S. Dasu, University of Wisconsin September 2003 - 1

Regional Calorimeter TriggerRegional Calorimeter TriggerRegional Calorimeter TriggerRegional Calorimeter Trigger

Outline:Status of PrototypesPlans for Production TestingPlans for Integration, Chain and Slice TestsSchedule and Milestones

RCT Personnel:Faculty: S. Dasu, W. H. Smith

Physicists: P. Chumney, Monika Grothe (New)

Students: C. Hogg (UG)

Engineers: T. Gorski (Lead Engineer), M. Jaworski, P. Robl (Physical Sciences Laboratory),J. Lackey (Retired, July 2003)

Technician: R. Fobes

S. Dasu, University of Wisconsin September 2003 - 2

AlgorithmsAlgorithmsAlgorithmsAlgorithms

S. Dasu, University of Wisconsin September 2003 - 3

OverviewOverviewOverviewOverview

S. Dasu, University of Wisconsin September 2003 - 4

Calorimeter GeometryCalorimeter GeometryCalorimeter GeometryCalorimeter Geometry

EB, EE, HB, HE map to 18 RCT crates

Provide e/ and jet, ET triggers

S. Dasu, University of Wisconsin September 2003 - 5

Trigger MappingTrigger MappingTrigger MappingTrigger Mapping

S. Dasu, University of Wisconsin September 2003 - 6

160 MHz point to point backplane (prototype tested)• 18 Clock&Control (prototype tested), 126 Electron ID (prototype tested),

18 Jet/Summary Cards -- all cards operate @ 160 MHz• Use 5 Custom Gate-Array 160 MHz GaAs Vitesse Digital ASICs

• Phase, Adder, Boundary Scan, Electron Isolation, Sort (manufactured)

Calorimeter Trigger CrateCalorimeter Trigger CrateCalorimeter Trigger CrateCalorimeter Trigger Crate

Spares not included*

Data from calorimeter FE on Cu links@ 1.2 Gbaud

•Into 126Into 126* * rearrearReceiverReceiverCardsCards

•PrototypePrototypetestedtestedw/ ASICsw/ ASICs

S. Dasu, University of Wisconsin September 2003 - 7

First Full RCT CrateFirst Full RCT CrateFirst Full RCT CrateFirst Full RCT Crate18 Such Crates make up the full RCT System covering ||<5 & 0 < < 2.

Rear: Receiver Cards Front: Electron, Jet, Clock Cards

S. Dasu, University of Wisconsin September 2003 - 8

FrontFront RearRear

Std.VMESlots

Second Generation Crate & BackplaneSecond Generation Crate & BackplaneSecond Generation Crate & BackplaneSecond Generation Crate & Backplane

160 MHz with 0.4 Tbit/sec dataflow (point-to-point)• Tests indicate good signal quality

Designed to incorporate all algorithms• Non-Isolated Electron, Tau & Jet Trigger primitives

Most data paths checked manually and with JTAG, and with loop-back cables.

VME Power Supply

CustomPoint-to-point

Dataflow

VME

48V externally supplied

CustomPoint-to-point

Dataflow

S. Dasu, University of Wisconsin September 2003 - 9

Second Generation Clock & Control CardSecond Generation Clock & Control CardSecond Generation Clock & Control CardSecond Generation Clock & Control Card

Fans out 160 MHz clock & adjusts phase to all boards

Design validated - With small changes, layout and routing of production version completed - Ready for full production.

DC-DCConverters

Clock delay adjust

S. Dasu, University of Wisconsin September 2003 - 10

Second Generation Receiver CardSecond Generation Receiver CardSecond Generation Receiver CardSecond Generation Receiver Card

Top side with 1 of 8 mezzanine cards & 2 of 3 Adder ASICs

DC-DC

Addermezzlink

cards

BSCANASICs

PHASEASICs

MLUs

Bottom side with all Phase& Boundary Scan ASICs

Full featured board & Phase, Boundary Scan & Adder ASICS fully validated. Production Started (ASIC production finished).Eight Boards built and tested in full crate test.Full quantity of mezzanine link cards (1422) are manufactured.

S. Dasu, University of Wisconsin September 2003 - 11

RCT 4 x 1.2 Gbaud CopperRCT 4 x 1.2 Gbaud CopperLink Cards & Serial Test CardLink Cards & Serial Test Card

RCT 4 x 1.2 Gbaud CopperRCT 4 x 1.2 Gbaud CopperLink Cards & Serial Test CardLink Cards & Serial Test Card

Compact Mezzanine

Cards for each

Receiver Card accept

4 x 20 m 1.2-Gbaudcopper pairs transmitting

2 cal. tower energies every 25 ns with low cost & power.

Uses Vitesse Link Chips (7216-01).

Final Serial Link Test Card (STC)

Status: Already commissioned, cables, cards, 48V PS, and support

software, delivered to CERN in March, operating in ECAL

Electronics lab stably with no errors for months.

Delivered to Princeton for HCAL tests in June and operating stably

with no errors since.Two pairs in use @ UW for testing

receiver mezzanine cards.

S. Dasu, University of Wisconsin September 2003 - 12

Second Generation Second Generation Electron Isolation CardElectron Isolation Card

Second Generation Second Generation Electron Isolation CardElectron Isolation Card

Full featured final prototype board is fully validated - production underway8 boards made and tested as part of full crate test.Electron ID & Sort ASICs validated and production complete

SORTASICs

EISO

EISO

S. Dasu, University of Wisconsin September 2003 - 13

Jet/Summary CardJet/Summary CardJet/Summary CardJet/Summary Card

Full function prototype manufactured and tested.• Uses SORT ASICs to find top four e/, threshold for muon bits, both to GCT• Region energies to GCT• Absorbs HF functionality with Rec. Mezz. Card, HF sent to GCT.• Integration test with GCT Done - Change in termination - Production to start shortly

ReceiverMezz. Card

SortASICs

CablesTo GCT

Backplane:Two e/ per region.Region ET

SumsBSCANASICs BSCAN

ASICs

PhaseASIC

S. Dasu, University of Wisconsin September 2003 - 14

RCT Test SuitesRCT Test SuitesRCT Test SuitesRCT Test Suites

Receiver Card (~150)• Cycle memory at speed - all paths beyond Phase ASIC exercised

• JTAG to test some circuits in detail

• A fraction of inputs (4 - 8) from STC transmitters

• Covers full data path

Electron Isolation Card (~150)• Input by cycling RC memories

• Multiple cards (corner data by loop back cables)

• JTAG to test some circuits in detail

Jet/Summary Card (~20)• Input by cycling RC memories

• Full crate with RCs + EICs used

• HF path test using STC transmitter

• Output to Jet Capture Card for testing (in design)

S. Dasu, University of Wisconsin September 2003 - 15

Software WorkSoftware WorkSoftware WorkSoftware Work

Crate Processor Hardware & Software• Present status: Old MVME Processor and software• Needs replacement by new CMS Compatible System

• New Hardware & New Software

Software for debugging production boards• Developing diagnostics software for each board• Ship data for analysis outside crate processor

• Use tools well known to physicists

Final software (in XDAQ) - Design work beginning• Want to reuse as much of test software as possible

• Need to add CMS Interfaces• Software will be integrated with CMS Online code for operations

• Monitoring/controls, diagnostics, configuration downloading and documentation, modeling, physics simulation, etc.

Personnel• P. Chumney, S. Dasu, M. Grothe

S. Dasu, University of Wisconsin September 2003 - 16

Production Testing Tasks:Production Testing Tasks:2003 - 20052003 - 2005

Production Testing Tasks:Production Testing Tasks:2003 - 20052003 - 2005

Testing software• VME Code + Conversion to SBS - S. Dasu, P. Chumney• RC & EIC Test Suites (JTAG…) well underway - P. Chumney• Jet/Summary Output verification code - M. Grothe• Integration of test software in XDAQ - P. Chumney, M. Grothe

Mezzanine cards (2003)• 4 months to test ~1400 cards - M. Jaworski & M. Grothe

Full Board Production & Test (2004-2005):• ~ 150 each Receiver & Electron Cards, ~ 20 each Jet, Clock Cards,

Backplanes & Crates need testing - All • Repair & Inventory - R. Fobes

Test full crates for delivery (2005)• 1 year for testing full complement of crates - all• Use custom card to capture output of J/S - Jet Capture Card -

Under design - T. Gorski• Provides trigger for slice test

S. Dasu, University of Wisconsin September 2003 - 17

Integration and Chain TestsIntegration and Chain TestsIntegration and Chain TestsIntegration and Chain TestsIntegration Tests (2003)

• Serial Test Cards for input link tests• 1 pair at CERN for ECAL integration since March.• 1 pair at Princeton for HCAL integration since June.

• Remaining 6 are being used for receiver mezzanine card production testing at UW

• Will be reused to pump data to RCT for full test (2005)

• Pre-production Prototype Full Crate tests• Global Calorimeter Trigger (Bristol group) integration at

Madison in August is successful - Termination scheme agreed - Minor changes to UW JSC and Bristol IC

Integration Tests (2004)• Augment above tests with additional electronics from

ECAL, HCAL, & GCT groups as becomes available.• Initiate Slice Test

S. Dasu, University of Wisconsin September 2003 - 18

Slice Tests and Trigger CommissioningSlice Tests and Trigger CommissioningSlice Tests and Trigger CommissioningSlice Tests and Trigger Commissioning

Slice Tests (Starting Late Summer 2004)• Use full crate of tested production boards

• Will remain at CERN as spare boards and crate• JSC Output Capture Card provides test trigger• Personnel:

• M. Grothe moves to CERN, assisted with visits by others

Trigger Commissioning (Starting April, 2005)• All eighteen crates - fully tested and shipped to CERN

• All electronics rechecked in electronics test facility• Full commissioning underground in USC55• Personnel:

• When production finishes, P. Chumney moves to CERN to join M. Grothe, assisted with visits by others.

S. Dasu, University of Wisconsin September 2003 - 19

RCT ConclusionsRCT ConclusionsRCT ConclusionsRCT ConclusionsRegional Calorimeter Trigger

• All pre-production prototype boards and ASICs built & validated

• All boards, ASICS, & crates are either produced, in production or about to start production

• Integration tests w/ECAL,HCAL, GCT have started

Very good progress, but…• Major work from now on:

• Production Testing of ~1800 Boards• Software Development - Integration with XDAQ• Slice Test Preparation + Software• Installation and Commissioning• Operations!

We have the team in place to do the job!