PLAN TO ATTEND!

SCANNING 2007April 10, 11, 12

Monterey, California

AT THE PORTOLA PLAZA

PLAN TO ATTEND!

AT THE PORTOLA PLAZA

SCANNING 2007April 10, 11, 12

Monterey, California

Image Courtesy of Monterey CVB

SCANNING 2007

• Advances in confocal and related optical microscopies

• Agricultural applications• Backscattering electron diffraction• Biological and biomedical microscopy and

microanalysis• Electron beam specimen interaction workshop• Focused ion beam (FIB)• Forensics applications• Graphic arts aspects of microscopy

Robert P. BeckerDept. of Anatomy and Cell BiologyUniversity of Illinois Medical Center808 S. Wood Street, Chicago, IL 60612-7308Phone (312) 996-7215; Fax (312) 413-0354e-mail: histologyman@yahoo.com

P.C. ChengAdvanced Microscopy and Imaging LaboratoryDept. of Electrical and Computer Engineering113 Bonner Hall, SUNY BuffaloBuffalo, NY 14260Phone (716) 645-3115; Fax (716) 645-3868e-mail: elepcc@gmail.com

Beverly GiammaraDept. of Anatomical Sciences and NeurobiologyUniversity of Louisville School of Medicine2205 Weber AvenueLouisville, KY 40205Phone & Fax: (502) 454-7218e-mail: giammara@bellsouth.net

David G. HowittDept. of Chem. Eng. and Materials ScienceUniversity California Davis, 2016 Bainer HallDavis, CA 95616Phone (530) 752-1164; Fax (530) 758-9918e-mail: dghowitt@ucdavis.edu

David C. JoyDept. Biochemistry, Cellular, Molecular BiologyUniversity of Tennessee Knoxville232 Science and Eng. Research Facility1414 Circle Drive, Knoxville, TN 37996-0840Phone (865) 974-3638; Fax (865) 974-9449e-mail: djoy@utk.edu

S. Frank PlatekForensic Chemistry Center, US Food and DrugAdministration, 6751 Steger DriveCincinnati, OH 45237-3097Phone: (513) 679-2700 x254;Fax: (513) 679-2761e-mail: fplatek@ora.fda.gov

PROGRAM COMMITTEE:

CALL FOR PAPERS: Abstract deadline — January 15, 2007

Papers are now being solicited for oral presentation and must be received at SCANNING/FAMS no later than January 15,2007. Submit online at http://scanning.msubmit.net Abstracts will be published in the Proceedings Issue of SCANNING®,The Journal of Scanning Microscopies, available at the meeting. In addition, full-length manuscripts may be submitted to SCANNING for peer review for publication in another issue. Presentation for contributed papers will be limited to approximately 20 minutes unless an exception is made by the Program Committee. For general meeting information,contact: SCANNING Program Committee, P.O. Box 485, Mahwah, NJ 07430-0485, USA. Phone (201) 818-1010, Fax (201)818-0086, e-mail: scanning2007@fams.org, Internet: www.scanning.org

All topics in the scanning microscopies are sought, including:

SHORT COURSESThe Short Courses present information on the subject listed, and the instructor will provide a course packet for eachregistrant. Special registration includes your choice of one short course. Be sure to REGISTER EARLY as enroll-ment is limited.

Short Courses will be scheduled on April 10, April 11, April 12. The Short Course curriculum at SCANNING 2007includes:

� Introduction to Atomic Force Microscopy (two-day course) � Advanced Topics in SEM

� Quantitative Measurements using AFM (half day course) � Scanning Microscopy in Forensic Science

� Materials Science Applications of AFM (half day course) � Images in Print

Michael T. Postek, Jr.Nanometer Scale Metrology GroupNational Institute of Standards and Technology Room A-117, Stop 8212Gaithersburg, MD 20899-8212Phone (301) 975-2299; Fax (301) 869-0822e-mail: postek@nist.gov

William P. WerginUSDA-ARS-EMU, Bldg. 177BBeltsville, MD 20705Phone (301) 504-9027; Fax (301) 504-8923e-mail: wwergin@msn.com

Audio-Visual:

Chris PooleyHRSL-Hydrology and Remote Sensing Lab10300 Baltimore Avenue465 BARC-EAST Bldg. Beltsville, MD 20705Phone: 301-504-8377; Fax: 301-504-8931 e-mail: pooleyc@asrr.arsuda.gov

• Light microscopy

• Materials microscopy and microanalysis

• Medical applications of scanning microscopy

• Microanalysis in SEM/EPMA/AEM

• Microscopy and microanalysis: theory, instru-

mentation and techniques

• Microwave technology

• Monte Carlo modeling for microscopy and

microanalysis

• Multidimensional microscopy

• Museum applications• Nanotechnology and nanofabrication• Scanning cry-HRSEM of chemical

systems• Scanning probe microscopies

• Semiconductor devices, materials, and process characterization

• STEM• TEM• X- ray mapping in electron beam

instruments

Instructions for Preparation of Abstracts

Abstracts:

Please provide an abstract of your proposed presentation at SCANNING 2007. Include relevant methods, materials,

data, conclusions, references, and illustrations (maximum of two single column width, black and white, high-resolution

images or glossy prints images). The charge to authors for publishing either halftones or line drawings is $92 each. A

check (in U.S. funds, drawn on a U.S. bank) for the full amount must be included with the abstract submission. The

text of your abstract must be no more than 700 words (references are included in the word count). Noninformational

language, such as “will be presented” or “will be discussed” will not be accepted. References must be cited in the text

and numbered, per SCANNING abstract style.

• Your abstract should be submitted online to http://scanning.msubmit.net. If it must be submitted by mail, the

abstract should be provided on a computer disc (please spell check) and on hard copy (e-mail preferred), and must

be accompanied by a completed checklist. Your abstract will be typeset for publication. Please include up to 5PACS codes (see www.scanning.org for full PACS list).

• Equations will be typeset, so kindly provide them in type form rather than hand drawing.

• References should be numbered and cited in the text. Do not underline. Please include the names of all authors (et

al. is not acceptable), complete title, volume, and inclusive page numbers for every reference.

• An unlabeled color image related to your presentation may be submitted for consideration as the cover of the

Proceedings Issue and should be supplied as a 5”x5” high-resolution Tiff file If more than 5mb, supply file on CD.

• Deadline: January 15, 2007. The Program Committee will acknowledge receipt of abstracts. Your abstract, if

received before the deadline and accepted for presentation at the meeting, will appear in the Proceedings Issue of

SCANNING, The Journal of Scanning Microscopies. The Proceedings Issue is the March/April 2007 issue of

SCANNING and will be distributed at SCANNING 2007.

• Abstracts received and accepted for presentation after the deadline will appear in the May/June 2007 issue (late

abstracts will not be distributed at the meeting).

Abstracts sent by mail should be addressed to Dr. Robert P. Becker, Editor, Proceedings Issue, SCANNING,P.O. Box 485, Mahwah, NJ 07430-0485. For express delivery services (not handled by the U.S. Postal Service),address to 545 Island Road, Suite 3D, Ramsey, NJ 07446-2822, USA. Dr. Becker’s phone: (312) 996-7215, fax:(312) 413-0354, e-mail: scanning2007@fams.org

Tuesday, April 10, Wednesday, April 11, and Thursday, April 12

The Portola Plaza

Monterey • California • USA

SCANNING 2007

Abstract submission extension to February 15, 2007

SCANNING 2007 PRELIMINARY PROGRAM

The Eighteenth Annual International Scientific Meeting on Scanning Microscopies

Monterey, California • April 10–12, 2007

TUESDAY, APRIL 10 Scanning Microscopy in Forensic Science (Portola Room) (8:30 a.m. - 4:30 p.m.) Short Course 2007A Chairs: S. Frank Platek, Forensic Chemistry Center, U.S. Food and Drug Administration, Cincinnati, OH; Michael T. Postek, US DOC-NIST, Gaithersburg, MD, M.A. Trimpe, Hamilton County Coroner’s Office, Cincinnati, OH, USA, and Michael J. McVicar, Chemistry Section Scientist, Center of Forensic Sciences, Ontario, Canada

This short course is devoted to scanning microscopy analysis of many types of forensic samples. Specific topics to be covered include particulate trace evidence analysis, gunshot residue (GSR) analysis and instrument calibration concerns and procedures. A trace evidence section in forensic sample processing will be presented. Topics covered include collection , handling, embedding, polishing, sectioning, mounting, storage and micro-manipulation of fine particles. With the increased efforts of most forensic laboratories to be certified, a portion of this short course will be devoted to SEM/EDX calibration issues and discussion among course attendees. A final segment will consist of a variety of actual sample-related applications of scanning microscopy over a number of interesting forensic cases. The short course will be instructed by forensic scientists and microscopists, each a specialist in his respective area of expertise. Course format will include a group question-and-answer session.

Introduction to AFM Sponsored by Pacific Nanotechnology, Inc. (Two-Day Course) (Ironwood) (8:30 a.m. – 4:30 p.m.) Short Course 2007B Chair: Paul West, Pacific Nanotechnology, Inc., Tustin, CA, USA

This course covers the following subjects: theory of AFM operation, AFM instrumentation, acquiring AFM images, recognizing artifacts, and processing AFM images. Students will have the opportunity to operate an AFM in this course.

Cryo Microscopy (9:00 a.m. – 10:15 a.m.) (Bonzai II) Chair: Jacob Bastacky, University of California, Berkeley, CA, USA

Low-temperature microscopy means imaging of samples held at temperatures down to that of liquid helium. Cryo light microscopes often operate in the range of the freezing temperature of water, 0°C, cryo electron microscopes below the recrystalization temperature of solid water, –130°C, the temperature of boiling nitrogen –196°C or that of liquid helium –273°C. Physical fixation without the need for chemical modification of the sample, protection against beam damage, and rapid immobilization of real time processes are possible with cryo. Recent applications to new imaging instruments such as the x-ray microtomograph and soft x-ray microscope, and ongoing applications such as CryoSEM, CryoTEM, and differential solidification light microscopy are examples of areas of interest for this session. Methodological similarities in imaging, interpretation, and all-important specimen preparation will provide a common ground for discussion. 1 (see over)

Among the contributors – "A complete cryo-chain from specimen preparation to the combined SIMS and SEM and EDX analysis of

frozen hydrated biomedical samples", W.H. Schroedera,

U. Breuerb, S. Kayser

c, W. Lorenz

c, U. Schurr

a, and R.

Metznerb,

aPhytosphere Institute, Research Center Jülich GmbH, Jülich, Germany,

bCentral Division of

Analytical Chemistry, Research Center, Jülich, Germany, cION-TOF GmbH, Münster, Germany

“Focused ion beam technology: Prototyping and fabrication of nanoscale devices”, Brandon Van Leer, FEI

Company, Hillsboro, OR, USA

Microwaves in Microscopy (sponsored by Ted Pella, Inc.) (9:00 a.m. – 12:30 p.m.) (Bonzai III) Chairs: Elaine Humphrey, University of British Columbia, Vancouver, BC and Beverly Giammara, University of Louisville School of Medicine, Louisville, Kentucky, USA Microwave processing is currently used for fluorescence labeling, immunogold labeling, TEM processing, SEM processing, decalcification and antigen retrieval. This session will include a complete demonstration of immunolabelling tissue with two fluorescent antibodies and the results shown on a fluorescent microscope. The practical necessities of controlling the temperature and the latest technology of using a magnetic stirrer within the microwave chamber will be covered. Among the contributors – "Benefits and drawbacks of microwave-assisted methods in both electron and light microscopy", Rick Giberson, Research and Development Manager, Ted Pella, Inc., Redding, CA, USA; Mark Sanders, Imaging Center, University of Minnesota, Twin Cities, MN, USA; and Elaine Humphrey, University of British Columbia, Vancouver, BC Scanning Cultural Heritage: Research, Documentation and Preservation for Works of Art, Museum Collections, Architecture and Archaeological Materials (9:00 a.m. - 5:00 p.m.) (Bonzai I) Chair: Eric Doehne, The Getty Conservation Institute, Los Angeles, CA, USA

Over the past decade, scanning technologies have become important tools in helping scientists perform research, documentation, conservation and preservation on an array of our material cultural heritage, ranging from Egyptian mummies to modern art. These technologies, including scanning electron microscopy (SEM), computed tomography (CT), and surface scanning, give researchers important insights into the history and state of preservation of these materials. Most techniques are non-destructive and non-invasive, and some can even be brought into the field. This kind of research borrows heavily from forensic science and this session will focus on the innovative application of various scanning techniques used to study our to cultural heritage as well as the detective work needed to investigate these materials.

Invited speakers – “Feasibility of conducting X-ray tomographic inspection of Michelangelo’s David”, James Trebes1, John Boone2, Cliff Bueno3, Franco Casali4, James Clayton5, Sung Han6, James Johnson5, Harry E. Martz, Jr.4, Alessandro Pasini4, Roger Perry1, Dan Schneberk1, Gary Stone1, 1Lawrence Livermore National Laboratory; 2University of California, Davis; 3General Electric; 4University of Bologna; 5Varian Instrument; 6Samsung

“Cryo-SEM of building materials – behavior of salts in the pore space”, Herbert Juling, Bremen Institute of Materials Science, Bremen, Germany

"3D- CT in the analysis of sculpture", Aurelia Badde, Staatliche Museen zu Berlin (SMB), Berlin, Germany,

and Bernhard Illerhaus, Bundesanstalt für Materialforschung und-prüfung (BAM), Berlin, Germany

Among the contributors –

“Optimization of CT scanning system for museum objects”, David Carson, Getty Conservation Institute, Los Angeles, CA, USA

2

“ESEM” and wet STEM applications to cultural heritage”, Eric Doehne, Getty Conservation Institute, Los Angeles, CA, USA

“FIB analysis of Coral Red and black gloss on Greek vases”, Alex Buxbaum, FEI Company, Hillsboro, OR, USA

“Analysis of gloss layers on Greek vases using ESEM/EDS and EPMA”, Marc Walton, Getty Conservation

Institute, Los Angeles, CA, USA

Focused Ion Beam Microscopy – Sponsored by the FEI Company (1:30 – 5:00 p.m.) (Bonzai II) Chair: Warren J. MoberlyChan, Materials Science and Technology Division, Lawrence Livermore National Laboratory, Livermore, CA, USA

Focused ion beam (FIB) microscopy and dual-column ion/electron beam systems are advancing into all fields of science, research and industrial applications. FIB is critical to the semiconductor industry for defect analysis, transmission electron microscopy (TEM) sample preparation, metrology and even device design and repair. Similar such applications are now being expanded into biology, geology, micromechanics, and nanoscience. Advances in computer control, in situ micromanipulators and add-on site-specific deposition systems enable the FIB/SEM to be ideal for prototyping a wide range of new nanostructures via simple cut-and-paste operations. This symposium will cover FIB uses in a wide range of fields, with an emphasis on sharing technical information among attendees in both formal and non-formal settings. Invited speakers "Focused ion beam sculpting curvilinear features”, David P. Adams, Sandia National Laboratories, Albuquerque, NM, USA “Wafers to needles: Utilizing the FIB for atomic scale co-examination with STEM and atom probe”, Brian Gorman, University of North Texas, Denton, TX, USA Among the contributors –

"Membrane folding by He

+ ion implantation using a focused ion beam", W.J. Arora, S. Sijbrandij*, L. Stern*,

H.I. Smith, G. Barbastathis, Massachusetts Institute of Technology, Cambridge, MA, USA and *ALIS

Corporation, Peabody, MA, USA "EM investigations of impurities in a fuel cell H2 electrode", A. Hauch, S.H. Jensen, L. Theil Kuhn, M. Mogensen, Fuel Cells and Solid State Chemistry Department, Riso National Laboratory, Technical University Denmark, Roskilde, Denmark "1-mm organic crystals (Rhodamine 590) for lasers and non-linear optics: A FIB/SEM preliminary

investigation", M. Milani*†, L. Ferraro*†, M. Moret*, S. Magni*†, and F. Tatti‡, *Department Materials

Science, University of Milano-Bicocca, Milan, Italy, †Laboratory FIB/SEM Bombay, University of Milano-

Bicocca, Milan, Italy, ‡FEI Italia S.r.l., Milan, Italy

"Focused ion beam post-fabrication processing of superluminescent diodes – a detailed analysis", F. Causa, M.

Milani*†, J. Sarma, F. Tatti‡, and L. Ferraro*, Department of Electronic and Electrical Engineering, University

of Bath, Bath, UK, *Department of Materials Science, University of Milano-Biococca, Milan, Italy,

†Laboratory FIB/SEM Bombay, University of Milano-Bicocca, Milan, Italy, ‡FEI Italia S.r.l., Milan, Italy

"Dual FIB/SEM systems for plasma facing materials in magnetic thermonuclear fusion”, M. Milani, S. Magni,

F. Ghezzi*, F. Tatti†, Laboratory FIB/SEM Bombay and Department of Materials Science, University of

Milano-Bicocca, Milan, Italy, *Istituto di Fisica del Plasma 'Piero Caldirola', CNR/ENEA/EURATOM, Milan,

Italy, †FEI Italy S.r.l., Milan, Italy

3 (see over)

"FIB sectioning for metal detection in digestive gland cells of P. scaber (Isopoda, Crustacea)", H. Zorz*, M.

Milani*†, F. Tatti‡, C. Savoia#, M. Acciarri*, D. Drobne

o, , *Department of Materials Science, University of

Milano-Bicocca, Milan, Italy, †Laboratory FIB/SEM Bombay, University of Milano-Bicocca, Milan, Italy,

‡FEI Italy S.r.l., Milan, Italy, #STMicroelectronics Agrate Brianza, Milan, Italy,

oDepartment of Biology,

University of Ljubljana, Ljubljana, Slovenia

“Focused ion beam technology: Prototyping and fabrication of nanoscale devices”, Brandon Van Leer, FEI Company, Hillsboro, OR, USA Advances in Scanning Microscopy and Analysis (10:45 a.m. – 5:00 p.m.) (Bonzai III) Chair: Timothy Maugel, Laboratory for Biological Ultrastructure, Biology Department, University of Maryland, College Park, MD, USA

"Combining SEM, X-ray and Raman spectroscopies for the study of geological materials", A.D. Brooker, Renishaw plc., Spectroscopy Division, Old Town, Wotton-under-edge, Glos, UK and R. Bormett, Renishaw Inc., Hoffmann Estates, IL, USA “Characterization of lead zirconate titanate – Ianthanum ruthenate thin films structures prepared by chemical solution deposition”, Andreja Ben an, Barbara Mali , Goran Dr zi , Marija Kosec, Jo ef Stefan Institute, Ljubljana, Slovenia

“Selection of drying methods for coated calcium alginate beads”, L. Deladino1, P. Anbinder1, A. Navarro1,2, and M. Martino1,2, 1Centro de Investigación y Desarrollo en Criotecnologia de Alimentos (CIDCA), Conicet, Fac. Ciencias Exactas; 2 Fac. Ingeniera (UNLP), La Plata, Buenos Aires, Argentina “Physicochemical characterization of different chemically modified corn starches”, O.V. López1, M.A. Garcia1, *N. Zaritzky1,2, 1Centro de Investigación y Desarrollo en Criotechnologia de Alimentos, Fac. Cs. Exactas, CONICET, Argentina, and 2Depto. Ing. Qca, Facultad de Ingenieria, Universidad Nacional La Plata, Argentina

"Particle impact damage study on optical lens materials", David P. Ziegler, Suzanne E. Bosselman, Christopher P. Drew, U.S. Army Natick Soldier RDEC, Natick MA "Development of automatic target recognition techniques for detecting and measuring the geometrical properties of carbon nanotubes and other nano-objects", M. Kaplan, N. Parkansky, R. Boxman, and L.P. Yaroslavsky, Electrical Discharge and Plasma Lab, Tel Aviv University, Tel Aviv, Israel "Controlled parallel DNA filament deposition in stretched conformation", Giovanni Valdrè, University of Bologna, Department of Earth Sciences, Bologna, Italy "Electrostatic force and resolution of EFM cantilevers modeled by finite element analysis", Giovanni Valdre

and Daniele Moro, Department of Earth and Geo-Environmental Sciences, University of Bologna, Bologna,

Italy

"New in situ investigation methods of polymers in the environmental SEM (ESEM)", Armin Zankel, Elisabeth

Ingolic and Peter Poelt, Institute for Electron Microscopy, Graz University of Technology, Graz, Austria

"Image analysis characterization of geological porous systems using Wood's metal intrusion", Serge Galaup,

René Burlot, and Adrian Cerepi, EGID-Bordeaux 3, Université Michel de Montaigne, Pessac Cedex, France

"Characterization of the peel behavior of polyethylene/polybutene-1 peel-systems using the in situ

environmental scanning electron microscopy", Michael Nase, Armin Zankel*, Beate Langer†, Hans-Joachim

Baumann‡, and Wolfgang Grellmann, Martin-Luther-University of Halle-Wittenberg, Center of Engineering

Science, Merseburg, Sachsen-Anhalt, Germany, * Intitute for Electron Microscopy, Graz University of

Technology, Graz, Austria, †Polymer Service Ltd, Merseburg, Germany, ‡ORBITA-FILM Ltd, Germany

“Electron microscopy and microanalysis of fiber-matrix interface in SiC based ceramic composite material for

fusion reactor application", Goran Drazic, Tea Toplisek, Sasa Novak, Natasa Drnovsek, Department for

Nanostructured Materials, Jozef Stefan Institute, Ljubljana, Slovenia

4

"Seed coat structure and colour in Brassica", Waheeb K. Heneen and Kerstin Brismar, Plant Protection Biology, Faculty of Landscape Planning, Horticulture and Agricultural Science, Swedish University of Agricultural Sciences, Alnarp, Sweden

“Study on ultrastructure change and cross-linking behaviors of microtusfortis neurocytes in physiological solution with contact mode atomic force microscopy”, Jie Zhu1, Li Lan and Guodong Wang, 2, 1Department of Applied Physics, College of Science, Northwest A & F University, Yangling, China, 2Morphologic Labs of Animal Cell, the Fourth Military and Medical University of China, Xi'an, China

“Partially gelatinized starches by high hydrostatic pressure as oligoelement carriers”, A.D. Molina-García, P.P. Fernández, P.D. Sanz, and M.N. Martino*, Department of Engineering, Instituto del Frío, CSIC, C/José

Antonio Novais 10, Madrid, Spain, *Centro de Investigación y Desarrollo en Criotecnología de Alimentos (CIDCA), Facultad de Ciencias Exactas, Universidad Nacional de La Plata, CONICET, La Plata, Argentina “Field emission scanning electron microscopy and correlative microscopy of axospinodendritic synapses of rodent and primate cerebellar cortex”, O.J. Castejón, Biological Research Institute, Drs. Orlando Castejón and Haydée Viloriade Castejón, Faculty of Medicine, Zulia University, Maracaibo, Venezuela “Quantifying the impacts of biobased urban wood waste on mycorrhizal formation”, Kamran K. Abdollahi,

Urban Forestry Program, Southern University Agricultural Research and Extension Center, Baton Rouge,

LA, USA

“Characterization of PbSe quantum dots embedded in poly vinyl alcohol film”, George A. Stanciu1, Josef

Friedmann, Stefan G. Stanciu1, Mahmoud A. Mahmoud

2, Bouchta Sahroui

3,

1Center for Microscopy-

Microanalysis and Information Processing, University Politechnica of Bucharest, Bucharest, Romania; 2Chemistry Department, Faculty of Science, Zagazig University, Zagazig, Egypt;

3Laboratory POMA UMR

CNRS 6136, University of Angers, UFR sciences, Angers, France

WEDNESDAY, APRIL 11 Advanced Topics in SEM (Bonzai I) (8:30 a.m. - 4:30 p.m.) Short Course 2007C Chairs: D.C. Joy, Department of Biochemistry, Cellular and Molecular Biology, University of Tennessee, Knoxville, TN, USA; O. C. Wells, Yorktown Heights, NY, USA

This is a course dealing with the fundamentals of scanning electron microscopy. Lectures will cover the basic techniques of scanning microscopy and applications to materials science. Specific topics include low voltage and low pressure microscopy, the appropriate use of detectors for the different types of imaging, Image J, SMART, Monte Carlo methods.

Introduction to AFM (continued) � Sponsored by Pacific Nanotechnology, Inc. (Two-Day Course) (Ironwood) � (8:30 a.m. - 4:30 p.m.) � Short Course 2007D Chair: Paul West, Pacific Nanotechnology, Inc., Tustin, CA, USA

This course covers the following subjects: theory of AFM operation, AFM instrumentation, acquiring AFM images, recognizing artifacts, and processing AFM images. Students will have the opportunity to operate an AFM in this course.

Quality Assurance for Measurements in the SEM (9 a.m. - 12:30 p.m.) (Bonzai II) Chairs: Dale E. Newbury and Michael T. Postek, NIST, Gaithersburg, MD, USA

The scanning electron microscope has evolved into a sophisticated measurement system incorporating morphological, compositional, and crystallographic characterization methods. The measurement science that forms the foundation of these characterization techniques is often overlooked, but careful attention to the individual measurement process is critical for achieving robust results with a meaningful error budget. This session seeks contributions describing efforts to bring SEM measurements in their wide diversity into satisfactory control, including specific applications such as linewidth measurement, particle analysis, etc.

5 (see over)

Among the topics and contributors � “Reference materials for quality assurance of automatic qualitative and quantitative analysis by energy dispersive x-ray spectrometry in the scanning electron microscope”, Dale E. Newbury, NIST, Microanalysis and Analytical Chemistry, Gaithersburg, MD, USA Morphological: Michael T. Postek and Andras E. Vladar, NIST, Precision Engineering Division,

Gaithersburg, MD � QA issues in high resolution and morphological measurement

Compositional: "Quality Assurance in automated electron beam analysis", Frederick Schamber, Aspex Corporation, Product Development, Delmont, PA

"Quantifying large particle data sets to facilitate robust classification", Nicholas W.M. Ritchie, Surface and Microanalysis Science Division, NIST, Gaithersburg, MD, USA

Crystallographic: Joseph R. Michael, Sandia National Laboratories, Albuquerque, NM, USA

QA issues with EBSP for grain size measurements

"3D image correction of tilted sample through coordinate transformation", Wei Chu, Joseph Fu, Ronald Dixson and Theodore Vorburger, Surface & Microform Metrology Group, Precision Engineering Division, NIST, Gaithersburg, MD, USA

“Computational models of the nano probe tip for static behaviors”, Shaw C. Feng, Theodore V. Vorburger, Che

Bong Joung, Joseph Fu, Ronald G. Dixson and Li Ma, NIST, Gaithersburg, MD, USA

“Improving linewidth and sidewall metrology capability with fast AFM scanning actuator”, Tianming Bao and Lars Mininni, Veeco Instruments, Inc., Santa Barbara, CA, USA

The Role of Scanning Microscopies in the Study of Disease (9:00 a.m. – 5:00 p.m.) (Bonzai I) Chair: Kenneth C. Moore, Central Microscopy Research Facility, The University of Iowa, Iowa City, IA, USA

This session will include research presentations using light, confocal, electron and atomic force microscopy featuring speakers in the respective technical areas. The morning session will begin with a one-hour tutorial on the theory, methodology and general applications of light, confocal and two-photon microscopy in medical research. A second one-hour tutorial will begin the afternoon session and introduce the theory, methodology and general applications of scanning and transmission electron microscopy in medical research. Established speakers in the areas of inflammation, cancer, lung disease, stem cells and other areas will present talks. Invited speakers – “Dynamics of neurons and glia in developing mammalian brain tissues”, Michael E. Dailey, Biological Sciences, The University of Iowa, Iowa City, IA, USA “Development of new optical techniques for imaging live cells, tissues and intact organisms”, Steven J. Smith, Molecular and Cellular Biology, Stanford University, Stanford, CA, USA Tutorials: Atomic Force Microscopy, Kenneth C. Moore, Central Microscopy Research Facility, The University of Iowa, Iowa City, IA, USA SEM for Biomedical Research, Randy A. Nessler, Central Microscopy Research Facility, The University of Iowa, Iowa City, IA, USA Multiphoton microscopy in biomedical research: A tutorial, Thomas M. Moninger, Central Microscopy Research Facility, The University of Iowa, Iowa City, IA, USA

6

The important role of atomic force microscopy in the study of diseases: A tutorial, Sophia Hohlbauch, Asylum

Research, Santa Barbara, CA, USA

Raman chemical imaging characterization of the adhesive-collagen interface, Newton T. Samuel, Ethicon, Inc.,

Corporate Product Characterization, Somerville, NJ, USA

Applications of Scanning Microscopy in Forensic Science Day 1 of 2 (9:00 a.m. ) (Portola Room) Chairs: S. Frank Platek, Forensic Chemistry Center, U.S. Food and Drug Administration; M.A. Trimpe, Hamilton County Coroner’s Office, Cincinnati, OH, USA

9:00-9:30 a.m. -“Forensic examination of surface-modified fibers”, Kurt Gaenzle, Materials Engineering

Laboratory, Naval Air Depot, North Island, San Diego, CA, USA, and Bob Blackledge, El Cajon, CA, USA

9:30-10:00 a.m. - “A comparison of chemically prepared toners (CPT’s) against conventional toners", Joseph C. Stephens, United States Secret Service, Forensic Services Division, Washington, D.C., USA 10:45-11:15 a.m. - "Quantitative analysis of toolmarks using stereoimaging", L.S. Chumbley, J. Kidd, J. Craft,

M. Morris, L. Genalo, Ames Laboratory, Iowa State University, Ames, IA, USA, and J. Kreiser, State of Illinois

Forensic Laboratory (ret.), Springfield, IL, USA

11:15-11:45 a.m. - J. Mershon, CamScan USA, Cranberry Twp., PA, USA – "TBA"

11:45-12:15 a.m. - "9mm Luger ammunition and its relationship with environmental and occupational sources",

A. Hanson and F. Springer, Sacramento County Forensics Office, Sacramento, CA, USA

1:30-2:00 p.m. - “Evidence for victim identification from dental materials”, R.G. Miller, DDS, AAFO, AAFS,

Laboratory for Forensics Odontology Research, Department of Oral Diagnostic Sciences, School of Dental

Medicine, SUNY, Buffalo, NY, USA

2:00-2:30 p.m. - “Dental materials database generation using SLICE”, Mary A. Bush, DDS, ASFO, AAFS,

Laboratory for Forensics Odontology Research, School of Dental Medicine, SUNY, Buffalo, NY, USA

2:30-3:00 p.m. - “Validation experiment using cadavers and portable X-ray fluorescence”, Peter Bush, BS,

ASFO, South Campus Instrumentation Center, School of Dental Medicine, SUNY, Buffalo, NY, USA

Microscopy in Firearms Identification and Consecutive Line Matching (3:30 – 5:00 p.m.)

Chair: David G. Howitt, Graduate Program in Forensic Science, University of California at Davis, Davis, CA, USA

The technique of consecutive lines matching for tool mark identification has long been practiced in California and provides an objective criterion for the determination of whether bullets were likely fired from the same gun. This session will be devoted to the objective and statistical evaluation of matching and non-matching striae along the lines originally developed by A.A. Biasotti. The presentations will include the uniqueness of particular tool marks and the differences between class, sub class and individual characteristics. "A simple method for examining ballistic and tool marks using low-angle BSE imaging", E. Randich1, F. A. Tulleners2, and M.F. Giusto3, 1Lawrence Livermore National Laboratory, Livermore, CA, USA, 2Forensic Science Graduate Program, University of California at Davis, Davis, CA, USA, 3California Department of Justice

"The technique of consecutive matching lines for bullet identification", David Howitt, Fred Tulleners, Karen

Cebra and Shiahn Chen, Graduate Program in Forensic Science, University of California, Davis, CA, USA

"The durability of the micromachining marks proposed for the identification of firearms", Michael Beddow,

Frederick Tulleners and David Howitt, Department of Chemical Engineering and Material Science , Graduate

Program in Forensic Science, University of California, Davis, CA, USA 7 (see over)

Microscopies for the Structural and Dynamic Organization of the Nucleus and Chromosomes (1:30 - 5:00 p.m.) (Bonzai II) Chair: Terry D. Allen, Paterson Institute for Cancer Research, University of Manchester, Manchester, U.K. The cell nucleus has undergone a renaissance over the last few years, largely brought about by the application

of microscopic technologies enabling not just visualization of dynamic events, but also their characterization using a variety of antibody labeling and fluorescent probes such as green fluorescent protein (GFP). This has been applied with great effect not only to the events occurring at cell division, but also many aspects of nuclear activity throughout interphase, which has now been demonstrated to be infinitely more dynamic than previously imagined. Three-dimensional time lapse imaging of living cells has produced existing new observations on many aspects of cell division, a subject studied for the last hundred years. Further ways of modifying nuclear biology by genetic mutants and techniques such as RNA interference have provided unique material for novel separate structural investigations. This session will incorporate a variety of approaches through light and electron microscopy concentrated on the biology of the nucleus.

THURSDAY, APRIL 12 Quantitative Measurements Using Atomic Force Microscopy Sponsored by Pacific Nanotechnology, Inc. (Half Day Course) (Ironwood) (8:30 a.m. - 12:30 p.m.) Short Course 2007D Chair: Paul West and Natasha Starostina, Pacific Nanotechnology, Inc., Tustin, CA, USA

This course focuses on the use of an AFM for making advanced measurements. Topics covered include modes such as EFM and MFM. Additionally, quantitative measurements such as metrology and friction will be discussed.

Materials Sciences Applications of Atomic Force Microscopy Sponsored by Pacific Nanotechnology, Inc. (Half Day Course) (Ironwood) (1:30 p.m. - 4:30 p.m.) Short Course 2007E Chair: Paul West and Natasha Starostina, Pacific Nanotechnology, Inc., Tustin, CA, USA

There are many applications for atomic force microscopes in the field of materials sciences. This course covers the types of applications that are possible with an AFM as well as a practical discussion on sample preparation.

Mastering the Digital Image (Bonzai I) (8:30 a.m. - 4:30 p.m.) Short Course 2007F Chair: P. C. Cheng, University of New York, Buffalo, NY, USA

I. Observation–Examining the images and samples to determine how humans identify the components of the image, and then looking at the analogs for what a computer can and cannot easily isolate. II. Acquisition–Capturing the digital image with attention to resolution requirements, noise (both pattern and random), contrast, and color. III. Isolation–Making the computer isolate the components of the image(s) on the basis of color, texture, size, orientation, etc. This includes a discussion of which methods are more reproducible and less susceptible to variation. IV. Measurement–Now that the components have been isolated, it is time to examine the statistical measures that can be made, along with their expected error. V. Automation–While it is generally easy to measure any ONE image, the whole procedure is much more difficult when measuring a batch of images. This includes both methods of automating Photoshop and also better choices for how to perform Steps II, III, and IV. And finally we revisit Step I to compare the computer’s identified components with what the trained human experts were seeing in the first place. 8

Electron Beam/Specimen Interaction Workshop (9:00 a.m. – 12:30 p.m.) (Bonzai III) Chair: Michael T. Postek, Division Chief, Precision Engineering Division, National Institute of Standards and Technology, Gaithersburg, MD, USA

The Electron Beam/Specimen Interaction Workshop has brought experimentalists and modeling experts together for nearly a decade to share information on this exciting topic.

This workshop has contributed to an enhanced understanding of the signal generation and imaging process in electron beam instrumentation. Signal formation in the scanning electron microscope represents a complex interaction between the instrument and the three-dimensional (3-D) sample. The primary beam also consists of electrons distributed within a 3-D volume. The scope of this workshop includes developments in the measurements and modeling of this interaction from electron generation to formation of the electron beam and focusing of it upon the sample to scattering of electrons and generation of signals within the sample and finally to collection and detection of those signals that produce the image (secondary electrons, transmitted electrons, x-rays, etc.) It also includes the use of such models for reduction of artifacts and uncertainty in SEM measurement results. The workshop encourages presentations on methods of inputting 3-D structural information as well as 3-D graphic representations of the data obtained. Other issues of interest include the effects of finite scatting volume of electrons within the sample, sample charging, modeling of the environmental SEM, charge-compensation methods, interactions with materials (e.g., photoresist) of particular scientific or technological interest, and behavior of electron scattering at energies much lower (<500eV) or much higher (>20keV) than those typically used in laboratory instruments. Anyone interested in electron beam modeling, electron beam interactions and their effect on the signals collected in a scanned beam instrument is welcome to submit abstracts to this workshop.

Among the contributors– "Improved X-ray simulation in NISTMonte" Nicholas W.M. Ritchie, Surface and Microanalysis Science Division, NIST, Gaithersburg, MD

"Monte Carlo simulation of SEM work with semiconducting devices", Eliahu Napchan, DLM Enterprises,

London, UK

“Modeling for SEM imaging and micro-analysis in water", D.C. Joy, University of Tennessee Knoxville, TN, and Center for NanoPhase Materials Science, Oak Ridge National Laboratory, TN, USA "Charge transport and secondary electron contrast in dielectric multi-layers", Visiliki Tileli†, Milos Toth‡†, W.

Ralph Knowles‡, and Bradley L. Thiel†, †College of Nanoscale Science and Engineering, University at Albany,

Albany, NY, USA ‡FEI Company, Newburyport, MA, USA

“Cathodoluminescence of SiO2: Influence of electron beam parameters”, J. Bigaré, CEA-LE Ripault,

DMAT/SCMF/LOD, Monts, France

"Monte Carlo simulation of SEM and AEM image of 3D objects", Z.J. Ding1, Z. Zhong1, S.M. Xiao1, S.F.

Mao1, Y.G. Li1, H.Y. Wang1, H.M. Li2, Z.M. Zhang3, 1Hefei National Laboratory for Physical Sciences at Microscale and Department of Physics, University of Science and Technology of China, Hefei, Anhui, China, , 2Department of Astronomy and Applied Physics, University of Science and Technology of China, Hefei Anhui, China, and 3USTC-HP Laboratory of High Performance Computing, University of Science and Technology of China, Hefei, Anhui, China "Monte Carlo simulation of X-ray photoemission electron microscopy image", Z.M. Zhang1, Y.J. Kuang2, T. Chen2, and Z.J. Ding2, Hefei National Laboratory for Physical Sciences at Microscale and Department of Astronomy and Applied Physics, University of Science and Technology of China, Hefei, Anhui, China, 2Hefei National Laboratory for Physical Sciences at Microscale and Department of Physics, University of Science and Technology of China, Hefei, Anhui, China

"Prediction of SEM image details using Lagrange time-delay estimation interpolation (LATDEI model", K. S.

Sim, C. P. Tso, W.K. Lim, Faculty of Engineering & Technology, Multimedia University, Melaka, Malaysia

9 (see over)

”Charge contrast imaging of non-conductive samples in the high vacuum FE-SEM", Y. Ji, X.L. Quan, J.Y. Fu,

Y.Q. Zhang, L. Wang, X.D. Xu, C.X. Liu, Beijing University of Technology, Beijing, China

"Resolution and signal-to-noise measurement in the SEM – A user's perspective", J. Alexander Liddle, Andras

E. Vladar, and Michael T. Postek, NIST, Gaithersburg, MD, USA

“Monte Carlo modeling of SEM using CHARIOT software and opportunity for calibration of linewidth

metrology”, S. Babin, S. Borisov, A. Ivanchikov, Abeam Technologies, Inc., Castro Valley, CA, USA

“Automatic measurement of electron beam size using BEAMETR technique”, Sergey Babin,*D.C. Joy, Mikhail

Machin, Alexey Martynov, Abeam Technologies, Inc., Castro Valley, CA, USA; *Department of Biochemistry,

Cellular and Molecular Biology, University of Tennessee, Knoxville, TN, USA

“The electron beam hole-drilling of silicon nitride thin films”, S.J. Chen, D.G. Howitt, Dept. of Chemical

Engineering and Materials Science, University of California, Davis, USA, B. Gierhart, Dept. of Electrical and

Computer Engineering, University of California, Davis, USA, R. Smith and S. Collins, The Micro Instruments

and Systems Laboratory, Laboratory for Surface Science and Technology, University of Maine, Orono,

ME, USA

Applications of Scanning Microscopy in Forensic Science – Day 2 of 2 (9:00 a.m. – 5:00 p.m.) (Portola Room) Chairs: S. Frank Platek, Forensic Chemistry Center, U.S. Food and Drug Administration; M.A. Trimpe, Hamilton County Coroner’s Office, Cincinnati, OH, USA

9:00-9:30 a.m. - "The Colonel Sabow homicide: The gunshot residue evidence", B. Burnett, MEIXA TECH, Forensic Science Consultants Group, Cardiff-by-the-Sea, CA, USA 9:30-10:00 a.m. - "A survey of primer residues produced by contemporary powertool rounds and their relation

to gunshot residue", Elspeth Lindsay, Michael J. McVicar, Robert V. Gerard, Naomi Janson*, Chemistry

Section, Center of Forensic Sciences, Toronto, Ontario, Canada, *University of Toronto at Mississauga,

Mississauga, Canada

10:45-11:15 a.m. - TBA - J. Lebiedzik, Advanced Instruments Corp., Golden, CO, USA

11:15-11:45 a.m. - “Non-traditional GSR evidence: The continuing saga”, James B. Crippin, Colorado State

University, Western Forensic Law Enforcement Center, Pueblo, CO, USA

11:45-12:15 -

Applications of Scanning Microscopy in Forensic Science – Gunshot Residue and GSR Forum – 1:30-3:00

p.m.

Chair: Michael A. Trimpe, Hamilton County Coroner's Office, Cincinnati, OH, USA

3:30-5:00 p.m. – Special "SLICE" Tutorial, xk, Inc., Clackamas, OR, USA (moderated and presented by John

Colby, owner)

Part I Basic Electron Backscattered Diffraction (EBSD): Tutorial and Applications; Part II – Advanced Electron Backscattered Diffraction (EBSD): Tutorial and Applications, Co-sponsored by TSL-EDAX, Draper, UT and HKL-Oxford, Pasadena, CA (9:00 a.m. – 5:00 p.m.) (Bonzai II) Co-chairs: Roy H. Geiss, NIST, Boulder, CO, USA, and Joseph R. Michael, Sandia National Laboratories,

Albuquerque, NM, USA

Invited speakers –

"EBSD 101 – an interactive tutorial", Matt Nowell, TSL-EDAX, Draper, UT, USA and Scott Sitzman, HKL-

Oxford, Pasadena, CA, USA

“Sample preparation for EBSD utilizing focused ion beams – is it worth the effort?”, J.R. Michael, Materials

Characterization Dept., Sandia National Laboratories, Albuquerque, NM, USA

10

“Carbonate EBSD – a new tool for understanding shell growth and ancient visual systems", M. Cusack, P. Dalbeck,

M.R. Lee, A.W. Owen and A. Perez-Huerta, Department of Geographical and Earth Sciences, University of

Glasgow, Glasgow, UK

“EBSD in the study of phase transformations", Gareth Seward, Department of Earth Science, University of

California Santa Barbara, Santa Barbara, CA, USA

"Focused ion beam routes to sample preparation for EBSD", Joseph Michael, Sandia National Laboratories,

Albuquerque, NM, USA

"Techniques for measuring elastic train using EBSD", Roy H. Geiss, NIST, Boulder, CO, USA

Contributed paper –

"Statistical variances between texture analyses conducted using electron backscatter diffraction and X-ray

diffraction", Stuart I. Wright, TSL-EDAX, Draper, UT, USA

Student Forum – 1:30 p.m. – A $200.00 scholarship will be awarded. (Bonzai III) Program Committee: Robert P. Becker P.C. Cheng Beverly Giammara Program Director Advanced Microsc. & Imaging Lab Dept. Anatomical Sciences & Dept. of Anatomy & Cell Biology Dept.of Electrical and Neurobiology University of Illinois Computer Engineering University of Louisville 808 S. Wood Street 113 Bonner Hall, SUNY Buffalo School of Medicine Chicago, IL 60612-7308 Buffalo, NY 14260 2205 Weber Avenue Phone (312) 996-7215 Phone (716) 645-3115 Louisville, KY 40205 Fax (312) 413-0354 Fax (716) 645-3868 Phone & Fax (502) 454-7218 e-mail: histologyman@yahoo.com e-mail: elepcc@gmail.com e-mail: giammara@bellsouth.net David G. Howitt David C. Joy S. Frank Platek Dept Chem Eng & Materials Science Dept Biochemistry, Cellular, Forensic Chemistry Ctr, US Food & University of California Davis Molecular Biology, University Drug Administration 206 Bainer Hall of Tennessee Knoxville 6751 Steger Drive Davis, CA 95616 232 Science & Eng Res Facility Cincinnati, OH 45237-3097 Phone (530) 752-1164 1414 Circle Dr Phone (513) 679-2700 X 254 Fax (530) 758-9918 Knoxville, TN 37996-0840 Fax (513) 679-2761 e-mail: dghowitt@ucdavis.edu Phone: (865) 974-3638 e-mail: frank.platek@fda.hhs.gov Fax: (865) 974-9449 e-mail: djoy@utk.edu Michael T. Postek, Jr. William P. Wergin Audio-Visual: Precision Engineering Division Wergin Associates, Inc. Chris Pooley NIST 1 Arch Place HRSL-Hydrology and Remote Bldg 220/A117 Gaithersburg, MD 20878-6600 Sensing Lab Gaithersburg, MD 20899-8212 Phone (301) 504-9027 10300 Baltimore Ave Phone (301) 975-2299 Fax (301) 504-8923 Beltsville, MD 20705 Fax (301) 869-0822 e-mail: wwergin@msn.com Phone (301) 504-8377 e-mail: postek @cme.nist.gov Fax (301) 504-8931 e-mail: cpooley@hydrolab.arsusda.gov

For further information contact scanning2007@fams.org; mks@fams.org; lconly@fams.org, mbraggin@fams.org or tony@fams.org

Visit us at http://www.scanning2007.org

Phone: 201-818-1010 Fax: 201-818-0086

Audio-visual requirements form is on line. Address questions to Chris Pooley: cpooley@hydrolab.arsusda.gov or phone 301-504-8337, or fax 301-504-8923.

Fax completed form to FAMS at 201-818-0086. 11

REGISTRATION SCHEDULE

SCANNING 2007April 10, 11, and 12

Monterey • California • USA

Category of Registration

Special registration (includes a one-year membership in the Foundationfor Advances in Medicine and Science, Inc. (FAMS) and your choice of one SCANNING 2007 Short Course.) Course No: ______________

Regular meeting registration (no membership or Short Course included)

One-day (specify day _____________________________________)

Student registration (only full-time students presenting credentials)

Guest (includes access to refreshments and Welcome Reception)

Pre-Registration(postmarked before

March 9, 2007)

$430

$300

$150

$ 60 per day

$ 50

On-Site

$475

$350

$175

$ 60 per day

$ 50

Amount

$___________

$___________

$___________

$___________

$___________

Course No.

�� 2007A

�� 2007B

�� 2007C

�� 2007D

�� 2007E

�� 2007F

��

��

��

��

��

All registration fees include Proceedings Issue, scientific sessions, tutorials, welcome reception, and social mixers for all daysregistered.

(See over)

Amount

$___________

$___________

$___________

$___________

$___________

$___________

Course Description Pre-registration / Registration

Scanning Microscopy in Forensic Science $125 $135Tuesday, April 10, 8:30 a.m.–4:30 p.m.Instructors: S. Frank Platek, National Forensic Chemistry Center, US FDA, Cincinnati, OH; Dennis C. Ward, US DOJ-FBI, Quantico, VA; Michael T.Postek, US DOC-NIST, Gaithersburg, MD and Michael A. Trimpe, HamiltonCoroner’s Office, Cincinnati, OH, USA

Introduction to Atomic Force Microscopy $250 $270Tuesday, April 10 and Wednesday, April 11, 8:30 a.m.–4:30 p.m.Instructor: Paul West, Pacific Nanotechnology, Inc., Santa Clara, CA, USA

Advanced Topics in SEM $125 $135Wednesday, April 11, 8:30 a.m.–4:30 p.m.Instructors: David C. Joy, University of Tennesse Knoxville, Knoxville, TN, USA, and Oliver C. Wells, Yorktown Heights, NY, USA

Quantitative Measurements Using Atomic Force Microscopy $75 $80Thursday, April 12, 8:30 a.m.–12:30 p.m. (half day class)Instructor: Paul West, Pacific Nanotechnology, Inc., Santa Clara, CA, USA

Materials Sciences Applications of Atomic Force Microscopy $75 $80Thursday, April 12, 1:30 p.m.–4:30 p.m. (half day class)Instructor: Paul West, Pacific Nanotechnology, Inc., Santa Clara, CA, USA

Mastering the Digital Image $125 $135Thursday, April 12, 8:30 a.m.–4:30 p.m.Instructor: P.C. Cheng,State University of New York, Buffalo, N.Y., USA

TOTAL $ _______________

*Short Course attendees MUST register for each meeting day in which they attend a short course at the above-noted fees.

SCANNING 2007 SHORT COURSES–VISIT WWW.SCANNING.ORG FOR COMPLETE SHORT COURSE DESCRIPTIONS:

PRE-REGISTRATION / REGISTRATION FORM

CIRCLE ONE

NAME

AFFILIATION

STREET ADDRESS

CITY, STATE AND ZIP

PHONE

FAX

E-MAIL

DR., MR., MRS., MS.

_______________________________________________________________________________

_______________________________________________________________________________

_______________________________________________________________________________

_______________________________________________________________________________

_______________________________________________________________________________

_______________________________________________________________________________

_______________________________________________________________________________

YOUR PLACE OFEMPLOYMENT

___ Industry

___ University

___ Government Facility

___ Research Institute

___ Hospital

___ Other

YOUR FIELDS OF SPECIAL INTEREST

___ AFM/STM including nanotechnology

___ Agricultural applications

___ Biological and biomedical applications

including microanalysis

___ Cell labelling techniques including gold and fluorescent markers

___ Confocal and related optical microscopies

___ Cryo-SEM

___ Digital image processing and analysis

___ Focused Ion Beam (FIB)

___ Food structure and functionality

___ Forensics applications in SEM

___ Four dimensional microscopy

___ Graphic arts aspects of microscopy

___ Materials applications including microstructure of materials

___ Monte Carlo modeling for microscopy and microanalysis

___ Pharmaceutics___ Polymer microscopy and microanalysis___ SEM, including low-voltage and variable pressure

techniques

___ Semiconductor devices, material and process characterization

___ STEM___ Telemicroscopy

___ 3-D imaging, reconstruction and stereology

___ Other

Registration Fee (total amount from other side) __________________

Pre-registration must be postmarked prior to March 9, 2007, and accompanied by full payment. Registrations received without payment and afterMarch 9, 2007 will be considered on-site and registrants will be required to pay the on-site fee. FAMS Federal tax-exempt ID number is 22-2464506.

�� Check enclosed (make check payable to FAMS, Inc.)

�� Bill to: �� AMEX �� DINERS �� MASTERCARD �� VISA Total Amount $_____________

Card No. __________________________________ Exp. Date ____________ Signature _____________________________________________(Print clearly or include photocopy of card)

Return registration and payment to: FAMS, Inc., P.O. Box 485, Mahwah, NJ 07430-0485, USA

Tel: (201) 818-1010 • Fax: (201) 818-0086 • scanning@fams.org • www.scanning.org

Date received at FAMS (for office use only – do not fill in) ________________________________

Cancellation policy: No refunds for registration or Short Courses will be issued after March 9, 2007, regardless of thereason. Cancellations before March 9, 2007 must be requested in writing. This policy is necessary due to the costs ofadvance planning.

SCANNING 2007April 10, 11, and 12

Monterey • California • USA

(See over)

ASSIGNMENT OF COPYRIGHT

I certify that no material in this manuscript has been published previously and no part of it is currently under consideration for publication elsewhere. Author’s signature ________________________________________________Please sign again below. ____________________________________________ (hereafter the “Author”), hereby assigns, transfers and sets over to the Foundation for Advances in Medicine and Science, Inc., (FAMS)/SCANNING, located at Mahwah, New Jersey 07430-0832, the copyright and the right to obtain copyright registration of the article entitled: _____________________________________________________________________________________ _____________________________________________________________________________________ Copyright transfer includes all rights to renewal and extensions of copyright for reproduction in all media. FAMS/SCANNING, its related companies, and licensees shall have the sole right to print, reprint, publish, license, translate, and vend the article, as an abstract and in its complete form, and it is agreed that the copyright to both forms is hereby conveyed. Author is hereby licensed the right to use all or part of the article in future works written by the Author without charge, provided written permission of the publisher is obtained. Author reserves all patent rights to any patentable subject matter described in said article. Author represents and warrants that said article is wholly original with Author/Authors and further warrants that Author/Authors have not sold, assigned, licensed or encumbered any of the rights granted herein. Federally funded research is in the public domain and is not subject to the copyright laws. However, all authors are required to sign to indicate their agreement to publication.

To be signed by all authors: _____________________________________________________________________________________ Signature (& date) _____________________________________________________________________________________ Signature (& date) _____________________________________________________________________________________ Signature (& date) _____________________________________________________________________________________ Signature (& date) _____________________________________________________________________________________ Signature (& date)

U.S. Government Employment Certification A work prepared by a U.S. Government employee as part of his or her official duties is not eligible for U.S. copyright. If all authors were U.S. Government employees when this Paper was prepared, and the authors prepared this Paper as part of their official duties, at least one author should sign below. If at least one author was not a U.S. Government employee, the work is eligible for copyright and that author should sign the Transfer of Copyright form above. _____________________________ ____________________________ _____________________ Author’s signature Print name Date

Travel to Monterey, California

Monterey is situated 60 miles south of San Jose International Airport, 120 miles south of downtown San

Francisco and 340 miles north of Los Angeles. The Monterey Peninsula Airport is located just four miles

from the Portola Plaza. Travel time is ten minutes. Taxi service is approximately $12 each way.

Air Transportation

Many flights are also available into San Francisco, San Jose and Phoenix, Arizona. The Phoenix flights

have connecting service to Monterey.

Non-stop flights to San Francisco are available at least once per day from the following cities:

Newark, Cleveland, Houston (via Continental); Detroit, Minneapolis, Memphis (via Northwest); Atlanta,

Salt Lake City, JFK (New York) (via Delta); Newark, Chicago, Washington/Dulles, Denver, JFK (New York)

(via United); Phoenix, Las Vegas (via US Airways); Chicago, Dallas, New York, Newark (via American).

Non-stop flights to San Jose are available at least once per day from the following cities: Newark,

Houston (via Continental); Minneapolis (via Northwest); Atlanta, Salt Lake City, JFK (New York) (via Delta);

Chicago, Dallas (via American).

Ground Transportation (Bus Service)

Monterey Airbus offers bus service from San Jose and San Francisco Airports to Monterey. Passengers

are picked up at the arrival level of the airport. Buses run 11 times per day (every 90 minutes) and a reser-

vation is strongly recommended and can be made by calling (831) 373-7777. Passengers will be allowed

on the bus without a reservation if space permits. The cost from San Francisco to Monterey is $40 per per-

son and buses run from 6:45 am to 10:00 pm. The cost from San Jose to Monterey is $30 per person and

buses run from 7:30 am to 10:45 pm.

Municipal Parking

Affordable municipal parking is available near the hotel in Monterey.

Hotel Reservation Form

PORTOLA PLAZA HOTEL AT MONTEREY BAY

SCANNING 2007

Group Rate Honored: MONDAY, APRIL 9, 2007 THROUGH FRIDAY, APRIL 13, 2007

PLEASE FAX THIS FORM DIRECT TO THE HOTEL AT: 831-649-3109

RESERVATIONS MUST BE MADE PRIOR TO THE CUT-OFF DATE OF MARCH 17, 2007, IN ORDER TO RECEIVE THE NEGOTIATED GROUP RATE OF $155.00 FOR SINGLE/DOUBLE OCCUPANCY. CHILDREN UNDER 18 STAYING IN THE SAME ROOM ARE FREE.

THERE IS A $20 CHARGE FOR EACH ADDITIONAL PERSON ABOVE 2 PER NIGHT.

48–HOUR CANCELLATION POLICY APPLIES.

PLEASE DO NOT CALL RESERVATIONS FOR THE FEDERAL RATE. CONTACT LILLIAN CONLY AT

LCONLY@FAMS.ORG.

LAST NAME: _________________________________________________________________________

FIRST NAME: ________________________________________________________________________

ADDRESS: ___________________________________________________________________________

CITY: ____________________________________ STATE: _______________ ZIP: _______________

PHONE: __________________________________ FAX: _____________________________________

EMAIL: ______________________________________________________________________________

ARRIVAL DATE: DEPARTURE DATE:

NUMBER OF ADULTS: ______________________ NUMBER OF CHILDREN: ___________________

BED TYPE: DOUBLE/DOUBLE_______________ KING: ______________ COMMENTS/REMARKS: _______________________________________________________________

All Reservations Require a Credit Card To Guarantee Room and Tax CREDIT CARD #: ________________________________________________EXP. DATE: __________

NAME ON CREDIT CARD: _____________________________________________________________

RESERVATIONS ~ 888-222-5857

GOLF OUTING AT SCANNING 2007FRIDAY, APRIL 13, 2007

MONTEREY, CA

Register in advance to ensure your tee time. Call (201) 818-1010 or

email your reservation to scanning@fams.org

Monterey BayWhale Watch

Friday, April 13, 2007 • 10 a.m. to 1:00 p.m.

A trip by boat on the Bay accompanied by a marine biologist fromthe Pacific Cetacean Group, a non-profit group dedicated toresearch, education and conservation of whatles and dolphins, isopen to SCANNING 2007 attendees. Partial proceeds from theWhale Watch trip directly supports this group.The entire GrayWhale population migrates past the Monterey coastline everywinter/spring and will be the focus of the trip. We also have timeto search for dolphins (up to five species) often seen by the thou-sands, porpoises (two species), sea lions, otters, and seabirds.

� Yes, please reserve tickets for the Monterey Bay Whale Watch. Cost is $32 for adults and $21 for children under 12:

Name # of adult tickets @ $32 # of children’s tickets @ $21 Total $

Address

Telephone Email

� Check enclosed (make check payable to FAMS, Inc.) � Bill to: AMEX Mastercard Visa

Card No. Exp. Date Signature

Return to: FAMS, Inc. Attention: Tony Bourgholtzer, P.O. Box, 485, Mahwah, NJ 07430-0485, USA or fax to: (201) 818-0086

TWO GREAT OUTINGS AT SCANNING 2007

STUDENT FORUM Student Scholarship Award:

A scholarship in the amount of $200 cash will be awarded to the student whose abstract is judged the best of all student submissions. In addition to the cash award, the winning student will receive a certificate entitled “Best Student Award

at SCANNING 2007” suitable for framing. This award will be announced and awarded at the conclusion of the Student Forum which starts on Thursday, April 12, 2007, at 1:30 p.m. in the Bonzai III Room at the Portola Plaza Hotel. Judging is by a 3-person Program Committee group. ______ Yes, I am a student and would like to apply for the Student Scholarship Award at SCANNING 2007. A copy of my abstract is enclosed. Student Free Registration: Students from California, Utah, and Nevada are eligible for FREE REGISTRATION with an official student ID card. Simply present your Student ID at the Registration Desk with your completed registration form or fax a photocopy to the FAMS office (201-818-0086).

Student Volunteers:

Students from other areas interested in helping as student monitors can receive free registration in exchange for light administrative duties such as assisting a session chair with a scientific presentation. Student Information:

Name: ___________________________email: _________________________ Address: __________________________________________________________ Phone No: _______________________Fax: _____________________________ Days Available/Specific session: _______________________________________

Please return form to Mary K. Sullivan (mks@fams.org) at FAMS.

AUDIO-VISUAL REQUIREMENTS FORM Name: ______________________________________________________________________________ Address: ______________________________________________________________________________ ______________________________________________________________________________ Phone No: _______________________________ Fax No:_____________________________ E-mail: _____________________________________________________________________ Session: _____________________________________________________________________

Abstract Title: ________________________________________________________________ Powerpoint presentations are now the norm. An LCD projector will be supplied for every session. A notebook computer will not be supplied. However, in most cases one will be provided by the session chair. ❐ I will present using a computer. ❐ I have a Mac with a Mini-DVI port. Any additional A/V equipment must be specifically requested and confirmed by email. ❐ I will require an S-VHS/VHS videocassette player. ❐ I will require a 35mm projector. ❐ I will require an overhead projector. Notes: _____________________________________________________________________________ _____________________________________________________________________________ _____________________________________________________________________________ Questions? Contact Chris Pooley: cpooley@hydrolab.arsusda.gov or phone (301) 504-8377, or fax (301) 504-8923. Please fax the completed form to FAMS at (201) 818-0086.

FAMS, Inc. P.O. Box 485 Mahwah, NJ 07430-0485

Phone: 201-818-1010 Fax: 201-818-0086

e-mail: scanning2007@fams.org; mks@fams.org; mbragging@fams.org;

lconly@fams.org or tony@fams.org Internet: www.scanning2007.org or

www.fams.org

SCANNING 2007 April 10, 11, 12

THE PORTOLA PLAZA MONTEREY, CALIFORNIA, USA