23/01/2007 ID Software Workshop 1

SCT performance from the SR1 endcap data

Satoru MimaOkayama University

ID Software Meeting23-Jan-2007

- Noise Study -

23/01/2007 ID Software Workshop 2

Contents -Noise Study -

1. Trigger rate scan2. Noise threshold scan3. Edge detection mode On/Off4. Cabling5. Summary

Online - Sergey Burdin Online Monitoring - Martin White Offline - Satoru Mima

23/01/2007 ID Software Workshop 3

Noise study - very important issue

Top Left Quadrant of the SCT EC-C 246/247 Modules

Hybrid Temperature ~ 17℃

SCT EC modules have 3 main types: Outer: 56.5–71.8 mm x 123.1 mm

Pitch: 70.8 – 90.3 μm Middle: 56.1–75.2 mm x 118.7 mm

Pitch: 70.3 – 94.8 μm Inner: 43.8–55.8 mm x 73.9 mm

Pitch: 54.4 – 69.5 μm

Sergey Burdin

EndCap-C

Module production phaseSR1 Cosmic ray testUnderground commissioning

Compare Barrel vs EC-C

23/01/2007 ID Software Workshop 4

1. Trigger Rate Scan EC-C

Run Number Trigger Rate7702 1 kHz7703 10 kHz7704 50 kHz7705 100 kHz

1 kHz 10 kHz 50 kHz 100 kHzLayer 0 3.78 (1.87) 3.58 (1.76) 3.57 (1.75) 3.41 (1.69)Layer 1 3.87 (2.21) 3.86 (2.15) 3.87 (2.19) 3.78 (2.09)Layer 2 5.04 (2.53) 4.76 (2.35) 4.74 (2.37) 4.73 (2.37)Layer 3 4.49 (3.12) 4.17 (3.04) 4.48 (2.87) 4.23 (2.92)Layer 4 4.50 (2.84) 4.46 (2.49) 4.11 (2.59) 4.09 (2.68)Layer 5 4.16 (2.77) 4.16 (2.63) 3.92 (2.68) 4.12 (2.61)Layer 6 5.53 (3.46) 5.29 (3.24) 5.33 (3.37) 5.25 (3.30)Layer 7 5.47 (2.47) 5.47 (2.72) 5.40 (2.71) 5.31 (2.73)Layer 8 3.66 (2.04) 3.69 (2.01) 3.60 (1.96) 3.58 (1.88)

Runs 7702 to 7705 were all performed with 1 fC thresholds, but with different trigger rates:

The mean and the RMS of the occupancy distribution does not apparently change with trigger rate:

The table shows the noise occupancy mean (RMS), scaled by 10E5

Martin White

Sergey Burdin

Online

Online Monitoring

23/01/2007 ID Software Workshop 5

Noise Occupancy of EC-Crun7705(1kHz) vs run7702(100kHz)

No trigger rate dependence

23/01/2007 ID Software Workshop 6

2. Noise threshold scan EC-C

Run Number Threshold (fC)7707 0.907711 0.957702 1.007710 1.057708 1.107709 1.20

All 10kEvent

A plot of noise Occupancy versus threshold. We fit Noise Occupancy with Error Function.

Good fitting result

23/01/2007 ID Software Workshop 7

Noise threshold scan EC-C

separated into Eta(Outer,Middle,Inner).

ENC(e-)

The distribution of Equivalent Noise Charge (ENC) value.

ENC (Outer) : 1570 e- (Middle) : 1550 e- (Inner) : 1110 e-

Zoom

per chip

per module

23/01/2007 ID Software Workshop 8

Comparison of ENC of Barrel and EndCap-C

ENC(Barrel) : 1580e-

EndCap-C

ENC(Outer) : 1570 e-

(Middle) : 1550 e-

(Inner) : 1110 e-

ENC(e-)Same ENC for Barrel and EndCap-C

23/01/2007 ID Software Workshop 9

Comparison of ENC for EC-C

My analysis resultRefer to “The ATLAS SemiConductor Tracker End-Cap Module” (2006) NIM Paper

SR1 Comic-Ray testModule Production

ENC(Outer) : 1570 e-

(Middle) : 1550 e-

(Inner) : 1110 e-

Only 50-100electron increase in ENC

23/01/2007 ID Software Workshop 10

3. Edge Detection Mode In physics mode the edge detect mode was ON

<config>0 3 0 1 0 0 0 0 0 0 1</config> Higher occupancy Sensitive to redundant clock?

Occupancy (Edge detect ON)

1.00E-08

1.00E-07

1.00E-06

1.00E-05

1.00E-04

1.00E-03

1.00E-02

1.00E-01

1.00E+00

1 21 41 61 81 101 121 141 161 181 201 221 241

Module

Calibration

Physics

S.BurdinObserved factor 3-4 increase in NO

Online

23/01/2007 ID Software Workshop 11

Increased Occupancy in the Endcap when switching between Edge Mode and Edge Detect

Re-cap of what the Front-End readout looks like:

DAC

Binary PipelineComparato

r

PerAmp+Shaper

Threshold Voltage

Edge-Detect circuit

Edge-Detect Enable

Readout Buffer

Sensor

Test-Input

Threshold Voltage

t

t

v

“Shaped” input pulse to

Comparator

“Logic” output of comparator

Δt Δt

Output pulse duration of comparator:

Δt ≈ Time-over-threshold of input pulse to comparator

Data Compression modes:

00 – Hit

01 – Level

10 – Edge

11 - Test

A. Greenall & J. VossebeldS.Burdin

23/01/2007 12

Noise occupancy Edge Detection Mode ON/OFF

Run 7757Edge DetectON

Run7702Edge DetectOFF

Inner

Middle

Outer

5E-65E-6

Noise OccupancyNoise Occupancy

Large Mean valueAnd dispersion

0 0

23/01/2007 ID Software Workshop 13

Time bin (Edge Off ) 20KEvent

Edge Detection Mode OFF

Time bin (Edge On)20KEvent

000 001 010 011 100 101 110 111

Time Bin

000 001 010 011 100 101 110 111

Time Bin

ON

Random, short, much smaller than 40MHz Noise

23/01/2007 ID Software Workshop 14

4. Cabling for EC-C at SR1

Module in Disk 3, Inner side had disappeared.

Inner

Middle

Outer

Fixed by Shaun Roe, Sergey Burdin

Disk

Missing Disk 3

Fixed!

(I use same cosmic run)

23/01/2007 ID Software Workshop 15

5. Summary

No trigger rate dependence (1kHz-100kHz) ENC=1600e- (spec.<1500e-) for Barrel and EndCap-C (Outer/Middle)

Inner ENC=1100e- (Quiet) Edge Detection Mode has been analyzed

Observed NO increase in Time bin = 001,010,100. Cabling map problem fixed

-> Looking forward to underground commissioning!