Techniques Probe

AFM SN- AF01

DFM Si-DF3, Si-DF20

STM Pt tip with ‘Au’ coating

MFM Si-MF3 Si-MF20 (Co-Pt-Cr Coated)

VE DFM SI-DF3

VE AFM SI-AF01

(LM-FFM) SI-AF01

Scanning Probe Microscope at NML was installed in the year 2004. It works at ambient conditions, is mounted on a vibration free table and has vibration proof chamber to reduce noise. The tip vibrations are monitored by a laser diode based detection system. Microscope is capable of characterizing samples upto a maximum diameter of 35 mm and thickness 5 mm. Two scanners are available : 20 and 100µm which scans down to atomic resolution. The X-Y resolution is 1 Ǻ and Z-resolution is 0.1 Ǻ. It can be used to characterize Metallic, Ceramic, and Biological samples .

Scanning Probe MicroscopeModel: SPA 400, From SIEKO, Japan

Contact Person: Dr. A.K. Pramanick

MST Division, National Metallurgical Laboratory (Council of Scientific and Industrial Research)

Jamshedpur-831007, India Tel:+91-657-2345014, E-mail:

pramanick@nmlindia.org

Technical SpecificationsThe Scanning Probe Microscope works with following modes of operations•Atomic Force Microscope (AFM)•Deflection Force Microscope (DFM)•Magnetic Force Microscope (MFM), •Visco-Elasticity Atomic Force Microscope(VE-AFM) and •Visco-Elasticity- Dynamic Force Microscope(VE-DFM)•Scanning Tunneling Microscope(STM)•Electro Chemical- Scanning Tunneling Microscope(EC-STM)