cc779/html5/thumbnails/50.jpg)
Resonant vs. Broadband Transmission Techniques
Resonant Broadband
Low Loss materialsYes
er” resolution ≤10-4
No
er” resolution ≥10-2-10-3
Thin Films and SheetsYes
10GHz sample thickness <1mm
No
10GHz optimum thickness ~ 5-10mm
Calibration Required No Yes
Measurement Frequency Coverage Single Frequency Broadband or Banded
![Page 51: Shelley Begley Application Development Engineer Agilent Technologies Electromagnetic Properties of Materials: Characterization at Microwave Frequencies](https://reader031.vdocuments.mx/reader031/viewer/2022032723/56649cfa5503460f949cc779/html5/thumbnails/51.jpg)
Summary Technique and Strengths
Parallel Plate Low Frequency
Best for thin flat sheets
Coaxial Probe Broadband
Best for liquids, semi-solids
Transmission Line Broadband
Best for machine-able solids
Transmission Free Space
Broadband, mm-wave
Non-contacting
Resonant Cavity Single frequency
High accuracy, Best for low loss, or very thin samples
![Page 52: Shelley Begley Application Development Engineer Agilent Technologies Electromagnetic Properties of Materials: Characterization at Microwave Frequencies](https://reader031.vdocuments.mx/reader031/viewer/2022032723/56649cfa5503460f949cc779/html5/thumbnails/52.jpg)
Microwave Dielectric Measurement Solutions
Model Number
Description
85070
E020
030
050
Dielectric Probe Kit High Temperature Probe
Slim Form Probe
Performance Probe
85071
E100
200
300
E01
E03
E04
Materials Measurement Software Free Space Calibration
Reflectivity Software
Resonant Cavity Software
75-110GHz Free Space Fixture
2.5GHz Split Post Dielectric Resonator
5GHz Split Post Dielectric Resonator
85072
A
10GHz Split Cylinder Resonant Cavity
![Page 53: Shelley Begley Application Development Engineer Agilent Technologies Electromagnetic Properties of Materials: Characterization at Microwave Frequencies](https://reader031.vdocuments.mx/reader031/viewer/2022032723/56649cfa5503460f949cc779/html5/thumbnails/53.jpg)
For More Information
Visit our website at:
www.agilent.com/find/materials
For Product Overviews, Application Notes, Manuals, Quick Quotes,
international contact information…
![Page 54: Shelley Begley Application Development Engineer Agilent Technologies Electromagnetic Properties of Materials: Characterization at Microwave Frequencies](https://reader031.vdocuments.mx/reader031/viewer/2022032723/56649cfa5503460f949cc779/html5/thumbnails/54.jpg)
For More Information
Visit our website at:
www.agilent.com/find/materials
Call our on-line technical support:
+1 800 829-4444
For Product Overviews, Application Notes, Manuals, Quick Quotes,
international contact information…
For personal help for your application, formal quotes, to get in touch with Agilent field engineers in your area.
![Page 55: Shelley Begley Application Development Engineer Agilent Technologies Electromagnetic Properties of Materials: Characterization at Microwave Frequencies](https://reader031.vdocuments.mx/reader031/viewer/2022032723/56649cfa5503460f949cc779/html5/thumbnails/55.jpg)
ReferencesR N Clarke (Ed.), “A Guide to the Characterisation of DielectricMaterials at RF and Microwave Frequencies,” Published by The Institute of Measurement & Control (UK) & NPL, 2003
J. Baker-Jarvis, M.D. Janezic, R.F. Riddle, R.T. Johnk, P. Kabos, C. Holloway, R.G. Geyer, C.A. Grosvenor, “Measuring the Permittivity and Permeability of Lossy Materials: Solids, Liquids, Metals, Building Materials, and Negative-Index Materials,” NIST Technical Note 15362005
“Test methods for complex permittivity (Dielectric Constant) of solid electrical insulating materials at microwave frequencies and temperatures to 1650°, ” ASTM Standard D2520, American Society for Testing and Materials
Janezic M. and Baker-Jarvis J., “Full-wave Analysis of a Split-Cylinder Resonator for Nondestructive Permittivity Measurements,” IEEE Transactions on Microwave Theory and Techniques vol. 47, no. 10, Oct 1999, pg. 2014-2020
J. Krupka , A.P. Gregory, O.C. Rochard, R.N. Clarke, B. Riddle, J. Baker-Jarvis, “Uncertainty of Complex Permittivity Measurement by Split-Post Dielectric Resonator Techniques,” Journal of the European Ceramic SocietyNo. 10, 2001, pg. 2673-2676
“Basics of Measureing the Dielectric Properties of Materials”. Agilent application note. 5989-2589EN, April 28, 2005