pragmatic device risk management

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www.inea.com [email protected] Boston: 100 Lowder Brook Drive, Suite 2500, Westwood, MA 02090 T: (781)801- 1100 Chicago: 475 Half Day Road, Suite 110, Lincolnshire, IL 60069 Pragmatic Medical Device Risk Management Current Problems and Solutions David A. Vogel, Ph.D. – President Intertech Engineering Associates, Inc. Aimee Raymond – Principal Quality Engineer Cordis ® - a Johnson & Johnson company © 2013 – Intertech Engineering Associates, Inc. sponsored by

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In this presentation, which was recorded at the 2013 Medical Devices Summit West in San Francisco, David Vogel of Intertech Engineering and Aimee Raymond of Cordis discuss some current problems and solutions in medical device development, including how to: - Manage the real hierarchy of harms, hazards, and causes - Prioritize and manage risk - Implement traceability to ensure risk controls have been implemented correctly - Deal with overall risk assessment and residual risk

TRANSCRIPT

Page 1: Pragmatic Device Risk Management

www.inea.com [email protected]

Boston: 100 Lowder Brook Drive, Suite 2500, Westwood, MA 02090 T: (781)801-1100Chicago: 475 Half Day Road, Suite 110, Lincolnshire, IL 60069 T: (773)915-2290

Pragmatic Medical Device Risk Management Current Problems and Solutions

David A. Vogel, Ph.D. – President – Intertech Engineering Associates, Inc.

Aimee Raymond – Principal Quality Engineer – Cordis® - a Johnson & Johnson company

© 2013 – Intertech Engineering Associates, Inc.

sponsored by

Page 2: Pragmatic Device Risk Management

• David Vogel, Ph.D.President and FounderIntertech Engineering Associates, Inc.Dave has been helping medical device companies bring quality products to market for over 30 years, with a 100% safety record with his company. He has participated in joint AAMI/FDA workgroups to develop standards for validation and risk management, like IEC 62304, TIR32:2004, and TIR36:2007. As an AAMI instructor and respected industry expert, he was named by MD&DI magazine as one of the “100 Notable People in the Medical Device Industry” in 2008.

Dave published “Medical Device Software: Verification, Validation, and Compliance” in late 2010, which is considered a must-read by most in the medical device industry, especially since it’s much easier to read and understand than our government regulations and recommendations.

• Aimee RaymondPrincipal Quality EngineerCordis® - a Johnson & Johnson companyAs a Bay-area professional with over 20 years of experience in product development and systems engineering, Aimee has helped bring many medical products to market with an emphasis on good processes and strong quality control. Armed with a Six Sigma Black Belt, she has been successful with deriving  requirements and driving them to measurable data points for better decision making in the development of her projects. As part of her current role at Cordis, she has implemented an integrated and traceable solution for design and risk control.

Aimee recently received a Masters of Science in Systems Engineering.

About Speakers

© 2013 – Intertech Engineering Associates, Inc.

Page 3: Pragmatic Device Risk Management

More detail …

3© 2013 – Intertech Engineering Associates, Inc.

Much of the content of this talk is covered in more detail in Chapters 8 and 18 of this textbook.

For more information, see www.validationtext.com

Page 4: Pragmatic Device Risk Management

Zoom Out on Risk Management

• Do we as an industry really know what we are doing with Risk Management?

• With all the regulatory “help”, standards, technical information reports, guidances, webinars, workshops … has the industry really improved?

© 2013 – Intertech Engineering Associates, Inc.

Page 5: Pragmatic Device Risk Management

Why Formal Risk Managementis Needed

1. As a design and development tool

2. As a focus for continued post-market attention to RM

3. As a communication tool

a. Internally

b. With regulators

Which of these makes the devices safer?

Which are necessary for compliance?

Which do many companies worry about more?

© 2013 – Intertech Engineering Associates, Inc.

Page 6: Pragmatic Device Risk Management

Many Types of Risk

• Safety Risk

• Business Risk– Project Risk– Sales and Marketing Risk– Image and Reputation Risk

• Regulatory Risk

© 2013 – Intertech Engineering Associates, Inc.

Page 7: Pragmatic Device Risk Management

Risk Hierarchy

14971 Standard defines or mentions:– Risk– Hazard– Hazardous Situation– Cause

Real projects easily identify complex hierarchies that don’t fit these definitions

© 2013 – Intertech Engineering Associates, Inc.

Page 8: Pragmatic Device Risk Management

Requirements & Risk Work Together

Requirement management drives product development

User Needs/Intended Use [UR]-> Product Requirements [DI] -> Detail Design Specification [DO] -> PRC, DWG, BOM, DOC (code)

Risk management asks what happens if the requirement is not satisfied

Page 9: Pragmatic Device Risk Management

Typical Requirement Cascade

Requirement Document

Sample Requirement

Intended Use to improve long-term vascular patency following angioplasty by releasing drug locally into the vessel wall to inhibit neointimal hyperplasia.

User Requirement [UR]

Stent reservoirs must contain similar drug API dosage as current marketed product.

Product Requirement [DI]

Provide API drug dose of X.X µg/mm2

Detail Design [DO] Every reservoir contains Y.YYY µg of drug.API concentration in drug solution shall be ZZ%

Process Spec [PRC]

Deposit X layers of drug solution.Place Y to Z drops of drug solution per reservoir per layer.

Page 10: Pragmatic Device Risk Management

Risks Cascade via Cause & Effect

RequirementDocument

Risk Document

Links To Effect

Links From Cause

ExampleEffect

Example Cause

IFU Harms list Patient harmed

Not (UR) Increase in neo hyperplasia

Not X.X µg/mm2

User Need (UR)

aFMEA Not (UR) Not (DI) Not X.X µg/mm2 drug

Not Y.YY µg/reservoir

Prod Req (DI) dFMEA Not (DI) Not (DO) Not Y.YY µg/reservoir

Bad seal

Detail Design (DO)

pFMEA Not (DO) Not (PRC) Bad seal Open crimps

Process Spec (PRC)

Control Plan Not (PRC) Not (RCM) Open crimps Crimp force < Z.z

Controls (RCM)

Not(RCMl) Crimp force < Z.z

Wrong pin gage

Page 11: Pragmatic Device Risk Management

Advanced RM ToolsMake it Happen in Real-Time

Configure the Requirement Types, Custom Data Fields and the Link Types

Page 12: Pragmatic Device Risk Management

Lack of Requirements Corrupts

Without requirements, then nothing to trace

Between requirement types To testing To risks & issues To changes

Risks are another type of requirement Traces are the glue holding the system

together

Page 13: Pragmatic Device Risk Management

Questions for You

Has anyone ever heard of someone “fudging” the risk priority numbers?

Why do “they” do that?

Maybe something is wrong with the way we prioritize risks

© 2013 – Intertech Engineering Associates, Inc.

Page 14: Pragmatic Device Risk Management

The FMEA Model is Overused

• Risk = “combination of Severity (S) and Probability (P)”

• Often Detectability (D) also included

• Quantitative FMEA calculates Risk Priority Number (RPN) as

RPN = S x P x f(D)

• Risk controls are prioritized based on RPN

© 2013 – Intertech Engineering Associates, Inc.

Page 15: Pragmatic Device Risk Management

What’s Wrong with Severity?

Common Severity Scale1. Discomfort

2. Reversible Injury

3. Permanent Injury

4. Death

Scaling is linearIf you would pay me $1 not to pinch you (discomfort), would you only pay me $4 not to kill you?

© 2013 – Intertech Engineering Associates, Inc.

Page 16: Pragmatic Device Risk Management

What’s Wrong with Probability?

• Historically used for probability of process failure, mechanical failure, electrical failure, where probability has real meaning based on measurements or experience.

• Design failure (esp. software) is the probability that the engineer made a mistake … what kind of number do we put on that?

© 2013 – Intertech Engineering Associates, Inc.

Page 17: Pragmatic Device Risk Management

Detectability

• Holdover from Process FMEA, with built in assumption that trained process operators know remedial action upon detection.

• Very often misapplied to devices– Detectability is worthless unless a corrective

risk control is triggered in response.– A car rolling over a cliff is

highly detectable, but …

© 2013 – Intertech Engineering Associates, Inc.

Page 18: Pragmatic Device Risk Management

Risk Quantification Templates

Templates for Probability of Occurrence (Po) and Consequence of Occurrence (Co)

Consequence of Occurrence

Low Minor Moderate Significant High

Product Performance Impact

No illness or injury to patient or user (inconvenience; delay to start; procedure was successful, but slow to perform).

May cause transient self-limiting illness or injury to patient or user (fever, bruise, or other condition not requiring medical intervention).

May cause significant but recoverable injury to patient or user (allergic reaction, or other condition requiring medical intervention).

May cause permanent impairment to patient or user (loss of limb or bodily function).

Potential for death. Failure in the device or the procedure can lead to patient or user death.

Regulatory Impact

Potential for issue resolvable with normal quality system procedures.

Potential for minor deficiency or violation of quality system.

Potential for regulatory warning, product deemed misbranded or adulterated.

Potential for significant regulatory observation, including warning letter

Potential recall regardless of clinical severity. Potential adverse impact to regulatory status of product

Schedule Impact Impact to project critical path < 1 month

Impact to project critical path >= 1 month

Impact to project critical path >= 3 months

Impact to project critical path >= 6 months

Impact to project critical path >= 12 months

Cost Impact Cost variance < 10% or < 0.1M USD of total budget

Cost variance >= 10% or >= 0.1M USD of total budget

Cost variance >= 20% or >= 1M USD of total budget

Cost variance >= 50% or >= 5M USD of total budget

Cost variance >= 100% or >= 10M USD of total budget

Probability of Occurrence

A B C

Probability of Root Cause Occurring

Likely Maybe Remote

Page 19: Pragmatic Device Risk Management

Risk Scoring Matrix

Customize Risk Quantification templates Risk Score Matrix based on Probability of

Occurrence (Po) and Consequence of Occurrence (Co)

ConsequenceProbability

A B C

Low 1 1 2

Minor 1 2 3

Moderate 2 3 4

Significant 3 4 4

High 3 4 5

High

Moderate

Low

Page 20: Pragmatic Device Risk Management

How Do You Know You Have Addressed All Risks in Your Device

Risk Management Process is effective in planning risk controls

How can you know that the controls have been implemented … correctly

Traceability can be the answer. How is that implemented?

Page 21: Pragmatic Device Risk Management

Integrated RM Tools Give Visibility

Apply Risk Score to each hazard Consider number of “AND” conditions Apply Bayes’ Theorem of conditional probabilities

Shaft Breaks

Higher tensile force required to retract

shaft

High friction btwn shaft and SR

Lack of lubrication

Tight tolerances

btwn shaft & SR

High coef of friction, SR

High coef of friction, shaft

Additional forces applied to shaft by

user

Pinch shaft in SR

Shaft has low tolerance to tensile

force

High percent elongation of shaft

High percent elongation of raw material

Localized defect in shaft

Small kink occurs under SR

Defect built into shaft

or

or

and

and

or

Timing / Duration

and

or

high primary force, as built

Intra-Procedural Delay

Intra-Procedural Delay

HARM

HAZ-A

HAZ-D

HAZ-AHAZ-D

HAZ-DHAZ-D

HAZ-P

HAZ-P

HAZ-P

HAZ-A

Page 22: Pragmatic Device Risk Management

Dealing with OverallRisk Assessment

• 14971 – “There is no preferred method for evaluating overall residual risk and the manufacturer is responsible for determining an appropriate method”

That is … you’re on your own.

• For some reason, devices don’t deal with residual risk as objectively as pharma … there seems to be a presumption of achievable perfection

© 2013 – Intertech Engineering Associates, Inc.

Page 23: Pragmatic Device Risk Management

www.inea.com [email protected]

Boston: 100 Lowder Brook Drive, Suite 2500, Westwood, MA 02090 T: (781)801-1100Chicago: 475 Half Day Road, Suite 110, Lincolnshire, IL 60069 T: (773)915-2290

Questions & Answers

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© 2013 – Intertech Engineering Associates, Inc.

sponsored by