Protocol Test Systems VIII

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Protocol Test Systems VIII Proceedings of the IFIP WG6.1 TC6 Eighth International Workshop on Protocol Test Systems, September 1995

Edited by

Ana Cavalli and Stan Budkowski Institut National dl!s Telecommunications Evry France

lunl SPRINGER-SCIENCE+BUSINESS MEDIA, B.v.

First edition 1996

© 1996 Springer Science+Business Media Dordrecht Originally published by Chapman & HalI in 1996

ISBN 978-1-4757-6312-6 ISBN 978-0-387-34988-6 (eBook) DOI 10.1007/978-0-387-34988-6

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CONTENTS

Preface

Program Committee

List of Referees

PART ONE Testing Methods

Invited lecture

1 Testing through the ages A. T. Dahbura

2 An executable protocol test sequence generation method for EFSM­specified protocols C.-M. Huang, f.-c. Lin and M.-f. lang

3 Transformation of Estelle modules aiming at test case generation 0. Henniger, A. Ulrich and H. Konig

PART TWO Test Environments

4 Application of a LOTOS based test environment on AAL5 l. Burmeister and A. Rennoeh

5 Stable testers for environment sensitive systems M. Ghriga

PART THREE Theoretical Framework

6 Timed systems behaviour and conformance testing - a mathematical framework B. Baumgarten

7 An adaptative test sequence generation method for the users needs R. Castanet, C. Chevrier, O. Kone and B. Le Saee

8 A framework for testing telecommunication services G. Vermeer, M. Wittemen and l. Kroon

PART FOUR Algorithms and Languages

9 Conformance testing of protocols specified as labeled transition systems P. V. Koppol and K. C. Tai

10 1\vo approaches linking test generation with verification techniques M Ciatin, R Groz, M Phalippou and R. Thummel

ix

x

xii

3

5

20

36

53

55

71

87

89

105

121

133

135

151

vi Contents

11 PROSPECT - a proposal for a new test specification language and its implementation T. Walter and B. Plattner 167

PART FIVE Test Generation 1 185

12 Test sequence generation for adaptive interoperability testing S. Kang and M. Kim 187

13 Fault-tolerant UIO sequences in finite state machines K. Naik 201

14 Guaranteeing full fault coverage for UIO-based testing methods R. Anido andA. Cavalli 215

PART SIX Testability 233

Invited lecture 235

15 Towards testable communication software R. Dssouli, K. Karoui, A. Petrenko and O. Rafiq 237

16 Design for testability of protocols based on formal specifications MC Kim, s.T. ChansonandS. Yoo 252

17 On the design for testability of communication protocols N. Yevtushenko, S. Prokopenko, A. Petrenko, R. Dssouli and K. Karoui 265

PART SEVEN Test Generation 2 281

18 A unified test case generation method for the EFSM model using context independent unique sequences T. Ramalingom, A. Das and K. Thulasiraman 283

19 Handling redundant and additional states in protocol testing A. Petrenko, T. Higashino and T. Kaji 300

PART EIGHT Industrial Applications 317

20 Experiences with the design ofB-ISDN integrated test system (BITS) K.Y. Kim, WS. Kim and B.K. Hong 319

21 The testing of BTs intelligent peripheral using abstract test suites from ETSI N. Webster 329

22 Design of intelligent OSI protocol monitor T. Ogishi, A. ldoue, T. Kalo and K. Suzuki 342

23 Management and maintenance of TTCN abstract test suites P.-Y. Danet and E. Desecures 358

PART NINE Distributed Testing and Performance 367

24 Port-synchronizable test sequences for communication protocols K. C. Tai and Y. C. Young 369

25 Synchronizable and checking sequences based on UIO sequences S. Guyot and H. Ural 385

Contents

26 Specification-driven performance monitoring of SDUMSC-specified protocols P. Dauphin, W. Dulz and F. Lemmen

PART TEN Test Management

27 Test management and TTCN based test sequencing J. Tian and J. Wu

28 Towards a 'practical formal method' for test derivation R.L. Probert and L. Wei

Index of contributors

Keyword index

vii

398

415

417

433

449

450

PREFACE

IWPTS'95 (International Workshop on Protocol Test Systems) is being held this year at !NT (Institut National des Telecommunications), Evry, France, from 4 to 6 September, 1995. IWPTS'95 is the eighth of a series of annual meetings sponsored by the IFIP Working Group WG6.1 dedicated to "Architecture and Protocols for Computer Networks". The seven previous workshops were held in Vancouver (Canada, 1988), Berlin (Germany, 1989), Mclean (USA, 1990), Leidschendam (The Netherlands, 1991), Montreal (Canada, 1992), Pau (France, 1993) and Tokyo (Japan, 1994).

The workshop is a meeting place where both research and industry, theory and practice come together. By bringing both researchers and practitioners together, IWPTS opens up the communication between these groups. This helps keep the research vital and improves the state of the practitioner's art.

Forty-eight papers have been submitted to IWPTS'95 and all of them have been reviewed by the members of the Program Committee and additional reviewers. The completed reviewers list is included in this Proceedings. Based on these reviews, the Program Committee selected 26 for oral presentation and 4 to be presented as posters. Two specially invited papers complete the Workshop Program, which is composed of ten sessions: Testing Methods (Session 1), Test Environments (Session 2), Theoretical Framework (Session 3), Algorithms and Languages (Session 4), Test Generation 1 (Session 5), Testability (Session 6), Test Generation 2 (Session 7), Industrial Applications (Session 8), Distributed Testing and performance (Session 9) and Test Management (Session 10).

IWPTS'95 includes a special session organized by the project COST 247, a European Research Action on verification and validation methods for formal descriptions. The special session is focused on the work developed on conformance testing by some of the participants to this project.

IWPTS'95 has received financial support from the European Commission to help researchers and students from Central and Eastern European countries to participate in the workshop. These stipends cover registration fees and/or subsistence and/or travel expenses.

IWPTS'95 could not take place without the effort of a great many individuals and organizations. The editors wish to thank all of them. In particular, we would like to thank our colleagues of INT: Michel Andrieu, Yves Dumont, Marie-Laure Feral, Hacene Fouchal, Marla Guilbert, Barbara Huc, Toma Macavei, Michel Marty, Luiz Paula-Lima, Louis Rambaud, Serge Robinson, Jocelyne Vallet.

Evry, September 1995

Ana Cavalli Stan Budkowski

PROGRAM COMMITTEE

Bernd Baumgarten, GMD-Darmstadt, Germany

Gregor von Bochrnann, Universite de Montreal, Canada (confirme)

Ed Brinskma, University of Twente, The Netherlands

Richard Castanet, Universite de Bordeaux, France

Samuel Chanson, University of HongKong, HongKong (confirme)

B. Chin, ETRI, Korea (confirme)

Anton Dahbura, Motorola, USA

Rachida Dssouli, Universite de Montreal, Canada

Jean-Philippe Favreau, NIST, USA

Roland Groz, CNET, France

Teruo Higashino, University of Osaka, Japan (confirme)

Dieter Hogrefe, University of Bern, Switzerland

Sung-Un Kim, Korea Telecom, Korea

Jan Kroon, P1T Research, The Netherlands

Gang Luo, University of Ottawa

Jan de Meer, GMD-Fokus, Germany (confirme)

Raymond E. Miller, University of Maryland, USA

Jose Manas, Technical University of Madrid,Spain

Tadanori Mizuno, University Shizuoka, Japan

Alexandre Petrenko, IECS, Latvia (confirme)

Program Committee

Marc Phalippou, CNET, France (continne)

Omar Rafiq, Universite de Pau, France (confinne)

Pierre de Saqui-Sannes, ENSICA, France (confinne)

Behcet Sarikaya, The University of Aizu, Japan

Nori Shiratori, Tohoku University, Japan

Katie Tamay, KFKI, Hongary

Jan Tretmans, ERCIM, The Netherlands (continne)

Hasan Ural, University of Ottawa, Canada

Son T. Vuong, University of British Columbia, Canada (confmne)

Jianping Wu, Tsinghua University, China

xi

B. Algayres R. Anido B. Baumgarten O. BelIal B. Bista B. G.v. Bochmann L. Boullier E.Brinksma R. Castanet S.T. Chanson O. Charles B.Chin M. Clatin G. Csopaki A. Dahbura P. De Saqui-Sannes K. Drira R. Dssouli H. Eertink A. Ezust I-P. Favreau D. de Frutos A. Giessier K.Go G. Grabowski R. Groz S.Guyot L. Heerink O. Henniger M.Higuchi G. Huecas K.Kasama A. Khoumsi I. Khriss G.Leduc G.Luo

LIST OF REFEREES

P. Maigron I.A. Manas I. de Meer 1. Miskolczi M.Mori A.Nakata N. Okazaki L.A. de Paula Lima A. Peeters A. Petrenko M. Phalippou O.Rafiq A.Rennoch N. Risser R.Roth H.Rudin I.Sanz B. Sarikaya F. Sato R. Scheurer G. Schoemakers I. Schubert K. Tamay MJ.A. Tesselaar 1. Tretmans A. Ulrich H. Ural M.U. Uyar M. VanEssen G. Venneer S. Vuong H. Wiland K. Yasumoto N. Yevtushenko S.Zhang I.Zhu