rf module characterisation test proceduresrf tests 3 rf tests 3.1 close-in phase noise (crystal...

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RF Module Characterisation

Test Procedures

September 2005

CSR Churchill House

Cambridge Business Park Cowley Road

Cambridge CB4 0WZ United Kingdom

Registered in England 3665875

Tel: +44 (0)1223 692000 Fax: +44 (0)1223 692001

www.csr.com

bcore-ug-013Pa © Cambridge Silicon Radio Limited 2005 This material is subject to CSR’s non-disclosure agreement.

http://www.csr.com/home.htm

Contents

Contents 1 Introduction .................................................................................................................................................... 4

1.1 Bluetooth Module Set-up ......................................................................................................................... 4 1.2 Required Test Equipment ........................................................................................................................ 5 1.3 Miscellaneous Notes ............................................................................................................................... 5

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haracterisation Test Procedures

2 Test Set-up ..................................................................................................................................................... 6 2.1 Hardware Configuration........................................................................................................................... 6 2.2 Software Configuration ............................................................................................................................ 7

2.2.1 PSTool Set-up.............................................................................................................................. 7 2.2.2 BlueTest Set-up ........................................................................................................................... 7

3 RF Tests.......................................................................................................................................................... 8 3.1 Close-In Phase Noise (Crystal Trim) ....................................................................................................... 8

3.1.1 Test Set-up .................................................................................................................................. 8 3.1.2 Procedure .................................................................................................................................... 8

3.2 RF Output Power..................................................................................................................................... 9 3.2.1 Test Set-up .................................................................................................................................. 9 3.2.2 Procedure .................................................................................................................................... 9

3.3 LO Leakage / LO Suppression .............................................................................................................. 10 3.3.1 Test Set-up ................................................................................................................................ 10 3.3.2 Procedure .................................................................................................................................. 11

3.4 Close-In Sideband Suppression: RF Coupling ...................................................................................... 11 3.4.1 Test Set-up ................................................................................................................................ 11 3.4.2 Procedure .................................................................................................................................. 12

3.5 Receiver Sensitivity and Bit Error Rate.................................................................................................. 12 3.5.1 Test Set-up ................................................................................................................................ 13 3.5.2 Procedure .................................................................................................................................. 14

3.6 Bluetooth Loopback Test Using Spectrum Analyser, Part 1 .................................................................. 14 3.6.1 Test Set-up ................................................................................................................................ 15 3.6.2 Procedure .................................................................................................................................. 16

3.7 Bluetooth Loopback Test Using Spectrum Analyser, Part 2 .................................................................. 18 3.7.1 Test Set-up ................................................................................................................................ 18 3.7.2 Procedure .................................................................................................................................. 19

3.8 Bluetooth Loopback Test Using the Anritsu Bluetooth Test Set ............................................................ 20 3.8.1 Test Set-up ................................................................................................................................ 20

4 Test Report Templates ................................................................................................................................ 21 4.1 General RF Tests Using Spectrum Analyser ......................................................................................... 21 4.2 RF Loopback Test Using Spectrum Analyser Bluetooth Personality ..................................................... 22 4.3 RF Loopback Test Using Anritsu Bluetooth Tester................................................................................ 23 4.4 Miscellaneous Test Cases..................................................................................................................... 24

5 Document References ................................................................................................................................. 25 Terms and Definitions ........................................................................................................................................ 26 Document History ............................................................................................................................................... 27

bcore-ug-013Pa © Cambridge Silicon Radio Limited 2005 This material is subject to CSR’s non-disclosure agreement. Page 2 of 27

Contents

List of Figures

Figure 1.1: Bluetooth Module Connection to Casira Development Board ............................................................... 4 Figure 2.1: Casira Development Board Cable Connections.................................................................................... 6 Figure 3.1: Crystal Trim........................................................................................................................................... 9 Figure 3.2: RF Output Power ................................................................................................................................ 10 _

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Figure 3.3: LO Leakage ........................................................................................................................................ 11 Figure 3.4: Close-In Sideband Suppression with 62.5kHz Baseband Offset......................................................... 12 Figure 3.5: Bit Error Rate ...................................................................................................................................... 14 Figure 3.6: Output Power ...................................................................................................................................... 16 Figure 3.7: Carrier Frequency Drift........................................................................................................................ 16 Figure 3.8: Initial Carrier Frequency Tolerance..................................................................................................... 17 Figure 3.9: Modulation Characteristics.................................................................................................................. 17 Figure 3.10: Sample Output Spectrum – 20dB Bandwidth.................................................................................... 19 Figure 3.11: Adjacent Channel Power................................................................................................................... 19


Introduction

1 Introduction This document describes how to perform an RF characterisation of a v1.2 Bluetooth® wireless technology CSR _äìÉ`çêÉ» module.

1.1 Bluetooth Module Set-up

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CSR has a development board known as the Casira™. If this kit is available, the Bluetooth module to be tested must be connected to the Casira carrier board (see Figure 1.1) and then mated to the Casira development board. The SPI, power and GND are the minimum signals needed. If a host interface (i.e., USB, UART) is available, this should be connected as well. If a Casira development kit is not available, then the unit under test should provide access to the following interfaces:

SPI (Serial Peripheral Interface) USB or UART Power and Ground Appropriate level shifter RF I/O

Casira carrier board Signalling, PWR and GND cables

Antenna pig-tail Bluetooth Module

Figure 1.1: Bluetooth Module Connection to Casira Development Board

An antenna pig-tail (i.e., coax stripped on one end with a connector on the other end) also needs to be added if the module has a printed antenna on the PCB or if there is no access to the transmit port. Remove any series component to isolate the printed antenna and add the pig-tail either to the radio-side pad of the removed component or to the antenna test point, if available. The ground of the pig-tail needs to be well attached to the module ground either at the shell or by scraping away some solder mask to expose a solid area of the ground plane. The insertion loss of the antenna pig-tail should be accounted for in all measurements.


Introduction 1.2 Required Test Equipment

To perform these tests, a PC with CSR’s BlueSuite™ (PSTools, BlueTest and BTCLI) installed is required. Also required is a spectrum analyser (preferably with the Bluetooth personality), a loopback tester (such as the Anritsu MT8850A/MT8852A, Agilent E1852A/B, Agilent N4010A or R&S CMU200 with the Bluetooth Option) and a Casira Test Development Board. Also useful is a signal generator.

1.3 Miscellaneous Notes

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For the test results, be sure to compensate for the loss of the antenna pig-tail (approximately 0.5dB to 1dB) and the RF cable/connector (approximately 1dB to 2dB) for a total system loss of approximately 1.5dB to 3dB depending on accessories used. The system loss should be added to all test results reported by any of the test equipment utilised.

The Bluetooth module should be tested at a minimum of three channels:

Channel 0 = 2402 MHz Channel 39 = 2441 MHz Channel 78 = 2480 MHz

When launching the various CSR software tools, be sure to select the appropriate host transport for communication.


Test Set-up

2 Test Set-up 2.1 Hardware Configuration

Connect the Bluetooth module to the Casira board. On the Casira motherboard, be sure the SPI cable and either USB or UART (Serial) cable is connected to the PC running the software noted in section 1.2. Be sure to disconnect the USB cable from the Casira motherboard if UART is the desired host interface. If both the USB and UART cables are connected, only the USB interface will work.

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UART

USB

Power

SPI

Casira Module

Figure 2.1: Casira Development Board Cable Connections


Test Set-up

2.2 Software Configuration

2.2.1 PSTool Set-up

Start PSTool with the following parameters.

Transport SPI BCCMD on Port LPT1

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Uncheck the “Halt Chip on SPI access” box. The other listed transports can be use if supported by the module, however SPI is the most flexible.

Verify that the following parameters are set correctly.

PSKEY_HOST_INTERFACE (0x01F9) Note the interface; this will be needed for BlueTest

PSKEY_BDADDR (0x0001) 0002-5B-01A2B9 (this will be different for each device)

Crystal Freq (0x01FE) 3E80 (16 MHz; this will be different for different modules)

USB Vendor ID (0x02BE) 0A12 (CSR module)

USB Product ID (0x02BF) 0001 (CSR module)

UART Baud Rate (0x01BE) Note the baud rate for use with BlueTest

Close the PSTool software once the above parameters are set and verified.

2.2.2 BlueTest Set-up

Start BlueTest with the following parameters.

Transport BCSP or any other supported transport Serial COM1 or any other supported COM ports

Baud Rate Depends on baud rate set by Bluetooth module. Use PSTools to determine baud rate first

If “Transport Active” and “Link Active” appear along with the HW ID and FW version, then a successful connection to the Bluetooth module has been achieved. If no connection has been established (i.e., “Cannot find BlueCore” message), verify cable connection, transport mode and baud rate are set correctly.

Leave BlueTest running to perform the RF characterisation.


RF Tests

3 RF Tests 3.1 Close-In Phase Noise (Crystal Trim)

To verify the centre frequency value and calibrate the crystal trim value. _äìÉ`çêÉ

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3.1.1 Test Set-up

BlueTest Set-up Parameters

Test Arguments

RF Test Mode LO Freq Mod Freq External Power Internal Power

TXSTART 2441MHz 0 255 63

An internal power level of 63 corresponds to the maximum transmit power, typically +4 to +6 dBm for a Class 2 device. The crystal trim can be set on the middle channel and verified on the top and bottom channels.

Spectrum Analyser Set-up Parameters

Span Sweep RBW VBW Trace Det Mode AVG

100kHz Auto 1kHz 1kHz Clear Write Sample Yes

3.1.2 Procedure

Select “CFG_XTAL_FTRIM” in BlueTest. Note the current value and put the marker on Peak Search on the spectrum analyser. Adjust the crystal trim value until the centre frequency is as close as possible to the desired centre frequency. Note that crystal trim values are in hex. See Figure 3.1 for an example of a trim crystal for CH 39 (2441MHz).

In addition, check for any unwanted close-in spurious emissions. A clean signal should resemble that in Figure 3.1.


RF Tests

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Figure 3.1: Crystal Trim

3.2 RF Output Power

To verify the RF output power of the module.

3.2.1 Test Set-up


Test Arguments

RF Test Mode LO Freq Mod Freq Ext Power Int Power

TXSTART 2402MHz 0 255 63 TXSTART 2441MHz 0 255 63 TXSTART 2480MHz 0 255 63

An internal power level of 63 corresponds to the maximum transmit power, typically +4 to +6 dBm for a Class 2 device.



10MHz Auto 100kHz 100 kHz Clear Write Sample Yes

3.2.2 Procedure

Select TXSTART in BlueTest and use the settings in section 3.2.1. Put the marker on Peak Search on the spectrum analyser and record the output power. Repeat for all three frequencies listed in the table in section 3.2.1. See Figure 3.2 as an example.


RF Tests

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Figure 3.2: RF Output Power

3.3 LO Leakage / LO Suppression

To measure non-Bluetooth spurious energy and LO suppression level.

3.3.1 Test Set-up


Test Arguments

RF Test Mode LO Freq Ext Power Int Power

TXDATA1 2402MHz 255 63 TXDATA1 2441MHz 255 63 TXDATA1 2480MHz 255 63

Verify these additional BlueTest set-up parameters.

CFG_FREQ CFG_PKT CFG_TX_IF

TX/RX Int Loopback Report Int Packet Type Packet Size

+2 or -2 1250 1875 1 4 27



10MHz 500ms 100 kHz 100kHz Clear Write Peak No


RF Tests 3.3.2 Procedure

The above parameters will transmit DH1 packets containing PRBS9 (pseudorandom bit sequence of (29 -1)) data with either a +1 or -1 MHz offset. A CFG_TX_IF of +2 will offset the carrier by -1 MHz and a setting of -2 will have a corresponding offset of +1 MHz.

Adjust the offset to achieve the lowest LO leakage. For Class 2 designs, LO leakage across the entire band should be less than -24dBc (relative to the wanted signal) but up to -22dBc is allowable. See Marker 1 amplitude delta example in Figure 3.3.

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Figure 3.3: LO Leakage

3.4 Close-In Sideband Suppression: RF Coupling

To measure the level of spurious frequency modulation produced by the voltage controlled oscillator (VCO).

3.4.1 Test Set-up


Test Arguments

RF Test Mode LO Freq Mod Freq Ext Power Int Power

TXSTART 2402MHz 0 and 256 255 63 TXSTART 2441MHz 0 and 256 255 63 TXSTART 2480MHz 0 and 256 255 63

A modulation frequency setting of 0 corresponds to no baseband transmit offset and a modulation frequency setting of 256 corresponds to a baseband transmit offset of 62.5kHz.


RF Tests Spectrum Analyser Set-up Parameters


1MHz 500ms 10kHz 10kHz Clear Write Peak No

3.4.2 Procedure _äìÉ`çêÉ

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For a Class 2 device, the height of the sideband at ±62.5kHz should be less than -4dBc. See Figure 3.4 for an example. If the sideband is too high, this could be caused by VDD_VCO and/or the balun supply, which could be fixed with layout, routing changes and/or additional RF filtering.

Figure 3.4: Close-In Sideband Suppression with 62.5kHz Baseband Offset

3.5 Receiver Sensitivity and Bit Error Rate

To measure the module’s maximum receiver sensitivity and bit error rate.


RF Tests

3.5.1 Test Set-up

Connect the antenna connector of the Bluetooth module to the signal generator RF port.


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Test Arguments

RF Test Mode LO Freq Hi Side RX Attenuation

BIT ERR1 2402MHz False 0 BIT ERR1 2441MHz False 0 BIT ERR1 2480MHz False 0

A signal generator with the internal dual arbitrary waveform generator is required for this test. The following procedures outline the steps required to build a Bluetooth waveform on the Agilent Vector Signal Generator with the Internal Dual Arbitrary Waveform Generator Option. If the waveform already exists in memory, proceed to “Signal Generator – Recalling a Bluetooth Waveform”.

Signal Generator: Building a Bluetooth Waveform

1. Press Mode.

2. Select Arb Waveform Generator.

3. Select Bluetooth.

4. Select Packet (DH1).

5. Select BD_ADDR.

Enter the Bluetooth address of the DUT, for example 0002-5B-01A2B9, then press Enter.

The Bluetooth address will be different for each DUT.

6. Select AM_ADDR.

Enter 7 then press the Enter.

7. Select Frequency and enter the same frequency as in BlueTest.

8. Select Amplitude and enter -75dBm as a starting value.

9. Toggle the Bluetooth softkey to On to build the Bluetooth waveform.

10. Turn on RF and Mod.

Signal Generator: Recalling a Bluetooth Waveform

1. Press Recall.

2. Turn the knob to select the register containing the Bluetooth waveform file.

3. Select Return.

4. Select Frequency and enter the same frequency as in BlueTest.

5. Select Return.

6. Select Amplitude.

Adjust the knob to set the amplitude level, start at around -75dBm.

Note: The above procedure only applies to CSR-specific test equipment, i.e., Agilent Vector Signal Generator. Other test equipment can be used for testing. Consult the owner’s manual for instructions on how to generate or download a Bluetooth waveform.


RF Tests

3.5.2 Procedure

In BlueTest, start the BIT_ERR1 test and turn on the RF on the signal generator. The BlueTest utility will constantly update the bit error rate as the amplitude on the signal generator varies. Adjust the amplitude on the signal generator until a bit error rate of less than or equal to 0.1% is achieved. The maximum sensitivity level should be in the range of -78dBm to -82dBm, depending on LO frequency. Repeat for all three channels. Be sure to record the % Bit Error in Current Cumulation value from BlueTest. Figure 3.5 shows an example. _äì

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Figure 3.5: Bit Error Rate

3.6 Bluetooth Loopback Test Using Spectrum Analyser, Part 1

The following RF tests can be performed using the Bluetooth personality option in the Agilent spectrum analyser. The test parameters may vary with different spectrum analyser Bluetooth options, therefore, section 3.6 and section 3.7 only apply to the Agilent spectrum analyser. The following RF test cases are per the Bluetooth specification.

TRM/CA/01/C Output Power TRM/CA/09/C Carrier Frequency Drift TRM/CA/08/C Initial Carrier Frequency Tolerance TRM/CA/07/C Modulation Characteristics

Note: If the tests in section 3.6 and section 3.7 are performed, then the test in section 3.8 is not required. However, the results for these loopback test cases will vary slightly depending on which test set-up is used.


RF Tests 3.6.1 Test Set-up


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Test Arguments



TXDATA3 has a transmit bit pattern of 10101010…..

Set up the spectrum analyser as follows.

Mode Bluetooth

Channel LMH Channel Select L, M or H for LO freq running on BlueTest

Packet Type Select either DH1, DH3 or DH5

Channel Auto Channel


RF Tests

3.6.2 Procedure

Return to the spectrum analyser Bluetooth main menu (press Measurement) after set-up and perform each test as shown in section 3.6. These tests will give either a Pass or Fail along with any measured data upon completion. See Figure 3.6 through Figure 3.9 as examples of each test parameter.

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Figure 3.6: Output Power

Figure 3.7: Carrier Frequency Drift


RF Tests

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Figure 3.8: Initial Carrier Frequency Tolerance

Figure 3.9: Modulation Characteristics


RF Tests

3.7 Bluetooth Loopback Test Using Spectrum Analyser, Part 2

The following RF tests can be performed using the Bluetooth personality option in the Agilent spectrum analyser. The test parameters may vary with different spectrum analyser Bluetooth options, therefore, section 3.6 and section 3.7 only apply to the Agilent spectrum analysers. The following test cases are per the Bluetooth specification. _

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TRM/CA/05/C Output Spectrum Bandwidth – 20dB Bandwidth RM/CA/06/C ACP (Adjacent Channel Power)

3.7.1 Test Set-up


Test Arguments



TXDATA4 has a transmit bit pattern of 11110000…..

Set up the spectrum analyser as follows:

Mode Bluetooth

Channel LMH Channel Select L, M or H for LO freq running on BlueTest

Packet Type Select DH1, DH3 or DH5

Channel Auto Channel


RF Tests

3.7.2 Procedure

Return to the spectrum analyser main menu after set-up and perform each test as shown in section 3.7. These tests will give either a Pass or Fail along with measured data upon completion. See Figure 3.10 and Figure 3.11 as examples of each test parameter.

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Figure 3.10: Sample Output Spectrum – 20dB Bandwidth

Figure 3.11: Adjacent Channel Power


RF Tests 3.8 Bluetooth Loopback Test Using the Anritsu Bluetooth Test Set

The procedures outlined in this section are specific only to the Anritsu Bluetooth Test Set (MT8850A/MT8852A). This loopback tester will measure the following Bluetooth test parameters per the Bluetooth specification.

TRM/CA/01/C Output Power TRM/CA/03/C Power Control TRM/CA/07/C Modulation Characteristics TRM/CA/08/C Initial Carrier Frequency Tolerance TRM/CA/09/C Carrier Frequency Drift RCV/CA/01/C Sensitivity: Single Slot Packets RCV/CA/02/C Sensitivity: Multi Slot Packets RCV/CA/06/C Maximum Input Power Level

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3.8.1 Test Set-up

Connect the antenna pig-tail connector of the Bluetooth module to the Anritsu tester.

BTCLI Set-up

1. Close any open BlueTest and/or PSTool utilities.

2. Start BTCLI with the appropriate transport (i.e., BCSP, USB or H4), COM port and baud rate.

3. If it returns nop in the DOS window, then connection is successful.

If connection is unsuccessful, verify that connection and transport method are correctly selected.

4. In a DOS window, type edutm to put the module into DUT mode.

5. In a DOS window, type slave to put the module into discoverable mode.

Anritsu MT8850A/MT8852A Set-up

1. Press Scpt/Test key for script menu.

2. Select List for list of stored scripts.

3. Using arrow keys, scroll and select Script 2 – FULLTEST using the Sel key.

4. Press Run to start testing and wait for testing to complete.

If testing does not start, press Inquiry, then Update to obtain the DUT Bluetooth address.

5. Upon successful test completion, the tester will return either a P or F next to the test.

6. Press Results to view the test results.

7. Further test data can be viewed using the Extended softkey.

8. To return back to the main menu, press Scpt/Test or Back key.

Note: If the Anritsu BlueSuite software application (different from CSR’s BlueSuite) is installed, the tests listed in section 3.8 can be automated and the test results can be exported to a PC.


Test Report Templates

4 Test Report Templates 4.1 General RF Tests Using Spectrum Analyser

Test Case Freq (Channel) Spec Result

2402MHz (CH 0)

2441MHz (CH 39) TRM/CA/01/C Output Power 2480MHz (CH 78)

Class 1: PAV > 6dBm Class 2: -6dBm < PAV < 4dBm Class 3: PAV < 0dBm

2402MHz (CH 0) ≤ -24dBc 2441MHz (CH 39) LO Leakage 2480MHz (CH 78)

2402MHz (CH 0) 2441MHz (CH 39)

Close-In Sideband Suppression (RF Coupling) 2480MHz (CH 78)

≤ -4dBc

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4.2 RF Loopback Test Using Spectrum Analyser Bluetooth Personality


2402MHz (CH 0)

2441MHz (CH 39) TRM/CA/01/C Output Power 2480MHz (CH 78)


2402MHz (CH 0) 2441MHz (CH 39)

TRM/CA/05/C TX Output Spectrum – 20dB Bandwidth 2480MHz (CH 78)

| fH – fL | ≤ 1MHz

2402MHz (CH 0) 2441MHz (CH 39)

TRM/CA/06/C Adjacent Channel Power 2480MHz (CH 78)

PTX ≤ -20dBm for | fC – fAdjCh | = 2

PTX ≤ -40dBm for | fC – fAdjCh | ≥ 3

2402MHz (CH 0)

2441MHz (CH 39) TRM/CA/07/C Modulation Characteristics

2480MHz (CH 78)

140kHz ≤ Δf1avg ≤ 175kHz

Δf2avg ≥ 115kHz

(Δf2avg / Δf1avg ) ≥ 0.8

2402MHz (CH 0) 2441MHz (CH 39)

TRM/CA/08/C Initial Carrier Frequency Tolerance 2480MHz (CH 78)

fTX – 75kHz ≤ fo ≤ fTX + 75kHz

2402MHz (CH 0) 2441MHz (CH 39)

TRM/CA/09/C Carrier Frequency Drift 2480MHz (CH 78)

Drift Rate ≤ ±20kHz / 50µs 1 Slot Freq Drift ≤ ±25kHz 3 and 5 Slot Freq Drift ≤ ±40kHz

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4.3 RF Loopback Test Using Anritsu Bluetooth Tester


2402MHz (CH 0) 2441MHz (CH 39) Output Power 2480MHz (CH 78)


2402MHz (CH 0) 2441MHz (CH 39) Power Control 2480MHz (CH 78)

2dB ≤ step size ≤ 8dB

2402MHz (CH 0) 2441MHz (CH 39) Modulation

Characteristics 2480MHz (CH 78)

140kHz ≤ Δf1avg ≤ 175kHz

Δf2max ≥ 115kHz

(Δf2avg / Δf1avg ) ≥ 0.8

2402MHz (CH 0) 2441MHz (CH 39)

Initial Carrier Frequency Tolerance 2480MHz (CH 78)

fTX – 75kHz ≤ fo ≤ fTX + 75kHz

2402MHz (CH 0)

2441MHz (CH 39) Carrier Frequency Drift

2480MHz (CH 78)

Drift Rate ≤ ±20kHz / 50µs

1 Slot Freq Drift ≤ ±25kHz

3 and 5 Slot Freq Drift ≤ ±40kHz

2402MHz (CH 0) 2441MHz (CH 39) Sensitivity: Single Slot Packets 2480MHz (CH 78)

For BER of 0.1%, PRX ≤ -70dBm

2402MHz (CH 0) 2441MHz (CH 39) Sensitivity: Multi Slot Packets 2480MHz (CH 78)

For BER of 0.1%, PRX ≤ -70dBm

2402MHz (CH 0) 2441MHz (CH 39) Maximum Input Power Level 2480MHz (CH 78)

For BER of 0.1%, PRX ≥ -20dBm

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4.4 Miscellaneous Test Cases

Test Case Parameter Spec Result

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Document References

5 Document References Document Reference

Specification of the Bluetooth System V1.1, 22 February 2001 and v1.2, 05 November 2003 _äìÉ`çêÉ

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Terms and Definitions

Terms and Definitions ACP Adjacent Channel Power BCCMD BlueCore Command BCSP BlueCore Serial Protocol

BlueCore™ Group term for CSR’s range of Bluetooth wireless technology chips

BlueSuite™ Suite of development tools that contains all of the BlueCore utilities. BlueSuite includes BlueChat2, BlueFlash, PSTools, BlueTest and BTCLI

BlueTest Software for executing BlueCore’s Built In Self Test functions. Program that controls the on chip BIST software for RF testing Bluetooth® Set of technologies providing audio and data transfer over short-range radio connections BTCLI Bluetooth Command Line Interface Casira™ CSR’s main Bluetooth development hardware CSR Cambridge Silicon Radio DUT Device Under Test I/O Input/Output H4 UART-based HCI transport, described in section of H4of v1.0b of Bluetooth specification LO Local Oscillator nop No Operation PCB Printed Circuit Board RF Radio Frequency RBW Resolution BandWidth SPI Serial Peripheral Interface UART Universal Asynchronous Receiver Transmitter USB Universal Serial Bus VBW Video BandWidth VCO Voltage Controlled Oscillator

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Document History

Document History Revision Date History

a 15 SEP 05 Original publication of this document. (CSR reference: bcore-ug-013Pa) _äìÉ`çêÉ

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_äìÉ`çêÉ»=

RF Module Characterisation

Test Procedures

bcore-ug-013Pa

September 2005

Unless otherwise stated, words and logos marked with ™ or ® are trademarks registered or owned by Cambridge Silicon Radio Limited or its affiliates. Bluetooth® and the Bluetooth logos are trademarks owned by Bluetooth SIG, Inc. and licensed to CSR. Other products, services and names used in this document may have been trademarked by their respective owners.

The publication of this information does not imply that any license is granted under any patent or other rights owned by Cambridge Silicon Radio Limited.

CSR reserves the right to make technical changes to its products as part of its development programme.

While every care has been taken to ensure the accuracy of the contents of this document, CSR cannot accept responsibility for any errors.

CSR’s products are not authorised for use in life-support or safety-critical applications.


1 Introduction 1.1 Bluetooth Module Set up 1.2 Required Test Equipment 1.3 Miscellaneous Notes 2 Test Set up 2.1 Hardware Configuration 2.2 Software Configuration 2.2.1 PSTool Set up 2.2.2 BlueTest Set up

3 RF Tests 3.1 Close-In Phase Noise (Crystal Trim) 3.1.1 Test Set up 3.1.2 Procedure

3.2 RF Output Power 3.2.1 Test Set up 3.2.2 Procedure

3.3 LO Leakage / LO Suppression 3.3.1 Test Set up 3.3.2 Procedure

3.4 Close-In Sideband Suppression: RF Coupling 3.4.1 Test Set up 3.4.2 Procedure

3.5 Receiver Sensitivity and Bit Error Rate 3.5.1 Test Set up 3.5.2 Procedure

3.6 Bluetooth Loopback Test Using Spectrum Analyser, Part 1 3.6.1 Test Set up 3.6.2 Procedure

3.7 Bluetooth Loopback Test Using Spectrum Analyser, Part 2 3.7.1 Test Set up 3.7.2 Procedure

3.8 Bluetooth Loopback Test Using the Anritsu Bluetooth Test Set 3.8.1 Test Set up

4 Test Report Templates 4.1 General RF Tests Using Spectrum Analyser4.2 RF Loopback Test Using Spectrum Analyser Bluetooth Personality4.3 RF Loopback Test Using Anritsu Bluetooth Tester4.4 Miscellaneous Test Cases

5 Document References Terms and DefinitionsDocument History

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